Reliability allocation method, device and equipment

Abstract

The invention discloses a reliability distribution method, device and equipment, and relates to the technical field of reliability distribution. The method comprises the following steps: decomposing a to-be-distributed system into a plurality of sub-targets according to functional requirements or structures; obtaining the sum of occurrence degree scores of faults of the sub-targets, obtaining scoring factors, and taking the reciprocal of each scoring factor as an initial distribution ratio of each sub-target; according to the severity and the detectivity of the fault of each sub-target, obtaining the sum of the fault criticality of each sub-target, and according to the sum of the fault criticality, obtaining a redistribution factor of each sub-target; and respectively obtaining the product of the initial distribution ratio and the redistribution factor of each sub-target, and carrying out reciprocal normalization processing to obtain the reliability index distribution ratio of each sub-target so as to obtain the reliability index distribution value of each sub-target. According to the method, the fault mode and the reliability index are combined, the comprehensive performance distribution relation between different levels is reflected, reliability analysis can be carried out on the product qualitatively and quantitatively according to the distribution result, and the scoring link is simplified.

Description

Technical Field

[0001] The present application relates to the technical field of reliability allocation, and in particular to a reliability allocation method, device and equipment. Background Art

[0002] At present, the electrochemical energy storage industry is developing rapidly and its scale is growing. Lithium iron phosphate liquid-cooled energy storage DC cabin is a mainstream energy storage system commonly used in electrochemical energy storage power stations, which can realize the conversion and storage of electrical energy and chemical energy. Lithium iron phosphate liquid-cooled energy storage DC cabin is composed of multiple subsystems, and each subsystem contains multiple components, which brings great challenges to the formulation of appropriate reliability indicators. Reliability allocation is the decomposition process of reasonably allocating the reliability indicators of products to units such as subsystems, components, and components. Through allocation, the quantitative reliability requirements of the unit are clarified, and the reliability requirements of the product as a whole and the unit are coordinated. It is a decomposition process from the whole to the part and from top to bottom.

[0003] In the related technology, the commonly used reliability allocation methods include the scoring allocation method, the proportional combination allocation method, the importance and complexity allocation method (AGREE method), etc. Among them, the scoring allocation method is to have experienced designers or experts score the important factors affecting product reliability in the absence of reliability data, and perform a comprehensive calculation of the score values ​​to obtain the relative reliability ratio between each unit product, and assign a reliability index to each unit according to the relative ratio.

[0004] However, there are still certain limitations in having experienced designers or experts score important factors that affect product reliability. The scoring allocation method requires comprehensive consideration of factors that affect reliability, such as complexity, technology maturity, importance, and environmental severity. It requires designers to have an in-depth understanding and evaluation of the product's design and usage environment. For large and complex systems, the reliability score allocation process is more complicated and requires consideration of multiple factors and constraints, which can easily lead to lower accuracy in reliability allocation results. Summary of the invention

[0005] The present application provides a reliability allocation method, device and equipment, which can solve the technical problem of low accuracy of reliability allocation results existing in the prior art.

[0006] In a first aspect, the present application provides a reliability allocation method, the method comprising:

[0007] Decompose the system to be allocated into multiple sub-goals according to functional requirements or structure;

[0008] Obtain the occurrence score and of each sub-goal failure, and obtain each scoring factor according to each score and, use the reciprocal of each scoring factor as the initial allocation ratio of each sub-goal;

[0009] According to the severity and detection degree of each sub-goal fault, the sum of the fault hazard degree of each sub-goal is obtained, and according to the sum of the fault hazard degree, the redistribution factor of each sub-goal is obtained;

[0010] The product of the initial allocation ratio of each sub-goal and the redistribution factor is obtained respectively, and the reciprocal normalization is performed to obtain the reliability index allocation ratio of each sub-goal, and then the reliability index allocation value of each sub-goal is obtained.

