TCR calibration method and device, calibration equipment and readable storage medium

Abstract

The invention relates to the technical field of heating body temperature calibration, in particular to a TCR calibration method and device, calibration equipment and a readable storage medium. The TCR calibration method comprises the following steps: calibrating at least one first heating body, obtaining a standard resistance temperature coefficient of the first heating body, heating the first heating body based on a predetermined condition, obtaining at least one standard temperature variable according to the standard resistance temperature coefficient, and heating at least one second heating body based on the same predetermined condition. Acquiring at least one test resistance value variable of the second heating body, and finally acquiring the resistance temperature coefficient of the at least one second heating body according to the standard temperature variable and the test resistance value variable. Therefore, the technical problems that in the TCR calibration process of the heating body, the operation process is tedious, and the calculation result is inaccurate are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of temperature calibration of heating elements, and in particular to a TCR calibration method, device, calibration equipment and readable storage medium. Background Art

[0002] As users' health awareness continues to improve, electronic atomization devices are gradually favored by the general public. During the operation of electronic atomization devices, the heating element of the atomization component is used to heat and atomize the atomization liquid / aerosol generating product to form an aerosol for users to inhale.

[0003] The temperature of the heating element of the electronic atomization device is determined by the temperature coefficient of resistance. The temperature coefficient of resistance (TCR) refers to the degree to which the resistance of a material or device changes with temperature. It is usually used to describe the thermal sensitivity of metal or semiconductor materials. The unit of the temperature coefficient of resistance TCR is ppm / ℃, which is the rate of change of resistance per degree Celsius temperature change. For example, if the TCR of a device is 50ppm / ℃, it means that the resistance of the device will increase by 50ppm (ie 0.005 ohms) for every 1 degree Celsius increase in temperature. Therefore, the temperature coefficient of resistance is particularly important in the performance parameters of the heating element of the electronic atomization device.

[0004] At present, in the process of TCR calibration of the heating element, it is necessary to use infrared equipment for calibration when the heating element is not blocked. When the infrared equipment measures the temperature of the heating element, the measurement position and time are prone to deviation. Since the position and angle of the infrared equipment are different during the process of measuring the temperature of the heating element, it will affect the accuracy of the temperature measured by the actual infrared equipment, and even get the wrong temperature T due to blocking; and because the surface temperature of the heating element is unevenly distributed during the heating process, this temperature difference will gradually decrease with continuous heating and the overall thermal equilibrium state of the heating element. In this process, the resistance of the heating element will also change. As for when to measure this resistance, due to manual operation, there is a certain degree of arbitrariness, which leads to low consistency of this operation and inaccurate measurement results.

[0005] Therefore, in the process of infrared equipment calibrating the TCR of the heater, there are clear and strict requirements for the position and angle of the heater. In addition, during the calibration process, the current temperature needs to be continuously fed back to the heater until the temperature calculated by the TCR and the temperature error of the infrared equipment are within a certain range. Therefore, the operation process is cumbersome and the calculation results are inaccurate. Summary of the invention

[0006] The present invention mainly solves the technical problem that the operation process is complicated and the calculation result is inaccurate during the TCR calibration of the heating element.

[0007] In order to solve the above technical problems, an embodiment of the present invention provides a TCR calibration method, including:

[0008] Calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element;

[0009] heating the first heating element based on a predetermined condition and obtaining at least one standard temperature variable according to a standard resistance temperature coefficient;

[0010] heating at least one second heating element based on the same predetermined condition, and obtaining at least one test resistance variable of the second heating element;

[0011] According to the standard temperature variable and the test resistance variable, the resistance temperature coefficient of at least one second heating element is obtained.

[0012] The embodiment of the present invention further provides a TCR calibration device, comprising:

[0013] A standard machine calibration module, the standard machine calibration module is used to calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element;

[0014] A standard temperature variable acquisition module, the standard temperature variable acquisition module is used to heat the first heating element based on a predetermined condition and acquire at least one standard temperature variable according to a standard resistance temperature coefficient;

[0015] A test resistance variable acquisition module, the test resistance variable acquisition module is used to heat at least one second heating element based on the same predetermined condition to acquire at least one test resistance variable of the second heating element;

[0016] A test machine calibration module, wherein the test machine calibration module is used to obtain the resistance temperature coefficient of at least one second heating element according to a standard temperature variable and a test resistance variable.

[0017] An embodiment of the present invention further provides a calibration device, including a communication bus, a memory, and a processor;

[0018] The communication bus is used to realize the connection and communication between the processor and the memory;

[0019] The memory is used to store programs;

[0020] The processor is used to implement the TCR calibration method as described above by executing the program stored in the memory.

[0021] An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores one or more computer programs, and the one or more computer programs can be executed by one or more processors to implement the TCR calibration method as described above.

