Metal plate detection equipment and method and electronic equipment

Abstract

The invention provides metal plate detection equipment, a metal plate detection method and electronic equipment. The metal plate detection equipment comprises a first wheel type probe, a second wheel type probe and a detection host, the first wheel type probe is used for emitting a guided wave signal and receiving an echo signal; the second wheel type probe comprises two receiving probes at different positions, and the two receiving probes are used for receiving guided wave signals respectively; the detection host is used for controlling the first wheel type probe and the second wheel type probe to move, receiving signals, sending the signals and determining a defect detection result and a residual stress detection result of the metal plate according to the signals of the probes; wherein the first wheel type probe and the second wheel type probe have two working states of synchronous movement and asynchronous movement. According to the invention, defect detection of the metal plate can be completed, residual stress detection can be realized, and the detection efficiency of the metal plate is improved.

Description

Technical Field

[0001] The present application relates to the field of metal detection technology, and in particular to a metal plate detection device, method and electronic equipment. Background Art

[0002] As the cornerstone of modern industry, sheet metal is widely used in many fields such as construction, bridges, shipbuilding, aerospace, and the automotive industry. Steel and aluminum plates have become indispensable materials in these fields due to their excellent mechanical properties and outstanding corrosion resistance. These industries have extremely high requirements for the structural safety and durability of metal plates. Therefore, regular ultrasonic testing has become a key step to ensure the quality of the plates. Ultrasonic testing can not only detect potential defects such as cracks, delamination, and corrosion in a timely manner, but also is an important guarantee for preventing structural failure, protecting the lives and property of personnel, and maintaining the normal operation of facilities. In these key industries, the role of ultrasonic testing is indispensable and it is of vital importance to maintain the stable development of the industry. However, traditional plate testing methods have many limitations. In order to overcome these challenges, modern ultrasonic testing technology is constantly developing and innovating. New ultrasonic testing equipment can provide a wider range of detection, while reducing the need for manual operation through automation technology.

[0003] In the process of implementing the embodiments of the present application, it is found that the prior art has at least the following problems:

[0004] There is only a single conventional test for measuring plates, which requires different devices to detect residual stress and defects respectively. The small detection range requires continuous positioning and multiple scanning, and the detection efficiency is low. Summary of the invention

[0005] The embodiments of the present application provide a metal plate detection device, method and electronic device to solve the problem of how to quickly detect defects and residual stresses of the plate.

[0006] In a first aspect, an embodiment of the present application provides a metal sheet detection device, including: a first wheel probe, a second wheel probe and a detection host;

[0007] The first wheel probe is used to send out a waveguide signal and receive an echo signal;

[0008] The second wheel probe comprises two receiving probes at different positions for respectively receiving the guided wave signals;

[0009] The detection host is used to control the movement of the first wheel probe and the second wheel probe, receive signals and send signals, and determine the defect detection result and residual stress detection result of the metal plate according to the signals of each probe;

[0010] Wherein, the first wheel probe and the second wheel probe include two working states: synchronous motion and asynchronous motion.

[0011] In a possible implementation, the metal sheet detection device further includes a traveling component carrying the detection host;

[0012] The traveling detection assembly comprises: a traveling wheel, a driving motor and a power supply;

[0013] The power source is respectively connected to the traveling wheel, the first wheel probe and the second wheel probe to provide a power source;

[0014] The driving motor is connected to the traveling wheel and is used to provide driving force for the traveling wheel based on the power source provided by the power supply.

[0015] In a second aspect, an embodiment of the present application provides a metal sheet detection method, comprising:

[0016] Controlling the first wheel probe to emit a waveguide signal, receiving the echo signal detected by the first wheel probe and obtaining an A scan result, controlling the first wheel probe and the second wheel probe to move synchronously along the stepping axis direction, and obtaining a B scan result according to a plurality of A scan results;

[0017] In the process of controlling the first wheel probe and the second wheel probe to move synchronously along the stepping axis direction, controlling the second wheel probe to move along the scanning axis direction, and acquiring echo reception information of two receiving probes; wherein the stepping axis direction is perpendicular to the scanning axis direction;

[0018] The metal sheet defect detection result is determined according to the A-scan result and the B-scan result, and the residual stress detection result is determined according to the echo reception information of the two receiving probes.

[0019] In a possible implementation, the stepping axis direction is parallel or perpendicular to the width direction of the metal plate.

