Spectrum measurement device

Abstract

The invention discloses a frequency spectrum measuring device. The frequency spectrum measuring device comprises a scanning type light receiver, an optical assembly and a processor. The scanning light receiver sequentially receives a plurality of light beams of a display image on a plane according to a scanning action so as to sequentially generate a plurality of input light beams. The optical assembly sequentially receives the input light beams and generates a plurality of pieces of processed information. The processor obtains brightness and chrominance information of the display image according to the processed information.

Description

Technical Field

[0001] The present invention relates to a spectrum measuring device, and in particular to a spectrum measuring device capable of obtaining wavelength energy data of a two-dimensional whole surface at one time. Background Art

[0002] The known spectrum measuring instrument makes the light beam enter through the lens, and then performs a variety of optical processing actions in sequence to split the wide wavelength range of the incident light beam into different narrow wavelength ranges in terms of angle, and then reaches different areas of the linear CCD in space to obtain the wavelength energy of each narrow wavelength range, and further calculate the measured brightness and chromaticity information. However, in the known technology, if the whole surface information needs to be measured, it is necessary to add a rotation or translation adjustment machine, and adjust the angle and position relationship between the measuring instrument and the object to be measured, which seriously reduces the convenience of use. Summary of the invention

[0003] The present invention is directed to a spectrum measuring device, which can obtain wavelength energy data of a two-dimensional whole surface at one time.

[0004] According to an embodiment of the present invention, a spectrum measuring device includes a scanning optical receiver, an optical component, and a processor. The scanning optical receiver sequentially receives a plurality of light beams of a display image according to a scanning action on a plane to sequentially generate a plurality of input light beams. The optical component sequentially receives the input light beams and generates a plurality of processed information. The processor is coupled to the optical component to obtain brightness and color information of the display image according to the processed information.

[0005] Based on the above, the spectrum measuring device of the present invention sequentially receives multiple light beams of a planar display image in a scanning manner through a scanning optical receiver, and performs sensing on the received light beams to obtain wavelength energy data of the entire two-dimensional display image. BRIEF DESCRIPTION OF THE DRAWINGS

[0006] Figure 1 A schematic diagram showing a spectrum measurement device according to an embodiment of the present invention;

[0007] Figure 2 A schematic diagram showing a spectrum measuring device according to another embodiment of the present invention;

[0008] Figure 3A as well as Figure 3B Schematic diagrams showing different implementations of a spectrum measurement device according to another embodiment of the present invention;

[0009] Figure 4 A schematic diagram showing a spectrum measuring device according to another embodiment of the present invention;

[0010] Figure 5A as well as Figure 5BSchematic diagrams showing different implementations of a spectrum measurement device according to another embodiment of the present invention;

[0011] FIG. 6A to FIG. 6C A schematic diagram showing a spectrum measuring device according to another embodiment of the present invention;

[0012] Figure 7 A partial structural schematic diagram of a spectrum measuring device according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0013] Reference will now be made in detail to exemplary embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Whenever possible, the same reference numerals are used in the drawings and the description to refer to the same or like parts.

[0014] Please refer to Figure 1 , Figure 1 The schematic diagram of the spectrum measuring device of the embodiment of the present invention is shown. The spectrum measuring device 100 includes a scanning optical receiver 110, an optical component 120 and a processor 130. The scanning optical receiver 110 is used to sequentially receive the light beams LB1-LB2 sent by the display DSP through the lens group LEG according to the scanning action, and obtain multiple input light beams ILBS respectively. In this embodiment, the scanning optical receiver 110 can first receive the light beam LB1 provided by the display part Z1 in the display DSP. Then, according to the default scanning order, the light beams (such as the light beam LB2) sent by different display parts (such as the display part Z2) in the display DSP are sequentially received along the first axial direction D1 of the plane where the display DSP is located. After the light beams sent by the display parts on the same row of the display parts Z1 and Z2 are received, the scanning optical receiver 110 can scan the multiple display parts on the row of the display parts Z1 and Z2 along the second axial direction D2 of the plane where the display DSP is located, and respectively receive the light beams sent by these display parts.

[0015] The above scanning action can be continuously performed, and the scanning light receiver 110 can receive all the light beams corresponding to the display image sent by the display DSP respectively and in a time-sharing manner, and obtain a plurality of input light beams ILBS.

