Local temperature control laser scanning galvanometer life test device and test method

Abstract

The application relates to a local temperature control laser scanning galvanometer life test device and a test method. The local temperature control laser scanning galvanometer life test device comprises a test table, a laser galvanometer assembly, a temperature adjusting mechanism, a laser and a position detector. The temperature adjusting mechanism comprises a heating fan and a hot air pipe. One end of the hot air pipe is fixedly communicated with the output end of the heating fan, and the other end of the hot air pipe is sleeved outside the laser galvanometer assembly, so that concentrated heating of the laser galvanometer assembly is realized. Different specifications of the heating pipe are matched with different specifications of the laser galvanometer assembly, so that the temperature of the laser galvanometer assembly is adjusted, and then the environmental adaptability of the laser galvanometer assembly is detected in cooperation with the laser and the position detector.

Description

Technical Field

[0001] This application relates to the fields of laser manufacturing and additive manufacturing technology, and in particular to a laser scanning galvanometer lifetime testing device and method with local temperature control. Background Technology

[0002] Galvanometers are high-precision scanning devices that play an increasingly important role in modern laser precision micro-machining applications. Therefore, the quality requirements for galvanometers are becoming increasingly stringent, leading to multiple testing processes before they leave the factory to ensure that each galvanometer meets the required standards.

[0003] However, existing laser galvanometer testing devices and methods are limited by the size of the heating device, making it impossible or difficult to test the environmental adaptability of large-sized laser galvanometers at different temperatures. Summary of the Invention

[0004] Therefore, it is necessary to address the problem that the environmental adaptability of excessively large laser galvanometers at different temperatures cannot be tested or is difficult to test due to limitations in the size of the heating device. This paper provides a locally temperature-controlled laser scanning galvanometer lifetime testing device and method.

[0005] In a first aspect, embodiments of this application provide a locally temperature-controlled laser scanning galvanometer lifetime testing device, the locally temperature-controlled laser scanning galvanometer lifetime testing device comprising:

[0006] A test bench is provided for placing a laser galvanometer assembly. The laser galvanometer assembly includes a galvanometer motor and a lens. The galvanometer motor is fixed to the test bench, and the lens is fixed to the output end of the galvanometer motor. The galvanometer motor can drive the lens to rotate along the axial direction of the output end of the galvanometer motor.

[0007] A temperature regulating mechanism includes a heating fan and a hot air pipe. One end of the hot air pipe is connected to the heating fan to receive the air blown out by the heating fan. The other end of the hot air pipe is sleeved outside the laser galvanometer assembly, and the lens extends at least partially outside the hot air pipe so that the air blown out by the heating fan can flow to the laser galvanometer assembly through the hot air pipe.

[0008] A laser, located outside the hot air duct, capable of emitting laser light onto the lens;

[0009] A position detector is located outside the hot air duct and is capable of receiving the laser reflected by the lens.

[0010] In one embodiment, the hot air duct is U-shaped and includes an air inlet pipe, a connecting pipe and an air outlet pipe connected in sequence. One end of the air inlet pipe is fixed to the heating fan. The air outlet pipe is sleeved outside the laser galvanometer assembly, and the lens is at least partially located outside the air outlet pipe. The connecting pipe is used to connect the air inlet pipe and the air outlet pipe.

[0011] In one embodiment, the air inlet pipe and the air outlet pipe extend along a first direction, and the connecting pipe extends along a second direction;

[0012] The first direction and the second direction are perpendicular to each other.

[0013] In one embodiment, the heating fan includes a first motor, a rotating shaft, multiple fan blades, and a cover; the rotating shaft is connected to the output end of the first motor, the multiple fan blades are connected to the rotating shaft and arranged sequentially along the circumference of the rotating shaft, the cover is provided over the multiple fan blades, the cover is provided with an air outlet, and one end of the hot air pipe is connected to the air outlet.

[0014] In one embodiment, the locally temperature-controlled laser scanning galvanometer lifetime testing device further includes a mounting fixture, which includes a mounting frame and a fixing plate. The mounting frame includes a base and a connecting plate. The base is fixed to the test bench. The connecting plate extends along a first direction and its bottom is fixed to the base. The fixing plate is fixedly connected to the connecting plate and is used to fix the laser galvanometer assembly.

[0015] In one embodiment, the connecting plate is provided with a slide rail, the fixing plate is movable along the slide rail in a first direction, and the fixing plate is provided with fasteners for fixing the fixing plate on the slide rail.