[0011] In combination with the first aspect, in one implementation, reciprocal normalization processing is performed to obtain the reliability index distribution ratio of each sub-goal, specifically including:

[0012] The product of the initial allocation ratio of each sub-goal and the redistribution factor is its secondary allocation ratio;

[0013] The sum of the reciprocals of the reliability index allocation ratios is taken as 1, and each secondary allocation ratio is normalized to obtain the reliability index allocation ratio of each sub-goal.

[0014] In conjunction with the first aspect, in one implementation, obtaining the reliability index allocation value of each sub-goal specifically includes:

[0015] Obtaining a preset reliability index allocation value of the above-mentioned system to be allocated;

[0016] The product of the reliability index allocation ratio of each sub-goal and the reliability index allocation value of the above-mentioned system to be allocated is calculated respectively as the reliability index allocation value of each sub-goal.

[0017] In combination with the first aspect, in one implementation, the reliability indicator allocation value is a mean time between failures.

[0018] In combination with the first aspect, in one embodiment, when the system to be allocated is a DC cabin system, the sub-targets are multiple subsystems into which the DC cabin system is decomposed according to functional requirements;

[0019] When the system to be allocated is any subsystem, the sub-targets are the multiple parts into which the subsystem is decomposed according to the structure.

[0020] In combination with the first aspect, in one implementation, before obtaining the occurrence score of each sub-target failure, the method further includes:

[0021] Perform Failure Mode and Effect Analysis (FMEA) on the assigned system-sub-goals, and obtain the severity, occurrence, and detection scores of each failure mode of each sub-goal.

[0022] In combination with the first aspect, in one implementation, the scoring factor of the i-th sub-goal is:

[0023]

[0024] Among them, O i is the occurrence score of the i-th sub-goal failure, and n is the number of sub-goals.

[0025] In combination with the first aspect, in one implementation, the sum of the fault criticality of any sub-goal is: the sum of the products of the severity and the detection degree of each fault of the sub-goal;

[0026] The redistribution factor of the i-th sub-goal is:

[0027]

[0028] Among them, H i is the sum of the failure criticality of the ith sub-goal, and n is the number of sub-goals.

[0029] In a second aspect, the present application provides a reliability allocation device, the device comprising:

[0030] A decomposition module is used to decompose the system to be allocated into multiple sub-goals according to functional requirements or structures; an initial allocation ratio acquisition module is used to obtain the occurrence score and of each sub-goal failure, and obtain each scoring factor according to each score and, and use the reciprocal of each scoring factor as the initial allocation ratio of each sub-goal;

[0031] A redistribution factor acquisition module, which is used to obtain the sum of the fault hazard levels of each sub-goal according to the severity and detection level of each sub-goal fault, and obtain the redistribution factor of each sub-goal according to the sum of the fault hazard levels;

[0032] The reliability index allocation value acquisition module is used to obtain the product of the initial allocation ratio of each sub-goal and the redistribution factor, and perform inverse normalization processing to obtain the reliability index allocation ratio of each sub-goal, and then obtain the reliability index allocation value of each sub-goal.

[0033] In a third aspect, the present application provides a reliability allocation device, which includes a processor, a memory, and a reliability allocation program stored in the memory and executable by the processor, wherein when the reliability allocation program is executed by the processor, the steps of the reliability allocation method as described above are implemented.

[0034] The beneficial effects of the technical solution provided by this application include:

[0035] The present application decomposes the system to be allocated into multiple sub-goals according to functional requirements or structures to obtain the occurrence score and of each sub-goal failure, and obtains each scoring factor according to each score sum, and uses the reciprocal of each scoring factor as the initial allocation ratio of the reliability index of each sub-goal; then, according to the severity and detection of each sub-goal failure, the sum of the failure hazard degree of each sub-goal is obtained, and according to the sum of each failure hazard degree, the redistribution factor of each sub-goal is obtained, and then the product of the initial allocation ratio of each sub-goal and the redistribution factor is obtained, and the reciprocal normalization is performed to obtain the reliability index allocation ratio of each sub-goal, and then the reliability index allocation value of each sub-goal is obtained according to each reliability index allocation ratio.

