Multi-cycle long-term live-line test method suitable for high-voltage direct-current GIS (Gas Insulated Switchgear) and related device

Abstract

The invention provides a multi-cycle long-term live-line test method suitable for a high-voltage direct-current GIS (Gas Insulated Switchgear) and a related device, and belongs to the technical field of power transmission and transformation insulation equipment. The method comprises the following steps: acquiring a time parameter when the high-voltage direct-current GIS reaches insulation stability; according to the time parameters, determining test periods of various sub-tests of the high-voltage direct-current GIS under different load conditions and voltage polarity conditions; determining a test sequence of each sub test according to a preset combination principle, wherein the combination principle is determined according to a load condition and a voltage polarity condition; and performing a long-term live test on the high-voltage direct-current GIS based on the test sequence and the test period. According to the invention, the long-term live-line test can be carried out for the high-voltage direct-current GIS with different voltage grades and structures by determining the differentiated test period and sequence, so that the long-term insulation reliability of the high-voltage direct-current GIS can be effectively and reliably evaluated.

Description

Technical Field

[0001] The invention belongs to the technical field of power transmission and transformation insulation equipment, and in particular relates to a multi-cycle long-term live test method and related devices suitable for high-voltage direct current GIS. Background Art

[0002] High-voltage direct current gas-insulated metal-enclosed switchgear (HVDC GIS) can significantly reduce the space occupied and equipment weight of offshore wind power conversion platforms. Compared with the DC field using air-insulated equipment, the space of the DC field using DC GIS can be reduced by 70% to 95%, and it has higher reliability because the high-voltage components will not be affected by external dust, salty air, rain and snow. Therefore, high-voltage direct current GIS has become a key electrical equipment to promote the large-scale and high-quality development of offshore wind power.

[0003] Under DC voltage, due to the long-term effect of unipolar electric field, the carriers in the insulation material of DC GIS gradually transfer to the gas-solid interface under the action of the tangential electric field and normal electric field of the insulation interface, resulting in significant interfacial charge accumulation on the surface of the insulator, causing distortion of the gas-solid interface electric field, which easily induces insulator surface flashover, seriously affecting the safe and stable operation of DC GIS. However, there are still no relevant standards for the design standards and performance assessment tests of DC GIS, and the long-term insulation stability of high-voltage DC GIS cannot be evaluated. Summary of the invention

[0004] In view of this, the present invention aims to provide a multi-cycle long-term energized test method and related devices suitable for high-voltage DC GIS, which are used to effectively and accurately test and evaluate the long-term insulation reliability of the high-voltage DC GIS.

[0005] In order to achieve the above object, the technical solution provided by the present invention is as follows:

[0006] In a first aspect, the present invention provides a multi-cycle long-term live test method applicable to a high-voltage direct current GIS, comprising the following steps:

[0007] Obtain the time parameters for high voltage DC GIS to reach insulation stability;

[0008] According to the time parameters, determine the test cycle of each sub-test of the high-voltage DC GIS under different load conditions and voltage polarity conditions;

[0009] Determine the test sequence of each sub-test according to the preset combination principle, which is determined according to the load conditions and voltage polarity conditions;

[0010] Long-term live tests are carried out on high-voltage DC GIS based on the test sequence and test cycle.

[0011] Furthermore, under different voltage polarity conditions, the voltage value of each sub-test ranges from 1 to 1.5 times the rated voltage of the high-voltage DC GIS.

[0012] Furthermore, the test period of each sub-test is determined according to the following formula:

[0013]

[0014] In the formula, Indicates the load condition is , the voltage polarity condition is The test period of the sub-test is Indicates The redundancy coefficient of the sub-test, Indicates the load condition is , the voltage polarity condition is The electric field stabilization time of HVDC GIS.

