A method and system for determining repetitive peak isolation voltage for optical isolation devices

Abstract

This invention discloses a method and system for determining the repetitive peak isolation voltage of optical isolators, comprising: statistically analyzing and estimating the distribution parameters of the lifetime termination time data of the optical isolator using a Weibull distribution to obtain a fitted probability map; based on the fitted probability map, obtaining the failure time at a specified failure rate under different test voltages; based on the failure time at the specified failure rate under different test voltages, obtaining a lifetime prediction map of the optical isolator under different specific voltages; and based on the lifetime prediction map of the optical isolator under different specific voltages, analyzing the lifetime of the device under a specific repetitive peak isolation voltage. This invention proposes a data analysis technique to obtain an accurate V IORM The value and predicted lifetime make the lifetime prediction of optical isolators more accurate in different scenarios.

Description

Technical Field

[0001] This invention belongs to the field of electronic component testing and reliability assessment, and specifically relates to a method and system for determining the repetitive peak isolation voltage for optical isolation devices. Background Technology

[0002] Optical isolators are devices that use optical signals for electrical isolation, and are widely used in communications, industrial control, medical equipment, and other fields. Their main function is to achieve electrical isolation through optical signal transmission, preventing damage to sensitive electronic equipment from high voltage or current. Optical isolators typically consist of light-emitting diodes (LEDs) and phototransistors, achieving electrical isolation through optical signal transmission. Currently, there is a lack of methods for determining the repetitive peak isolation voltage for optical isolators.

[0003] Currently, there is a lack of unified standards for end-of-life testing of optical isolators, and the two main methods used are accelerated aging testing and cycle life testing.

[0004] Accelerated aging test: This method accelerates the aging process of optical isolators by applying harsher environments (such as high temperature and high humidity) than normal operating conditions, thereby predicting their lifespan in a shorter time. This method can effectively simulate the aging process of optical isolators during long-term use, but it requires precise control of test conditions and parameters.

[0005] Cyclic life test: Repeatedly perform operating cycles on the optical isolator until it fails. For example, repeatedly perform optical power switching operations on the optical isolator to simulate operating conditions in actual use. This method can directly reflect the lifespan of the optical isolator in actual use, but the test time is relatively long. Summary of the Invention

[0006] To address the shortcomings of existing technologies in end-of-life testing of optical isolators, this invention proposes a method and system for determining the repetitive peak isolation voltage of optical isolators, and designs an analytical method for end-of-life testing. By analyzing the data obtained from the end-of-life test, the lifespan of the device under a specific repetitive peak isolation voltage is determined, thereby providing a scientific basis for product design and quality control, and ensuring the long-term stability and safety of optical isolators in practical applications.

[0007] To achieve the above objectives, the present invention provides the following solution:

[0008] A method for determining the repetitive peak isolation voltage for optically isolated devices includes the following steps:

[0009] The Weibull distribution was used to perform statistical analysis and distribution parameter estimation on the lifetime termination time data of optically isolated devices, and a fitting probability plot was obtained.

[0010] Based on the fitted probability plot, the failure time of the specified failure rate under different test voltages is obtained;

[0011] Based on the failure time at specified failure rates under different test voltages, a lifetime prediction chart for optical isolators under different specific voltages is obtained;

[0012] Based on the lifetime prediction charts of opto-isolators under different specific voltages, the lifetime of the device under a specific repetitive peak isolation voltage is analyzed.

[0013] Preferably, the method for obtaining a fitted probability map by statistically analyzing and estimating the distribution parameters of the lifetime end-of-life time data of optically isolated devices using the Weibull distribution includes:

[0014] By using failure time data at three different voltages, the distribution parameters are estimated using the least squares method or the maximum likelihood estimation method, and the shape and scale parameters are obtained.

[0015] The fitted Weibull probability density function is obtained based on the estimated values ​​of shape and scale parameters;

[0016] The fitting effect was verified by plotting a Weibull probability plot.

[0017] Preferably, the method for estimating the distribution parameters and obtaining the shape and scale parameters by using failure time data at three different preset voltages and employing the least squares method or the maximum likelihood estimation method includes:

[0018]

[0019] Preferably, the method for obtaining the lifetime prediction curve of the optical isolator under different specific voltages based on the failure time of the specified failure rate under different test voltages includes: selecting three sets of failure times under different voltages and then fitting the lifetime prediction curves under different voltages.

