A method and system for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube
By constructing a growth kinetic model to calculate the thickness of the oxide film in the inner wall of Ni-Cr-M-based high-temperature alloy tube, the limitations of the traditional method are solved, and the oxide film thickness is efficiently and non-destructively predicted, ensuring the safety and economicality of the unit.
Patent Information
- Application Number
- CN202411446778.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-16
- Publication Date
- 2025-09-02
- Estimated Expiration
- 2044-10-16
AI Technical Summary
The prior art cannot effectively predict the thickness of the surface oxide film when high-grade heat-resistant steels and high-temperature alloys are exposed for a long time in supercritical water vapor. The traditional method is destructive and costly, and is not suitable for a wide range of alloy materials and temperature ranges.
By constructing a growth kinetic model of the oxide film, combining the type of oxide film and the service temperature of the alloy tube, the weight gain per unit area is calculated and the thickness of the oxide film is obtained. The method and system for obtaining the thickness of the oxide film in the inner wall of the Ni-Cr-M-based high-temperature alloy tube is used to avoid cutting tube measurement and high-temperature autoclave tests.
Quickly obtain the thickness of oxide films grown by high-grade heat-resistant steel and high-temperature alloys at any temperature and time, reduce the difficulty and cost of testing, predict the thinning of the inner wall of the boiler tube, provide a reference for the remaining life of the components, and ensure the safe operation of the unit.
Smart Images

Figure CN119400256B_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the technical field of detecting the thickness of an oxide film on the inner wall of a high-temperature alloy tube, and relates to a method and a system for obtaining the thickness of an oxide film on the inner wall of a Ni-Cr-M based high-temperature alloy tube. Background Art
[0002] High-temperature boiler tubes, a key heat channel component in coal-fired power plants, are subject to long-term corrosion from high-temperature steam, which easily forms an oxide film on their inner walls. This creates several problems: First, the effective wall thickness required to withstand pressure is reduced, making the tubes susceptible to creep fracture. Second, the oxide film, with its low thermal conductivity, acts as a shield for the tubes, leading to overheating. Furthermore, during power plant startup and shutdown, the oxide film is prone to flaking due to the significant difference in thermal expansion coefficient with the alloy. This flaked film can clog elbows and other locations, causing overheating and tube bursts. Furthermore, it can be carried away by high-velocity steam, eroding high- and intermediate-pressure turbine blades, seriously impacting the safety, reliability, and economic efficiency of the unit. Therefore, simulating the type and growth rate of the oxide film on the inner walls of coal-fired power plant boiler tubes and developing a corresponding model to predict the thickness of the oxide film and the resulting metal wall thinning, thereby providing early warning, is a critical issue that needs to be addressed in power plant design and operation and maintenance.
[0003] Current research on the oxide film on the inner wall of coal-fired power plant boiler tubes focuses primarily on measuring and online monitoring the oxide film's thickness. However, traditional oxide film thickness measurement methods require cutting the tube after shutdown, followed by inlaying, grinding, and polishing, which are destructive and costly. Patent CN201911396580.X provides a method for calculating the oxide film thickness of martensitic heat-resistant steel under supercritical high-temperature steam. This method can predict the oxide film thickness without cutting the tube, but it has significant limitations. First, it is only applicable to martensitic heat-resistant steel, particularly 9% Cr martensitic heat-resistant steel, on which the Fe-rich oxide film grows on the surface, controlled by the outward diffusion of metal cations and the inward diffusion of oxygen-containing anions. Second, it is applicable for a duration of no more than 20,000 hours and a temperature no higher than 700°C. Obviously, this prediction method is not applicable to the currently widely used 18%Cr-8%Ni series austenitic heat-resistant steels, 25%Cr austenitic heat-resistant steel HR3C, and future higher-grade heat-resistant steels or high-temperature alloys. Moreover, the time and temperature ranges specified in the patent are far from sufficient for the design service life of 20 to 30 years and the new generation of 650℃ and higher-grade ultra-supercritical coal-fired power plants (whose high-temperature boiler tube wall temperature exceeds 700℃). Summary of the Invention
[0004] In response to the problems existing in the prior art, the present invention provides a method and system for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M-based high-temperature alloy tube, thereby solving the difficult problem that the prior art cannot effectively predict the thickness of the oxide film generated on the surface of high-grade heat-resistant steel and high-temperature alloys when exposed to supercritical water vapor for a long time.
