Mutual inductor testing device and method, computer equipment and storage medium

Abstract

The invention relates to a mutual inductor testing device and method, computer equipment and a storage medium. The device comprises a central control module, a boosting module, a main battery pack and a first test module, the central control module is electrically connected with the boost module, the boost module is electrically connected with the first test module, and the central control module is used for outputting a first test instruction to the boost module, so that the boost module outputs a corresponding first test voltage to the first test module according to the first test instruction; the first test module is used for outputting a corresponding first test waveform to the to-be-tested mutual inductor based on a first test voltage when the first test voltage is received; the main battery pack is electrically connected with the boosting module and the central control module, and the main battery pack is used for supplying power to the boosting module and the central control module. The device can automatically test the mutual inductor, does not need an external power supply, and is convenient to use in a production field.

Description

Technical Field

[0001] The present application relates to the field of electronic power technology, and in particular to a transformer testing device, method, computer equipment and storage medium. Background Art

[0002] Current transformer is one of the important equipment in the power system. It is related to secondary equipment such as relay protection, metering, and measurement and control. The characteristics of current transformer directly affect the normal operation of secondary equipment. In equipment verification, handover acceptance, regular inspection and maintenance, etc., the performance of current transformer needs to be tested.

[0003] In the prior art, a current transformer characteristic tester is usually used to test the performance of a current transformer. Existing current transformers are often installed in a primary field without a power supply box, so there is a problem of obtaining a power supply when testing the current transformer. Summary of the invention

[0004] Based on this, it is necessary to provide a transformer testing device, method, computer equipment and storage medium to address the above technical problems.

[0005] In a first aspect, the present application provides a transformer testing device, the device comprising a central control module, a boost module, a main battery pack, and a first testing module;

[0006] The central control module is electrically connected to the boost module, and the boost module is electrically connected to the first test module. The central control module is used to output a first test instruction to the boost module, so that the boost module outputs a corresponding first test voltage to the first test module according to the first test instruction;

[0007] The first test module is used for outputting a first test waveform corresponding to the transformer to be tested based on the first test voltage when the first test voltage is received;

[0008] The main battery pack is electrically connected to the boost module, and the main battery pack is electrically connected to the central control module. The main battery pack is used to supply power to the boost module and the central control module.

[0009] In one embodiment, the first test module includes an inverter unit, the inverter unit is electrically connected to the boost module, and the inverter unit is also electrically connected to the transformer to be tested.

[0010] In one embodiment, the device also includes a second test module, the central control module is electrically connected to the second test module, and the central control module is used to output a second test instruction to the second test module so that the second test module outputs a corresponding second test voltage to the transformer to be tested based on the second test instruction.

[0011] In one embodiment, the second test module is in communication connection with the transformer to be tested, and the second test module is further used to receive a test result of the transformer to be tested, and feed the test result back to the central control module.

[0012] In one embodiment, the central control module includes a single-chip microcomputer and an interaction unit, the interaction unit is used to obtain test parameters, and the single-chip microcomputer is used to determine the current first test instruction or the second test instruction based on the test parameters, wherein the first test instruction includes a direct resistance test instruction and an excitation test instruction, and the second test instruction includes signal test instructions for multiple different types of signals.

[0013] In one of the embodiments, the central control module includes a backup battery, and the backup battery is used to supply power to the central control module when the main battery pack is powered off.

[0014] In one of the embodiments, the device further includes a monitoring module, which is used to monitor the battery status of the main battery pack and the backup battery respectively, and feed back the battery status of the main battery pack and the backup battery to the central control module.

[0015] In a second aspect, the present application further provides a transformer testing method, which is applied to the transformer testing device as described in the first aspect, comprising:

[0016] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0017] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0018] In a third aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0019] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0020] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0021] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the following steps are implemented:

[0022] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0023] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0024] In a fifth aspect, the present application further provides a computer program product, including a computer program, which implements the following steps when executed by a processor:

[0025] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0026] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0027] The above-mentioned transformer test device, method, computer equipment, storage medium and computer program product realize the output of test instructions based on the central control module, and realize automatic testing of the current transformer based on the boost module and the test module. Compared with the traditional large-scale current transformer tester, it can quickly realize the test of the current transformer, and no parameters need to be set during the test. In addition, the transformer test device provided by the present application also has a built-in power supply, and no external power supply is required, which avoids the problem of power supply in application scenarios such as primary sites. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0029] FIG1 is a schematic structural diagram of a transformer testing device in one embodiment;