[0020] Preferably, the method for fitting lifetime prediction curves under different voltages after selecting three sets of failure times includes:

[0021] For SiO2-type optical isolators, an exponential model is used:

[0022] L = ce kV

[0023] Where L is the lifetime, i.e. the failure time based on the specified failure rate under different test voltages, V is the voltage, and c and k are parameters to be determined;

[0024] Using an exponential model, three equations were obtained from three different sets of experimental data. These equations were then combined pairwise to yield three different K values:

[0025]

[0026] After the value of k is determined, the parameter c is subjected to exponential fitting using three sets of data to obtain the final three sets of lifetime curves.

[0027] Select the manufacturer's claimed lifespan from the three sets of lifespan curves and find the corresponding voltage V. ware out The fitting result with the minimum voltage is selected.

[0028] Preferably, the method for fitting lifetime prediction curves under different voltages after selecting three sets of failure times at different voltages further includes:

[0029] For non-SiO2 compound optical isolators, a nonlinear model is applicable.

[0030] L = ce kV-n

[0031] Where L is the lifetime, i.e. the failure time based on the specified failure rate under different test voltages, V is the voltage, and c, n, and k are parameters to be determined.

[0032] Using a nonlinear model, the value of n is obtained by solving a system of equations derived from fitting data under three different voltages, resulting in a nonlinear equation, expressed as:

[0033]

[0034] After obtaining the specific value of parameter n, the lifetime curve is obtained by performing nonlinear fitting on parameters c and k.

[0035] Select the manufacturer's claimed lifespan from the lifespan curve and find the corresponding voltage V. ware out The fitting result with the minimum voltage is selected.

[0036] The present invention also discloses a system for determining the repetitive peak isolation voltage for optical isolation devices, comprising: an estimation module, a selection module, a fitting module, and an analysis module;

[0037] The estimation module is used to perform statistical analysis and distribution parameter estimation on the lifetime end-of-life time data of optically isolated devices using the Weibull distribution, and obtain a fitting probability map;

[0038] The selection module is used to obtain the failure time of a specified failure rate under different test voltages based on the fitted probability map.

[0039] The fitting module is used to obtain a lifetime prediction map of the optical isolator under different specific voltages based on the failure time of a specified failure rate under different test voltages.

[0040] The analysis module is used to analyze the lifetime of the device under a specific repetitive peak isolation voltage based on the lifetime prediction chart of the opto-isolator under different specific voltages.

[0041] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0042] Accurate data analysis: This invention introduces Weibull distribution and maximum likelihood estimation methods, as well as mathematical models for different materials, into the data analysis of end-of-life tests of optically isolated devices, thereby improving the accuracy of data processing and result analysis and ensuring the reliability of lifetime prediction.

[0043] The results are verified to be reliable: This invention verifies the accuracy of the data analysis results through goodness-of-fit tests and Weibull probability plots, ensuring the reliability of the test results. Attached Figure Description

[0044] To more clearly illustrate the technical solution of the present invention, the drawings used in the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0045] Figure 1 This is a schematic flowchart of a method for determining the repetitive peak isolation voltage for an optical isolation device according to an embodiment of the present invention. Detailed Implementation

[0046] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0047] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0048] Example 1

[0049] V IORM Maximum Repetitive Peak Isolation Voltage (MRV) is an important voltage parameter that represents the device's ability to isolate voltage.

[0050] V IORM This refers to the maximum repetitive peak isolation voltage that a device can withstand during its lifetime. This is a peak voltage specified by the manufacturer, indicating the device's specific withstand capability under repetitive peak voltages. VIORM This reflects the maximum periodic voltage that the device can safely withstand under normal operating conditions. This includes all repetitive transient voltages, but excludes non-repetitive transient voltages.

[0051] In the end-of-life test, the optical isolator is subjected to accelerated stress test (such as time-dependent dielectric breakdown, TDDB), a voltage higher than the operating isolation voltage is applied, the breakdown time is recorded, and extrapolated to the voltage-time relationship graph to determine the predicted lifetime at different voltages.

[0052] The purpose of this invention is to address the shortcomings of existing technologies in optical isolator end-of-life testing by proposing a data analysis technique to obtain accurate V... IORM The values ​​and predicted lifetimes enable more accurate lifetime predictions for optical isolators in different scenarios. Specific objectives include:

[0053] Improve data analysis methods: Introduce Weibull distribution and maximum likelihood estimation, and perform different parameter fittings on different models to improve the accuracy of data processing and result analysis.

