Defect detection display method, system, device and medium

Abstract

The application discloses a kind of detection defect display method, system, device and medium, it is related to glass manufacturing technical field.The method comprises the following steps: in response to detection query request, obtain all first detection results corresponding to detection equipment, and display first control and second control on main interface, and display first detection result on second control;In response to triggering first control, obtain production line information, filter second detection result corresponding to production line information from first detection result, display third control on main interface, and display second detection result on third control;In response to triggering third control, obtain station rejection defect data and mold number rejection defect data, and display station rejection defect table on main interface according to station rejection defect data;In response to triggering chart control, display defect analysis chart corresponding to station rejection defect data and mold number rejection defect data on main interface.Defect data and detection result are directly and intuitively, and the optimization of production process is improved.

Description

Technical Field

[0001] This application relates to the field of glass manufacturing technology, and in particular to a method, system, device and medium for detecting and displaying defects. Background Technology

[0002] With the development of technology, the production efficiency of glass manufacturing has gradually improved, enabling the production of several products at once. In order to improve the quality of finished products, various equipment is used on the production line to inspect the products and eliminate defective products.

[0003] In related technologies, glass manufacturing involves multiple production lines operating simultaneously and producing a large number of products. Therefore, it is difficult to present the complete and intuitive results of each inspection device's testing and rejection status. This makes it challenging to integrate and analyze the test results to determine the cause of defects and the corresponding production station. The poor visualization of test results and rejection status further hinders users' ability to optimize the production process. Summary of the Invention

[0004] The main objective of this application is to provide a method, system, device, and medium for displaying defects, so as to intuitively display the detection results and rejection status, thereby improving the user's optimization of the production process.

[0005] To achieve the above objectives, one aspect of this application proposes a method for detecting and displaying defects, comprising the following steps:

[0006] In response to a detection query request, the system retrieves all first detection results corresponding to the detection device and displays a first control and a second control on the main interface, with the first detection results displayed on the second control.

[0007] The response is triggered by the first control, obtains production line information, filters out the second detection result corresponding to the production line information from the first detection result, updates the second control on the main interface, displays the third control, and displays the second detection result on the third control;

[0008] The response is triggered by the third control. Based on the second detection result, the station rejection defect data and the module rejection defect data are obtained. Based on the station rejection defect data, the station rejection defect table, station rejection label and chart control are displayed on the main interface. The station rejection label is used to provide an entry point to the interface of the station rejection defect table.

[0009] The response is triggered by the chart control, which displays a defect analysis chart on the main interface corresponding to the defect rejection data of the workstation and the defect rejection data of the module. The chart control is used to provide an entry point to the interface of the defect analysis chart.

[0010] Furthermore, the method also includes:

[0011] When responding to the detection query request, a statistics control is also displayed on the main interface;

[0012] The response is triggered by the statistics control, which updates the first control and displays the query control, the first detection label, and the second detection label on the main interface;

[0013] The response is triggered by the query control to obtain the first detection rejection data and the second detection rejection data. Based on the first detection rejection data, the station rejection defect data and the module rejection defect data, the first rejection analysis chart detected and rejected by the crack machine is displayed on the main interface. The first detection label is used to provide an entry point to the interface of the first rejection analysis chart.

[0014] The response is triggered by the second detection tag. Based on the second detection rejection data, the workstation rejection defect data, and the module rejection defect data, a second rejection analysis chart detected and rejected by the camera is displayed on the main interface. The second detection tag is used to provide an entry point to the interface of the second rejection analysis chart.

[0015] Furthermore, the first control includes a kiln control and a row and column machine control; the response is triggered by the first control, and obtaining production line information specifically includes:

[0016] The response is triggered by the kiln control, and a first selection control is displayed on the main interface. The response is triggered by the first selection control, and the kiln number is obtained.

[0017] The response is triggered by the row and column machine control, and a second selection control is displayed on the main interface. The response is triggered by the second selection control, and the row and column machine number is obtained.

[0018] The production line information includes the kiln number and the row machine number.

[0019] Furthermore, updating the second control and displaying the third control on the main interface specifically includes:

[0020] Filter out the detection results corresponding to the production line information from the first detection results, and use the detection results corresponding to the production line information as the second detection results;

[0021] The second control, which corresponds to the second detection result, is used as the third control. The second control is cleared on the main interface, and the third control is displayed to update the second control.

[0022] Furthermore, the workstation defect rejection data includes: product code, group, start time, end time, total number, total number of qualified products, total number of rejected products, pass rate, rejection rate, mold reading rate, and defect location parameters; the step of displaying the workstation defect rejection table on the main interface based on the workstation defect rejection data specifically includes:

[0023] Using the product code as the row data basis, the group, start time, end time, total number, total number of qualified products, total number of rejected products, pass rate, rejection rate, mold reading rate, and defect location parameters are displayed in a table on the main interface to display the defect rejection table for the workstation.

[0024] Furthermore, the station-based defect rejection data includes defect location parameters, and the module-based defect rejection data includes module-based defect parameters. The specific steps of displaying defect analysis charts corresponding to the station-based defect rejection data and the module-based defect rejection data on the main interface include:

[0025] Based on the defect location parameters, the occurrence frequency of each defect location factor is counted to obtain the total occurrence frequency of each defect location factor at the workstation.

