Battery piece test probe dismounting device

Abstract

A battery piece test probe dismounting device comprises a first clamping assembly, a second clamping assembly and a lifting support. The first clamping assembly and the second clamping assembly are arranged on the lifting support, the included angle between the first clamping strip and the second clamping strip is a right angle, the first clamping strip is arranged to clamp test probes in rows, and the second clamping strip is arranged to clamp test probes in columns, so that double clamping of a single test probe is realized, and the test efficiency is improved. The clamping stability of the test probe is improved, and the test probe is prevented from slipping in the pulling-out process; the second clamping strip and the first clamping strip are arranged to be perpendicular to each other, so that the directions of the clamping forces applied to the single test probe are perpendicular to each other, and the clamping forces applied to the single test probe on the horizontal plane limit the swing of the test probe, thereby ensuring that the test probe does not incline or bend in the pulling-out process. The verticality can be always maintained, and the probe row and the probe groove are prevented from being damaged.

Description

Technical Field

[0001] The invention belongs to the technical field of solar cell testing, and in particular relates to a device for disassembling a probe for testing a solar cell. Background Art

[0002] At present, the conventional method of testing silicon-based solar cells under mass production conditions is mainly to clamp the cell with upper and lower probes for testing. That is, the upper and lower probes contact the electrodes on the front and back of the cell at corresponding positions for testing. The probes that directly contact the cell electrodes are more severely worn under mass production conditions and need to be replaced regularly, otherwise it will affect the test results.

[0003] Currently, the commonly used test probe rows include 32 pins / row, 36 pins / row and 48 pins / row, which are used according to the size of the test battery cells. The tools for removing the probes are mainly clamp-type tools. When removing the probes, a large clamping force needs to be applied to the probes. When pulling out the probes, the probes may tilt and cannot maintain verticality, thereby damaging the probe row and the probe slot. Summary of the invention

[0004] In view of the above situation, in order to overcome the defects of the prior art, the present invention provides a battery cell test probe removal device to at least partially solve the above technical problems.

[0005] The technical solution adopted by the present invention is as follows: The present invention proposes a battery cell test probe disassembly device, comprising a first clamping assembly, a second clamping assembly and a lifting bracket, wherein the first clamping assembly and the second clamping assembly are arranged on the lifting bracket, and the first clamping assembly and the second clamping assembly are used to clamp and fix the test probe on the probe base, and the positions of the first clamping assembly and the second clamping assembly on the lifting bracket are adjustable; the first clamping assembly comprises a first clamping strip, and the lifting bracket is provided with a first side slide groove, and the first clamping strip is slidably arranged in the first side slide groove; the second clamping assembly comprises a second clamping strip, and the lifting bracket is provided with a second side slide groove, and the second clamping strip is slidably arranged in the second side slide groove; the angle between the first clamping strip and the second clamping strip is a right angle.

[0006] Furthermore, two probe clamping blocks are arranged on the first clamping strip, blade grooves are arranged on opposite sides of the probe clamping blocks, a rotating blade is arranged in the blade groove, and the rotating blade is rotatably connected to the blade groove.

[0007] Furthermore, the first clamping assembly includes a first sliding base, the first clamping strip is fixed on the first sliding base, and the first sliding base is slidably arranged in the first side sliding groove; the second clamping assembly includes a second sliding base, the second clamping strip is fixed on the second sliding base, and the second sliding base is slidably arranged in the second side sliding groove; the second clamping strip is provided with a penetrating central through groove, the central through groove is located at the center position of the second clamping strip, and the first clamping strip passes through the central through groove.

[0008] Furthermore, a scale ruler is provided on the lifting bracket near the second side sliding groove, and a positioning mark line is provided on the second sliding base. The positioning mark line and the scale ruler are used to mark the position of the second sliding base.

[0009] Furthermore, a fastening bolt is provided at the bottom of the second sliding base, and the second sliding base is fixed to the lifting bracket through the fastening bolt. A rotating paddle is provided on the fastening bolt, and the rotating paddle is used to rotate the fastening bolt.

