Semiconductor chip test equipment with fool-proof function and test method thereof

Abstract

The invention discloses semiconductor chip test equipment with a fool-proof function and a test method thereof, and relates to the technical field of test equipment. The main points of the technical scheme are that the testing device comprises a wiring device and a testing machine, the wiring device comprises a support, the top of the support is provided with a horizontal testing mother board, the surface of the testing mother board is provided with a plurality of testing PCBs, each testing PCB is connected with each testing jack of the testing machine through a flat cable, and the testing jacks of the testing machine are connected with the wiring device. The test PCBs are connected to a device to be tested through connecting wires, and fool-proof resistors with different resistances are respectively connected in series in a circuit of each test PCB. The invention aims to provide semiconductor chip test equipment with a fool-proof function and a test method thereof.

Description

Technical Field

[0001] The present invention relates to semiconductor testing equipment, and more particularly to a semiconductor chip testing equipment with fool-proofing function and a testing method thereof. Background Art

[0002] In order to achieve the qualified rate of semiconductor chips, almost all semiconductor chips must undergo aging tests before leaving the factory. Aging tests provide necessary system signals to the semiconductor chips to be tested through semiconductor test PCB boards, simulate the working state of semiconductor chips, accelerate the electrical failure of semiconductor chips under high temperature or other conditions, obtain the failure rate of semiconductor chips within a period of time, and make semiconductor chips work under a given load state so that their defects appear in a shorter time, thereby obtaining the approximate failure rate of semiconductor chips in their life cycle and avoiding failures in the early stage of use.

[0003] In the existing testing process, when the test PCB board of each device is connected to the test machine, manual observation is generally required to make a one-to-one connection. If the communication lines between the test board and the test machine station are cross-connected incorrectly, the test results of the test machine will not correspond to the actual object, thereby creating the risk of mixed testing or missed testing.

[0004] Therefore, a new technical solution is urgently needed to solve the above technical problems. Summary of the invention

[0005] In view of the deficiencies in the prior art, an object of the present invention is to provide a semiconductor chip testing device with fool-proof function and a testing method thereof.

[0006] The above technical objectives of the present invention are achieved through the following technical solutions: a semiconductor chip testing device with fool-proofing function and a testing method thereof, comprising a wiring device and a testing machine, the wiring device comprising a bracket, a horizontal testing motherboard is arranged on the top of the bracket, a plurality of testing PCB boards are arranged on the surface of the testing motherboard, each of the testing PCB boards is connected to each test socket of the testing machine through a flat cable, the testing PCB board is connected to the device to be tested through a connecting line, and a fool-proofing resistor with different resistances is connected in series in the circuit of each of the testing PCB boards;

[0007] The test method comprises the following steps:

[0008] Step S1, test preparation: After connecting one end of each connecting line to a device to be tested, disconnect the other end of the connecting line from the PCB to be tested and reconnect;

[0009] Step S2, foolproof detection: the test machine outputs a fixed current to each test PCB board, detects the output voltage, and measures the size of the foolproof resistor on each test PCB board according to Ohm's law;

[0010] Step S3, test as needed or terminated: if the test machine detects that the sizes of each anti-foolproofing resistor are within the preset range, the test continues; if the test machine detects that the sizes of two or more anti-foolproofing resistors are no longer within the preset range, the test is terminated, reminding the tester to check whether the connecting wire is accurately connected to the device under test, and return to step S2 after reconnecting.

[0011] By adopting the above technical solution, when performing the test, the size of the anti-fool resistance in the test PCB board is detected by the test machine. When the sizes of all the anti-fool resistances are within the preset range, the test is carried out normally. If there is an anti-fool resistance whose resistance value is not within the preset range, the test is automatically stopped to remind the staff to reconnect the wires, which effectively prevents the test results from being affected by wiring errors, thereby ensuring the test efficiency.

[0012] The present invention is further configured as follows: a connection socket is provided on the test PCB board, a connection plug that matches the connection socket is provided on one end of the connection line, and a control component for controlling the connection plug to be plugged in and out of the connection socket is also included.

[0013] The present invention is further configured as follows: the control component includes a lifting plate arranged above the test motherboard, and also includes a first driving member for driving the lifting plate to rise and fall, and the connecting plug is arranged on the lower surface of the lifting plate and is located directly above the connecting socket.

[0014] The present invention is further configured as follows: vertical guide rods are fixedly connected to both ends of the bottom of the lifting plate, the test mother board is provided with guide grooves for the guide rods to pass through and be slidably connected, the first driving member is specifically a first cylinder arranged on one side of the frame, the piston rod of the first cylinder is vertically upward and its end is fixedly connected to the lifting plate.

