Power failure test device and method for memory
By designing a multi-module memory power-down test device, optimizing the test process and parameters, dynamically adjusting the algorithm and precise timing control, the problem of multiple and time-consuming test steps in the existing technology is solved, and the test efficiency and accuracy are improved. .
Patent Information
- Application Number
- CN202411225789.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-03
- Publication Date
- 2025-01-21
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
The current memory power-down test device has many test links and takes a long time, resulting in low testing efficiency. Especially in high-frequency power-down cycles, system call and scheduling waste a lot of time.
Design a power loss test device including host module, protocol conversion module, power control module, signal detection module, data storage module, timing control module, and data analysis module. Control and reduce the waste of testing time.
It improves the efficiency and accuracy of the memory loss test, reduces unnecessary waiting time, enhances the user experience, and provides rich user interaction functions.
Smart Images
Figure CN119339777A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of power-off testing, and in particular to a power-off testing device and method for a memory. Background Art
[0002] Memory is a key component in computer systems, used to store data and programs. Depending on whether the data can be retained after power failure, memory can be divided into volatile memory (such as DRAM) and non-volatile memory (such as NAND Flash, EEPROM, FRAM, etc.). Non-volatile memory is widely used in various electronic devices to store important information such as files, keys, transaction logs, and application data because it can retain data after power failure.
[0003] In the prior art, the power-off test device of the memory mainly tests the memory by a low-interval power-off interval method and performs the test operation in combination with direct processing of commands. However, this method has the following problems: Since there are many test links and each test link takes a long time, the entire test process takes a long time and the test efficiency is low. Especially in the high-frequency power-off-power-on cycle, a lot of time is wasted on system calls and scheduling rather than the actual power-off test itself.
[0004] In order to solve the above problems, the present application proposes a power-off test device and method for a memory. Summary of the invention
[0005] 1. Purpose of the invention In order to solve the technical problems existing in the background technology, the present invention provides a power-off test device and method for a memory. The present invention improves the test efficiency by optimizing the test process and test parameters.
[0006] (II) Technical solution In order to solve the above problems, the present invention provides a power-off test device for a memory, comprising: Host module, used to store and run the test software and control the entire test process; A protocol conversion module, used for converting the signal output by the host into a signal type that can be received by the memory; The power control module is used to control the power on and off of the memory to achieve accurate power off simulation; A signal detection module, used for real-time monitoring of the input and output signals of the memory; Data storage module, used to store key data and results during the test; The timing control module is used to accurately control the time interval between power-off and power-on to optimize test efficiency.
[0007] Data analysis module: processes and analyzes test data to evaluate the power-off protection capability of the memory; User interface module: provides a user interaction interface to facilitate users to set test parameters and view test results; The host module is connected to the protocol conversion module, the data storage module, the data analysis module and the user interface module respectively through a data bus; The protocol conversion module is connected with the power control module and the signal detection module through an interface; The power control module directly controls the power supply of the memory to realize power-off and power-on operations; The signal detection module monitors the input and output signals of the memory in real time and transmits the signal data back to the data analysis module.
[0008] Preferably, the host module comprises: A processor, used to execute test software and control the test process; Memory, which stores temporary data and program instructions generated during the test; Hard disk, used to store test software, test data, and test reports; Network interface for communicating with remote servers or other test equipment; Input and output interfaces, such as USB and RS-232, are used to connect external devices such as keyboards, monitors, and protocol conversion modules.
[0009] Preferably, the protocol conversion module includes: A signal interface, used to receive signals sent by the host module; A signal processor, used for converting the signal sent by the host into a protocol format recognizable by the memory; The driving circuit is used to amplify or adjust the signal level to ensure that the signal can be stably transmitted to the memory; Output interface, sends the converted signal to the memory.
[0010] Preferably, the power control module includes: Power management chip, which controls the power on, off and voltage regulation; The relay, as a switching element, controls the on and off of the power supply according to the control signal; Voltage monitoring circuit, used to monitor the power supply voltage in real time to ensure voltage stability; Protection circuit, used to cut off power supply when power supply is abnormal, to protect memory and test equipment.
[0011] Preferably, the signal detection module includes: A signal acquisition circuit, used for acquiring input and output signals of the memory; Analog-to-digital converter, which converts analog signals into digital signals for subsequent processing; Data cache, used to temporarily store the collected signal data; Communication interface, sends the collected data to the data analysis module.