[0030] FIG2 is an oblique side view of a transformer testing device in one embodiment;

[0031] FIG3 is a top view of a transformer testing device in one embodiment;

[0032] FIG4 is a schematic diagram of a module of a transformer testing device in one embodiment;

[0033] FIG5 is a flow chart of a method for testing a mutual inductor in one embodiment;

[0034] FIG. 6 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0035] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0036] In an exemplary embodiment, as shown in FIG1 , a transformer testing device 100 is provided, the device comprising a central control module 101 , a boost module 102 , a main battery pack 103 , and a first testing module 104 ;

[0037] The central control module 101 is electrically connected to the boost module 102, and the boost module 102 is electrically connected to the first test module 104. The central control module 101 is used to output a first test instruction to the boost module 102, so that the boost module 102 outputs a corresponding first test voltage to the first test module 104 according to the first test instruction;

[0038] The first test module 104 is used for outputting a first test waveform corresponding to the transformer to be tested based on the first test voltage when receiving the first test voltage;

[0039] The main battery pack 103 is electrically connected to the boost module 102 , and the main battery pack 103 is electrically connected to the central control module 101 . The main battery pack 103 is used to supply power to the boost module 102 and the central control module 101 .

[0040] Current transformer (usually referred to as CT or TA) is one of the commonly used measuring elements in power systems. It is widely used in low-voltage systems below 400V to ultra-high voltage power systems of 10kV, 35kV, 110kV, 220kV and even 750kV. It is one of the necessary equipment to reliably isolate high voltage and convert the large current of the primary circuit into a small current of the safety level standard required for relay protection and secondary instrument measurement on the secondary side. Its importance is no less than that of power system components such as power transformers, high-voltage circuit breakers, lightning arresters, and voltage transformers.

[0041] The existing current transformer characteristic tester has problems such as complex detection settings and long detection time. Therefore, in some embodiments, the central control module 101 is the main control module of the transformer testing device, which can realize the functions of issuing and processing test instructions. It only needs to obtain a small amount of test parameters to automatically determine the current test instructions based on the test parameters. The boost module 102 is used to adjust the voltage output to the test module according to the test instructions, so that the test module outputs the test waveform corresponding to the test instructions to realize the test of the transformer to be tested. During the test process, there is no need for additional debugging by the staff, the degree of automation is high, the complexity of the detection setting is reduced, and faster detection can be achieved.

[0042] In addition, existing large-scale current transformer characteristic testers all require an external power supply, and current transformers are often installed in a primary site without a power box, so obtaining power becomes a prominent problem. Based on this, this embodiment uses the main battery pack 103 as the power supply module of the transformer test device. In this way, without the need for an external power supply, the main battery pack 103 can meet the power supply of the transformer test device itself and the testing requirements of the transformer. Preferably, large-scale current transformer characteristic testers are usually heavy, which may reach more than 30kg. Based on this, the transformer test device 100 can be designed as a small handheld test device. Compared with traditional large-scale current transformer characteristic testers, it is light and easy to carry, meeting the requirements of portability in on-site work.

[0043] In summary, this embodiment provides a current transformer testing device, which only needs to set a small number of test parameters during testing, and the testing device can automatically complete the current transformer characteristic test, while also having the advantages of light weight, built-in power supply, etc.

[0044] In an exemplary embodiment, the first test module 104 includes an inverter unit, which is electrically connected to the boost module 102 and is also electrically connected to the transformer to be tested.

[0045] Exemplarily, the inverter unit may be a VVVF (Variable Voltage and Variable Frequency) controlled inverter, whose input is a first test voltage and output is a first test waveform. Exemplarily, the first test waveform may be a sine wave and a square wave with a relatively large amplitude, which can adapt to different input voltages and ensure voltage stability under different load currents.

[0046] In some embodiments, the first test module 104 has a waveform feedback function, which can provide the VVVF output required for the direct resistance test and the excitation test, has a fast response capability and high output stability, and can cope with high current peak output requirements.