[0022] According to the TCR calibration method, apparatus, calibration equipment and readable storage medium of the above-mentioned embodiments, a first heating element is selected as a standard machine, and the standard resistance temperature coefficient of the standard machine is obtained through a series of precise measurements. The power is input to the standard machine according to the specified power to obtain the standard temperature. Since the temperature curves of different heating elements are highly consistent when the power is consistent, the resistance temperature coefficient TCR of the second heating element can be obtained by detecting the resistance values ​​of multiple second heating elements by calibrating the standard machine only once. The calibration operation is simplified, the calibration efficiency is improved, and the influencing factors during temperature detection are avoided, thereby improving the accuracy of the calculation results. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 Flow chart of a TCR calibration method provided in one embodiment of the present application (I);

[0024] Figure 2 Flow chart of a TCR calibration method provided in one embodiment of the present application (II);

[0025] Figure 3 Flow chart of a TCR calibration method provided in one embodiment of the present application (III);

[0026] Figure 4 Flow chart of a TCR calibration method provided in one embodiment of the present application (IV);

[0027] Figure 5 Flow chart of a TCR calibration method provided in one embodiment of the present application (V);

[0028] Figure 6 A schematic diagram of the structure of a TCR calibration device provided in one embodiment of the present application.

[0029] Figure numerals: 61, standard machine calibration module; 62, standard temperature variable acquisition module; 63, test resistance variable acquisition module; 64, test machine calibration module. DETAILED DESCRIPTION

[0030] The present invention is further described in detail below by specific embodiments in conjunction with the accompanying drawings. Wherein similar elements in different embodiments adopt associated similar element numbers. In the following embodiments, many detailed descriptions are for making the present application better understood. However, those skilled in the art can easily recognize that some features can be omitted in different situations, or can be replaced by other elements, materials, methods. In some cases, some operations related to the present application are not shown or described in the specification, this is to avoid the core part of the present application being overwhelmed by too much description, and for those skilled in the art, it is not necessary to describe these related operations in detail, and they can fully understand the related operations according to the description in the specification and the general technical knowledge in the art.

[0031] In addition, the features, operations or characteristics described in the specification can be combined in any appropriate manner to form various implementations. At the same time, the steps or actions in the method description can also be interchanged or adjusted in a manner that is obvious to those skilled in the art. Therefore, the various sequences in the specification and the drawings are only for the purpose of clearly describing a certain embodiment and are not meant to be a required sequence, unless otherwise specified that a certain sequence must be followed.

[0032] The serial numbers of the components in this document, such as "first", "second", etc., are only used to distinguish the objects described and do not have any order or technical meaning. The "connection" and "coupling" mentioned in this application, unless otherwise specified, include direct and indirect connections (couplings).

[0033] In the present invention, TCR, or temperature coefficient of resistance, refers to the degree to which the resistance of a material or device changes with temperature, and is usually used to describe the thermal sensitivity of metal or semiconductor materials. TCR is a physical quantity related to the material itself, and different materials have different TCR values. The unit of TCR is usually ppm / ℃, which is the rate of change of resistance per degree Celsius temperature change. For example, if the TCR of a device is 50ppm / ℃, it means that the resistance of the device will increase by 50ppm (i.e. 0.005 ohms) for every 1℃ increase in temperature.

[0034] In an embodiment of the present invention, the first heating element and the second heating element are heating elements of the same specification, have the same structure and material, and are produced and processed by the same process. First, select at least one first heating element, calibrate it, and obtain its standard TCR value; then heat the first heating element to a specified time according to the specified power, and calculate the standard temperature according to the resistance of the first heating element in a thermal equilibrium state; take the second heating element as the calibrated object, and heat it to the same time according to the same specified power as the first heating element. Since the temperature curves of different heating elements are highly consistent when the power is consistent, the standard temperature is regarded as its test temperature, and the TCR value of the second heating element is calculated according to its test resistance; repeat multiple times to obtain the TCR values ​​of multiple different second heating elements.

[0035] In the embodiment of the present invention, the thermal equilibrium state of the first heating element and the second heating element can both be a state under stable normal temperature and pressure. Of course, it also includes the state where the first heating element and the second heating element are at any stable temperature and any stable pressure. It can be understood that: when the heat absorbed by the first heating element or the second heating element and the heat dissipated reach a balance, it is considered that the first heating element or the second heating element has reached a thermal equilibrium state.

[0036] In the embodiment of the present invention, normal temperature and pressure refer to the external environment temperature and pressure of the first heating element or the second heating element, and the thermal equilibrium state under normal temperature and pressure refers to the state in which the temperature of the first heating element or the second heating element is consistent with the external environment temperature.

