Mold system, parameter debugging method and equipment

Abstract

The present application relates to the field of intelligent control technology, and specifically to a mold system, parameter debugging method and equipment. The method includes: obtaining the measured values ​​of multiple key parameters of the mold system; determining the deviation between the measured values ​​and theoretical values ​​of the multiple key parameters; determining the associated impact values ​​of the multiple key parameters on stable production based on the deviations of the multiple key parameters; determining whether to trigger parameter debugging of the mold system based on the associated impact values; if it is determined that the parameter debugging of the mold system is triggered, selecting target key parameters from the multiple key parameters; and performing parameter debugging on the target key parameters. The embodiment of the present invention can debug parameters according to the superimposed impact of each key parameter on stable production, provide a reasonable basis for debugging parameters, and improve debugging efficiency.

Description

Technical Field

[0001] The present application relates to the field of intelligent control technology, and specifically to a mold system, parameter debugging method and equipment. Background Art

[0002] Traditionally, mold system debugging involves adjusting parameters related to the mold, stamping equipment, or production materials. Each debugging session requires trial and error to achieve a balance between parameters and stable production. However, this trial-and-error approach to parameter debugging results in significant waste of resources, including personnel, equipment, raw materials, utilities, electricity, gas, and space. It also wastes debugging time, and it can be difficult to determine whether the parameters are correct after debugging. Therefore, efficiently debugging mold system parameters has become a technical challenge that needs to be addressed. Summary of the Invention

[0003] In view of this, the present application provides a mold system, parameter debugging method and equipment, which can debug parameters according to the superimposed impact of each key parameter on stable production, provide a reasonable basis for debugging parameters, and improve debugging efficiency.

[0004] In a first aspect, an embodiment of the present invention provides a parameter debugging method for a mold system, comprising:

[0005] Obtain the measured values ​​of multiple key parameters of the mold system;

[0006] Determining the deviation between the measured values ​​and the theoretical values ​​of the plurality of key parameters;

[0007] Determining, based on the deviations of the multiple key parameters, associated impact values ​​of the multiple key parameters on stable production;

[0008] determining whether to trigger parameter debugging of the mold system according to the associated impact value;

[0009] If it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters;

[0010] Parameter debugging is performed on the target key parameters.

[0011] In some embodiments, determining the deviations between the measured values ​​and theoretical values ​​of the plurality of key parameters comprises:

[0012] respectively determining the differences between the theoretical values ​​and the measured values ​​of the plurality of key parameters;

[0013] The difference rates of the multiple key parameters are determined respectively according to the ratios of the difference values ​​of the multiple key parameters to the corresponding theoretical values, and the difference rates are used to represent the deviations between the measured values ​​and the theoretical values ​​of the key parameters.

[0014] In some embodiments, determining the associated impact values ​​of the multiple key parameters on stable production based on the deviations of the multiple key parameters includes:

[0015] The difference rates of the multiple key parameters are weighted to obtain the associated impact value.

[0016] In some embodiments, determining whether to trigger parameter debugging of the mold system according to the associated impact value includes:

[0017] If the associated impact value is greater than a first set value, it is determined to trigger parameter debugging of the mold system.

[0018] In some embodiments, if it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the plurality of key parameters includes:

[0019] The key parameter whose deviation is within the preset adjustable range is selected as the target key parameter.

[0020] In some embodiments, the performing parameter debugging on the target key parameter includes:

[0021] Determining the parameter adjustment amount and adjustment direction based on the difference between the theoretical value and the measured value of the target key parameter;

[0022] According to the parameter adjustment amount and adjustment direction, the target key parameter is adjusted; wherein,

[0023] The parameter adjustment amount is smaller than the absolute value of the difference between the theoretical value and the measured value of the target key parameter;

[0024] The adjustment direction is to approach the theoretical value of the target key parameter.

