Method, device, equipment, storage medium and product for rechecking battery cell defects

Abstract

The present invention relates to the technical field of photovoltaic cells, and particularly to a method, device, equipment, storage medium and product for re-inspecting defects of cell wafers. The present invention inputs the image data of the cell wafers to be re-inspected into a trained defect detection model for defect detection of the cell wafers for re-inspection, and determines the target cell wafers based on the defect detection results of the re-inspection and the detection results of the cell wafers to be re-inspected. Finally, by sending down the cell wafer attribute information of the target cell wafers, an automatic sorting device can re-sort the target cell wafers, so as to improve the output efficiency of qualified cell wafers on the production line, and avoid the technical problems of low re-inspection efficiency and large workload in the prior art when there are quality defects in the cell wafers.

Description

Technical Field

[0001] The present invention relates to the technical field of photovoltaic cells, and particularly to a method, device, equipment, storage medium and product for re-inspecting defects of battery wafers. Background Art

[0002] When traditional photovoltaic battery wafers are taken offline, quality inspection of the photovoltaic battery wafers is required, such as electroluminescence detection, photoluminescence detection, etc. However, after the detection is completed, quality review is generally carried out through the equipment used for quality inspection. However, for the traditional equipment for defect detection of battery wafers, in order to reduce the missed inspection rate, the passing rate of electroluminescence detection is very high, while the review quality is low. Therefore, in order to improve the quality of battery wafers, manual re-inspection stations are set up on the battery production line, so as to re-inspect the battery wafers manually. However, the efficiency of manual re-inspection is low, and the workload is large, and mis-inspection may occur.

[0003] The above content is only used to assist in understanding the technical solution of the present invention, and does not represent an admission that the above content is prior art. Summary of the Invention

[0004] The main purpose of the present invention is to provide a method, device, equipment, storage medium and product for re-inspecting defects of battery wafers, aiming to solve the technical problems of low re-inspection efficiency and large workload when there are quality defects in battery wafers in the prior art.

[0005] To achieve the above object, the present invention provides a method for re-inspecting defects of battery wafers, and the method includes the following steps:

[0006] Obtain image data of the battery wafer to be re-inspected;

[0007] Perform battery wafer defect detection on the image data through a trained defect detection model to determine a target battery wafer, where the target battery wafer is a battery wafer whose defect detection result is opposite to the electroluminescence detection result of the battery wafer to be re-inspected;

[0008] Send down the battery wafer attribute information of the target battery wafer;

[0009] Based on the battery wafer attribute information, perform re-sorting processing on the target battery wafer through an automatic sorting device.

[0010] Optionally, the obtaining of the image data of the battery wafer to be re-inspected includes:

[0011] Receive the battery wafer attribute information sent from a quality inspection station;

[0012] Screen the battery wafer to be re-inspected according to the battery wafer attribute information;

[0013] Obtain the image data of the battery cell to be re-inspected based on the image path in the battery cell attribute information.

[0014] Optionally, the step of performing battery cell defect detection on the image data through a trained defect detection model to determine the target battery cell includes:

[0015] Preprocess the image data;

[0016] Perform electroluminescence detection on the preprocessed image data through a trained defect detection model;

[0017] Screen out the target battery cell from the battery cells to be re-inspected according to the electroluminescence detection result, and the target battery cell is the battery cell to be re-inspected with a qualified electroluminescence test.

[0018] Optionally, the step of re-sorting the target battery cell through an automatic sorting device based on the battery cell attribute information includes:

[0019] Determine the target interface field of the target battery cell based on the battery cell attribute information;

[0020] Drive the automatic sorting device to perform re-sorting processing on the target battery cell based on the target interface field.

[0021] Optionally, the battery cell defect re-inspection method further includes:

[0022] When the battery cell cassette meets the preset conditions, drive the automatic sorting device to report the actual battery cell attribute data, and the actual battery cell attribute data at least includes the actual battery cell identification code, the actual electrical performance test grading number, and the actual sorting time information.

[0023] Optionally, the battery cell defect re-inspection method further includes:

[0024] Compare the issued battery cell attribute information with the actual battery cell attribute information fed back by the automatic sorting device to achieve sorting query and traceability of the battery cells.

