Automatic detection method for material uniformity and computer equipment

Abstract

The invention discloses an automatic detection method for material uniformity and computer equipment, and the method comprises the following steps: setting voltage, current and exposure time conditions of an X-ray emitter, and setting an observation area and a uniformity judgment standard of a to-be-detected material; directly irradiating X-rays on the surface of the detector to obtain an empty field detection image pixel point gray value: placing a material to be detected on the surface of the detector, and irradiating X-rays on the surface of the detector to obtain a full field detection image pixel point gray value; according to the pixel gray value of the empty field detection image and the pixel gray value of the full field detection image, calculating and obtaining a variable coefficient of the to-be-detected material in the observation area; and comparing the variable coefficient of the observation area with the set uniformity judgment standard, judging that the material uniformity meets the requirement when the variable coefficient is lower than the judgment standard, and otherwise, judging that the material uniformity is unqualified. According to the method, the compactness, thickness consistency and the like of different areas of the material can be quickly detected and judged.

Description

Technical Field

[0001] The invention belongs to the technical field of automated detection, and in particular relates to an automated detection method and computer equipment for material uniformity. Background Art

[0002] In order to adapt to the high-efficiency production needs of digital transformation of enterprises, enterprises are in urgent need of a set of automated testing methods and systems with fast detection speed, high precision and low cost, so as to facilitate high-quality control of incoming materials from suppliers. For example, detection imaging equipment in the fields of medical, security, industrial control, etc. usually involves applications including but not limited to metal sheets, carbon fiber sheets, assembly foam, glass, metal coatings and other materials, and auxiliary equipment to improve appearance, mechanical properties, heat dissipation performance, detection imaging, etc. Enterprises need to control and inspect the uniformity of the above materials to achieve the purpose of improving equipment performance.

[0003] The existing technology usually uses X-ray, sound wave and other detection equipment to detect the above materials, obtains the images generated after the transmission and reflection of X-rays, sound waves, etc., and judges whether there are defects inside the above materials through manual or machine recognition of the images. This technical solution can judge whether there are defects inside the material within a certain range through manual and machine recognition of the images generated after the transmission and reflection of X-rays, sound waves, etc., but it is difficult to judge the density and thickness consistency of different areas of the material. Summary of the invention

[0004] The purpose of the present invention is to provide an automated detection method for material uniformity, computer equipment, computer-readable storage medium and computer program product, which can quickly test and judge the density and thickness consistency of different areas of the material.

[0005] In order to achieve the above object, one aspect of the present invention provides an automated detection method for material uniformity, comprising: The detection condition setting step includes setting the voltage, current and exposure time conditions of the X-ray emitter, and setting the observation area and uniformity judgment criteria of the material to be tested; The empty field test steps are as follows: according to the set voltage, current and exposure time conditions, the X-ray emitter is used to directly irradiate the detector surface with X-rays, and a transmission image is obtained as the empty field detection image. The pixel grayscale value of the empty field detection image is calculated: The full-field test step is to place the material to be tested on the detector surface according to the set voltage, current and exposure time conditions, use the X-ray emitter to irradiate the detector surface with X-rays, obtain a transmission image as a full-field detection image, and calculate the pixel grayscale value of the full-field detection image; The variation coefficient calculation step is to calculate the variation coefficient of the material to be tested in the observation area according to the pixel gray value of the empty field detection image and the pixel gray value of the full field detection image. CV :

[0006] in, N is the total number of pixels in the observation area, For observation area i The attenuation coefficient of the pixel position u Transmission distance d The product of is the attenuation coefficient of all pixel positions in the observation area u Transmission distance d The mean of the products of , in, is the gray value of the pixel at the (x, y) coordinate position of the empty field detection image, is the gray value of the pixel at the (x, y) coordinate position of the full-field detection image; The uniformity determination step is to use the coefficient of variation of the observation area CV Compared with the set uniformity judgment standard, when the coefficient of variation CV When the value is lower than the uniformity judgment standard, the material uniformity is judged to meet the requirements; otherwise, the material uniformity is judged to be unqualified.

[0007] Preferably, in the empty field test step, the pixel grayscale value of the empty field detection image is calculated according to the following formula:

[0008] in: is the X-ray dose received by the detector at the pixel position with (x, y) coordinates in the empty field test, k is a constant.

[0009] Preferably, in the full-field test step, the pixel grayscale value of the full-field detection image is calculated according to the following formula:

[0010] in: It is the X-ray dose received by the detector at the pixel position with (x, y) coordinates in the full-field test.

[0011] Preferably, in the detection condition setting step, the interval time for the next detection is also set, and in the uniformity determination step, after determining whether the material uniformity is qualified, the test of the next material to be tested is started after the set interval time.

[0012] Preferably, the material includes metal sheet, carbon fiber sheet, assembled foam, glass and metal coating.

[0013] Another aspect of the present invention provides a computer device, including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the steps of the above method.

[0014] Another aspect of the present invention provides a computer-readable storage medium having a computer program stored thereon, which implements the steps of the above method when executed by a processor.

