An abnormal detection method for a photovoltaic panel

Abstract

The present invention discloses an abnormal detection method for a photovoltaic panel, which relates to the technical field of abnormal detection of photovoltaic panels. During the process of obtaining the physical changes corresponding to the encapsulation material of the photovoltaic panel, an image of the encapsulation material of the photovoltaic panel is captured by a mobile rail camera, and the captured image of the photovoltaic panel is compared with the images corresponding to each historical abnormal detection period, as well as with the image of the standard encapsulation material, which is beneficial to timely discover the color change of the encapsulation material of the photovoltaic panel, and then determine whether internal moisture detection is required, thereby improving the detection efficiency and accuracy, and avoiding early damage caused by appearance changes. By setting a first control group and a second control group in the installation area of the photovoltaic panel and comparing the change speeds of the two groups, it is beneficial to determine whether ultraviolet rays are one of the main factors causing the appearance abnormality of the encapsulation material of the photovoltaic panel, providing a scientific basis for subsequent abnormal detection and preventive measures.

Description

Technical Field

[0001] The present invention relates to the technical field of abnormal detection of photovoltaic panels, and particularly to an abnormal detection method for photovoltaic panels. Background Art

[0002] In order to comprehensively evaluate the operating state of photovoltaic panels, modern abnormal detection methods not only focus on the performance parameters of the photovoltaic panels themselves, but also combine environmental monitoring data for multi-parameter comprehensive evaluation. For example, by measuring parameters such as the ultraviolet intensity, temperature, and humidity of the environment where the photovoltaic panels are located, the influence of these environmental factors on the photovoltaic panels can be analyzed, and through establishing an environment-performance correlation model, accurate prediction of the abnormalities of the photovoltaic panels can be achieved.

[0003] The prior art, such as the invention patent application with the publication number CN115797351A, discloses an abnormal detection method for photovoltaic panels, including: obtaining a first binary segmentation threshold for segmenting the photovoltaic panel image into a grid line area and a panel area, and a second binary segmentation threshold for segmenting the panel area into an abnormal dark area and a non-abnormal light area, adjusting the gray value of the first pixel point to a first target gray value according to the first binary segmentation threshold, adjusting the gray value of the second pixel point to a second target gray value according to the first binary segmentation threshold and the second binary segmentation threshold to obtain a target photovoltaic panel image, compressing the target photovoltaic panel image and sending it to a cloud server for abnormal detection of the photovoltaic panel by the cloud server.

[0004] For the above solution, there are at least the following technical problems: 1. The above solution lacks in-depth analysis of the relationship between ultraviolet intensity and the appearance abnormality of the encapsulation material, which will lead to the inability to accurately identify the degree of influence of ultraviolet rays on the aging of the encapsulation material during the abnormal detection process. If the relationship between ultraviolet intensity and the color change of the encapsulation material cannot be analyzed, it will lead to the accelerated aging of the encapsulation material of the photovoltaic panel in an environment with high ultraviolet intensity, while the staff cannot receive early warnings in time, thus affecting the service life and power generation efficiency of the photovoltaic panel.

[0005] 2. The above solution lacks an evaluation process of the influence of the encapsulation material abnormality on the photovoltaic panel, which will lead to the inability to comprehensively understand the influence of the encapsulation material abnormality on the overall performance of the photovoltaic panel during the detection of the encapsulation material abnormality. When the encapsulation material shows an abnormality, it will lead to the inability to accurately judge whether the photovoltaic panel needs to be maintained or replaced, thus affecting the long-term stable operation of the photovoltaic system. In addition, the lack of a process for obtaining and evaluating the performance parameters of the encapsulation material will lead to the inability to comprehensively understand the physical properties of the encapsulation material during the abnormal detection process. When the performance of the encapsulation material deteriorates, it will lead to the inability to timely judge whether it needs to be replaced, thus affecting the power generation efficiency and long-term stability of the photovoltaic panel.