[0025] In addition, to achieve the above object, the present invention also proposes a battery cell defect re-inspection device, and the battery cell defect re-inspection device includes:

[0026] An acquisition module, configured to acquire the image data of the battery cell to be re-inspected;

[0027] A detection module, configured to perform battery cell defect detection on the image data through a trained defect detection model to determine the target battery cell, and the target battery cell is the one with a defect detection result opposite to the electroluminescence detection result of the battery cell to be re-inspected;

[0028] A sending module, configured to send the cell attribute information of the target cell;

[0029] A sorting module, configured to re-sort the target cell by an automatic sorting device based on the cell attribute information.

[0030] In addition, to achieve the above object, the present invention further provides a cell defect re-inspection device, which includes: a memory, a processor, and a cell defect re-inspection program stored on the memory and executable on the processor, and the cell defect re-inspection program is configured to implement the steps of the cell defect re-inspection method as described above.

[0031] In addition, to achieve the above object, the present invention further provides a storage medium, on which a cell defect re-inspection program is stored, and when the cell defect re-inspection program is executed by a processor, the steps of the cell defect re-inspection method as described above are implemented.

[0032] In addition, to achieve the above object, the present application further provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the steps of the cell defect re-inspection method as described above are implemented.

[0033] One or more technical solutions provided by the present application have at least the following technical effects: The present invention discloses a cell defect re-inspection method, which includes: obtaining image data of a cell to be re-inspected; performing cell defect detection on the image data through a trained defect detection model to determine a target cell, where the target cell is a cell whose defect detection result is opposite to the electroluminescence detection result of the cell to be re-inspected; sending the cell attribute information of the target cell; and re-sorting the target cell by an automatic sorting device based on the cell attribute information. Compared with the prior art, the present invention inputs the image data of the cell to be re-inspected into a trained defect detection model for cell defect detection for re-inspection, and determines the target cell based on the defect detection result of the re-inspection and the detection result of the cell to be re-inspected. Finally, by sending the cell attribute information of the target cell, the automatic sorting device can re-sort the target cell, so as to improve the output efficiency of qualified cells in the production line, and avoid the technical problems of low re-inspection efficiency and large workload when there are quality defects in cells in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] The accompanying drawings here are incorporated into the specification and form a part of this specification, showing embodiments consistent with the present application, and are used together with the specification to explain the principles of the present application.

[0035] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, for those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0036] Figure 1 It is a schematic flowchart of the first embodiment of the method for re-inspecting defects of battery wafers according to the present invention;

[0037] Figure 2 It is an overall architecture diagram of the battery defect re-inspection of an embodiment of the method for re-inspecting defects of battery wafers according to the present invention;

[0038] Figure 3 It is a schematic diagram of the overall process of battery defect re-inspection of an embodiment of the method for re-inspecting defects of battery wafers according to the present invention;

[0039] Figure 4 It is a schematic flowchart of the second embodiment of the method for re-inspecting defects of battery wafers according to the present invention;

[0040] Figure 5 It is an example diagram of the battery wafer grading query and traceability scheme of an embodiment of the method for re-inspecting defects of battery wafers according to the present invention;

[0041] Figure 6 It is an example diagram of the battery wafer grading query and traceability example of an embodiment of the method for re-inspecting defects of battery wafers according to the present invention;

[0042] Figure 7 It is a structural block diagram of the first embodiment of the device for re-inspecting defects of battery wafers according to the present invention;

[0043] Figure 8 It is a schematic diagram of the structure of the battery wafer defect re-inspection device in the hardware operating environment involved in the embodiment solution of the present invention.

[0044] The realization, functional features and advantages of the object of the present invention will be further described with reference to the embodiments and the drawings. Specific Embodiments

[0045] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0046] To better understand the technical solutions of the present application, the following will be described in detail in combination with the drawings of the specification and specific embodiments.

[0047] Based on this, the embodiments of the present invention provide a method for re-inspecting defects of battery wafers, referring to Figure 1 , Figure 1 It is a schematic flowchart of the first embodiment of a method for re-inspecting defects of battery wafers according to the present invention.

[0048] In this embodiment, the method for re-inspecting defects of solar cells includes the steps of:

[0049] Step S10: Obtain the image data of the solar cell to be re-inspected.

