Multi-specification capacitor reliability test system

Abstract

The invention provides a multi-specification capacitor reliability test system, and belongs to the technical field of capacitors, and the system comprises an image obtaining module which is configured to obtain the image information of a first to-be-tested capacitor and a second to-be-tested capacitor after obtaining a capacitor test request, the first strategy configuration module is configured to determine a first initial test strategy according to the image information of the first to-be-tested capacitor, and determine a second initial test strategy according to the image information of the second to-be-tested capacitor; the second strategy configuration module is configured to determine a target test strategy according to a multi-dimensional matching result of the first initial test strategy and the second initial test strategy, and the test module is configured to perform parallel test on the first to-be-tested capacitor and the second to-be-tested capacitor according to the target test strategy. Therefore, test data of the first to-be-tested capacitor and the second to-be-tested capacitor are obtained. The objective of the invention is to improve the problem that reliability testing of capacitors of different specifications is tedious and time-consuming.

Description

Technical Field

[0001] The present application relates to the technical field of capacitors, and in particular to a reliability testing system for capacitors with multiple specifications. Background Art

[0002] Capacitor reliability testing refers to a series of experiments to evaluate the long-term performance, life and failure mode of capacitors under specific environmental and stress conditions. Capacitors may be affected by factors such as temperature changes, voltage stress, frequent charging and discharging to varying degrees in applications, so reliability testing can help predict the stability and life of capacitors under actual use conditions.

[0003] At present, for capacitors used in the rail transit field, due to the large differences in specifications and models of capacitors, usually only capacitors of a single specification can be tested. Therefore, when there are many types of capacitors, the entire testing process is cumbersome and time-consuming. Summary of the invention

[0004] The embodiment of the present application provides a reliability testing system for capacitors with multiple specifications. The present application adopts the following technical solutions:

[0005] In a first aspect, a multi-specification capacitor reliability testing system is provided, comprising:

[0006] An image acquisition module is configured to acquire image information of a first capacitor to be tested and a second capacitor to be tested after acquiring a capacitor test request, wherein the first capacitor to be tested and the second capacitor to be tested have different specifications;

[0007] A first strategy configuration module is configured to determine a first initial test strategy according to image information of a first capacitor to be tested, and to determine a second initial test strategy according to image information of a second capacitor to be tested;

[0008] A second strategy configuration module is configured to determine a target test strategy according to a multi-dimensional matching result of the first initial test strategy and the second initial test strategy;

[0009] The testing module is configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to a target testing strategy to obtain test data of the first capacitor to be tested and the second capacitor to be tested.

[0010] In a feasible implementation, the image acquisition module includes:

[0011] A query submodule, used to determine whether there is a first type tag matching the capacitor to be tested according to the model features in the image information, where the first type tag is used to characterize the type of capacitor for which there is a historical test record;

[0012] A first determination submodule, configured to determine the first type tag as a type tag of the capacitor to be tested when there is a first type tag matching the model feature;

[0013] The second determination submodule is used to determine a second type tag as the type tag of the capacitor to be tested when there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to characterize the type of capacitor for which there is no historical test record.

[0014] In a feasible implementation manner, the first policy configuration module includes:

[0015] A first configuration submodule, configured to determine an AC test strategy and a DC test strategy of the first capacitor to be tested according to a type label of the first capacitor to be tested, and determine a first initial test strategy according to the AC test strategy and the DC test strategy of the first capacitor to be tested;

[0016] The second configuration submodule is used to determine the AC test strategy and the DC test strategy of the second capacitor to be tested according to the type label of the second capacitor to be tested, and determine the second initial test strategy according to the AC test strategy and the DC test strategy of the second capacitor to be tested.

[0017] In a feasible implementation manner, the second policy configuration module includes:

[0018] A combination submodule, used to determine a plurality of first optimization objectives according to a first initial test strategy, and to determine a plurality of second optimization objectives according to a second initial test strategy;

[0019] The determination submodule is used to determine the target test strategy according to the multi-dimensional matching results of the multiple first optimization objectives and the multiple second optimization objectives.

[0020] In a feasible implementation, the combined submodule includes:

[0021] A matching unit, used for determining a plurality of candidate test strategies according to the multi-dimensional matching results of the plurality of first optimization objectives and the plurality of second optimization objectives;

[0022] The evaluation unit is used to determine the matching scores of multiple candidate test strategies according to a preset evaluation strategy, and determine the target test strategy according to the matching scores.

[0023] In a feasible implementation manner, the matching unit includes:

[0024] A first combining subunit, used to arbitrarily combine at least one first optimization target and at least one second optimization target to obtain a matching result of one dimension;

[0025] The importance evaluation subunit is used to determine the importance evaluation value of the matching result of each dimension, and determine the target dimension according to the importance evaluation value;

[0026] The second combination subunit is used to arbitrarily combine the matching results of the target dimensions and determine the corresponding candidate test strategies.

