A testing device and testing method for a photovoltaic emitter

Abstract

The application relates to a testing device and a testing method of a photovoltaic emitter. The testing device is characterized in that the testing board in each testing channel receives a testing signal, samples and processes the power consumption data of the testing point, judges after a preset fixed time of each sampling, sends a qualified result to an upper computer if the judgment is qualified, continues sampling and judging if the judgment is unqualified, and stops until the judgment is qualified or the preset response time is exceeded. In the embodiment of the application, the power consumption data of the testing point is processed and judged by the testing board, so that the calculation resource of the upper computer is significantly reduced, the frequent judgment times of the testing result are reduced, and the overall efficiency of the testing device is greatly improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of photovoltaic shutdown system testing, and particularly relates to a photovoltaic emitter testing device and a testing method. BACKGROUND

[0002] In the field of safety control of photovoltaic systems, photovoltaic shutdown devices play a crucial role. A photovoltaic shutdown system is usually composed of a photovoltaic shutdown device and an emitter, and its working principle is based on a signal transmission and response mechanism: the emitter is responsible for emitting a specific signal, and the photovoltaic shutdown device maintains its on state after receiving the signal to ensure the normal operation of the photovoltaic system; if the signal is not received, the photovoltaic shutdown device will automatically shut down to quickly cut off the power supply of the photovoltaic components in emergency situations, fault situations or maintenance situations, thereby eliminating the direct current high voltage and making the system enter a non-dangerous state, ensuring the safety of personnel and equipment.

[0003] Currently, the power consumption test of the emitter is one of the key indicators for evaluating its performance, which is directly related to the energy efficiency ratio and long-term operation stability of the emitter. The traditional power consumption test method relies on an upper computer system. When multiple emitters need to be tested simultaneously, the upper computer in the traditional test method needs to frequently process and judge the power consumption data of each emitter, which takes a long time and increases the occupation of system test resources, seriously affecting the overall test efficiency. In addition, frequent data processing and judgment also increase the load of the upper computer, affecting the stability of the system; finally, since the emitter continuously sends power carrier signals during the test process, the power consumption of the emitter is prone to fluctuation, which leads to misjudgment of the upper computer and affects the test accuracy.

[0004] Therefore, how to realize efficient, stable and accurate power consumption performance test of the emitter is a problem to be solved. SUMMARY

[0005] Therefore, the embodiments of the present application provide a photovoltaic emitter testing device and a testing method to solve at least one problem in the background art.

[0006] In a first aspect, the embodiments of the present application provide a testing device for a photovoltaic transmitter, the photovoltaic transmitter being applied to a photovoltaic system, the photovoltaic system comprising an inverter, a photovoltaic string and the photovoltaic transmitter; the photovoltaic string comprising a plurality of photovoltaic units, each of the photovoltaic units comprising a photovoltaic shut-off device and a photovoltaic assembly connected to the photovoltaic shut-off device; the inverter being configured to convert direct current output by the photovoltaic string into alternating current and output the alternating current; the transmitter being configured to send a pilot signal to the photovoltaic shut-off device in the photovoltaic string at a fixed time period; the transmitter and the photovoltaic shut-off device being in communication through a power line; the testing device comprising: a plurality of testing needle plates, a plurality of testing base plates, a communication bus and an upper computer; wherein the testing base plates are connected to the photovoltaic transmitter to be tested through the testing needle plates, and are configured to perform performance testing on the photovoltaic transmitter to be tested; each of the testing needle plates and the corresponding testing base plate form a testing channel; the upper computer is connected to the plurality of testing base plates through the communication bus, and is configured to interact with each of the testing channels for testing instructions and testing results.

[0007] The upper computer is configured to send a testing signal to each of the testing channels; wherein the testing signal comprises a preset response time T w and a preset threshold range [P L , P H ].

[0008] Each of the testing base plates is configured to receive the testing signal, collect testing point power consumption data of the corresponding photovoltaic transmitter to be tested according to the testing signal, judge whether the power consumption of the photovoltaic transmitter to be tested is qualified within the preset response time T L according to the testing point power consumption data and the preset threshold range [P H , P w ], and send the judgment result to the upper computer.

