Identification method for quantum measurement EIT-Stark spectral oscillation period and initial oscillation moment calibration method

Abstract

The invention discloses a recognition method and an initial oscillation moment calibration method for an oscillation period of quantum measurement EIT-Stark spectral oscillation. The recognition method comprises the following steps: setting a single sampling period; setting cyclic sampling times m according to requirements, and storing data sampled for m times into an array S; obtaining a data maximum value in the data sampled each time in the array S by solving a maximum value function, and storing the m data maximum values into an array M; calling a wave crest recognition function for the array M to record the number n of recognizable wave crests, judging whether n is greater than 2 or not, if so, recording the distance between two wave crests, and calculating a wave crest oscillation period; otherwise, increasing the length of a single sampling period and re-sampling. According to the method, the EIT-Stark spectrum oscillation period of 50Hz power frequency voltage can be accurately measured, and the initial oscillation moment is calibrated.

Description

Technical Field

[0001] The invention relates to the field of power frequency electric field quantum measurement, and in particular to a method for identifying an oscillation period of an EIT-Stark spectrum oscillation in quantum measurement and a method for calibrating an initial oscillation time. Background Art

[0002] With the development of quantum measurement technology, Rydberg atoms have been explored for application in the field of quantum sensing. They mainly obtain accurate measurement values ​​of the electric field through electromagnetically induced transparency (EIT) and the quantum-confined Stark effect. In the actual measurement process, the displacement of the spectral peak oscillation of the EIT-Stark effect is mainly analyzed as the basis for electric field measurement. First, its oscillation period needs to be identified.

[0003] At present, the technical research on quantum measurement of Rydberg atoms is mainly used for the measurement of microwave electric fields. There are few methods for measuring power frequency electric fields. The microwave electric field measurement data is the static peak splitting value, while the power frequency electric field measurement data is the dynamic peak frequency shift. In contrast, in addition to frequency and amplitude, the power frequency electric field measurement also has a time axis, which is a three-dimensional data. Therefore, most of the measurement methods for high-frequency microwaves use superheterodyne technology or radio frequency modulation technology for measurement, but there is no specific method description for the measurement of power frequency electric fields.

[0004] And with the further development of quantum sensing technology, it is gradually being considered for application in power systems. The voltage frequency used in power systems is generally 50Hz industrial frequency voltage, which makes the effect of Rydberg atoms in measuring microwave electric fields no longer applicable to industrial frequency electric fields. A new quantum measurement method for industrial frequency electric fields and its supporting implementation method are needed. Summary of the invention

[0005] In view of the above-mentioned deficiencies in the prior art, the present invention provides a method for identifying the oscillation period of EIT-Stark spectrum oscillation in quantum measurement and a method for calibrating the initial oscillation time, which solves the problem that the prior art cannot measure the oscillation period of EIT-Stark spectrum oscillation under 50 Hz industrial frequency voltage.

[0006] In order to achieve the above-mentioned object of the invention, the technical solution adopted by the present invention is:

[0007] A method for identifying an oscillation period of an EIT-Stark spectrum oscillation is provided, which comprises the following steps:

[0008] S1. Set a single sampling cycle;

[0009] S2. Set the number of cyclic sampling times m according to the requirements, and store the data of m sampling times into array S;

[0010] S3, obtaining the maximum value of the data sampled each time in the array S by using the maximum value function, and storing the m maximum values ​​of the data into the array M;

[0011] S4, calling the peak recognition function on the array M to record the number of identifiable peaks n, and judging whether n is greater than 2, if so, proceeding to step S5; otherwise, increasing the length of the single sampling cycle and returning to step S2;

[0012] S5. Record the distance between the two peaks and calculate the peak oscillation period, that is, obtain the quantum measurement EIT-Stark spectrum oscillation period.

[0013] Furthermore, when the sweep frequency is 1 kHz and the single sampling frequency is 10 milliseconds, the initial value of the single sampling period is 1500 milliseconds.

[0014] Furthermore, the specific method of increasing the length of a single sampling cycle is:

[0015] Add 1 millisecond, 10 milliseconds, or 20 milliseconds to the current single sampling period.

[0016] Furthermore, the expression for calculating the peak oscillation period is:

[0017] T=t×|k2-k1|

[0018] Where T is the peak oscillation period; t is the current single sampling period; k1 is the time when the earliest peak in array M appears within its sampling period; k2 is the time when the latest peak in array M appears within its sampling period; |k2-k1| represents the interval time when the oscillation returns to the highest peak value.