[0036] Since the fault occurrence degree is directly related to the reliability of the sub-goal, the initial allocation is performed by combining the scoring factor obtained by combining the fault occurrence degree, which can reflect the distribution relationship between the system to be allocated and the sub-goal regarding reliability; then the hazard degree is obtained according to the fault severity and detection degree to optimize the initial allocation, reflecting the important performance of the sub-goal such as safety and testability, so as to obtain the reliability index distribution value of each sub-goal with higher accuracy and simplify the scoring process. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 This is a flow chart of an embodiment of a reliability allocation method of the present application;

[0038] Figure 2 This is an exploded schematic diagram of a battery compartment system according to an embodiment of the present application;

[0039] Figure 3 This is a functional module diagram of an embodiment of a reliability allocation device of the present application;

[0040] Figure 4 This is a schematic diagram of the hardware structure of the reliability allocation device involved in the embodiment of the present application. DETAILED DESCRIPTION

[0041] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0042] In a first aspect, an embodiment of the present application provides a reliability allocation method.

[0043] In one embodiment, referring to Figure 1 , Figure 1This is a flow chart of the first embodiment of the reliability allocation method of this application. Figure 1 As shown, the reliability allocation method includes:

[0044] S1. Decompose the system to be allocated into multiple sub-goals according to functional requirements or structure;

[0045] S2. Obtain the occurrence score and of each sub-goal failure, and obtain each scoring factor according to each score and, and use the reciprocal of each scoring factor as the initial allocation ratio of each sub-goal;

[0046] The sum of the occurrence scores of each failure mode of any sub-goal is the occurrence score sum of the failure of the sub-goal.

[0047] S3. According to the severity and detection degree of each sub-goal fault, the sum of the fault hazard degree of each sub-goal is obtained, and according to the sum of the fault hazard degree, the redistribution factor of each sub-goal is obtained;

[0048] S4. Obtain the product of the initial allocation ratio of each sub-goal and the redistribution factor respectively, and perform inverse normalization processing to obtain the reliability index allocation ratio of each sub-goal, and then obtain the reliability index allocation value of each sub-goal.

[0049] In this embodiment, the system to be allocated is decomposed into multiple sub-goals according to functional requirements or structures to obtain the occurrence score and of each sub-goal failure, and each scoring factor is obtained according to each score sum, and the reciprocal of each scoring factor is used as the initial allocation ratio of the reliability index of each sub-goal; then, according to the severity and detection of each sub-goal failure, the sum of the failure hazard of each sub-goal is obtained, and according to the sum of each failure hazard, the redistribution factor of each sub-goal is obtained, and then the product of the initial allocation ratio of each sub-goal and the redistribution factor is obtained, and the reciprocal normalization is performed to obtain the reliability index allocation ratio of each sub-goal, and then the reliability index allocation value of each sub-goal is obtained according to each reliability index allocation ratio.

[0050] Since the fault occurrence rate is directly related to the reliability of the sub-goal, the initial allocation is performed by combining the scoring factor obtained based on the fault occurrence rate, which can reflect the distribution relationship between the system to be allocated and the sub-goal regarding reliability; then the hazard degree is obtained based on the fault severity and detection degree to optimize the initial allocation and reflect important performance such as the safety and testability of the sub-goal. Therefore, this application combines the failure mode with the reliability index, which reflects the comprehensive performance distribution relationship between different levels, can conduct qualitative and quantitative reliability analysis on the product based on the allocation results, and simplifies the scoring process.

[0051] In this embodiment, the mean time between failures (MTBF, Mean Time Between Failure) of the system to be allocated is used as the reliability index to be allocated, that is, the reliability index allocation value.

[0052] Furthermore, in one embodiment, a reciprocal normalization process is performed to obtain the reliability index distribution ratio of each sub-goal, specifically including:

[0053] First, the product of the initial allocation ratio of each sub-goal and the redistribution factor is taken as its secondary allocation ratio.