[0027] In a feasible implementation, the evaluation strategy includes a stability evaluation strategy and a time evaluation strategy, and the evaluation unit includes:

[0028] A first evaluation subunit is used to evaluate the selected test strategy according to the stability evaluation strategy to obtain a first evaluation score;

[0029] A second evaluation subunit is used to evaluate the test strategy to be selected according to the time evaluation strategy to obtain a second evaluation score;

[0030] The comprehensive evaluation subunit is used to determine the matching score of each candidate test strategy according to the first evaluation score and the second evaluation score.

[0031] In a feasible implementation, the test module includes:

[0032] A first test submodule is configured to perform a DC test on the first capacitor to be tested to obtain first DC test data, and perform an AC test on the second capacitor to be tested to obtain first AC test data according to a target test strategy;

[0033] The second testing submodule is configured to perform an AC test on the first capacitor to be tested to obtain second AC test data, and perform a DC test on the second capacitor to be tested to obtain second DC test data.

[0034] In a feasible implementation manner, the test module further includes a test circuit:

[0035] The test circuit is configured to couple with a first capacitor to be tested and a second capacitor to be tested, and to provide an AC ripple current to the first capacitor to be tested and a DC voltage to the second capacitor to be tested when executing a target test strategy; or

[0036] An AC ripple current is provided to the second capacitor to be tested, and a DC voltage is provided to the first capacitor to be tested.

[0037] A multi-specification capacitor reliability test system provided by an embodiment of the present application, first, after obtaining a capacitor test request, the image acquisition module can promptly obtain the image information of the first capacitor to be tested and the second capacitor to be tested, although the specifications of the two are different. This capability ensures the automation and intelligence of the test process, so that the system can quickly identify the specific type and characteristics of the capacitor to be tested, laying the foundation for the subsequent test strategy configuration. Next, the first strategy configuration module determines the initial test strategy of each according to the image information of the first and second capacitors to be tested. This strategy configuration based on image information can formulate personalized test plans for capacitors of different specifications, ensure that the selection of test methods and parameters is optimal, and can effectively evaluate the performance of capacitors. Then, the second strategy configuration module determines the target test strategy by analyzing the multi-dimensional matching results of the first initial test strategy and the second initial test strategy. The advantage of this process is that by comprehensively considering the test requirements of different capacitors, it is ensured that the final test strategy can take into account the characteristics of the two capacitors, thereby achieving an optimized test effect. The multi-dimensional matching method ensures the flexibility and adaptability of the test strategy, so that the system can cope with the complexity that may be brought about by capacitors of different specifications. Finally, the test module is configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to the target test strategy. This design significantly improves test efficiency, reduces test time, and allows the test processes of the two capacitors to not interfere with each other, avoiding waste of resources. Through parallel testing, the system can collect test data of the two capacitors at the same time, providing rich basic data for subsequent analysis and evaluation. This efficient testing method not only saves time and cost, but also improves the accuracy and reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 A schematic diagram of the structure of a multi-specification capacitor reliability testing system provided in an embodiment of the present application;

[0039] Figure 2 A circuit diagram of a test circuit provided in an embodiment of the present application. DETAILED DESCRIPTION

[0040] The technical solution in this application will be described below in conjunction with the accompanying drawings.

[0041] In order to make the purpose, technical solutions and advantages of this application more clear, the following Figure 1-Figure 2 It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0042] The terms "first", "second", etc. involved in the embodiments of the present application are only used to distinguish features of the same type and cannot be understood as indicating relative importance, quantity, order, etc.

[0043] The terms "exemplary" or "for example" and the like in the embodiments of the present application are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of the terms "exemplary" or "for example" is intended to present the related concepts in a specific way.

[0044] The terms "coupling" and "connection" involved in the embodiments of the present application should be understood in a broad sense. For example, they may refer to a direct physical connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0045] In the field of rail transit, capacitors are key components and are widely used in power supply systems, signal control systems, traction systems and other scenarios. Rail transit equipment requires high reliability, so there are strict testing requirements for the performance and life of capacitors. However, there are many types of capacitors in rail transit applications, and capacitors of different models and specifications have significant differences in withstand voltage, capacity, temperature and life, which requires specific parameter settings and test conditions to be considered during testing. Due to the wide variety of capacitors and different performance requirements, a single specification test solution is difficult to apply to all capacitors. Each capacitor has different specifications and may require different test parameter settings, including test voltage, test temperature, load conditions, etc. Therefore, the test system can often only test capacitors of one specification, and capacitors of other specifications need to be set up and tested separately. Since it is impossible to achieve parallel testing of capacitors of multiple specifications, testers usually need to test capacitors of different specifications one by one according to the preset process, which makes the whole process very time-consuming.

