Automatic memory bank test system

Abstract

The invention discloses an automatic memory bank test system which comprises a plurality of annularly arranged cabinets, a test device is arranged in each cabinet, a lifting rotating device is arranged at the center of the annularly arranged cabinets, and a test device supporting platform and a tray supporting platform are arranged on the lifting rotating device. According to the invention, the material tray is accommodated in an annular layout, and the material tray supporting platform can rotate independent of the lifting and rotating device and the test equipment supporting platform, so that the loading and unloading of the memory bank carrying equipment are facilitated, and the loading and unloading efficiency of the memory bank carrying equipment is improved. The number of trays capable of being stored on the periphery of the feeding and discharging station is increased, the time needed for switching different trays is shortened, the influence of tray switching on the normal feeding and discharging process is reduced, and the overall efficiency of equipment is improved.

Description

Technical Field

[0001] The invention belongs to the technical field of memory bar testing, and in particular belongs to an automatic memory bar testing system. Background Art

[0002] The test time required for SLT (System Level Test) or aging of memory sticks is relatively long. Generally, the test efficiency can be improved by increasing the number of memory sticks tested simultaneously. Memory sticks generally need to be plugged into the test motherboard for SLT testing or aging. The number of memory sticks that can be plugged into a test motherboard is limited. Generally, the number of test motherboards can be increased to increase the number of memory sticks tested simultaneously and thus improve the test efficiency.

[0003] Removing the tested memory stick from the test motherboard and inserting the untested memory stick into the test motherboard is a necessary part of the memory stick testing process, and due to the large number of memory sticks to be tested, this part of the workload is very large. Currently, there are two solutions for removing and placing memory sticks from the test motherboard: manual and automated. Manual removal and placement of memory sticks is inefficient, requires high labor costs, and may cause additional losses due to operator errors.

[0004] The common scheme for automatic placement of memory sticks is as follows: put the test motherboard into a multi-layer cabinet, each layer can accommodate a test motherboard, and multiple cabinets are closely arranged in one or more rows to accommodate multiple test motherboards. A mobile station is set in front of each row of cabinets, which can move in a straight line along the direction of cabinet arrangement. There are two types of station movement schemes: ground rail and AGV. When it is necessary to take and place a memory stick on a motherboard, the mobile station moves to the front of the corresponding cabinet, pulls the corresponding test motherboard out of the cabinet, and puts the test motherboard back into the cabinet after taking and placing the memory stick. A loading and unloading station is set at one end of the moving path of the mobile station. The loading and unloading station is responsible for receiving the tested memory sticks removed by the mobile station and replenishing the untested memory sticks for the mobile station. At the same time, the loading and unloading station is also responsible for pre-testing visual inspection and other pre-testing ...

[0005] The above automation solution has the following problems: when there are a large number of cabinets, if they are arranged in a row, the time required for the mobile station to move from one end to the other is long, which will reduce the efficiency of taking and placing memory sticks, and reduce the number of cabinets that can be matched with a mobile station, thereby increasing the testing cost; when the number of cabinets is large, if the number of cabinets in a row is reduced, the number of rows of cabinets needs to be increased. If a ground rail solution is adopted, an additional row of ground rails needs to be added, which increases the equipment cost; if the mobile station adopts the AGV solution, its stability and accuracy of alignment with the cabinet are low, and an additional AGV power supply system is required, which increases the cost.

[0006] At the same time, most material trays currently use memory stick packaging blister trays. The capacity of common memory stick packaging blister trays is 50 and 25 sticks. At present, the memory stick test bits on the test motherboard are mostly integer powers of 2, such as 4, 8, 16, and 32. The number of memory sticks required for testing the motherboard is not an integer multiple of the number of memory sticks in the material tray. Therefore, when feeding or unloading the test equipment, there is often a situation where there is insufficient remaining material in the material tray or insufficient space in the material tray, and the material tray needs to be replaced. The use of ground rails or AGV solutions has limitations on the size of the mobile platform, so it is impossible to store a large number of material trays on the mobile platform. Even if a certain number of material trays are stored by stacking, etc., it is necessary to take them from the stacked material trays and put them in the work area. It also takes a lot of time. The current solution on the mobile platform is configured with a loading tray station, an unloading tray station and a tray storage station. When the memory stick in the loading tray is exhausted or the unloading tray is full, the tray in the loading or unloading tray station needs to be placed in the tray storage station, and a new tray is taken out from the tray storage station and placed in the loading or unloading tray station. This process takes a long time. At the same time, the test equipment that is loading and unloading when the tray is replaced cannot be tested. The test equipment can not start testing until the tray is replaced and the remaining loading and unloading processes are completed, resulting in a long idle time for the test equipment and reduced overall equipment efficiency. In summary, the existing memory stick testing solution is inefficient. Summary of the invention