[0010] Furthermore, electric lifts are symmetrically provided on the edge of the lifting bracket, and the electric lifts are used to drive the lifting of the lifting bracket.

[0011] Furthermore, it also includes a fixed table top, which is arranged below the lifting bracket and is used to fix the probe base.

[0012] Furthermore, a bottom chamfer is provided at the bottom position of the second clamping assembly.

[0013] Compared with the prior art, the present invention has the following advantages: 1. The angle between the first clamping bar and the second clamping bar of the present invention is a right angle. The first clamping bar is provided to clamp the test probes in a row, and the second clamping bar is provided to clamp the test probes in a column, thereby realizing double clamping of a single test probe, improving the clamping stability of the test probe, and avoiding slipping of the test probe during the removal process.

[0014] 2. The second clamping strip and the first clamping strip of the present invention are arranged to be perpendicular to each other, so the directions of the clamping forces applied to the individual test probes are also perpendicular to each other. The clamping force applied to the individual test probes on the horizontal plane limits the swinging of the test probes, thereby ensuring that the test probes will not tilt or bend during the removal process, and can always maintain verticality, thereby avoiding damage to the probe row and the probe slot. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A three-dimensional diagram of a battery cell test probe disassembly device proposed in an embodiment of the present invention; Figure 2A front view of a battery cell test probe disassembly device provided by an embodiment of the present invention; Figure 3 A left side view of a battery cell test probe removal device provided by an embodiment of the present invention; Figure 4 A top view of a battery cell test probe removal device provided by an embodiment of the present invention; Figure 5 for Figure 4 The cross-sectional view along the AA direction; Figure 6 for Figure 4 Sectional view along BB direction' Figure 7 for Figure 3 The enlarged view at center Ⅰ; Figure 8 for Figure 4 Magnified view at center II; Fig. 9 for Figure 5 Enlarged view at center III; Fig.10 for Figure 6 Magnified view of point IV in the middle.

[0016] Among them, 100, a first clamping assembly, 200, a second clamping assembly, 300, a lifting bracket, 400, a fixed table, 101, a first sliding base, 102, a first clamping strip, 103, a probe clamp block, 104, a rotating blade, 105, a blade groove, 201, a second sliding base, 202, a second clamping strip, 203, a fastening bolt, 204, a rotating paddle, 205, a positioning mark, 206, a center through groove, 207, a bottom chamfer, 301, a first side slide groove, 302, a second side slide groove, 303, an electric lift, 304, a scale ruler, 401, a probe base, 402, a test probe.

[0017] The accompanying drawings are used to provide further understanding of the present invention and constitute a part of the specification. They are used to explain the present invention together with the embodiments of the present invention and do not constitute a limitation of the present invention. DETAILED DESCRIPTION

[0018] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments; based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0019] In the description of the present invention, it should be understood that terms such as “upper”, “lower”, “front”, “back”, “left”, “right”, “top”, “bottom”, “inside” and “outside” indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as limiting the present invention.

[0020] like Figure 1-Figure 10 As shown, the present embodiment is mainly used for disassembling a plurality of test probes 402 linearly arranged on a probe base 401. The clamps used in the existing disassembly tools exert a relatively large pressure on the test probes 402 when clamping and fixing a row of test probes 402, which may easily cause the row of test probes 402 to be tilted and bent due to the force. At the same time, when the test probes 402 are pulled out, the probe row and the probe slot may be damaged.

[0021] The structure of this embodiment includes a first clamping assembly 100, a second clamping assembly 200 and a lifting bracket 300. The first clamping assembly 100 and the second clamping assembly 200 are arranged on the lifting bracket 300. The first clamping assembly 100 and the second clamping assembly 200 are used to clamp and fix the test probe 402. The positions of the first clamping assembly 100 and the second clamping assembly 200 on the lifting bracket 300 are adjustable. According to the size and number of test probes 402 of different specifications, the positions and numbers of the first clamping assembly 100 and the second clamping assembly 200 are adaptively adjusted to clamp each test probe 402. The lifting bracket 300 drives the first clamping assembly 100 and the second clamping assembly 200 to rise and fall to pull out the test probe 402, thereby completing the disassembly of multiple test probes 402 at the same time, thereby improving the disassembly efficiency of the test probe 402.