[0005] The present invention is achieved through the following technical solutions:
[0006] A method for obtaining the thickness of an oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube comprises the following steps:
[0007] S1: Obtaining the type of the oxide film, and constructing a growth kinetics model of the oxide film according to the type of the oxide film and the service temperature of the alloy tube;
[0008] S2: Obtaining the weight gain per unit area of the alloy tube to be evaluated according to the growth kinetics model;
[0009] S3: Obtaining the oxide film thickness on the inner wall of the alloy tube to be evaluated according to the weight gain per unit area.
[0010] Preferably, the growth kinetics model is specifically:
[0011] Δw 2 =a+k p ×t
[0012] Where Δw is the weight gain per unit area of the alloy tube, a and k p are constants, and t is the service time.
[0013] Preferably, step S2 is specifically as follows:
[0014]
[0015] Where x is the thickness of the oxide film; Oxide film B m O n The relative molecular mass; M o is the relative atomic mass of oxygen; ρ is the oxide film B m O n density of the oxide film; m and n are the density of the oxide film B m O n The number of metal atoms and oxygen atoms in the ion.
[0016] Preferably, the service temperature range of the alloy tube is 650°C to 750°C.
[0017] Preferably, the service steam pressure of the alloy tube is 0.1 MPa to 35 MPa.
[0018] Preferably, the service life of the alloy tube is 1000 hours to 100,000 hours.
[0019] A system for obtaining the thickness of an oxide film on the inner wall of a Ni-Cr-M-based high-temperature alloy tube, comprising:
[0020] A data acquisition unit, the data acquisition unit is used to acquire the type of the oxide film and construct a growth kinetics model of the oxide film according to the type of the oxide film and the service temperature of the alloy tube;
[0021] a first data processing unit, configured to obtain a weight gain per unit area of the alloy tube to be evaluated according to the growth kinetics model;
[0022] The second data processing unit is used to obtain the thickness of the oxide film on the inner wall of the alloy tube to be evaluated according to the weight gain per unit area.
[0023] A computer device / apparatus / system comprises a memory, a processor and a computer program stored in the memory, wherein the processor executes the computer program to implement the steps of the above method.
[0024] A computer-readable storage medium stores a computer program, wherein the computer program / instructions are executed by a processor to implement the steps of the above method.
[0025] A computer program product comprises a computer program / instruction, which implements the steps of the above method when executed by a processor.
[0026] Compared with the prior art, the present invention has the following beneficial technical effects:
[0027] The present invention discloses a method for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M-based high-temperature alloy tube. First, the type of oxide film is obtained, and a growth kinetics model of the oxide film is constructed based on the type of oxide film and the service temperature of the alloy tube. Then, the weight gain per unit area of the alloy tube to be evaluated is obtained based on the growth kinetics model. Finally, the thickness of the oxide film on the inner wall of the alloy tube to be evaluated is obtained based on the weight gain per unit area. This method combines the growth kinetics of the oxide film and, based on the classical Wagner theory, can quickly obtain the thickness of the oxide film grown on the surface of high-grade heat-resistant steel and high-temperature alloys at any temperature and time without having to cut the tube for measurement or measure after testing in a high-temperature autoclave, thereby reducing the difficulty of testing and saving costs. At the same time, this method can also predict the thickness of the thinned inner wall of the boiler tube, providing a reference for calculating the remaining life of the components and helping to ensure the safe operation of the unit. BRIEF DESCRIPTION OF THE DRAWINGS
[0028] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.
[0029] Figure 1 Schematic diagram of a process for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube according to the present invention;
[0030] Figure 2 The figure is a structural diagram of a system for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube in the present invention. DETAILED DESCRIPTION
[0031] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in various different configurations.
[0032] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention as claimed, but rather merely represents selected embodiments of the present invention. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort shall fall within the scope of protection of the present invention.
[0033] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.
[0034] In the description of the embodiments of the present invention, it should be noted that if the terms "upper," "lower," "horizontal," "inner," etc. appear, the orientation or positional relationship indicated is based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship in which the inventive product is typically placed when in use. These terms are merely for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or component referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. In addition, the terms "first," "second," etc. are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0035] In addition, if the term "horizontal" appears, it does not mean that the component must be absolutely horizontal, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.
[0036] In the description of the embodiments of the present invention, it should be noted that, unless otherwise expressly specified or limited, the terms "disposed," "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal connections between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.
[0037] The present invention is described in further detail below with reference to the accompanying drawings:
[0038] Example 1
[0039] like Figure 1 As shown, the present invention discloses a method for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube, comprising the following steps:
[0040] S1: Obtaining the type of the oxide film, and constructing a growth kinetics model of the oxide film according to the type of the oxide film and the service temperature of the alloy tube;
[0041] The growth kinetics model is specifically:
[0042] Δw 2 =a+k p ×t
[0043] Where Δw is the weight gain per unit area of the alloy tube, a and k p are constants, and t is the service time.