[0054] Standardized testing methods: Establish unified data processing standards and procedures to ensure that test results under different testing methods and conditions are comparable and consistent.

[0055] By achieving the above objectives, this invention will significantly improve the accuracy of optical isolator end-of-life testing.

[0056] like Figure 1 As shown, the present invention provides a method for determining the repetitive peak isolation voltage for optical isolation devices, comprising the following steps:

[0057] The Weibull distribution was used to perform statistical analysis and distribution parameter estimation on the lifetime termination time data of optically isolated devices, and a fitting probability plot was obtained.

[0058] Based on the fitted probability plot, the failure time of the specified failure rate under different test voltages is obtained;

[0059] Based on the failure time at specified failure rates under different test voltages, a lifetime prediction chart for optical isolators under different specific voltages is obtained;

[0060] Based on the lifetime prediction charts of opto-isolators under different specific voltages, the lifetime of the device under a specific repetitive peak isolation voltage is analyzed.

[0061] The specific implementation process is as follows:

[0062] First, the Weibull distribution is used to perform statistical analysis and estimate the distribution parameters of the lifespan termination time data. The probability distribution function of the Weibull distribution is as follows:

[0063]

[0064] In the life test application scenario, x is the failure time of the device during the test, λ>0 is the scaling parameter, and k>0 is the shape parameter.

[0065] 1. After obtaining sufficient failure time data at three different voltages, the shape and scale parameters are estimated using either the least squares method or the maximum likelihood estimation method. Taking the maximum likelihood estimation method as an example:

[0066]

[0067] The shape and scale parameters are obtained by differentiation:

[0068]

[0069] The fitted Weibull probability density function was obtained by estimating the parameters. The fitting effect was then verified by plotting a Weibull probability plot (with time on the X-axis and failure rate on the Y-axis).

[0070] 2. Read the failure time of the specified failure rate under different test voltages from the fitted probability plot. For basic insulation, select the point with a failure rate of 1000ppm for data selection, while for reinforced insulation, select 1ppm.

[0071] Third, from the obtained Weibull distribution plot, read the lifetime times corresponding to three sets of voltages under a specific failure rate. After obtaining three sets of L (lifetime time) and V (voltage) data, fit the lifetime curve of the device. For different types of optical isolators, there are corresponding different fitting models:

[0072] 1. For SiO2-type optical isolators, the exponential model applies;

[0073] L = ce kV

[0074] Where L is the lifetime (i.e., the failure time in step two), V is the voltage, and c and k are parameters to be determined. By combining three equations obtained from three different sets of experimental data, three different K values ​​can be obtained:

[0075]

[0076] After determining the value of k, an exponential fit is performed on the parameter c using three sets of data to obtain the final three lifetime curves. From these three lifetime curves, the claimed lifetime desired by the manufacturer is selected, and the corresponding voltage V is found. ware outThe most stringent condition, i.e., the one with the lowest voltage, is selected. For couplers, a safety factor needs to be extrapolated to ensure device reliability; the required V... IORM That is, V ware out / 1.2.

[0077] 2. For non-SiO2 compound optical isolators, a nonlinear model is applicable;

[0078] L = ce kV-n

[0079] Where L is the lifetime, V is the voltage, and c, n, and k are parameters to be determined.

[0080] Unlike the exponential model, the value of n can be obtained by solving a system of equations derived from three sets of data to form a nonlinear equation, expressed as:

[0081]

[0082] Using mathematical tools, a numerical solution for n can be obtained. After obtaining the specific value of parameter n, the lifetime curve is obtained by performing nonlinear fitting on parameters c and k. IORM The extrapolation method is consistent with that of the exponential model.

[0083] Example 2

[0084] The present invention also discloses a system for determining the repetitive peak isolation voltage for optical isolation devices, comprising: an estimation module, a selection module, a fitting module, and an analysis module;

[0085] The estimation module is used to perform statistical and distribution parameter estimation on the lifetime end-of-life data of optically isolated devices using the Weibull distribution, and obtain a fitted probability map;

[0086] The selection module is used to obtain the failure time of a specified failure rate under different test voltages based on the fitted probability map;

[0087] The fitting module is used to obtain a lifetime prediction map of the optical isolator under different specific voltages based on the failure time of a specified failure rate under different test voltages;

[0088] The analysis module is used to analyze the lifetime of the device under a specific repetitive peak isolation voltage based on the lifetime prediction graph of the opto-isolator under different specific voltages.