[0047] Specifically, the waveform feedback function means that the first test module 104 can adjust the characteristics of the output signal in real time according to the waveform of the input signal. Through waveform feedback, the system can dynamically adjust the output signal as needed to meet the test requirements.

[0048] The full name of the DC resistance test is the direct current resistance test. It is a method used to test circuits by adding direct current to measure the resistance of the circuit. The direct resistance test is usually used to detect connection problems and component parameters in the circuit. In the test of current transformers, the DC resistance test can check the welding quality of the wires inside the transformer windings, the welding quality of the leads and windings, whether the specifications of the wires used in the windings meet the design requirements, whether the contact of the current-carrying parts such as the tap changer, leads and bushings is good, and whether the three-phase resistance is balanced.

[0049] Excitation test is a method used to test generators, transformers and other equipment. It observes the performance of the equipment by providing excitation current. Excitation test can be used to detect indicators such as output stability and saturation characteristics of the equipment. In the test of current transformer, the excitation test determines the quality of the core of the current transformer by identifying the saturation degree of the magnetization curve and calculating the error curve to determine whether the secondary winding of the transformer has defects such as turn-to-turn short circuit.

[0050] In an exemplary embodiment, the device also includes a second test module 105, and the central control module 101 is electrically connected to the second test module 105. The central control module 101 is used to output a second test instruction to the second test module 105 so that the second test module 105 outputs a corresponding second test voltage to the transformer to be tested based on the second test instruction.

[0051] In some embodiments, the second test module 105 uses a high-precision measurement and control unit to test the transformer to be tested by a low-frequency voltage method. Specifically, the low-frequency voltage method uses a test voltage of 0.1HZ or lower frequency to replace the power frequency AC withstand voltage test, which can not only achieve the same test effect, but also can greatly reduce the volume of the test device and reduce the weight, which is about one-five hundredth of the power frequency. The second test module 105 can meet the testing requirements of different signals such as ultra-small signals, sudden large signals, and large current signals. After the test is completed, the low frequency used in the test can be converted to a more standard frequency (such as 50Hz), which will amplify the error in disguise to ensure the accuracy of the test results. The low-frequency voltage method can also eliminate the interference of the power grid and ensure the accuracy of the test results.

[0052] In an exemplary embodiment, the second test module 105 is in communication connection with the transformer to be tested. The second test module 105 is further configured to receive a test result of the transformer to be tested and feed the test result back to the central control module 101 .

[0053] In some embodiments, the second test module 105 can also feed back the test results returned by the transformer to be tested to the central control module 101. The test results include but are not limited to the test results of the first test instruction and the test results of the second test instruction. After receiving the test results, the central control module 101 can make corresponding responses according to the test results. For example, if the transformer to be tested feeds back that the current test instruction meets the standard of the current test, the next test instruction is executed; if it does not meet the standard, the test data is displayed on the interactive unit of the central control module 101, and the current test is suspended.

[0054] In an exemplary embodiment, the central control module 101 includes a single-chip microcomputer and an interaction unit, the interaction unit is used to obtain test parameters, and the single-chip microcomputer is used to determine the current first test instruction or the second test instruction based on the test parameters, wherein the first test instruction includes a direct resistance test instruction and an excitation test instruction, and the second test instruction includes a signal test instruction for multiple different types of signals.

[0055] Specifically, the first test instruction and the second test instruction have been introduced in the previous text and will not be repeated here. The single-chip microcomputer is the core processing unit of the central control module 101, which can analyze the input parameters to obtain the corresponding first test instruction and second test instruction; it can also analyze the test results fed back by the second test module 105 to determine whether the performance of the transformer to be tested in the current test meets the production standards, and reflect the test results on the interactive unit. In addition, the single-chip microcomputer can also include an embedded operating system that can perform model calculations and human-computer interaction.

[0056] Exemplarily, the interaction unit may be a touch screen display, and the staff may input test parameters into the interaction unit through the touch screen input, and may also view test results or other types of data through the screen display of the interaction unit.

[0057] In an exemplary embodiment, the central control module 101 includes a backup battery, which is used to power the central control module 101 when the main battery pack 103 is powered off. Exemplarily, the main battery pack 103 is a constant voltage source, which can independently power the test device or use an external adapter to power it.