[0054] Then, the sum of the reciprocals of the reliability index allocation ratios is taken as 1, and each secondary allocation ratio is normalized to obtain the reliability index allocation ratio of each sub-goal.

[0055] Furthermore, in one embodiment, obtaining the reliability index distribution value of each sub-goal specifically includes:

[0056] First, the preset reliability index allocation value of the above-mentioned system to be allocated is obtained.

[0057] Then, the product of the reliability index allocation ratio of each sub-goal and the reliability index allocation value of the above-mentioned system to be allocated is calculated respectively as the reliability index allocation value of each sub-goal.

[0058] Furthermore, in one embodiment, when the system to be allocated is a DC cabin system, the sub-targets are multiple subsystems into which the DC cabin system is decomposed according to functional requirements.

[0059] In other embodiments, when the system to be allocated is any subsystem, the sub-targets are multiple components into which the subsystem is decomposed according to the structure.

[0060] In this embodiment, through the above decomposition, the reliability index allocation from the DC cabin system to the subsystem and from the subsystem to the components can be completed quickly and effectively.

[0061] Furthermore, in one embodiment, before obtaining the occurrence score of each sub-goal failure, the process further includes:

[0062] Perform FMEA (Failure Mode and Effect Analysis) on the allocated system-sub-goals, and obtain the severity S (Severity), occurrence O (Occurrence), and detection D (Detection) scores of each failure mode of each sub-goal.

[0063] In this embodiment, by utilizing the S / O / D data in FMEA, that is, based on the scoring of the severity, occurrence, and detection of each failure mode of the above-mentioned sub-goals, not only can the scoring process be simplified, but also the reliability analysis of subsystems and components can be performed qualitatively and quantitatively based on the allocation results, thereby solving the problem of lack of reliability data.

[0064] Furthermore, in one embodiment, the scoring factor of the i-th sub-goal is:

[0065]

[0066] Among them, O i is the occurrence score of the i-th sub-goal failure, and n is the number of sub-goals.

[0067] Furthermore, in one embodiment, the hazard level H is defined as the product of severity and detection level, that is:

[0068] H=S·D

[0069] The sum of the fault severity of any sub-goal is the sum of the products of the fault severity and detection degree of the sub-goal.

[0070] In this embodiment, the redistribution factor W of the i-th sub-goal i for:

[0071]

[0072] Among them, H i is the sum of the failure criticality of the ith sub-goal, and n is the number of sub-goals.

[0073] In this embodiment, taking the mean time between failures (MTBF) of the DC cabin system as an example of the reliability index to be allocated, the reliability allocation method specifically includes:

[0074] Step 1: Figure 2 As shown in the figure, the DC cabin system is decomposed into 6 subsystems, namely, electrochemical energy storage module subsystem, battery management subsystem, liquid cooling and thermal management subsystem, fire protection subsystem, high-voltage electrical subsystem and prefabricated cabin subsystem. Among them, the electrochemical energy storage module subsystem is used for electrical energy-chemical energy conversion and storage; the battery management subsystem is used for battery information collection, operation management and alarm protection; the liquid cooling and thermal management subsystem is used for energy storage module temperature control; the fire protection subsystem is used for fire detection and fire extinguishing in the energy storage module and DC cabin; the high-voltage electrical subsystem is used for high-voltage power transmission and control; the prefabricated cabin subsystem is used for system structure protection, thermal insulation, single-machine power supply and distribution, etc.

[0075] In this embodiment, the DC cabin system is set to consist of various subsystems connected in series, and the lifespans all obey exponential distribution. Therefore, the failure rate of the DC cabin system is equal to the failure rate λ of each subsystem. i The sum of the DC cabin system failure rate λ s MTBF is the mean time between failures of the DC cabin system S The reciprocal of .

[0076] The specific relationship is as follows:

[0077]

[0078] Step 2: Conduct FMEA at the system-subsystem level and score each failure mode according to its severity (S), occurrence (O), and detection (D).