[0015] Further, the electric field stabilization time is determined according to the following formula,

[0016]

[0017] In the formula, represents the time saturation coefficient, It represents the theoretical calculation time required for the electric field inside the GIS to transition from a capacitive field to a resistive field after the DC voltage excitation is added. is the dielectric constant of vacuum, is the dielectric constant of SF6 gas, is the dielectric constant of solid insulating material, is the electrical conductivity of SF6 gas, is the volume conductivity of the solid insulating material, is the surface conductivity of the solid insulating material, is the characteristic coefficient related to the insulator radius.

[0018] Further, the load conditions include no-load and load, the voltage polarity conditions include positive polarity and negative polarity, and the combination principles include: opposite polarity principle and no-load and load phase principle;

[0019] The polarity opposite principle is to arrange the subtests in alternating order according to positive and negative polarities;

[0020] The no-load and load alternation principle is to arrange the sub-tests alternately according to no-load and load.

[0021] Furthermore, various sub-tests of HVDC GIS under different load conditions and voltage polarity conditions include:

[0022] Subtest under no-load positive polarity voltage, subtest under no-load negative polarity voltage, subtest under load positive polarity voltage and subtest under load negative polarity voltage.

[0023] Furthermore, the test conditions of each sub-test include:

[0024] Voltage value, voltage polarity, load or not, and test cycle.

[0025] In a second aspect, the present invention provides a multi-cycle long-term live test system suitable for high-voltage DC GIS, comprising:

[0026] A time parameter acquisition unit, used to obtain the time parameter for the high voltage DC GIS to reach insulation stability;

[0027] A test cycle determination unit is used to determine the test cycle of each sub-test of the high-voltage DC GIS under different load conditions and voltage polarity conditions according to time parameters;

[0028] A test sequence determination unit is used to determine the test sequence of each sub-test according to a preset combination principle, and the combination principle is determined according to load conditions and voltage polarity conditions;

[0029] The live test unit is used to perform long-term live tests on high-voltage DC GIS based on the test sequence and test cycle.

[0030] In a third aspect, the present invention provides a computer device, the device comprising a processor and a memory:

[0031] The memory is used to store the computer program and send the instructions of the computer program to the processor;

[0032] The processor executes a multi-cycle long-term live test method applicable to a high-voltage DC GIS according to the instructions of the computer program as described in the first aspect.

[0033] In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements a multi-cycle, long-term energized test method applicable to a high-voltage DC GIS as in the first aspect.

[0034] In summary, the present invention provides a multi-cycle long-term live-test method and related device suitable for high-voltage direct current GIS, including obtaining the time parameter for the high-voltage direct current GIS to reach insulation stability; determining the test cycle of each sub-test of the high-voltage direct current GIS under different load conditions and voltage polarity conditions according to the time parameter; determining the test sequence of each sub-test according to a preset combination principle, and the combination principle is determined according to the load condition and the voltage polarity condition; and performing a long-term live-test on the high-voltage direct current GIS based on the test sequence and the test cycle. The present invention can conduct a long-term live-test on a high-voltage direct current GIS of different voltage levels and structures by determining differentiated test cycles and sequences, thereby effectively and reliably evaluating its long-term insulation reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0036] Figure 1 A flowchart of a multi-cycle long-term live test method applicable to a high-voltage DC GIS provided in an embodiment of the present invention;

[0037] Figure 2 A schematic diagram of a long-term live test cycle of a ±550kV DC GIS provided in an embodiment of the present invention;

[0038] Figure 3 A block diagram of a multi-cycle long-term live test device suitable for high-voltage DC GIS provided in an embodiment of the present invention;

[0039] Figure 4 A block diagram of a computer device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0040] In order to make the purpose, features and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0041] See also Figure 1 This embodiment provides a multi-cycle long-term live test method applicable to high-voltage DC GIS, comprising the following steps:

[0042] S1: Obtain the time parameters for the high-voltage DC GIS to reach insulation stability.