[0009] Optionally, judging whether the power consumption of the photovoltaic transmitter to be tested is qualified within the preset response time T L according to the testing point power consumption data and the preset threshold range [P H , P w ] comprises:

[0010] If the average value of the testing point power consumption data collected within a preset fixed time T s is within the preset threshold range [P L , P H ], the testing result is judged to be qualified, and the qualified judgment result is sent to the upper computer accordingly;

[0011] If the average value of the testing point power consumption data collected within a preset fixed time T s is not within the preset threshold range [P L , P HIf it is within, the test result is judged as unqualified; then continue to collect the next preset fixed time T s The test data within until mT s The average value of the power consumption data of the test points within the time is within the preset threshold range [P L , P H , the test result is judged as qualified. Correspondingly, send the qualified judgment result to the host computer; if until NT s The average value of the power consumption data of the test points within the time is not within the preset threshold range [P L , P H , the test result is judged as unqualified. Correspondingly, send the unqualified judgment result to the host computer; where N≥m, (N + 1)T s >T w .

[0012] Optionally, the preset response time T s is determined according to the preset response time T w .

[0013] Optionally, 5T s ≤T w ≤10T s .

[0014] In a second aspect, an embodiment of the present application provides a test method for a photovoltaic emitter. The method is applied to a photovoltaic emitter test device, and the test device includes: a plurality of test pin boards, a plurality of test bottom boards, a communication bus, and a host computer; where the test bottom board is connected to the photovoltaic emitter to be tested through the test pin board for performing a performance test on the photovoltaic emitter to be tested; each test pin board and the corresponding test bottom board form a test channel; the host computer is connected to the plurality of test bottom boards through the communication bus for interacting test instructions and test results with each test channel; the method includes:

[0015] Receiving a test signal sent by the host computer; where the test signal includes a preset response time T w and a preset threshold range [P L , P H ;

[0016] Collecting the power consumption data of the test points of the photovoltaic emitter to be tested according to the test signal;

[0017] Judging whether the power consumption of the photovoltaic emitter to be tested is qualified according to the power consumption data of the test points and the preset threshold range [P L , P H within the preset response time T w , and sending the judgment result to the host computer.

[0018] Optionally, based on the power consumption data of the test points and the preset threshold range [P L , P H within the preset response time T w to determine whether the power consumption of the photovoltaic transmitter to be tested is qualified, and send the judgment result to the host computer, including:

[0019] If the average value of the power consumption data of the test points within the preset fixed time T s is within the preset threshold range [P L , P H , the test result is judged to be qualified. Correspondingly, send the qualified judgment result to the host computer;

[0020] If the average value of the power consumption data of the test points within the preset fixed time T s is not within the preset threshold range [P L , P H , the test result is judged to be unqualified; then continue to collect the test data within the next preset fixed time T s until the average value of the power consumption data of the test points within mT s time is within the preset threshold range [P L , P H , the test result is judged to be qualified. Correspondingly, send the qualified judgment result to the host computer; if until the average value of the power consumption data of the test points within NT s time is not within the preset threshold range [P L , P H , the test result is judged to be unqualified. Correspondingly, send the unqualified judgment result to the host computer; where N≥m, (N + 1)T s >T w .

[0021] Optionally, the preset response time T s is determined according to the preset response time T w .

[0022] Optionally, 5T s ≤T w ≤10T s .

[0023] In a third aspect, an embodiment of the present application provides a computer-readable storage medium. The computer-readable storage medium stores instructions. When the instructions are executed by a processor of an electronic device, the electronic device can execute the test method of the photovoltaic transmitter provided in any one of the first aspects above.

[0024] Fourthly, one embodiment of this application provides an electronic device, the electronic device comprising:

[0025] processor;

[0026] Memory used to store executable instructions for a computer;

[0027] The processor is configured to execute the computer-executable instructions to implement the test method for the photovoltaic emitter as described in any one of the first aspects above.