[0026] On the main interface, a defect analysis bar chart corresponding to each defect location factor is displayed in descending order of the total number of times the workstation appears, based on the counting dimension.

[0027] Based on the module defect parameters, the occurrence frequency of each module defect factor is counted to obtain the total occurrence frequency of each module defect factor.

[0028] On the main interface, a defect analysis ring chart corresponding to the defect factors of each module number is displayed based on the total number of occurrences of the module number.

[0029] The defect analysis charts include defect analysis bar charts and defect analysis ring charts.

[0030] Furthermore, the method also includes:

[0031] When the response is triggered by the third control, a template removal label is also displayed on the main interface;

[0032] The response is triggered by the module number rejection tag, and a module number rejection defect table corresponding to the module number rejection defect data is displayed on the main interface. The module number rejection tag is used to provide an entry point to the interface of the module number rejection defect table.

[0033] To achieve the above objectives, another aspect of this application proposes a defect detection display system, the system comprising:

[0034] The first module is used to respond to detection query requests, obtain all first detection results corresponding to the detection device, and display a first control and a second control on the main interface, with the first detection results displayed on the second control;

[0035] The second module is used to respond to the first control, obtain production line information, filter out the second detection result corresponding to the production line information from the first detection result, update the second control on the main interface, display the third control, and display the second detection result on the third control.

[0036] The third module is used to respond to the triggering of the third control, and to obtain the station rejection defect data and the module rejection defect data according to the second detection result. According to the station rejection defect data, the module displays the station rejection defect table, the station rejection label and the chart control on the main interface. The station rejection label is used to provide an entry point to the interface of the station rejection defect table.

[0037] The fourth module is used to respond to the chart control and display a defect analysis chart on the main interface corresponding to the defect rejection data of the workstation and the defect rejection data of the module. The chart control is used to provide an entry point to the interface of the defect analysis chart.

[0038] To achieve the above objectives, another aspect of the present application provides an electronic device, characterized in that the electronic device includes a hardware device, the hardware device includes a memory and a processor, the memory stores a computer program, and the processor executes the computer program to implement the above-mentioned defect detection display method.

[0039] Another aspect of this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by one or more processors, can implement the steps of the defect detection and display method described above.

[0040] The embodiments of this application include at least the following beneficial effects: This application provides a method, system, device, and medium for displaying detected defects. This solution responds to the triggering of different controls, filters the corresponding detection results according to the production line information, and removes defect data based on the acquired workstation and module number, displaying the corresponding charts to intuitively show the defect data and detection results. Furthermore, it can quickly integrate and analyze the detection results through defect analysis charts, accurately determine the cause of the defect and the production workstation, facilitate the detection of defect data, and improve the user's optimization of the production process.

[0041] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0042] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0043] Figure 1 This is a flowchart of a defect detection and display method provided by some embodiments of this application;

[0044] Figure 2 This is a schematic diagram illustrating the display effect of the second control in a defect detection display method provided by some embodiments of this application;

[0045] Figure 3 This is a schematic diagram showing the display effect of a third control in a defect detection display method provided by some embodiments of this application;

[0046] Figure 4 This is a schematic diagram showing the display effect of the station rejection table of a defect display method provided by some embodiments of this application;

[0047] Figure 5 This is a schematic diagram showing the effect of a defect analysis chart of a defect display method provided by some embodiments of this application;

[0048] Figure 6 This is a schematic diagram showing the display effect of a defect table for removing defects by module according to some embodiments of the present application;

[0049] Figure 7 This is a schematic diagram showing the first rejection analysis chart of a defect detection display method provided by some embodiments of this application. Detailed Implementation

[0050] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the reference to "embodiment" herein means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments. The implementation methods described in the following exemplary embodiments do not represent all implementation methods consistent with the embodiments of this application; they are merely examples of apparatuses and methods consistent with some aspects of the embodiments of this application as detailed in the appended claims.

[0051] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various concepts, but unless otherwise stated, these concepts are not limited by these terms. These terms are only used to distinguish one concept from another. For example, without departing from the scope of the embodiments of this application, first information may also be referred to as second information, and similarly, second information may also be referred to as first information. Depending on the context, the words “if,” “when,” or “in response to a determination” as used herein may be interpreted as “when…” or “when…” or “in response to a determination.”

[0052] As used in this application, the terms "at least one", "multiple", "each", "any", etc., "at least one" includes one, two or more, "multiple" includes two or more, "each" refers to each of the corresponding multiples, and "any" refers to any one of the multiples.

[0053] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0054] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0055] To facilitate understanding of the inventive concept of this application, before providing a detailed description of the embodiments of this application, the English abbreviations (terms) / related concepts involved in the embodiments of this application will first be explained. The English abbreviations (terms) / related concepts involved in the embodiments of this application are subject to the following interpretations.

[0056] Mold number: This usually refers to the mold number used to determine the size and shape of glass products. The mold number typically consists of a number and a name, and can be marked on the product.

[0057] Crack machine: This usually refers to the operation of scanning defective glass during the glass manufacturing or processing process, locating the defect, and separating or removing it.

[0058] Camera: This usually refers to the operation of using a camera to scan defective glass during the glass manufacturing or processing process, locate the defect, and separate or remove it.