[0043] It should be noted that the purpose of this step is to determine the time required for the high-voltage DC GIS to reach insulation stability. The "insulation stability" here refers to the insulation performance of the equipment insulation material reaching a stable state under the action of the electric field and no longer undergoing significant changes. Obtaining the time parameter is crucial for the design of subsequent tests, which can ensure that the test is carried out after the equipment reaches a stable state, thereby improving the accuracy of the test results.

[0044] S2: According to the time parameters, determine the test cycle of each sub-test of the high-voltage DC GIS under different load conditions and voltage polarity conditions.

[0045] It should be noted that this step determines the test cycle of each sub-test based on the time parameters obtained in step S1, combined with different load conditions (i.e., different currents or power levels that the equipment may withstand during operation) and voltage polarity conditions (i.e., positive or negative polarity voltages that the equipment may face). The test cycle refers to the duration of each sub-test, which needs to be long enough to ensure that the insulation performance of the equipment under different conditions can be accurately evaluated.

[0046] S3: Determine the test sequence of each sub-test according to the preset combination principle, and the combination principle is determined according to the load conditions and voltage polarity conditions.

[0047] It should be noted that the test sequence refers to the execution order of each sub-test. The test sequence is determined based on preset combination principles, which take into account the load conditions and voltage polarity conditions. A reasonable test sequence can ensure the logic and systematicness of the test, avoid repeated tests, and improve test efficiency. For example, you may first test under low load conditions and then gradually increase the load, or first test the positive polarity voltage and then the negative polarity voltage.

[0048] S4: Conduct long-term energized tests on high-voltage DC GIS based on the test sequence and test cycle.

[0049] It should be noted that the long-term live test refers to applying voltage to the equipment over a long period of time to simulate actual operating conditions, thereby evaluating the reliability and stability of its insulation materials in long-term operation. This step performs a long-term live test on the high-voltage DC GIS according to the test sequence determined in step S3 and the test cycle determined in step S2.

[0050] This embodiment provides a multi-cycle long-term live test method suitable for high-voltage DC GIS. It can conduct long-term live tests on high-voltage DC GIS of different voltage levels and structures by determining differentiated test cycles and sequences, thereby effectively and reliably evaluating its long-term insulation reliability.

[0051] In one embodiment, under different voltage polarity conditions, the voltage value of each sub-test ranges from 1 to 1.5 times the rated voltage of the high-voltage DC GIS.

[0052] In one embodiment, a method for calculating a test period is proposed. In this method, the test period of each sub-test is determined according to the following formula:

[0053] (1)

[0054] In the formula, Indicates the load condition is , the voltage polarity condition is The test period of the sub-test is Indicates The redundancy coefficient of the sub-test, Indicates the load condition is , the voltage polarity condition is The electric field stabilization time of HVDC GIS.

[0055] Based on the test cycle provided in the above embodiment, in a further embodiment, a method for calculating the electric field stabilization time is proposed. In this method, the electric field stabilization time is determined according to the following formula:

[0056] (2)

[0057] In the formula, represents the time saturation coefficient, It represents the theoretical calculation time required for the electric field inside the GIS to transition from a capacitive field to a resistive field after the DC voltage excitation is added. is the dielectric constant of vacuum, is the dielectric constant of SF6 gas, is the dielectric constant of solid insulating material, is the electrical conductivity of SF6 gas, is the volume conductivity of the solid insulating material, is the surface conductivity of the solid insulating material, is the characteristic coefficient related to the insulator radius.

[0058] In one embodiment, the load conditions include no-load and load, the voltage polarity conditions include positive polarity and negative polarity, and the combination principles include: opposite polarity principle and no-load and load phase principle;

[0059] The polarity opposite principle is to arrange the subtests in alternating order according to positive and negative polarities;

[0060] The no-load and load alternation principle is to arrange the sub-tests alternately according to no-load and load.

[0061] In this embodiment, the polarity opposite principle is to alternately order the sub-tests according to positive polarity and negative polarity, that is, when one sub-test is performed under positive polarity conditions, the next sub-test will be performed under negative polarity conditions, and so on. For example, the test sub-cycle can be ,or wait.

