Chip adjusting and testing device and method

Abstract

The embodiment of the invention provides a chip adjusting and testing device and method, and the device comprises a communication control module which is used for connecting a chip with a PC end operation platform; the PC end operation platform is provided with an automatic test module and is used for calling an automatic use case interface through an interface and editing automatic use case parameters so as to test a chip according to an automatic test case, and the PC end operation platform is also provided with a user-defined use case mode and is used for identifying a control keyword, calling a user-defined use case development sub-interface and developing the chip according to the user-defined use case development sub-interface. A user can edit the user-defined use case to generate a user-defined use case interface, so that the chip is subjected to a user-defined test according to the user-defined use case interface; and the instrument control module is used for calling a corresponding test instrument according to the test instrument type input by the PC end operation platform so as to detect the chip and generate test data. The problem that some temporary or sudden test requirements in the chip test process are difficult to meet is solved, and the effect of conveniently testing the chip according to the requirements of a user is achieved.

Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of chip detection, and in particular, to a chip debugging device and method. Background Art

[0002] In recent years, with the continuous development of the semiconductor industry, the functions of chip products have become more complex and the types have become more diverse. As an important part of the chip R&D process, chip debugging, verification and analysis are also facing greater challenges. As an important part of the chip debugging process, chip testing devices have also ushered in more and higher demands.

[0003] At present, chip testing tools often have problems such as single function, strong targeting, poor portability and high code duplication, which makes it difficult to meet some temporary or sudden testing needs during the chip testing process. Summary of the invention

[0004] The embodiments of the present invention provide a chip debugging device and method to at least solve the problem in the related art that it is difficult to meet some temporary or sudden testing requirements in the chip testing process.

[0005] According to an embodiment of the present invention, a chip debugging device is provided, comprising:

[0006] Communication control module, used to connect the chip to the PC operating platform;

[0007] The PC-side operating platform is provided with an automated test module, which is used to call the automated use case interface and edit the automated use case parameters through the interface to test the chip according to the automated test case, and is also provided with a custom use case mode, which is used to identify control keywords and call the custom use case development sub-interface to facilitate the user to edit the custom use case, so as to generate a custom use case interface, so as to perform a custom test on the chip according to the custom use case interface;

[0008] The instrument control module is used to call the corresponding test instrument according to the test instrument type input by the PC operating platform to detect the chip and generate test data.

[0009] According to another embodiment of the present invention, a chip debugging method is provided, including:

[0010] Identify the connection status of the communication control module, instrument control module and chip;

[0011] When the communication control module, the instrument control module and the chip are in a connected state, the test mode of the PC operating platform is identified, and the automated test case interface is called through the interface and the automated test case parameters are edited to test the chip according to the automated test case, or used to identify the control keyword and call the custom test case development sub-interface so that the user can edit the custom test case to generate a custom test case interface, so as to perform a custom test on the chip according to the custom test case interface;

[0012] According to the test instrument type inputted into the PC operating platform, the corresponding test instrument is called to detect the chip and generate test data.

[0013] According to yet another embodiment of the present invention, a computer-readable storage medium is provided, in which a computer program is stored, wherein the computer program is configured to execute the steps of any one of the above method embodiments when run.

[0014] According to yet another embodiment of the present invention, there is provided an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0015] Through the present invention, users can perform comprehensive tests on the chip according to their needs by selecting the PC operating platform for automated testing or customized testing. This flexibility and customizability enable the disclosed chip testing device to meet the testing needs of different users and improve testing efficiency and accuracy. Therefore, the problem of difficulty in meeting some temporary or sudden testing needs during chip testing can be solved, achieving the effect of facilitating chip testing according to user needs. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is a schematic structural diagram of a chip debugging device according to an embodiment of the present invention;

[0017] Figure 2 is a structural schematic diagram of a UI interaction interface according to an embodiment of the present invention;

[0018] Figure 3 is a flow chart of a chip debugging method according to an embodiment of the present invention;

[0019] Figure 4 is a flowchart of testing using an automated use case or a custom use case according to an embodiment of the present invention;

[0020] Figure 5 It is a flowchart of generating a customized report or generating an indicator debugging optimization solution according to an embodiment of the present invention.

[0021] Explanation of the accompanying drawings: 1. Communication control module; 11. Communication control board; 12. Communication protocol interface library; 2. PC operating platform; 21. Manual test module; 22. Automatic test module; 23. Data analysis module; 3. Instrument control module; 31. Matrix switch; 32. Universal instrument interface library; 33. Instrument library; 4. DUT. DETAILED DESCRIPTION

[0022] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings and in combination with the embodiments.