[0089] The embodiments described above are merely preferred embodiments of the present invention and are not intended to limit the scope of the present invention. Various modifications and improvements made to the technical solutions of the present invention by those skilled in the art without departing from the spirit of the present invention should fall within the protection scope defined by the claims of the present invention.

Claims

1. A method for determining the repetitive peak isolation voltage for optically isolating devices, characterized in that, Includes the following steps: The Weibull distribution was used to perform statistical analysis and distribution parameter estimation on the lifetime termination time data of optically isolated devices, and a fitting probability plot was obtained. Based on the fitted probability plot, the failure time of the specified failure rate under different test voltages is obtained; Based on the failure time at specified failure rates under different test voltages, a lifetime prediction chart for optical isolators under different specific voltages is obtained; Based on the lifetime prediction charts of optical isolators under different specific voltages, the lifetime of the device under a specific repetitive peak isolation voltage is analyzed. In the obtained Weibull distribution plot, the lifetime time corresponding to three sets of voltages under a specific failure rate is read. After obtaining the data of three sets of lifetime time L and voltage V, the lifetime curve of the device is fitted. For different types of optical isolators, there are corresponding different fitting models. The method for obtaining the lifetime prediction curve of an optical isolator under different specific voltages based on the failure time of the specified failure rate under different test voltages includes: selecting three sets of failure times under different voltages and then fitting the lifetime prediction curves under different voltages. The method for fitting lifetime prediction curves under different voltages after selecting three sets of failure times includes: For SiO2-type optical isolators, an exponential model is used: Where L is the lifetime, i.e. the failure time based on the specified failure rate under different test voltages, V is the voltage, and c and k are parameters to be determined; Using an exponential model, three equations were obtained from three different sets of experimental data. These equations were then combined pairwise to obtain three different values ​​of k. After the value of k is determined, the parameter c is subjected to exponential fitting using three sets of data to obtain the final three sets of lifetime curves. Select the manufacturer's claimed lifespan from the three sets of lifespan curves and find the corresponding voltage V. ware out The fitting result with the minimum voltage is selected.

2. The method for determining the repetitive peak isolation voltage for an optically isolating device according to claim 1, characterized in that, Methods for statistical analysis and distribution parameter estimation of lifetime termination time data for optically isolated devices using the Weibull distribution to obtain a fitted probability plot include: By using failure time data at three different voltages, the distribution parameters are estimated using the least squares method or the maximum likelihood estimation method, and the shape and scale parameters are obtained. The fitted Weibull probability density function is obtained based on the estimated values ​​of shape and scale parameters; The fitting effect was verified by plotting a Weibull probability plot.

3. The method for determining the repetitive peak isolation voltage for optically isolating devices according to claim 2, characterized in that, Methods for estimating distribution parameters and obtaining shape and scale parameters by using failure time data at three different preset voltages and employing either the least squares method or the maximum likelihood estimation method include: 。 4. The method for determining the repetitive peak isolation voltage for an optically isolating device according to claim 1, characterized in that, The method of fitting lifetime prediction curves under different voltages after selecting three sets of failure times at different voltages also includes: For non-SiO2 compound optical isolators, a nonlinear model is applicable. Where L is the lifetime, i.e. the failure time based on the specified failure rate under different test voltages, V is the voltage, and c, n, and k are parameters to be determined. Using a nonlinear model, the value of n is obtained by solving a system of equations derived from fitting data under three different voltages, resulting in a nonlinear equation, expressed as: After obtaining the specific value of parameter n, the lifetime curve is obtained by performing nonlinear fitting on parameters c and k. Select the manufacturer's claimed lifespan from the lifespan curve and find the corresponding voltage V. ware out The fitting result with the minimum voltage is selected.

5. A system for determining a repetitive peak isolation voltage for an optically isolating device, said system being used to implement the method according to any one of claims 1-4, characterized in that, include: The module includes estimation, selection, fitting, and analysis modules. The estimation module is used to perform statistical analysis and distribution parameter estimation on the lifetime end-of-life time data of optically isolated devices using the Weibull distribution, and obtain a fitting probability map; The selection module is used to obtain the failure time of a specified failure rate under different test voltages based on the fitted probability map. The fitting module is used to obtain a lifetime prediction map of the optical isolator under different specific voltages based on the failure time of a specified failure rate under different test voltages. The analysis module is used to analyze the lifetime of the device under a specific repetitive peak isolation voltage based on the lifetime prediction chart of the opto-isolator under different specific voltages.

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