[0059] As described in the background section, in related technologies, glass manufacturing involves multiple production lines operating simultaneously and producing a large number of products. Therefore, it is difficult to present the complete and intuitive results and rejection status of each inspection device, making it challenging to integrate and analyze the results to determine the cause of defects and the corresponding production station. The poor visualization of inspection results and rejection status hinders users' ability to optimize the production process.

[0060] The method provided in this application embodiment can be applied to the system provided in this application embodiment, wherein the system can be a terminal or a server.

[0061] The terminal can be a tablet computer, a laptop computer, a desktop computer, etc., but is not limited to these.

[0062] A server can be a standalone physical server, a server cluster or distributed system consisting of multiple physical servers, or a cloud server that provides basic cloud computing services such as cloud services, cloud databases, cloud computing, cloud functions, cloud storage, network services, cloud communication, middleware services, domain name services, security services, content delivery networks, and big data and artificial intelligence platforms.

[0063] The above is an introduction to the implementation environment of the embodiments of this application.

[0064] The implementation steps of a defect detection and display method provided in this application will be described in detail below with reference to the accompanying drawings.

[0065] Please refer to Figure 1 , Figure 1 The flowchart illustrates a method for detecting and displaying defects, provided for some embodiments of this application. It should be noted that the steps shown in the flowchart can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases the steps shown or described may be executed in a different order than that shown here.

[0066] The method of the embodiments of this application includes the following steps:

[0067] S100: Respond to the detection query request, obtain all first detection results corresponding to the detection device, and display the first control and the second control on the main interface, with the first detection results displayed on the second control.

[0068] S200, the response is triggered by the first control, obtains production line information, filters out the second detection result corresponding to the production line information from the first detection result, updates the second control on the main interface, displays the third control, and displays the second detection result on the third control.

[0069] S300, triggered by the third control, obtains station rejection defect data and module rejection defect data based on the second detection result. Based on the station rejection defect data, it displays the station rejection defect table, station rejection labels, and chart controls on the main interface. The station rejection labels provide an entry point to the interface for accessing the station rejection defect table.

[0070] S400, triggered by the chart control, displays a defect analysis chart on the main interface corresponding to the defect data removed from the workstation and the defect data removed from the module. The chart control provides an entry point to the interface for accessing the defect analysis chart.

[0071] Steps S100 to S400, as illustrated in this embodiment, respond to triggering different controls, filter corresponding inspection results based on production line information, and remove defect data based on the acquired workstation and module numbers, displaying corresponding charts to intuitively display defect data and inspection results. Furthermore, the defect analysis charts can quickly integrate and analyze the inspection results, accurately determine the cause of the defect and the production workstation, facilitate the detection of defect data, improve the user's optimization of the production process, thereby improving production technology, increasing production efficiency and product quality.

[0072] The specific implementation methods for each of the above steps are described below.

[0073] In S100, by responding to the detection query request, all first detection results are obtained. Each first detection result corresponds to a detection device. That is, one detection device detects and rejects a product, resulting in one first detection result. Since there are multiple production lines in glass manufacturing, each with its own detection device, in this embodiment, the first detection result refers to the detection results corresponding to all detection devices across multiple production lines. Therefore, by responding to the detection query request, the detection results of all detection devices are obtained. Upon responding to the detection query request, the main interface displays a first control and a second control. The second control can display the first detection results to visually indicate the detection status.

[0074] The response to the detection query request can be obtained through responses to other interfaces or controls, or it can be sent by other devices and thus responded to. This application does not impose any restrictions on the request.

[0075] In one embodiment, the first control includes a kiln control and a row and column machine control. The first control guides the user to query the rejection status and inspection results of different production lines, facilitating user management and viewing of rejection data and improving the user's ability to optimize production processes and workflows.

[0076] The number of second controls is consistent with the number of first detection results, and this application does not limit the number of second controls. The first detection results include: detection equipment, number of bottles entered, number of bottles rejected, pass rate, rejection rate, mold reading rate, and detection time.

[0077] For example, refer to Figure 2 By responding to detection query requests, all first detection results are obtained and displayed on the main interface as first and second controls. The first controls include a kiln control and a row and column machine control. Each second control displays a corresponding first detection result. One of the first detection results includes: DY5-1-LW1 (detection equipment number), 509 (number of bottles entered), 66 (number of rejections), 88.52% (pass rate), 11.48% (rejection rate), 99.8% (mold reading rate), and the detection time (2024-08-06 15:00-15:03). The first detection result corresponds to the detection equipment.

[0078] The embodiments provided in this application respond to a detection query request, display a first control to guide the user to query the rejection status and detection results of different production lines, and obtain all the first detection results. The corresponding first detection results are then displayed through a second control so that the user can intuitively view the detection results and optimize the production process and workflow.

[0079] In step S200, by responding to the trigger of the first control, the production line information that the user needs to query is determined, i.e., the production line that the user needs to query is identified. Based on the production line information, the corresponding detection result is filtered from the obtained first detection result and used as the second detection result. The second control displayed according to the second detection result becomes the third control, which can display the second detection result. The third control replaces the second control and is displayed on the main interface to update the second control.

[0080] The first control can be a button, a label, or a tree view; this application does not limit the specific form of the first control. The triggering operation for the first control can be a user touch click, mouse movement or clicking, or voice control; this application does not restrict the triggering operation for the first control. Similarly, the specific form and triggering operation of the second control are not limited.

[0081] In one embodiment, the first control includes a kiln control and a row / column machine control, and the production line information includes a kiln number and a row / column machine number. The first control displays the production line information accordingly.