[0025] In some embodiments, determining the parameter adjustment amount based on the difference between the theoretical value and the measured value of the target key parameter includes:

[0026] If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than a second set value, determining a first adjustment amount;

[0027] Adjusting the target key parameter in a direction approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value;

[0028] Based on the second set value, the target key parameter continues to be adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value.

[0029] In some embodiments, the step of continuing to adjust the target key parameter multiple times based on the second set value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value includes:

[0030] determining a second adjustment amount according to the second set value and the number of steps;

[0031] adjusting the target key parameter in a direction approaching the theoretical value according to the second adjustment amount;

[0032] determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value;

[0033] If yes, stop adjusting the target key parameter;

[0034] If not, determine the third adjustment amount based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, and continue to adjust the target key parameter until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0035] In some embodiments, the method further includes: if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to a second set value, then adjusting the target key parameter in multiple times according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps, until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0036] In some embodiments, before determining whether to trigger parameter debugging of the mold system according to the associated impact value, the method further includes:

[0037] The plurality of key parameters are debugged independently, and the absolute value of the difference between the theoretical value and the measured value of each key parameter after independent debugging is less than the fourth set value

[0038] In a second aspect, an embodiment of the present invention provides a control device, comprising: at least one processor; and at least one memory communicatively connected to the processor, wherein: the memory stores program instructions that can be executed by the processor, and the processor calls the program instructions to execute the method described in the first aspect or any one of the first aspects.

[0039] In the third aspect, an embodiment of the present invention provides a mold system, comprising: a mold device, a sensing component for collecting the measured values ​​of multiple key parameters of the mold device in the mold system; a control device for receiving the measured values ​​of the multiple key parameters, and executing the method described in the first aspect or any one of the first aspects according to the measured values ​​of the multiple key parameters.

[0040] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, which includes a stored program, wherein when the program is running, the device where the computer-readable storage medium is located is controlled to execute the method described in the first aspect or any one of the first aspects.

[0041] The mold system, parameter debugging method, and device of the embodiments of the present invention have at least the following beneficial effects:

[0042] After obtaining the measured values ​​of each key parameter, the embodiment of the present invention determines the deviation between the measured value and the theoretical value of each key parameter. Based on the deviation of each key parameter, the associated impact of each key parameter on stable production can be determined. Based on this associated impact, it can be determined whether to perform parameter debugging and which key parameters to debug, thereby providing a basis for parameter debugging. The method of the embodiment of the present invention eliminates the need to blindly attempt to debug each parameter, avoids the waste caused by debugging each parameter, reduces debugging time, and improves debugging efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0044] Figure 1 A schematic diagram of a mold system provided by an embodiment of the present invention;

[0045] Figure 2 A flow chart of a method for debugging key parameters of a mold system provided by an embodiment of the present invention;

[0046] Figure 3 A flow chart of a method for parameter debugging based on the correlation between key parameters provided by an embodiment of the present invention;

[0047] Figure 4 A schematic structural diagram of a control device provided in an embodiment of the present invention;

[0048] Figure 5 A schematic structural diagram of a control device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0049] In order to better understand the technical solution of the present application, the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0050] It should be clear that the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0051] The terms used in the embodiments of the present application are for the purpose of describing specific embodiments only and are not intended to limit the present application. The singular forms "a", "an", "the" and "the" used in the embodiments of the present application and the appended claims are also intended to include plural forms unless the context clearly indicates otherwise.

[0052] It should be understood that the term "and / or" as used herein simply describes a relationship between associated objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A alone, A and B together, or B alone. Furthermore, the character " / " in this document generally indicates an "or" relationship between the associated objects.

[0053] See also Figure 1 , is a schematic diagram of a mold system provided in an embodiment of the present invention. Figure 1 The mold system shown can be a mold system for a vehicle production line. Figure 1 As shown, the mold system includes mold equipment, a sensing component, and a control device. The mold equipment may include product molds and stamping equipment, among others. The sensing component is deployed on the mold equipment to collect measured values ​​of key parameters of the product molds and / or stamping equipment. The sensing component transmits the collected measured values ​​of the key parameters of the product molds and / or stamping equipment to the control device. The control device then executes a parameter debugging strategy based on the measured values ​​of the key parameters of the product molds and / or stamping equipment.

