A charger test overload protection method, system

Abstract

The application relates to a charger test overload protection method and system, and relates to the technical field of charger overload protection testing.The application comprises the following steps: collecting and monitoring detection current when a charger is tested; when the detection current is at a preset safe current critical value, a preset threshold calculation strategy is used for calculation to determine a safe threshold; the safe threshold and a preset dangerous threshold are compared; when the safe threshold is equal to or greater than the preset dangerous threshold of an overload protector, a preset test current adjusting device is instructed to adjust the test current; the calculation formula of the threshold calculation strategy is as follows: wherein S represents the safe threshold, I avg represents average current in a period of time, I max represents the maximum allowable current of the charger, T represents the length of time, and I(τ) represents instantaneous current at τ moment. The application has the effect of reducing the probability of short circuit in the charger inspection process.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of charger overload protection test, in particular to a charger test overload protection method and system. BACKGROUND

[0002] During the production process of the charger, the charger needs to be detected correspondingly to screen out qualified products and unqualified products. When the input rectifier is inserted reversely or damaged during the detection process, the input positive and negative poles are easily short-circuited, which can easily cause fire accidents. Therefore, a corresponding overload protector needs to be set to protect the short circuit.

[0003] In the related art, in order to reduce the occurrence of short circuit accidents, a white incandescent bulb is usually connected in series in the detection circuit loop. However, when the resistance value of the bulb is large, the charger works under full load. In addition, some use an alternating current overload protector to protect the circuit. However, the alternating current overload protector has a delay time, so that the short circuit action has occurred before the protector acts, which is not conducive to the protection of the detection work.

[0004] In view of the above related art, in order to reduce the probability of short circuit during the charger inspection process, a corresponding overload protector needs to be designed to protect the detection circuit. SUMMARY

[0005] In order to solve the above technical problems, the present application provides a charger test overload protection method and system.

[0006] In a first aspect, the present application provides a charger test overload protection method, which adopts the following technical solution:

[0007] A charger test overload protection method, comprising:

[0008] The detection current of the charger during the test is collected and monitored. When the detection current is at a preset safe current critical value, a preset threshold calculation strategy is used to calculate to determine a safe threshold;

[0009] The safe threshold and a preset dangerous threshold are compared. When the safe threshold is equal to or greater than the preset dangerous threshold of the overload protector, a preset test current adjusting device is instructed to adjust the test current;

[0010] The calculation formula of the threshold calculation strategy is as follows:

[0011]

[0012] Wherein, S represents the safe threshold, I avg represents the average current in a period of time, I maxThe maximum allowed current of the charger is represented by I, the time length is represented by T, and the instantaneous current at time τ is represented by I(τ).

[0013] By adopting the technical scheme, the detection current is monitored during the current test and inspection of the charger, and corresponding threshold analysis is performed when the current is at the critical value of the safe current, and the test current is adjusted before the current is overloaded, so that the detection process is less likely to have an overload short circuit risk, and the probability of safety accidents is reduced.

[0014] Optionally, when the safety threshold and the preset dangerous threshold are compared, the comparison includes:

[0015] Based on the detection current, the current fluctuation parameter is analyzed to determine the current fluctuation parameter;

[0016] Based on the current fluctuation parameter and the preset model database, the current fluctuation parameter corresponding to the charger model is matched to determine the current fluctuation parameter;

[0017] Based on the charger model, the corresponding dangerous threshold in the preset threshold database is searched, and the dangerous threshold is exchanged;

[0018] The current fluctuation parameter is monitored, and when the current fluctuation parameter is within the preset change fluctuation parameter interval value, the dangerous threshold is updated.

[0019] By adopting the technical scheme, different charger models are analyzed and the corresponding dangerous threshold is searched, so that the corresponding dangerous threshold can be automatically matched during the current test and detection of the charger, and the accuracy of the detection result of the charger is higher.