[0044] S2: Obtaining the weight gain per unit area of the alloy tube to be evaluated according to the growth kinetics model;
[0045] S3: Obtaining the oxide film thickness on the inner wall of the alloy tube to be evaluated according to the weight gain per unit area.
[0046] Specifically, the thickness of the oxide film on the inner wall of the alloy tube is calculated according to the following formula:
[0047]
[0048] Where x is the thickness of the oxide film; Oxide film B m O n The relative molecular mass; M ois the relative atomic mass of oxygen; ρ is the oxide film B m O n density of the oxide film; m and n are the density of the oxide film B m O n The number of metal atoms and oxygen atoms in the ion.
[0049] The oxide film in the present invention can be Cr2O3. Furthermore, the service temperature range of the Ni-Cr-M-based superalloy tube in the present invention is 650°C to 750°C, the service steam pressure is 0.1 MPa to 35 MPa, and the service time is 1000 to 100,000 hours. Specifically, the present invention provides a method for predicting the thickness of the oxide film formed on the surface of Ni-Cr-M-based superalloys used in high-grade, high-temperature boiler tubes under operating conditions ranging from 650°C to 750°C, 0.1 MPa to 35 MPa, and for 1000 to 100,000 hours. This method overcomes the limitations of existing technologies regarding boiler tube alloy material, oxide film type, service temperature, and service time. By combining oxide film type and oxide film growth kinetics, and based on the classical Wagner theory, the thickness of the Cr2O3 oxide film grown on the surface of high-grade heat-resistant steel and superalloys at any temperature and time can be rapidly calculated, eliminating the need for cutting the tube for measurement or conducting post-test measurements in a high-temperature autoclave, thereby reducing testing difficulty and saving costs. At the same time, this method can also predict the thickness of the inner wall of the boiler tube, providing a reference for calculating the remaining life of the components and helping to ensure the safe operation of the unit.
[0050] That is, the present invention discloses a method for calculating the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube, comprising:
[0051] Determine the structure of the oxide film on the inner wall of Ni-Cr-M based high temperature alloy tubes;
[0052] Establish a growth kinetics model of the oxide film on the inner wall of the alloy tube;
[0053] Calculate the thickness of the oxide film at any temperature and at any time based on the structure and growth dynamics of the oxide film on the inner wall of the alloy tube;
[0054] Based on the growth mechanism of the oxide film on the inner wall of the alloy tube and its thickness at a specific temperature and time, the thickness reduction of the inner wall of the alloy tube at the temperature and time is calculated.
[0055] A continuous Cr2O3 oxide film is formed on the inner wall of the Ni-Cr-M based high temperature alloy tube under high temperature steam.
[0056] The growth kinetics of the Cr2O3 oxide film follows a parabolic law, namely:
[0057] Δw 2 =a+k p ×t
[0058] Where a is a constant; k p is the parabolic rate constant in mg 2 / cm 4 / h; t is time, unit is h.
[0059] When the oxide film is Cr2O3, the thickness of the oxide film is:
[0060]
[0061] Where x is the thickness of the oxide film in μm; Δw is the weight gain per unit area in mg / cm 2 ; is the relative molecular mass of Cr2O3; M o is the relative atomic mass of oxygen; is the density of Cr2O3, in g / cm 3 .
[0062] The amount of thinning of the alloy tube wall caused by the growth of the oxide film is approximately equal to the thickness of the oxide film.
[0063] Example 2
[0064] In order to further explain the technical solution of the present invention, it is described through the following examples:
[0065] The oxide film used in the technical solution of the present invention is Cr2O3, and it grows stably under high-temperature steam. That is, the Cr2O3 oxide film formed on the metal surface is continuous, dense and complete. As time goes by, the oxidation reaction continues. The growth of the Cr2O3 oxide film is mainly controlled by the diffusion of oxygen-containing anions. New oxides form on the alloy surface and grow inward, and the Cr2O3 thickens. According to Wagner theory, the growth dynamics of this oxide film, which is controlled by anion migration, follows a parabolic law, namely:
[0066] Δw 2 =a+k p ×t
[0067] Where a is a constant; k p is the parabolic rate constant in mg 2 / cm 4 / h; t is time, unit is h.