[0082] For example, refer to Figure 3When the user clicks the first control (kiln control and row machine control), the kiln number and row machine number are obtained. When the kiln number is "DY2" and the row machine number is "DY2-2", the corresponding second detection result is filtered from the first detection result based on the kiln number and row machine number. The second control is updated on the main interface, and the third control is displayed. The third control displays the second detection result corresponding to the kiln number "DY2" and the row machine number "DY2-2", that is, it displays the detection equipment number, number of bottles entered, number of rejections, pass rate, rejection rate, mold reading rate and detection time corresponding to the kiln number "DY2" and the row machine number "DY2-2".

[0083] The embodiments provided in this application guide users to query the rejection status and test results of different production lines by responding to the triggering of a first control, determine the production line that the user needs to query, filter the corresponding test results through the production line information, and display them so that the test results can be viewed intuitively, eliminating the interference of information from other production lines, and clarifying the rejection status and production status of the current production line.

[0084] In S300, by responding to a third control, station rejection defect data and module rejection defect data corresponding to the second detection result are obtained. These are then used to correlate the corresponding second detection result with the third control used for triggering. The main interface displays the station rejection defect data in a table format, thus showing the station rejection defect table. The main interface also displays station rejection labels, module rejection labels, and chart controls. The station rejection labels provide an entry point to the interface for accessing the station rejection defect table.

[0085] In other words, when the third control is triggered, based on the second detection result of S300, the corresponding second detection result is matched with the triggering third control to obtain the rejection data for the workstations and the rejection data for the module numbers detected and rejected on the production line. The workstation rejection data is then displayed in a table format on the main interface, creating a workstation rejection defect table. The main interface also displays workstation rejection labels, module rejection labels, and chart controls. When a workstation rejection label is triggered, the main interface can directly display the workstation rejection defect table.

[0086] The third control can be a button, a label, or a tree view; this application does not limit the specific form of the third control. The triggering operation for the third control can be a user touch click, mouse movement or clicking, or voice control; this application does not restrict the triggering operation of the third control. Similarly, the specific form and triggering operation of the workstation removal label, module removal label, and chart control are not limited.

[0087] Since the third control is obtained by filtering the second control, this application does not limit the number of third controls.

[0088] In one embodiment, the defect rejection data at the workstation may include: product code, group, start time, end time, total number, total number of qualified products, total number of rejected products, pass rate, rejection rate, mold reading rate, and defect location parameters. The defect rejection data for the mold number may include: product code, group, start time, end time, mold number, mold number defect parameters, and number of rejected products.

[0089] The workstation defect rejection table can use the product code as the row data basis and display the group, start time, end time, total, total number of qualified, total number of rejected, pass rate, rejection rate, mold reading rate, and defect location parameters in a tabular form.

[0090] For example, refer to Figure 4 When a user clicks on one of the third controls, based on the second detection result corresponding to the clicked third control, the system retrieves the corresponding workstation rejection data and mold number rejection data. The main interface displays the workstation rejection data corresponding to the production line information in a table format, thus displaying the workstation rejection table. The workstation rejection table displays the product code, group, start time, end time, total, total number of qualified products, total number of rejections, pass rate, rejection rate, mold reading rate, and defect location parameters. The main interface also displays workstation rejection labels, mold number rejection labels, and chart controls.

[0091] The embodiments provided in this application obtain the rejection defect data corresponding to the production line that the user needs to query by responding to a third control, intuitively display the rejection status of the corresponding data, and clearly identify the defect factors and defect workstations.

[0092] In the S400, a defect analysis chart corresponding to the workstation rejection data and the module rejection data is displayed on the main interface by responding to a chart control. The chart control provides an entry point to the interface for accessing the defect analysis chart. That is, when the chart control is triggered, the main interface can directly display the defect analysis chart.

[0093] The defect analysis charts include: defect analysis bar charts and defect analysis pie charts.

[0094] For example, refer to Figure 5 When the user clicks the chart control, the main interface displays a defect analysis bar chart and a defect analysis pie chart. The defect analysis bar chart shows the total number of times each defect location factor occurs at each workstation and the defect location factor for each defect location. The defect analysis pie chart shows the number of times each module defect factor occurs and the defect factor for each module.

[0095] The embodiments provided in this application display defect analysis charts through a response-triggered chart control, which intuitively presents defect data and detection results. Furthermore, the defect analysis charts enable rapid integration and analysis of detection results, accurately determining the cause of defects and the production station. This facilitates the collection of defect data, improves user optimization of the production process, and ultimately enhances production technology, production efficiency, and product quality.

[0096] In some embodiments of the present invention, in S200, the process of obtaining production line information specifically includes:

[0097] The production line information includes: kiln number and row / column machine number. The first control includes: kiln control and row / column machine control.

[0098] S210, triggered by the kiln control, displays the first selection control on the main interface, responds to the first selection control, and obtains the kiln number.

[0099] S220, triggered by the row and column machine control, displays a second selection control on the main interface, responds to the second selection control, and obtains the row and column machine number.

[0100] The specific implementation methods for each of the above steps are described below.

[0101] In S210, when the kiln control is triggered by a response, a first selection control is displayed on the main interface, and the first selection control corresponds to the kiln control.

[0102] The first selection control can be a drop-down list, a prompt box, or a tree view. This application does not limit the specific form of the first selection control.