[0062] The no-load and load alternation principle is to alternate the sub-tests according to no-load (ZL) and load (hl), that is, when one sub-test is performed under no-load conditions, the next sub-test will be performed under load conditions, and so on. For example, the test sub-cycle can be ,or wait.

[0063] Based on the load conditions proposed in the above embodiments, in one embodiment, various sub-tests of the high-voltage DC GIS under different load conditions and voltage polarity conditions include:

[0064] Subtest under no-load positive polarity voltage, subtest under no-load negative polarity voltage, subtest under load positive polarity voltage and subtest under load negative polarity voltage.

[0065] In one embodiment, the test conditions of each sub-test include:

[0066] Voltage value, voltage polarity, load or not, and test cycle.

[0067] Taking a ±550 kV DC GIS as an example, the test cycle and test sequence of the above sub-tests are introduced in combination with the above embodiments.

[0068] The ε0 of this ±550kV DC GIS is 8.85E -12 F / m, ε SF6 Take 1.002, ε epoxy Take 5.3, σ SF6 Take 1.00E -21 S / m,σ V Take 7.20E -16 S / m,σ S Take 9.10E -16 S / m, R0 is 80. Calculate t mIt is 152515s, about 42.3 hours (1.8 days). Due to the temperature rise effect, the electric field transition time of the no-load condition under DC voltage is greater than the electric field transition time of the load condition; ignoring the influence of slightly uneven field polarity effect, it is assumed that the positive polarity voltage and negative polarity voltage transition time are the same under the same conditions. Comprehensive consideration, take the DC ±550kV DC GIS is 0.95, is 0.98. The temperature rise stabilization time t is obtained by simulation calculation w About 16 hours.

[0069] The sub-cycles and their cycles of the DC GIS multi-cycle long-term live test procedure include: no-load positive polarity voltage The test cycle (denoted as )、No-load negative voltage The test cycle (denoted as )、Load positive voltage The test cycle (denoted as )、Load negative polarity voltage The test cycle (denoted as ).

[0070] Test cycle of high voltage DC GIS under no-load positive polarity voltage By ij OK, at this time i represents no-load ZL, j represents DC voltage + polarity, that is, t ij for . Depend on The calculation relationship is shown in formula (3). k1 is the redundancy coefficient, which is generally not less than 2.

[0071] (3)

[0072] Substituting the parameters into formulas (1) and (2), we obtain hours (1.7 days), k1 is 10, and according to formula (3) we get For 17 days.

[0073] Test cycle of high voltage DC GIS under no-load positive polarity voltage By ij OK, at this time i represents no-load ZL, j represents DC voltage-polarity, that is, t ij for . Depend on The calculation relationship is shown in formula (4). k2 is the redundancy coefficient, which is generally not less than 2.

[0074] (4)

[0075] Substituting the parameters into formulas (1) and (2), we obtain hours (1.7 days), k2 is 10, and according to formula (4) we get For 17 days.

[0076] Test cycle of high voltage DC GIS under no-load positive polarity voltage By ij OK, at this time i represents the load HL, j represents the DC voltage + polarity, that is, t ij for . Depend on The calculation relationship is shown in formula (5). k3 is the redundancy coefficient, which is generally not less than 2.

[0077] (5)

[0078] Substituting the parameters into formulas (1) and (2), we obtain hours (1.7 days), k1 is 10, and according to formula (5) we get For 17 days.

[0079] Test cycle of high voltage DC GIS under no-load positive polarity voltage By ij OK, at this time i represents the load HL, j represents the DC voltage Polarity, i.e. t ij for . Depend on The calculation relationship is shown in formula (6). k4 is the redundancy coefficient, which is generally not less than 2.

[0080] (6)

[0081] Substituting the parameters into formulas (1) and (2), we obtain hours (1.7 days), k1 is 10, and according to formula (6) we get For 17 days.