[0020] Optionally, when the test current adjusting device adjusts the test current, the adjusting includes:

[0021] According to the detection current, the instantaneous current change rate is calculated and analyzed to determine the instantaneous current change rate, and when the instantaneous current change rate is greater than the preset stable instantaneous change rate, the preset current adjustment strategy is calculated to determine the adjusted current;

[0022] According to the adjusted current and the charger model, the same type of current adjustment parameter of the same type of charger is marked to determine the same type of current adjustment parameter of the same type of charger;

[0023] When the safety threshold is equal to or greater than the preset dangerous threshold of the overload protector, the same type of current adjustment parameter is matched according to the charger model, and the current is adjusted;

[0024] The current adjustment strategy is calculated by the following formula:

[0025] ΔI=I test +k·(I safe -I danger );

[0026] Wherein, ΔI represents the adjustment current amount that needs to be adjusted, k represents the adjustment speed and amplitude proportion coefficient of the current adjustment, I safe represents the current safety threshold, I danger represents the current danger threshold, I test represents the test current value that is currently detected.

[0027] By adopting the technical solution, the test current adjustment device is controlled according to the current adjustment strategy, so that the charger is not prone to cause the test current to be adjusted to a too low state before the test overload occurs, and the size of the current does not need to be re-adjusted when the remaining chargers are tested subsequently, thereby improving the test efficiency.

[0028] Optionally, when the current adjustment is performed, the method further comprises:

[0029] analyzing based on the detected current to determine a current test mode;

[0030] when the current test mode is consistent with a preset strong current test mode, and according to a preset adjustment cost analysis strategy, analyzing to determine a response time cost value;

[0031] comparing the response time cost value with a preset high-efficiency response value, and if the response time cost value is greater than the high-efficiency response value, matching a historical current adjustment parameter corresponding to an instantaneous current change rate in a preset current adjustment database;

[0032] performing current adjustment based on the historical current adjustment parameter.

[0033] By adopting the technical solution, the strong current test mode is analyzed according to the adjustment cost, the response time cost value required for the corresponding adjustment is analyzed, and the historical current adjustment parameter is matched for adjustment under the premise that the high-efficiency response is not met, so as to reduce the response time, which is helpful for quickly and timely adjusting the current and reducing the occurrence of overload short circuit accidents.

[0034] Optionally, when the response time cost value is determined, the adjustment cost analysis strategy is analyzed according to the following formula:

[0035] C(I)=k·T d ;

[0036] Cost(I)=C(I)+δ(I-I thresh )·T fixed ;

[0037] Wherein, C(I) is a test cost function under the current test mode, k represents a proportional constant of the time cost and the current intensity, Cost(I) represents the response time cost value, δ is a preset unit step function, T fixed represents a fixed time cost required for response overload protection.

[0038] By adopting the technical solution, the response consumption cost is calculated according to the test cost function in the current test mode, so as to compare and analyze the response consumption cost and perform current adjustment.

[0039] Optionally, when collecting the detection current during the test of the charger and monitoring, the method comprises the following steps:

[0040] Collecting the test environment temperature of the charger, and matching the noise reduction coefficient corresponding to the instantaneous current change rate in the preset translation filter database when the test environment temperature is in the preset abnormal temperature interval value.

[0041] Performing instantaneous fluctuation noise reduction processing on the detection current based on the noise reduction coefficient to obtain an optimized current parameter, and updating the optimized current parameter as the detection current.

[0042] By adopting the technical solution, when collecting the detection current, the test environment temperature is abnormally analyzed, and the corresponding noise reduction coefficient is matched to perform current instantaneous fluctuation noise reduction processing, which helps to remove the interference in the circuit.

[0043] Optionally, when the test environment temperature is in the preset abnormal temperature interval value, the method comprises the following steps:

[0044] Comparatively analyzing the test environment temperature to determine whether the test environment temperature corresponds to a low-temperature test environment or a high-temperature test environment.

[0045] Matching a correction coefficient in a preset noise reduction correction database based on the low-temperature test environment and the high-temperature test environment.

[0046] Calculating based on the correction coefficient and the noise reduction coefficient to determine a target noise reduction coefficient, and replacing the noise reduction coefficient according to the target noise reduction coefficient.

[0047] By adopting the technical solution, the test environment temperature is analyzed, and the corresponding correction coefficient is matched based on the low-temperature test environment and the high-temperature test environment to correct the value of the noise reduction coefficient, which can accurately eliminate the instantaneous fluctuation generated in different types of temperature environments, and helps to improve the reliability of the detection current.