[0007] In view of this, the purpose of the present invention is to overcome the deficiencies in the prior art and provide an automated memory stick testing system. The present application provides the following technical solutions:

[0008] An automated memory stick test system comprises a plurality of cabinets arranged in a ring, each of the cabinets being provided with a test device, each of the test devices being slidably connected to the corresponding cabinet, a lifting and rotating device being provided at the center of the plurality of cabinets arranged in a ring, a test device support platform and a tray support platform being provided on the lifting and rotating device, the test device support platform and the tray support platform being both rotatably connected to the lifting and rotating device, a memory stick transport device being provided on the test device support platform, a tray conveying device being provided on one side of the lifting and rotating device, and the test device, the lifting and rotating device, the memory stick transport device and the tray conveying device being all connected to the same control system.

[0009] In a possible embodiment, a plurality of testing devices are arranged along the height direction of each of the cabinets.

[0010] In a possible embodiment, a plurality of the cabinets and the tray conveying device are arranged in a circle.

[0011] In a possible embodiment, the test device includes a test device housing, a test mainboard and an incubator, both sides of the test device housing are slidably connected to the cabinet, the test mainboard and the incubator are arranged on the test device housing, and the incubator is flip-connected to the test device housing.

[0012] In a possible embodiment, two flip legs are provided at the bottom of the incubator, the two flip legs are connected by a flip shaft, and the middle of the flip shaft is connected to a flip motor via a worm gear mechanism.

[0013] In a possible embodiment, the lifting and rotating device includes a lifting and rotating column, and a linear motion module is provided on one side of the lifting and rotating column. The linear motion module is respectively connected to the test equipment support platform and the material tray support platform, so as to drive the test equipment support platform and the material tray support platform to perform linear motion along the lifting and rotating column through the linear motion module.

[0014] In a possible embodiment, the linear motion module includes a lifting motor, a lifting screw and a nut seat. The lifting motor is arranged at one end of the lifting and rotating column. The lifting motor is connected to the lifting screw. The side of the testing equipment support platform and the side of the material tray support platform are connected to the lifting screw through the nut seat.

[0015] In a possible embodiment, the lifting and rotating device includes a lifting and rotating base and a lifting and rotating column. The lifting and rotating base is arranged at the center of the several cabinets. A driving gear is arranged on the lifting and rotating base. The lifting and rotating column is provided with an annular rack. The driving gear cooperates with the annular rack. The inner ring of the driving gear is connected to a rotating motor to drive the lifting and rotating column to rotate through the rotating motor.

[0016] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are:

[0017] The present invention changes the cabinets accommodating the test motherboard from a linear arrangement to a circular arrangement, which reduces the time required for the loading and unloading equipment to move between the cabinets and improves efficiency. At the same time, a circular layout is adopted to accommodate material trays, and the material tray support platform can rotate independently of the lifting and rotating device and the test equipment support platform, which is convenient for the memory stick handling equipment to load and unload, increases the number of material trays that can be stored around the loading and unloading stations, and reduces the time required for switching between different material trays, reduces the impact of switching material trays on the normal loading and unloading process, and improves the overall efficiency of the equipment. At the same time, the ground rail or AGV is eliminated, which saves costs and reduces the site requirements of the test system.

[0018] In order to make the above-mentioned objects, features and advantages of the present application more obvious and understandable, preferred embodiments are given below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1 It is a schematic diagram of the internal structure of the present invention.

[0021] Figure 2 It is a schematic diagram of the external structure of the present invention.