[0028] In this embodiment, the test signal sent by the host computer includes a preset response time and a preset threshold range. After receiving the test signal, the test baseboard in each test channel samples and processes the power consumption data of the test point, and makes a judgment after a preset fixed time each time the sampling is completed. If the judgment is qualified, a qualified result is sent to the host computer; if the judgment is unqualified, sampling and judgment continue until the judgment is qualified or the preset response time is exceeded. In this embodiment, by processing and judging the power consumption data of the test point through the test baseboard, the computing resources of the host computer are significantly reduced, the number of frequent judgments of the test results is reduced, and the overall efficiency of the test device is greatly improved. Secondly, when the judgment is unqualified, the test baseboard will continue to sample to form a new data set and judge the data set, thereby effectively reducing the potential interference of the transmitter's transmission of the conduction signal on the power consumption data, significantly reducing the phenomenon of misjudgment of test results, and improving the accuracy of test results. Finally, within the preset response time, the test baseboard will perform multiple supplementary sampling sets, thereby enabling multiple judgments, effectively reducing errors, and improving the accuracy and reliability of the test.

[0029] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0030] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0031] Figure 1 This is a schematic diagram of the test device structure for a photovoltaic emitter provided in one embodiment of this application;

[0032] Figure 2 This is a schematic diagram of the testing process of a specific embodiment of this application;

[0033] Figure 3 A flowchart of a photovoltaic emitter testing method provided in an embodiment of this application;

[0034] Figure 4This is a schematic diagram of a test base plate structure provided in one embodiment of this application;

[0035] Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0036] To make the technical solution and beneficial effects of the present invention more apparent and understandable, a detailed description is provided below by listing specific embodiments. Unless otherwise defined, the technical and scientific terms used herein have the same meanings as those in the technical field to which this application pertains.

[0037] Figure 1 This is a schematic diagram of the test device structure for a photovoltaic emitter provided in one embodiment of this application. Figure 1 As shown, the testing device includes: multiple test pin boards, multiple test base boards, a communication bus, and a host computer. The test base boards are connected to the photovoltaic emitter under test (PVD) via the test pin boards for performance testing. Specifically, each test pin board has one end connected to the test point of the PVD via a test pin, and the other end connected to the corresponding test base board via a ribbon cable. Each test pin board and its corresponding test base board form a test channel. The host computer is connected to multiple test base boards via the communication bus for exchanging test commands and results with each test channel. A photovoltaic (PV) transmitter is used in a photovoltaic (PV) system, which includes an inverter, a PV string, and a PV transmitter. The PV string includes multiple PV units, each of which includes a PV switch and a PV module connected to the PV switch. The inverter converts the direct current (DC) output from the PV string into alternating current (AC) and outputs it. The transmitter sends a turn-on signal to the PV switch in the PV string at fixed time intervals. The PV switch maintains the output of the PV module when it receives the turn-on signal and disconnects the output of the PV module when it does not receive the turn-on signal. The transmitter and the PV switch communicate via power lines. It should be noted that the transmitter in this embodiment can be either a transmitter that only transmits a turn-on signal or a transceiver that transmits and receives signals. Correspondingly, the PV switch can be either a switch that only receives signals or a switch that transmits and receives signals.

[0038] The host computer is used to send test signals to the test channel, wherein the test signal includes a preset response time T. w and preset threshold range [P] L ,P H For example, such as Figure 1As shown, the testing device includes 8 test channels with communication addresses sequentially designated as 0x01, 0x02, ..., 0x08. The host computer sends test signals to the corresponding test channels via command messages. It should be noted that the test signal in this application refers to a power consumption test command. Correspondingly, the test baseboard receives the test signal and performs power consumption data acquisition and judgment.

[0039] Each test base plate is used to receive test signals, collect power consumption data of the corresponding photovoltaic emitter under test based on the test signals, and then, based on the power consumption data of the test points and a preset threshold range [P], [the system] collects power consumption data of the photovoltaic emitter under test at the test points. L ,P H At the preset response time T w The system internally determines whether the power consumption of the transmitter under test is qualified and sends the result to the host computer. It should be noted that the test baseboard continuously collects data and processes and judges the data simultaneously; it does not acquire all data within the preset response time Tw before making a judgment.