[0006] 3. The above solution lacks the prediction process for the abnormal development trend of the encapsulation material appearance, which will lead to the inability to predict in advance the aging trend of the encapsulation material during the use of the photovoltaic panel. When the encapsulation material gradually ages, preventive measures cannot be taken in advance, thus increasing the risk of failure of the photovoltaic panel. Summary of the Invention

[0007] The object of the present invention is to provide an abnormal detection method for a photovoltaic panel, which solves the problems existing in the background technology.

[0008] To solve the above technical problems, the present invention adopts the following technical solutions: The present invention provides an abnormal detection method for a photovoltaic panel, including: S1. Obtain the physical changes corresponding to the encapsulation material of the photovoltaic panel, and then evaluate whether the photovoltaic panel needs to be detected for abnormal encapsulation appearance.

[0009] S2. When the photovoltaic panel does not need to be detected for abnormal encapsulation appearance, measure the average ultraviolet intensity in each set time period, and then analyze the relationship between ultraviolet light and the abnormal appearance of the encapsulation material of the photovoltaic panel.

[0010] S3. Evaluate the impact of the abnormal appearance of the encapsulation material of the photovoltaic cell on the photovoltaic panel according to the relationship between ultraviolet light and the abnormal appearance of the encapsulation material of the photovoltaic panel.

[0011] S4. When the photovoltaic panel needs to be detected for abnormal encapsulation appearance, obtain the performance parameters corresponding to the encapsulation material of the photovoltaic panel, and then evaluate whether the encapsulation material of the photovoltaic panel is allowed to continue to be used.

[0012] The beneficial effects of the present invention are as follows: 1. For the abnormal detection method of a photovoltaic panel provided by the present invention, during the process of obtaining the physical changes corresponding to the encapsulation material of the photovoltaic panel, the encapsulation material of the photovoltaic panel is photographed by a mobile slide rail camera, and the photographed image of the photovoltaic panel is compared with the images corresponding to each historical abnormal detection period, and compared with the image of the standard encapsulation material, which is beneficial to timely discover the color change of the encapsulation material of the photovoltaic panel, and then determine whether internal water vapor detection is required, thereby improving the detection efficiency and accuracy, and avoiding early damage caused by appearance changes.

[0013] 2. In the embodiment of the present invention, a first control group and a second control group are set in the installation area of the photovoltaic panel, and the average ultraviolet intensity is detected in each set time period. The drawing software is used to draw the average ultraviolet intensity and the encapsulation material appearance change charts of the first control group and the second control group, and compare the change speeds of the two groups, which is beneficial to determine whether ultraviolet light is one of the main factors leading to the abnormal appearance of the encapsulation material of the photovoltaic panel, and provides a scientific basis for subsequent abnormal detection and preventive measures.

[0014] 3. In the embodiment of the present invention, by calculating the quantitative relationship between the color change degree of the encapsulation material and the ultraviolet intensity within a set time period, and by combining the charts of the first control group and the second control group, an abnormal detection model for photovoltaic panels is established, and minor influencing factors are added to improve the model, which is beneficial to comprehensively evaluating the influence degree of ultraviolet intensity on photovoltaic panels, predicting the development trend of abnormal appearance of the encapsulation material, and providing scientific guidance for the maintenance and management of photovoltaic panels.

[0015] 4. In the embodiment of the present invention, when the photovoltaic panel is in a non-operating state, the encapsulation material is disassembled and the light transmittance, hardness, and tensile strength are detected. By calculating the physical property evaluation coefficient corresponding to the encapsulation material of the photovoltaic panel, it is beneficial to comprehensively evaluate the performance status of the encapsulation material of the photovoltaic panel, ensure the safe and efficient operation of the photovoltaic panel, and avoid premature scrapping caused by performance degradation. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0017] Figure 1 It is a schematic diagram of the implementation steps of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0018] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0019] Please refer to Figure 1 As shown, the present invention provides an abnormal detection method for photovoltaic panels, and the method includes: S1. Obtain the physical changes corresponding to the encapsulation material of the photovoltaic panel, and then evaluate whether the photovoltaic panel needs to perform an abnormal detection of the encapsulation appearance.