[0022] Figure 3 yes Figure 1 An enlarged schematic diagram of point A.

[0023] Figure 4 It is a schematic diagram of the internal structure of the present invention from another perspective.

[0024] Figure 5 It is a schematic diagram of the external structure of another embodiment of the present invention.

[0025] Figure 6 It is a schematic diagram of the internal structure of another embodiment of the present invention.

[0026] Figure markings: 1-cabinet; 2-test equipment; 3-lifting and rotating device; 4-test equipment support platform; 5-tray support platform; 6-memory stick handling equipment; 7-tray conveying device; 8-flipping support foot; 9-flipping motor; 10-linear motion module. DETAILED DESCRIPTION

[0027] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as limiting the present application.

[0028] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0029] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0030] Please refer to Figure 1-6 As shown, an automated memory stick test system provided by the present embodiment comprises a plurality of cabinets 1 arranged in a ring, each of the cabinets 1 is provided with a test device 2, each of the test devices 2 is slidably connected with the corresponding cabinet 1, a lifting and rotating device 3 is provided at the center of the plurality of cabinets 1 arranged in a ring, a test device support platform 4 and a tray support platform 5 are provided on the lifting and rotating device 3, a memory stick handling device 6 is provided on the test device support platform 4, a tray conveying device 7 is provided on one side of the lifting and rotating device 3, and the test device 2, the lifting and rotating device 3, the memory stick handling device 6 and the tray conveying device 7 are all connected to the same control system;

[0031] Several test devices 2 are arranged along the height direction of each cabinet 1; several cabinets 1 and the tray conveyor 7 are arranged in a circle; the test device 2 includes a test device housing, a test mainboard and a temperature box, both sides of the test device housing are slidably connected to the cabinet 1, the test mainboard and the temperature box are arranged on the test device housing, and the temperature box is flipped and connected to the test device housing;

[0032] In the above embodiment, if Figure 1 It is a schematic diagram of the internal structure of the present invention. Figure 1Three cabinets 1 are omitted so that the internal structure of the present invention can be seen clearly. The automated memory stick test system of the present invention includes several cabinets 1 arranged in a ring, a lifting and rotating device 3, a test equipment support platform 4, a tray support platform 5, a tray conveyor 7, a memory stick handling device 6 and a control system. In a preferred embodiment, the number of cabinets 1 is seven, and the seven cabinets 1 are arranged in a ring at an angle of 45°. The tops of several cabinets 1 are connected by fixed brackets. Multiple layers of test equipment 2 can be set in each cabinet 1. At the same time, the standard cabinet 1 can be replaced with a customized cabinet 1, and the cabinet 1 can be heightened to accommodate more test equipment 2. Compared with the uniform arrangement, one less cabinet 1 is set for setting the tray conveyor 7. The tray conveyor The device 7 is arranged at the gap of the annular cabinet 1, and the material tray conveyor device 7 includes a loading conveyor belt and a unloading conveyor belt arranged in the gravity direction, which are divided into two layers of conveyor belts, one layer is the loading conveyor belt, and the other layer is the unloading conveyor belt. The conveyor belt can accommodate multiple material trays, the loading conveyor belt is a full material tray with memory bars to be tested, and the unloading conveyor belt is a full material tray with tested memory bars. In the present application, the loading conveyor belt and the unloading conveyor belt can also be arranged in sequence horizontally; in a possible embodiment, the material tray conveyor device 7 of the present application can be a loading and unloading tray storage cabinet in addition to the loading and unloading conveyor belt. The loading and unloading conveyor belt is suitable for docking with an external automation line, and the loading and unloading tray storage cabinet is suitable for manual operation, such as Figure 5-6 As shown, a multi-layer tray tray is arranged inside the upper and lower tray storage cabinet, and each tray can store a tray. When the tray is unlocked, it can be pulled out backwards, which is convenient for operators to place trays. The tray storing the memory stick to be tested or the empty tray can be pulled out from the tray to the tray support platform 5 by the memory stick handling device 6, and conversely, the tray storing the tested memory stick or the empty tray can be pushed into the tray by the tray support platform 5 by the memory stick handling device 6.