[0015] The present invention is further configured as follows: a plurality of positioning sleeves corresponding to the respective connection sockets are arranged on the lower surface of the lifting plate, and the connection plug is arranged in the positioning sleeves.

[0016] The present invention is further configured as follows: a vertically arranged sliding rod is arranged on the top of the connecting plug, a sliding groove for the sliding rod to be lifted and lowered is opened on the lifting plate, and a driving component for driving the sliding rod to be lifted and lowered is also included.

[0017] The present invention is further configured as follows: the top end of the sliding rod extends out of the surface of the lifting plate, the driving assembly includes a top plate fixedly connected to the top of one side wall of the sliding rod, the lower surface of the top plate is fixedly connected to the sliding rod, the surface of the lifting plate is provided with a sliding groove for the sliding rod to be slidably connected, a spring is fixedly connected between the bottom end of the sliding groove and the end of the sliding rod, and the driving assembly also includes a second driving member for driving the sliding rod and the sliding rod to descend.

[0018] The present invention is further configured as follows: the second driving member includes a driving rod arranged on the surface of the lifting plate, the driving rod is slidably connected to the surface of the lifting plate along the length direction of the lifting plate, a plurality of triangular grooves corresponding to the sliding rods are provided at the bottom of the driving rod, the triangular grooves include a first inclined surface and a vertical surface, a second inclined surface parallel to and abutting against the first inclined surface is provided at the top of one side wall of the sliding rod, and a second cylinder for pushing the driving rod is provided at one end of the surface of the lifting plate.

[0019] The present invention is further configured as follows: limit strips are arranged on the surface of the lifting plate at both sides of the driving rod.

[0020] The present invention has the following beneficial effects: 1. When performing testing, the size of the fool-proofing resistor in the test PCB board is detected by a testing machine. When the sizes of all the fool-proofing resistors are within a preset range, the testing work is carried out normally. If there is a fool-proofing resistor whose resistance value is not within the preset range, the testing work is automatically stopped to remind the staff to reconnect the wires, thereby effectively preventing the test results from being affected by wiring errors, thereby ensuring the testing efficiency.

[0021] 2. Through the control component, the connection plug and the connection socket can be automatically connected and disconnected, reducing the manual repeated plugging and unplugging work and improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 is a schematic diagram of the three-dimensional structure of this embodiment;

[0023] Figure 2 This is a schematic diagram of the structure of the test PCB board in this embodiment;

[0024] Figure 3 is a schematic cross-sectional structure diagram of the driving assembly of this embodiment;

[0025] Figure 4 for Figure 3 The structural diagram of the middle A part;

[0026] Figure 5 This is a schematic diagram of the exploded structure of the driving assembly of this embodiment;

[0027] Figure 6 Schematic diagram of the structure of the sliding rod in this embodiment.

[0028] Description of the drawings: 1. Bracket; 2. Test motherboard; 3. Test PCB board; 4. Anti-fool resistor; 5. Connection socket; 6. Connection plug; 7. Lifting plate; 8. Guide rod; 9. First cylinder; 10. Positioning sleeve; 11. Sliding rod; 12. Top plate; 13. Sliding rod; 14. Spring; 15. Driving rod; 16. Triangular groove; 161. First inclined plane; 162. Vertical plane; 17. Second inclined plane; 18. Second cylinder. DETAILED DESCRIPTION

[0029] The present invention is further described in detail below in conjunction with the accompanying drawings.

[0030] The same parts are denoted by the same reference numerals. It should be noted that the words "front", "rear", "left", "right", "upper" and "lower" used in the following description refer to directions in the drawings, and the words "bottom" and "top", "inner" and "outer" refer to directions toward or away from the geometric center of a specific component, respectively. Specific embodiment 1:

[0032] As shown in the figure, a semiconductor chip testing device with a fool-proofing function and a testing method thereof include a wiring device and a testing machine (not shown in the figure), the wiring device includes a bracket 1, a horizontal testing motherboard 2 is arranged on the top of the bracket 1, a plurality of testing PCB boards 3 are arranged on the surface of the testing motherboard 2, each testing PCB board 3 is connected to each test socket of the testing machine through a flat cable (not shown in the figure), the testing PCB board 3 is connected to the device to be tested through a connecting line (not shown in the figure), and fool-proofing resistors 4 with different resistances are respectively connected in series in the circuit of each testing PCB board 3, and a detection device (not shown in the figure) for detecting the size of each fool-proofing resistor is arranged in the test connection.

[0033] The test machine outputs a rated current to each test PCB board, and detects the voltage in each test PCB board through the detection device, and obtains the size of the fool-proof resistor 4 after calculation (the detection device and the calculation method are both existing technologies and are not described in detail in this embodiment), thereby ensuring that the test board is accurately connected to the device under test. After ensuring that the wiring is correct, the test work is carried out.