[0050] It should be noted that the execution subject of this embodiment can be a computing service device with data processing, network communication, and program running functions, such as: tablet computers, personal computers, mobile phones, etc., or an electronic device capable of implementing the above functions, the control computer of the battery production line, etc. Hereinafter, the control computer of the battery production line will be taken as an example to illustrate this embodiment and the following embodiments.

[0051] It should be noted that the passing rate of electroluminescence (EL) detection for solar cells is currently very high. Therefore, in addition to the on-line EL detection equipment at the production line end, off-line detection machines need to be added, and NG products at the on-line end are manually re-judged. However, the manual judgment method for classifying defects has low efficiency, high labor consumption, and is prone to false detection and missed detection, resulting in customer complaints and the generation of batch defective products.

[0052] The solar cell to be re-inspected refers to a solar cell that meets the preset light emission detection conditions, specifically a solar cell that meets the condition that the EL detection result is NG (unqualified) and the PL detection result is OK (qualified).

[0053] Among them, EL refers to electroluminescence detection. Electroluminescence detection mainly applies a voltage to the solar cell to make it emit light, and then uses a high-sensitivity camera to capture the near-infrared image, so as to detect the defects inside the solar cell, and can quickly and accurately locate common defects such as cracks, broken grids, and hidden cracks in the solar cell, ensuring that the photovoltaic solar cells leaving the factory have excellent performance and stability.

[0054] PL refers to photoluminescence detection. Photoluminescence detection means using light (usually laser) to irradiate the material, so that the material absorbs light energy and excites electrons to a higher energy level. When these electrons return to the ground state, they will release energy in the form of light, and this light emission is called photoluminescence. It can simulate the actual light illumination conditions, irradiate the solar cell with light and collect the fluorescence signal, and then analyze the electrical performance parameters and defect conditions of the solar cell.

[0055] Specifically, by screening out the solar cells that are unqualified in electroluminescence detection and qualified in photoluminescence detection on the battery production line as the solar cells to be re-inspected, and obtaining the image data of the solar cells to be re-inspected, so as to realize the re-inspection of the solar cells through the trained defect detection model, improve the qualification rate of the solar cells on the production line, and make the passing rate of the solar cells on the production line more accurate.

[0056] Further, the obtaining of the image data of the solar cell to be re-inspected includes:

[0057] Receive cell property information sent from the quality inspection machine;

[0058] Selecting the battery cells to be re-inspected according to the battery cell attribute information;

[0059] Image data of the battery cell to be reviewed is acquired based on the image path in the battery cell attribute information.

[0060] In a specific implementation, the cell attribute information includes but is not limited to the cell identification code ID, the bin number of the electrical performance test result (IV_BIN), the bin number of the electroluminescence test result (EPL_BIN: EL), the bin number of the photoluminescence test result (EPL_BIN: PL), and the equipment test time (Test_time: IV).

[0061] The cell data information can be used to screen out cells to be re-inspected, and can also be used for traceability after subsequent cell sorting, thereby improving the efficiency of outputting qualified cells for the entire battery production line.

[0062] Specifically, refer to Figure 2 and Figure 3 The entire battery defect re-inspection architecture in this embodiment is a quality inspection machine (EPL inspection machine, an integrated machine for both battery cell EL inspection and PL inspection), a control computer with an online EL re-inspection system, an Equipment Automation Programming (EAP) system, and an automated sorting device. The EPL inspection machine screens the EL and PL inspection results, and selects the battery cells with EL=NG, PL=OK, and sends the information such as CELLID, IV_BIN, EPL_BIN, Test_time, and EL image path to the online EL re-inspection system through the KAFKA message middleware, thereby realizing defect re-inspection of the image data of the battery cells to be re-inspected.

[0063] Step S20: Performing cell defect detection on the image data through a trained defect detection model to determine a target cell, wherein the target cell has a defect detection result opposite to the electroluminescence detection result of the cell to be re-inspected.

[0064] Furthermore, the performing cell defect detection on the image data through a trained defect detection model to determine a target cell includes:

[0065] Preprocessing the image data;

[0066] The preprocessed image data is subjected to electroluminescence detection through a trained defect detection model;

[0067] Screen out target wafers from the wafers to be re-inspected according to the electroluminescence detection results, where the target wafers are the wafers to be re-inspected with qualified electroluminescence tests.