[0020] In a possible implementation, determining the metal sheet defect detection result according to the A scan result and the B scan result includes:

[0021] When it is determined that an A-scan echo exists within the set time according to a certain A-scan result, there is a defect in the scanning axis direction corresponding to the A-scan result;

[0022] The size of the defect is determined based on the B-scan result.

[0023] In a possible implementation, determining the residual stress detection result according to the echo reception information of the two receiving probes includes:

[0024] Acquire echo reception information of two receiving probes at a set detection position;

[0025] Determine the echo receiving time difference according to the echo receiving information of the two receiving probes;

[0026] The residual stress value corresponding to the set detection position is determined according to the echo receiving time difference and the set plate zero stress time difference.

[0027] In a possible implementation, the relationship between the echo receiving time difference, the time difference for setting the plate zero stress, and the residual stress value is:

[0028]

[0029] Among them, t σ is the echo receiving time difference; t0 is the set plate zero stress time difference; E is the elastic modulus; σ is the residual stress value.

[0030] In a possible implementation manner, before controlling the first wheel probe to send a waveguide signal, the method further includes:

[0031] Obtaining basic parameters of the metal sheet to be tested, and simulating a dispersion curve according to the basic parameters;

[0032] Selecting a suitable waveguide mode and a probe frequency of the first wheel probe according to the dispersion curve, and determining an incident angle of the wedge according to the sound velocity of the wedge and the phase velocity of the waveguide signal;

[0033] Wherein, the waveguide mode includes a symmetric type or an antisymmetric type.

[0034] In a possible implementation, the relationship between the sound velocity of the wedge, the phase velocity of the waveguide signal and the incident angle of the wedge is:

[0035]

[0036] Wherein, θ is the incident angle of the wedge; C 楔块 C is the sound velocity of the wedge; p is the phase velocity of the waveguide signal.

[0037] In a third aspect, an embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the steps of the method described in the first aspect or any possible implementation of the first aspect are implemented.

[0038] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps of the method described in the first aspect or any possible implementation method of the first aspect.

[0039] The embodiment of the present application provides a metal sheet detection device, method and electronic device, and the metal sheet detection device is constructed by a first wheel probe, a second wheel probe and a detection host. The first wheel probe is responsible for transmitting the waveguide signal and receiving the echo signal, and the second wheel probe is equipped with two receiving probes in different positions, which are respectively used to receive the waveguide signal. Automatic scanning is achieved through the combination mode of one probe transmitting and two receiving, avoiding the need for repositioning and multiple scanning, and simplifying the entire detection process. The detection host controls the movement of the first wheel probe and the second wheel probe, receives signals, and sends signals, and comprehensively analyzes the signals received by each probe. The detection host can accurately determine the defect detection results and residual stress detection results of the metal sheet. These probes have two working modes: synchronous movement and asynchronous movement. This flexible working mode enables the device to detect residual stress and defects at the same time, greatly improving the efficiency and accuracy of the detection. The metal sheet detection device in the present application can detect residual stress and defects at the same time. Through the mobile detection of the first wheel probe and the second wheel probe, the detection range is expanded, and flexible positioning and scanning are achieved, thereby improving the overall detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0041] Figure 1 It is a structural schematic diagram of a metal sheet detection device provided in one embodiment of the present application;

[0042] Figure 2 is a schematic diagram of a metal sheet detection device provided in an embodiment of the present application;

[0043] Figure 3 is a flow chart of an implementation of a metal sheet detection method provided in an embodiment of the present application;

[0044] Figure 4 It is a schematic diagram of the stepping axis direction and the scanning axis direction of an embodiment of the present application;

[0045] Figure 5 is a schematic diagram of an A-scan result provided in an embodiment of the present application;

[0046] Figure 6 is a schematic diagram of an A-scan result provided by another embodiment of the present application;

[0047] Figure 7 is a schematic diagram of a B-scan result provided by an embodiment of the present application;

[0048] Figure 8 This is a schematic diagram of residual stress distribution of a plate provided in an embodiment of the present application;

[0049] Fig. 9 is a schematic diagram of a theoretical phase velocity dispersion curve provided by a specific embodiment of the present application;

[0050] Fig.10 is a schematic diagram of a theoretical group velocity dispersion curve provided by a specific embodiment of the present application;

[0051] Fig.11 is a schematic diagram of a theoretical phase velocity dispersion curve provided by another specific embodiment of the present application;

[0052] Fig.12 is a schematic diagram of a theoretical group velocity dispersion curve provided by another specific embodiment of the present application;

[0053] Fig.13 It is a schematic diagram of the structure of an electronic device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0054] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0055] The terms "first", "second", etc. in the specification and claims of the embodiments of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the embodiments of the present application described here. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions.