[0020] In a specific embodiment, the evaluation of whether the photovoltaic panel needs to be subjected to encapsulation appearance abnormality detection is as follows: Abnormality detection is carried out according to the abnormality detection cycle of the photovoltaic panel encapsulation material. An image of the photovoltaic panel encapsulation material is captured by a mobile rail camera. By comparing the photovoltaic panel image with the images corresponding to each historical abnormality detection cycle, and comparing the photovoltaic panel image with the standard encapsulation material image, it is further determined whether there is a color change in the photovoltaic panel encapsulation material. When there is a color change in the photovoltaic panel encapsulation material, internal moisture detection of the photovoltaic panel encapsulation material is performed.

[0021] A microprobe is used to detect the internal humidity of the encapsulation material through the encapsulation material interface, and then the internal humidity of the encapsulation material is compared with the ambient humidity. The comparison result of the internal humidity of the encapsulation material and the ambient humidity is recorded as a quantitative evaluation value. The quantitative evaluation value includes the values 0 and 1. When the value of the quantitative evaluation value is 0, it indicates that the photovoltaic panel needs to be subjected to encapsulation appearance abnormality detection. When the value of the quantitative evaluation value is 1, it indicates that the photovoltaic panel does not need to be subjected to encapsulation appearance abnormality detection.

[0022] It should be noted that the mobile rail camera is a camera device installed on a movable rail, and its main function is to capture images of the photovoltaic panel encapsulation material. The standard encapsulation material image refers to the image of the photovoltaic panel encapsulation material without any abnormalities under ideal conditions. The standard encapsulation material image is captured when the photovoltaic panel is just installed or after strict inspection and confirmation of no abnormalities, and is used as a reference standard for evaluating whether the photovoltaic panel needs to be subjected to encapsulation appearance abnormality detection. Color change refers to the change in the color of the photovoltaic panel encapsulation material during use compared with the initial state or the standard state. For example, when the photovoltaic panel encapsulation material is exposed to sunlight for a long time, ultraviolet rays will cause changes in the polymer materials, additives, and colorants in the encapsulation material, resulting in yellowing, darkening, or the appearance of color spots, etc.

[0023] In a specific embodiment, the comparison of the internal humidity of the encapsulation material with the ambient humidity is as follows: A humidity sensor is used to detect the ambient humidity corresponding to the outside of the photovoltaic panel encapsulation material, and the ambient humidity corresponding to the outside of the encapsulation material is denoted as sd out , and the internal humidity of the encapsulation material is denoted as sd in , and through the water vapor abnormality detection expression: The quantitative evaluation value α of the comparison result of the internal humidity of the encapsulation material and the ambient humidity is obtained, where X is the standard humidity difference control threshold.

[0024] It should be noted that X is one of the bases for evaluating whether the photovoltaic panel needs to be subjected to encapsulation appearance abnormality detection. For example, when X takes the value of 10, the value of sd out is 5, and the value of sdin When the value is 10, sd out <sd in , it indicates that the humidity inside the encapsulation material is greater than the ambient humidity. Combining with the color change of the photovoltaic panel encapsulation material, it further shows that the photovoltaic panel needs to be detected for abnormal encapsulation appearance.

[0025] S2. When the photovoltaic panel does not need to be detected for abnormal encapsulation appearance, by measuring the average ultraviolet intensity in each set time period, and then analyzing the relationship between ultraviolet and the abnormal appearance of the photovoltaic panel encapsulation material.

[0026] In a specific embodiment, the process of analyzing the relationship between the ultraviolet intensity and the abnormal appearance of the photovoltaic panel encapsulation material is as follows: Set a first control group and a second control group in the photovoltaic panel installation area. The difference between the first control group and the second control group is that the second control group is shielded by an ultraviolet absorption film above. Set each acquisition time point in each set time period, and then detect the corresponding average ultraviolet intensity in each set time period, as well as the color change of the encapsulation material corresponding to the first control group and the second control group in each set time period. Use drawing software to draw the appearance change charts of the encapsulation materials corresponding to the average ultraviolet intensity of the first control group and the second control group in each set time period. The abscissa of the drawn chart is each set time period, and the ordinate of the chart is the RGB value of the surface color of the encapsulation material and the average ultraviolet intensity respectively.