[0048] In a second aspect, the application provides a charger test overload protection system, which adopts the following technical solution:

[0049] A charger test overload protection system comprises:

[0050] An acquisition module is configured to acquire;

[0051] A memory is configured to store the program of any one of the charger test overload protection methods.

[0052] A processor, a program in the memory can be loaded and executed by the processor to implement the charger test overload protection method of any one.

[0053] By adopting the technical scheme, the detection current is monitored during the current test inspection of the charger, threshold analysis is performed when the current is at the critical value of the safe current, the test current is adjusted before the current is overloaded, the detection process is not prone to overload short circuit hidden danger, and the probability of safety accidents is reduced.

[0054] In summary, the present application includes at least one of the following beneficial technical effects:

[0055] 1. During the current test inspection of the charger, the detection current is monitored, threshold analysis is performed when the current is at the critical value of the safe current, the test current is adjusted before the current is overloaded, the detection process is not prone to overload short circuit hidden danger, and the probability of safety accidents is reduced;

[0056] 2. The test current adjusting device is adjusted and controlled according to the current adjusting strategy, so that the charger is not prone to cause the test current to be adjusted to a too low state before the test overload occurs, the size of the current does not need to be adjusted again when the remaining chargers are tested subsequently, and the test efficiency is improved;

[0057] 3. The test environment temperature is analyzed, and the corresponding correction coefficient is matched according to the low-temperature test environment and the high-temperature test environment to correct the value of the noise reduction coefficient, so that the instantaneous fluctuation in different types of temperature environments can be accurately eliminated, and the reliability of the detection current is improved. BRIEF DESCRIPTION OF DRAWINGS

[0058] Figure 1 is a method flowchart of steps S100 to S200 in the present application.

[0059] Figure 2 is a method flowchart of steps S201 to S204 in the present application.

[0060] Figure 3 is a method flowchart of steps S205 to S207 in the present application.

[0061] Figure 4 is a method flowchart of steps S2071 to S2074 in the present application.

[0062] Figure 5 is a method flowchart of steps S2075 to S2076 in the present application.

[0063] Figure 6 is a method flowchart of steps S2077 to S2079 in the present application.

[0064] Figure 7 is a partial module circuit diagram of an overload protector in the present application.

[0065] Figure 8 is a remaining partial module circuit diagram of an overload protector in the present application. DETAILED DESCRIPTION

[0066] In order to make the purpose, technical solutions and advantages of the present application more clear, the following further describes the present application in combination with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and do not limit the present application. Figures 1-8 The present application is further described in detail below in combination with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and do not limit the present application.

[0067] The embodiments of the present application are further described in detail below in combination with the accompanying drawings.

[0068] The embodiments of the present application disclose a charger test overload protection method. During the current test inspection process of the charger, the detection current is monitored, and when the current is at a safe current threshold value, corresponding threshold value analysis is performed, and the test current is adjusted before the current is overloaded, so that the detection process is not prone to overload short circuit hidden danger, thereby helping to reduce the probability of safety accidents.

[0069] Referring to Figure 1 , the method flow of the charger test overload protection method includes the following steps:

[0070] Step S100: collecting and monitoring the detection current when the charger is tested, and when the detection current is at a preset safe current threshold value, calculating according to a preset threshold value calculation strategy to determine a safe threshold value;

[0071] The current detection and detection can be detected by a corresponding current sensor, such as a Hall effect sensor. The safe current threshold value is a pre-set current threshold value, which represents the critical current value within the safe range of the detection current. When the critical current value is exceeded, it means that the current in the circuit is large and is in a state prone to short circuit hidden danger. In addition, the safe threshold value represents that the current threshold value corresponding to the detection current is within the safe range, which is set by the staff. The threshold value calculation strategy is further detailed in the subsequent steps. The safe threshold value corresponding to the detection current can be calculated by the threshold value calculation strategy, so as to be further called in the subsequent steps.