[0056] Unless otherwise specified, the term "plurality" means two or more. The character " / " indicates that the objects before and after are in an "or" relationship. For example, A / B means: A or B. The term "and / or" is a description of the association relationship between objects, indicating that there can be three relationships. For example, A and / or B means: A or B, or, A and B.

[0057] The words used in this application are only used to describe the embodiments and are not used to limit the claims. As used in the description of the embodiments and claims, unless the context clearly indicates, the singular forms of "a", "an" and "the" are intended to include the plural forms as well. Similarly, the term "and / or" as used in this application refers to any and all possible combinations of one or more associated listings. In addition, when used in this application, the term "comprise" and its variants "comprises" and / or including (comprising) refer to the existence of stated features, wholes, steps, operations, elements, and / or components, but do not exclude the existence or addition of one or more other features, wholes, steps, operations, elements, components and / or these groups. In the absence of more restrictions, the elements defined by the statement "including one..." do not exclude the existence of other identical elements in the process, method or device including the elements.

[0058] In this application, each embodiment may focus on the differences from other embodiments, and the same or similar parts between the embodiments may refer to each other. For the methods, products, etc. disclosed in the embodiments, if they correspond to the method part disclosed in the embodiments, then the relevant parts may refer to the description of the method part.

[0059] In order to make the purpose, technical solutions and advantages of the present application clearer, specific embodiments will be described below in conjunction with the accompanying drawings.

[0060] Figure 1 Schematic diagram of the structure of a metal sheet detection device provided in one embodiment of the present application. Figure 1 As shown, it includes: a first wheel probe 100, a second wheel probe 200 and a detection host 300.

[0061] The first wheel probe 100 is used to send out a waveguide signal and receive an echo signal.

[0062] like Figure 1 As shown, after the first wheel probe 100 sends out a waveguide signal, the waveguide signal propagates along the metal plate and is returned, and the first wheel probe 100 receives the echo signal after propagating through the metal plate.

[0063] Optionally, the waveguide signal is an ultrasonic signal. The use of ultrasonic signals can expand the detection range, is suitable for the detection of large plates, and improves the detection efficiency.

[0064] The second wheel probe 200 includes two receiving probes at different positions for respectively receiving the waveguide signals.

[0065] like Figure 1 As shown, the two receiving probes in the second wheel probe 200 are at different positions, and the received echo signals have a time difference. According to the time difference, the residual stress value corresponding to the detection position of the second wheel probe 200 can be determined.

[0066] The detection host 300 is used to control the movement of the first wheel probe 100 and the second wheel probe 200, receive signals and send signals, and determine the defect detection results and residual stress detection results of the metal plate according to the signals of each probe.

[0067] The first wheel probe 100 and the second wheel probe 200 include two working states: synchronous motion and asynchronous motion.

[0068] In this embodiment, a metal sheet detection device is constructed by a first wheel probe 100, a second wheel probe 200 and a detection host 300. The first wheel probe 100 is responsible for transmitting a waveguide signal and receiving an echo signal, and the second wheel probe 200 is equipped with two receiving probes at different positions, which are respectively used to receive the waveguide signal. Automatic scanning is achieved through a combination mode of one probe transmitting and two receiving, avoiding the need for repositioning and multiple scanning, and simplifying the entire detection process. The detection host 300 controls the movement of the first wheel probe 100 and the second wheel probe 200, receives signals, and sends signals, and comprehensively analyzes the signals received by each probe. The detection host 300 can accurately determine the defect detection results and residual stress detection results of the metal sheet. These probes have two working modes: synchronous motion and asynchronous motion. This flexible working mode enables the equipment to simultaneously detect residual stress and defects, greatly improving the efficiency and accuracy of detection. The metal sheet detection equipment in the present application can detect residual stress and defects at the same time. Through the mobile detection of the first wheel probe 100 and the second wheel probe 200, the detection range is expanded, flexible positioning and scanning are achieved, and the overall detection efficiency is improved.

[0069] Figure 2 It is a schematic diagram of a metal sheet detection device provided in one embodiment of the present application.

[0070] In one possible implementation, Figure 2 As shown, the metal sheet detection device also includes a detection host 300 ( Figure 2 Traveling components (not shown).