[0079] Step 3: Initial allocation of reliability indicators based on occurrence:

[0080] 3.1. Organize the occurrence scores and O of each subsystem failure i , as shown in Table 1 below;

[0081] Table 1. Sum of the fault occurrence (O) scores of each subsystem

[0082]

[0083] 3.2. Combine the sum of the occurrence scores of each subsystem failure O i , calculate each scoring factor C i , as shown in Table 2 below; where C i for:

[0084]

[0085] Table 2. Failure incidence scoring factors for each subsystem

[0086]

[0087] 3.3. According to the scoring factor C of each subsystem i According to the principle that the higher the failure occurrence score, the lower the reliability index (i.e., the lower MTBF value) is assigned, the MTBF of each subsystem can be obtained by the following formula: i and system MTBF S The ratio of , that is, the initial allocation ratio of each sub-goal:

[0088]

[0089] Table 3. Occurrence scores, scoring factors and initial allocation ratios of each subsystem

[0090]

[0091] Step 4: Secondary allocation of reliability indicators based on fault criticality:

[0092] Considering that both severity and detection can reflect the degree of harm of the fault to the system, the degree of harm of the fault to the system is represented by the degree of harm H, and its value is the product of severity and detection:

[0093] H=S·D

[0094] 4.1. Sum of the failure severity of each subsystem H i , as shown in Table 4 below;

[0095] Table 4. Sum of criticality of each subsystem

[0096]

[0097] 4.2. Combine the sum of the failure severity of each subsystem to obtain the redistribution factor W i :

[0098]

[0099] Table 5. Redistribution factors for each subsystem

[0100]

[0101] 4.3. Multiply the initial allocation ratio of each sub-goal by the corresponding redistribution factor W i , the secondary distribution ratio of the reliability distribution of each sub-goal is obtained, and the distribution results are shown in Table 6 below:

[0102] Table 6. Secondary distribution factor and MTBF ratio of each subsystem

[0103]

[0104] Step 5: In order to ensure that the sum of the reciprocals of the final reliability index allocation ratios of each subsystem is equal to 1, it is also necessary to make equal coefficient adjustments to the secondary allocation ratios of each subsystem after secondary allocation to obtain the reliability index allocation ratios of each subsystem. The allocation results after equal coefficient adjustment are shown in Table 7 below:

[0105] Table 7. Equal coefficient adjustment after secondary distribution of MTBF of each subsystem

[0106]

[0107]

[0108] Step 6: According to the reliability index allocation ratio after secondary allocation, the mean time between failures of the DC cabin system can be allocated to the subsystem level, that is, the reliability index allocation ratio of each subsystem and the MTBF of the DC cabin system S The product of is taken as the mean time between failures of each subsystem.

[0109] Furthermore, the inverse of the mean time between failures of each subsystem may be obtained as a failure rate indicator of each subsystem.

[0110] Furthermore, the reliability allocation process from any subsystem to key components is consistent with the above method.

[0111] First, the structure of the subsystem is decomposed, and then FMEA work is carried out at the subsystem level, and S / O / D scoring is performed. Then, primary allocation and secondary allocation are carried out in turn based on the occurrence degree and criticality degree, and the reliability index assigned to the key components is obtained after adjusting the coefficients of the secondary allocation results. The following takes the liquid cooling thermal management subsystem as an example to perform reliability allocation from subsystem to key components.

[0112] First, the reliability index is initially allocated according to the occurrence degree, and the allocation results are shown in Table 8 below;

[0113] Table 8. Initial allocation ratios of key components of the liquid cooling thermal management subsystem (ratio to subsystem)

[0114]

[0115] Then, the reliability index is secondary distributed according to the fault criticality. The distribution results are shown in Table 9 below:

[0116] Table 9. Secondary distribution of key components

[0117]

[0118] Finally, the secondary distribution results are adjusted with equal coefficients. The adjustment results are shown in Table 10 below:

[0119] Table 10. Results of reliability index allocation for key components

[0120]

[0121] In this embodiment, when only qualitative analysis is required, in terms of fault prevention and reduction, if the focus is on reliability related to the occurrence of faults, according to the results of the initial allocation, components with lower MTBF ratios, such as water pumps and condensing fans, indicate that their inherent reliability is poor and should be given priority in improving system reliability. In terms of system comprehensive performance, components with higher MTBF indicators should focus on improving the comprehensive performance of these subsystems and components (such as easy maintenance, easy isolation and detection of faults). When quantitative analysis is required, if there is a certain reliability index value for the subsystem, the reliability index of key components can be allocated according to the MTBF ratio.