[0037] Embodiment 1:

[0038] Please refer to Figure 1 In order to solve the technical problems in the prior art of TCR calibration of heating elements, such as cumbersome calibration operation process, multiple and strict control parameters, and inaccurate calculation results, this embodiment provides a TCR calibration method, including the following steps:

[0039] Step S101: calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element.

[0040] In this embodiment, a first heating element is first calibrated. When the first heating element can provide a stable temperature change and thermal equilibrium state when heated, or when the first heating element is a normal and qualified product, there is no need to select other first heating elements. When the performance of the first selected first heating element is unstable or a stable standard resistance temperature coefficient cannot be obtained, another first heating element is selected for calibration until the standard resistance temperature coefficient can be stably measured.

[0041] The heating element is similar to a resistance wire. When voltage is provided at both ends of the heating element, it can generate heat. As the temperature changes, the resistance of the heating element will also change. When the first heating element is calibrated, infrared rays representing the temperature are received through the lens of the infrared thermal imager. The wavelength of the infrared rays is directly related to the temperature. The temperature T of the first heating element is measured by infrared equipment, and this temperature is fed back to the calibration equipment, such as a computer, and then the standard TCR value is calculated based on this value. Of course, the first heating element can also be calibrated using a thermocouple or other methods.

[0042] For example: during the heating process of the first heating element, at a certain moment, the initial temperature of the first heating element is T0 and the initial resistance is R0; after heating for a period of time, the temperature of the first heating element is T and the resistance is R, then TCR = (R-R0) / [R0(T-T0)]. TCR represents the relationship between the resistance and temperature of the heating element, so according to TCR, by obtaining the resistance R of the first heating element at any moment, the current temperature T corresponding to the resistance R can be calculated. The calibration process of the first heating element is the process of calculating the standard TCR value of the first heating element.

[0043] Step S102: heating the first heating element based on a predetermined condition, and obtaining at least one standard temperature variable according to a standard resistance temperature coefficient.

[0044] In this embodiment, the predetermined condition may be a certain power and a certain time, and the determined values ​​of power and time are obtained. When a certain amount of power is provided to the first heating element and the power is continued for a certain time, the temperature of the first heating element will gradually increase to a certain temperature until it can no longer be increased. At this time, the first heating element reaches a thermal equilibrium state, that is, the energy absorbed by the first heating element and the energy dissipated to the outside are balanced, so the temperature of the first heating element is stable; the temperature of the first heating element in the thermal equilibrium state is obtained by calculation or direct measurement as the standard temperature.

[0045] To obtain the temperature of the first heating element in thermal equilibrium state by calculation, it is necessary to utilize the standard TCR value of the first heating element obtained in step S101, that is, the standard resistance temperature coefficient of the first heating element; in addition, when the first heating element is in thermal equilibrium state, by obtaining the voltage across the first heating element, under the condition of known input power, the current resistance value of the first heating element in thermal equilibrium state is calculated by the formula P=U*U / R; the predetermined conditions are changed and the calculation method of this step is repeated to obtain at least two current resistance values ​​of the first heating element in two different thermal equilibrium states, and at least one current resistance value variable is obtained according to the two current resistance values; the standard temperature variable of the first heating element is obtained according to the current resistance value variable and the standard resistance temperature coefficient.

[0046] The temperature of the first heating element in thermal equilibrium is obtained by measuring, and the temperature of the first heating element in thermal equilibrium is directly measured by infrared, thermocouple or other temperature measurement methods; the predetermined conditions are changed and the measurement method of this step is repeated to obtain at least two current temperatures of the first heating element in two different thermal equilibrium states, and at least one standard temperature variable of the first heating element is obtained according to the at least two current temperatures. Due to manual measurement, the error is larger than that of the calculation acquisition method.

[0047] Step S103: heating at least one second heating element based on the same predetermined condition, and obtaining at least one test resistance variable of the second heating element.

[0048] In this embodiment, the second heating element is heated using the same predetermined conditions as the first heating element, that is, the second heating element is provided with the same power of a certain magnitude as the first heating element, and the power is continued for the same certain time as the first heating element. The temperature of the second heating element will gradually increase to a certain temperature that is the same as the first heating element. At this time, the second heating element reaches the same thermal equilibrium state as the first heating element, that is, the energy absorbed by the second heating element is balanced with the energy emitted to the outside world, so the temperature of the second heating element is stable. The above-mentioned heating principle of the second heating element is based on the theoretical basis that the temperature curves of different heating elements are highly consistent when the power is consistent. When the second heating element is in thermal equilibrium, the voltage across the second heating element can be obtained. When the input power is known, the test resistance value of the second heating element in thermal equilibrium can be calculated by the formula P=U*U / R.