[0046] Based on this, the inventor proposed the inventive concept of this application, which tests capacitors of different specifications at the same time by presetting the test circuit. Different specifications of capacitors perform different types of tests at the same time, that is, one specification of capacitor performs DC test, and another specification of capacitor performs AC test. This can greatly improve the test efficiency and reduce the repeated adjustment of different parameters and test conditions in each test process, thereby meeting the needs of efficient reliability testing of capacitors of various specifications in complex application fields such as rail transit.

[0047] Reference Figure 1 The present application provides a multi-specification capacitor reliability testing system, the system comprising:

[0048] The image acquisition module 101 is configured to acquire image information of the first capacitor to be tested and the second capacitor to be tested after acquiring the capacitor test request.

[0049] In this embodiment, the specifications of the first capacitor to be tested and the second capacitor to be tested are different. Once the image acquisition module detects a test request from a user or a system, the module will be activated to start the image acquisition process. The image acquisition module will first locate and capture the image of the first capacitor to be tested. For example, a camera or other imaging device is used to obtain a close-up image of the capacitor to ensure that sufficient details are captured for subsequent analysis. After acquiring the image of the first capacitor, the module will continue to acquire the image of the second capacitor to be tested. This process is similar to the first capacitor, so it will not be repeated.

[0050] After the image information of the first capacitor to be tested and the second capacitor to be tested is acquired, the types of the first capacitor to be tested and the second capacitor to be tested can be determined.

[0051] In a feasible implementation, the image acquisition module includes a query submodule for determining whether there is a first type tag matching the capacitor to be tested according to the model features in the image information, the first type tag being used to characterize the type of capacitor for which there is a historical test record;

[0052] A first determination submodule, configured to determine the first type tag as a type tag of the capacitor to be tested when there is a first type tag matching the model feature;

[0053] The second determination submodule is used to determine a second type tag as the type tag of the capacitor to be tested when there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to characterize the type of capacitor for which there is no historical test record.

[0054] In this embodiment, the main task of the query submodule is to analyze the model features in the image information. This may include extracting information such as the model, size, shape, etc. of the capacitor and matching it with a known label library. When the image acquisition module receives the image information of the capacitor to be tested, the query submodule searches the database for a first type of label that matches the model features through a comparison algorithm. If a matching label is found, it means that the capacitor type has had a test record in the past, and the subsequent test analysis will be based on this label. Once the query submodule finds a qualified first type of label, the first determination submodule will mark and record it. This will ensure that subsequent tests can be analyzed based on this type of label, using the data and experience provided by the historical test records, thereby improving the efficiency and accuracy of the test. If no matching first type of label is found, the second determination submodule will automatically generate and assign a second type of label, which is used to characterize the capacitor type for which there is no historical test record. This mechanism ensures that the test process can still be carried out even in the absence of historical data, allowing the system to establish new test records for new or uncommon capacitor types.

[0055] The first strategy configuration module 102 is configured to determine a first initial test strategy according to the image information of the first capacitor to be tested, and to determine a second initial test strategy according to the image information of the second capacitor to be tested.

[0056] In this embodiment, after acquiring the image information of the first capacitor to be tested and the second capacitor to be tested, the image information of the first capacitor to be tested and the second capacitor to be tested can be used as a basis to determine the initial test strategy of each of the image information of the first capacitor to be tested and the second capacitor to be tested. The initial test strategy is a test strategy that meets the test requirements of each of the first capacitor to be tested and the second capacitor to be tested.

[0057] In a feasible implementation manner, the first policy configuration module includes:

[0058] A first configuration submodule, configured to determine an AC test strategy and a DC test strategy of the first capacitor to be tested according to a type label of the first capacitor to be tested, and determine a first initial test strategy according to the AC test strategy and the DC test strategy of the first capacitor to be tested;

[0059] The second configuration submodule is used to determine the AC test strategy and the DC test strategy of the second capacitor to be tested according to the type label of the second capacitor to be tested, and determine the second initial test strategy according to the AC test strategy and the DC test strategy of the second capacitor to be tested.

[0060] In this embodiment, the first configuration submodule is responsible for formulating an AC test strategy and a DC test strategy suitable for the capacitor according to the type label of the first capacitor to be tested. By analyzing the type label of the capacitor, the submodule will refer to historical test data and best practices to determine the test parameters and methods suitable for the capacitor. Then, based on these AC and DC test strategies, the first initial test strategy is further integrated to provide specific guidance for the subsequent test process. Similarly, the function of the second configuration submodule is similar to that of the first configuration submodule, but it is aimed at the second capacitor to be tested. This submodule also formulates its AC test strategy and DC test strategy based on the type label of the second capacitor to be tested, and combines the two to determine the second initial test strategy. In this way, through the collaborative work of these two submodules, the first strategy configuration module can generate personalized test strategies for capacitors of different specifications, thereby ensuring the scientificity, effectiveness and reliability of the test.