[0103] When the first selection control is triggered, the kiln number in the production line information is obtained.

[0104] The embodiments provided in this application, in response to triggering the kiln control, display a first selection control corresponding to the kiln control. By triggering the first selection control, the user can determine the kiln number as needed, helping the user quickly find the required kiln number, maintaining consistency between the second detection result and the kiln number, and improving the user experience.

[0105] In S220, when the row and column machine control is triggered, a second selection control is displayed on the main interface, which corresponds to the row and column machine control.

[0106] The second selection control can be a drop-down list, a tooltip, or a tree view. This application does not limit the specific form of the second selection control.

[0107] When the second selection control is triggered, obtain the row and column machine number from the production line information.

[0108] The embodiments provided in this application display a second selection control corresponding to the row and column machine control in response to triggering the row and column machine control. By triggering the second selection control, the user can determine the row and column machine number as needed, helping the user to quickly find the required row and column machine number, maintaining the consistency between the second detection result and the row and column machine number, and improving the user experience.

[0109] In some embodiments of the present invention, in S200, the display process of the third control specifically includes:

[0110] S230, Select the test results corresponding to the production line information from the first test results, and use the test results corresponding to the production line information as the second test results.

[0111] S240, the second control displayed corresponding to the second detection result is used as the third control. The second control is cleared on the main interface and the third control is displayed to update the second control.

[0112] The specific implementation methods for each of the above steps are described below.

[0113] In S230, based on the production line information, the corresponding test result is selected from the first test result and used as the second test result.

[0114] In S240, the second control displayed according to the second detection result becomes the third control, and the third control can display the second detection result. The third control replaces the second control and is displayed on the main interface to update the second control.

[0115] The embodiments provided in this application guide users to query the rejection status and test results of different production lines by responding to the triggering of a first control, determine the production line that the user needs to query, filter the corresponding test results through the production line information, and display them so that the test results can be viewed intuitively, eliminating the interference of information from other production lines, and clarifying the rejection status and production status of the current production line.

[0116] In some embodiments of the present invention, in S400, the process of displaying the defect analysis chart specifically includes:

[0117] S410: Based on the defect location parameters, count the occurrence frequency of each defect location factor to obtain the total occurrence frequency of each defect location factor at the workstation.

[0118] The S420 displays a defect analysis bar chart on the main interface, based on the total number of times a workstation appears, arranged from high to low according to the counting dimension, corresponding to the factors of each defect location.

[0119] S430, based on the module defect parameters, count the occurrence frequency of each module defect factor to obtain the total occurrence frequency of each module defect factor.

[0120] S440 displays a defect analysis ring chart on the main interface, based on the total number of times each module number appears, corresponding to the defect factors of each module number.

[0121] The specific implementation methods for each of the above steps are described below.

[0122] In S410, the occurrence frequency of each defect location factor is counted through the defect location parameter to obtain the total occurrence frequency of each defect location factor at the corresponding workstation.

[0123] The product can be inspected by crack testing equipment such as a crack testing machine and / or a camera to locate the defective part. Based on the current product code, the type of defect in that part is recorded, forming the defect part factor, and the number of times the defect part factor occurs is recorded, thus forming the defect part parameter.

[0124] In S420, the total number of times each workstation appears is sorted from high to low based on the total number of times each defect location factor appears. The total number of times each workstation appears and the corresponding defect location factor are displayed in the form of a bar chart to form a defect analysis bar chart, which is then displayed on the main interface.

[0125] For example, refer to Figure 5 The defect factors include: "flat bottom crack", "insufficient bottle mouth", "other bottle mouth defects", "bottom stones", "other bottle bottom defects", "bottom dirt", "bottom positioning failure", "bottom air bubbles", and "bottom small black spots". The total occurrence frequency of the above defect factors at each workstation is sorted from high to low. The workstation with "flat bottom crack" has the highest total occurrence frequency, and the workstation with "bottom small black spots" has the lowest total occurrence frequency. The total occurrence frequency of each workstation and the corresponding defect factor are displayed in the form of a bar chart, and the defect analysis bar chart is displayed on the main interface.

[0126] In S430, the occurrence frequency of each module defect factor is counted through the module defect parameter to obtain the total occurrence frequency of the module corresponding to each module defect factor.

[0127] The product can be inspected by crack testing equipment such as a crack testing machine and / or a camera to locate the defective module. Based on the current product code, the type of defect of the module is recorded to form the module defect factor, and the number of times the module defect factor occurs is recorded to form the module defect parameter.

[0128] In S440, based on the total number of occurrences of each module number corresponding to a defect factor, a pie chart is generated to display the total number of occurrences of the module number and the corresponding defect factor, thus forming a defect analysis pie chart. This defect analysis pie chart is then displayed on the main interface.

[0129] For example, refer to Figure 5 and Figure 6 The module defect factors include "defect code" and "defect name". Based on the total number of times the module corresponding to the above module defect factors appears, the proportion of each module defect factor to the total number of module defect factors is calculated. The total number of times the workstation appears and the corresponding defect location factor are displayed in the form of a pie chart. The defect analysis pie chart is displayed on the main interface.

[0130] The embodiments provided in this application process different defect parameters to form corresponding defect analysis charts, enabling rapid integration and analysis of detection results, accurate determination of the cause of defects and production stations, facilitating the detection of defect data, improving user optimization of production processes, thereby improving production technology, production efficiency and product quality.