[0054] Figure 1After the mold equipment is installed in the mold system shown, the theoretical values ​​of the production parameters of the mold equipment are set, such as the theoretical values ​​of the various production parameters of the product mold and the stamping equipment, and then the mold system is run. During the operation of the mold system, the sensing component can collect the measured values ​​of the key parameters of the various production parameters of the product mold and / or the stamping equipment at a certain sampling frequency. It is inevitable that there may be deviations between the theoretical values ​​and the measured values ​​of the key parameters of the mold equipment. The deviations of the key parameters can form a parameter chain, and the deviation parameter chain formed by the key parameters will have a correlation effect on the stable production of the product, and then can trigger the parameter debugging of the mold system. The parameter debugging method of the present invention will be described in detail in conjunction with the embodiments below.

[0055] Figure 1 After installing the mold equipment in the mold system shown, the theoretical values ​​of various production parameters are set, and the mold system is then put into operation. During operation, the sensing components collect the measured values ​​of multiple key parameters of the mold equipment. The sensing components transmit these measured values ​​to the control device. The control device first independently adjusts each key parameter, ensuring that the difference between each parameter and the theoretical value after independent adjustment is within a controllable range. This independent adjustment of each key parameter ensures stable operation of the mold system to a certain extent.

[0056] See also Figure 2 , is a flow chart of a method for debugging key parameters of a mold system provided by an embodiment of the present invention. Figure 2 As shown, the processing steps of the method include:

[0057] 101, obtain the measured values ​​of each key parameter.

[0058] 102, determine the deviation between the measured value and the theoretical value of each key parameter.

[0059] 103. Determine whether the deviation of each key parameter is within the adjustable range. If the deviation of the key parameter is within the adjustable range, the corresponding key parameter is independently adjusted. If the deviation of the key parameter is less than the minimum boundary value of the adjustable range, the key parameter is not adjusted. If the deviation of the key parameter is greater than the maximum boundary value of the adjustable range, the mold system needs to be shut down for maintenance.

[0060] Among them, determining the deviation between the theoretical value and the measured value of the key parameter includes: determining the difference between the theoretical value and the measured value of the key parameter; and determining the difference rate of the key parameter based on the ratio between the difference and the theoretical value, and the difference rate is used to represent the deviation value between the measured value and the theoretical value of the key parameter.

[0061] In one example, let Fs be the theoretical value of the key parameter, Fa be the measured value of the key parameter, and α be the difference rate. Then the calculation formula for the difference rate of the key parameter can be:

[0062] Formula 1: α=(Fs-Fa) / Fs*100%.

[0063] When α is less than 0.05%, the mold system continues to execute; or when the absolute value of α is less than 0.05%, the mold system continues to execute.

[0064] When 0.05%≤α≤0.1%, it is determined that the key parameters of the mold system need to be debugged. Alternatively, when 0.05%≤the absolute value of α≤0.1%, it is determined that the key parameters of the mold system need to be debugged.

[0065] When α>0.1%, the difference rate of key parameters exceeds the adjustable range, and the mold system is controlled to stop for maintenance. Or, when the absolute value of α>0.1%, the difference rate of key parameters exceeds the adjustable range, and the mold system is controlled to stop for maintenance.

[0066] In the above example, if the difference rate is [0.05%, 0.1%] or the absolute value of the difference rate is [0.05%, 0.1%], it indicates that the key parameter is within the debuggable range, and the key parameter can be debugged. If the difference rate or the absolute value of the difference rate of the key parameter is less than the minimum boundary value of the debuggable range, the key parameter can be debugged. If the difference rate or the absolute value of the difference rate of the key parameter is greater than the maximum boundary value of the debuggable range, the mold system is controlled to shut down for maintenance.