[0122] In this embodiment, the reliability allocation of the DC cabin system is realized based on the FMEA-SOD score, and the reliability qualitative and quantitative analysis can be carried out according to the allocation result, thereby realizing the reliability analysis of different levels of the DC cabin system.

[0123] Since the failure rate is directly related to the reliability of the subsystem or component, the result of the initial allocation combined with the failure rate reflects the distribution relationship between the system and subsystems and components regarding reliability. The severity and detectability of the failure reflect important performance such as the safety and testability of the subsystem or component. Therefore, the final result after the secondary allocation reflects the comprehensive performance distribution relationship from the system to the subsystem and from the subsystem to the key components.

[0124] In the present embodiment, in the absence of reliability data, the failure mode is combined with the reliability index by utilizing the S / O / D scoring data in FMEA, and the reliability index is allocated from the system to the subsystem and from the subsystem to the key components by defining the allocation factors of the occurrence degree and the criticality. This not only simplifies the scoring process, but also can reasonably allocate the reliability index to the subsystem and components in combination with the sum of the occurrence degree and the criticality of the failure, which has a high engineering application value.

[0125] In a second aspect, an embodiment of the present application also provides a reliability allocation device.

[0126] In one embodiment, referring to Figure 3 , Figure 3 This is a functional module diagram of an embodiment of the reliability allocation device of the present application. Figure 3 As shown, the reliability allocation device includes a decomposition module, an initial allocation ratio acquisition module, a redistribution factor acquisition module and a reliability index allocation value acquisition module.

[0127] The above decomposition module is used to decompose the system to be allocated into multiple sub-goals according to functional requirements or structure.

[0128] The initial allocation ratio acquisition module is used to obtain the occurrence score and of each sub-goal failure, and obtain each scoring factor based on each score and, respectively, take the reciprocal of each scoring factor as the initial allocation ratio of each sub-goal.

[0129] The above-mentioned redistribution factor acquisition module is used to obtain the sum of the fault hazard levels of each sub-goal according to the severity and detection level of each sub-goal fault, and to obtain the redistribution factor of each sub-goal according to the sum of the fault hazard levels.

[0130] The reliability index allocation value acquisition module is used to obtain the product of the initial allocation ratio of each sub-goal and the redistribution factor, and perform inverse normalization processing to obtain the reliability index allocation ratio of each sub-goal, and then obtain the reliability index allocation value of each sub-goal.

[0131] Furthermore, in one embodiment, the reliability index allocation value acquisition module is further used to:

[0132] The product of the initial allocation ratio of each sub-goal and the redistribution factor is its secondary allocation ratio;

[0133] The sum of the reciprocals of the reliability index allocation ratios is taken as 1, and each secondary allocation ratio is normalized to obtain the reliability index allocation ratio of each sub-goal.

[0134] Furthermore, in one embodiment, the reliability index allocation value acquisition module is further used to:

[0135] Obtaining a preset reliability index allocation value of the system to be allocated;

[0136] The product of the reliability index allocation ratio of each sub-goal and the reliability index allocation value of the to-be-allocated system is calculated respectively as the reliability index allocation value of each sub-goal.

[0137] Optionally, the reliability indicator allocation value is the mean time between failures.

[0138] Furthermore, in one embodiment, when the system to be allocated is a DC cabin system, the sub-targets are multiple subsystems into which the DC cabin system is decomposed according to functional requirements; when the system to be allocated is any subsystem, the sub-targets are multiple components into which the subsystem is decomposed according to its structure.