[0131] In some embodiments of the present invention, the display method further includes:

[0132] S301, when the response is triggered by a third control, the main interface also displays a template removal label;

[0133] S302, the response is triggered by the module number rejection tag, and the module number rejection defect table corresponding to the module number rejection defect data is displayed on the main interface. The module number rejection tag is used to provide an entry point to the interface of the module number rejection defect table.

[0134] The specific implementation methods for each of the above steps are described below.

[0135] In S301, when the third control is triggered, the main interface displays the workstation rejection defect table, workstation rejection label, module rejection label, and chart control.

[0136] In S302, when the module rejection tag is triggered by a response, the module rejection defect table is displayed on the main interface based on the module rejection defect data, but the workstation rejection defect table is not displayed.

[0137] The defect data for module number removal can include: product code, group, start time, end time, module number, module number defect parameters, and number of removals.

[0138] The module number rejection defect table can use the product code as the row data base and display the group, start time, end time, module number, module number defect parameters, and rejection count in a tabular format.

[0139] The template rejection tag provides an entry point to the template rejection defect table interface. In other words, in response to triggering the template rejection tag, the main interface can directly display the template rejection defect table.

[0140] The template number removal label can be a button, a label, or a tree view; this application does not limit the specific form of the template number removal label. The triggering operation for the template number removal label can be a user touch click, a mouse movement or click, or a voice control trigger; this application does not limit the triggering operation for the template number removal label.

[0141] For example, refer to Figure 6 When a user clicks the "Modal Number Rejection" label, the main interface displays a table of rejected module numbers based on the defect data. This table shows the product code, group, start time, end time, module number, defect parameters, and the number of rejections. The main interface also displays workstation rejection labels, module rejection labels, and chart controls.

[0142] In some embodiments of the present invention, the display method further includes:

[0143] S101, when responding to a detection query request, a statistics control is also displayed on the main interface.

[0144] S102, the response is triggered by the statistics control, the first control is updated, and the query control, the first detection label and the second detection label are displayed on the main interface.

[0145] S103, the response is triggered by the query control, the first detection rejection data and the second detection rejection data are obtained, and the first rejection analysis chart of the crack machine rejection is displayed on the main interface based on the first detection rejection data, the station rejection defect data and the module rejection defect data. The first detection label is used to provide the entry point to the interface of the first rejection analysis chart.

[0146] S104, the response is triggered by the second detection label. Based on the second detection rejection data, the station rejection defect data, and the module rejection defect data, the second rejection analysis chart detected and rejected by the camera is displayed on the main interface. The second detection label is used to provide an entry point to the interface of the second rejection analysis chart.

[0147] The specific implementation methods for each of the above steps are described below.

[0148] In S101, when responding to a detection query request, the main interface displays a first control, a second control, and a statistics control; the first control includes a kiln control and a row and column machine control.

[0149] In S102, when the statistics control is triggered, the query control is displayed on the main interface, but the first control is not displayed, so as to update the first control.

[0150] The main interface also displays a first inspection label and a second inspection label to update the interface that displays the third control or the interface that displays the defect analysis chart.

[0151] The statistics control provides an entry point to the interface of the query control, the first detection label, and the second detection label.

[0152] The statistical control can be a button, a label, or a tree view; this application does not limit the specific form of the statistical control. The triggering operation for the statistical control can be a user touch click, mouse movement or clicking, or voice control; this application does not restrict the triggering operation of the statistical control. Similarly, the specific form and triggering operation of the query control, the first detection label, and the second detection label are not limited.

[0153] In S103, when the query control is triggered by a response, the first detection and removal data and the second detection and removal data are obtained.

[0154] The first method of data rejection involves scanning and detecting defective products using a crack detection machine to locate the defects and then rejecting the products. The second method involves scanning and detecting defective products using a camera to locate the defects and then rejecting the products.

[0155] Based on the first detection rejection data, the station rejection defect data, and the module rejection defect data, the station rejection defect data and the module rejection defect data are processed, and the first rejection analysis chart is displayed on the main interface. The first rejection analysis chart includes: a bar chart of station rejection analysis detected by the crack machine and a ring chart of module rejection analysis detected by the crack machine.

[0156] The first detection tag provides an entry point to the interface of the first rejection analysis chart. That is, in response to triggering the first detection tag, the main interface can directly display the first rejection analysis chart.

[0157] For example, refer to Figure 7 When the user clicks the query control, the system retrieves the first rejection data. Based on this data, along with the station rejection data and the module rejection data, the main interface displays a bar chart of station rejection analysis and a ring chart of module rejection analysis (the first rejection analysis chart). These charts allow for the rapid identification of defect causes. The first detection label is the crack machine label, and the second detection label is the camera label.

[0158] In S104, when the second detection tag is triggered by a response, the station rejection data and the module rejection data are processed based on the second detection rejection data, the station rejection defect data, and the module rejection defect data. The second rejection analysis chart detected by the camera is displayed on the main interface. The second rejection analysis chart includes: a station rejection analysis bar chart detected by the camera and a module rejection analysis ring chart detected by the camera.

[0159] The second detection tag provides an entry point to the interface of the second rejection analysis chart. That is, in response to triggering the second detection tag, the main interface can directly display the second rejection analysis chart.