[0067] When debugging key parameters, in order to avoid damage to the mold equipment or waste of materials, the single adjustment of key parameters should not be too large. Among them, the key parameters can be adjusted multiple times based on the difference between the theoretical value and the measured value of the key parameters. Specifically:

[0068] The parameter adjustment amount and adjustment direction are determined based on the difference between the theoretical value and the measured value of the key parameter. The key parameter is adjusted based on the parameter adjustment amount and adjustment direction; the parameter adjustment amount is less than the absolute value of the difference between the theoretical value and the measured value of the key parameter; and the adjustment direction is the direction that approaches the theoretical value of the key parameter.

[0069] Determining a parameter adjustment amount based on a difference between a theoretical value and a measured value of a key parameter includes: if the absolute value of the difference between the theoretical value and the measured value of the key parameter is greater than a second set value, determining a first adjustment amount; adjusting the key parameter in a direction toward the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the key parameter and the theoretical value is a second set value; and continuing to adjust the target key parameter multiple times based on the second set value until the absolute value of the difference between the key parameter and the theoretical value is less than a third set value.

[0070] The method further comprises: determining a second adjustment amount based on the second set value and the number of steps, adjusting the key parameter in a direction toward the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted key parameter and the theoretical value is less than the third set value; if so, stopping adjusting the key parameter; if not, determining a third adjustment amount based on the absolute value of the difference between the adjusted key parameter and the theoretical value and the number of steps, and continuing adjusting the key parameter until the absolute value of the difference between the key parameter and the theoretical value is less than the third set value.

[0071] Among them, if the absolute value of the difference between the theoretical value and the measured value of the key parameter is less than or equal to the second set value, the key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the key parameter and the number of steps until the absolute value of the difference between the key parameter and the theoretical value is less than the third set value.

[0072] In one example, when the absolute value of the difference between the theoretical value and the measured value of the key parameter is less than or equal to the second set value, the single adjustment amount αn of the key parameter can be determined according to Formula 2.

[0073] Formula 2: αn=(Fs-Fa) / n.

[0074] The value of n can be fixed. The magnitude of αn represents the single adjustment amount of the key parameter, and the positive or negative value of αn indicates the adjustment direction of the key parameter. When αn is a positive number, it means that the measured value of the key parameter is less than the theoretical value, and the key parameter needs to be adjusted in the direction of increase. When αn is a negative number, it means that the measured value of the key parameter is greater than the theoretical value, and the key parameter needs to be adjusted in the direction of decrease.

[0075] In some examples, the key parameters of the mold system include one or more of: production tonnage (a), production cycle (b), air cushion size (c), material inflow (d), mold closing height (e), mold temperature (f), and mold wear (g). Those skilled in the art can derive other parameters based on the listed parameters. For debugging methods for other parameters, refer to the debugging methods for established parameters.

[0076] In some examples, the tuning of various key parameters includes:

[0077] Production tonnage (a): Increase or decrease the output tonnage of the equipment;

[0078] Production pace (b): reduce or increase the pace;

[0079] Air cushion size (c): Increase or decrease the size of the air cushion output pressure source;

[0080] Material inflow (d): Increase or decrease the amount of material used;

[0081] Mould closing height (e): reduce or increase the closing height;

[0082] Mold temperature (f): Increase or decrease the flow rate of the cooling medium to reduce or increase the mold temperature;

[0083] Die wear (g): Increase or decrease the friction force;

[0084] (g): Increase or decrease the magnitude of friction.