[0061] The second strategy configuration module 103 is configured to determine a target test strategy according to the multi-dimensional matching result of the first initial test strategy and the second initial test strategy.

[0062] In this embodiment, the second strategy configuration module receives the first initial test strategy and the second initial test strategy sent from the first strategy configuration module. The two strategies are each formulated for different capacitors to be tested and have different focuses. Then, the module will perform a multi-dimensional matching analysis to compare the consistency and applicability of the two initial test strategies in multiple dimensions, such as voltage range, frequency response, test time, and environmental conditions. Through this multi-dimensional matching, the second strategy configuration module aims to formulate a comprehensive target test strategy so that the first capacitor to be tested and the second capacitor to be tested can have the optimal test strategy at the same time. This target test strategy will take into account the characteristics and test requirements of the two capacitors to ensure that while meeting their respective test requirements, the optimal utilization of resources and the efficiency of the test process are achieved.

[0063] In a feasible implementation manner, the second policy configuration module includes:

[0064] A combination submodule, used to determine a plurality of first optimization objectives according to a first initial test strategy, and to determine a plurality of second optimization objectives according to a second initial test strategy;

[0065] The determination submodule is used to determine the target test strategy according to the multi-dimensional matching results of the multiple first optimization objectives and the multiple second optimization objectives.

[0066] In this embodiment, the combination submodule is responsible for determining multiple first optimization targets according to the first initial test strategy, and determining multiple second optimization targets according to the second initial test strategy. These optimization targets may involve different test parameters, such as test accuracy, time efficiency, resource utilization, etc. Through the analysis of the first and second initial test strategies, the combination submodule can identify the key performance indicators and optimization directions related to each capacitor, laying the foundation for subsequent strategy integration. Next, the determination submodule will use the multidimensional matching results obtained from the multiple first optimization targets and the multiple second optimization targets to comprehensively analyze the correlation and applicability between the two optimization targets. Through this multidimensional matching, the integration submodule aims to formulate a target test strategy to ensure that the first capacitor to be tested and the second capacitor to be tested can simultaneously achieve the optimal test effect under different test requirements.

[0067] Finally, the target test strategy generated by the second strategy configuration module not only reflects the consideration and optimization of the two capacitors, but also provides clear guidance for the actual test process to improve the efficiency and accuracy of the test. The target test strategy includes parameter configuration information for the first capacitor to be tested and the second capacitor to be tested, namely, DC test configuration information and AC test configuration information, and the DC test configuration information of the first capacitor to be tested and the second capacitor to be tested is also different, and the AC test configuration information of the first capacitor to be tested and the second capacitor to be tested is also different.

[0068] In a feasible implementation, the combined submodule includes:

[0069] A matching unit, used for determining a plurality of candidate test strategies according to the multi-dimensional matching results of the plurality of first optimization objectives and the plurality of second optimization objectives;

[0070] The evaluation unit is used to determine the matching scores of multiple candidate test strategies according to a preset evaluation strategy, and determine the target test strategy according to the matching scores.

[0071] In this embodiment, the function of the matching unit is to determine multiple candidate test strategies based on the multidimensional matching results of multiple first optimization targets and multiple second optimization targets. The matching unit will analyze the relationship between the two groups of optimization targets and identify potential test strategies that can simultaneously meet the requirements of the first and second capacitors to be tested. By evaluating the adaptability and effectiveness of different strategies in various dimensions, the matching unit can generate a candidate list containing multiple candidate test strategies. Next, the main task of the evaluation unit is to score the matching degree of these candidate test strategies according to the preset evaluation strategy. The evaluation unit will apply a series of evaluation indicators, such as test accuracy, efficiency, resource consumption, etc., to quantitatively analyze each candidate strategy to obtain its matching degree score. The score will reflect the degree to which the strategy meets the capacitor requirements in the actual test. Based on these matching degree scores, the evaluation unit further screens and determines the target test strategy. Therefore, the combination submodule can not only comprehensively consider multiple optimization targets, but also ensure that the final target test strategy has high applicability and effectiveness through a systematic evaluation process, thereby improving the reliability and accuracy of the test.

[0072] In a feasible implementation manner, the matching unit includes:

[0073] A first combining subunit, used to arbitrarily combine at least one first optimization target and at least one second optimization target to obtain a matching result of one dimension;

[0074] The importance evaluation subunit is used to determine the importance evaluation value of the matching result of each dimension, and determine the target dimension according to the importance evaluation value;

[0075] The second combination subunit is used to arbitrarily combine the matching results of the target dimensions and determine the corresponding candidate test strategies.