[0160] The embodiments provided in this application, through response statistical controls, enable users to view data on rejected products detected by different testing devices, thereby generating corresponding rejection analysis charts. This allows for rapid integration and analysis of testing results, accurate determination of the causes and production stations of defects, and facilitates the collection of defect data. It also enhances users' ability to optimize production processes, thereby improving production technology, production efficiency, and product quality.

[0161] The above is an introduction to an embodiment of a defect detection and display method provided in this application.

[0162] The implementation of the defect detection display system provided in this application will now be described in detail with reference to the accompanying drawings.

[0163] Regarding the defect display method provided in the above embodiments, this application also provides a defect display system for implementing the above method. The defect display system includes:

[0164] The first module responds to the detection query request, obtains all the first detection results corresponding to the detection device, and displays the first control and the second control on the main interface, with the first detection results displayed on the second control.

[0165] The second module responds to the first control, obtains production line information, filters out the second detection result corresponding to the production line information from the first detection result, updates the second control on the main interface, displays the third control, and displays the second detection result on the third control.

[0166] The third module, triggered by the third control, obtains station rejection defect data and module rejection defect data based on the second detection result. Based on the station rejection defect data, it displays the station rejection defect table, station rejection labels, and chart controls on the main interface. The station rejection labels provide an entry point to the interface for accessing the station rejection defect table.

[0167] The fourth module, triggered by the chart control, displays a defect analysis chart on the main interface corresponding to the defect data removed from the workstation and the defect data removed from the module. The chart control provides an entry point to the interface for accessing the defect analysis chart.

[0168] It is understood that the content of the above method embodiments is applicable to this system embodiment. The specific functions implemented by this device embodiment are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0169] This application also provides an electronic device, which includes a hardware device including a memory, one or more processors, and a computer program stored in the memory and executable on the processors. The memory stores the software program and its components. The processor executes the software program and its components stored in the memory to perform various functional applications and data processing to obtain resources corresponding to the aforementioned preset events. Optionally, the processor implements the aforementioned defect detection and display method by running the computer program stored in the memory.

[0170] Memory, as a non-transitory computer-readable medium, can be used to store non-transitory software programs and non-transitory computer-executable programs. Furthermore, memory may include high-speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, memory may optionally include memory remotely located relative to the processor, and these remote memories can be connected to the processor via a network.

[0171] It is understood that the content of the above method embodiments is applicable to the embodiments of this electronic device. The specific functions implemented by the embodiments of this electronic device are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0172] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aforementioned defect detection and display method.

[0173] It is understood that the content of the above method embodiments is applicable to this storage medium embodiment. The specific functions implemented in this storage medium embodiment are the same as those in the above method embodiments, and the beneficial effects achieved are also the same as those achieved in the above method embodiments.

[0174] This application also provides a computer program product, which includes a computer program that, when executed by one or more processors, can implement the steps of the defect detection display method described above.

[0175] It is understood that the content of the above method embodiments is applicable to this computer program product. The specific functions implemented by the embodiments of this computer program product are the same as those of the above method embodiments, and the beneficial effects achieved are also the same as those achieved by the above method embodiments.

[0176] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0177] Although specific embodiments are described herein, those skilled in the art will recognize that many other modifications or alternative embodiments are also within the scope of this disclosure. For example, any of the functions and / or processing capabilities described in connection with a particular device or component can be performed by any other device or component. Furthermore, while various exemplary embodiments and architectures have been described according to embodiments of this disclosure, those skilled in the art will recognize that many other modifications to the exemplary embodiments and architectures described herein are also within the scope of this disclosure.

[0178] The foregoing description, with reference to block diagrams and flowcharts of systems, methods, systems, and / or computer program products according to exemplary embodiments, has described certain aspects of this disclosure. It should be understood that one or more blocks in the block diagrams and flowcharts, as well as combinations of blocks in the block diagrams and flowcharts, can be implemented by executing computer-executable program instructions, respectively. Similarly, according to some embodiments, some blocks in the block diagrams and flowcharts may not need to be executed in the order shown, or may not all need to be executed. Furthermore, additional components and / or operations beyond those shown in the blocks in the block diagrams and flowcharts may exist in some embodiments.

[0179] Therefore, blocks in block diagrams and flowcharts support combinations of means for performing a specified function, combinations of elements or steps for performing a specified function, and program instruction means for performing a specified function. It should also be understood that each block in a block diagram and flowchart, and combinations of blocks in block diagrams and flowcharts, can be implemented by a dedicated hardware computer system or a combination of dedicated hardware and computer instructions that performs a specific function, element, or step.

[0180] The program modules, applications, etc., described herein may include one or more software components, including, for example, software objects, methods, data structures, etc. Each such software component may include computer-executable instructions that, in response to execution, cause at least a portion of the functionality described herein (e.g., one or more operations of the exemplary methods described herein) to be performed.

[0181] Software components can be stored as files or other data storage structures. Software components of similar type or related function can be stored together in a specific directory, folder, or library. Software components can be static (e.g., pre-defined or fixed) or dynamic (e.g., created or modified at runtime).

[0182] The embodiments of this application have been described in detail above with reference to the accompanying drawings. However, this application is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of this application.