[0016] In one embodiment, the temperature regulating mechanism further includes a temperature sensor fixed to the galvanometer motor, the temperature sensor being used to detect the temperature of the galvanometer motor.

[0017] In one embodiment, the locally temperature-controlled laser scanning galvanometer lifetime testing device further includes a mounting bracket, which is fixed to the test bench and is used to place the laser and the position detector.

[0018] In one embodiment, the locally temperature-controlled laser scanning galvanometer lifetime testing device further includes a second fixing mechanism, which is fixed to the mounting bracket and is used to fix the laser and the position detector to the mounting bracket.

[0019] Secondly, this application also provides a method for testing the lifetime of a laser scanning galvanometer with local temperature control, using the aforementioned laser scanning galvanometer lifetime testing device with local temperature control. The method for testing the lifetime of a laser scanning galvanometer with local temperature control includes the following steps:

[0020] Adjust the laser galvanometer assembly to the zero position and adjust the lens mounting angle so that the laser reflected by the lens can fall into the position detector;

[0021] Start the heating fan and set the heating temperature to the test temperature T;

[0022] The temperature of the galvanometer motor is measured using the temperature sensor, and after the temperature stabilizes, a lifespan test is performed. Beneficial effects

[0023] This application provides a locally temperature-controlled laser scanning galvanometer lifetime testing device and method. The locally temperature-controlled laser scanning galvanometer lifetime testing device includes a test bench, a laser galvanometer assembly, a temperature adjustment mechanism, a laser, and a position detector. The temperature adjustment mechanism includes a heating fan and a hot air pipe. By fixing one end of the hot air pipe to the output end of the heating fan and sleeve the other end of the hot air pipe around the laser galvanometer assembly, centralized heating of the laser galvanometer assembly is achieved. Furthermore, by using heating pipes of different specifications in conjunction with laser galvanometer assemblies of different specifications, the temperature of the laser galvanometer assembly can be adjusted. This, in conjunction with the laser and the position detector, allows for the testing of the environmental adaptability of the laser galvanometer assembly. Attached Figure Description

[0024] Figure 1 This is a schematic diagram of a locally temperature-controlled laser scanning galvanometer lifetime testing device provided in some embodiments of this application.

[0025] Figure 2 This is a schematic diagram of the mounting fixture and moving mechanism of a locally temperature-controlled laser scanning galvanometer lifetime testing device provided in some embodiments of this application.

[0026] Figure 3 This is a schematic diagram of the heating fan of a local temperature-controlled laser scanning galvanometer lifetime testing device provided in some embodiments of this application.

[0027] Figure 4 This is a schematic diagram of the moving mechanism of a locally temperature-controlled laser scanning galvanometer lifetime testing device provided in some embodiments of this application.

[0028] Figure 5 This diagram illustrates the relationship between the deflection angle of the scanning galvanometer assembly and the displacement detected by the position detector in a locally temperature-controlled laser scanning galvanometer lifetime testing device provided in some embodiments of this application.

[0029] Figure 6 This diagram illustrates the relationship between the deflection angle of the scanning galvanometer assembly and the displacement of the reflected light spot in a locally temperature-controlled laser scanning galvanometer lifetime testing device provided in some embodiments of this application.

[0030] Figure label:

[0031] 1. Test bench;

[0032] 2. Temperature regulation mechanism; 21. Heating fan; 211. Heating motor; 212. Shaft; 213. Fan blade; 214. Cover; 215. Heating element; 22. Hot air duct; 221. Inlet duct; 222. Connecting pipe; 223. Outlet duct;

[0033] 3. Laser;

[0034] 4. Position detector;

[0035] 5. Installation clamp; 51. Mounting bracket; 511. Base; 512. Connecting plate; 52. Fixing plate;

[0036] 6. Install the bracket;

[0037] 7. Adjustment mechanism; 71. First adjustment component; 711. First drive rod; 712. First adjustment platform; 72. Second adjustment component; 721. Second drive rod; 722. Second adjustment platform; 73. Angle adjustment component; 731. Arc-shaped platform; 732. Arc-shaped seat;

[0038] 100. Laser galvanometer assembly; 101. Galvanometer motor; 102. Lens;

[0039] X, first direction; Y, second direction; Z, third direction. Detailed Implementation

[0040] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0041] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0042] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0043] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0044] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0045] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0046] Firstly, see Figures 1-2 One embodiment of this application provides a locally temperature-controlled laser scanning galvanometer lifetime testing device, which includes a test bench 1, a temperature adjustment mechanism 2, a laser 3, and a position detector 4.