[0016] On the other hand, the optical component 120 is coupled to the scanning light receiver 110. The optical component 120 receives the input light beam ILBS in sequence, and performs optical processing operations on the input light beam ILBS to sequentially generate a plurality of processed information PI. In this embodiment, the optical component 120 can perform diffraction and linear sensing operations on the input light beam ILBS, and obtain the processed information PI according to the linear sensing operations. Further, the optical component 120 can transmit the processed information PI to the processor 130. The processor 130 can be coupled to the optical component 120, and is used to obtain the brightness and color information of the display image generated by the display DSP according to the processed information PI.

[0017] In this embodiment, through the scanning action of the scanning light receiver 110 , the spectrum measurement device 100 can receive a two-dimensional light beam of a complete plane of a display image at one time, and thereby sense the brightness and color information of the display image, thereby improving the working efficiency of the spectrum measurement device 100 .

[0018] Incidentally, the processor 130 may be a processor or a controller circuit with computing capabilities.

[0019] Please refer to Figure 2 , Figure 2 A schematic diagram of a spectrum measuring device according to another embodiment of the present invention is shown. The spectrum measuring device 200 includes a scanning optical receiver 210, an optical component 220, and a processor 230. In this embodiment, the scanning optical receiver 210 includes a light receiving lens SFH. The light receiving lens SFH can be connected to an actuator (not shown). The actuator can carry and drive the light receiving lens SFH to move along a first axial direction D1 or a second axial direction D2 of a plane, so as to sequentially receive a plurality of light beams LB of a display image sent by a display DSP, and sequentially obtain a plurality of input light beams.

[0020] The light receiving lens SFH can be coupled to the optical component 220 through an optical fiber, and transmits multiple input light beams to the optical component 220 in sequence through the optical fiber. In this embodiment, the optical component 220 includes a slit device, a reflector, and a diffraction grating. The slit device, the reflector, and the diffraction grating can be arranged in sequence, and each input light beam is received in sequence, and each corresponding processed information PI is generated in sequence. The processor 230 can obtain the brightness and color information of the displayed image according to the processed information PI.

[0021] In this embodiment, by adjusting the movement of the light receiving lens on the plane, the spectrum measuring device 200 can complete the measurement of the brightness and color information of the displayed image, and further obtain the wavelength energy data of the entire two-dimensional surface of the displayed image.

[0022] Please refer to Figure 3A as well as Figure 3B , Figure 3A as well as Figure 3B Schematic diagrams showing different implementations of a spectrum measurement device according to another embodiment of the present invention. Figure 3A In the embodiment, the spectrum measuring device 300 includes a scanning optical receiver 310, an optical component 320 and a processor 330. In the present embodiment, the scanning optical receiver 310 includes a slit array 311 and a focusing lens 312. The slit array 311 has a plurality of slits ST arranged in an array, wherein each slit ST can be opened in sequence according to a scanning sequence, and each light beam LB of a display image generated by a display DSP can be received in sequence through the opened slits ST. The slit array 311 can perform a scanning action according to a first axial direction D1 or a second axial direction D2 on a plane, and each slit ST can be opened in sequence. By opening each slit ST at different positions on the slit array 311 in sequence, each light beam LB of a display image generated by the display DSP can be passed through each opened slit ST in sequence, light outside the measurement position can be shielded, and the measured light beam can be transmitted to the focusing lens 312.

[0023] The focusing lens 312 and the slit array 311 are arranged to overlap each other. The slit array 311 can be disposed between the lens group LEG and the focusing lens 312, and the focusing lens 312 can be disposed between the slit array 311 and the optical component 320. The focusing lens 312 is used to focus the incoming light beam LB to generate an input light beam ILB, and guide the input light beam ILB to be projected toward the optical component 320.

[0024] The optical component 320 includes a reflective diffraction grating 321A and a linear sensor 322 which are arranged in an overlapping manner; wherein the linear sensor 322 receives the reflected light generated by the reflective diffraction grating 321A. The focusing lens 312 allows the input light beam ILB to be projected onto the reflective diffraction grating 321A. The reflective diffraction grating 321A is used to split the wide wavelength range light of the input light beam ILB into different narrow wavelength range lights PLB in terms of angle, and make the narrow wavelength range lights PLB arrive at different areas of the linear sensor 322 in space. In this way, the linear sensor 322 can sense the wavelength energy of each narrow wavelength range and generate processed information PI. The processor 330 can further obtain the brightness and chromaticity information to be measured.