[0019] Furthermore, the value of m is greater than or equal to 100.

[0020] A method for calibrating the initial oscillation time based on a method for identifying the oscillation period of an EIT-Stark spectrum oscillation in quantum measurement is provided, which comprises the following steps:

[0021] A1. Set the sampling times m* according to the requirements;

[0022] A2, perform m* sampling within the peak oscillation period T and store the data obtained by m* sampling into the array S*;

[0023] A3. Obtain the maximum value of each sampled data in the array S* by using the maximum value function, and store the maximum value of the data into the array M*;

[0024] A4, calling the peak recognition function for the data M* to record the number of identifiable peaks n*, and judging whether n* is 0, if so, setting the peak frequency shift at the beginning of the current sampling to 0, and completing the initial oscillation time calibration; otherwise, proceeding to step A5;

[0025] A5. Delay the current sampling start time and return to step A2.

[0026] Furthermore, the specific method for delaying the current sampling start time is:

[0027] The current sampling start time is delayed by (m*-n*)×T* / 100 seconds.

[0028] Furthermore, the value of m* is greater than or equal to 100.

[0029] The beneficial effects of the present invention are as follows: the present invention can obtain the oscillation period T of the EIT-Stark effect at 50 Hz for the industrial frequency electric field measurement data of the Rydberg atom, and can calibrate the peak frequency shift at the initial sampling moment to be 0, and then further record the X value of the peak frequency shift position at the moment T / 2 and compare it with the initial moment to analyze the mathematical relationship between the measured electric field and the peak displacement, thereby realizing electric field measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 is a flow chart of the method for identifying the oscillation period;

[0031] Figure 2 A schematic diagram of the process of the initial oscillation moment calibration method;

[0032] Figure 3 It is a sampling data diagram in the embodiment;

[0033] Figure 4 for Figure 3 Floor plan of the. DETAILED DESCRIPTION

[0034] The specific implementation modes of the present invention are described below so that those skilled in the art can understand the present invention. However, it should be clear that the present invention is not limited to the scope of the specific implementation modes. For those of ordinary skill in the art, as long as various changes are within the spirit and scope of the present invention as defined and determined by the attached claims, these changes are obvious, and all inventions and creations utilizing the concept of the present invention are protected.

[0035] like Figure 1 As shown, the method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation includes the following steps:

[0036] S1. Set a single sampling cycle;

[0037] S2. Set the number of cyclic sampling times m according to the requirements, and store the data of m sampling times into array S; the value of m is greater than or equal to 100;

[0038] S3, obtaining the maximum value of the data sampled each time in the array S by using the maximum value function, and storing the m maximum values ​​of the data into the array M;

[0039] S4, calling the peak recognition function on the array M to record the number of identifiable peaks n, and judging whether n is greater than 2, if so, proceeding to step S5; otherwise, increasing the length of the single sampling cycle and returning to step S2;

[0040] S5. Record the distance between the two peaks and calculate the peak oscillation period, that is, obtain the quantum measurement EIT-Stark spectrum oscillation period.

[0041] When the sweep frequency is 1 kHz and the single sampling frequency is 10 milliseconds, the initial value of the single sampling period is 1500 milliseconds.

[0042] The specific method of increasing the length of a single sampling cycle is: adding 1 millisecond, 10 milliseconds or 20 milliseconds to the current single sampling cycle.

[0043] The expression for calculating the peak oscillation period is:

[0044] T=t×|k2-k1|

[0045] Where T is the peak oscillation period; t is the current single sampling period; k1 is the time when the earliest peak in array M appears within its sampling period; k2 is the time when the latest peak in array M appears within its sampling period; |k2-k1| represents the interval time when the oscillation returns to the highest peak value.

[0046] like Figure 2 As shown, the initial oscillation time calibration method for the method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation includes the following steps:

[0047] A1. Set the sampling times m* according to the requirements;

[0048] A2, perform m* sampling within the peak oscillation period T and store the data obtained by m* sampling into the array S*;

[0049] A3. Obtain the maximum value of each sampled data in the array S* by using the maximum value function, and store the maximum value of the data into the array M*;

[0050] A4, calling the peak recognition function for the data M* to record the number of identifiable peaks n*, and judging whether n* is 0, if so, setting the peak frequency shift at the beginning of the current sampling to 0, and completing the initial oscillation time calibration; otherwise, proceeding to step A5;

[0051] A5. Delay the current sampling start time and return to step A2.

