Static test mechanism for IGBT (Insulated Gate Bipolar Translator) module

Abstract

The invention belongs to the technical field of IGBT (Insulated Gate Bipolar Translator) production, and provides an IGBT module static test mechanism which comprises a rack large plate, a test machine is fixedly mounted on the rack large plate through a test machine fixing frame, a mounting plate is arranged on the rack large plate, and a hollow rotating platform driven by a servo motor is rotationally mounted on the mounting plate. The technical problem that in the prior art, a test platform is reset under the action of gravity, so that the test platform impacts a device, and the reset stability of the test platform is reduced is solved. Compared with the prior art, the beneficial effects of the invention are that the synchronous movement of the test platform and the jacking block is realized, the test platform can be rapidly driven to reset through the jacking block, and the reset time of the test platform is reduced, so that the subsequent replacement speed of an IGBT on the test platform is improved, and the test speed and efficiency of the IGBT are improved.

Description

Technical Field

[0001] The invention belongs to the technical field of IGBT production, and in particular relates to an IGBT module static testing mechanism. Background Art

[0002] With the advancement of science and technology and the development of industry, IGBT modules have become important components in the field of power electronics. Various IGBT modules are increasingly developing towards high efficiency, high reliability, high integration, low cost and other characteristics. The static test mechanism of IGBT modules is no exception as a necessary equipment in power electronics laboratories.

[0003] Insulated Gate Bipolar Transistor, or IGBT, is a common semiconductor device that combines the advantages of metal oxide semiconductor field effect transistor and bipolar transistor, with a series of advantages such as high input impedance, low control power, simple drive circuit, high switching speed, high current density, low saturation voltage, and strong current handling capability.

[0004] IGBT modules need to be tested one by one before leaving the factory. Most of the test devices in the prior art use a lifting block to push the test platform upward, so that the IGBT enters the test machine for testing. After the test is completed, the test platform is reset downward under the action of gravity. At this time, the test platform will accelerate downward under the action of gravity, so that the speed of the test platform changes, which can easily cause the test platform to shake, thereby reducing the stability of the IGBT placement. At the same time, when the test platform continues to accelerate down and reset, the test platform will collide with the components of the device, thereby reducing the service life of the device. The impact can easily cause the IGBT to detach from the test platform, reducing the stability of the test platform when it is reset. Summary of the invention

[0005] The purpose of the present invention is to provide an IGBT module static test mechanism, aiming to solve the technical problem in the prior art that the test platform is reset under the action of gravity, causing the test platform and the device to impact, thereby reducing the reset stability of the test platform.

[0006] The present invention is implemented as follows: a static test mechanism for an IGBT module comprises a large frame plate, a test machine is fixedly mounted on the large frame plate through a test machine fixing frame, a mounting plate is arranged on the large frame plate, a hollow rotating platform driven by a servo motor is rotatably mounted on the mounting plate, the hollow rotating platform is provided with two groups of cantilevers and the test platform is slidably mounted on both groups of cantilevers, a lifting block driven by a servo lifting module is arranged on the mounting plate, a top plate is arranged on the lifting block, an electromagnet block is fixedly mounted on the top plate, and the electromagnet block is used in conjunction with a contact block fixedly mounted on the test platform.

[0007] Further technical solution: Both groups of cantilevers of the hollow rotating platform are provided with guide components for guiding the movement of the test platform.

[0008] Further technical solution: the frame plate is provided with an adjustment component for adjusting the position of the mounting plate.

[0009] Further technical solution: A jig plate is provided on the test platform, the jig plate is connected to the test platform through pins and magnets, and the jig plate and the jig are connected with an adjustable slot-shaped hole.

[0010] Further technical solution: two groups of symmetrically distributed L-shaped brackets are fixedly installed on the jacking block, a sliding frame is slidably installed on the bracket, and the end of the sliding frame is fixedly connected to the top plate.

[0011] Further technical solution: A fixing block driven by a telescopic member and used to fix the sliding frame is fixedly mounted on the bracket.

[0012] Further technical solution: A pressure sensor is arranged on the lifting block, and the pressure sensor is detachably connected to the lifting block. The pressure sensor is located in the projection area of ​​the top plate onto the lifting block. The pressure sensor is used in conjunction with a pressure plate slidably installed on the bracket, and an elastic part is fixedly installed on the pressure plate, and one end of the elastic part is fixedly connected to the top plate.

[0013] Further technical solution: A limit plate located on one side of the pressure sensor is fixedly installed on the lifting block, and the limit plate is used in conjunction with a clamping plate set on the lifting block and driven by screws. The clamping plate and the limit plate are distributed on both sides of the pressure sensor.