[0022] The first clamping assembly 100 proposed in this embodiment includes a first clamping bar 102, and the lifting bracket 300 is provided with a first side slide groove 301, and the first clamping bar 102 is slidably set in the first side slide groove 301; the second clamping assembly 200 includes a second clamping bar 202, and the lifting bracket 300 is provided with a second side slide groove 302, and the second clamping bar 202 is slidably set in the second side slide groove 302, and the angle between the first clamping bar 102 and the second clamping bar 202 is a right angle. The first clamping bar 102 is provided to clamp the test probes 402 in a row, and the second clamping bar 202 is provided to clamp the test probes 402 in a column, thereby realizing double clamping of a single test probe 402, improving the clamping stability of the test probe 402, and preventing the test probe 402 from slipping during the removal process.

[0023] At the same time, since the second clamping strip 202 and the first clamping strip 102 are arranged to be perpendicular to each other, the directions of the clamping forces applied to the individual test probes 402 are also perpendicular to each other. The clamping force applied to the individual test probes 402 on the horizontal plane limits the swing of the test probes 402, thereby ensuring that the test probes 402 will not tilt or bend during the removal process, and can always maintain verticality, thereby avoiding damage to the probe row and the probe slot.

[0024] When in use, this embodiment sets n first clamping assemblies 100 according to the number n of rows of test probes 402, and adjusts the distance between the first clamping assemblies 100 so that each first clamping strip 102 corresponds to the position of the test probe 402; then, according to the number m of columns of the test probes 402, set m+1 second clamping assemblies 200 so that the spacing between each adjacent second clamping strip 202 corresponds to the position of the test probe 402; the first clamping strip 102 clamps a row of test probes 402 laterally, and the adjacent second clamping strip 202 clamps a row of test probes 402 longitudinally, and the cooperation of the first clamping strip 102 and the second clamping strip 202 realizes bidirectional clamping of each test probe 402; then, the lifting bracket 300 drives the first clamping assembly 100 and the second clamping assembly 200 to rise, and the disassembly of the test probe 402 is completed.

[0025] In this embodiment, two probe clamps 103 are arranged on the first clamp strip 102, and the test probe 402 is clamped by the gap between the two probe clamps 103. At the same time, a blade groove 105 is arranged on the opposite side of the probe clamp 103, and a rotating blade 104 is arranged in the blade groove 105. The rotating blade 104 and the blade groove 105 are rotatably connected.

[0026] The depth of the blade groove 105 proposed in this embodiment gradually increases from top to bottom, and the rotating blade 104 is arranged at the bottom of the blade groove 105. Due to the limitation of the blade groove 105, the rotation range of the rotating blade 104 is above the horizontal plane where the rotating axis of the rotating blade 104 is located. Therefore, when the first clamping assembly 100 descends, the rotating blade 104 contacts the test probe 402 and can rotate upward to allow the test probe 402 to pass through the gap between the probe clamp blocks 103.

[0027] However, when the first clamping assembly 100 rises, since the rotating blade 104 cannot rotate downward, the tip of the rotating blade 104 will be embedded in the test probe 402, thereby firmly clamping the test probe 402. As the first clamping assembly 100 rises, the clamping force of the rotating blade 104 on the test probe 402 will gradually increase, allowing the test probe 402 to be smoothly pulled out.

[0028] The test probe 402 is clamped by setting a probe clamp 103, a rotating blade 104 and a blade groove 105. Even if the rotating blade 104 is embedded in the test probe 402 and damages the surface of the test probe 402, the test probe 402 is a part that is severely worn and needs to be scrapped. The rotating blade 104 can be used for embedded clamping. The rotating blade 104 can achieve a better clamping and fixing effect. In the process of pulling out the test probe 402, the clamping force on the test probe 402 will gradually increase, thereby avoiding the test probe 402 from slipping.