[0034] The test PCB board 3 is provided with a connection socket 5, one end of the connection line is provided with a connection plug 6 matched with the connection socket, and also includes a control component for controlling the connection plug 6 to be plugged in and out of the connection socket. After a test is completed, the control component controls the connection plug 6 to be disconnected from the connection socket, and in the next test, the connection plug 6 is controlled to be reconnected with the connection socket to ensure the accuracy of each test result.

[0035] The control assembly includes a lifting plate 7 disposed above the test motherboard, and also includes a first driving member for driving the lifting plate 7 to rise and fall. The connection plug 6 is disposed on the lower surface of the lifting plate 7 and is located directly above the connection socket. Vertical guide rods 8 are fixedly connected to both ends of the bottom of the lifting plate 7. The test motherboard 2 is provided with a guide groove for the guide rod 8 to pass through and slide to ensure the stability of the lifting plate 7 when it is raised and lowered.

[0036] The first driving member is specifically a first cylinder 9 disposed on one side of the frame, the piston rod of the first cylinder 9 is vertically upward and its end is fixedly connected to the lifting plate 7. The lifting plate 7 is lifted and lowered by the first cylinder 9, thereby controlling the plugging and unplugging of the connecting plug 6 and the connecting socket.

[0037] The lower surface of the lifting plate 7 is provided with a plurality of positioning sleeves 10 corresponding to the respective connection sockets, and the connection plug is arranged in the positioning sleeves 10. When the lifting plate 7 is lowered, the positioning sleeves 10 are sleeved on the peripheral side of the connection socket, thereby ensuring that the connection plug 6 can be accurately inserted into the connection socket.

[0038] A vertically arranged sliding rod 11 is arranged on the top of the connection plug 6, and a sliding groove for the sliding rod 11 to be lifted and lowered is provided on the lifting plate 7, and a driving assembly for driving the sliding rod 11 to be lifted and lowered is also included. When the first driving member drives the lifting plate 7 to descend, and the positioning sleeve 10 is sleeved on the connection socket, the driving assembly drives the sliding rod 11 to descend, so that the connection plug 6 is inserted into the connection socket, so as to ensure that the connection plug 6 can be accurately and stably inserted into the connection socket.

[0039] The top of the sliding rod 11 extends out of the surface of the lifting plate 7, and the driving assembly includes a top plate 12 fixedly connected to the top of one side wall of the sliding rod 11, and a sliding rod 13 is fixedly connected to the lower surface of the top plate 12. A sliding groove for sliding connection of the sliding rod 13 is provided on the surface of the lifting plate 7, and a spring 14 is fixedly connected between the bottom end of the sliding groove and the end of the sliding rod 13. The driving assembly also includes a second driving member for driving the sliding rod 11 and the sliding rod 13 to descend. When the second driving member drives the sliding rod 11 to descend, the sliding rod 13 descends, so that the spring 14 is compressed, so that the connecting plug 6 can be stably inserted into the connecting socket.

[0040] The second driving member includes a driving rod 15 disposed on the surface of the lifting plate 7, and the driving rod 15 is slidably connected to the surface of the lifting plate 7 along the length direction thereof, and the surface of the lifting plate 7 is provided with limit bars 19 on both sides of the driving rod 15. The bottom of the driving rod 15 is provided with a plurality of triangular grooves 16 corresponding to the sliding rod 11, and the triangular grooves 16 include a first inclined surface 161 and a vertical surface 162, and a second inclined surface 17 parallel to and abutting against the first inclined surface 161 is disposed on the top of one side wall of the sliding rod 11, and a second cylinder 18 for pushing the driving rod 15 is disposed at one end of the surface of the lifting plate 7, and the end of the piston rod thereof is fixedly connected to one end of the driving rod 15. The second cylinder 18 pushes the driving rod 15 to slide, and under the action of the first inclined surface 161 and the second inclined surface 17, drives the sliding rod 11 to slide downward.

[0041] After the test is completed, the first cylinder drives the lifting plate 7 to reset, and the second cylinder 18 drives the driving rod 15 to reset, and under the elastic force of the spring 14, drives the sliding rod 13 and the sliding rod 11 to reset.

[0042] Specific embodiment 2: The testing method of the testing device comprises the following steps:

[0043] Step S1, test preparation: After connecting one end of each connecting line to a device to be tested, disconnect the other end of the connecting line from the PCB board 3 to be tested and reconnect;

[0044] Step S2, foolproof detection: the test machine outputs a fixed current to each test PCB board 3, and detects the output voltage, and measures the size of the foolproof resistor 4 on each test PCB board 3 according to Ohm's law;

[0045] Step S3, the test is terminated as needed: if the test machine detects that the sizes of each anti-foolproofing resistor 4 are within the preset range, the test continues; if the test machine detects that the sizes of two or more anti-foolproofing resistors 4 are no longer within the preset range, the test is terminated, reminding the tester to check whether the connecting line is accurately connected to the device under test, and return to step S2 after reconnecting.