[0027] By comparing the charts of the first control group and the second control group, if the color change speed of the surface of the encapsulation material of the second control group is less than that of the first control group when the second control group is shielded by the ultraviolet absorption film, it indicates that ultraviolet is one of the factors causing the abnormal appearance of the photovoltaic panel encapsulation material.

[0028] It should be noted that in the photovoltaic panel installation area, install the photovoltaic panels of the first control group and the second control group under the same environmental conditions. For example, the same bracket height, angle and orientation, etc., ensure firm installation, and avoid appearance changes caused by improper installation. Appearance changes include color changes, blisters and cracks, etc. Use tools such as color standard cards or spectrophotometers to quantitatively describe the color. For example, record the RGB value of the color. By calculating the mean value of the ultraviolet intensity at each acquisition time point in each set time period, the corresponding average ultraviolet intensity in each set time period is obtained.

[0029] In the embodiment of the present invention, by setting a first control group and a second control group in the installation area of the photovoltaic panel, and detecting the average ultraviolet intensity in each set time period, using drawing software to draw the average ultraviolet intensity and the appearance change chart of the encapsulation material of the first control group and the second control group, and comparing the change speeds of the two groups, it is beneficial to determine whether ultraviolet is one of the main factors causing the abnormal appearance of the encapsulation material of the photovoltaic panel, and provide a scientific basis for subsequent anomaly detection and preventive measures.

[0030] In the embodiment of the present invention, by calculating the quantitative relationship between the color change degree of the encapsulation material and the ultraviolet intensity in the set time period, and combining the charts of the first control group and the second control group, an abnormal detection model of the photovoltaic panel is established, and secondary influencing factors are added to improve the model, which is beneficial to comprehensively evaluate the influence degree of the ultraviolet intensity on the photovoltaic panel, predict the development trend of the abnormal appearance of the encapsulation material, and provide scientific guidance for the maintenance and management of the photovoltaic panel.

[0031] S3. According to the relationship between ultraviolet and the abnormal appearance of the encapsulation material of the photovoltaic panel, evaluate the influence of the abnormal appearance of the photovoltaic cell encapsulation material on the photovoltaic panel.

[0032] In a specific embodiment, the evaluation of the influence of the abnormal appearance of the photovoltaic cell encapsulation material on the photovoltaic panel is as follows: by calculating the quantitative relationship between the color change degree of the encapsulation material and the ultraviolet intensity in the set time period, thereby evaluating the influence degree of the ultraviolet intensity on the photovoltaic panel, and combining the charts of the first control group and the second control group, and then obtaining the rules and trends of the color change of the encapsulation material under different ultraviolet intensities, thereby establishing an abnormal detection model of the photovoltaic panel, and adding secondary influencing factors affecting the abnormality of the encapsulation material to improve the model, and predicting the development trend of the corresponding abnormal appearance of the photovoltaic cell encapsulation material.

[0033] It should be noted that by calculating the quantitative relationship between the degree of color change of the encapsulation material and the ultraviolet intensity within a set time period, taking the Pearson correlation coefficient as an example for the specific calculation process, the secondary influencing factors include but are not limited to temperature, humidity, mechanical stress, and chemical substances. Based on the calculation of the quantitative relationship between the degree of color change of the encapsulation material and the ultraviolet intensity within the set time period, combined with the chart analysis of the first control group and the second control group to analyze the color change rules and trends of the encapsulation material under different ultraviolet intensities, an abnormal detection model for photovoltaic panels is established. Then, secondary influencing factors such as temperature, humidity, mechanical stress, chemical substances, and internal factors of the panel are added to improve the model, so as to achieve the prediction of the development trend of the corresponding appearance abnormality of the encapsulation material of the photovoltaic panel. The construction method of the abnormal detection model for photovoltaic panels is the same as the construction method of the BERT model based on the Transformer mechanism, both of which establish and improve the model in a specific way to achieve a specific goal. The BERT model based on the Transformer mechanism is a prior art and will not be elaborated here.