[0085] Example 1:

[0086] The theoretical value of the mold closing height is 1000mm. During the production process, the closing height changes slightly, causing it to drop to 999mm. At this time, the product produced has cracking defects. The difference rate α = (1000-999) / 1000 = 0.1%, and the value of α is within the adjustable range. The control equipment to adjust the mold closing height includes:

[0087] Case 1: The difference between the theoretical value and the measured value of the mold closing height is 1mm, which is less than the set value of 2mm. Then debug the mold closing height in multiple times according to the following method:

[0088] The difference between the theoretical value and the measured value of the mold closing height is 1mm, that is, the total adjustment value is 1mm. The number of steps n = 5 times, then the adjustment amount each time is:

[0089] The amount of the first adjustment is α1 = (1000-999) / 5 = 0.2 mm;

[0090] The second adjustment amount is α2 = (1000-999.2) / 5 = 0.16mm;

[0091] The third adjustment amount is α3 = (1000-999.36) / 5 = 0.128mm;

[0092] When the difference between the adjusted value of the mold closing height and the theoretical value, that is, the total adjustment value, is less than 0.1 mm, the adjustment of the mold closing height is stopped.

[0093] Case 2: If the difference between the theoretical and measured mold closing heights is greater than the set value of 2mm, a quick adjustment of the mold closing height is permitted. The absolute value of the difference between the theoretical and adjusted mold closing heights is set at 2mm. The mold closing height can then be adjusted multiple times in steps, depending on the situation.

[0094] Case 3: The theoretical value of the mold closing height is smaller than the measured value. For example, if the theoretical value is 1000mm and the measured value is 1001mm, the adjustment direction is opposite to the above adjustment direction.

[0095] Example 2:

[0096] The theoretical production tonnage is 2000 tons, but the measured value is 1800 tons. Insufficient pressure can cause wrinkling or overlapping in the product. The discrepancy α = (2000-1800) / 2000 = 10%, and the machine should be shut down for maintenance. If the measured value is 1998 tons, the discrepancy α = (2000-1998) / 2000 = 0.1%. Adjust the production tonnage parameters according to Formula 2. See Example 1 for the adjustment method.

[0097] After each key parameter is independently debugged so that the absolute value of the difference between each key parameter and the theoretical value is within the third set value, the control device can superimpose the key parameters together to calculate the correlation between the key parameters, and then debug the mold system according to the correlation between the key parameters.

[0098] See also Figure 3 , is a flow chart of a method for parameter debugging based on the correlation between key parameters provided by an embodiment of the present invention. Figure 3 As shown, the processing steps of the method include:

[0099] 201, obtain measured values ​​of multiple key parameters of the mold system.

[0100] 202, determine the deviation between the measured values ​​and the theoretical values ​​of multiple key parameters.

[0101] 203. Determine, based on the deviations of the multiple key parameters, the associated impact values ​​of the multiple key parameters on stable production.

[0102] 204 : Determine whether to trigger debugging of mold system parameters according to the associated impact value.

[0103] 205 , if it is determined to trigger parameter debugging of the mold system, a target key parameter is selected from a plurality of key parameters.

[0104] 206 , perform parameter debugging on target key parameters.

[0105] The aforementioned key parameters may include one or more of: production tonnage (a), production cycle (b), air cushion size (c), material inflow (d), mold closing height (e), mold temperature (f), and mold wear (g). Those skilled in the art can derive other parameters based on the listed parameters. For debugging methods for other parameters, please refer to the debugging methods for established parameters.

[0106] The aforementioned multiple key parameters may have an associated impact on the stable production of the mold system. After obtaining the measured values ​​of the multiple key parameters, the associated impact values ​​on the stable production can be calculated based on the measured values ​​of the multiple key parameters.

[0107] In some embodiments, a functional relationship f(a, b, c, d, e, f, g) between the associated impact value β and the aforementioned multiple key parameters can be preset. After obtaining the measured values ​​of the multiple key parameters, the associated impact value β can be substituted into the functional relationship f(a, b, c, d, e, f, g) to obtain the associated impact value β.

[0108] In some embodiments, each key parameter has its own theoretical value. After obtaining the measured value of each key parameter, the difference between the theoretical value and the measured value of each key parameter can be determined. Based on the ratio between the difference value of each key parameter and the corresponding theoretical value, the difference rate of each key parameter can be determined, and the difference rate is used to represent the deviation between the measured value and the theoretical value of the key parameter. The calculation method of each key parameter difference rate can be referred to Formula 1.