[0049] Change the same predetermined conditions as the first heating element and repeat the calculation method of this step to obtain at least two test resistance values ​​of the second heating element in at least two different thermal equilibrium states, and obtain at least one test resistance variable based on the two test resistance values.

[0050] Step S104: Obtain the resistance temperature coefficient of at least one second heating element according to the standard temperature variable and the test resistance variable.

[0051] In this embodiment, the standard temperature variable is ΔT, and the test resistance variable is ΔR, wherein ΔR=R2-R1, R1 and R2 are two test resistance values ​​of the second heating element in two different thermal equilibrium states, and the resistance temperature coefficient of the second heating element is calculated according to the formula TCR=ΔR / (R1*ΔT).

[0052] The above steps are performed on multiple second heating elements respectively, so as to obtain the resistance temperature coefficient of each second heating element, thereby realizing rapid and accurate calibration of a large number of heating elements.

[0053] Embodiment 2:

[0054] Please refer to Figure 2In order to solve the technical problems in the prior art of calibrating TCR of a heating element, such as the cumbersome calibration operation process, multiple and strict control parameters, and inaccurate calculation results, compared with the first embodiment, this embodiment provides a more concise TCR calibration method, including the following steps:

[0055] Step S201: calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element.

[0056] In this embodiment, the first heating element can be calibrated according to the calibration method of the first embodiment, or the following method can be used: first, the initial temperature and initial resistance of the first heating element are obtained, and the initial temperature and initial resistance can be the temperature and resistance of the first heating element at normal temperature and pressure; second, the first heating element is heated to any equilibrium state, that is, the temperature is stable and maintained for a certain period of time, ensuring that the temperature of the first heating element is evenly distributed on its surface, and the temperature and resistance of the first heating element in this state are obtained; finally, the standard TCR value of the first heating element is calculated based on the initial temperature, initial resistance, temperature and resistance in the thermal equilibrium state. Furthermore, as a preference, the above steps are repeated multiple times to obtain multiple standard TCR values, and the average value of the multiple standard TCR values ​​is calculated, and the average value is used as the final standard TCR value to make the result more accurate.

[0057] For example, the initial temperature of the first heating element at room temperature and pressure is T0, and the initial resistance is R0; after heating for a period of time (60S), the temperature of the first heating element is T, and the resistance is R, then TCR = (R-R0) / [R0(T-T0)]. The calibration process of the first heating element is the process of calculating the standard TCR value of the first heating element.

[0058] Step S202: heating the first heating element based on a predetermined condition, and obtaining at least one standard temperature according to a standard resistance temperature coefficient.

[0059] The predetermined conditions of this embodiment are the same as those of the first embodiment. First, the initial temperature T0 and the initial resistance R0 of the first heating element at normal temperature and pressure are measured; based on the initial temperature T0 and the initial resistance R0, the first heating element is heated once according to the predetermined conditions to obtain the standard resistance R3 in the thermal equilibrium state; the standard resistance variable is obtained according to the difference between the standard resistance R3 and the initial resistance R0, the standard temperature variable is calculated according to the standard resistance variable and the standard TCR value, and the standard temperature T3 is calculated according to the standard temperature variable and the initial temperature.

[0060] The standard temperature of the first heating element in thermal equilibrium state can also be obtained by measuring, using infrared, thermocouple or other temperature measurement methods to directly measure the temperature of the first heating element in thermal equilibrium state as the standard temperature. Due to manual measurement, the error is larger than that of the calculation method.

[0061] Step S103: heating at least one second heating element based on the same predetermined condition to obtain at least one test resistance value of the second heating element.

[0062] The predetermined conditions of this embodiment are the same concept as the predetermined conditions of the first embodiment. The second heating element is heated using the same predetermined conditions as the first heating element, that is, the second heating element is provided with the same power of a certain magnitude as the first heating element, and the power is continued for the same certain time as the first heating element. The temperature of the second heating element will gradually increase to the same temperature as the first heating element. At this time, the second heating element reaches the same thermal equilibrium state as the first heating element, that is, the energy absorbed by the second heating element is balanced with the energy dissipated to the outside world, so the temperature of the second heating element is stable.

[0063] First, the initial temperature T0 and initial resistance R0 of the second heating element at normal temperature and pressure are measured. Since the second heating element and the first heating element are products of the same specifications, under the same environment, the initial temperature and initial resistance of the second heating element are the same as the initial temperature and initial resistance of the first heating element; based on the initial temperature T0 and the initial resistance R0, the second heating element is heated once according to predetermined conditions to obtain a test resistance R4 in a thermal equilibrium state; the test resistance variable is obtained according to the difference between the test resistance R4 and the initial resistance R0.

[0064] Step S204: Obtain the resistance temperature coefficient of at least one second heating element according to the standard temperature and the test resistance value.