[0071] The traveling detection assembly includes: a traveling wheel 400, a driving motor 500 and a power supply 600;

[0072] The power source 600 is respectively connected to the traveling wheel 400, the first wheel probe 100 and the second wheel probe 200 to provide a power source;

[0073] The driving motor 500 is connected to the traveling wheel 400 and is used to provide driving force for the traveling wheel 400 based on the power source provided by the power source 600 .

[0074] In this embodiment, the traveling assembly includes a traveling wheel 400, a driving motor 500 and a power supply 600, so as to realize the overall operation of the metal sheet detection device. In addition, the traveling assembly and the first wheel probe 100 and the second wheel probe 200 are separately arranged to avoid interference of the adjacent components with the signal acquisition of the first wheel probe 100 and the second wheel probe 200, thereby improving the metal sheet detection efficiency.

[0075] The above is an embodiment of the device of the present application. For details not described in detail, please refer to the following corresponding method embodiments.

[0076] Figure 3 is a flow chart of a metal sheet detection method according to an embodiment of the present application. Figure 3 As shown, the method comprises the following steps:

[0077] S301, control the first wheel probe 100 to emit a waveguide signal, receive the echo signal detected by the first wheel probe 100 and obtain an A scan result, control the first wheel probe 100 and the second wheel probe 200 to move synchronously along the stepping axis direction, and obtain a B scan result based on multiple A scan results.

[0078] The execution subject of each embodiment of the present application can be a server, processor, microprocessor or other device with data processing function. In the actual implementation process, the specific implementation method of the execution subject can be selected according to actual needs. This embodiment does not impose any special restrictions on this. As long as it is a device with data processing function. Figure 1 As shown, the execution subject of the method in the embodiment of the present application is described by taking the detection host 300 as an example.

[0079] After the first wheel probe 100 sends out a waveguide signal, an A scan result is obtained in the scanning axis direction. After the first wheel probe 100 and the second wheel probe 200 have completed their movement along the stepping axis direction, all A scan results constitute a B scan result. The A scan result is a one-dimensional display, and the B scan result is a two-dimensional cross-sectional image.

[0080] S302, in the process of controlling the first wheel probe 100 and the second wheel probe 200 to move synchronously along the stepping axis direction, controlling the second wheel probe 200 to move along the scanning axis direction, and obtaining echo reception information of the two receiving probes. Figure 4 As shown, the stepper axis ( Figure 4 The y-axis) direction and the scanning axis ( Figure 4 x-axis) direction.

[0081] In one possible implementation, Figure 4 As shown, the stepping axis direction is parallel to the width direction of the metal sheet. In other possible implementations, the stepping axis direction is perpendicular to the width direction of the metal sheet.

[0082] S303, determining the metal plate defect detection result according to the A scan result and the B scan result, and determining the residual stress detection result according to the echo reception information of the two receiving probes.

[0083] In a possible implementation, determining a metal sheet defect detection result according to an A-scan result and a B-scan result includes:

[0084] When it is determined that an A-scan echo exists within the set time according to a certain A-scan result, there is a defect in the scanning axis direction corresponding to the A-scan result;

[0085] Determine the size of the defect based on the B-scan results.

[0086] The setting time is determined according to the length of the plate and the phase velocity. Specifically, the reflected echo of the plate is analyzed, the length of the plate is d, and the phase velocity selected by the dispersion curve is C g , defect detection adopts single-shot and single-receive, and selects a suitable position on one side of the steel plate as a reference point. The defect-free time is:

[0087]

[0088] Figure 5 and Figure 6 Schematic diagrams of A-scan results with and without defects in the scanning axis direction.

[0089] During the specific implementation process, residual stress detection is automatically performed on positions without defects in the scanning axis direction. A one-transmit-two-receive probe is used to increase the detection range and improve the detection efficiency and speed. The one-transmit-two-receive probe can obtain more information about the object being detected during a single scan, reducing the need for repositioning and multiple scans, and simplifying the entire detection process.

[0090] In a possible implementation, determining the residual stress detection result according to the echo reception information of the two receiving probes includes:

[0091] Acquire echo reception information of two receiving probes at a set detection position;

[0092] Determine the echo receiving time difference according to the echo receiving information of the two receiving probes;

[0093] According to the echo receiving time difference and the set plate zero stress time difference, the residual stress value corresponding to the set detection position is determined.