[0109] In some embodiments, the difference rates of the above-mentioned multiple key parameters are weighted to obtain the correlation impact values ​​of the multiple key parameters on stable production. In one example, the correlation impact value β can be calculated according to the following formula 3.

[0110] Formula 3: β = a + b + c + d + e + f + g. a, b, c, d, e, f, and g are the differences between the key parameters (a), (b), (c), (d), (e), (f), and (g), respectively. In Formula 3, the values ​​of a, b, c, d, e, f, and g can be positive or negative.

[0111] In some embodiments, if the associated influence value is greater than a first set value, it is determined that parameter debugging of the mold system is triggered. For example, when the β value is ≤0.3, it indicates that the production of the mold system is stable and there is no need to trigger parameter debugging; when the β value is greater than 0.3, it indicates that the production of the mold system is unstable and it is necessary to trigger parameter debugging of the mold system. Optionally, after taking the absolute value of the associated influence value, it can be determined whether the absolute value of the associated influence value is greater than the first set value. If it is greater, it is determined that parameter debugging of the mold system is triggered. For example, when the absolute value of β is ≤0.3, it indicates that the production of the mold system is stable and there is no need to trigger parameter debugging; when the absolute value of β is greater than 0.3, it indicates that the production of the mold system is unstable and it is necessary to trigger parameter debugging of the mold system.

[0112] After triggering the parameter debugging of the mold system according to the associated influence value β, not all key parameters are debugged directly, but target key parameters are selected from multiple key parameters for debugging.

[0113] The method of selecting the target key parameter from the plurality of key parameters may include: selecting a key parameter whose deviation between a measured value and a theoretical value is within an adjustable range as the target key parameter.

[0114] The difference rate of each key parameter can be calculated according to Formula 1, and the target key parameter can be selected according to the rule corresponding to Formula 1, and the target key parameter can be debugged.

[0115] Among them, debugging the target key parameters includes: determining the parameter adjustment amount and adjustment direction based on the difference between the theoretical value and the measured value of the target key parameters; adjusting the target key parameters according to the parameter adjustment amount and adjustment direction; wherein the parameter adjustment amount is less than the absolute value of the difference between the theoretical value and the measured value of the target key parameters; the adjustment direction is to approach the theoretical value of the target key parameters.

[0116] Among them, the parameter adjustment amount is determined according to the difference between the theoretical value and the measured value of the target key parameter, including: if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than the second set value, then determine the first adjustment amount; according to the first adjustment amount, adjust the target key parameter in the direction of approaching the theoretical value, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value; based on the second set value, continue to adjust the target key parameter in multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value.

[0117] Among them, based on the second set value, the target key parameter is continued to be adjusted in multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value, including: determining the second adjustment amount according to the second set value and the number of steps; adjusting the target key parameter in the direction of approaching the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value; if so, stopping adjusting the target key parameter; if not, determining the third adjustment amount and continuing to adjust the target key parameter according to the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0118] Among them, if the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to the second set value, the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

[0119] The debugging method for the target key parameters can be found in the description above.

[0120] Corresponding to the parameter debugging method of the above mold system, the embodiment of the present invention also provides a structural diagram of a control device. Figure 4 As shown, the control device includes:

[0121] The acquisition module 301 is used to obtain measured values ​​of multiple key parameters of the mold system.

[0122] The determination module 302 is configured to determine the deviations between the measured values ​​and the theoretical values ​​of the multiple key parameters; and determine the associated impact values ​​of the multiple key parameters on stable production based on the deviations of the multiple key parameters.

[0123] The judgment module 303 is used to determine whether to trigger parameter debugging of the mold system according to the associated impact value.

[0124] The debugging module 304 is configured to select a target key parameter from the plurality of key parameters when determining to trigger parameter debugging of the mold system; and to perform parameter debugging on the target key parameter.