[0015] Another aspect of the present invention provides a computer program product, comprising a computer program, which implements the steps of the above method when executed by a processor.

[0016] According to the automated material uniformity detection method, computer equipment, computer-readable storage medium and computer program product of the above aspects of the present invention, it is possible to quickly inspect and determine the density, thickness consistency, etc. of different regions of the material. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solution of the present invention, the following briefly introduces the drawings used in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative work: Figure 1 is a flow chart of an automated detection method for material uniformity according to an embodiment of the present invention; Figure 2 It is a structural diagram of a computer device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] An embodiment of the present invention provides an automated detection method for material uniformity, such as Figure 1 As shown, the automated material uniformity detection method according to the embodiment of the present invention includes steps S1 to S5.

[0020] Step S1 is a detection condition setting step. In step S1, the voltage, current, and exposure time conditions of the X-ray emitter are set, and parameters such as the observation area and uniformity judgment standard of the material to be tested are set.

[0021] Specifically, according to the type of material to be tested, the following test conditions are mainly set: (1) Set the voltage, current and exposure time of the X-ray emitter; (2) Set up the observation area for the material to be tested; (3) Set the criteria for determining the uniformity of the material to be tested, that is, under the conditions set in (1) and in the observation area set in (2), the coefficient of variation obtained by calculation in the subsequent steps CV Failure to meet required thresholds; (4) Set control parameters such as the interval time for the next detection.

[0022] Step S2 is an empty field test step. In step S2, according to the set detection conditions, X-rays are used to directly irradiate the detector to obtain an empty field detection image.

[0023] Specifically, according to the voltage, current and exposure time conditions of the X-ray emitter set in step S1, X-rays are used to directly irradiate the detector surface without any obstacles in the middle and without placing the material to be tested (hereinafter referred to as empty field test), and the X-ray detection image (empty field detection image) obtained by the empty field test is used as the basic reference image for subsequent judgment.

[0024] The gray value of the pixel point in the empty field detection image is calculated according to the following formula (1):

[0025] in: is the X-ray dose received by the detector at the pixel position with (x, y) coordinates in the empty field test, is the gray value of the pixel at the (x, y) coordinate position of the empty field detection image, k is a constant.

[0026] The step is S3, a full-field test step. In step S3, according to the set detection conditions, the material to be tested is placed on the detector surface, irradiated with X-rays, and a full-field detection image is obtained.

[0027] Specifically, according to the voltage, current and exposure time conditions of the X-ray emitter set in step S1, the material to be tested is placed on the detector surface, and the detector surface is irradiated with X-rays (hereinafter referred to as full-field test).

[0028] It can be learned that:

[0029] in: is the X-ray dose received by the detector at the pixel position of (x, y) coordinates after being blocked and attenuated by the material in the full-field test. is the grayscale value of the pixel at the (x, y) coordinate of the full-field detection image. u is the comprehensive attenuation coefficient, d is the X-ray transmission distance.

[0030] And, the pixel grayscale value of the full-field detection image is calculated according to the following formula (3):

[0031] in: is the grayscale value of the pixel at the (x, y) coordinate position of the full-field detection image.

[0032] Step S4 is a step of calculating the coefficient of variation. In step S4, the coefficient of variation CV of the material to be tested in the observation area is calculated based on the grayscale values ​​of the pixels in the empty-field detection image and the grayscale values ​​of the pixels in the full-field detection image.

[0033] Specifically, the X-ray detection images obtained by the empty field test in step S2 and the full field test in step S3 are processed to calculate the pixel points corresponding to different areas of the material. ud The coefficient of variation CV The specific implementation process is as follows: According to formulas (1), (2) and (3), we can obtain:

[0034] Therefore, after dividing the grayscale values ​​of the empty field detection image and the full field detection image and taking the logarithm, we can obtain all the pixels corresponding to the observation area. ud , and then according to all the pixels ud , find the coefficient of variation CV , the specific calculation formula is as follows:

[0035] in: N is the total number of pixels in the observation area, For all pixels in the observation area ud The mean of For observation area i Pixels ud value.

[0036] Step S5 is a uniformity determination step. In step S5, based on the coefficient of variation of the observation area obtained in step S4, CV , and the step S1 preset CVWhen the material is below the threshold, it is judged that the material uniformity meets the requirements, and the material is transferred to the qualified product placement area, and the next material to be tested is started after the interval time; when it is equal to or higher than the threshold, it is judged that the material uniformity is unqualified, and the material is transferred to the unqualified product placement area, and the next material to be tested is started after the interval time.

[0037] The following is a specific example to illustrate the effect of the automated material uniformity detection method of the embodiment of the present invention. The method of the embodiment of the present invention is used to detect the uniformity of a 2.5mm thick glass. The detection conditions are set as follows: the X-ray emitter voltage is 28KV, the emitter current is 45mA, the emitter exposure time is 300ms, the observation area is set to the gray value data of the area covered by the entire glass, and the corresponding pixel points are set. ud The coefficient of variation CV The threshold for not meeting the requirements is 1.30%, etc.