[0076] In this embodiment, the main task of the first combination subunit is to arbitrarily combine at least one first optimization target and at least one second optimization target to obtain a matching result of one dimension. This process can help identify the potential connection between different optimization targets. Select from multiple first optimization targets and second optimization targets for combination. For example, a specific AC test parameter may be selected to be combined with a DC test parameter. By analyzing the combined targets, the first combination subunit can generate a new matching result, which will be used for subsequent evaluation and analysis. The task of the importance evaluation subunit is to assign an importance evaluation value to the matching result of each dimension. This evaluation value will reflect the importance of the matching result in the formulation of the overall test strategy. The importance evaluation subunit can evaluate the relevance and influence of the matching results of each dimension according to preset standards or rules. For example, some test targets may have a greater impact on the performance of the capacitor, so their importance evaluation value is higher. Through this evaluation, the importance evaluation subunit can determine which dimensions are the basis for constructing the target dimension, which will help the subsequent strategy optimization and selection. The task of the second combination subunit is to arbitrarily combine its matching results based on the determined target dimension to determine the final corresponding candidate test strategy. This unit will use the target dimensions provided by the importance assessment subunit for further combination analysis. By integrating the matching results of the target dimensions, the second combination subunit can generate candidate test strategies that meet multiple optimization goals. This process ensures that the generated candidate test strategies can achieve the best performance overall while meeting the characteristics of different capacitors. Through the collaborative work of these three subunits, the matching unit can effectively integrate multiple optimization goals, conduct multi-dimensional matching analysis, and ultimately determine the candidate strategies that meet the test requirements. This process not only improves the systematicness and scientificity of the strategy, but also provides practical guidance for actual testing to ensure the accuracy and reliability of the test.

[0077] In a feasible implementation, the evaluation strategy includes a stability evaluation strategy and a time evaluation strategy, and the evaluation unit includes:

[0078] A first evaluation subunit is used to evaluate the selected test strategy according to the stability evaluation strategy to obtain a first evaluation score;

[0079] A second evaluation subunit is used to evaluate the test strategy to be selected according to the time evaluation strategy to obtain a second evaluation score;

[0080] The comprehensive evaluation subunit is used to determine the matching score of each candidate test strategy according to the first evaluation score and the second evaluation score.

[0081] In this embodiment, the main task of the first evaluation subunit is to evaluate the candidate test strategy according to the stability evaluation strategy, so as to obtain a first evaluation score. The stability evaluation strategy focuses on the consistency and reliability of the test strategy under different conditions. This subunit will analyze the performance of the candidate test strategy in various environments and usage conditions, and evaluate whether it can stably complete the test task under different conditions. Finally, the first evaluation subunit will generate a first evaluation score for each candidate test strategy to reflect its stability.

[0082] The task of the second evaluation subunit is to evaluate the candidate test strategies according to the time evaluation strategy and obtain the second evaluation score. The time evaluation strategy mainly focuses on the time efficiency and resource utilization of the test process. This subunit will analyze the time required for each candidate test strategy, including test preparation, execution, and data analysis, to ensure that the test can be completed within a reasonable time. Finally, the second evaluation subunit will generate a second evaluation score for each candidate test strategy to reflect its time efficiency.

[0083] The main reason for conducting stability assessment and time assessment is to ensure the effectiveness and efficiency of the test strategy. Stability assessment focuses on the consistency and reliability of the test strategy under different conditions. It can ensure that the selected strategy can continuously and stably provide accurate test results in actual applications, avoiding fluctuations in test results caused by environmental changes or improper operations. On the other hand, time assessment focuses on the time efficiency of the test process, ensuring that the test can be completed within a reasonable time frame to avoid waste of resources and delays. Through these two assessments, we can fully understand the performance of the candidate test strategy, ensure that the selected strategy can not only meet the stability requirements, but also achieve optimization in time, thereby improving the overall test efficiency and reliability.

[0084] The main task of the comprehensive evaluation subunit is to comprehensively determine the matching score of each candidate test strategy based on the first evaluation score and the second evaluation score. This subunit integrates the first evaluation score and the second evaluation score, and calculates a comprehensive matching score taking into account the evaluation results of the two dimensions of stability and time efficiency. The comprehensive evaluation can use weighted average or other algorithms to ensure that the influence of the two evaluation scores is reflected in the final score. Through this process, the comprehensive evaluation subunit can provide a comprehensive score for each candidate test strategy to facilitate the subsequent selection of the best test strategy. Through the collaborative work of these three evaluation subunits, the evaluation unit can comprehensively and systematically evaluate the candidate test strategies to ensure that the final selected test strategy can achieve the best results in terms of both stability and time efficiency. This evaluation mechanism not only enhances the scientific nature of the test strategy selection, but also improves the effectiveness and reliability of the overall testing process.