[0082] Pick .

[0083] Through the above formula, four pairs of data of loading voltage and corresponding time are obtained (each pair is a sub-cycle), namely [+660kV no-load, 17 days], [-660kV no-load, 17 days], [+660kV load, 18 days], [-660kV load, 18 days]. No-load means no current is applied, and load means a current of 5000A (5000A DC current or 5000A AC current with an effective value of 5000A) is applied.

[0084] In this example, the test sequence of each sub-cycle of the ±550kV DC GIS is: [+660kV no-load, 17 days] → [-660kV no-load, 17 days] → [+660kV load, 18 days] → [-660kV load, 18 days].

[0085] Based on the above four pairs of data and test sequence, the long-term live test procedure of the ±550kV DC GIS is formed, as follows: Figure 2 As shown. During the implementation of each sub-cycle, the DC GIS samples should be consistent and the internal SF6 gas and spare parts should not be unpacked and replaced. After the entire experiment is completed, the samples should be inspected to meet the insulation requirements.

[0086] Based on the same inventive concept, the embodiment of the present application also provides a multi-cycle long-term live test system applicable to high-voltage DC GIS for implementing the multi-cycle long-term live test method applicable to high-voltage DC GIS involved above. The implementation scheme for solving the problem provided by the system is similar to the implementation scheme recorded in the above method, so the specific limitations in the embodiment of the multi-cycle long-term live test system applicable to high-voltage DC GIS provided below can refer to the limitations of the multi-cycle long-term live test method applicable to high-voltage DC GIS above, and will not be repeated here.

[0087] See also Figure 3 The embodiment of the present invention provides a multi-cycle long-term live test system suitable for high-voltage DC GIS, including:

[0088] A time parameter acquisition unit, used to obtain the time parameter for the high voltage DC GIS to reach insulation stability;

[0089] A test cycle determination unit is used to determine the test cycle of each sub-test of the high-voltage DC GIS under different load conditions and voltage polarity conditions according to time parameters;

[0090] A test sequence determination unit is used to determine the test sequence of each sub-test according to a preset combination principle, and the combination principle is determined according to load conditions and voltage polarity conditions;

[0091] The live test unit is used to perform long-term live tests on high-voltage DC GIS based on the test sequence and test cycle.

[0092] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the system can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0093] Reference Figure 4 The embodiment of the present invention further provides a computer device, including: a memory and a processor and a computer program stored in the memory. When the computer program is executed on the processor, a multi-cycle long-term live test system method suitable for high-voltage DC GIS as described in any one of the above methods is implemented.

[0094] The computer device may be a desktop computer, a notebook, a PDA, a cloud server or other computing device. The computer device may include, but is not limited to, a processor and a memory. Those skilled in the art will understand that Figure 4 It is only an example of a computer device and does not constitute a limitation of the computer device. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, it may also include input and output devices, network access devices, etc.

[0095] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0096] In some embodiments, the memory may be an internal storage unit of the computer device, such as a hard disk or memory of the computer device. In other embodiments, the memory may also be an external storage device of the computer device, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the computer device. Further, the memory may include both an internal storage unit and an external storage device of the computer device. The memory is used to store an operating system, an application program, a boot loader (BootLoader), data, and other programs, such as the program code of the computer program. The memory may also be used to temporarily store data that has been output or is to be output.

[0097] An embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for a multi-cycle long-term live test system suitable for a high-voltage DC GIS as described in any one of the above methods is implemented.