[0034] In a specific embodiment, the process of predicting the development trend of the corresponding appearance abnormality of the encapsulation material of the photovoltaic panel is as follows: According to the improved abnormal detection model of the photovoltaic panel, when the photovoltaic panel does not need to perform encapsulation appearance abnormality detection, the real-time state information and the environmental information of the photovoltaic panel encapsulation material are collected, and the collected real-time state information and environmental information of the photovoltaic panel encapsulation material are input into the abnormal detection model of the photovoltaic panel, and then the predicted damage duration of the photovoltaic panel encapsulation material is obtained, so as to achieve the prediction of the development trend of the corresponding appearance abnormality of the photovoltaic panel encapsulation material.

[0035] It should be noted that the real-time state information includes but is not limited to surface flatness, light transmittance, hardness, insulation resistance, and dielectric constant, and the environmental information includes but is not limited to temperature and humidity, ultraviolet intensity, wind speed, and rainfall. The real-time state information such as the color, light transmittance, and hardness of the photovoltaic panel encapsulation material, as well as the environmental information such as temperature, humidity, and ultraviolet intensity, are measured and recorded through devices such as sensors, so as to achieve the collection of the real-time state information and the environmental information.

[0036] S4. When the photovoltaic panel needs to perform encapsulation appearance abnormality detection, obtain the corresponding performance parameters of the photovoltaic panel encapsulation material, and then evaluate whether the photovoltaic panel encapsulation material is allowed to continue to be used.

[0037] In a specific embodiment, the process of obtaining the performance parameters corresponding to the photovoltaic panel encapsulation material is as follows: The performance parameters include light transmittance, hardness, and tensile strength. When obtaining the performance parameters corresponding to the photovoltaic panel encapsulation material, in the non-operating state of the photovoltaic panel, the photovoltaic panel encapsulation material is disassembled, and a light transmittance meter, a Shore hardness tester, and a universal material testing machine are respectively used to detect the light transmittance, hardness, and tensile strength of the encapsulation material, thereby obtaining the performance parameters corresponding to the photovoltaic panel encapsulation material. Based on the performance parameters corresponding to the photovoltaic panel encapsulation material, the physical performance evaluation coefficient corresponding to the photovoltaic panel encapsulation material is further calculated.

[0038] In a specific embodiment, the process of calculating the physical performance evaluation coefficient corresponding to the photovoltaic panel encapsulation material is as follows: Obtain the standard performance parameters corresponding to the photovoltaic panel encapsulation material from the database. The standard performance parameters include standard light transmittance, standard hardness, and standard tensile strength. Denote the standard light transmittance, standard hardness, and standard tensile strength as A′, B′, and C′ respectively.

[0039] Through the calculation formula the physical performance evaluation coefficient EN corresponding to the photovoltaic panel encapsulation material is obtained, where A, B, and C respectively represent the light transmittance, hardness, and tensile strength corresponding to the photovoltaic panel encapsulation material, and ι1, ι2, and ι3 respectively represent the weight factors corresponding to the set light transmittance, hardness, and tensile strength.

[0040] It should be noted that the values of ι1, ι2, and ι3 are all greater than 0 and less than 1.

[0041] It should be noted that the performance and failure modes of photovoltaic panels under different aging conditions are collected, and then, through statistical analysis and machine learning algorithms, the correlation coefficients between the performance parameters and the panel life and performance are determined. For example, if the experimental data shows that a 5% decrease in light transmittance leads to a 10% decrease in power generation efficiency, while a 5% decrease in hardness only leads to a 2% decrease in power generation efficiency, initially set the weight factor of light transmittance to be higher than that of hardness. Finally, in combination with expert experience and actual application feedback, the weight factors are fine-tuned, and the weight factors of light transmittance, hardness, and tensile strength are set to 0.6, 0.25, and 0.15 respectively.