[0014] Compared with the prior art, the beneficial effects of the present invention are as follows: 1. The synchronous movement of the test platform and the lifting block is realized. The lifting block can quickly drive the test platform to reset, reducing the reset time of the test platform, thereby increasing the speed of subsequent replacement of IGBTs on the test platform, reducing the interval time of IGBT testing, and improving the test speed and efficiency of IGBTs. At the same time, the synchronous movement of the test platform and the lifting block avoids the shaking of the test platform caused by speed changes during the resetting process of the test platform, avoids the impact of the continuous linear acceleration of the test platform during the reset, and improves the stability of the test platform during the reset.

[0015] 2. The test platform is lifted at a fixed position by a single set of lifting blocks, realizing single-station lifting at a fixed position, ensuring the consistency and stability of the test platform during lifting and resetting, reducing the difference in lifting between different test platforms, and improving the stability of IGBT testing.

[0016] 3. The pressure of the IGBT during testing can be detected by the pressure sensor, so that the pressure during IGBT testing can be adjusted by controlling the rising position of the lifting block, so that the IGBT can be tested under the correct pressure to ensure the accuracy of the IGBT test structure. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the present invention.

[0018] Figure 2 It is a structural schematic diagram of the mounting plate in the present invention.

[0019] Figure 3 It is a structural schematic diagram of the servo jacking module in the present invention.

[0020] Figure 4 It is a schematic structural diagram of the jacking block in the present invention.

[0021] Figure 5 It is a schematic diagram of the cross-sectional structure of the jacking block in the present invention.

[0022] In the attached figure: 1. frame plate; 2. test machine fixing frame; 3. test machine; 4. mounting plate; 5. hollow rotating platform; 6. servo motor; 7. servo lifting module; 8. test platform; 9. lifting block; 10. bracket; 11. sliding frame; 12. top plate; 13. electromagnet block; 14. pressure sensor; 15. pressure plate; 16. elastic part; 17. splint; 18. limit plate; 19. telescopic part; 20. fixed block; 21. contact block; 22. guide assembly; 23. adjustment assembly. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0024] The specific implementation of the present invention is described in detail below in conjunction with specific embodiments.

[0025] like Figure 1-Figure 5As shown, a static test mechanism for an IGBT module provided by the present invention comprises a frame plate 1, a test machine 3 is fixedly mounted on the frame plate 1 through a test machine fixing frame 2, a mounting plate 4 is arranged on the frame plate 1, an adjustment component 23 for adjusting the position of the mounting plate 4 is arranged on the frame plate 1, a hollow rotating platform 5 driven by a servo motor 6 is rotatably mounted on the mounting plate 4, the hollow rotating platform 5 is provided with two groups of cantilevers and a test platform 8 is slidably mounted on both groups of cantilevers, a guide component 22 for guiding the movement of the test platform 8 is arranged on both groups of cantilevers of the hollow rotating platform 5, a lifting block 9 driven by a servo lifting module 7 is arranged on the mounting plate 4, a top plate 12 is arranged on the lifting block 9, an electromagnet block 13 is fixedly mounted on the top plate 12, and the electromagnet block 13 is used in conjunction with a contact block 21 fixedly mounted on the test platform 8.

[0026] In actual application of this embodiment, the position of the mounting plate 4 is first adjusted by adjusting the assembly 23 according to the test conditions, so that the hollow rotating platform 5 is located at a suitable test position, and the test can be carried out after the adjustment is completed; During the test, the IGBT to be tested is placed on one of the test platforms 8, and then the servo motor 6 drives the hollow rotating platform 5 to rotate 180 degrees, so that the IGBT to be tested moves to the bottom of the test machine 3, and then the servo lifting module 7 drives the lifting block 9 to move upward, and the lifting block 9 moves upward to make the electromagnet block 13 contact with the contact block 21. At this time, the electromagnet block 13 is energized to adsorb the contact block 21, and then the lifting block 9 can push the test platform 8 to move upward through the contact block 21, and the movement of the test platform 8 is guided and restricted by the guide component 22, so as to improve the stability of the test platform 8 during movement, so that the IGBT on the test platform 8 enters the test machine 3 for testing. After the test is completed, the servo lifting module 7 drives the lifting block 9 to move downward, and then the test platform 8 can be pulled downward synchronously through the electromagnet block 13. When the test platform 8 is reset, the electromagnet block 13 is powered off. At this time, the electromagnet block 13 can be disengaged from the contact block 21, thereby realizing the synchronous movement of the test platform 8 and the lifting block 9. The lifting block 9 can quickly drive the test platform 8 to reset, reducing the reset time of the test platform 8, thereby improving the speed of subsequent replacement of the IGBT on the test platform 8, reducing the interval time of the IGBT test, and improving the test speed and efficiency of the IGBT. At the same time, the synchronous movement of the test platform 8 and the lifting block 9 avoids the shaking of the test platform 8 caused by the change of speed during the resetting process of the test platform 8, avoids the impact of the continuous linear acceleration of the test platform 8 during the reset, and improves the stability of the test platform 8 during the reset. The test platform 8 is lifted at a fixed position by a single set of lifting blocks 9, realizing single-station lifting at a fixed position, ensuring the consistency and stability of the test platform 8 during lifting and resetting, reducing the difference between different test platforms 8 during lifting, and improving the stability of the IGBT test; While one group of IGBTs is being tested, another group of test platforms 8 is located outside the test machine 3. At this time, the IGBTs to be tested can be placed or replaced on the other group of test platforms 8. After the subsequent test is completed, the hollow rotating platform 5 can be rotated to swap the positions of the two groups of IGBTs, thereby realizing rapid loading and unloading of IGBTs, improving the loading and unloading speed of IGBTs, and further improving the testing speed and efficiency of IGBTs.