[0068] Plotting Δw 2 The relationship curve with t is a straight line, and the slope of the straight line is k pThe intercept of the straight line is the a value. From this, we can obtain the weight gain per unit area of the metal at a specific temperature and at any time. Considering that the weight gain per unit area of the metal is caused by the oxygen participating in the reaction, the mass percentage of oxygen in the formed oxide film Cr2O3 is:
[0069]
[0070] Among them, M o is the relative atomic mass of oxygen, is the relative molecular mass of Cr2O3, the thickness of the oxide film Cr2O3 can be calculated by the following formula:
[0071]
[0072] Where x is the thickness of the oxide film, in μm; Δw is the weight gain per unit area of metal, in mg / cm 2 ; is the relative molecular mass of Cr2O3; M o is the relative atomic mass of oxygen; is the density of Cr2O3, in g / cm 3 .
[0073] In water vapor at different temperatures, k p The value is different from the a value, so by measuring the k at different temperatures p The value of and a can be used to further calculate the oxide film weight gain at any time at this temperature, and finally obtain the corresponding oxide film thickness.
[0074] Since the growth of Cr2O3 in a water vapor environment is caused by oxygen-containing anions (OH - or O 2- ) is dominated by the inward diffusion of the oxide film, and new Cr2O3 is formed at the interface between the oxide film and the substrate. The thickness of the oxide film is the thinning amount of the alloy tube wall.
[0075] High-grade heat-resistant steel and high-temperature alloys will be used in the new generation of ultra-supercritical coal-fired units, with a service temperature range of 650°C to 750°C and a pressure range of 28MPa to 35MPa. Therefore, the applicable temperature range of the technical solution of the present invention is 650°C to 750°C, the steam pressure range is 0.1MPa to 35MPa, and the time range is 1000h to 100000h.
[0076] Example 3
[0077] The technical solution of the present invention is further explained by the following examples:
[0078] Comparison of the calculation method involved in the present invention with the oxidation test results of GH4070 under high temperature steam.
[0079] When the high-temperature alloy GH4070 is oxidized under 700℃ / 750℃ / 0.1MPa steam conditions, a single Cr2O3 oxide film is formed on the surface. Its growth kinetics follows a parabolic law. At the corresponding temperature, k p The values of a and a are 4.058 and 0.0138, 2.048 and 0.0535 respectively. The weight gain per unit area at 1000h and 10000h is calculated, and the thickness of the oxide film calculated by the method of the present invention is compared with the thickness obtained by experimental measurement. The results are shown in Table 1. It can be seen that the thickness obtained by calculation is very close to the thickness obtained by experimental measurement.
[0080] Table 1 Comparison of the oxide film thickness predicted by the present invention for GH4070 alloy under high temperature steam and the measured thickness
[0081]
[0082] Example 4
[0083] Comparison between the calculation method involved in the present invention and the oxidation test results of a certain high-temperature alloy under supercritical water vapor.
[0084] A high-temperature alloy was oxidized under 700°C / 20 MPa steam conditions, forming a single Cr2O3 oxide film on its surface. Its growth kinetics followed a parabolic law. The weight gain per unit area was calculated at 1000 h, 2000 h, and 3000 h. The oxide film thickness was also calculated using the method of the present invention and compared with the thickness obtained from experimental measurements. The results are shown in Table 2. It can be seen that the calculated thickness is very close to the experimentally measured thickness.
[0085] Table 2 Comparison of the oxide film thickness predicted by the present invention and the measured thickness of a certain alloy in supercritical water
[0086] Time / h Measured thickness / μm Predicted thickness / μm Error percentage / % 1000 0.58 0.62 6.9 2000 0.69 0.74 7.2 3000 0.92 0.84 8.7
[0087] Example 5
[0088] The application of the calculation method involved in the present invention in an actual power plant environment.
[0089] A supercritical test platform had a steam pressure of approximately 24.9 MPa, a temperature of 740-744°C, and a service life of 35,573 hours. The pipe alloy was Ni-Cr-Co based, and a continuous Cr2O3 film formed on the surface. The thickness of the Cr2O3 film, calculated using the present invention's method, was 7.06 μm, while the actual measured thickness was 4-6 μm.
[0090] Example 6
[0091] The present invention relates to the application of the calculation method in a real power plant environment.
[0092] A certain ultra-supercritical test platform operated at a steam pressure of approximately 24.9 MPa, a temperature of 700°C, and a service life of 11,000 hours. The pipe alloy was Ni-Fe-based, and a dense Cr2O3 layer formed on the surface. The thickness of the Cr2O3 film was calculated using the method of the present invention to be 4.12 μm, while the actual thickness was measured to be 3.15 ± 1.02 μm. Furthermore, the wall thickness reduction of the pipe was calculated using the method of the present invention to be 4.12 μm, while the actual wall thickness reduction was 3.75 μm, with a percentage error of 9.8%.