[0052] The specific method for delaying the current sampling start time is: delaying the current sampling start time by (m*-n*)×T* / 100 seconds, where the value of m* is greater than or equal to 100.

[0053] In the specific implementation process, the single data recorded in the array S and the array S* can be expressed as S k [Y i ,X i ] form, S k Indicates the data obtained by the kth sampling, the subscript k is determined by the number of sampling times, and the subscript i is determined by the number of single samplings. i The X-axis represents the optical disc from which the sampled data is obtained, and theoretically represents the detuning amount of the spectrum; Y i The Y axis represents the sampled data, which has no specific unit and represents the intensity of the atom's absorption of light. The peak recognition function can use the peak recognition function that comes with LabVIEW.

[0054] In one embodiment of the present invention, the EIT-Stark spectrum oscillation period T of the 50Hz power frequency voltage is obtained through multiple sampling, and each sampling period is changed to T by calibrating the initial oscillation moment, and sampling starts from T / 2. In this way, the data obtained in each sampling is the data at the moment when the peak spacing is the largest, and the displacement at this time can correspond to the maximum displacement of the external electric field. After obtaining the sampling method of the maximum displacement, the actual external electric field E=U / d can be further obtained, where d is the plate spacing (the value in this embodiment is 7mm). By changing the external electric field U, we get the following Figure 3 and Figure 4 The data shown. Finally, the model formula can be derived by further fitting the relationship between the peak spacing and the external electric field, and the mathematical relationship of quantum electric field measurement can be obtained. It can be seen that this method can accurately measure the EIT-Stark spectrum oscillation period of 50Hz power frequency voltage and calibrate the initial oscillation time.

Claims

1. A method for identifying the oscillation period of quantum measurement of EIT-Stark spectrum oscillation, characterized in that: The following steps are involved: S1. Set a single sampling cycle; S2. Set the number of cyclic sampling times m according to the requirements, and store the data of m sampling times into array S; S3, obtaining the maximum value of the data sampled each time in the array S by using the maximum value function, and storing the m maximum values ​​of the data into the array M; S4, calling the peak recognition function on the array M to record the number of identifiable peaks n, and judging whether n is greater than 2, if so, proceeding to step S5; otherwise, increasing the length of the single sampling cycle and returning to step S2; S5. Record the distance between the two peaks and calculate the peak oscillation period, that is, obtain the quantum measurement EIT-Stark spectrum oscillation period.

2. The method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation according to claim 1, characterized in that: When the sweep frequency is 1 kHz and the single sampling frequency is 10 milliseconds, the initial value of the single sampling period is 1500 milliseconds.

3. The method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation according to claim 1, characterized in that: The specific method to increase the length of a single sampling cycle is: Add 1 millisecond, 10 milliseconds, or 20 milliseconds to the current single sampling period.

4. The method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation according to claim 1, characterized in that: The expression for calculating the peak oscillation period is: T=t×|k2-k1| Where T is the peak oscillation period; t is the current single sampling period; k1 is the time of appearance of the earliest peak in array M within its sampling period; k2 is the time of occurrence of the latest peak in array M within its sampling period; |k2-k1| represents the interval time for the oscillation to return to the highest peak value.

5. The method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation according to claim 1, characterized in that: The value of m is greater than or equal to 100.

6. A method for calibrating the initial oscillation time based on the method for identifying the oscillation period of the quantum measurement EIT-Stark spectrum oscillation according to any one of claims 1 to 5, characterized in that: The following steps are involved: A1. Set the sampling times m* according to the requirements; A2, perform m* sampling within the peak oscillation period T and store the data obtained by m* sampling into the array S*; A3. Obtain the maximum value of each sampled data in the array S* by using the maximum value function, and store the maximum value of the data into the array M*; A4. Call the peak recognition function for the data M* to record the number of identifiable peaks n*, and determine whether n* is 0. If so, set the peak frequency shift at the beginning of the current sampling to 0, and complete the initial oscillation time calibration; Otherwise, go to step A5; A5. Delay the current sampling start time and return to step A2.

7. The method for calibrating the initial oscillation time according to claim 6, characterized in that: The specific method to delay the current sampling start time is: The current sampling start time is delayed by (m*-n*)×T* / 100 seconds.

8. The method for calibrating the initial oscillation time according to claim 6, characterized in that: The value of m* is greater than or equal to 100.

Images