[0012] Preferably, the data storage module includes: Hard disk, used for long-term storage of key data and results generated during the test; Database management system manages and maintains data stored in the hard disk and provides data query and modification functions.
[0013] Preferably, the timing control module includes: Timer, controlling the time interval between power-off and power-on; A logic control unit generates control signals according to preset test parameters and timing requirements; Synchronization circuit ensures timing synchronization between modules.
[0014] Preferably, the data analysis module includes: A data processor, used for processing and analyzing the collected signal data; Algorithm library, including various data analysis algorithms, such as signal filtering, data verification, and performance evaluation; The result display unit is used to display the analysis results in the form of charts and reports.
[0015] A power-off test method for a memory comprises the following steps: S1. Initialize the test software and detect the connection status between the host and the test device; S2. Setting the desired power-off interval and test times parameters through the user interface module; S3, the host sends a test command to the memory through the protocol conversion module, and starts to monitor the input and output signals of the memory; S4, the timing control module controls the power control module to power off the memory according to preset parameters; S5, the signal detection module continuously monitors the signal of the memory during the power-off process, and stores the data in the data storage module; S6, the power control module resumes power supply, and the data analysis module verifies the data in the memory to determine whether the data is complete; S7, repeat S4 to S6 according to the preset number of times until the test requirements are met; S8. The data analysis module processes and analyzes the test data, generates a test report, and displays it to the user through the user interface module.
[0016] The above technical solution of the present invention has the following beneficial technical effects: By dynamically adjusting the algorithm and precise timing control, the time wasted in the test process is reduced, ensuring the accuracy and efficiency of the test. In addition, the test device of the present invention also provides a rich user interaction function, which is convenient for users to set parameters and view results, further improving the user experience. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 The present invention is a schematic structural diagram of a power-off test device for a memory.
[0018] Figure 2 The present invention is a flowchart of a power-off test method for a memory. DETAILED DESCRIPTION
[0019] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are only exemplary and are not intended to limit the scope of the present invention. In addition, in the following description, the description of well-known structures and technologies is omitted to avoid unnecessary confusion of the concept of the present invention.
[0020] like Figure 1-2 As shown, the present invention provides a power-off test device for a memory, comprising: Host module, used to store and run the test software and control the entire test process; The main module includes: A processor, used to execute test software and control the test process; Memory, which stores temporary data and program instructions generated during the test; Hard disk, used to store test software, test data, and test reports; Network interface for communicating with remote servers or other test equipment; Input and output interfaces, such as USB and RS-232, are used to connect external devices such as keyboards, monitors, and protocol conversion modules.
[0021] It should be noted that the processor: is connected to the memory, hard disk, network interface, and input and output interface to execute programs stored in the memory and hard disk, process data, communicate through the network interface, and interact with external devices through the input and output interface.
[0022] A protocol conversion module, used for converting the signal output by the host into a signal type that can be received by the memory; The protocol conversion module includes: A signal interface, used to receive signals sent by the host module; A signal processor, used for converting the signal sent by the host into a protocol format recognizable by the memory; The driving circuit is used to amplify or adjust the signal level to ensure that the signal can be stably transmitted to the memory; Output interface, sends the converted signal to the memory.
[0023] It should be noted that the signal interface is connected to the input and output interface of the host module to receive signals from the host.
[0024] Signal processor: receives the signal from the signal interface and processes it into a format suitable for the memory.
[0025] Driving circuit: connected to the signal processor and output interface, adjusts the signal level to adapt to the memory.
[0026] Output interface: connected to the memory to send the converted signal.
[0027] The power control module is used to control the power on and off of the memory to achieve accurate power off simulation; The power control module includes: Power management chip, which controls the power on, off and voltage regulation; The relay, as a switching element, controls the on and off of the power supply according to the control signal; Voltage monitoring circuit, used to monitor the power supply voltage in real time to ensure voltage stability; Protection circuit, used to cut off power supply when power supply is abnormal, to protect memory and test equipment.
[0028] It should be noted that the power management chip: is connected to the relay / MOSFET, voltage monitoring circuit, and protection circuit to control the power on and off, monitor voltage stability, and cut off the power in case of an abnormality.
[0029] Relay: Connects to the power management chip and the power source (such as an AC / DC converter or a battery) to perform power on and off operations.
[0030] Voltage monitoring circuit: connected to the power management chip to provide real-time voltage feedback.
[0031] Protection circuit: connected to the power management chip and the power source, cutting off the power supply when an abnormality is detected.