[0072] Step S200: comparing the safe threshold value with a preset dangerous threshold value, and when the safe threshold value is equal to or greater than the dangerous threshold value preset by the overload protector, instructing a preset test current adjusting device to adjust the test current;

[0073] The dangerous threshold value represents that the detection current is large, and is easy to cause the charger to be overloaded. The specific threshold value size is known by personnel through a current overload test experiment. By comparing the safe threshold value and the dangerous threshold value, it can be known whether the charger is overloaded and short-circuited during current testing, so as to timely adjust the test current. The test current adjusting device is a control chip connected with the current source in advance, and can receive a current adjusting signal and respond.

[0074] The calculation formula of the threshold value calculation strategy is as follows:

[0075]

[0076] wherein S represents the safe threshold value, I avg represents the average current in a period of time, I max represents the maximum allowable current of the charger, T represents the time length, I(τ) represents the instantaneous current at τ moment, and S(t) represents the functional relationship formula of the safe threshold value and the maximum allowable current over time.

[0077] With reference to Figure 2 , the comparison between the safe threshold value and the preset dangerous threshold value includes:

[0078] Step S201: analyzing based on the detection current to determine a current fluctuation parameter;

[0079] The current fluctuation parameter represents the current size and the change rate of the current size of the charger during current detection. Different types of chargers produce different current sizes and current size change rates during charging. The reason is that there are different rated current sizes and different fast charging and slow charging types, so that the internal charging structure of the charger is different, and thus the current fluctuation parameter can map the corresponding type of charger.

[0080] Step S202: matching based on the current fluctuation parameter and a preset model database to determine the charger model corresponding to the current fluctuation parameter;

[0081] Different charger models are stored in the model database, and the current fluctuation parameters corresponding to the charger models are also stored. When the current fluctuation parameter is input, the corresponding charger model can be automatically matched and output, so as to be called during subsequent analysis.

[0082] Step S203: finding the corresponding dangerous threshold value in the preset threshold value database based on the charger model, and adjusting the dangerous threshold value;

[0083] The charger corresponding to different charger models has different dangerous thresholds due to different rated current sizes that can be borne in the charger. A threshold database can be established in advance, different charger models are stored in the threshold database, and the dangerous thresholds corresponding to the charger models are stored. When the charger model is input, the corresponding dangerous threshold is matched and output, and the dangerous threshold is updated to realize the updating of the dangerous thresholds of different charger models, which helps to improve the overload adjustment accuracy of different charger models.

[0084] Step S204: monitoring the current fluctuation parameter, and updating the dangerous threshold when the current fluctuation parameter is within the preset variation fluctuation parameter interval value.

[0085] By monitoring the current fluctuation parameter, when the current fluctuation parameter changes, it indicates that the charger model changes, so that the dangerous threshold is updated to adjust the accurate dangerous threshold in time and improve the test accuracy of the charger.

[0086] Referring to Figure 3 , when the test current adjusting device adjusts the test current, comprising:

[0087] Step S205: calculating and analyzing the detection current to determine the instantaneous current change rate, and when the instantaneous current change rate is greater than the preset stable instantaneous change rate, calculating the adjustment current according to the preset current adjustment strategy;

[0088] The instantaneous current change rate represents the rate of change of the current parameter when the current parameter is detected. The stable instantaneous change rate represents the normal current fluctuation value within the allowed range, which does not affect the normal charging test of the charger. The specific calculation method of the current adjustment strategy is further described in the subsequent steps.

[0089] The adjustment current is the size adjustment of the detection current, so that the safety threshold corresponding to the detection current is less than the dangerous threshold.

[0090] Step S206: marking according to the adjustment current and the charger model to determine the same type of current adjustment parameter of the same type of charger;

[0091] Step S207: when the safety threshold is equal to or greater than the preset dangerous threshold of the overload protector, matching the same type of current adjustment parameter according to the charger model and adjusting the current;

[0092] The charger model corresponding to the adjustment current is marked, so that the current parameter required for adjustment of different types of chargers in the state of large instantaneous current change rate can be known. The current parameter is defined as the same type of current adjustment parameter, so that it can be directly called subsequently, which helps to reduce the analysis time and improve the response speed of the overload protection.