[0058] Exemplarily, the backup battery is independent of the main battery pack 103. Even when the main battery pack 103 is powered off, the backup battery can still supply power to the central control module 101, avoiding data loss caused by accidental power failure of the main battery pack 103. The backup battery can be quickly replaced at any time.

[0059] In an exemplary embodiment, the device further includes a monitoring module 106 , which is used to monitor the battery status of the main battery pack 103 and the backup battery respectively, and feed back the battery status of the main battery pack 103 and the backup battery to the central control module 101 .

[0060] In some embodiments, the monitoring module 106 can monitor the battery power of the central control module 101 and the main battery pack 103 in real time, give an alarm signal and diagnostic information when the battery is under-voltage or over-current, and feed back to the central control module 101 to prevent the battery from being damaged due to long-term storage, over-discharge, over-charging, etc.

[0061] In order to explain the transformer test device and its effect in detail, the following is a most detailed embodiment:

[0062] Please refer to Figures 2 and 3. Figure 2 is an oblique side view of a transformer testing device in an embodiment; Figure 3 is a top view of a transformer testing device in an embodiment; the transformer testing device includes a central control module 101 fixed to the upper part of the box 300, and a boost module 102, a first test module 104, a second test module 105, a main battery pack 103, and a monitoring module 106 fixed to the lower part of the box 300; the second test module 105 is connected to the measurement and control unit and the monitoring module 106 respectively, the first test module 104 is connected to the boost module 102 and the second test module 105 respectively, and the main battery pack 103 is connected to the boost module 102 and the monitoring module 106 respectively; the transformer testing device is connected to the transformer through a terminal 301 fixed to the side of the box 300. After turning on the power switch, the central control module 101 obtains the test parameters and issues a test instruction based on the current test parameters, thereby automatically completing the current transformer characteristic test, and the obtained test data is displayed on the central control module 101.

[0063] For example, if the current test parameters are related to the direct resistance test and the excitation test, the central control module 101 outputs a first test instruction to the boost module 102, so that the boost module 102 outputs a corresponding first test voltage to the first test module 104 according to the first test instruction; when the first test module 104 receives the first test voltage, it outputs a corresponding first test waveform to the transformer under test based on the first test voltage.

[0064] If the current test parameters are related to multiple types of signal tests, the second test instruction is output to the second test module 105, so that the second test module 105 outputs the corresponding second test voltage to the transformer to be tested based on the second test instruction. That is: the transformer to be tested is tested by the low-frequency voltage method. The low-frequency voltage method uses a test voltage of 0.1HZ or lower frequency to replace the industrial frequency AC withstand voltage test. After the test is completed, the low frequency used in the test can be converted to a more standard frequency (such as 50Hz), which will amplify the error in disguise to ensure the accuracy of the test results. The low-frequency voltage method can complete conventional P-level transformer testing. Only the number parameters need to be set to complete the test. The operation is simple and convenient.

[0065] Please refer to Figure 4, which is a module diagram of a transformer testing device in one embodiment; preferably, in order to meet the portable requirements of the testing work, the transformer testing device can be designed as a small handheld power source, which has the advantages of high frequency, high efficiency, light weight and easy to carry.

[0066] Preferably, the central control module 101 has its own backup battery, which can be powered independently, and the single-chip microcomputer is the core processing unit of the central control module 101, which can analyze the input parameters to obtain the corresponding first test instructions and second test instructions; it can also analyze the test results fed back by the second test module 105, determine whether the performance of the transformer to be tested in the current test meets the production standards, and reflect the test results on the interactive unit. In addition, the single-chip microcomputer can also include an embedded operating system that can perform model calculations and human-computer interaction. The interactive unit can be a touch screen, and the staff can input test parameters to the interactive unit through the touch screen, and can also view test results or other types of data through the screen display of the interactive unit. The interactive unit can adopt an intelligent human-computer interaction interface, which is simple and intuitive.

[0067] Preferably, the main battery pack 103 adopts a constant voltage source, the reading is stable, it is suitable for different current transformers, and has a wide range of applications.

[0068] It should be understood that, although the steps in the flowcharts involved in the above embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps is not strictly limited in order, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0069] Each module in the above-mentioned transformer test device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each of the above modules.