[0139] Furthermore, in one embodiment, the reliability allocation device further includes a scoring module, and the scoring module is used to:

[0140] Perform Failure Mode and Effect Analysis (FMEA) on the assigned system-sub-goals, and obtain the severity, occurrence, and detection scores of each failure mode of each sub-goal.

[0141] Furthermore, in one embodiment, the scoring factor of the i-th sub-goal is:

[0142]

[0143] Among them, O i is the occurrence score of the i-th sub-goal failure, and n is the number of sub-goals.

[0144] Furthermore, in one embodiment, the sum of the fault criticality of any sub-goal is: the sum of the products of the severity and the detection degree of each fault of the sub-goal.

[0145] In this embodiment, the redistribution factor W of the i-th sub-goal i for:

[0146]

[0147] Among them, H i is the sum of the failure criticality of the ith sub-goal, and n is the number of sub-goals.

[0148] The functional implementation of each module in the reliability allocation device corresponds to each step in the reliability allocation method embodiment, and its functions and implementation processes are not described one by one here.

[0149] In a third aspect, an embodiment of the present application provides a reliability allocation device, which may be a device having a data processing function, such as a personal computer (PC), a laptop computer, or a server.

[0150] Reference Figure 4 , Figure 4 The hardware structure diagram of the reliability allocation device involved in the embodiment of the present application is shown in FIG. In the embodiment of the present application, the reliability allocation device may include a processor, a memory, a communication interface, and a communication bus.

[0151] The communication bus may be of any type and is used to interconnect the processor, the memory, and the communication interface.

[0152] The communication interface includes input / output (I / O) interface, physical interface and logical interface, etc., which are used to realize the interconnection of devices inside the reliability distribution device, and the interface used to realize the interconnection between the reliability distribution device and other devices (such as other computing devices or user devices). The physical interface can be an Ethernet interface, a fiber optic interface, an ATM interface, etc.; the user device can be a display, a keyboard, etc.

[0153] The memory can be various types of storage media, such as random access memory (RAM), read-only memory (ROM), non-volatile RAM (NVRAM), flash memory, optical storage, hard disk, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), etc.

[0154] The processor may be a general-purpose processor, and the general-purpose processor may call the reliability allocation program stored in the memory and execute the reliability allocation method provided in the embodiment of the present application. For example, the general-purpose processor may be a central processing unit (CPU). The method executed when the reliability allocation program is called may refer to the various embodiments of the reliability allocation method of the present application, and will not be repeated here.

[0155] Those skilled in the art will understand that Figure 4 The hardware structure shown in the figure does not constitute a limitation on the present application, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0156] It should be noted that the serial numbers of the above-mentioned embodiments of the present application are only for description and do not represent the advantages or disadvantages of the embodiments.

[0157] The terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned drawings are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices. The terms "first", "second" and "third" are used to distinguish different objects, etc., and do not represent a sequence, nor do they limit "first", "second" and "third" to different types.

[0158] In the description of the embodiments of the present application, "exemplary", "for example" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary", "for example" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary", "for example" or "for example" is intended to present related concepts in a specific way.

[0159] In the description of the embodiments of the present application, unless otherwise specified, “ / ” means or, for example, A / B can mean A or B; the “and / or” in the text is merely a description of the association relationship of associated objects, indicating that three relationships may exist, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, in the description of the embodiments of the present application, “multiple” refers to two or more than two.

[0160] In some processes described in the embodiments of the present application, multiple operations or steps that appear in a specific order are included, but it should be understood that these operations or steps may not be executed in the order in which they appear in the embodiments of the present application or in parallel, and the sequence number of the operation is only used to distinguish the different operations, and the sequence number itself does not represent any execution order. In addition, these processes may include more or fewer operations, and these operations or steps may be executed in sequence or in parallel, and these operations or steps may be combined.