[0093] The current regulation strategy is calculated by the following formula:

[0094] ΔI = I test +k·(I safe -I danger );

[0095] Wherein, ΔI represents the adjustment amount of the adjustment current, k represents the adjustment speed and amplitude proportion coefficient of the current adjustment, I safe represents the current safety threshold, I danger represents the current danger threshold, I test represents the current test value detected at present.

[0096] Referring to Figure 4 , when the current is regulated, it further includes:

[0097] Step S2071: analyzing based on the detected current to determine the current test mode;

[0098] The current test mode represents the current intensity mode used by the charger when performing the charging test, including the strong current test mode and the weak current test mode. By analyzing the current size of the detected current, the current test mode corresponding to the current intensity can be known.

[0099] Step S2072: when the current test mode is consistent with the preset strong current test mode, and according to the preset regulation cost analysis strategy, the response time cost value is analyzed to determine the response time cost value.

[0100] When the current test mode is the strong current test mode, it means that the current needs a faster response time when the current is short-circuited compared to the weak current test mode. By setting the cost regulation analysis strategy, the response time cost value of the required adjustment current is calculated and analyzed to determine the response time cost value.

[0101] When the response time cost value is determined, the regulation cost analysis strategy is analyzed by the following formula:

[0102] C(I) = k·T d ;

[0103] Cost(I) = C(I) + δ(I-I thresh )·T fixed ;

[0104] Wherein, C(I) is the test cost function under the current test mode, k represents the proportion constant of the time cost and the current intensity, Cost(I) represents the response time cost value, δ is the preset unit step function, T fixed represents the fixed time cost required for response overload protection;

[0105] Step S2073: comparing the response time cost value with the preset efficient response cost value, if greater, matching the historical current adjustment parameter corresponding to the instantaneous current change rate in the preset current adjustment database;

[0106] The efficient response cost value is a pre-set cost coefficient value, representing the time cost required for fast response to overload protection. By comparing the response time cost value with the efficient response cost value, when the response time cost value is greater than the efficient response cost value, it means that the current adjustment measure at this time cannot respond to the overload protection quickly. Then, according to the pre-set current adjustment database, the corresponding historical current adjustment parameter is queried for subsequent current adjustment, which helps to save response time.

[0107] Step S2074: current adjustment based on the historical current adjustment parameter.

[0108] By directly calling the queried historical current adjustment parameter and performing current adjustment, fast current adjustment can be realized.

[0109] Referring to Figure 5 , when collecting the detection current of the charger for testing and monitoring, it includes:

[0110] Step S2075: collecting the test environment temperature of the charger, when the test environment temperature is within the pre-set abnormal temperature interval value, matching the noise reduction coefficient corresponding to the instantaneous current change rate in the pre-set translational filtering database;

[0111] The test environment temperature is the environment temperature of the charger during current charging test. The environment temperature has little effect on the charger under natural conditions, but the effect is relatively large under some extreme conditions. In order to make the results of the charger current test experiment more comprehensive, the corresponding extreme environment temperature will be set, and the temperature value exceeding the natural temperature is defined as the abnormal temperature interval value. At the same time, the translational filtering database is pre-established, different instantaneous current change rates are stored in the translational filtering database, and the corresponding noise reduction coefficients are also stored, so that the corresponding noise reduction coefficient can be queried according to the input instantaneous current change rate. The noise reduction coefficient represents the proportional coefficient value of the detection current when the translational filtering processing is performed under different temperatures, which can eliminate the clutter of the detection current.

[0112] Step S2076: performing instantaneous fluctuation noise reduction processing on the detection current based on the noise reduction coefficient to obtain an optimized current parameter, and updating the optimized current parameter as the detection current.

[0113] The detection current is filtered by the pre-set translational filter installation noise reduction coefficient, the current parameter obtained after processing is defined as the optimized current parameter, and is replaced and updated for use, so that the subsequent calling detection current for analysis is not easy to be affected by the existing interference current, and the accuracy of the analysis result is reduced.