[0085] In a feasible implementation, the test module includes:

[0086] A first test submodule is configured to perform a DC test on the first capacitor to be tested to obtain first DC test data, and perform an AC test on the second capacitor to be tested to obtain first AC test data according to a target test strategy;

[0087] The second testing submodule is configured to perform an AC test on the first capacitor to be tested to obtain second AC test data, and perform a DC test on the second capacitor to be tested to obtain second DC test data.

[0088] In this embodiment, the first test submodule is configured to perform a DC test on the first capacitor to be tested according to the target test strategy to obtain the first DC test data. The design focus of this test is to evaluate the DC characteristics of the first capacitor, including key parameters such as its capacitance and leakage current, through accurate DC voltage and current measurement. These data will help determine the performance of the first capacitor under static conditions to ensure that it meets the requirements of use. At the same time, the submodule will also perform an AC test on the second capacitor to be tested to obtain the first AC test data. This process aims to obtain the frequency response, phase angle and other dynamic characteristics of the second capacitor, so as to comprehensively evaluate its performance at different frequencies. This test strategy can fully tap the performance potential of the capacitor and provide data support for subsequent applications.

[0089] The second test submodule is responsible for executing the test process opposite to the first submodule. According to the target test strategy, this submodule performs an AC test on the first capacitor to be tested to obtain the second AC test data. This test will evaluate the AC performance of the first capacitor at different frequencies in detail, revealing its phase response and impedance characteristics. This is crucial to understand how the capacitor performs in actual applications. At the same time, the second test submodule will also perform a DC test on the second capacitor to be tested to obtain the second DC test data. This test will focus on evaluating the static characteristics of the second capacitor to ensure its reliability and performance under DC conditions.

[0090] By testing the first capacitor to be tested and the second capacitor to be tested of different specifications at the same time, the test equipment and time can be used efficiently. By processing two different types of capacitors in parallel, the overall test efficiency can be significantly improved and the time required for individual tests can be reduced. Secondly, the DC test of the first capacitor to be tested can accurately evaluate its static characteristics, such as key parameters such as capacitance, leakage current and equivalent series resistance, while the AC test of the second capacitor to be tested can reveal its frequency response and phase characteristics under dynamic signals.

[0091] In a feasible implementation manner, the test module further includes a test circuit:

[0092] The test circuit is configured to couple with a first capacitor to be tested and a second capacitor to be tested, and to provide an AC ripple current to the first capacitor to be tested and a DC voltage to the second capacitor to be tested when executing a target test strategy; or

[0093] An AC ripple current is provided to the second capacitor to be tested, and a DC voltage is provided to the first capacitor to be tested.

[0094] In this embodiment, refer to Figure 2 The test circuit shown includes an AC / DC superposition power supply part, a rectifier and filter part, a main power conversion part, a DC high-voltage power supply part and an output part.

[0095] The three-phase power input enters the circuit through three sets of fuses F1, F2, and F3, and is connected to the three-phase lines A, B, and C. The input power is detected by current transformers I11 and I12. The input three-phase AC first passes through a diode rectifier bridge (composed of VD1 to VD) to rectify the three-phase AC into DC. The rectified current is filtered by filter capacitor C1 to reduce the ripple interference of the voltage. The rectified and filtered DC current is input to the thyristor VT1 and the related control circuit, and the DC voltage is regulated by the conduction control of the thyristor. The diodes VD11 to VD61 below cooperate with VT1 to achieve further rectification and current control. The auxiliary power supply part, including diode rectifier bridges VD3, VD4 and filter capacitors, generates the required auxiliary DC voltage. V1, 3R3, C1 and KM3 in the auxiliary power supply circuit can be used to protect or stabilize the output of the auxiliary power supply. There are multiple sets of relays and resistors in the circuit, such as KM1, R1, R2 and QM1, which are used to realize switch control and protection functions to prevent short circuit or overcurrent. Q1 and Q3 can be used to detect current and provide feedback signals to the control system for timely protection. The DC output of the entire circuit is isolated by transformer T2, which transmits the DC voltage to the load end. The output end includes AC1 and AC2 as well as the positive and negative ends of the DC voltage output (DC+ and DC-), which can be used for different loads.