[0161] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, disk, CD) as described above, and includes a number of instructions for a terminal device to execute the methods described in each embodiment of the present application.

[0162] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A reliability allocation method, characterized in that: The method comprises: Decompose the system to be allocated into multiple sub-goals according to functional requirements or structure; Obtain the occurrence score and of each sub-goal failure, and obtain each scoring factor according to each score and, use the reciprocal of each scoring factor as the initial allocation ratio of each sub-goal; According to the severity and detection degree of each sub-goal fault, the sum of the fault hazard degree of each sub-goal is obtained, and according to the sum of the fault hazard degree, the redistribution factor of each sub-goal is obtained; The product of the initial allocation ratio of each sub-goal and the redistribution factor is obtained respectively, and the reciprocal normalization is performed to obtain the reliability index allocation ratio of each sub-goal, and then the reliability index allocation value of each sub-goal is obtained.

2. The reliability allocation method according to claim 1, characterized in that: Perform reciprocal normalization to obtain the reliability index distribution ratio of each sub-goal, including: The product of the initial allocation ratio of each sub-goal and the redistribution factor is its secondary allocation ratio; The sum of the reciprocals of the reliability index allocation ratios is taken as 1, and each secondary allocation ratio is normalized to obtain the reliability index allocation ratio of each sub-goal.

3. The reliability allocation method according to claim 1, characterized in that: The reliability index distribution values ​​of each sub-goal are as follows: Obtaining a preset reliability index allocation value of the system to be allocated; The product of the reliability index allocation ratio of each sub-goal and the reliability index allocation value of the to-be-allocated system is calculated respectively as the reliability index allocation value of each sub-goal.

4. The reliability allocation method according to claim 3, characterized in that: The reliability index allocation value is the mean time between failures.

5. The reliability allocation method according to claim 1, characterized in that: When the system to be allocated is a DC cabin system, the sub-goals are multiple subsystems into which the DC cabin system is decomposed according to functional requirements; When the system to be allocated is any subsystem, the sub-targets are multiple parts decomposed into the subsystem according to the structure.

6. The reliability allocation method according to claim 1, characterized in that: Before obtaining the occurrence score of each sub-goal failure, it also includes: Perform Failure Mode and Effect Analysis (FMEA) on the assigned system-sub-goals, and obtain the severity, occurrence, and detection scores of each failure mode of each sub-goal.

7. The reliability allocation method according to claim 1, characterized in that: The scoring factor for the i-th sub-goal is: Among them, O i is the occurrence score of the i-th sub-goal failure, and n is the number of sub-goals.

8. The reliability allocation method according to claim 1, characterized in that: The sum of the fault severity of any sub-goal is: the sum of the products of the severity and detection of each fault of the sub-goal; The redistribution factor of the i-th sub-goal is: Among them, H i is the sum of the failure criticality of the ith sub-goal, and n is the number of sub-goals.

9. A reliability allocation device, characterized in that: The device comprises: A decomposition module is used to decompose the system to be allocated into multiple sub-goals according to functional requirements or structures; An initial allocation ratio acquisition module is used to obtain the occurrence score and of each sub-goal failure, and obtain each scoring factor according to each score and, and use the reciprocal of each scoring factor as the initial allocation ratio of each sub-goal; A redistribution factor acquisition module, which is used to obtain the sum of the fault hazard levels of each sub-goal according to the severity and detection level of each sub-goal fault, and obtain the redistribution factor of each sub-goal according to the sum of the fault hazard levels; The reliability index allocation value acquisition module is used to obtain the product of the initial allocation ratio of each sub-goal and the redistribution factor, and perform inverse normalization processing to obtain the reliability index allocation ratio of each sub-goal, and then obtain the reliability index allocation value of each sub-goal.

10. A reliability allocation device, characterized in that: The reliability allocation device comprises a processor, a memory, and a reliability allocation program stored in the memory and executable by the processor, wherein when the reliability allocation program is executed by the processor, the steps of the reliability allocation method according to any one of claims 1 to 8 are implemented.

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