[0033] The advantage of the loading and unloading tray storage cabinet solution is that it can store a larger number of trays, that is, after loading once, it can meet the memory required for the system to run for a longer period of time, and no intervention is required in the middle, reducing the demand for operators or external automation equipment.

[0034] The test equipment 2 in each cabinet 1 is composed of a test equipment shell, a test mainboard, a temperature box and other supporting equipment for the test mainboard. Slide rails are arranged on both sides of the test equipment shell, and the test equipment shell is fixedly connected to the cabinet 1 through the slide rails. The test equipment shell as a whole can be pulled out of the cabinet 1 by one end. The test mainboard and the temperature box are arranged on the test equipment shell. The test mainboard is provided with a plurality of memory slots for inserting memory sticks. The temperature box is arranged above the test mainboard, and can accommodate the memory stick to be tested, and provide the temperature environment required for the test. The temperature box can be rotated open when taking and placing the memory stick.

[0035] A lifting and rotating device 3 is arranged at the center of the circular arrangement of the cabinet 1. The lifting and rotating device 3 includes a lifting and rotating column. A test equipment support platform 4 and a material tray support platform 5 are arranged on the lifting and rotating column. The upper layer is the test equipment support platform 4, and the lower layer is the material tray support platform 5. The test equipment support platform 4 and the material tray support platform 5 can move vertically up and down on the lifting and rotating column, and can drive the test equipment support platform 4 and the material tray support platform 5 to rotate through the self-rotation of the lifting and rotating column. The test equipment support platform 4 can be rotated to align with any test equipment 2 on the circular cabinet 1. When the test equipment shell is pulled out of the cabinet 1, the test equipment support platform 4 is located below the test equipment shell to support and fix the test equipment 2. At the same time, a memory stick handling device 6 is arranged on the test equipment support platform 4 for completing In order to perform tasks such as plugging and unplugging memory sticks, pushing and pulling the test equipment casing, etc., the memory stick handling equipment 6 can have various forms. It can be a manipulator, such as the multi-axis manipulator or parallel manipulator shown in the figure, or an XYZ motion module can be used instead of the manipulator. For example, the manipulator has one or more memory clamps at the end for clamping the memory stick, and one or more pressure strip mechanisms at the end for pressing the memory stick placed on the memory slot of the test equipment 2 into the memory slot, and one or more buckle opening mechanisms at the end for opening the buckle of the memory slot on the test equipment 5. The memory clamps, pressure strip mechanisms, and buckle opening mechanisms can be set independently or integrated, etc. A clamp is also provided at the end of the manipulator of the memory stick handling equipment, which can be connected to the corresponding mechanism on the front panel of the test equipment, so as to pull the test equipment out or push it back into the cabinet 1, etc.

[0036] The automatic memory stick test system of the present invention is automatically controlled by a control system. The control system can adopt PLC automatic control technology. Its structure and principle belong to the prior art and will not be elaborated in detail in this application.

[0037] During operation, when a test device 2 completes the test, the test device support platform 4 moves to the aligned position with the corresponding test device 2, the memory stick handling device 6 pulls the test device 2 out of the cabinet 1 and onto the test device support platform 4, and the incubator of the test device 2 is opened. When aligning and pulling out the test device 2, the tray support platform 5 rotates synchronously so that an empty tray and a full tray are located on both sides of the test device support platform 4, respectively. The memory stick handling device 6 removes the tested memory sticks on the test device 2 from the test device 2 and puts them into the empty tray, and removes the memory sticks to be tested in the full tray from the tray and plugs them into the test mainboard of the test device 2. The memory stick handling device 6 repeats the work to put all the tested memory sticks on the test device 2 into the empty tray, and fills the test positions of the test device 2 with the memory sticks to be tested in the full tray. The incubator of the test equipment 2 is closed, and the memory stick handling device 6 pushes the test equipment 2 back to the cabinet 1. The tray support platform 5 moves to align with the unloading conveyor belt, and the tray support platform 5 rotates to align the tray with the tested memory stick with the unloading transfer belt. The tray is transported to the unloading conveyor belt, and the corresponding tray position on the tray support platform 5 is vacated. Then the tray support platform 5 is lifted and lowered to align with the loading conveyor belt. The empty tray position on the tray support platform 5 is aligned with the loading transfer belt, and the tray with the memory stick to be tested is transported by the loading conveyor belt to the corresponding tray position of the tray support platform 5.