[0038] The first test results:

[0039] The first test obtained CV It is 1.27%, which is lower than the set threshold of 1.33%. It is considered that the uniformity of the tested material meets the requirements.

[0040] Then, the glass was polished with sandpaper to increase the unevenness of its surface, and the test was performed again. CV They are 1.34%, 1.35% and 1.34% respectively, indicating that the uniformity of the glass after sandpaper polishing does not meet the requirements:

[0041] The above implementation cases not only verify the feasibility of the method of the embodiment of the present invention, but also effectively prove that the method of the present invention has extremely high test accuracy.

[0042] In summary, the automated material uniformity detection method of the embodiment of the present invention uses an X-ray detection device to perform transmission imaging on the material, and obtains the attenuation coefficient of each pixel position corresponding to the X-ray passing through the material by changing the gray value data of the pixel point of the transmission image. u and transmission distance d The product of ud , and then according to the position of each pixel corresponding to the material in the observation area ud , calculate and obtain the corresponding pixel points of different areas of the material ud The coefficient of variation CV , through the coefficient of variation CVComprehensively judge the uniformity of the material in different areas, so as to judge the density, thickness consistency, internal defects, etc. of the material in different areas.

[0043] The present invention can effectively solve the problems in the prior art that are difficult to achieve in terms of fast inspection and judgment of the density, thickness consistency, internal defects, etc. of different areas of materials including but not limited to metal plates, carbon fiber plates, assembled foam, glass, metal coatings, etc., and provides a set of fast, high-precision, and low-cost solutions for enterprises to control and inspect the uniformity of incoming materials, and has good engineering application value and huge economic and social benefits.

[0044] An embodiment of the present invention further provides a computer device, which may be a server, and its internal structure diagram may be as shown in FIG. Figure 2 As shown. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store operating parameter data of each framework. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, the steps of the method of the embodiment of the present invention are implemented.

[0045] Those skilled in the art will understand that Figure 2 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0046] An embodiment of the present invention further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the method of the embodiment of the present invention are implemented.

[0047] An embodiment of the present invention further provides a computer program product, including a computer program, which implements the steps of the method of the embodiment of the present invention when executed by a processor.

[0048] The above description is only by way of illustration of certain exemplary embodiments of the present invention. It is undoubted that those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. An automated method for detecting material uniformity, characterized in that: include: The detection condition setting step includes setting the voltage, current and exposure time conditions of the X-ray emitter, and setting the observation area and uniformity judgment criteria of the material to be tested; The empty field test steps are as follows: according to the set voltage, current and exposure time conditions, the X-ray emitter is used to directly irradiate the detector surface with X-rays, and a transmission image is obtained as the empty field detection image. The pixel grayscale value of the empty field detection image is calculated: The full-field test step is to place the material to be tested on the detector surface according to the set voltage, current and exposure time conditions, use the X-ray emitter to irradiate the detector surface with X-rays, obtain a transmission image as a full-field detection image, and calculate the pixel grayscale value of the full-field detection image; The variation coefficient calculation step is to calculate the variation coefficient of the material to be tested in the observation area according to the pixel gray value of the empty field detection image and the pixel gray value of the full field detection image. CV : in, N is the total number of pixels in the observation area, For observation area i The attenuation coefficient of the pixel position u Transmission distance d The product of is the attenuation coefficient of all pixel positions in the observation area u Transmission distance d The mean of the products of ， in, is the gray value of the pixel at the (x, y) coordinate position of the empty field detection image, is the gray value of the pixel at the (x, y) coordinate position of the full-field detection image; The uniformity determination step is to use the coefficient of variation of the observation area CV Compared with the set uniformity judgment standard, when the coefficient of variation CV When the value is lower than the uniformity judgment standard, the material uniformity is judged to meet the requirements; otherwise, the material uniformity is judged to be unqualified.

2. The method according to claim 1, characterized in that In the empty field test step, the pixel grayscale value of the empty field detection image is calculated according to the following formula: in: is the X-ray dose received by the detector at the pixel position with (x, y) coordinates in the empty field test, k is a constant.

3. The method according to claim 2, characterized in that In the full-field test step, the pixel grayscale value of the full-field detection image is calculated according to the following formula: in: It is the X-ray dose received by the detector at the pixel position with (x, y) coordinates in the full-field test.

4. The method according to any one of claims 1 to 3, characterized in that In the detection condition setting step, the interval time for the next detection is also set. In the uniformity determination step, after determining whether the material uniformity is qualified, the test of the next material to be tested is started after the set interval time.

5. The method according to any one of claims 1 to 3, characterized in that The materials include metal sheets, carbon fiber sheets, assembled foam, glass and metal coatings.

6. A computer device comprising a memory, a processor and a computer program stored in the memory, characterized in that: The processor executes the computer program to implement the steps of the method according to any one of claims 1 to 5.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

8. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

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