[0065] In this embodiment, the standard temperature is T3 and the test resistance is R4, so the formula for calculating the resistance temperature coefficient of the second heating element is TCR=(R4-R0) / [R0(T3-T0)].

[0066] The above steps are performed on multiple second heating elements respectively to obtain the resistance temperature coefficient of each second heating element, and rapid and accurate calibration of a large number of heating elements can be achieved simultaneously. Compared with the first embodiment, the method steps of this embodiment are simpler in operation.

[0067] Embodiment three:

[0068] Please refer to Figure 3 In order to accurately obtain the standard TCR value of the first heating element, based on the above implementation, step S101, calibrating at least one first heating element to obtain the standard resistance temperature coefficient of the first heating element, includes the following steps:

[0069] Step S301, heating the first heating element.

[0070] In this embodiment, the first heating element can be selected from a plurality of heating elements of the same specification. When the first heating element can provide a stable temperature change and thermal equilibrium state when heated, or when the first heating element is a normal qualified product, there is no need to select other first heating elements. The heating of the first heating element is achieved by providing a voltage to both ends of the first heating element, and the first heating element can generate heat at its own resistance value, similar to a resistance wire.

[0071] Step S302: during the temperature change process of the first heating element, obtaining the resistance variable and the temperature variable of the first heating element.

[0072] In this embodiment, the process of obtaining the resistance variable and the temperature variable of the first heating element is as follows: in the temperature change process of the first heating element, at least two thermal equilibrium states are obtained; the first resistance and the second resistance of the first heating element in the two thermal equilibrium states are respectively obtained; the first temperature and the second temperature of the first heating element in the two thermal equilibrium states are respectively obtained; the resistance variable is obtained according to the first resistance and the second resistance, and the temperature variable is obtained according to the first temperature and the second temperature.

[0073] In the process of changing the temperature, different powers are input to obtain at least two thermal equilibrium states, and the first resistance value and the second resistance value, the first temperature and the second temperature of the first heating element are respectively obtained in the two thermal equilibrium states. The difference between the first resistance value and the second resistance value is the resistance variable, and the difference between the first temperature and the second temperature is the temperature variable.

[0074] The method for obtaining the first resistance value and the second resistance value is:

[0075] The voltages across the first heating element are obtained respectively when the first heating element is in two thermal equilibrium states. When the input power is known, the first resistance and the second resistance of the first heating element in the two thermal equilibrium states are calculated by the formula P=U*U / R.

[0076] The method for obtaining the first temperature and the second temperature is:

[0077] When the first heating element is in two thermal equilibrium states, the first temperature and the second temperature of the first heating element in the two thermal equilibrium states are directly measured by using infrared, thermocouple or other temperature measurement methods respectively; it is worth noting that when measuring the temperature twice, the temperature measurement conditions should be kept consistent, that is, the measuring position and time of the infrared, thermocouple or other temperature measurement methods on the first heating element should be the same, that is, the temperature is measured at the same position on the first heating element when measuring the temperature twice, and when measuring the temperature, it is ensured that both measurements reach a thermal equilibrium state and maintain the equilibrium state for the same time.

[0078] Step S303: Obtain the standard resistance temperature coefficient of the first heating element according to the resistance variable and the temperature variable.

[0079] In this embodiment, the standard resistance temperature coefficient of the first heating element, that is, the standard TCR value, is calculated according to the formula TCR=ΔR / (R*ΔT), wherein the standard temperature variable is ΔT, the test resistance variable is ΔR, and R is the first resistance value or the second resistance value.

[0080] When ΔR≥0, R is the smaller value between the first resistance value and the second resistance value; when ΔR<0, R is the larger value between the first resistance value and the second resistance value.

[0081] In this embodiment, preferably, the thermal equilibrium state of the first heating element may include the state of the first heating element at normal temperature and pressure, that is, at normal temperature and pressure, the temperature and resistance of the first heating element are fixed, and it is in a temperature equilibrium state, which is also a thermal equilibrium state.

[0082] That is to say, the thermal equilibrium states of the first heating element and the second heating element can both be states at normal temperature and pressure.

[0083] Embodiment 4:

[0084] Please refer to Figure 4 In order to simplify the process of obtaining the resistance temperature coefficient of the second heating element and improve the calibration efficiency, based on the above implementation, step S102, heating the first heating element based on a predetermined condition, and obtaining at least one standard temperature variable according to the standard resistance temperature coefficient, includes the following steps:

[0085] Step S401: Determine at least two different designated powers, where the at least two different designated powers include a first power and a second power.