[0040] As an optional implementation method, the photovoltaic (PV) emitter under test (PVD) sends a conduction signal at a fixed time period to simulate the actual operating state of the PVD, thereby facilitating the acquisition of accurate power consumption data. It should be noted that the power consumption of the PVD D categorizes into dynamic power consumption and static power consumption. Dynamic power consumption refers to the power consumption generated during the transmission of the conduction signal, while static power consumption refers to the power consumption when no conduction signal is being transmitted. The dynamic power consumption data of the PVD D PV may fluctuate due to its continuous transmission of the conduction signal. Furthermore, since the conduction signal propagates through power lines, it may also interfere with the transmission of power consumption data at the test points, affecting the accuracy of the test point power consumption data.

[0041] As one optional implementation method, determining whether the power consumption of the photovoltaic emitter under test is qualified based on the power consumption data at the test points and a preset threshold range within a preset response time includes:

[0042] If the preset fixed time T for data collection s The average power consumption data of the internal test points is within the preset threshold range [P] L ,P H If the result is within the specified range, the test result is judged as qualified, and the qualified result is sent to the host computer.

[0043] If the preset fixed time T for data collection s The average power consumption data of the internal test points is not within the preset threshold range [P] L ,P H If the test result is within a certain time frame (e.g., 1 minute), the result is considered unqualified; then, the test continues for the next preset fixed time T. s Test data within mT sIf the average value of the power consumption data of the test points within the time is within the preset threshold range [P L , P H , the test result is judged to be qualified. Correspondingly, the qualified judgment result is sent to the host computer; if until NT s The average value of the power consumption data of the test points within the time is not within the preset threshold range [P L , P H , the test result is judged to be unqualified. Correspondingly, the unqualified judgment result is sent to the host computer; where N≥m, (N + 1)T s >T w .

[0044] Figure 2 is a schematic diagram of the test process of a specific embodiment of the present application. As Figure 2 shown, after receiving the power consumption test signal, the test floor starts the test process. The acquisition and processing module in the test floor can obtain the power consumption data of the test points of the photovoltaic emitter to be tested through the electrical connection of the pin board, and transfer the data to the control module of the test floor. The data set collected by the control module within the preset fixed time T s is P = {P1, P2, P3,...P N}, and the control module calculates the arithmetic mean value of the data set to obtain the average power consumption of the test points P C . If P C is within the preset threshold range, that is, P L < P C < P H , the control module sends the qualified judgment result to the host computer. If P C is not within the preset threshold range, the original data set is retained, and the data acquisition time is increased to 2T S , that is, the data acquisition for another T S time is performed, and the collected data is integrated into the data set P = {P1, P2, P3,...P N , P N+1 , P N+2 ,...P 2N}, and the control module calculates the arithmetic mean value of the data set to obtain P C . If P C meets the threshold, the qualified judgment result is returned to the host computer. If P C does not meet the threshold interval, the above operation is repeated. When the sampling time has increased multiple times to NT s , P C still does not meet the output threshold interval, and the waiting response time T W < (N + 1)T s , an unqualified result is returned.

[0045] As one optional implementation method, a fixed time T is preset. s According to the preset response time T w Confirmed. Furthermore, 5T s ≤T w ≤10T s That is, during the waiting time of the host computer, each test channel can supplement 5-10 sampling sets and determine whether the average power consumption of the corresponding test point meets the preset threshold range, thereby improving the accuracy of the test results and reducing the phenomenon of misjudgment.

[0046] As an optional specific implementation, the testing device also includes a power supply (not shown in the figure), which is connected to the test base plate and is used to supply power to the test base plate; the test base plate is connected to the photovoltaic emitter under test through the test probe plate and is also used to supply power to the photovoltaic emitter under test.

[0047] In this embodiment, the test signal sent by the host computer includes a preset response time and a preset threshold range. After receiving the test signal, the test baseboard in each test channel samples and processes the power consumption data of the test point, and makes a judgment after a preset fixed time each time the sampling is completed. If the judgment is qualified, a qualified result is sent to the host computer; if the judgment is unqualified, sampling and judgment continue until the judgment is qualified or the preset response time is exceeded. In this embodiment, by processing and judging the power consumption data of the test point through the test baseboard, the computing resources of the host computer are significantly reduced, the number of frequent judgments of the test results is reduced, and the overall efficiency of the test device is greatly improved. Secondly, when the judgment is unqualified, the test baseboard will continue to sample to form a new data set and judge the data set, thereby effectively reducing the potential interference of the transmitter's transmission of the conduction signal on the power consumption data, significantly reducing the phenomenon of misjudgment of test results, and improving the accuracy of test results. Finally, within the preset response time, the test baseboard will perform multiple supplementary sampling sets, thereby enabling multiple judgments, effectively reducing errors, and improving the accuracy and reliability of the test.