[0068] It should be understood that when taking the battery image, due to the test stage being in progress, or reasons such as light and shadow, dust, etc., the image data of the battery may be blurred or blocked. To improve the accuracy of defect re-inspection of wafers, in this embodiment, the preprocessing of the image data includes, but is not limited to, image sharpening, de-blurring, and image restoration, etc.

[0069] In a specific implementation, the online EL re-inspection system obtains image data based on the EL image path and uses this image as the input of the defect detection model to detect whether the EL image of the wafer is OK or NG. If the re-inspection system determines it is OK, it means the wafer can be upgraded to a good product, that is, it is used as a target wafer. If the re-inspection system determines it is NG, it means the wafer cannot be upgraded to a good product, and then the automatic sorting equipment defaults to execute the EPL binning instruction to perform subsequent scrapping or reprocessing.

[0070] Step S30: Send down the wafer attribute information of the target wafer.

[0071] If in the above Figure 3 in S2 shown, if the EL is determined to be OK and can be upgraded based on the image-based detection model, then send the CELLID and IV_BIN sent by EPL to the EAP system through the KAFKA message middleware, so that the EAP system forwards the wafer attribute information to the automatic sorting equipment to perform the re-sorting process of the wafers.

[0072] Step S40: Based on the wafer attribute information, perform re-sorting of the target wafers through the automatic sorting equipment.

[0073] The automatic sorting equipment can perform sorting of the target wafers based on the received wafer identification code ID and the electrical performance test grading number, so as to distinguish between qualified wafers and unqualified wafers, and improve the operation efficiency of the production line.

[0074] In this embodiment, the image data of the wafers to be re-inspected is input into the trained defect detection model for wafer defect detection for re-inspection, and based on the defect detection results of the re-inspection and the detection results of the wafers to be re-inspected, the target wafers are determined. Finally, by sending down the wafer attribute information of the target wafers, the automatic sorting equipment can perform re-sorting of the target wafers to improve the output efficiency of qualified wafers in the production line, and avoid the technical problems of low re-inspection efficiency and large workload in the prior art when there are quality defects in wafers.

[0075] Based on the first embodiment of the present application, in the second embodiment of the present application, the same or similar content as that in the above-mentioned Embodiment 1 can be referred to the above introduction and will not be repeated hereinafter. On this basis, please refer to Figure 4 , step S40 includes:

[0076] Step S401: Determine the target interface field of the target cell based on the cell attribute information.

[0077] Step S402: Drive the automatic sorting device to perform re-sorting processing on the target cell based on the target interface field.

[0078] It should be noted that the interface field refers to the Assign_Code field. The Assign_Code field is generally 1 or 2. When the Assign_Code field is 1, the automatic sorting device can perform the operation of re-sorting the target cell. When the Assign_Code field is 2, the automatic sorting device does not perform the operation of re-sorting the target cell. This embodiment does not make specific restrictions on this.

[0079] Further, after driving the automatic sorting device to perform re-sorting processing on the target cell based on the target interface field, it further includes:

[0080] When the cell cassette meets the preset conditions, drive the automatic sorting device to report the actual cell attribute data, and the actual cell attribute data at least includes the actual cell identification code, the actual electrical performance test grading number, and the actual sorting time information.

[0081] The preset condition means that the current cell cassette is full of cells. At this time, the automatic sorting device reports the CELLID and BIN number of the cells in this cassette to the EAP through the PLC, and replaces the empty cell cassette to facilitate subsequent cell sorting.

[0082] Further, after driving the automatic sorting device to report the actual cell attribute data, it further includes:

[0083] Compare the issued cell attribute information with the actual cell attribute information fed back by the automatic sorting device to realize the sorting query and traceability of the cells.

[0084] It can be understood that referring to Figure 5 and Figure 6 , Figure 5 and Figure 6For the solution and example description of grading traceability, the abnormal situation can be quickly investigated according to the resume information of the cell grading. The EAP system feeds back the CELLID, BIN, and time information of the actual BIN drop of the cell to the online EL re-inspection system through the KAFKA message middleware. The online EL re-inspection system compares the BIN data of the cell sent down with the actual BIN drop data received, and then completes the query and traceability of the BIN drop of the cell.