[0086] In this embodiment, two different specified powers are selected to heat the first heating element, and the two different specified powers are marked as the first power Pa and the second power Pb respectively. The power for heating the first heating element is controlled by PWM, i.e., pulse width modulation. By changing the duty cycle of PWM, the input power of the first heating element is changed, that is, the change or switching between the first power and the second power is achieved.

[0087] It is worth noting that the first power or the second power can be zero power, that is, there is no power input at both ends of the first heating element. At this time, if the temperature of the first heating element is stable, it is in a thermal equilibrium state at normal temperature and pressure.

[0088] Preferably, the first power and the second power can be two different power curves, where the power curve refers to a curve that controls the power of the heating of the first heating element over time, and is used to adjust the heating power of the first heating element, thereby controlling the temperature of the first heating element; the two power curves enable the first heating element to reach two different thermal equilibrium states.

[0089] Preferably, one of the first power and the second power is a power curve, and the first power and the second power enable the first heating element to reach two different thermal equilibrium states.

[0090] Preferably, all or one of the first power and the second power is a point value on a certain power curve, and the first power and the second power enable the first heating element to reach two different thermal equilibrium states.

[0091] Step S402: inputting a first power to the first heating element for a first specified time, so that the first heating element reaches a first thermal equilibrium state.

[0092] In this embodiment, the first power is input to the first heating element by adjusting the duty cycle of PWM. After the first power input continues for a first specified time, the first heating element reaches a first thermal equilibrium state, that is, the temperature of the first heating element is stable.

[0093] It is worth noting that when the first power is zero power, the first thermal equilibrium state is a thermal equilibrium state at normal temperature and pressure, and the first designated time may be 0.

[0094] Step S403: inputting a second power to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state.

[0095] In this embodiment, the second power is input to the first heating element by adjusting the duty cycle of PWM. After the second power input continues for a second specified time, the first heating element reaches a second thermal equilibrium state, that is, the temperature of the first heating element is stable.

[0096] It is worth noting that when the second power is zero power, the second thermal equilibrium state is a thermal equilibrium state at normal temperature and pressure, and the second designated time may be zero.

[0097] Step S404, respectively obtaining a first standard resistance value of the first heating element in a first thermal equilibrium state and a second standard resistance value of the first heating element in a second thermal equilibrium state.

[0098] In this embodiment, a first standard voltage Ua at both ends of the first heating element in a first thermal equilibrium state and a second standard voltage Ub at a second thermal equilibrium state are obtained by measuring or according to PWM;

[0099] The first standard resistance value Ra=Ua*Ua / Pa is calculated, and the second standard resistance value Rb=Ub*Ub / Pb is calculated.

[0100] Step S405: Obtain a standard resistance variable according to the first standard resistance and the second standard resistance.

[0101] In this embodiment, it is known that the first standard resistance is Ra and the second standard resistance is Rb. Therefore, the standard resistance variable dR=Rb-Ra is calculated.

[0102] Step S406: Obtain a standard temperature variable according to the standard resistance variable and the standard resistance temperature coefficient.

[0103] In this embodiment, the standard resistance value variable dR and the standard temperature coefficient of resistance TCR are known. Therefore, the standard temperature variable dT=dR / (Ra*TCR) is calculated.

[0104] Please refer to Figure 5 Based on the above embodiment, step S103, heating at least one second heating element based on the same predetermined condition to obtain at least one test resistance variable of the second heating element, includes the following steps:

[0105] Step S501: inputting a first power to a second heating element for a first specified time, so that the second heating element reaches a third thermal equilibrium state.

[0106] In this embodiment, the first power input to the second heating element is the same as that of the first heating element by adjusting the duty cycle of PWM, and after the first power input continues for the same first specified time as that of the first heating element, the second heating element reaches a third thermal equilibrium state. The third thermal equilibrium state is the same thermal equilibrium state as the first thermal equilibrium state.

[0107] Step S502: inputting a second power to the second heating element for a second specified time, so that the second heating element reaches a fourth thermal equilibrium state.

[0108] In this embodiment, the second heating element is input with the same second power as the first heating element by adjusting the duty cycle of PWM, and after the second power input continues for the same second specified time as the first heating element, the second heating element reaches a fourth thermal equilibrium state. The fourth thermal equilibrium state is the same thermal equilibrium state as the second thermal equilibrium state.

[0109] Step S503, respectively obtaining a first test resistance value of the second heating element in the third thermal equilibrium state and a second test resistance value of the second heating element in the fourth thermal equilibrium state.

[0110] In this embodiment, a first test voltage Uc at both ends of the second heating element in the third thermal equilibrium state and a second test voltage Ud at the fourth thermal equilibrium state are obtained by measuring or according to PWM;

[0111] The first test resistance Rc=Uc*Uc / Pa is calculated, and the second test resistance Rd=Ud*Ud / Pb is calculated.