[0048] Figure 3 This is a flowchart illustrating a photovoltaic emitter testing method according to an embodiment of this application. Figure 3 As shown, this method is applied to a testing device for photovoltaic (PV) emitters. The testing device includes: multiple test pin plates, multiple test base plates, a communication bus, and a host computer. The test base plates are connected to the PV emitter under test via the test pin plates for performance testing. Each test pin plate and its corresponding test base plate form a test channel. The host computer is connected to multiple test base plates via the communication bus for exchanging test commands and results with each test channel. The method includes:

[0049] S1. Receive the test signal sent by the host computer.

[0050] Specifically, the test signal includes a preset response time T w and a preset threshold range [P L , P H .

[0051] S2. Collect the power consumption data of the test points of the photovoltaic emitter to be tested according to the test signal.

[0052] As an optional specific implementation manner, the photovoltaic emitter to be tested sends a conduction signal at a fixed time period, so as to imitate the operation state of the actual photovoltaic emitter to be tested, which is beneficial to obtaining accurate power consumption data.

[0053] S3. Judge whether the power consumption of the photovoltaic emitter to be tested is qualified within the preset response time according to the power consumption data of the test points and the preset threshold range [P L , P H , and send the judgment result to the host computer.

[0054] Specifically, S3 includes:

[0055] If the average value of the power consumption data of the test points within the preset fixed time T s is within the preset threshold range, the test result is judged as qualified. Correspondingly, send the qualified judgment result to the host computer.

[0056] If the average value of the power consumption data of the test points within the preset fixed time T s is not within the preset threshold range, the test result is judged as unqualified; continue to collect the test data within the next preset fixed time T s until the average value of the power consumption data of the test points within mT s time is within the preset threshold range, then the test result is judged as qualified. Correspondingly, send the qualified judgment result to the host computer; if the average value of the power consumption data of the test points within NT s time is not within the preset threshold range, the test result is judged as unqualified. Correspondingly, send the unqualified judgment result to the host computer; where N≥m, (N + 1)T s > T w .

[0057] As an optional specific implementation manner, determine the preset fixed time T w according to the preset response time T s . Further, 5T s ≤T w ≤10T s .

[0058] Figure 4 is a schematic structural diagram of a test floor provided by an embodiment of the present application. As Figure 4As shown in the figure, the test base plate includes:

[0059] A receiving module 100 for receiving test signals sent by a host computer.

[0060] Specifically, the test signal includes a preset response time T w and a preset threshold range [P L , P H .

[0061] An acquisition module 200 for acquiring test point power consumption data of a photovoltaic emitter to be tested according to the test signal.

[0062] As an optional specific implementation manner, the photovoltaic emitter to be tested sends a conduction signal at a fixed time period, so as to imitate the operation state of the actual photovoltaic emitter to be tested, which is beneficial to obtaining accurate power consumption data.

[0063] A processing and judgment module 300 for judging whether the power consumption of the photovoltaic emitter to be tested is qualified within the preset response time according to the test point power consumption data and the preset threshold range [P L , P H , and sending the judgment result to the host computer.

[0064] Specifically, the processing and judgment module 300 is used for:

[0065] If the average value of the test point power consumption data collected within the preset fixed time T s is within the preset threshold range, the test result is judged to be qualified. Correspondingly, the qualified judgment result is sent to the host computer.

[0066] If the average value of the test point power consumption data collected within the preset fixed time T s is not within the preset threshold range, the test result is judged to be unqualified; continue to collect the test data within the next preset fixed time T s until the average value of the test point power consumption data within the time of mT s is within the preset threshold range, then the test result is judged to be qualified. Correspondingly, the qualified judgment result is sent to the host computer; if the average value of the test point power consumption data within the time of NT s is not within the preset threshold range, the test result is judged to be unqualified. Correspondingly, the unqualified judgment result is sent to the host computer; where N≥m, (N + 1)T s > T w .