[0047] In this embodiment of the application, the test bench 1 is used to place the laser galvanometer assembly 100. The laser galvanometer assembly 100 includes a galvanometer motor 101 and a lens 102. The galvanometer motor 101 is fixed to the test bench 1, and the lens 102 is fixed to the output end of the galvanometer motor 101. The galvanometer motor 101 can drive the lens 102 to rotate along the axial direction of the output end of the galvanometer motor 101.

[0048] The temperature regulation mechanism 2 includes a heating fan 21 and a hot air pipe 22. One end of the hot air pipe 22 is connected to the heating fan 21 to receive the air blown out by the heating fan 21.

[0049] The other end of the hot air pipe 22 is sleeved outside the laser galvanometer assembly 100, and the lens 102 extends at least partially outside the hot air pipe 22 so that the air blown out by the heating fan 21 can flow through the hot air pipe 22 to the laser galvanometer assembly 100.

[0050] The laser 3 is located outside the hot air duct 22, and the laser 3 is capable of emitting laser light at the lens 102;

[0051] The position detector 4 is located outside the hot air duct 22, and the position detector 4 is capable of receiving the laser reflected by the lens 102.

[0052] The embodiment of this application provides a local temperature-controlled laser scanning galvanometer life test device and test method. By fixing one end of the hot air pipe 22 to the output end of the heating fan 21 and sleeve the other end of the hot air pipe 22 outside the laser galvanometer assembly 100, the laser galvanometer assembly 100 is centrally heated. By using heating pipes of different specifications in conjunction with laser galvanometer assemblies of different specifications, the temperature of the laser galvanometer assembly 100 can be adjusted. This, in conjunction with the laser 3 and the position detector 4, tests the environmental adaptability of the laser galvanometer assembly 100.

[0053] It should be noted that the first direction X is the X direction, the second direction Y is the Y direction, and the third direction Z is the Z direction. The first direction X, the second direction Y, and the third direction Z are all perpendicular to each other.

[0054] like Figures 1-3 As shown, in some embodiments, specifically, the hot air duct 22 is U-shaped and includes an air inlet duct 221, a connecting duct 222, and an air outlet duct 223 connected in sequence. One end of the air inlet duct 221 is fixed to the heating fan 21. The air outlet duct 223 is sleeved outside the laser galvanometer assembly 100, and the lens 102 is at least partially located outside the air outlet duct 223. The connecting duct 222 is used to connect the air inlet duct 221 and the air outlet duct 223.

[0055] By configuring the hot air duct 22 into three segments—inlet duct 221, connecting duct 222, and outlet duct 223—connected sequentially, it is possible to replace only the outlet duct 223 when using laser galvanometer components 100 of different specifications, without replacing the entire hot air duct 22 structure. This greatly improves the efficiency of the test. Furthermore, if any one of the three components—inlet duct 221, connecting duct 222, and outlet duct 223—is damaged, only the damaged part needs to be replaced, thus saving on the test cost.

[0056] like Figures 1-3 As shown, in some embodiments, the air inlet pipe 221 and the air outlet pipe 223 extend along a first direction X, and the connecting pipe 222 extends along a second direction Y; the first direction X and the second direction Y are perpendicular to each other.

[0057] In this embodiment, the lens 102 is located at the bottom of the galvanometer motor 101. Correspondingly, the air outlet duct 223 is configured to extend along the first direction X, so that the laser galvanometer assembly 100 can be directly fitted inside the air outlet duct 223 from top to bottom, and a portion of the lens 102 can be exposed outside the air outlet duct 223, so that the lens 102 can reflect the laser emitted by the laser 3 into the position detector 4.

[0058] like Figure 1 and Figure 3 As shown, in some embodiments, the heating fan 21 includes a first motor, a rotating shaft 212, and a plurality of fan blades 213 and a cover 214; the rotating shaft 212 is connected to the output end of the first motor, the plurality of fan blades 213 are connected to the rotating shaft 212 and arranged sequentially along the circumference of the rotating shaft 212, the cover 214 covers the plurality of fan blades 213, the cover 214 is provided with an air outlet, and one end of the hot air pipe 22 is connected to the air outlet.

[0059] Furthermore, in this embodiment, the heating fan 21 also includes a heating element 215, which is located between the fan blade 213 and the air outlet. In this embodiment, the heating element 215 is a heating wire.

[0060] The first motor drives the rotating shaft 212 to rotate the fan blades 213, thereby blowing out hot air and allowing the hot air to enter the hot air pipe 22 to heat the laser galvanometer assembly 100.