[0070] Based on the same inventive concept, the embodiment of the present application also provides a transformer testing method. The implementation scheme for solving the problem provided by the method is similar to the implementation scheme recorded in the above-mentioned device, so the specific limitations in one or more transformer testing method embodiments provided below can refer to the limitations on the transformer testing device above, and will not be repeated here.

[0071] In an exemplary embodiment, as shown in FIG5 , a transformer testing method is provided, including:

[0072] Step 501, obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0073] Step 502: Output a first test waveform corresponding to the transformer to be tested based on the first test voltage.

[0074] The transformer testing method further includes:

[0075] A second test instruction is obtained, and a second test voltage corresponding to the output of the transformer to be tested is output based on the second test instruction.

[0076] In an exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be shown in FIG6. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit, and an input device. The processor, the memory, and the input / output interface are connected via a system bus, and the communication interface, the display unit, and the input device are connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner may be implemented through WIFI, a mobile cellular network, near field communication (NFC) or other technologies. When the computer program is executed by the processor, a mutual inductor testing method is implemented. The display unit of the computer device is used to form a visually visible picture, which may be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device shell, or an external keyboard, touchpad or mouse.

[0077] Those skilled in the art will understand that the structure shown in FIG. 6 is merely a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0078] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0079] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0080] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0081] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0082] A second test instruction is obtained, and a second test voltage corresponding to the output of the transformer to be tested is output based on the second test instruction.

[0083] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0084] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0085] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0086] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0087] A second test instruction is obtained, and a second test voltage corresponding to the output of the transformer to be tested is output based on the second test instruction.

[0088] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0089] Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction;

[0090] A first test waveform corresponding to the transformer under test is output based on the first test voltage.

[0091] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0092] A second test instruction is obtained, and a second test voltage corresponding to the output of the transformer to be tested is output based on the second test instruction.

[0093] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0094] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0095] The above embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A transformer testing device, characterized in that: The device includes a central control module, a boost module, a main battery pack, and a first test module; The central control module is electrically connected to the boost module, and the boost module is electrically connected to the first test module. The central control module is used to output a first test instruction to the boost module, so that the boost module outputs a corresponding first test voltage to the first test module according to the first test instruction; The first test module is used for outputting a first test waveform corresponding to the transformer to be tested based on the first test voltage when the first test voltage is received; The main battery pack is electrically connected to the boost module, and the main battery pack is electrically connected to the central control module. The main battery pack is used to supply power to the boost module and the central control module.

2. The device according to claim 1, characterized in that The first test module comprises an inverter unit, the inverter unit is electrically connected to the boost module, and the inverter unit is also electrically connected to the transformer to be tested.

3. The device according to claim 1, characterized in that The device also includes a second test module, the central control module is electrically connected to the second test module, and the central control module is used to output a second test instruction to the second test module so that the second test module outputs a corresponding second test voltage to the transformer to be tested based on the second test instruction.

4. The device according to claim 3, characterized in that The second test module is in communication connection with the transformer to be tested, and the second test module is further used to receive a test result of the transformer to be tested, and feed the test result back to the central control module.

5. The device according to claim 4, characterized in that The central control module includes a single-chip microcomputer and an interaction unit, the interaction unit is used to obtain test parameters, and the single-chip microcomputer is used to determine the current first test instruction or the second test instruction according to the test parameters, wherein the first test instruction includes a direct resistance test instruction and an excitation test instruction, and the second test instruction includes signal test instructions for multiple different types of signals.

6. The device according to claim 1, characterized in that The central control module includes a backup battery, and the backup battery is used to supply power to the central control module when the main battery pack is powered off.

7. The device according to claim 6, characterized in that The device further comprises a monitoring module, which is used to monitor the battery status of the main battery pack and the backup battery respectively, and feed back the battery status of the main battery pack and the backup battery to the central control module.

8. A method for testing a mutual inductor, characterized in that: Applied to the transformer testing device according to any one of claims 1 to 6, the method comprises: Obtaining a first test instruction, and determining a corresponding first test voltage according to the first test instruction; A first test waveform corresponding to the transformer under test is output based on the first test voltage.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to claim 8 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to claim 8 are implemented.

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