[0042] In a specific embodiment, the process of evaluating whether the encapsulation material of a photovoltaic panel is allowed to continue to be used is as follows: According to the time points corresponding to the images of the encapsulation material taken during each historical anomaly detection cycle, which are denoted as each historical time point, the power generation efficiency of the photovoltaic panel corresponding to each historical time point and the current power generation efficiency of the photovoltaic panel are obtained from the database. The power generation efficiency corresponding to each historical time point is calculated by taking the mean to obtain the historical average power generation efficiency. The historical average power generation efficiency and the current power generation efficiency of the photovoltaic panel are denoted as D and D' respectively. Subtracting D' from D gives the change value ΔD of the power generation efficiency of the photovoltaic panel. Then, the comprehensive evaluation value corresponding to the encapsulation material of the photovoltaic panel is analyzed. The comprehensive evaluation value includes -1 and 1. When the comprehensive evaluation value is 1, it indicates that the encapsulation material of the photovoltaic panel is allowed to continue to be used. When the comprehensive evaluation value is -1, it indicates that the encapsulation material of the photovoltaic panel is not allowed to continue to be used.

[0043] In a specific embodiment, the process of analyzing the comprehensive evaluation value corresponding to the encapsulation material of the photovoltaic panel is as follows: Substitute the change value ΔD of the power generation efficiency of the photovoltaic panel and the physical property evaluation coefficient EN corresponding to the encapsulation material of the photovoltaic panel into the comprehensive quality evaluation expression: to obtain the comprehensive evaluation value β corresponding to the encapsulation material of the photovoltaic panel, where D″ represents the threshold value of the change value of the power generation efficiency of the photovoltaic panel, EN′ represents the threshold value of the standard physical property evaluation coefficient corresponding to the encapsulation material of the photovoltaic panel, and and represents the AND relationship.

[0044] It should be noted that D″ and EN′ are used as the basis for evaluating whether the encapsulation material of the photovoltaic panel is allowed to continue to be used. For example, when the values of D″ and EN′ are 20 and 25 respectively, and the values of ΔD and EN are 10 and 20 respectively, since 0 < (ΔD = 10) < (D″ = 20) and (EN = 20) < (EN′ = 25), it indicates that the encapsulation material of the photovoltaic panel is allowed to continue to be used.

[0045] In the embodiment of the present invention, when the photovoltaic panel is in a non-operating state, the encapsulation material is disassembled and the light transmittance, hardness, and tensile strength are detected. By calculating the physical property evaluation coefficient corresponding to the encapsulation material of the photovoltaic panel, it is beneficial to comprehensively evaluate the performance status of the encapsulation material of the photovoltaic panel, ensure the safe and efficient operation of the photovoltaic panel, and avoid premature scrapping caused by performance degradation.

[0046] An abnormal detection method for a photovoltaic panel provided by the present invention, in the process of obtaining the physical changes corresponding to the encapsulation material of the photovoltaic panel, uses a mobile rail camera to take images of the encapsulation material of the photovoltaic panel, compares the taken images of the photovoltaic panel with the images corresponding to each historical abnormal detection period, and compares them with the images of the standard encapsulation material, which is beneficial to timely detect the color change of the encapsulation material of the photovoltaic panel, and then determine whether internal water vapor detection is required, thereby improving the detection efficiency and accuracy and avoiding early damage caused by appearance changes.

[0047] The above content is only an example and illustration of the concept of the present invention. Those skilled in the art of this technology can make various modifications or supplements to the described specific embodiments or use similar methods for substitution, as long as they do not deviate from the concept of the invention or exceed the scope defined by this specification, they should all fall within the protection scope of the present invention.