[0029] The first clamping assembly 100 proposed in this embodiment includes a first sliding base 101, the first clamping strip 102 is fixed on the first sliding base 101, and the first sliding base 101 is slidably arranged in the first side sliding groove 301; the second clamping assembly 200 includes a second sliding base 201, the second clamping strip 202 is fixed on the second sliding base 201, and the second sliding base 201 is slidably arranged in the second side sliding groove 302, and the positions of the first clamping strip 102 and the second clamping strip 202 are adjusted by the first sliding base 101 and the second sliding base 201.

[0030] The second clamp 202 proposed in this embodiment is provided with a penetrating central slot 206, and the central slot 206 is located at the center position of the second clamp 202. The first clamp 102 passes through the central slot 206. During specific use, the clamping force applied by the first clamp 102 to the test probe 402 is located at the center position of the second clamp 202. At the same time, the clamping force applied by the second clamp 202 to the test probe 402 is symmetrically located at the upper and lower parts of the first clamp 102, so that the test probe 402 is in a force balance state, reducing the possibility of twisting or tilting of the test probe 402.

[0031] The lifting bracket 300 proposed in this embodiment is provided with a scale ruler 304 near the second side slide groove 302, and the second sliding base 201 is provided with a positioning mark 205. The positioning mark 205 and the scale ruler 304 are used to calibrate the position of the second sliding base 201. When used specifically, the position of the second clamping assembly 200 can be adjusted according to the position and spacing of the test probes 402. At this time, the position and spacing of the second clamping assembly 200 can be determined by the scale ruler 304 and the positioning mark 205, thereby achieving more precise position adjustment. At the same time, no additional external measuring equipment is required, and it is more convenient to use.

[0032] The second sliding base 201 proposed in this embodiment has a fastening bolt 203 at the bottom, and the second sliding base 201 is fixed to the lifting bracket 300 by the fastening bolt 203. The fastening bolt 203 is provided with a rotating paddle 204, and the rotating paddle 204 is used to rotate the fastening bolt 203. When used specifically, after adjusting the position of the second clamping assembly 200, the position of the second clamping assembly 200 has been determined. At this time, the second clamping assembly 200 is fixed in the second side slide groove 302 by the fastening bolt 203 to avoid the position of the second clamping assembly 200 from changing during the disassembly of the test probe 402.

[0033] At the same time, by providing a rotating paddle 204 on the fastening bolt 203, it is convenient to use hands to adjust the tightness of the fastening bolt 203. Since the test probe 402 is an electronic component, it does not need to be disassembled with great force, so the fastening bolt 203 does not need too much fixing torque. It is more convenient to adjust the fastening bolt 203 by rotating the paddle 204.

[0034] The electric lifts 303 are symmetrically arranged on the edge of the lifting bracket 300 proposed in this embodiment. The electric lifts 303 are used to drive the lifting of the lifting bracket 300. When in use, the electric lifts 303 provide symmetrical lifting forces to the lifting bracket 300, so that the lifting bracket 300 can be lifted and lowered smoothly.

[0035] At the same time, in this embodiment, the lifting bracket 300 is driven to move up and down by the electric lift 303 . The electric lift 303 can provide a vertical lifting force to prevent the test probe 402 from being offset by force and causing the test probe 402 to bend and damage the probe slot.

[0036] The electric lift 303 drives the lifting bracket 300 to lift and lower without manual operation, and multiple test probes 402 can be disassembled in one lifting, thereby improving work efficiency and reducing labor waste.

[0037] This embodiment also includes a fixed table 400, which is arranged below the lifting bracket 300. The fixed table 400 is used to fix the probe base 401. Specifically, when in use, the probe base 401 is first fixed on the fixed table 400, and then the lifting bracket 300 drives the first clamping assembly 100 and the second clamping assembly 200 to remove the test probe 402 on the probe base 401.