[0061] like Figure 2 As shown, in some embodiments, the locally temperature-controlled laser scanning galvanometer lifetime testing device further includes a mounting fixture 5. The mounting fixture 5 includes a mounting frame 51 and a fixing plate 52. The mounting frame 51 includes a base 511 and a connecting plate 512. The base 511 is fixed to the test bench 1. The connecting plate 512 extends along the first direction X. The bottom of the connecting plate 512 is fixed to the base 511. The fixing plate 52 is fixedly connected to the connecting plate 512. The fixing plate 52 is used to fix the laser galvanometer assembly 100.

[0062] By fixing the laser galvanometer assembly 100 with the mounting fixture 5, the laser galvanometer assembly 100 can be made more stable, thereby improving the test quality.

[0063] like Figure 2 As shown, in some embodiments, the connecting plate 512 is provided with a slide rail, the fixing plate 52 is movable along the slide rail in a first direction X, and the fixing plate 52 is provided with a fastener for fixing the fixing plate 52 on the slide rail.

[0064] By providing a slide rail on the connecting plate 512, and slidably connecting the fixing plate 52 to the slide rail, the fixing plate 52 can slide along the first direction X, thereby driving the laser galvanometer assembly 100 to move along the first direction X. This allows for adjustment of the position of the lens 102 in the first direction X, further improving the testing accuracy of the lens 102 and enhancing the product quality of the laser galvanometer assembly 100. Furthermore, by fixing the position of the fixing plate 52 on the slide rail with fasteners, the stability of the laser galvanometer assembly 100 is greatly improved, enhancing experimental quality.

[0065] like Figures 1-3 As shown, in some embodiments, the temperature regulating mechanism 2 further includes a temperature sensor, which is fixed to the galvanometer motor 101 and is used to detect the temperature of the galvanometer motor 101.

[0066] In this embodiment of the application, the local temperature-controlled laser scanning galvanometer life test device further includes a temperature control unit, which includes a control screen and a control board. The control screen is electrically connected to a temperature sensor and can display the temperature of the laser galvanometer assembly 100. The control board is electrically connected to a heating motor 211 and can control the switching of the heating motor 211, thereby adjusting the temperature of the laser galvanometer assembly 100.

[0067] like Figures 1-3 As shown, in some embodiments, the locally temperature-controlled laser scanning galvanometer life test device further includes a first fixing mechanism, which is fixed to the test bench 1 and is used to fix the galvanometer motor 101.

[0068] like Figures 1-3 As shown, in some embodiments, the locally temperature-controlled laser scanning galvanometer life test device further includes a second fixing mechanism, which is fixed to the mounting bracket 6 and is used to fix the laser 3 and the position detector 4 to the mounting bracket 6.

[0069] By setting up a mounting bracket 6 to place the laser 3 and the position detector 4, and fixing the laser 3 and the position detector 4 to the mounting bracket 6 through a second fixing mechanism, the placement position of the laser 3 and the position detector 4 can be fixed, thereby making the laser 3 and the position detector 4 more stable, making the test results more accurate, and improving the experimental efficiency by fixing the position of the laser 3 and the position detector 4.

[0070] like Figure 2 and Figure 4 As shown, in some embodiments, the locally temperature-controlled laser scanning galvanometer lifetime testing device further includes an adjustment mechanism 7, which is fixed to the test bench 1. The first fixing mechanism is fixed to the adjustment assembly. The adjustment mechanism 7 is used to adjust the position of the first fixing mechanism along the second direction Y and along the third direction Z. The adjustment mechanism 7 can also adjust the tilt angle of the lens 102 relative to the second direction Y.

[0071] By setting up a moving mechanism and fixing the mounting fixture 5 to the moving mechanism, the mounting fixture 5 and the laser galvanometer assembly 100 fixed on the mounting fixture 5 can move along the second direction Y and the third direction Z under the drive of the moving mechanism, and adjust the angle of the lens 102 relative to the second direction Y, thereby greatly improving the movement range of the lens 102, thereby improving the testing degree of the lens 102, and further improving the product quality of the laser galvanometer assembly 100.

[0072] like Figure 2 and Figure 4As shown, in some embodiments, the adjustment mechanism 7 includes a first adjustment component 71, which includes a first driving member, a first driving rod 711, and a first adjustment platform 712. The first adjustment platform 712 and the first driving member are disposed on the test bench 1. The first driving rod 711 is fixedly disposed at the output end of the first driving member. The first driving member is used to drive the first driving rod 711 to move the first adjustment platform 712 along the second direction Y.