[0032] A signal detection module, used for real-time monitoring of the input and output signals of the memory; The signal detection module includes: A signal acquisition circuit, used for acquiring input and output signals of the memory; Analog-to-digital converter, which converts analog signals into digital signals for subsequent processing; Data cache, used to temporarily store the collected signal data; Communication interface, sends the collected data to the data analysis module.
[0033] It should be noted that the signal acquisition circuit is connected to the memory (or the signal output point of the device under test) to collect input and output signals.
[0034] Analog-to-digital converter (ADC): connected to the signal acquisition circuit to convert analog signals into digital signals.
[0035] Data cache: connected to ADC and communication interface to temporarily store converted data.
[0036] Communication interface: connects to the data analysis module and sends cached data.
[0037] Data storage module, used to store key data and results during the test; Preferably, the data storage module includes: Hard disk, used for long-term storage of key data and results generated during the test; Database management system manages and maintains data stored in the hard disk and provides data query and modification functions.
[0038] It should be noted that the hard disk: is connected to the database management system to store data.
[0039] Database management system: connects to the hard disk / solid state drive and data analysis module to manage data and provide query and modification functions.
[0040] The timing control module is used to accurately control the time interval between power-off and power-on to optimize test efficiency.
[0041] The timing control module includes: Timer, controlling the time interval between power-off and power-on; A logic control unit generates control signals according to preset test parameters and timing requirements; Synchronization circuit ensures timing synchronization between modules.
[0042] It should be noted that the timer is connected to the logic control unit to provide precise time control.
[0043] Logic control unit: connected with the timer, power control module, and other modules that require timing control (such as signal detection module) to generate and send control signals.
[0044] Synchronous circuit: connected with the logic control unit and other modules that need to be synchronized to ensure consistent timing.
[0045] In the timing control module, a dynamic adjustment algorithm is used to optimize the power-off interval and improve the test efficiency. The specific algorithm is as follows: T_{\text{interval}}=\frac{T_{\text{total}}}{N\times(1+\alpha)}\] Where: -\(T_{\text{interval}}\) is the optimized power-off interval. -\(T_{\text{total}}\) is the total test time. -\(N\) is the preset number of power-offs. -\(\alpha\) is the adjustment coefficient, which is dynamically adjusted according to the test results and the initial value can be set to 0. This formula dynamically adjusts the power-off interval by adjusting the coefficient \(\alpha\) to reduce unnecessary waiting time while maintaining the test effect, thereby improving test efficiency.
[0046] Data analysis module: processes and analyzes the test data to evaluate the power-off protection capability of the memory.
[0047] Data analysis modules include: A data processor, used for processing and analyzing the collected signal data; Algorithm library, including various data analysis algorithms, such as signal filtering, data verification, and performance evaluation; The result display unit is used to display the analysis results in the form of charts and reports.
[0048] Data processor: connects with the communication interface (from the signal detection module) and the algorithm library, processes the data and applies the algorithm.
[0049] Algorithm library: connects with the data processor to provide algorithm support.
[0050] Result display unit: connected to the data processor to display the analysis results.
[0051] User interface module: provides a user interaction interface to facilitate users to set test parameters and view test results; include: Display screen: connected to the operating system / user interface software to display information.
[0052] Input devices (such as keyboards and touch screens): connect to the operating system / user interface software to receive user input.
[0053] Operating system / user interface software: connects to the display, input devices, host module (possibly through API or middleware), provides user interaction interface and processes user requests.
[0054] The host module is connected to the protocol conversion module, the data storage module, the data analysis module and the user interface module respectively through a data bus; The protocol conversion module is connected with the power control module and the signal detection module through an interface; The power control module directly controls the power supply of the memory to realize power-off and power-on operations; The signal detection module monitors the input and output signals of the memory in real time and transmits the signal data back to the data analysis module.
[0055] A power-off test method for a memory comprises the following steps: S1. Initialize the test software and detect the connection status between the host and the test device; S2. Setting the desired power-off interval and test times parameters through the user interface module; S3, the host sends a test command to the memory through the protocol conversion module, and starts to monitor the input and output signals of the memory; S4, the timing control module controls the power control module to power off the memory according to preset parameters; S5, the signal detection module continuously monitors the signal of the memory during the power-off process, and stores the data in the data storage module; S6, the power control module resumes power supply, and the data analysis module verifies the data in the memory to determine whether the data is complete; S7, repeat S4 to S6 according to the preset number of times until the test requirements are met; S8. The data analysis module processes and analyzes the test data, generates a test report, and displays it to the user through the user interface module.