[0027] In one embodiment of the present invention, the guide component 22 is a linear guide rail, and of course it can also be other components with a guiding function such as a guide shaft. The movement of the test platform 8 is guided by the linear guide rail. The adjustment component 23 is a component that moves the mounting plate 4 driven by a threaded rod. Of course, other components such as electric poles or cylinders can also be used instead of the threaded rods to drive the mounting plate 4 to move. The servo lifting module 7 can also be replaced by other components with active length change such as electric cylinders or cylinders. The test platform 8 is lifted by the servo lifting module 7 to improve the stability of the test platform 8 during the rise.

[0028] like Figure 1 , Figure 2 As shown, a static test mechanism for an IGBT module provided by the present invention is provided with a jig plate on the test platform 8, the jig plate is connected to the test platform 8 through pins and magnets, and the jig plate and the jig are connected with an adjustable slot-shaped hole.

[0029] In actual application, since the jig plate and the jig are connected by an adjustable slot-shaped hole, the position of the product in the X direction can be adjusted, and the position of the testing machine 3 can be adjusted in the Y direction. This ensures that the alignment relationship between the product and the testing machine 3 is adjustable, so as to eliminate the misalignment caused by mechanical errors.

[0030] like Figure 1-Figure 5 As shown, a static test mechanism for an IGBT module provided by the present invention is provided. Two groups of symmetrically distributed L-shaped brackets 10 are fixedly mounted on the lifting block 9 , a sliding frame 11 is slidably mounted on the bracket 10 , and the end of the sliding frame 11 is fixedly connected to the top plate 12 .

[0031] Specifically, a fixing block 20 driven by a telescopic member 19 and used for fixing the sliding frame 11 is fixedly mounted on the bracket 10 .

[0032] Specifically, a pressure sensor 14 is provided on the lifting block 9, and the pressure sensor 14 is detachably connected to the lifting block 9. The pressure sensor 14 is located in the projection area of ​​the top plate 12 onto the lifting block 9. The pressure sensor 14 is used in conjunction with a pressure plate 15 slidably installed on the bracket 10. An elastic member 16 is fixedly installed on the pressure plate 15, and one end of the elastic member 16 is fixedly connected to the top plate 12.

[0033] Specifically, a limit plate 18 located on one side of the pressure sensor 14 is fixedly mounted on the lifting block 9 , and the limit plate 18 is used in conjunction with a clamping plate 17 driven by screws and arranged on the lifting block 9 . The clamping plate 17 and the limit plate 18 are distributed on both sides of the pressure sensor 14 .