[0073] The first driving rod 711 is driven by the first driving component to move the first adjustment platform 712 along the second direction Y, which can expand the range of movement of the lens 102 along the second direction Y, thereby improving the testing degree of the lens 102, further improving the product quality of the laser galvanometer assembly 100, and improving the automation level of the local temperature-controlled laser scanning galvanometer life test device, thereby improving the experimental efficiency and accelerating the production efficiency of the laser galvanometer assembly 100.

[0074] like Figure 2 and Figure 4 As shown, in some embodiments, the moving mechanism includes a second adjustment component 72, which includes a second driving member, a second driving rod 721, and a second adjustment platform 722. The second moving platform and the second driving member are disposed on the first adjustment platform 712. The output end of the second driving member is fixedly provided with the second driving rod 721. The second driving member can drive the second driving rod 721 to move the second moving platform along a third direction Z.

[0075] By driving the second drive rod 721 through the second drive component to move the second moving platform along the third direction Z, the movement range of the lens 102 along the third direction Z can be expanded, thereby further improving the testing degree of the lens 102, further improving the product quality of the laser galvanometer assembly 100, and improving the automation level of the local temperature-controlled laser scanning galvanometer life test device, thereby further improving the experimental efficiency and accelerating the production efficiency of the laser galvanometer assembly 100.

[0076] like Figure 2 and Figure 4 As shown, in some embodiments, the adjustment mechanism 7 includes an angle adjustment component 73, which comprises an arc-shaped platform 731, an arc-shaped seat 732, and a third driving member. The arc-shaped platform 731 and the third driving member are disposed on the second moving platform. The arc-shaped platform 731 is provided with an arc-shaped groove, and the arc-shaped seat 732 is provided with an arc-shaped protrusion. The arc-shaped groove and the arc-shaped protrusion are in arc-surface engagement. The third driving member can drive the arc-shaped seat 732 to rotate around the third-direction Z axis along the arc-shaped groove.

[0077] By setting an arc-shaped groove on the arc-shaped stage 731 and an arc-shaped protrusion on the arc-shaped seat 732, and by driving the arc-shaped seat 732 to rotate around the third direction Z along the arc-shaped groove via a third driving component, the angle of the lens 102 relative to the second direction Y can be adjusted, thereby further improving the testing degree of the lens 102 and further improving the product quality of the laser galvanometer assembly 100.

[0078] Secondly, such as Figures 5-6 As shown in the figure, this application embodiment also provides a method for testing the lifetime of a laser scanning galvanometer with local temperature control. The test is conducted using the aforementioned laser scanning galvanometer lifetime testing device with local temperature control. The method for testing the lifetime of a laser scanning galvanometer with local temperature control includes the following steps:

[0079] Adjust the laser galvanometer assembly 100 to the zero position and adjust the mounting angle of the lens 102 so that the laser reflected by the lens 102 can fall into the position detector 4;

[0080] Start the heating fan 21 and set the heating temperature to the test temperature T;

[0081] The temperature of the galvanometer motor 101 is measured using the temperature sensor, and after the temperature stabilizes, a lifespan test is performed.

[0082] like Figures 5-6 As shown, in some embodiments, specifically, the local temperature-controlled laser scanning galvanometer life test device and the laser galvanometer assembly 100 to be tested are started, the monochromatic laser 3 is turned on, and the lens 102 is placed at the zero position. The installation angle of the lens 102 is adjusted to ensure that the light spot can appear on the position detector 4 when the lens 102 is at the maximum deflection angle in both positive and negative directions and when the lens 102 is at the zero position.

[0083] In some embodiments, life index testing includes pre-life test testing, which is index testing, including scanning galvanometer maximum scanning angle testing, deflection accuracy testing, linearity testing, and zero-position deviation testing.

[0084] In this embodiment of the application, the life test also includes a life test in progress. After the laser galvanometer assembly 100 passes the pre-life test, the life test in progress begins. The life test in progress lasts for 1500 hours and the test cycle is 24 hours. One index test is carried out in each test cycle to test the maximum scanning angle, deflection accuracy, linearity, and zero-position deviation of the laser galvanometer assembly 100.

[0085] In this embodiment of the application, the life test also includes a post-life test. After the laser galvanometer assembly 100 completes a 1,500-hour life test, the life test is stopped, and a final index test is conducted.