[0067] As an optional specific implementation manner, determine the preset fixed time T w according to the preset response time T s . Further, 5T s ≤T w≤10T s .

[0068] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working process of the modules described above can be referred to the corresponding process in the foregoing method embodiments or device embodiments, and will not be repeated here.

[0069] This application also provides a computer-readable storage medium. The computer-readable storage medium stores instructions that, when executed by a processor of an electronic device, enable the electronic device to perform the steps in the photovoltaic emitter testing method of any of the above embodiments.

[0070] Embodiments of this application may be systems, methods, and / or computer program products. A computer program product may include a computer-readable storage medium having computer-readable program instructions loaded thereon for causing a processor to implement various aspects of this application. In some embodiments, electronic circuitry, such as programmable logic circuitry, field-programmable gate arrays (FPGAs), or programmable logic arrays (PLAs), is customized by utilizing state information from the computer-readable program instructions. This electronic circuitry can execute the computer-readable program instructions to implement various aspects of this application.

[0071] This application also provides an electronic device. Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. As shown in the figure, the electronic device 400 includes: one or more processors 401 and a memory 402; the memory 402 stores computer-executable instructions; the processor 401 is used to execute the computer-executable instructions to implement the steps in the photovoltaic emitter testing method of any of the above embodiments.

[0072] The processor 401 may be a central processing unit (CPU) or other form of processing unit with data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device to perform desired functions.

[0073] The memory 402 may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. Volatile memory may include, for example, random access memory (RAM) and / or cache memory. Non-volatile memory may include, for example, read-only memory (ROM), hard disk, flash memory, etc. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor 301 may execute the program instructions to implement the steps in the text recognition methods of the various embodiments of this application described above, and / or other desired functions.

[0074] Of course, for the sake of simplicity, Figure 5 Only a portion of the components of the electronic device 400 relevant to this application are shown in this illustration; components such as buses and input / output interfaces are omitted. In addition, the electronic device 400 may include any other suitable components depending on the specific application.

[0075] It should be noted that the photovoltaic emitter testing device embodiment, photovoltaic emitter testing method device embodiment, computer-readable storage medium embodiment, and electronic device embodiment provided in this application belong to the same concept; the technical features in the technical solutions described in each embodiment can be arbitrarily combined without conflict.

[0076] It should be understood that the above embodiments are exemplary and are not intended to encompass all possible implementations included in the claims. Various modifications and changes can be made to the above embodiments without departing from the scope of this disclosure. Similarly, the various technical features of the above embodiments can be arbitrarily combined to form other embodiments of the present invention that may not be explicitly described. Therefore, the above embodiments only illustrate several implementations of the present invention and do not limit the scope of protection of this patent.