[0038] During loading and unloading, the two sides of the test equipment support platform 4 are respectively the loading tray station and the unloading tray station. The memory stick handling equipment 6 takes out and puts in the memory sticks from these two stations respectively. The loading tray station and the unloading tray station are not specific physical structures. There are 8 tray positions on the tray support platform 5, and the tray support platform 5 can rotate independently of the test equipment support platform 4. When any tray position on the tray support platform 5 is rotated to the positions on both sides of the test equipment support platform 4, it is the loading tray station or the unloading tray station. When there is insufficient material on the loading tray or insufficient space on the unloading tray, the loading and unloading trays can be quickly switched by rotating the tray support platform 5. The loading tray and the unloading tray have the same tray structure. When all the memory sticks to be tested in the loading tray are taken out, the loading tray is converted into the unloading tray for use. If it works in a cycle, the memory stick test efficiency can be greatly improved.

[0039] In an optional solution of the above embodiment, two flip legs 8 are provided at the bottom of the incubator, the two flip legs are connected by a flip shaft, and the middle of the flip shaft is connected to a flip motor 9 through a worm gear mechanism.

[0040] In this optional solution, a flip structure of the incubator is provided, such as Figure 3As shown, two flip feet 8 are integrally provided at the bottom of each incubator, which are respectively located on both sides of the incubator. The two flip feet 8 are connected by a flip shaft, and a flip motor 9 is connected to the middle of the flip shaft through a turbine worm mechanism. When the flip motor 9 is started, it drives the flip shaft to rotate, thereby driving the flip feet 8 to rotate and then realizing the flipping of the incubator.

[0041] In an optional scheme of the above embodiment, the lifting and rotating device 3 includes a lifting and rotating column, a linear motion module 10 is arranged on one side of the lifting and rotating column, and the linear motion module 10 is respectively connected to the test equipment support platform 4 and the material tray support platform 5, so as to drive the test equipment support platform 4 and the material tray support platform 5 to make linear motion along the lifting and rotating column through the linear motion module 10; the linear motion module 10 includes a lifting motor, a lifting screw and a nut seat, the lifting motor is arranged at one end of the lifting and rotating column, the lifting motor is connected to the lifting screw, and the side of the test equipment support platform 4 and the side of the material tray support platform 5 are connected to the lifting screw through the nut seat;

[0042] The lifting and rotating device 3 includes a lifting and rotating base and a lifting and rotating column. The lifting and rotating base is arranged at the center of the several cabinets 1. A driving gear is arranged on the lifting and rotating base. The lifting and rotating column is provided with an annular rack. The driving gear cooperates with the annular rack. The inner ring of the driving gear is connected to a rotating motor to drive the lifting and rotating column to rotate through the rotating motor.

[0043] In this optional solution, a structural schematic diagram of a lifting and rotating device 3 is provided, and the lifting and rotating device 3 can realize the lifting and rotation of the test equipment support platform 4 and the tray support platform 5. Specifically, Figure 4 As shown, the lifting and rotating device 3 includes a lifting and rotating column and a lifting and rotating base. The lifting and rotating base is installed on the ground, that is, at the center of several cabinets 1. The lifting and rotating column is connected to the lifting and rotating base through bearings and rotating shafts, so that the lifting and rotating column can be on the lifting and rotating base. At the same time, an annular rack is sleeved on the lifting and rotating column, and a driving gear and a driving motor that match the annular rack are provided on the lifting and rotating base. The output shaft of the driving motor is connected to the inner ring of the driving gear, and the outer ring of the driving gear is meshed with the annular rack. When the driving motor is working, it can control the rotation of the lifting and rotating column, so that the test equipment support platform 4 and the material tray support platform 5 connected to the lifting and rotating column rotate synchronously;

[0044] The test equipment support platform 4 and the tray support platform 5 are connected to the lifting and rotating column through a linear motion module 10, which includes a lifting motor, a lifting screw and a nut seat. Figure 4As shown, a lifting motor, a lifting screw and a nut seat are installed on the side of the lifting and rotating column, and the test equipment support platform 4 and the material tray support platform 5 are connected to the lifting screw through the nut seat. The lifting motor rotates the nut seat to make a back and forth linear motion along the lifting screw to realize the lifting and lowering of the test equipment support platform 4 and the material tray support platform 5. In this embodiment, the lifting and lowering movement and rotation movement of the test equipment support platform 4 and the material tray support platform 5 are carried out synchronously.