[0114] Referring to Figure 6 , when the test environment temperature is in the preset abnormal temperature interval value, comprising:

[0115] Step S2077: comparing and analyzing the test environment temperature to determine whether the test environment corresponding to the test environment temperature is a low-temperature test environment or a high-temperature test environment;

[0116] By analyzing the test environment temperature, it can be known that the test environment temperature is in high temperature or low temperature, and is divided into low-temperature test environment and high-temperature test environment according to the temperature, so as to accurately match the corresponding noise reduction coefficient.

[0117] Step S2078: matching the correction coefficient in the preset noise reduction correction database based on the low-temperature test environment and the high-temperature test environment;

[0118] The corresponding correction coefficient is set for the high-temperature test environment and the low-temperature test environment, a noise reduction correction database is established, and the correction coefficient corresponding to the temperature of the high-temperature test environment and the low-temperature test environment is stored, so as to be queried and called.

[0119] Step S2079: calculating based on the correction coefficient and the noise reduction coefficient to determine the target noise reduction coefficient, and replacing the noise reduction coefficient according to the target noise reduction coefficient.

[0120] The difference between the correction coefficient and the noise reduction coefficient is calculated, the calculated coefficient is defined as the target noise reduction coefficient, and the new noise reduction coefficient is updated and replaced, so that the detection current can be optimally filtered according to the noise reduction coefficient.

[0121] Referring to Figure 7 and Figure 8The overload protector is provided with a plurality of circuit modules, including an AC-DC conversion module, a DC-AC conversion module, an auxiliary power module, a display module, a MUC control module and a test current adjustment module. The AC-DC conversion module and the DC-AC conversion module are used for converting alternating current and direct current to adapt to detection operation under different currents. The display module is connected with a liquid crystal display screen and is used for displaying current parameters of detection. The auxiliary power module is connected with the MUC control module and is used for providing auxiliary power. The test current adjustment module is connected with the MUC control module, can receive a current adjustment signal and send a corresponding feedback signal, and the MUC control module sends the feedback signal to an external test current adjustment device to instruct the test current adjustment device to complete current adjustment. When adjustment fails, the MUC control module controls a circuit to be cut off to realize overload protection.

[0122] Based on the same inventive concept, the embodiment of the present application provides a charger test overload protection system, comprising:

[0123] An acquisition module acquires a detection current when a charger is tested and performs monitoring. When the detection current is at a preset safe current threshold value, a threshold analysis module performs calculation according to a preset threshold calculation strategy to determine a safe threshold value.

[0124] A threshold comparison module compares the safe threshold value with a preset dangerous threshold value. When the safe threshold value is equal to or greater than the preset dangerous threshold value of an overload protector, a test current adjustment module instructs a preset test current adjustment device to perform test current adjustment.

[0125] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above functional modules is exemplified, and in actual application, the above functions can be completed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. The specific working process of the system, device and unit described above can refer to the corresponding process in the foregoing method embodiments, which will not be described here.

[0126] The embodiment of the present application provides a computer readable storage medium, which stores a computer program capable of being loaded by a processor and executing a charger test overload protection method.

[0127] The computer storage medium includes, for example, a U disk, a mobile hard disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a magnetic disk or an optical disk and various media capable of storing program codes.

[0128] Based on the same inventive concept, the embodiment of the present application provides a kind of intelligent terminal, including memory and processor, computer program capable of being loaded and being executed charger test overload protection method is stored on memory by processor.

[0129] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the above-mentioned division of functional modules is exemplified, and in actual application, the above-mentioned functions can be completed by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. The specific working process of the above-described system, device and unit can refer to the corresponding process in the foregoing method embodiments, which will not be described here.

[0130] The above are preferred embodiments of the present application, and are not intended to limit the protection scope of the present application. Any feature disclosed in the specification (including the abstract and drawings) can be replaced by other equivalent or similar features unless specifically described. That is, each feature is only an example of a series of equivalent or similar features unless specifically described.