Claims

1. A testing device for a photovoltaic emitter, characterized in that, The photovoltaic transmitter is applied to a photovoltaic system, which includes an inverter, a photovoltaic string, and a photovoltaic transmitter. The photovoltaic string includes multiple photovoltaic units, each of which includes a photovoltaic switch and a photovoltaic module connected to the photovoltaic switch. The inverter is used to convert the DC power output from the photovoltaic string into AC power and output it. The photovoltaic transmitter is used to send a turn-on signal to the photovoltaic switch in the photovoltaic string at a fixed time period. The photovoltaic emitter and the photovoltaic shut-off device communicate via power lines. The testing device includes multiple test pin plates, multiple test base plates, a communication bus, and a host computer. The test base plates are connected to the photovoltaic emitter under test via the test pin plates for performance testing. Each test pin plate and its corresponding test base plate form a test channel. The host computer is connected to the multiple test base plates via the communication bus for exchanging test commands and results with each test channel. The host computer is used to send test signals to each of the test channels; wherein, the test signal includes a preset response time T. w and preset power threshold range [P] L ,P H ]; Each test base plate is used to receive test signals and collect power consumption data of the corresponding photovoltaic emitter under test based on the test signals. The power consumption data of the test points is then used in conjunction with the preset power threshold range [P]. L ,P H At the preset response time T w The system internally determines whether the power consumption of the photovoltaic transmitter under test is qualified and sends the determination result to the host computer. Among them, based on the power consumption data at the test points and the preset power threshold range [P] L ,P H ] at the preset response time T w The internal determination of whether the power consumption of the photovoltaic emitter under test is qualified includes: If the preset fixed time T for data collection s The average power consumption data of the internal test points is within the preset power threshold range [P] L ,P H If the result is within the specified range, the test result is judged as qualified, and the qualified result is sent to the host computer. If the average value of the power consumption data of the test points within the preset fixed time T s is not within the preset power threshold range [P L , P H , the test result is judged as unqualified; then continue to collect the test data within the next preset fixed time T s until the average value of the power consumption data of the test points within mT s is within the preset power threshold range [P L , P H , the test result is judged as qualified, and correspondingly, send the qualified judgment result to the host computer; if until NT s the average value of the power consumption data of the test points within the time is not within the preset power threshold range [P L , P H , the test result is judged as unqualified, and correspondingly, send the unqualified judgment result to the host computer; where N≥m, (N + 1)T s > T w , and N and m are positive integers.

2. The testing apparatus for a photovoltaic emitter as described in claim 1, characterized in that, The preset fixed time T s According to the preset response time T w Sure.

3. The testing apparatus for a photovoltaic emitter as described in claim 2, characterized in that, 5T s ≤T w ≤10T s ...

4. A test method for a photovoltaic emitter, characterized in that, The method is applied to a photovoltaic emitter testing device, which includes: multiple test pin plates, multiple test base plates, a communication bus, and a host computer; wherein, the test base plate is connected to the photovoltaic emitter under test through the test pin plates for performance testing of the photovoltaic emitter under test; each test pin plate and its corresponding test base plate form a test channel; the host computer is connected to multiple test base plates through the communication bus for exchanging test commands and test results with each test channel; the method includes: Receives a test signal sent by the host computer; wherein the test signal includes a preset response time T. w and preset power threshold range [P] L ,P H ]; The power consumption data of the photovoltaic emitter under test at the test point is collected based on the test signal. Based on the power consumption data at the test points and the preset power threshold range [P] L ,P H At the preset response time T w The system internally determines whether the power consumption of the photovoltaic transmitter under test is qualified and sends the determination result to the host computer. Among them, based on the power consumption data at the test points and the preset power threshold range [P] L ,P H At the preset response time T w The internal mechanism determines whether the power consumption of the photovoltaic transmitter under test is qualified, and sends the determination result to the host computer, including: If the preset fixed time T for data collection s The average power consumption data of the internal test points is within the preset power threshold range [P] L ,P H If the result is within the specified range, the test result is judged as qualified, and the qualified result is sent to the host computer. If the average value of the power consumption data of the test points within the preset fixed time T s is not within the preset power threshold range [P L , P H , the test result is judged as unqualified; then continue to collect the test data within the next preset fixed time T s until the average value of the power consumption data of the test points within mT s time is within the preset power threshold range [P L , P H , the test result is judged as qualified, and correspondingly, the qualified judgment result is sent to the host computer; if until NT s the average value of the power consumption data of the test points within the time is not within the preset power threshold range [P L , P H , the test result is judged as unqualified, and correspondingly, the unqualified judgment result is sent to the host computer; where N≥m, (N + 1)T s >T w , and N and m are positive integers.

5. The test method for a photovoltaic emitter as described in claim 4, characterized in that, The preset fixed time T s According to the preset response time T w Sure.

6. The test method for a photovoltaic emitter as described in claim 5, characterized in that, 5T s ≤T w ≤10T s ...

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores instructions that, when executed by a processor of an electronic device, enable the electronic device to perform the test method for a photovoltaic emitter as described in any one of claims 4 to 6.

8. An electronic device, characterized in that, The electronic device includes: processor; Memory used to store executable instructions for a computer; The processor is configured to execute the computer-executable instructions to implement the test method for the photovoltaic emitter according to any one of claims 4 to 6.

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