[0045] In the optional scheme of this embodiment, the linear motion module 10 can also be driven by a chain, a synchronous belt, a gear rack, a linear motor, etc. These methods are all mature solutions in the prior art and also fall within the protection scope of this application. At the same time, in order to reduce the load of the linear motion module 10, a balanced gravity device is provided on the lifting and rotating column. The balanced gravity device can apply a force to the linear motion module 10 that is approximately equal to the sum of the gravity of the linear motion module 10 and the load thereon, and is vertically upward, so as to reduce the load of the linear motion module 10, reduce its cost and extend its service life; there are multiple implementation schemes for the balanced gravity device, such as the balanced gravity device can adopt a constant force spring, which is fixedly set on the top of the lifting and rotating column, and the end of the spring piece is fixedly connected to the linear motion module 10 to apply a constant vertical upward pulling force to the linear motion module 10. The balanced gravity device can also adopt a counterweight scheme, and a certain pulley is provided on the top of the lifting and rotating column, and a steel wire is wound around the fixed pulley, one end of which is fixedly connected to the linear motion module 10, and the other end is fixedly connected to the counterweight block.

[0046] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. An automated memory stick testing system, characterized in that: It comprises several cabinets arranged in a ring, each of which is provided with a test device, each of which is slidably connected to the corresponding cabinet, a lifting and rotating device is provided at the center of the several cabinets arranged in a ring, a test device support platform and a material tray support platform are provided on the lifting and rotating device, a memory stick transporting device is provided on the test device support platform, a material tray conveying device is provided on one side of the lifting and rotating device, and the test equipment, the lifting and rotating device, the memory stick transporting device and the material tray conveying device are all connected to the same control system.

2. The automatic memory stick testing system according to claim 1, characterized in that: Several testing devices are arranged along the height direction of each of the cabinets.

3. The automatic memory stick testing system according to claim 1, characterized in that: A plurality of the cabinets and the tray conveying device are arranged in a circle.

4. The automatic memory stick testing system according to claim 1, characterized in that: The test device comprises a test device housing, a test mainboard and a temperature box. Both sides of the test device housing are slidably connected to the cabinet. The test mainboard and the temperature box are arranged on the test device housing. The temperature box is flip-connected to the test device housing.

5. The automatic memory stick testing system according to claim 4, characterized in that: Two flip legs are arranged at the bottom of the temperature box, the two flip brackets are connected by a flip shaft, and the middle part of the flip shaft is connected to a flip motor through a turbine worm gear mechanism.

6. The automatic memory stick testing system according to claim 1, characterized in that: The lifting and rotating device includes a lifting and rotating column, and a linear motion module is arranged on one side of the lifting and rotating column. The linear motion module is respectively connected to the test equipment support platform and the material tray support platform, so as to drive the test equipment support platform and the material tray support platform to perform linear motion along the lifting and rotating column through the linear motion module.

7. The automatic memory stick testing system according to claim 6, characterized in that: The linear motion module includes a lifting motor, a lifting screw and a nut seat. The lifting motor is arranged at one end of the lifting and rotating column. The lifting motor is connected to the lifting screw. The side of the test equipment support platform and the side of the material tray support platform are connected to the lifting screw through the nut seat.

8. The automatic memory stick testing system according to claim 1, characterized in that: The lifting and rotating device includes a lifting and rotating base and a lifting and rotating column. The lifting and rotating base is arranged at the center of the several cabinets. A driving gear is arranged on the lifting and rotating base. The lifting and rotating column is provided with an annular rack. The driving gear cooperates with the annular rack. The inner ring of the driving gear is connected to a rotating motor to drive the lifting and rotating column to rotate through the rotating motor.

Images