[0125] The control device of the embodiment of the present invention can execute the parameter debugging method of the embodiment shown above. For the parts not described in detail in this embodiment, please refer to the relevant description of the method embodiment. The execution process and technical effects of this technical solution are described in the embodiment shown in the method, and will not be repeated here.

[0126] See also Figure 5 , which is a structural diagram of a control device provided in an embodiment of the present invention. Figure 5 The control device shown is implemented in the form of a computer. Figure 5 As shown, the control device 400 may include: a processor 401, a memory 402, and a communication unit 403. These components communicate via one or more buses. Those skilled in the art will appreciate that the structure of the control device shown in the figure does not limit the embodiments of the present application. It may be a bus structure or a star structure, and may include more or fewer components than shown, or combine certain components, or arrange the components differently.

[0127] The communication unit 403 is configured to establish a communication channel so that the control device can communicate with other devices, receive user data sent by other devices, or send user data to other devices.

[0128] The processor 401 is the control center of the control device. It uses various interfaces and lines to connect the various parts of the entire control device. It runs or executes software programs, instructions, and / or modules stored in the memory 402, and calls data stored in the memory to perform various functions of the control device and / or process data. The processor can be composed of an integrated circuit (IC), for example, it can be composed of a single packaged IC, or it can be composed of multiple packaged ICs with the same or different functions. For example, the processor 401 can only include a central processing unit (CPU). In the embodiment of the present application, the CPU can be a single computing core or multiple computing cores.

[0129] The memory 402 is used to store the execution instructions of the processor 401. The memory 402 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0130] When the execution instruction in the memory 402 is executed by the processor 401, the control device 400 is able to execute Figure 1 Part or all of the steps of the parameter debugging method of the mold system in the illustrated embodiment.

[0131] In a specific implementation, the present application further provides a computer storage medium, wherein the computer storage medium may store a program, and when the program is executed, the program may include some or all of the steps of each embodiment of the printing method of the image forming device provided in the present application. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM).

[0132] In a specific implementation, the present application also provides a computer program product, wherein the computer program product includes executable instructions, which, when executed on a computer, enable the computer to execute some or all of the steps in each embodiment of the parameter debugging method of the mold system provided in the present application.

[0133] An embodiment of the present application further provides a non-transitory computer-readable storage medium, which stores computer instructions, and the computer instructions enable the computer to execute the method provided by the embodiment of the present application.

[0134] The above-mentioned non-transitory computer-readable storage medium can adopt any combination of one or more computer-readable media. The computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. The computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination thereof. More specific examples (non-exhaustive list) of computer-readable storage media include: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (Read On ly Memory; hereinafter referred to as: ROM), an erasable programmable read-only memory (Erasab leProgrammab le Read On ly Memory; hereinafter referred to as: EPROM) or flash memory, optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, device or device.

[0135] A computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, which carries computer-readable program code. Such a propagated data signal may take a variety of forms, including, but not limited to, electromagnetic signals, optical signals, or any suitable combination thereof. A computer-readable signal medium may also be any computer-readable medium other than a computer-readable storage medium that can transmit, propagate, or transport a program for use by or in conjunction with an instruction execution system, apparatus, or device.

[0136] Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

[0137] Those skilled in the art can clearly understand that the technology in the embodiments of the present application can be implemented by means of software plus the necessary general hardware platform. Based on this understanding, the technical solutions in the embodiments of the present application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product, which can be stored in a storage medium such as ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment of the present application or certain parts of the embodiments.

[0138] In this specification, reference can be made to the same or similar parts between the various embodiments. In particular, for the device embodiment and the terminal embodiment, since they are basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the description in the method embodiment.