[0098] In this embodiment, if the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned various method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium can at least include: any entity or device that can carry the computer program code to the camera / terminal device, recording medium, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electric carrier signal, telecommunication signal and software distribution medium. For example, USB flash drive, mobile hard disk, disk or optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0099] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0100] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0101] In the embodiments disclosed in the present application, it should be understood that the disclosed devices / terminal equipment and methods can be implemented in other ways. For example, the device / terminal equipment embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0102] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A multi-cycle long-term live test method suitable for high-voltage DC GIS, characterized in that: The steps include: Obtain the time parameters for high voltage DC GIS to reach insulation stability; According to the time parameters, determine the test cycle of each sub-test of the high-voltage DC GIS under different load conditions and voltage polarity conditions; Determining the test order of each of the sub-tests according to a preset combination principle, wherein the combination principle is determined according to the load condition and the voltage polarity condition; Based on the test sequence and the test cycle, a long-term live test is performed on the high-voltage DC GIS.

2. The multi-cycle long-term live test method applicable to high-voltage direct current GIS according to claim 1 is characterized in that: Under the different voltage polarity conditions, the voltage value of each sub-test ranges from 1 to 1.5 times the rated voltage of the high-voltage DC GIS.

3. The multi-cycle long-term live test method applicable to high-voltage direct current GIS according to claim 1 is characterized in that: The test period of each sub-test is determined according to the following formula: In the formula, Indicates the load condition is , the voltage polarity condition is The test period of the sub-test is Indicates The redundancy coefficient of the sub-test, Indicates the load condition is , the voltage polarity condition is The electric field stabilization time of HVDC GIS.

4. The multi-cycle long-term live test method applicable to high-voltage direct current GIS according to claim 3 is characterized in that: The electric field stabilization time is determined according to the following formula: In the formula, represents the time saturation coefficient, It represents the theoretical calculation time required for the electric field inside the GIS to transition from a capacitive field to a resistive field after the DC voltage excitation is added. is the dielectric constant of vacuum, is the dielectric constant of SF6 gas, is the dielectric constant of solid insulating material, is the electrical conductivity of SF6 gas, is the volume conductivity of the solid insulating material, is the surface conductivity of the solid insulating material, is the characteristic coefficient related to the insulator radius.

5. The multi-cycle long-term live test method applicable to high-voltage direct current GIS according to claim 1 is characterized in that: The load conditions include no-load and load, the voltage polarity conditions include positive polarity and negative polarity, and the combination principles include: opposite polarity principle and no-load and load phase principle; The polarity opposite principle is to arrange the subtests in alternating order according to positive polarity and negative polarity; The no-load and load alternation principle is to arrange the sub-tests in an alternating order according to no-load and load.

6. The multi-cycle long-term live test method applicable to high-voltage direct current GIS according to claim 5 is characterized in that: The sub-tests of HVDC GIS under different load conditions and voltage polarity conditions include: Subtest under no-load positive polarity voltage, subtest under no-load negative polarity voltage, subtest under load positive polarity voltage and subtest under load negative polarity voltage.

7. The multi-cycle long-term live test method applicable to high-voltage direct current GIS according to claim 1 is characterized in that: The test conditions for each of the sub-tests include: Voltage value, voltage polarity, whether there is load and the test cycle.

8. A multi-cycle long-term live test system suitable for high-voltage DC GIS, characterized in that: include: A time parameter acquisition unit, used to obtain the time parameter for the high voltage DC GIS to reach insulation stability; A test cycle determination unit, used to determine the test cycle of each sub-test of the high-voltage direct current GIS under different load conditions and voltage polarity conditions according to the time parameters; A test sequence determination unit, used to determine the test sequence of each of the sub-tests according to a preset combination principle, wherein the combination principle is determined according to the load condition and the voltage polarity condition; The live test unit is used to perform a long-term live test on the high-voltage DC GIS based on the test sequence and the test cycle.

9. A computer device, characterized in that: The device comprises a processor and a memory: The memory is used to store a computer program and send instructions of the computer program to the processor; The processor executes a multi-cycle long-term energized test method applicable to a high-voltage DC GIS according to instructions of the computer program as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by the processor, the multi-cycle long-term energized test method applicable to high-voltage DC GIS according to any one of claims 1 to 7 is implemented.

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