Claims

1. A method for detecting and displaying defects, characterized in that, Includes the following steps: In response to a detection query request, the system retrieves all first detection results corresponding to the detection device and displays a first control and a second control on the main interface, with the first detection results displayed on the second control. The response is triggered by the first control, obtains production line information, filters out the second detection result corresponding to the production line information from the first detection result, updates the second control on the main interface, displays the third control, and displays the second detection result on the third control; The response is triggered by the third control. Based on the second detection result, the station rejection defect data and the module rejection defect data are obtained. Based on the station rejection defect data, the station rejection defect table, station rejection label and chart control are displayed on the main interface. The station rejection label is used to provide an entry point to the interface of the station rejection defect table. The response is triggered by the chart control, which displays a defect analysis chart on the main interface corresponding to the defect rejection data of the workstation and the defect rejection data of the module. The chart control is used to provide an entry point to the interface of the defect analysis chart.

2. The defect detection and display method according to claim 1, characterized in that, The method further includes: When responding to the detection query request, a statistics control is also displayed on the main interface; The response is triggered by the statistics control, which updates the first control and displays the query control, the first detection label, and the second detection label on the main interface; The response is triggered by the query control to obtain the first detection rejection data and the second detection rejection data. Based on the first detection rejection data, the station rejection defect data and the module rejection defect data, the first rejection analysis chart detected and rejected by the crack machine is displayed on the main interface. The first detection label is used to provide an entry point to the interface of the first rejection analysis chart. The response is triggered by the second detection tag. Based on the second detection rejection data, the workstation rejection defect data, and the module rejection defect data, a second rejection analysis chart detected and rejected by the camera is displayed on the main interface. The second detection tag is used to provide an entry point to the interface of the second rejection analysis chart.

3. The defect detection and display method according to claim 1, characterized in that, The first control includes a kiln control and a row and column machine control; the response is triggered by the first control, and obtaining production line information specifically includes: The response is triggered by the kiln control, and a first selection control is displayed on the main interface. The response is triggered by the first selection control, and the kiln number is obtained. The response is triggered by the row and column machine control, and a second selection control is displayed on the main interface. The response is triggered by the second selection control, and the row and column machine number is obtained. The production line information includes the kiln number and the row and column machine number.

4. The defect detection and display method according to claim 1, characterized in that, Updating the second control and displaying the third control on the main interface specifically includes: Filter out the detection results corresponding to the production line information from the first detection results, and use the detection results corresponding to the production line information as the second detection results; The second control, which corresponds to the second detection result, is used as the third control. The second control is cleared on the main interface, and the third control is displayed to update the second control.

5. The defect detection and display method according to claim 1, characterized in that, The defect rejection data at the workstation includes: product code, group, start time, end time, total number, total number of qualified products, total number of rejected products, pass rate, rejection rate, mold reading rate, and defect location parameters; the process of displaying the workstation defect rejection table on the main interface based on the workstation defect rejection data specifically includes: Using the product code as the row data basis, the group, start time, end time, total number, total number of qualified products, total number of rejected products, pass rate, rejection rate, mold reading rate, and defect location parameters are displayed in a table on the main interface to display the defect rejection table for the workstation.

6. The defect detection and display method according to claim 5, characterized in that, The station-level defect rejection data includes defect location parameters, and the module-level defect rejection data includes module-level defect parameters. The specific steps of displaying defect analysis charts corresponding to the station-level defect rejection data and the module-level defect rejection data on the main interface include: Based on the defect location parameters, the occurrence frequency of each defect location factor is counted to obtain the total occurrence frequency of each defect location factor at the workstation. On the main interface, a defect analysis bar chart corresponding to each defect location factor is displayed in descending order of the total number of times the workstation appears, based on the counting dimension. Based on the module defect parameters, the occurrence frequency of each module defect factor is counted to obtain the total occurrence frequency of each module defect factor. On the main interface, a defect analysis ring chart corresponding to the defect factors of each module number is displayed based on the total number of occurrences of the module number. The defect analysis charts include defect analysis bar charts and defect analysis ring charts.

7. The defect detection and display method according to claim 1, characterized in that, The method further includes: When the response is triggered by the third control, a template removal label is also displayed on the main interface; The response is triggered by the module number rejection tag, and a module number rejection defect table corresponding to the module number rejection defect data is displayed on the main interface. The module number rejection tag is used to provide an entry point to the interface of the module number rejection defect table.

8. A defect detection display system, characterized in that, include: The first module is used to respond to detection query requests, obtain all first detection results corresponding to the detection device, and display a first control and a second control on the main interface, with the first detection results displayed on the second control; The second module is used to respond to the first control, obtain production line information, filter out the second detection result corresponding to the production line information from the first detection result, update the second control on the main interface, display the third control, and display the second detection result on the third control. The third module is used to respond to the triggering of the third control, and to obtain the station rejection defect data and the module rejection defect data according to the second detection result. According to the station rejection defect data, the module displays the station rejection defect table, the station rejection label and the chart control on the main interface. The station rejection label is used to provide an entry point to the interface of the station rejection defect table. The fourth module is used to respond to the chart control and display a defect analysis chart on the main interface corresponding to the defect data removed from the workstation and the defect data removed from the module. The chart control is used to provide an entry point to the interface of the defect analysis chart.

9. An electronic device, characterized in that, The electronic device includes a hardware device, which includes a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the defect detection display method as described in any one of claims 1 to 7.

10. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, it implements the defect detection and display method as described in any one of claims 1 to 7.

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