Claims

1. A parameter debugging method for a mold system, characterized in that: include: Obtain the measured values ​​of multiple key parameters of the mold system; Determining the deviation between the measured values ​​and the theoretical values ​​of the plurality of key parameters; Determining, based on the deviations of the multiple key parameters, associated impact values ​​of the multiple key parameters on stable production; determining whether to trigger parameter debugging of the mold system according to the associated impact value; If it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters; Performing parameter debugging on the target key parameters; The parameter debugging of the target key parameters includes: Determining the parameter adjustment amount and adjustment direction based on the difference between the theoretical value and the measured value of the target key parameter; According to the parameter adjustment amount and adjustment direction, the target key parameter is adjusted; wherein, The parameter adjustment amount is smaller than the absolute value of the difference between the theoretical value and the measured value of the target key parameter; The adjustment direction is to approach the theoretical value of the target key parameter; Determining the deviations between the measured values ​​and theoretical values ​​of the plurality of key parameters includes: respectively determining the differences between the theoretical values ​​and the measured values ​​of the plurality of key parameters; Determining the difference rates of the multiple key parameters respectively according to the ratios of the difference values ​​of the multiple key parameters to the corresponding theoretical values, wherein the difference rates are used to represent the deviations between the measured values ​​and the theoretical values ​​of the key parameters; Determining, based on the deviations of the multiple key parameters, the associated impact values ​​of the multiple key parameters on stable production, includes: The difference rates of the multiple key parameters are weighted to obtain the associated impact value.

2. The method according to claim 1, characterized in that The determining whether to trigger parameter debugging of the mold system according to the associated impact value includes: If the associated impact value is greater than a first set value, it is determined to trigger parameter debugging of the mold system.

3. The method according to claim 1, characterized in that If it is determined that parameter debugging of the mold system is triggered, selecting a target key parameter from the multiple key parameters includes: The key parameter whose deviation is within the preset adjustable range is selected as the target key parameter.

4. The method according to claim 1, wherein Determining the parameter adjustment amount according to the difference between the theoretical value and the measured value of the target key parameter includes: If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is greater than a second set value, determining a first adjustment amount; Adjusting the target key parameter in a direction approaching the theoretical value according to the first adjustment amount, wherein the absolute value of the difference between the adjusted value of the target key parameter and the theoretical value is the second set value; Based on the second set value, the target key parameter continues to be adjusted multiple times until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value.

5. The method according to claim 4, characterized in that The step of continuing to adjust the target key parameter multiple times based on the second set value until the absolute value of the difference between the target key parameter and the theoretical value is less than a third set value includes: determining a second adjustment amount according to the second set value and the number of steps; adjusting the target key parameter in a direction approaching the theoretical value according to the second adjustment amount; determining whether the absolute value of the difference between the adjusted target key parameter and the theoretical value is less than the third set value; If yes, stop adjusting the target key parameter; If not, determine the third adjustment amount based on the absolute value of the difference between the adjusted target key parameter and the theoretical value and the number of steps, and continue to adjust the target key parameter until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

6. The method according to claim 4, characterized in that The method further comprises: If the absolute value of the difference between the theoretical value and the measured value of the target key parameter is less than or equal to the second set value, the target key parameter is adjusted multiple times according to the absolute value of the difference between the theoretical value and the measured value of the target key parameter and the number of steps until the absolute value of the difference between the target key parameter and the theoretical value is less than the third set value.

7. The method according to claim 1, characterized in that Before determining whether to trigger parameter debugging of the mold system according to the associated impact value, the method further includes: The multiple key parameters are independently debugged respectively, and the absolute value of the difference between the theoretical value and the measured value of each key parameter after the independent debugging is less than the fourth set value.

8. A control device, characterized in that: include: at least one processor; as well as at least one memory in communication with the processor, wherein: The memory stores program instructions that can be executed by the processor, and the processor calls the program instructions to perform the method according to any one of claims 1 to 7.

9. A mold system, characterized in that: include: Mould equipment; A sensing component, used for collecting measured values ​​of multiple key parameters of the mold equipment in the mold system; A control device, configured to receive the measured values ​​of the plurality of key parameters and execute the method according to any one of claims 1 to 7 based on the measured values ​​of the plurality of key parameters.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium includes a stored program, wherein when the program is executed, the device where the computer-readable storage medium is located is controlled to execute the method according to any one of claims 1 to 7.

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