[0056] In the present invention, (right 1 beneficial effect).
[0057] It should be noted that.
[0058] It should be understood that the above specific embodiments of the present invention are only used to illustrate or explain the principles of the present invention, and do not constitute a limitation of the present invention. Therefore, any modifications, equivalent substitutions, improvements, etc. made without departing from the spirit and scope of the present invention should be included in the protection scope of the present invention. In addition, the appended claims of the present invention are intended to cover all changes and modifications that fall within the scope and boundaries of the appended claims, or the equivalent forms of such scope and boundaries.
Claims
1. A power-off test device for a memory, characterized in that: include: Host module, used to store and run the test software and control the entire test process; A protocol conversion module, used for converting the signal output by the host into a signal type that can be received by the memory; The power control module is used to control the power on and off of the memory to achieve accurate power off simulation; A signal detection module, used for real-time monitoring of the input and output signals of the memory; Data storage module, used to store key data and results during the test; Timing control module, used to accurately control the time interval between power-off and power-on; Data analysis module: processes and analyzes test data to evaluate the power-off protection capability of the memory; User interface module: provides user interaction interface; The host module is connected to the protocol conversion module, the data storage module, the data analysis module and the user interface module respectively through a data bus; The protocol conversion module is connected with the power control module and the signal detection module through an interface; The power control module directly controls the power supply of the memory to realize power-off and power-on operations; The signal detection module monitors the input and output signals of the memory in real time and transmits the signal data back to the data analysis module.
2. A power-off test device for a memory according to claim 1, characterized in that: The main module includes: A processor, used to execute test software and control the test process; Memory, which stores temporary data and program instructions generated during the test; Hard disk, used to store test software, test data, and test reports; Network interface for communicating with remote servers or other test equipment; Input and output interfaces are used to connect external devices such as keyboards, monitors, and protocol conversion modules.
3. A power-off test device for a memory according to claim 2, characterized in that: The protocol conversion module includes: A signal interface, used to receive signals sent by the host module; A signal processor, used for converting the signal sent by the host into a protocol format recognizable by the memory; The driving circuit is used to amplify or adjust the signal level to ensure that the signal can be stably transmitted to the memory; Output interface, sends the converted signal to the memory.
4. A power-off test device for a memory according to claim 3, characterized in that: The power control module includes: Power management chip, which controls the power on, off and voltage regulation; The relay, as a switching element, controls the on and off of the power supply according to the control signal; Voltage monitoring circuit, used for real-time monitoring of power supply voltage; Protection circuit, used to cut off power supply when power supply is abnormal, to protect memory and test equipment.
5. A power-off test device for a memory according to claim 4, characterized in that: The signal detection module includes: A signal acquisition circuit, used for acquiring input and output signals of the memory; Analog-to-digital converter, which converts analog signals into digital signals; Data cache, used to temporarily store the collected signal data; Communication interface, sends the collected data to the data analysis module.
6. A power-off test device for a memory according to claim 5, characterized in that: The data storage module includes: Hard disk, used for long-term storage of key data and results generated during the test; Database management system manages and maintains data stored in the hard disk and provides data query and modification functions.
7. A power-off test device for a memory according to claim 6, characterized in that: The timing control module includes: Timer, controlling the time interval between power-off and power-on; A logic control unit generates control signals according to preset test parameters and timing requirements; Synchronization circuit ensures timing synchronization between modules.
8. A power-off test device for a memory according to claim 7, characterized in that: Data analysis modules include: A data processor, used for processing and analyzing the collected signal data; Algorithm library, including various data analysis algorithms, such as signal filtering, data verification, and performance evaluation; The result display unit is used to display the analysis results in the form of charts and reports.
9. A power-off test method for a memory, characterized in that: The following steps are involved: S1. Initialize the test software and detect the connection status between the host and the test device; S2. Setting the desired power-off interval and test times parameters through the user interface module; S3, the host sends a test command to the memory through the protocol conversion module, and starts to monitor the input and output signals of the memory; S4, the timing control module controls the power control module to power off the memory according to preset parameters; S5, the signal detection module continuously monitors the signal of the memory during the power-off process, and stores the data in the data storage module; S6, the power control module resumes power supply, and the data analysis module verifies the data in the memory to determine whether the data is complete; S7, repeat S4 to S6 according to the preset number of times until the test requirements are met; S8. The data analysis module processes and analyzes the test data, generates a test report, and displays it to the user through the user interface module.