[0112] Step S504: Obtain a test resistance variable according to the first test resistance and the second test resistance.

[0113] In this embodiment, the first test resistance Rc and the second test resistance Rd are known. Therefore, the test resistance variable is calculated as Rd-Rc.

[0114] According to the above embodiment, in step S104, in obtaining the resistance temperature coefficient of at least one second heating element according to the standard temperature variable and the test resistance variable, the standard temperature variable dT and the test resistance variable dR' are known.

[0115] Therefore, the temperature coefficient of resistance TCR'=dR' / (Rc*dT) of the second heating element is finally calculated.

[0116] The TCR calibration method of the present invention simplifies the overall calibration operation and improves the calibration efficiency by simplifying the step of obtaining the test temperature of the second heating element; and avoids the influencing factors during temperature detection and improves the accuracy of the calculation result.

[0117] Embodiment five:

[0118] Please refer to Figure 6 , this embodiment provides a TCR calibration device, including:

[0119] A standard machine calibration module 61, wherein the standard machine calibration module 61 is used to calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element;

[0120] A standard temperature variable acquisition module 62, the standard temperature variable acquisition module 62 is used to heat the first heating element based on a predetermined condition and acquire at least one standard temperature variable according to a standard resistance temperature coefficient;

[0121] A test resistance variable acquisition module 63, wherein the test resistance variable acquisition module 63 is used to heat at least one second heating element based on the same predetermined condition and acquire at least one test resistance variable of the second heating element;

[0122] The test machine calibration module 64 is used to obtain the resistance temperature coefficient of at least one second heating element according to the standard temperature variable and the test resistance variable.

[0123] In some embodiments, the standard machine calibration module 61 also includes: a calibration heating module, used to heat the first heating element during calibration; a calibration variable acquisition module, used to obtain the resistance variable and temperature variable of the first heating element during the temperature change process of the first heating element during calibration; a standard resistance temperature coefficient acquisition module, used to obtain the standard resistance temperature coefficient of the first heating element based on the resistance variable and the temperature variable.

[0124] Among them, the calibration variable acquisition module also includes: a calibration thermal equilibrium state acquisition module, which is used to obtain at least two thermal equilibrium states during the temperature change process of the first heating element during calibration; a calibration resistance value acquisition module, which is used to obtain the first resistance value and the second resistance value of the first heating element in the two thermal equilibrium states during calibration; a calibration temperature acquisition module, which is used to obtain the first temperature and the second temperature of the first heating element in the two thermal equilibrium states during calibration; and a calibration temperature variable calculation module, which is used to obtain the resistance variable according to the first resistance value and the second resistance value, and to obtain the temperature variable according to the first temperature and the second temperature.

[0125] In some embodiments, the standard temperature variable acquisition module 62 also includes: a power determination module, used to determine at least two different specified powers, the at least two different specified powers including a first power and a second power; a first heating module, used to input the first power to the first heating element for a first specified time, so that the first heating element reaches a first thermal equilibrium state; a second heating module, used to input the second power to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state; a standard resistance acquisition module, used to respectively obtain the first standard resistance value of the first heating element in the first thermal equilibrium state and the second standard resistance value in the second thermal equilibrium state; a standard resistance variable acquisition module, used to obtain a standard resistance variable based on the first standard resistance value and the second standard resistance value; a standard temperature variable acquisition module, used to obtain a standard temperature variable based on the standard resistance variable and the standard resistance temperature coefficient.

[0126] In some embodiments, the test resistance variable acquisition module 63 also includes: a third heating module, used to input the first power to the second heating element for a first specified time so that the second heating element reaches a third thermal equilibrium state; a fourth heating module, used to input the second power to the second heating element for a second specified time so that the second heating element reaches a fourth thermal equilibrium state; a test resistance acquisition module, used to respectively obtain the first test resistance of the second heating element in the third thermal equilibrium state and the second test resistance of the second heating element in the fourth thermal equilibrium state; and a test resistance variable acquisition module, used to obtain the test resistance variable according to the first test resistance and the second test resistance.

[0127] Embodiment six:

[0128] This embodiment also provides a calibration device, including a communication bus, a memory and a processor; the communication bus is used to realize the connection and communication between the processor and the memory; the memory is used to store programs; the processor is used to implement the TCR calibration method as described above by executing the programs stored in the memory. This embodiment will not be described in detail here.

[0129] Embodiment seven:

[0130] This embodiment also provides a computer-readable storage medium, which stores one or more computer programs. The one or more computer programs can be executed by one or more processors to implement the TCR calibration method as described above. This embodiment will not be described in detail here.