[0046] By detecting the foolproof resistor 4, it is possible to quickly determine whether each test PCB board 3 is correctly connected to each device under test.

[0047] The specific embodiments are merely explanations of the present invention and are not limitations of the present invention. After reading this specification, those skilled in the art may make modifications to the embodiments without any creative contribution as needed. However, such modifications are protected by the patent law as long as they are within the scope of the claims of the present invention.

Claims

1. A semiconductor chip testing device with foolproof function and a testing method thereof, comprising a wiring device and a testing machine, characterized in that: The wiring device comprises a bracket (1), a horizontal test motherboard (2) is arranged on the top of the bracket (1), a plurality of test PCB boards (3) are arranged on the surface of the test motherboard (2), each of the test PCB boards (3) is connected to each test socket of the test machine via a flat cable, the test PCB board (3) is connected to the device to be tested via a connecting line, and a foolproof resistor (4) with different resistances is respectively connected in series in the circuit of each of the test PCB boards (3); The testing method comprises the following steps: Step S1, test preparation: After connecting one end of each connecting line to a device to be tested, disconnect the other end of the connecting line from the PCB board (3) to be tested and reconnect; Step S2, foolproof detection: the test machine outputs a fixed current to each test PCB board (3), detects the output voltage, and calculates the size of the foolproof resistor (4) on the PCB board (3); Step S3, the test is terminated as needed: if the test machine detects that the values ​​of the foolproof resistors (4) are all within the preset range, the test continues; If the test machine detects that the sizes of two or more foolproof resistors (4) are no longer within the preset range, the test is terminated, and the tester is reminded to check whether the connecting wire is correctly connected to the device under test, and return to step S2 after reconnecting.

2. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 1, characterized in that: The test PCB board (3) is provided with a connection socket (5), one end of the connection line is provided with a connection plug (6) matched with the connection socket (5), and also includes a control component for controlling the connection plug (6) to be plugged in and out of the connection socket (5).

3. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 2, characterized in that: The control component comprises a lifting plate (7) arranged above the test motherboard (2), and also comprises a first driving member for driving the lifting plate (7) to rise and fall, and the connecting plug (6) is arranged on the lower surface of the lifting plate (7) and is located directly above the connecting socket (5).

4. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 3, characterized in that: The two ends of the bottom of the lifting plate (7) are fixedly connected with vertical guide rods (8); the test motherboard (2) is provided with a guide groove for the guide rod (8) to pass through and be slidably connected; the first driving member is specifically a first cylinder (9) arranged on one side of the frame; the piston rod of the first cylinder (9) is vertically upward and its end is fixedly connected to the lifting plate (7).

5. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 4, characterized in that: The lower surface of the lifting plate (7) is provided with a plurality of positioning sleeves (10) corresponding to the respective connection sockets (5), and the connection plug (6) is arranged in the positioning sleeves (10).

6. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 5, characterized in that: A vertically arranged sliding rod (11) is arranged on the top of the connecting plug (6), a sliding groove for the sliding rod (11) to be lifted and lowered is provided on the lifting plate (7), and a driving component for driving the sliding rod (11) to be lifted and lowered is also included.

7. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 6, characterized in that: The top end of the sliding rod (11) extends out of the surface of the lifting plate (7); the driving assembly comprises a top plate (12) fixedly connected to the top of a side wall of the sliding rod (11); a sliding rod (13) is fixedly connected to the lower surface of the top plate (12); a sliding groove for slidingly connecting the sliding rod (13) is provided on the surface of the lifting plate (7); a spring (14) is fixedly connected between the bottom end of the sliding groove and the end of the sliding rod (13); and the driving assembly further comprises a second driving member for driving the sliding rod (11) and the sliding rod (13) to descend.

8. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 7, characterized in that: The second driving member comprises a driving rod (15) arranged on the surface of the lifting plate (7), the driving rod (15) being slidably connected to the surface of the lifting plate (7) along the length direction thereof, a plurality of triangular grooves (16) corresponding to the sliding rod (11) being provided at the bottom of the driving rod (15), the triangular grooves (16) comprising a first inclined surface (1601) and a vertical surface (1602), a second inclined surface (17) parallel to and abutting against the first inclined surface (1601) being provided at the top of a side wall of the sliding rod (11), and a second cylinder (18) for pushing the driving rod (15) being provided at one end of the surface of the lifting plate (7).

9. The semiconductor chip testing device with foolproof function and the testing method thereof according to claim 8, characterized in that: Limiting strips (19) are arranged on the surface of the lifting plate (7) at both sides of the driving rod (15).

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