[0096] The test circuit is coupled to the first capacitor to be tested and the second capacitor to be tested, and provides the required current and voltage according to the target test strategy. The three-phase power input enters the circuit through fuses F1, F2, and F3, and is connected to the three-phase lines A, B, and C, ensuring the safety and stability of the power supply. The input power is detected by current transformers I11 and I12 to provide real-time feedback for subsequent current control. The three-phase AC first passes through a diode rectifier bridge (VD1 to VD6) to convert the AC into DC. This rectification process is a key step in achieving current supply because it converts the original AC signal into DC that can be stably controlled. The rectified current passes through the filter capacitor C1 to reduce the ripple interference of the voltage and ensure the stability and reliability of the output voltage. This rectified and filtered DC current is connected to the thyristor VT1 and the related control circuit, and the DC voltage is regulated through the conduction control of the thyristor to ensure that a stable DC voltage can be provided for the second capacitor to be tested. During this process, the diodes VD11 to VD61 below cooperate with VT1 to achieve further rectification and current control, which enhances the flexibility of the circuit. The diode rectifier bridge VD3, VD4 and the filter capacitor of the auxiliary power supply part generate the required auxiliary DC voltage to provide support for the stable operation of the circuit. The components in the auxiliary power supply circuit are used to protect or stabilize the output of the auxiliary power supply to ensure the reliability of the entire circuit. At the same time, the design of multiple groups of relays and resistors in the circuit is used to realize the switch control and protection functions to prevent short circuit or overcurrent, which is essential for the safe testing of capacitors. When performing the test, the circuit can flexibly provide AC ripple current or DC voltage, depending on the type of capacitor to be tested and the test requirements. For example, when it is necessary to provide AC ripple current for the first capacitor to be tested, the circuit adjusts the corresponding control parameters so that its output meets the AC ripple characteristics. Conversely, if it is necessary to provide DC voltage for the second capacitor to be tested, the circuit provides a stable DC output through the adjustment function of the thyristor VT1. This flexible circuit configuration and control mechanism enables the test circuit to efficiently and accurately meet the test requirements of different capacitors, thereby achieving effective coupling with the first capacitor to be tested and the second capacitor to be tested.

[0097] In a feasible implementation manner, the system further includes an evaluation module for generating a test evaluation report of the capacitor to be tested.

[0098] In this embodiment, the system also includes an evaluation module for generating a test evaluation report of the capacitor to be tested. The evaluation module can analyze the test data of the capacitor, including key parameters such as its capacitance, equivalent series resistance (ESR) and leakage current. By comparing these parameters with preset standard values, the evaluation module can automatically identify whether the performance of the capacitor meets the specification requirements. In addition, the test evaluation report can also provide suggestions on potential failure modes of the capacitor, as well as recommended further tests or treatment measures.

[0099] A multi-specification capacitor reliability test system provided by an embodiment of the present application, first, after obtaining a capacitor test request, the image acquisition module can promptly obtain the image information of the first capacitor to be tested and the second capacitor to be tested, although the specifications of the two are different. This capability ensures the automation and intelligence of the test process, so that the system can quickly identify the specific type and characteristics of the capacitor to be tested, laying the foundation for the subsequent test strategy configuration. Next, the first strategy configuration module determines the initial test strategy of each according to the image information of the first and second capacitors to be tested. This strategy configuration based on image information can formulate personalized test plans for capacitors of different specifications, ensure that the selection of test methods and parameters is optimal, and can effectively evaluate the performance of capacitors. Then, the second strategy configuration module determines the target test strategy by analyzing the multi-dimensional matching results of the first initial test strategy and the second initial test strategy. The advantage of this process is that by comprehensively considering the test requirements of different capacitors, it is ensured that the final test strategy can take into account the characteristics of the two capacitors, thereby achieving an optimized test effect. The multi-dimensional matching method ensures the flexibility and adaptability of the test strategy, so that the system can cope with the complexity that may be brought about by capacitors of different specifications. Finally, the test module is configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to the target test strategy. This design significantly improves test efficiency, reduces test time, and allows the test processes of the two capacitors to not interfere with each other, avoiding waste of resources. Through parallel testing, the system can collect test data of the two capacitors at the same time, providing rich basic data for subsequent analysis and evaluation. This efficient testing method not only saves time and cost, but also improves the accuracy and reliability of the test.

[0100] The above embodiments can be implemented in whole or in part by software, hardware (such as circuits), firmware or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When a computer instruction or computer program is loaded or executed on a computer, a process or function according to an embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable system. The computer program or instruction can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer program or instruction can be transmitted from one website site, computer, server or data center to another website site, computer, server or data center by wired (such as infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center containing one or more available media sets. The available medium can be a magnetic medium (for example, a floppy disk, a hard disk, a tape), an optical medium (for example, a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state hard disk.

[0101] It should be understood that the term "and / or" in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. A and B can be singular or plural. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship, but it may also indicate an "and / or" relationship. Please refer to the context for specific understanding.

[0102] In this application, "at least one" means one or more, and "more" means two or more. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can be represented by: a, b, c, ab, ac, bc, or abc, where a, b, c can be single or multiple.

[0103] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0104] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0105] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, systems and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0106] In the several embodiments provided in the present application, it should be understood that the disclosed systems, systems and methods can be implemented in other ways. For example, the system embodiments described above are only schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection of the system or unit can be electrical, mechanical or other forms.