[0131] Those skilled in the art will appreciate that all or part of the functions of the various methods in the above-mentioned embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above-mentioned embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, and the storage medium can include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to implement the above-mentioned functions. For example, the program is stored in the memory of the device, and when the program in the memory is executed by the processor, all or part of the above-mentioned functions can be implemented. In addition, when all or part of the functions in the above-mentioned embodiments are implemented by computer programs, the program can also be stored in a storage medium such as a server, another computer, disk, optical disk, flash disk or mobile hard disk, and can be downloaded or copied and saved in the memory of the local device, or the system of the local device is updated, and when the program in the memory is executed by the processor, all or part of the functions in the above-mentioned embodiments can be implemented.

[0132] The above specific examples are used to illustrate the present invention, which is only used to help understand the present invention and is not intended to limit the present invention. For those skilled in the art, according to the concept of the present invention, some simple deductions, modifications or substitutions can be made.

Claims

1. A TCR calibration method, characterized in that include: Calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element; heating the first heating element based on a predetermined condition and obtaining at least one standard temperature variable according to a standard resistance temperature coefficient; heating at least one second heating element based on the same predetermined condition, and obtaining at least one test resistance variable of the second heating element; According to the standard temperature variable and the test resistance variable, the resistance temperature coefficient of at least one second heating element is obtained.

2. The TCR calibration method according to claim 1, characterized in that: The step of calibrating at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element includes: heating the first heating element; During the temperature change process of the first heating element, obtaining the resistance variable and the temperature variable of the first heating element; According to the resistance variable and the temperature variable, the standard resistance temperature coefficient of the first heating element is obtained.

3. The TCR calibration method according to claim 2, characterized in that: In the process of the first heating element changing temperature, obtaining the resistance variable and the temperature variable of the first heating element includes: During the temperature change process of the first heating element, at least two thermal equilibrium states are obtained; Respectively obtain a first resistance value and a second resistance value of the first heating element in two thermal equilibrium states; respectively obtaining a first temperature and a second temperature of the first heating element in two thermal equilibrium states; A resistance variable is obtained according to the first resistance value and the second resistance value, and a temperature variable is obtained according to the first temperature and the second temperature.

4. The TCR calibration method according to claim 1, characterized in that: The step of heating the first heating element based on a predetermined condition comprises: determining at least two different specified powers, the at least two different specified powers comprising a first power and a second power; Inputting a first power to the first heating element for a first specified time, so that the first heating element reaches a first thermal equilibrium state; A second power is input to the first heating element for a second specified time, so that the first heating element reaches a second thermal equilibrium state.

5. The TCR calibration method according to claim 4, characterized in that: The step of obtaining at least one standard temperature variable according to the standard resistance temperature coefficient comprises: Respectively obtaining a first standard resistance value of the first heating element in a first thermal equilibrium state and a second standard resistance value of the first heating element in a second thermal equilibrium state; Obtaining a standard resistance value variable according to the first standard resistance value and the second standard resistance value; The standard temperature variable is obtained according to the standard resistance variable and the standard resistance temperature coefficient.

6. The TCR calibration method according to claim 4, characterized in that: The step of heating at least one second heating element based on the same predetermined condition comprises: Inputting a first power to the second heating element for a first specified time, so that the second heating element reaches a third thermal equilibrium state; A second power is input to the second heating element for a second specified time, so that the second heating element reaches a fourth thermal equilibrium state.

7. The TCR calibration method according to claim 6, characterized in that: The obtaining of at least one test resistance variable of at least one second heating element comprises: Respectively obtaining a first test resistance value of the second heating element in a third thermal equilibrium state and a second test resistance value of the second heating element in a fourth thermal equilibrium state; A test resistance variable is obtained according to the first test resistance value and the second test resistance value.

8. A TCR calibration device, characterized in that include: A standard machine calibration module, the standard machine calibration module is used to calibrate at least one first heating element to obtain a standard resistance temperature coefficient of the first heating element; A standard temperature variable acquisition module, the standard temperature variable acquisition module is used to heat the first heating element based on a predetermined condition and acquire at least one standard temperature variable according to a standard resistance temperature coefficient; A test resistance variable acquisition module, the test resistance variable acquisition module is used to heat at least one second heating element based on the same predetermined condition to acquire at least one test resistance variable of the second heating element; A test machine calibration module, wherein the test machine calibration module is used to obtain the resistance temperature coefficient of at least one second heating element according to a standard temperature variable and a test resistance variable.

9. A calibration device, characterized in that: including a communication bus, a memory and a processor; The communication bus is used to realize the connection and communication between the processor and the memory; The memory is used to store programs; The processor is configured to implement the TCR calibration method according to any one of claims 1 to 7 by executing the program stored in the memory.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores one or more computer programs, and the one or more computer programs can be executed by one or more processors to implement the TCR calibration method according to any one of claims 1 to 7.

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