Claims

1. A charger test overload protection method, characterized by, The method comprises the following steps: Collecting and monitoring the detection current when the charger is tested, and calculating according to the preset threshold calculation strategy when the detection current is at the preset safety current threshold, to determine the safety threshold; Comparing the safety threshold with the preset dangerous threshold, and instructing the preset test current adjusting device to adjust the test current when the safety threshold is equal to or greater than the preset dangerous threshold of the overload protector; The comparison between the safety threshold and the preset dangerous threshold comprises: Analyzing the detection current to determine the current fluctuation parameter, and matching the current fluctuation parameter with the preset model database to determine the charger model corresponding to the current fluctuation parameter; Looking up the corresponding dangerous threshold in the preset threshold database based on the charger model, and replacing the dangerous threshold; monitoring the current fluctuation parameter, and updating the dangerous threshold when the current fluctuation parameter is within the preset change fluctuation parameter interval; The calculation formula of the threshold calculation strategy is as follows: where S represents a safety threshold, I avg represents an average current over a period of time, I max represents a maximum allowed current of the charger, T represents a length of time, and I(τ) represents an instantaneous current at time τ.

2. The charger test overload protection method of claim 1, wherein, The test current adjusting device adjusts the test current, which comprises the following steps: Calculating and analyzing the detection current to determine the instantaneous current change rate, and calculating according to the preset current adjusting strategy when the instantaneous current change rate is greater than the preset stable instantaneous change rate, to determine the adjusted current; Labeling the adjusted current and the charger model to determine the same type of current adjusting parameter of the same type of charger; When the safety threshold is equal to or greater than the preset dangerous threshold of the overload protector, matching the same type of current adjusting parameter according to the charger model and adjusting the current; The current adjusting strategy is calculated by the following formula: ΔI = I test + k · (I safe - I danger ); where ΔI represents the adjustment current amount to be adjusted, k represents the adjustment speed and amplitude proportionality coefficient of the current adjustment, I safe represents the current safety threshold, I danger represents the current danger threshold, I test represents the test current value currently detected.

3. The charger test overload protection method of claim 2, wherein, When adjusting the current, it further comprises the following steps: Analyzing the detection current to determine the current test mode; When the current test mode matches the preset strong current test mode, analyzing according to the preset adjustment cost analysis strategy to determine the response consumption time value; Comparing the response consumption time value with the preset efficient response time value, and if it is greater, matching the historical current adjusting parameter corresponding to the instantaneous current change rate in the preset current adjusting database; Adjusting the current based on the historical current adjusting parameter.

4. The charger test overload protection method of claim 3, wherein, When determining the response consumption time value, the adjustment cost analysis strategy is analyzed by the following formula: C(I) = k-T d ; Cost(I) = C(I) + δ(I - I thresh ) · T fixed ; where C(I) is a test cost function in a current test mode, k represents a proportional constant of time cost and current intensity, Cost(I) represents a response consumption cost value, δ is a preset unit step function, T fixed represents a fixed time cost required in response to overload protection.

5. The charger test overload protection method of claim 2, wherein, When collecting and monitoring the detection current when the charger is tested, it comprises the following steps: Collecting the test environment temperature of the charger, and matching the noise reduction coefficient corresponding to the instantaneous current change rate in the preset translation filtering database when the test environment temperature is within the preset abnormal temperature interval; Optimizing the current parameter by performing instantaneous fluctuation noise reduction processing on the detection current based on the noise reduction coefficient, and updating the optimized current parameter as the detection current.

6. The charger test overload protection method of claim 5, wherein, When the test environment temperature is within the preset abnormal temperature interval, it comprises the following steps: Comparing and analyzing the test environment temperature to determine whether the test environment temperature corresponds to a low-temperature test environment or a high-temperature test environment; Matching the correction coefficient in the preset noise reduction correction database based on the low-temperature test environment and the high-temperature test environment; Calculating the target noise reduction coefficient based on the correction coefficient and the noise reduction coefficient, and replacing the noise reduction coefficient according to the target noise reduction coefficient.

7. A charger test overload protection system employing the charger test overload protection method according to any one of claims 1 to 6, characterized by, ​ The acquisition module acquires and monitors the detection current when the charger is tested, and when the detection current is at a preset safe current threshold, the threshold analysis module calculates according to a preset threshold calculation strategy to determine a safe threshold; The threshold comparison module compares the safe threshold with a preset dangerous threshold, and when the safe threshold is equal to or greater than the preset dangerous threshold of the overload protector, the test current adjustment module instructs the preset test current adjustment device to adjust the test current.

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