[0094] In a possible implementation, the relationship between the echo receiving time difference, the time difference for setting the plate zero stress, and the residual stress value is:

[0095]

[0096] Among them, t σ is the echo receiving time difference; t0 is the time difference for setting the plate to zero stress; E is the elastic modulus; σ is the residual stress value.

[0097] In a specific embodiment, for the defective position in the scanning axis direction, the detection process is as follows:

[0098] Step 1: The first wheel probe 100 sends out a waveguide signal, and the first wheel probe 100 receives the signal sent out by itself, and the computer processes it. If an A-scan echo appears within t time, Figure 6 , indicating that there is a defect.

[0099] Step 2: Check the B scan at this time, record the strongest reflected signal strength through the computer program, and combine this information into a two-dimensional image and present it on the computer. Figure 7 , from which the location and size of the defect can be determined.

[0100] Step 3: The computer program automatically steps the first wheel probe 100 and the second wheel probe 200 along the stepping axis direction by 2 to 10 mm, and repeats steps 1 to 3 of this embodiment for the defective part until the entire plate is scanned.

[0101] In a specific embodiment, for a position without defects in the scanning axis direction, the detection process is as follows:

[0102] Step 1: The first wheel probe 100 sends out a waveguide signal, and the first wheel probe 100 receives the signal sent out by itself, and the computer processes it. If no A-scan echo appears within the time t, it means that there is no defect.

[0103] Step 2: The second wheel probe 200 (containing two receiving probes) receives the signal sent by the first wheel probe 100.

[0104] Step 3: Since the two receiving probes in the second wheel probe 200 are at different positions, the received guided waves have a time difference, and the value of the time difference and the position information of the second wheel probe 200 are recorded.

[0105] Step 4: Compare and analyze the time difference detected at this location with the pre-calibrated zero stress time difference of the plate, and obtain the residual stress value at the position of the second wheel probe 200 through the relationship between the acoustic time difference and stress (as shown in the following formula):

[0106]

[0107] Step 5: Fix the first wheel probe 100, and automatically step the second wheel probe 200 by 2 to 10 mm through a computer program. The scanning speed of the second wheel probe 200 is 5 mm / s-100 mm / s. Repeat steps 1 to 3 in this embodiment to obtain a new residual stress value at the position of the second wheel probe 200.

[0108] Step 6: When the second wheel probe 200 steps to the other end of the plate width, the computer program automatically steps the first wheel probe 100 and the second wheel probe 200 along the stepping axis direction by 2 to 10 mm. The second wheel probe 200 repeats steps 1 to 5 in this embodiment. If defects occur, steps 1 to 3 in the aforementioned embodiment can be repeated until the entire plate is scanned.

[0109] Step 7: All the scanned second wheel probe 200 position information and residual stress value information are fitted with a color block diagram through a computer program. The negative residual stress value (compressive stress) is blue and the positive residual stress value (tensile stress) is red, and the residual stress size distribution of the whole plate is obtained. Figure 8 .

[0110] In a possible implementation, before controlling the first wheel probe 100 to send a waveguide signal, the method further includes:

[0111] Obtain basic parameters of the metal sheet to be tested, and simulate the dispersion curve according to the basic parameters;

[0112] Selecting a suitable waveguide mode and a probe frequency of the first wheel probe 100 according to the dispersion curve, and determining the incident angle of the wedge according to the sound velocity of the wedge and the phase velocity of the waveguide signal;

[0113] Among them, the guided wave mode includes symmetric or antisymmetric. The guided wave mode is determined by whether the particle moves symmetric or antisymmetric relative to the middle layer of the plate. Each guided wave mode can be further divided into several modes with different phase velocities. The propagation of guided waves can be expressed by the following formula:

[0114] Symmetrical type:

[0115]

[0116] Antisymmetry:

[0117]

[0118] in, Among them C p represents the phase velocity, C l represents the longitudinal wave velocity, C T represents the shear wave velocity, l represents half of the plate d (i.e. ), if the product of frequency f and plate thickness d is taken into account, then for thin plates of different materials, the longitudinal and transverse wave propagation speeds of the material (C l and C T ) value, solve the above formula to get f*d and C p The relationship curve of phase velocity dispersion curve is According to the relationship between phase velocity and group velocity, the group velocity dispersion curve can be obtained.

