High spatial resolution measurement method and system for large-aperture nanosecond pulse laser flux
By using a combination of radiochromic film and opaque paper, combined with net optical density distribution fitting, the problems of high spatial resolution and high precision in laser flux measurement in large-aperture laser devices were solved, and low-cost and high-accuracy laser flux measurement was achieved.
Patent Information
- Application Number
- CN202411870661.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2025-10-03
- Estimated Expiration
- 2044-12-18
AI Technical Summary
Existing technologies make it difficult to achieve high spatial resolution and high-precision laser flux measurement in large-aperture laser devices, and the cost is high. The complex optical path also leads to inaccurate measurement results.
A method combining radiochromic film and opaque paper is adopted. The radiochromic film is irradiated once with multiple groups of laser flux beams with different values to obtain the spatial distribution of optical characteristic parameters. The net optical density distribution is used to fit the laser flux distribution, and high spatial resolution measurement is achieved in combination with computer processing.
It achieves micron-level high spatial resolution laser flux measurement, reduces measurement costs, is suitable for large-aperture laser systems, and improves measurement accuracy and reliability.
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Abstract
Citation Information
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