[0093] The above examples show that the thickness of the oxide film formed on the inner wall of the Ni-Cr-M based high temperature alloy tube under high temperature steam and the resulting wall thickness reduction calculated by the method of the present invention are in good agreement with the actual measurement results, with an error within 10%.
[0094] like Figure 2 As shown, the present invention also discloses a system for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube, comprising:
[0095] A data acquisition unit, the data acquisition unit being used to acquire the weight gain per unit area of the alloy tube to be evaluated according to a pre-established growth kinetics model;
[0096] A data processing unit is used to obtain the thickness of the oxide film on the inner wall of the alloy tube to be evaluated according to the weight gain per unit area.
[0097] In addition, a schematic diagram of a terminal device is provided in one embodiment of the present invention. The terminal device in this embodiment includes: a processor, a memory, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of each of the aforementioned method embodiments are implemented. Alternatively, when the processor executes the computer program, the functions of each module / unit in each of the aforementioned device embodiments are implemented.
[0098] The computer program may be divided into one or more modules / units, which are stored in the memory and executed by the processor to accomplish the present invention.
[0099] The terminal device may be a computing device such as a desktop computer, a notebook computer, a PDA, a cloud server, etc. The terminal device may include, but is not limited to, a processor and a memory.
[0100] The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc.
[0101] The memory may be used to store the computer programs and / or modules, and the processor implements various functions of the terminal device by running or executing the computer programs and / or modules stored in the memory and calling the data stored in the memory.
[0102] If the module / unit integrated in the terminal device is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the process in the above-mentioned embodiment method, and can also be completed by a computer program to instruct the relevant hardware. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, it can implement the steps of each of the above-mentioned method embodiments. The computer program includes computer program code, which can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media does not include electric carrier signals and telecommunication signals. The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations of the present invention are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.
[0103] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations of the present invention are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.
Claims
1. A method for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube, characterized in that: The following steps are involved: S1: Obtaining the type of the oxide film, and constructing a growth kinetics model of the oxide film according to the type of the oxide film and the service temperature of the alloy tube; S2: Obtaining the weight gain per unit area of the alloy tube to be evaluated according to the growth kinetics model; S3: Obtaining the thickness of the oxide film on the inner wall of the alloy tube to be evaluated according to the weight gain per unit area; The growth kinetics model is specifically: Where, is the weight gain per unit area of the alloy tube, as well as constant, For service time; Step S2 is specifically as follows: Where, is the oxide film thickness; Oxide film The relative molecular mass; is the relative atomic mass of oxygen; Oxide film density; and Oxide film The number of metal atoms and oxygen atoms in the ion.
2. The method for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube according to claim 1, characterized in that: The service temperature range of the alloy tube is 650°C to 750°C.
3. The method for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube according to claim 1, characterized in that: The service steam pressure of the alloy tube is 0.1 MPa~35 MPa.
4. The method for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube according to claim 1, characterized in that: The service life of the alloy tube is 1000h~100000h.
5. A system for obtaining the thickness of the oxide film on the inner wall of a Ni-Cr-M based high temperature alloy tube, characterized in that: include: A data acquisition unit, the data acquisition unit is used to acquire the type of the oxide film and construct a growth kinetics model of the oxide film according to the type of the oxide film and the service temperature of the alloy tube; a first data processing unit, configured to obtain a weight gain per unit area of the alloy tube to be evaluated according to the growth kinetics model; a second data processing unit, configured to obtain the thickness of the oxide film on the inner wall of the alloy tube to be evaluated according to the weight gain per unit area; The growth kinetics model is specifically: Where, is the weight gain per unit area of the alloy tube, as well as constant, For service time; The weight gain per unit area of the alloy tube to be evaluated is obtained according to the growth kinetics model, specifically: Where, is the oxide film thickness; Oxide film The relative molecular mass; is the relative atomic mass of oxygen; Oxide film density; and Oxide film The number of metal atoms and oxygen atoms in the ion.
6. A computer device / apparatus / system comprising a memory, a processor, and a computer program stored in the memory, characterized in that: The processor executes the computer program to implement the steps of the method according to any one of claims 1 to 4.
7. A computer-readable storage medium storing a computer program, characterized in that: When the computer program / instructions are executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.
8. A computer program product comprising a computer program / instructions, characterized in that When the computer program / instruction is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.
Citation Information
Patent Citations
Method for calculating thickness of oxide film of martensite heat-resistant steel under supercritical high-temperature steam
CN111161806A
Calculation method of zirconium alloy corrosion behavior
CN116631524A
Method and system for predicting growth of oxidation film on surface of piercing plug of seamless steel pipe
CN118262839A