[0119] In a possible implementation, the relationship between the acoustic velocity of the wedge, the phase velocity of the guided wave signal and the incident angle of the wedge is:

[0120]

[0121] Where θ is the incident angle of the wedge; C 楔块 is the sound velocity of the wedge; C p is the phase velocity of the guided wave signal.

[0122] In this embodiment, the relationship between the acoustic velocity of the wedge, the phase velocity of the waveguide signal and the incident angle of the wedge is determined according to Snell's law.

[0123] In a specific embodiment, the metal plate to be tested is a stainless steel plate, and the basic parameters of the metal plate to be tested include thickness 1 mm, length 1 meter, width 0.5 meter, d = 1 mm, longitudinal wave propagation speed C l =5900m / s, shear wave propagation speed C T =3100m / s is taken as an example for verification, and ω=2πf is substituted into the symmetric and asymmetric guided wave propagation formulas. The theoretical phase velocity dispersion curve of the test steel plate is drawn using MatLab software as shown in Fig. 9 As shown. With the phase velocity dispersion curve, according to the relationship between group velocity and phase velocity (k is the wave number, angular frequency ω = 2πf) the theoretical group velocity dispersion curve can be obtained as Fig.10 shown.

[0124] As the frequency increases, the dispersion of each mode is different. At the same time, when the symmetrical S0 mode is within 0.05-1.4MHz, the group velocity is greater than that of other modes. This means that the signal can be received first when this mode is used for excitation, and the dispersion is weaker when it is less than 1.4MHz, which is conducive to the subsequent signal separation and processing. Therefore, the frequency of the stainless steel plate probe can be selected as 1MHz, and the mode is selected as the symmetrical S0 mode. According to Snell's law, the incident angle of the wedge and the sound velocity C of the wedge are 斜楔 and the phase velocity C of the guided wave p The incident angle can be determined based on the relationship between the sound velocity of the inclined wedge, the phase velocity of the guided wave signal and the incident angle of the inclined wedge.

[0125] In another specific embodiment, the metal plate to be tested is an aluminum plate, and the basic parameters of the metal plate to be tested include a thickness of 3 mm, a length of 5 meters, a width of 1.5 meters, d = 3 mm, and a longitudinal wave propagation speed C l =6420m / s, shear wave propagation speed C T =3040m / s is used as an example for verification, and ω=2πf is substituted into the symmetric and asymmetric guided wave propagation formulas. The theoretical phase velocity dispersion curve of the experimental aluminum plate is drawn using MatLab software. Fig.11 As shown. With the phase velocity dispersion curve, according to the relationship between group velocity and phase velocity (k is the wave number, angular frequency ω = 2πf) the theoretical group velocity dispersion curve can be obtained as Fig.12 Shown

[0126] As the frequency increases, the dispersion of each mode is different. At the same time, when the symmetrical S0 mode is within 0.05-0.38MHz, the group velocity is greater than other modes, which means that the signal can be received first when this mode is used for excitation, and the dispersion is weaker when it is less than 1.4MHz, which is conducive to the subsequent signal separation processing. Therefore, the steel plate probe frequency can be selected as 0.35MHz, and the mode is selected as the symmetrical S0 mode. According to Snell's law, the incident angle of the wedge and the sound velocity C of the wedge are 斜楔 and the phase velocity C of the guided wave p The incident angle can be determined based on the relationship between the sound velocity of the inclined wedge, the phase velocity of the guided wave signal and the incident angle of the inclined wedge.

[0127] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0128] Fig.13 Schematic diagram of the structure of an electronic device provided by an embodiment of the present application. Fig.13 As shown, the electronic device 13 of this embodiment includes: a processor 130, a memory 131, and a computer program 132 stored in the memory 131 and executable on the processor 130. When the processor 130 executes the computer program 132, the steps in the above-mentioned metal sheet detection method embodiments are implemented, for example Figure 3 The steps shown.

[0129] Exemplarily, the computer program 132 may be divided into one or more modules / units, which are stored in the memory 131 and executed by the processor 130 to complete the present application. The one or more modules / units may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program 132 in the electronic device 13.

[0130] The electronic device 13 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The electronic device 13 may include, but is not limited to, a processor 130 and a memory 131. Those skilled in the art will appreciate that Fig.13 It is only an example of the electronic device 13 and does not constitute a limitation of the electronic device 13. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the electronic device may also include input and output devices, network access devices, buses, etc.