[0107] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0108] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0109] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the various embodiments of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM), random access memory (RAM), disk or optical disk, and other media that can store program codes.

[0110] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A multi-specification capacitor reliability testing system, characterized in that: The system comprises: An image acquisition module is configured to acquire image information of a first capacitor to be tested and a second capacitor to be tested after acquiring a capacitor test request, wherein the first capacitor to be tested and the second capacitor to be tested have different specifications; A first strategy configuration module is configured to determine a first initial test strategy according to the image information of the first capacitor to be tested, and to determine a second initial test strategy according to the image information of the second capacitor to be tested; A second strategy configuration module is configured to determine a target test strategy according to a multi-dimensional matching result of the first initial test strategy and the second initial test strategy; The testing module is configured to perform parallel testing on the first capacitor to be tested and the second capacitor to be tested according to a target testing strategy to obtain test data of the first capacitor to be tested and the second capacitor to be tested.

2. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The image acquisition module comprises: A query submodule, used to determine whether there is a first type tag matching the capacitor to be tested according to the model feature in the image information, wherein the first type tag is used to characterize the type of capacitor for which there is a historical test record; A first determination submodule, configured to, if there is a first type tag matching the model feature, determine the first type tag as the type tag of the capacitor to be tested; The second determination submodule is used to determine a second type tag as the type tag of the capacitor to be tested when there is no first type tag matching the capacitor to be tested, wherein the second type tag is used to represent a capacitor type for which there is no historical test record.

3. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The first policy configuration module includes: a first configuration submodule, configured to determine an AC test strategy and a DC test strategy of the first capacitor to be tested according to a type label of the first capacitor to be tested, and to determine the first initial test strategy according to the AC test strategy and the DC test strategy of the first capacitor to be tested; The second configuration submodule is used to determine the AC test strategy and the DC test strategy of the second capacitor to be tested according to the type label of the second capacitor to be tested, and determine the second initial test strategy according to the AC test strategy and the DC test strategy of the second capacitor to be tested.

4. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The second policy configuration module includes: A combination submodule, configured to determine a plurality of first optimization objectives according to the first initial test strategy, and to determine a plurality of second optimization objectives according to the second initial test strategy; The determination submodule is used to determine the target test strategy according to the multi-dimensional matching results of the multiple first optimization objectives and the multiple second optimization objectives.

5. The multi-specification capacitor reliability testing system according to claim 4, characterized in that: The combined submodule comprises: A matching unit, configured to determine the plurality of candidate test strategies according to a multi-dimensional matching result of the plurality of first optimization objectives and the plurality of second optimization objectives; An evaluation unit is used to determine the matching scores of the multiple candidate test strategies according to a preset evaluation strategy, and determine the target test strategy according to the matching scores.

6. The multi-specification capacitor reliability testing system according to claim 5, characterized in that: The matching unit comprises: A first combining subunit, configured to arbitrarily combine at least one of the first optimization objectives and at least one of the second optimization objectives to obtain a matching result of one dimension; An importance evaluation subunit, used to determine an importance evaluation value of the matching result of each dimension, and determine a target dimension according to the importance evaluation value; The second combination subunit is used to arbitrarily combine the matching results of the target dimension to determine the corresponding candidate test strategy.

7. The multi-specification capacitor reliability testing system according to claim 5, characterized in that: The evaluation strategy includes a stability evaluation strategy and a time evaluation strategy, and the evaluation unit includes: A first evaluation subunit is used to evaluate the candidate test strategy according to the stability evaluation strategy to obtain a first evaluation score; A second evaluation subunit is used to evaluate the candidate test strategy according to the time evaluation strategy to obtain a second evaluation score; The comprehensive evaluation subunit is used to determine the matching score of each of the candidate test strategies according to the first evaluation score and the second evaluation score.

8. The multi-specification capacitor reliability testing system according to claim 1, characterized in that: The test module includes: a first test submodule configured to perform a DC test on the first capacitor to be tested to obtain first DC test data, and to perform an AC test on the second capacitor to be tested to obtain first AC test data according to the target test strategy; The second testing submodule is configured to perform an AC test on the first capacitor to be tested to obtain second AC test data, and perform a DC test on the second capacitor to be tested to obtain second DC test data.

9. The multi-specification capacitor reliability testing system according to claim 8, characterized in that: The test module also includes a test circuit: The test circuit is configured to couple with the first capacitor to be tested and the second capacitor to be tested, and to provide an AC ripple current to the first capacitor to be tested and a DC voltage to the second capacitor to be tested when executing the target test strategy; or An AC ripple current is provided to the second capacitor to be tested, and a DC voltage is provided to the first capacitor to be tested.

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