Claims

1. An abnormal detection method for a photovoltaic panel, characterized in that, Including: S1. Obtain the physical changes corresponding to the encapsulation material of the photovoltaic panel, and then evaluate whether the photovoltaic panel needs to be detected for abnormal encapsulation appearance; The process of evaluating whether the photovoltaic panel needs to be detected for abnormal encapsulation appearance is as follows: Perform abnormal detection according to the abnormal detection cycle of the encapsulation material of the photovoltaic panel. Use a mobile slide camera to take images of the encapsulation material of the photovoltaic panel. By comparing the photovoltaic panel image with the images corresponding to each historical abnormal detection cycle, and comparing the photovoltaic panel image with the standard encapsulation material image, it is determined whether the color of the encapsulation material of the photovoltaic panel has changed. When the color of the encapsulation material of the photovoltaic panel has changed, perform internal water vapor detection on the encapsulation material of the photovoltaic panel; Use a microprobe to detect the internal humidity of the encapsulation material through the encapsulation material interface, and then compare the internal humidity of the encapsulation material with the ambient humidity. Record the comparison result of the internal humidity of the encapsulation material and the ambient humidity as a quantitative evaluation value. The quantitative evaluation value includes the values 0 and 1. When the value of the quantitative evaluation value is 0, it indicates that the photovoltaic panel needs to be detected for abnormal encapsulation appearance. When the value of the quantitative evaluation value is 1, it indicates that the photovoltaic panel does not need to be detected for abnormal encapsulation appearance; The process of comparing the internal humidity of the encapsulation material with the ambient humidity is as follows: Use a humidity sensor to detect the ambient humidity corresponding to the outside of the photovoltaic panel packaging material, and record the ambient humidity corresponding to the outside of the packaging material as sd out , and record the humidity inside the packaging material as sd in , through the water vapor anomaly detection expression: Obtain the quantitative evaluation value α of the comparison result between the humidity inside the packaging material and the ambient humidity. X is the standard humidity difference control threshold; S2. When the photovoltaic panel does not need to be detected for abnormal encapsulation appearance, measure the average ultraviolet intensity at each set time period, and then analyze the relationship between ultraviolet rays and abnormal appearance of the encapsulation material of the photovoltaic panel; S3. Evaluate the impact of abnormal appearance of the encapsulation material of the photovoltaic cell on the photovoltaic panel according to the relationship between ultraviolet rays and abnormal appearance of the encapsulation material of the photovoltaic panel; S4. When the photovoltaic panel needs to be detected for abnormal encapsulation appearance, obtain the performance parameters corresponding to the encapsulation material of the photovoltaic panel, and then evaluate whether the encapsulation material of the photovoltaic panel is allowed to continue to be used.

2. The anomaly detection method for a photovoltaic panel according to claim 1, wherein, The specific analysis process of analyzing the relationship between ultraviolet rays and abnormal appearance of the encapsulation material of the photovoltaic panel is as follows: Set a first control group and a second control group in the installation area of the photovoltaic panel. The difference between the first control group and the second control group is that the second control group is covered with an ultraviolet absorption film above. Set each collection time point within each set time period, and then detect the corresponding average ultraviolet intensity within each set time period, and the color change of the encapsulation material corresponding to the first control group and the second control group within each set time period. Use drawing software to draw the encapsulation material appearance change charts corresponding to the average ultraviolet intensity of the first control group and the second control group within each set time period. The abscissa of the drawn chart is each set time period, and the ordinate of the chart is the RGB value of the surface color of the encapsulation material and the average ultraviolet intensity respectively; By comparing the charts of the first control group and the second control group, if the color change speed of the surface of the encapsulation material of the second control group is less than the color change speed of the surface of the encapsulation material of the first control group when the second control group is covered with an ultraviolet absorption film, it indicates that ultraviolet rays are one of the factors causing abnormal appearance of the encapsulation material of the photovoltaic panel.

3. The abnormal detection method of a photovoltaic panel according to claim 2, wherein, Evaluating the impact of the appearance abnormality of the photovoltaic cell encapsulation material on the photovoltaic panel, the specific evaluation process is as follows: By calculating the quantitative relationship between the degree of color change of the encapsulation material and the ultraviolet intensity within a set time period, thereby evaluating the impact degree of the ultraviolet intensity on the photovoltaic panel, and combining the charts of the first control group and the second control group, and then obtaining the rules and trends of the color change of the encapsulation material under different ultraviolet intensities, thus establishing an abnormal detection model for the photovoltaic panel, and adding secondary influencing factors affecting the abnormality of the encapsulation material to the abnormal detection model of the photovoltaic panel to improve the model, and predicting the development trend of the corresponding appearance abnormality of the photovoltaic panel encapsulation material.