[0034] In actual application, when the test platform 8 is lifted, the fixing block 20 on the sliding frame 11 is released. At this time, the servo lifting module 7 pushes the lifting block 9 to move upward so that the electromagnet block 13 contacts and adsorbs the contact block 21. Then, the lifting block 9 continues to rise. At this time, the top plate 12 will compress the elastic member 16 downward and generate pressure on the pressure sensor 14 through the pressure plate 15. When the force generated by the deformation of the elastic member 16 is the same as the gravity of the test platform 8, the lifting block 9 pushes the test platform 8 to move online so that the IGBT on the test platform 8 enters the test machine 3 for testing. When the IGBT contacts the test machine 3, if the lifting block 9 continues to move upward, the lifting block 9 will further compress the elastic member 16, thereby increasing the detection pressure between the IGBT and the test machine 3. The pressure of the IGBT when being detected can be detected by the pressure sensor 14, so that the pressure of the IGBT during detection can be adjusted by controlling the rising position of the lifting block 9, so that the IGBT can be tested under the correct pressure, ensuring the accuracy of the IGBT test structure; When the detection is completed, the telescopic member 19 drives the fixed block 20 to move toward the sliding frame 11, thereby pressing the sliding frame 11 onto the bracket 10 through the fixed block 20, so that the top plate 12 is fixedly connected to the lifting block 9. When the servo lifting module 7 drives the lifting block 9 to move downward, the top plate 12 moves downward synchronously with the lifting block 9. At the same time, since the electromagnet block 13 contacts and adsorbs the contact block 21, the lifting block 9 will drive the test platform 8 to move downward synchronously so that the IGBT on the test platform 8 is separated from the test machine 3. When the test platform 8 moves to the bottom, the electromagnet block 13 is powered off and no longer adsorbed with the contact block 21. At this time, the top plate 12 can be separated from the contact block 21, and the subsequent hollow rotating platform 5 can drive the test platform 8 to rotate to replace the IGBT after test, thereby realizing the stable and controllable rising and falling speeds of the test platform 8, ensuring that the test platform 8 can move synchronously with the lifting block 9 when rising and falling, avoiding shaking when the test platform 8 rises and falls, and improving the stability of the IGBT placed on the test platform 8. At the same time, the test platform 8 follows the jacking block 9 to descend, which increases the descending speed of the test platform 8, thereby reducing the time for the test platform 8 to be reset when it leaves the test machine 3, further improving the replacement speed of the IGBT, and improving the testing speed and efficiency of the IGBT.

[0035] In one embodiment of the present invention, the telescopic member 19 is an electric telescopic rod, and of course it can also be other components such as a hydraulic cylinder that can actively change the length. The electric telescopic rod drives the fixed block 20 to move, thereby achieving a fixed connection between the top plate 12 and the jacking block 9.

[0036] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

[0037] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. An IGBT module static test mechanism, comprising a frame plate (1), on which a test machine (3) is fixedly mounted via a test machine fixing frame (2), characterized in that: The frame plate (1) is provided with a mounting plate (4), a hollow rotating platform (5) driven by a servo motor (6) is rotatably mounted on the mounting plate (4), the hollow rotating platform (5) is provided with two groups of cantilevers and a test platform (8) is slidably mounted on both groups of cantilevers, a lifting block (9) driven by a servo lifting module (7) is provided on the mounting plate (4), a top plate (12) is provided on the lifting block (9), an electromagnet block (13) is fixedly mounted on the top plate (12), and the electromagnet block (13) is used in conjunction with a contact block (21) fixedly mounted on the test platform (8).

2. An IGBT module static test mechanism according to claim 1, characterized in that: Both sets of cantilevers of the hollow rotating platform (5) are provided with guide components (22) for guiding the movement of the test platform (8).

3. The IGBT module static testing mechanism according to claim 1, characterized in that: The frame plate (1) is provided with an adjustment component (23) for adjusting the position of the mounting plate (4).

4. The IGBT module static test mechanism according to claim 1, characterized in that: The test platform (8) is provided with a jig plate, the jig plate is connected to the test platform (8) via pins and magnets, and the jig plate and the jig are connected via an adjustable slot-shaped hole.

5. The IGBT module static testing mechanism according to claim 1, characterized in that: Two groups of symmetrically distributed L-shaped brackets (10) are fixedly mounted on the lifting block (9), a sliding frame (11) is slidably mounted on the bracket (10), and the end of the sliding frame (11) is fixedly connected to the top plate (12).

6. The IGBT module static testing mechanism according to claim 5, characterized in that: A fixing block (20) driven by a telescopic member (19) and used to fix the sliding frame (11) is fixedly mounted on the bracket (10).

7. An IGBT module static testing mechanism according to claim 6, characterized in that: A pressure sensor (14) is provided on the lifting block (9), and the pressure sensor (14) is detachably connected to the lifting block (9). The pressure sensor (14) is located in a projection area of ​​the top plate (12) onto the lifting block (9). The pressure sensor (14) is used in conjunction with a pressure plate (15) slidably mounted on the bracket (10), and an elastic member (16) is fixedly mounted on the pressure plate (15), and one end of the elastic member (16) is fixedly connected to the top plate (12).

8. An IGBT module static testing mechanism according to claim 7, characterized in that: A limit plate (18) located on one side of the pressure sensor (14) is fixedly mounted on the lifting block (9); the limit plate (18) cooperates with a clamping plate (17) provided on the lifting block (9) and driven by screws; the clamping plate (17) and the limit plate (18) are distributed on both sides of the pressure sensor (14).

Images