[0085] In this embodiment, the target interface field of the target cell is determined based on the cell attribute information; the automatic sorting device is driven based on the target interface field to perform re-sorting processing on the target cell, so that during re-inspection, only the cells that can be upgraded are re-graded, and the grading logic of the remaining cells still follows the processing of the original device, ensuring that the cells are not mixed or misgraded.

[0086] This application also provides a cell defect re-inspection device. Please refer to Figure 7 , the cell defect re-inspection device includes:

[0087] An acquisition module 10, configured to acquire image data of a cell to be re-inspected.

[0088] A detection module 20, configured to perform cell defect detection on the image data through a trained defect detection model to determine a target cell, where the target cell is a cell whose defect detection result is opposite to the electroluminescence detection result of the cell to be re-inspected.

[0089] A sending module 30, configured to send the cell attribute information of the target cell.

[0090] A sorting module 40, configured to perform re-sorting processing on the target cell through an automatic sorting device based on the cell attribute information.

[0091] In this embodiment, the image data of the cell to be re-inspected is input into a trained defect detection model for cell defect detection for re-inspection, and based on the defect detection result of the re-inspection and the detection result of the cell to be re-inspected, a target cell is determined. Finally, by sending the cell attribute information of the target cell, the automatic sorting device can re-sort the target cell, so as to improve the output efficiency of qualified cells on the production line, and solve the technical problems of low re-inspection efficiency and large workload when there are quality defects in cells in the prior art.

[0092] In an embodiment, the acquisition module 10 is further configured to receive the cell attribute information sent by a quality inspection machine; screen the cells to be re-inspected according to the cell attribute information; and acquire the image data of the cell to be re-inspected based on the image path in the cell attribute information.

[0093] In one embodiment, the detection module 20 is further configured to preprocess the image data; perform electroluminescence detection on the preprocessed image data through a trained defect detection model; and screen out target wafers from the wafers to be reinspected according to the electroluminescence detection results, where the target wafers are the wafers to be reinspected that pass the electroluminescence test.

[0094] In one embodiment, the sorting module 40 is further configured to determine a target interface field of the target wafer based on the wafer attribute information; and drive an automatic sorting device to perform a re-sorting process on the target wafer based on the target interface field.

[0095] In one embodiment, the sorting module 40 is further configured to drive the automatic sorting device to report actual wafer attribute data when the wafer cassette meets a preset condition, where the actual wafer attribute data at least includes an actual wafer identification code, an actual electrical performance test grading number, and actual sorting time information.

[0096] In one embodiment, the sorting module 40 is further configured to compare the issued wafer attribute information with the actual wafer attribute information fed back by the automatic sorting device to implement sorting query and traceability of the wafers.

[0097] The present application provides a wafer defect reinspection device, and the wafer defect reinspection device includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein, the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the wafer defect reinspection method in the first embodiment above.

[0098] Reference is made below to Figure 8 , which shows a schematic structural diagram of a wafer defect reinspection device suitable for implementing the embodiments of the present application. The wafer defect reinspection device in the embodiments of the present application may include, but is not limited to, mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions: tablet computers), PMPs (Portable Media Players), in-vehicle terminals (such as in-vehicle navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Figure 8 The wafer defect reinspection device shown is only an example and should not impose any limitation on the functions and usage scopes of the embodiments of the present application.

[0099] As Figure 8As shown in the figure, the battery cell defect re-inspection device may include a processing device 1001 (such as a central processing unit, a graphics processing unit, etc.), which may perform various appropriate actions and processes according to the program stored in a read-only memory (ROM: Read Only Memory) 1002 or the program loaded from a storage device 1003 into a random access memory (RAM: Random Access Memory) 1004. In the RAM 1004, various programs and data required for the operation of the battery cell defect re-inspection device are also stored. The processing device 1001, the ROM 1002, and the RAM 1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems may be connected to the I / O interface 1006: an input device 1007 including, for example, a touch screen, a touchpad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; an output device 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage device 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 1009. The communication device 1009 may allow the battery cell defect re-inspection device to communicate with other devices wirelessly or wiredly to exchange data. Although the figure shows a battery cell defect re-inspection device having various systems, it should be understood that it is not required to implement or have all the shown systems. More or fewer systems may be alternatively implemented or had.