[0086] In some embodiments, if the laser galvanometer assembly 100 does not fail after the above-mentioned life test is completed, and all test results meet the requirements, then the laser galvanometer assembly 100 is considered to have passed the life test at temperature T.

[0087] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0088] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A locally temperature-controlled laser scanning galvanometer lifetime testing device, characterized in that, The locally temperature-controlled laser scanning galvanometer lifetime testing device includes: A test bench is provided for placing a laser galvanometer assembly. The laser galvanometer assembly includes a galvanometer motor and a lens. The galvanometer motor is fixed to the test bench, and the lens is fixed to the output end of the galvanometer motor. The galvanometer motor can drive the lens to rotate along the axial direction of the output end of the galvanometer motor. A temperature regulating mechanism includes a heating fan and a hot air pipe. One end of the hot air pipe is connected to the heating fan to receive the air blown out by the heating fan. The other end of the hot air pipe is sleeved outside the laser galvanometer assembly, and the lens extends at least partially outside the hot air pipe so that the air blown out by the heating fan can flow to the laser galvanometer assembly through the hot air pipe. A laser, located outside the hot air duct, capable of emitting laser light onto the lens; A position detector is located outside the hot air duct and is capable of receiving the laser reflected by the lens.

2. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 1, characterized in that, The hot air duct is U-shaped and includes an air inlet pipe, a connecting pipe and an air outlet pipe connected in sequence. One end of the air inlet pipe is fixed to the heating fan. The air outlet pipe is sleeved outside the laser galvanometer assembly, and the lens is at least partially located outside the air outlet pipe. The connecting pipe is used to connect the air inlet pipe and the air outlet pipe.

3. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 2, characterized in that, The air inlet pipe and the air outlet pipe extend along a first direction, and the connecting pipe extends along a second direction. The first direction and the second direction are perpendicular to each other.

4. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 1, characterized in that, The heating fan includes a first motor, a rotating shaft, multiple fan blades, and a cover; the rotating shaft is connected to the output end of the first motor, the multiple fan blades are connected to the rotating shaft and arranged sequentially along the circumference of the rotating shaft, the cover is placed over the multiple fan blades, the cover has an air outlet, and one end of the hot air pipe is connected to the air outlet.

5. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 1, characterized in that, The locally temperature-controlled laser scanning galvanometer life test device further includes a mounting fixture, which includes a mounting frame and a fixing plate. The mounting frame includes a base and a connecting plate. The base is fixed to the test bench. The connecting plate extends along a first direction and its bottom is fixed to the base. The fixing plate is fixedly connected to the connecting plate. The fixing plate is used to fix the laser galvanometer assembly. The connecting plate is provided with a slide rail, the fixing plate can move along the slide rail in a first direction, and the fixing plate is provided with fasteners for fixing the fixing plate on the slide rail.

6. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 5, characterized in that, The locally temperature-controlled laser scanning galvanometer lifetime testing device further includes a first fixing mechanism, which is fixed to the test bench and is used to fix the galvanometer motor. The locally temperature-controlled laser scanning galvanometer lifetime testing device further includes an adjustment mechanism, which is fixed to the test platform. A first fixing mechanism is fixed to the adjustment mechanism. The adjustment mechanism is used to adjust the position of the first fixing mechanism along a second direction and along a third direction. The joint mechanism can also adjust the tilt angle of the lens relative to the second direction.

7. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 6, characterized in that, The temperature regulation mechanism also includes a temperature sensor, which is fixed to the galvanometer motor and is used to detect the temperature of the galvanometer motor.

8. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 1, characterized in that, The locally temperature-controlled laser scanning galvanometer life test device also includes a mounting bracket, which is fixed to the test bench and is used to place the laser and the position detector.

9. The locally temperature-controlled laser scanning galvanometer lifetime testing device according to claim 8, characterized in that, The locally temperature-controlled laser scanning galvanometer life test device further includes a second fixing mechanism, which is fixed to the mounting bracket and is used to fix the laser and the position detector to the mounting bracket.

10. A method for testing the lifetime of a laser scanning galvanometer with localized temperature control, characterized in that, The laser scanning galvanometer lifetime testing device with local temperature control as described in claim 7 is used for testing. The method for testing the lifetime of the laser scanning galvanometer with local temperature control includes the following steps: Adjust the laser galvanometer assembly to the zero position and adjust the lens mounting angle so that the laser reflected by the lens can fall into the position detector; Start the heating fan and set the heating temperature to the test temperature T; The temperature of the galvanometer motor is measured using the temperature sensor, and after the temperature stabilizes, a lifespan test is performed.

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