4. The abnormal detection method of a photovoltaic panel according to claim 3, characterized in that Predicting the development trend of the corresponding appearance abnormality of the photovoltaic panel encapsulation material, the specific process is as follows: According to the improved abnormal detection model of the photovoltaic panel, when the photovoltaic panel does not need to be detected for encapsulation appearance abnormality, collect the real-time state information and the environmental information of the photovoltaic panel encapsulation material, and input the collected real-time state information and the environmental information of the photovoltaic panel encapsulation material into the abnormal detection model of the photovoltaic panel, and then obtain the predicted damage duration of the photovoltaic panel encapsulation material, so as to realize the prediction of the development trend of the corresponding appearance abnormality of the photovoltaic panel encapsulation material.

5. The abnormal detection method of a photovoltaic panel according to claim 4, wherein Obtaining the corresponding performance parameters of the photovoltaic panel encapsulation material, the specific obtaining process is as follows: The performance parameters include light transmittance, hardness and tensile strength. When obtaining the corresponding performance parameters of the photovoltaic panel encapsulation material, under the non-operating state of the photovoltaic panel, disassemble the photovoltaic panel encapsulation material, and use a light transmittance meter, a Shore hardness tester and a universal material testing machine to detect the light transmittance, hardness and tensile strength of the encapsulation material respectively, thereby obtaining the corresponding performance parameters of the photovoltaic panel encapsulation material, and calculating the corresponding physical property evaluation coefficient of the photovoltaic panel encapsulation material according to the corresponding performance parameters of the photovoltaic panel encapsulation material.

6. The abnormal detection method of a photovoltaic panel according to claim 5, characterized in that, Calculating the corresponding physical property evaluation coefficient of the photovoltaic panel encapsulation material, the specific calculation process is as follows: Obtain the corresponding standard performance parameters of the photovoltaic panel encapsulation material from the database. The standard performance parameters include standard light transmittance, standard hardness and standard tensile strength. Denote the standard light transmittance, standard hardness and standard tensile strength as A′, B′ and C′ respectively; Through the calculation formula the physical property evaluation coefficient EN of the photovoltaic cell panel packaging material is obtained, where A, B, and C respectively represent the light transmittance, hardness, and tensile strength corresponding to the photovoltaic cell panel packaging material, and ι1, ι2, and ι3 respectively represent the weight factors corresponding to the set light transmittance, the weight factor corresponding to the hardness, and the weight factor corresponding to the tensile strength.

7. The abnormal detection method of a photovoltaic panel according to claim 6, characterized in that, Evaluating whether the photovoltaic panel encapsulation material is allowed to continue to be used, the specific evaluation process is as follows: According to the time points corresponding to the encapsulation material images taken during each historical anomaly detection cycle, which are denoted as each historical time point, the power generation efficiency of the photovoltaic panel corresponding to each historical time point and the current power generation efficiency of the photovoltaic panel are obtained from the database. The power generation efficiency corresponding to each historical time point is calculated by the mean value to obtain the historical average power generation efficiency. The historical average power generation efficiency and the current power generation efficiency of the photovoltaic panel are denoted as D and D′ respectively. D is subtracted from D′ to obtain the change value of the power generation efficiency of the photovoltaic panel, ΔD. Furthermore, the comprehensive evaluation value corresponding to the encapsulation material of the photovoltaic panel is analyzed. The comprehensive evaluation value includes -1 and 1. When the comprehensive evaluation value is 1, it indicates that the encapsulation material of the photovoltaic panel is allowed to continue to be used. When the comprehensive evaluation value is -1, it indicates that the encapsulation material of the photovoltaic panel is not allowed to continue to be used.

8. The abnormal detection method of a photovoltaic panel according to claim 7, characterized in that, The specific analysis process of the comprehensive evaluation value corresponding to the encapsulation material of the photovoltaic panel is as follows: Substitute the change value ΔD of the power generation efficiency of the photovoltaic panel and the physical property evaluation coefficient EN corresponding to the encapsulation material of the photovoltaic panel into the comprehensive quality evaluation expression: Obtain the comprehensive evaluation value β corresponding to the encapsulation material of the photovoltaic panel, where D″ represents the threshold value of the change value of the power generation efficiency of the photovoltaic panel, EN′ represents the threshold value of the standard physical property evaluation coefficient corresponding to the encapsulation material of the photovoltaic panel, and and represents the AND relationship.

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