[0038] According to the different specifications of the probe base 401 and the test probe 402, fixed tables 400 of different sizes are used to ensure that the probe base 401 and the test probe 402 are always under the lifting bracket 300, so that the first clamping assembly 100 and the second clamping assembly 200 can accurately remove the test probe 402.

[0039] The second clamping assembly 200 proposed in this embodiment is provided with a bottom chamfer 207 at the bottom position. During specific use, when the second clamping assembly 200 is lowered, the bottom chamfer 207 of the second clamping strip 202 guides the test probe 402, and guides some test probes 402 that are already tilted into between adjacent second clamping strips 202, thereby improving the applicability of the second clamping assembly 200 and allowing some tilted test probes 402 to be disassembled.

[0040] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0041] The present invention and its embodiments are described above, and such description is not restrictive. The drawings show only one embodiment of the present invention, and the actual structure is not limited thereto. In short, if ordinary technicians in the field are inspired by it, without departing from the purpose of the invention, they can design a structure and embodiment similar to the technical solution without creativity, which should belong to the protection scope of the present invention.

Claims

1. A battery cell test probe removal device, characterized in that: The invention comprises a first clamping assembly (100), a second clamping assembly (200) and a lifting bracket (300), wherein the first clamping assembly (100) and the second clamping assembly (200) are arranged on the lifting bracket (300), the first clamping assembly (100) and the second clamping assembly (200) are used to clamp and fix a test probe (402) on a probe base (401), and the positions of the first clamping assembly (100) and the second clamping assembly (200) on the lifting bracket (300) are adjustable; The first clamping assembly (100) comprises a first clamping strip (102), the lifting bracket (300) is provided with a first side sliding groove (301), and the first clamping strip (102) is slidably disposed in the first side sliding groove (301); The second clamping assembly (200) comprises a second clamping strip (202), the lifting bracket (300) is provided with a second side sliding groove (302), and the second clamping strip (202) is slidably disposed in the second side sliding groove (302); [z1] The angle between the first clamping strip (102) and the second clamping strip (202) is a right angle.

2. The battery cell test probe removal device according to claim 1, characterized in that: Two probe clamping blocks (103) are provided on the first clamping strip (102), blade grooves (105) are provided on opposite sides of the probe clamping blocks (103), a rotating blade (104) is provided in the blade groove (105), and the rotating blade (104) and the blade groove (105) are rotatably connected.

3. The battery cell test probe removal device according to claim 1, characterized in that: The first clamping assembly (100) comprises a first sliding base (101), the first clamping strip (102) is fixedly arranged on the first sliding base (101), and the first sliding base (101) is slidably arranged in a first side sliding groove (301).

4. The battery cell test probe removal device according to claim 3, characterized in that: A scale ruler (304) is provided on the lifting bracket (300) at a position close to the second side sliding groove (302), and a positioning mark line (205) is provided on the second sliding base (201). The positioning mark line (205) and the scale ruler (304) are used to mark the position of the second sliding base (201).

5. The battery cell test probe removal device according to claim 3, characterized in that: A fastening bolt (203) is provided at the bottom of the second sliding base (201), and the second sliding base (201) is fixed to the lifting bracket (300) via the fastening bolt (203). A rotating paddle (204) is provided on the fastening bolt (203), and the rotating paddle (204) is used to rotate the fastening bolt (203).

6. The battery cell test probe removal device according to claim 1, characterized in that: Electric lifts (303) are symmetrically arranged on the edge of the lifting bracket (300), and the electric lifts (303) are used to drive the lifting of the lifting bracket (300).

7. The battery cell test probe removal device according to claim 1, characterized in that: It also comprises a fixed table top (400), wherein the fixed table top (400) is arranged below the lifting bracket (300), and the fixed table top (400) is used to fix the probe base (401).

8. The cell test probe disassembly device according to claim (1), characterized in that: A bottom chamfer (207) is provided at the bottom of the second clamping assembly (200).

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