[0131] The processor 130 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0132] The memory 131 may be an internal storage unit of the electronic device 13, such as a hard disk or memory of the electronic device 13. The memory 131 may also be an external storage device of the electronic device 13, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the electronic device 13. Further, the memory 131 may also include both an internal storage unit of the electronic device 13 and an external storage device. The memory 131 is used to store the computer program and other programs and data required by the electronic device. The memory 131 may also be used to temporarily store data that has been output or is to be output.

[0133] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0134] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0135] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed in this application can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0136] In the embodiments provided in the present application, it should be understood that the disclosed devices / electronic devices and methods can be implemented in other ways. For example, the device / electronic device embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0137] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0138] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0139] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the steps of the above-mentioned metal sheet detection method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device that can carry the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium.

[0140] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A metal sheet detection device, characterized in that: include: A first wheel probe, a second wheel probe and a detection host; The first wheel probe is used to send out a waveguide signal and receive an echo signal; The second wheel probe comprises two receiving probes at different positions for respectively receiving the guided wave signals; The detection host is used to control the movement of the first wheel probe and the second wheel probe, receive signals and send signals, and determine the defect detection result and residual stress detection result of the metal plate according to the signals of each probe; Wherein, the first wheel probe and the second wheel probe include two working states: synchronous motion and asynchronous motion.

2. The metal sheet detection device according to claim 1, characterized in that: It also includes a traveling component carrying the detection host; The traveling detection assembly comprises: a traveling wheel, a driving motor and a power supply; The power source is respectively connected to the traveling wheel, the first wheel probe and the second wheel probe to provide a power source; The driving motor is connected to the traveling wheel and is used to provide driving force for the traveling wheel based on the power source provided by the power supply.

3. A metal sheet detection method based on the metal sheet detection device according to claim 1 or 2, characterized in that: include: Controlling the first wheel probe to emit a waveguide signal, receiving the echo signal detected by the first wheel probe and obtaining an A scan result, controlling the first wheel probe and the second wheel probe to move synchronously along the stepping axis direction, and obtaining a B scan result according to a plurality of A scan results; In the process of controlling the first wheel probe and the second wheel probe to move synchronously along the stepping axis direction, controlling the second wheel probe to move along the scanning axis direction, and acquiring echo reception information of two receiving probes; wherein the stepping axis direction is perpendicular to the scanning axis direction; The metal sheet defect detection result is determined according to the A-scan result and the B-scan result, and the residual stress detection result is determined according to the echo reception information of the two receiving probes.

4. The metal sheet detection method according to claim 3, characterized in that: The stepping axis direction is parallel or perpendicular to the width direction of the metal plate.

5. The metal sheet detection method according to claim 3, characterized in that: The determining of the metal sheet defect detection result according to the A scan result and the B scan result includes: When it is determined that an A-scan echo exists within the set time according to a certain A-scan result, there is a defect in the scanning axis direction corresponding to the A-scan result; The size of the defect is determined based on the B-scan result.

6. The metal sheet detection method according to claim 3, characterized in that: The method of determining the residual stress detection result according to the echo reception information of the two receiving probes includes: Acquire echo reception information of two receiving probes at a set detection position; Determine the echo receiving time difference according to the echo receiving information of the two receiving probes; The residual stress value corresponding to the set detection position is determined according to the echo receiving time difference and the set plate zero stress time difference.

7. The metal sheet detection method according to claim 6, characterized in that: The relationship between the echo receiving time difference, the time difference for setting the plate zero stress and the residual stress value is: Among them, t σ is the echo receiving time difference; t0 is the set plate zero stress time difference; E is the elastic modulus; σ is the residual stress value.

8. The metal sheet detection method according to claim 4, characterized in that: Before controlling the first wheel probe to send a waveguide signal, the method further includes: Obtaining basic parameters of the metal sheet to be tested, and simulating a dispersion curve according to the basic parameters; Selecting a suitable waveguide mode and a probe frequency of the first wheel probe according to the dispersion curve, and determining an incident angle of the wedge according to the sound velocity of the wedge and the phase velocity of the waveguide signal; Wherein, the waveguide mode includes a symmetric type or an antisymmetric type.

9. The metal sheet detection method according to claim 8, characterized in that: The relationship between the acoustic velocity of the wedge, the phase velocity of the waveguide signal and the incident angle of the wedge is: Wherein, θ is the incident angle of the wedge; C 楔块 C is the sound velocity of the wedge; p is the phase velocity of the waveguide signal.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and capable of running on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 3 to 9 are implemented.

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