[0100] In particular, according to the embodiments disclosed in the present application, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, the embodiments disclosed in the present application include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program contains program codes for executing the methods shown in the flowcharts. In such an embodiment, the computer program may be downloaded and installed from the network through the communication device, or installed from the storage device 1003, or installed from the ROM 1002. When the computer program is executed by the processing device 1001, the above functions defined in the methods of the embodiments disclosed in the present application are executed.

[0101] The battery cell defect re-inspection device provided by the present application adopts the battery cell defect re-inspection method in the above embodiment and can solve the technical problem of battery cell defect re-inspection. Compared with the prior art, the beneficial effects of the battery cell defect re-inspection device provided by the present application are the same as those of the battery cell defect re-inspection method provided by the above embodiment, and the other technical features in the battery cell defect re-inspection device are the same as those disclosed in the method of the previous embodiment, and will not be elaborated herein.

[0102] It should be understood that each part disclosed in this application can be implemented by hardware, software, firmware, or a combination thereof. In the description of the above embodiments, specific features, structures, materials, or characteristics can be combined in a suitable manner in any one or more embodiments or examples.

[0103] As described above, only the specific embodiments of this application are provided, but the protection scope of this application is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in this application, and all should be covered by the protection scope of this application. Therefore, the protection scope of this application should be subject to the protection scope of the claims.

[0104] This application provides a computer-readable storage medium having computer-readable program instructions (i.e., computer programs) stored thereon, and the computer-readable program instructions are used to execute the method for re-inspecting defects of battery wafers in the above embodiments.

[0105] The computer-readable storage medium provided by this application can be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or any combination of the above. More specific examples of computer-readable storage media can include, but are not limited to: electrical connections with one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM) or flash memory, optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the above. In this embodiment, the computer-readable storage medium can be any tangible medium that contains or stores a program, and this program can be used by or in combination with an instruction execution system, device, or device. The program code contained on the computer-readable storage medium can be transmitted by any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination of the above.

[0106] The above computer-readable storage medium can be included in the device for re-inspecting defects of battery wafers; or it can exist separately and not be assembled into the device for re-inspecting defects of battery wafers.

[0107] The above computer-readable storage medium carries one or more programs, and when the one or more programs are executed by the device for re-inspecting defects of battery wafers, the device for re-inspecting defects of battery wafers is enabled to: re-inspect defects of battery wafers.

[0108] Computer program code for performing the operations of this application can be written in one or more programming languages or combinations thereof. The above-mentioned programming languages include object-oriented programming languages such as Java, Smalltalk, C++, and also include conventional procedural programming languages such as the "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, executed as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (for example, by connecting through the Internet using an Internet service provider).

[0109] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of systems, methods, and computer program products according to various embodiments of this application. In this regard, each block in the flowchart or block diagram can represent a module, a program segment, or a part of the code, and this module, program segment, or part of the code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks can occur in a different order than that marked in the accompanying drawings. For example, two consecutively represented blocks can actually be executed substantially in parallel, and they can sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, and the combination of blocks in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system for performing the specified functions or operations, or can be implemented by a combination of dedicated hardware and computer instructions.

[0110] The modules described in the embodiments of this application can be implemented in software or in hardware. Among them, the name of the module does not constitute a limitation on the unit itself in some cases.

[0111] The readable storage medium provided by this application is a computer-readable storage medium. The computer-readable storage medium stores computer-readable program instructions (i.e., computer programs) for performing the above-mentioned method for rechecking battery cell defects, and can solve the technical problem of rechecking battery cell defects. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided by this application are the same as those of the method for rechecking battery cell defects provided by the above embodiments, and will not be elaborated here.

[0112] The present application also provides a computer program product, including a computer program which, when executed by a processor, implements the steps of the method for re-inspecting defects of battery cells as described above.

[0113] The computer program product provided by the present application can solve the technical problem of re-inspecting defects of battery cells. Compared with the prior art, the beneficial effects of the computer program product provided by the present application are the same as those of the method for re-inspecting defects of battery cells provided in the above embodiments, and will not be elaborated here.