[0025] It is worth mentioning that the focal length of the focusing lens 312 can be dynamically adjusted. Furthermore, the focusing lens 312 can be a single lens or composed of a plurality of unit lenses, without any particular limitation. When the focusing lens 312 is composed of a plurality of unit lenses, the positions of the unit lenses can be set to correspond to the positions of the plurality of slits in the slit array 311, respectively.

[0026] In this embodiment, by sequentially opening the slits at different positions in the slit array 311 , the position of the focusing lens 312 , the corresponding angular position relationship between the reflective diffraction grating 321A and the line sensor 322 , the entire surface measurement of the displayed image can be achieved.

[0027] exist Figure 3B In the embodiment, the spectrum measuring device 300' comprises a scanning optical receiver 310, an optical component 320' and a processor 330. In the embodiment, the scanning optical receiver 310 and the processor 330 are connected to the optical component 320'. Figure 3A The implementation method is the same and will not be described in detail here. Figure 3B In the embodiment of the present invention, in the optical component 320', the line sensor 322 receives the transmitted light generated by the transmissive diffraction grating 321B.

[0028] Please refer to Figure 4 , Figure 4 A schematic diagram of a spectrum measuring device according to another embodiment of the present invention is shown. The spectrum measuring device 400 includes a scanning optical receiver 410, an optical component 420, and a processor 430. In this embodiment, the scanning optical receiver 410 includes a slit array 411 and a grating array 412 composed of a plurality of diffraction gratings GR. The slit array 411 has the same function as the slit array 311 of the aforementioned embodiment, which will not be described in detail herein. The grating array 412 is arranged to overlap with the slit array 411. The plurality of diffraction gratings GR on the grating array 412 respectively correspond to the plurality of slits ST in the slit array 411, and each diffraction grating GR is used to receive the corresponding light beams LB through the lens group LEG when the corresponding slit ST1 is opened, and is used to diffract each light beam LB to split the light beam LB into different narrow wavelength intervals of light, and to generate a plurality of input light beams ILB.

[0029] The input light beam ILB is projected onto the optical component 420. The optical component 420 includes a line sensor 421. The input light beam ILB generated by the diffraction grating GR is projected onto a plurality of different regions in one dimension on the line sensor 421.

[0030] In this embodiment, when the slit array 411 opens the slits ST in sequence along the first axial direction D1 or the second axial direction D2, the linear sensor 421 can be synchronously moved along the first axial direction D1 or the second axial direction D2, and sense the chromaticity and brightness of the input light beam ILB generated by the diffraction grating GR. In this way, the spectrum measurement device 400 can achieve the sensing action of the chromaticity and brightness of the entire plane of the display image.

[0031] Please refer to Figure 5A as well as Figure 5B , Figure 5A as well as Figure 5BSchematic diagrams showing different implementations of a spectrum measurement device according to another embodiment of the present invention. Figure 5A In the embodiment, the spectrum measuring device 500 includes a scanning optical receiver 510, an optical component 520, and a processor 530. In this embodiment, the scanning optical receiver 510 includes a slit array 511 composed of a plurality of slits ST and a grating array 512 composed of a plurality of diffraction gratings GR. The scanning optical receiver 510 has the same structure and operation mode as the scanning optical receiver 410 in the aforementioned embodiment, and will not be described in detail here.

[0032] The optical component 520 includes a linear sensor 521. The position of the linear sensor 521 can be adjusted corresponding to the optical path of the input light beam ILB provided by the diffraction grating GR. In the present embodiment, the linear sensor 521 can have a relatively long length compared to the linear sensor 421. When the slit array 511 and the grating array 512 respectively open the slit ST and the diffraction grating GR in sequence along the first axial direction D1, the linear sensor 521 does not need to move along the first axial direction D1, and receives the input light beam ILB provided by the opened diffraction grating GR through a plurality of different areas. When the slit array 511 and the grating array 512 move along the second axial direction D2 to open the slit ST and the diffraction grating GR, the linear sensor 521 can correspondingly move along the second axial direction D2 to effectively receive the input light beam ILB provided by the opened diffraction grating GR. Figure 5B As shown, when the opened slit ST and the diffraction grating GR are moved below the slit array 511 and the grating array 512 , the line sensor 521 correspondingly moves downward along the second axis D2 to effectively receive the input light beam ILB.

[0033] according to FIG. 5A to FIG. 5B From the implementation method, it can be known that the spectrum measuring device 500 can achieve the sensing action of the wavelength energy data of the entire two-dimensional display screen at one time by sequentially opening the slit ST and the diffraction grating GR and adaptively adjusting the position of the linear sensor 521.

[0034] The spectrum measuring device 500 may be provided with an actuator (not shown) to drive the linear sensor 521 to move. The related technology may be implemented in a manner known to those skilled in the art without any limitation.

[0035] Please refer to FIG. 6A to FIG. 6C , FIG. 6A to FIG. 6C Schematic diagram of a spectrum measurement device according to another embodiment of the present invention is shown. The spectrum measurement device 600 includes a scanning optical receiver 610, an optical component 620, and a processor 630. The scanning optical receiver 610 includes a linear diffraction grating 611. Fig. 6AIn the embodiment, the diffraction grating GR receives the light beam LB of the display image provided by the display part DP1 of the display DSP through the lens group LEG. The diffraction grating GR causes the light beam LB to be diffracted and provides a plurality of input light beams ILB to a plurality of different regions of the line sensor 621 of the optical component 620. Thus, the line sensor 621 can measure the wavelength energy of each narrow wavelength range and generate the processed information PI.

[0036] Then, in Figure 6B In the embodiment, another diffraction grating GR' of the linear diffraction grating 611 passes through the lens group LEG to receive the light beam LB' of the display image provided by the display part DP2 of the display DSP. The diffraction grating GR' causes the light beam LB' to be diffracted and provides a plurality of input light beams ILB' to a plurality of different regions of the linear sensor 621. Thus, the linear sensor 621 can measure the wavelength energy of each narrow wavelength range and generate the processed information PI.

[0037] exist Fig. 6A as well as Figure 6B During the operation, the position of the linear sensor 621 can be fixed without moving.

[0038] exist Figure 6C In the embodiment, when the display portion DP3 of the display DSP provides a light beam LB" for displaying an image, the linear diffraction grating 611 can move accordingly along the second axial direction D2 to receive the light beam LB". In the present embodiment, the linear diffraction grating 611 is moved downward, and the diffraction grating GR" therein receives the light beam LB" and generates an input light beam ILB" by diffracting the light beam LB". In addition, the linear sensor 621 can also be synchronously moved along the second axial direction D2 and moved downward to the projection direction of the input light beam ILB". The input light beam ILB" is projected onto different areas of the linear sensor 621, thereby, the linear sensor 621 can measure the wavelength energy of each narrow wavelength range and generate processed information PI.

[0039] according to FIG. 6A to FIG. 6B From the implementation method, it can be known that by adjusting the display part of the display DSP, the spectrum measurement device 600 can adaptively adjust the positions of the linear diffraction grating 611 and the linear sensor 621, and can achieve the sensing action of the wavelength energy data of the entire two-dimensional display screen at one time.

[0040] Similarly, the spectrum measuring device 600 can be provided with an actuator (not shown) to drive the linear diffraction grating 611 and the linear sensor 621 to move. The related technology can be implemented in a manner known to those skilled in the art without any limitation.

[0041] Please refer to the following Figure 7, Figure 7 A partial structural schematic diagram of a spectrum measuring device according to an embodiment of the present invention is shown. In the spectrum measuring device 700, the lens group LEG can overlap with the zoom lens VFL and be arranged in the direction of travel of the light beam LB projected by the display DSP. The light beam LB is used to project to the scanning light receiver of the spectrum measuring device 700. That is, the lens group LEG of this embodiment is arranged between the display DSP and the scanning light receiver, and the zoom lens VFL is arranged between the lens group LEG and the scanning light receiver.

[0042] The focal length of the zoom lens VFL can be adjusted dynamically. The zoom lens VFL can introduce light from a specific area into the slit, increase spatial resolution, and allow the controllable slit to block light outside the measurement position.

[0043] Incidentally, this embodiment can be applied to the aforementioned FIG. 3A to FIG. 6C In the embodiment of .