[0114] The above are only partial embodiments of the present application, and thus do not limit the patent scope of the present application. Any equivalent structural transformation made under the technical concept of the present application by using the content of the specification and drawings of the present application, or any direct / indirect application in other related technical fields, is included in the patent protection scope of the present application.

Claims

1. A method for re-inspecting defects of battery chips, characterized in that, The method for re-inspecting defects of solar cells includes: Obtaining image data of the solar cells to be re-inspected, where the solar cells to be re-inspected are those that fail in electroluminescence detection but pass in photoluminescence detection; Performing defect detection on the solar cells using the trained defect detection model for the image data to determine the target solar cells, where the target solar cells have a defect detection result opposite to the electroluminescence detection result of the solar cells to be re-inspected; Issuing the solar cell attribute information of the target solar cells; Based on the solar cell attribute information, performing re-sorting processing on the target solar cells through an automatic sorting device; The obtaining of the image data of the solar cells to be re-inspected includes: Receiving the solar cell attribute information sent from a quality inspection machine; Screening the solar cells to be re-inspected according to the solar cell attribute information; Obtaining the image data of the solar cells to be re-inspected based on the image path in the solar cell attribute information.

2. The method according to claim 1, characterized in that The performing of defect detection on the solar cells using the trained defect detection model for the image data to determine the target solar cells includes: Preprocessing the image data; Performing electroluminescence detection on the preprocessed image data using the trained defect detection model; Screening out the target solar cells from the solar cells to be re-inspected according to the electroluminescence detection result, where the target solar cells are the solar cells to be re-inspected that pass in electroluminescence testing.

3. The method according to claim 1, wherein The performing of re-sorting processing on the target solar cells through an automatic sorting device based on the solar cell attribute information includes: Determining the target interface field of the target solar cells based on the solar cell attribute information; Driving the automatic sorting device to perform re-sorting processing on the target solar cells based on the target interface field.

4. The method according to claim 3, characterized in that, The method for re-inspecting defects of solar cells further includes: When the solar cell cassette meets the preset conditions, driving the automatic sorting device to report the actual solar cell attribute data, where the actual solar cell attribute data includes at least the actual solar cell identification code, the actual electrical performance test grading number, and the actual sorting time information.

5. The method according to claim 4, characterized in that, The method for re-inspecting defects of solar cells further includes: Comparing the issued solar cell attribute information with the actual solar cell attribute information fed back by the automatic sorting device to achieve sorting query and traceability of solar cells.

6. A battery cell defect re-inspection device, characterized in that, The device for re-inspecting defects of solar cells includes: An obtaining module, configured to obtain image data of the solar cells to be re-inspected, where the solar cells to be re-inspected are those that fail in electroluminescence detection but pass in photoluminescence detection; A detection module, configured to perform defect detection on the solar cells using the trained defect detection model for the image data to determine the target solar cells, where the target solar cells have a defect detection result opposite to the electroluminescence detection result of the solar cells to be re-inspected; An issuing module, configured to issue the solar cell attribute information of the target solar cells; A sorting module, configured to perform re-sorting processing on the target solar cells through an automatic sorting device based on the solar cell attribute information; The obtaining module is further configured to receive the solar cell attribute information sent from a quality inspection machine; Screening the solar cells to be re-inspected according to the solar cell attribute information; Obtaining the image data of the solar cells to be re-inspected based on the image path in the solar cell attribute information.

7. A battery cell defect re-inspection device, characterized in that, The battery cell defect re-inspection device includes: a memory, a processor, and a battery cell defect re-inspection program stored on the memory and executable on the processor, and the battery cell defect re-inspection program is configured to implement the steps of the battery cell defect re-inspection method according to any one of claims 1 to 5.

8. A storage medium, characterized in that, A battery cell defect re-inspection program is stored on the storage medium, and when the battery cell defect re-inspection program is executed by a processor, the steps of the battery cell defect re-inspection method according to any one of claims 1 to 5 are implemented.

9. A computer program product, characterized in that, The computer program product includes a computer program, and when the computer program is executed by a processor, the steps of the battery cell defect re-inspection method according to any one of claims 1 to 5 are implemented.

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