[0044] In summary, the spectrum measuring device of the present invention receives multiple light beams of the display image by scanning, and thereby senses the brightness and chromaticity information of the light beams of the entire two-dimensional surface of the display image. In this way, the spectrum measuring device of the present invention can obtain the wavelength energy data of the entire two-dimensional surface at one time, which can greatly improve the convenience of the spectrum measuring device in use.

[0045] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A spectrum measuring device, comprising: A scanning light receiver, on a plane, sequentially receives a plurality of light beams of a display image according to a scanning action to sequentially generate a plurality of input light beams; An optical component receives the plurality of input light beams in sequence and generates a plurality of processed information; as well as The processor is coupled to the optical component and obtains the brightness and color information of the display image according to the plurality of processed information.

2. The spectrum measuring device according to claim 1, wherein the scanning optical receiver comprises: The light receiving lens moves in the first axis direction or the second axis direction of the plane according to the scanning action.

3. The spectrum measuring device according to claim 2, wherein the optical component comprises: A slit device, a reflector and a diffraction grating, wherein the slit device, the reflector and the diffraction grating are arranged in sequence to receive each of the input light beams and to generate each of the processed information in sequence.

4. The spectrum measuring device according to claim 1, wherein the scanning optical receiver comprises: A slit array having a plurality of slits, each of which is opened in sequence according to a scanning order and receives each of the light beams in sequence; as well as A focusing lens is arranged to overlap with the slit array, receives each of the light beams and focuses each of the light beams to generate each of the input light beams.

5. The spectrum measuring device according to claim 4, wherein the optical component comprises: A diffraction grating receives each of the input light beams and diffracts each of the input light beams to generate a plurality of diffracted light beams; as well as A line sensor, wherein the plurality of diffracted light beams are respectively projected onto different areas of the line sensor, and the line sensor is used to obtain the wavelength energy of each of the diffracted light beams. 6 . The spectrum measuring device according to claim 5 , wherein the linear sensor receives the light generated by the diffraction grating. 7 . The spectrum measuring device according to claim 4 , wherein the focusing lens comprises a plurality of unit lenses, and the plurality of unit lenses are arranged to correspond to the plurality of slits respectively.

8. The spectrum measuring device according to claim 1, wherein the scanning optical receiver comprises: A slit array having a plurality of slits, each of which is opened in sequence according to a scanning order and receives each of the light beams in sequence; as well as A plurality of diffraction gratings are respectively arranged corresponding to the plurality of slits, and each of the diffraction gratings is used to receive each of the light beams and diffract each of the light beams to generate a plurality of input light beams.

9. The spectrum measuring device according to claim 8, wherein the optical component comprises: A line sensor, wherein the plurality of input light beams generated by each of the diffraction gratings are projected onto different areas of the line sensor. 10 . The spectrum measuring device according to claim 9 , wherein the slits are opened sequentially along a first axial direction or a second axial direction according to the scanning sequence, and the linear sensor moves along the first axial direction or the second axial direction corresponding to the opened slits.

11. The spectrum measuring device according to claim 9, wherein each of the slits is opened sequentially along the first axis or the second axis according to the scanning sequence, and when each of the slits is opened along the second axis, the linear sensor moves along the second axis corresponding to each of the opened slits.

12. The spectrum measuring device according to claim 4, further comprising: A lens group is arranged between a display for providing a display image and the scanning light receiver; as well as The zoom lens is overlapped with the lens group and is arranged between the lens group and the scanning light receiver. 13 . The spectrum measuring device according to claim 12 , wherein the zoom lens has an adjustable focal length.

14. The spectrum measuring device according to claim 1, wherein the scanning optical receiver comprises: A linear diffraction grating receives a plurality of first light beams distributed along a first axial direction among the plurality of light beams, wherein the linear diffraction grating moves along a second axial direction according to the scanning sequence, wherein the first axial direction is orthogonal to the second axial direction.

15. The spectrum measuring device according to claim 13, wherein the optical component comprises: The line sensor, wherein the plurality of input light beams generated by the linear diffraction grating are projected onto different areas of the line sensor, and the line sensor corresponds to the linear diffraction grating to move along the second axial direction.

16. The spectrum measuring device according to claim 14, further comprising: A lens group is arranged between a display for providing a display image and the scanning light receiver; as well as The zoom lens overlaps with the lens group and is arranged between the lens group and the scanning light receiver.

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