[0023] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0024] In this embodiment, a chip debugging device is provided.

[0025] Figure 1 is a schematic diagram of the structure of a chip debugging device according to an embodiment of the present invention. Figure 1 As shown, the device comprises:

[0026] Communication control module 1, used to connect the chip to the PC operating platform 2;

[0027] In an exemplary embodiment, on the PC operating platform 2, the user selects the chip model to be connected through a setting menu or interface, and sets the communication configuration parameters according to the chip model.

[0028] The PC-side operating platform 2 sends the communication configuration parameters to the communication control module 1 .

[0029] The communication control module 1 selects the corresponding communication control interface for configuration according to the communication configuration parameters, completes the connection with the chip, and realizes normal communication with the chip.

[0030] The communication control module 1 establishes a communication channel with the PC operating platform 2, so that the PC operating platform 2 can directly communicate with the chip.

[0031] The PC-side operating platform 2 can send read and write commands or other operating instructions to the communication control module 1, and the communication control module 1 forwards them to the chip for corresponding operations.

[0032] The communication control module 1 reads the response data from the chip and transmits it to the PC operating platform 2 for the user to view and analyze.

[0033] Through the above settings, the communication control module 1 can automatically select the appropriate communication interface and protocol for connection according to the communication configuration parameters on the PC operating platform 2. In this way, the user does not need to replace the communication control board, but only needs to set the communication configuration parameters through the PC operating platform 2 to achieve connection with different types of chips. Such a solution simplifies the operation steps, improves the flexibility and convenience of the connection and the versatility of the device.

[0034] The PC-side operating platform 2 is provided with an automated test module 22, which is used to call the automated test case interface and edit the automated test case parameters through the interface to test the chip according to the automated test case. It is also provided with a custom test case mode, which is used to identify control keywords and call the custom test case development sub-interface to facilitate the user to edit the custom test case, so as to generate a custom test case interface, so as to perform a custom test on the chip according to the custom test case interface;

[0035] In an exemplary embodiment, for the automated testing module 22:

[0036] The user can select the automated test module 22 on the interface of the PC operating platform 2 .

[0037] The available automation use case interfaces are displayed on the interface, and users can select the required interface to test the chip.

[0038] Users can edit automation use case parameters, such as chip operating mode, test voltage, etc.

[0039] Users can set test conditions and rules, such as the number of test case loops, concurrency, etc.

[0040] After the user clicks the start test button, the PC operating platform 2 will automatically call the selected automation use case interface and perform configuration and testing according to the parameters set by the user.

[0041] The test status will be displayed on the interface, including the number of passed cases, the number of failed cases, error messages, etc.

[0042] For custom use case mode:

[0043] The user can select a custom use case mode on the interface of the PC operating platform 2.

[0044] Users can enter control keywords to call the custom use case development sub-interface.

[0045] The custom use case development sub-interface will be displayed on the interface, and users can edit custom use cases in this interface.

[0046] Users can call different interfaces or functions to write their own test logic in custom use cases.

[0047] A custom use case interface can be generated which will execute the test according to the user defined test logic.

[0048] Users can set parameters and conditions for custom tests, similar to the automated testing module 22.

[0049] In the above manner, users can select automated test or custom test mode as needed and conduct comprehensive testing of the chip. The automated test module 22 provides some predefined test case interfaces and parameter editing functions, which are convenient for users to quickly conduct tests. The custom case mode provides higher flexibility, allowing users to define test logic according to their own needs and write their own test cases. The combination of the two modes can meet the needs of different users and improve test efficiency and accuracy.

[0050] The instrument control module 3 is used to call the corresponding test instrument according to the test instrument type input by the PC operating platform 2 to detect the chip and generate test data.

[0051] The PC operating platform 2 generates a test report based on the test data, including test results and charts.

[0052] In the above manner, the user can input the test instrument type and parameters on the PC operating platform 2, and then call the corresponding test instrument through the instrument control module 3 to perform chip detection. The instrument control module 3 communicates with the instrument, sets the test parameters and collects test data. Finally, the PC operating platform 2 generates a test report based on the test data and provides it to the user for analysis and evaluation. Such a solution can realize automated instrument control and data collection, and improve test efficiency and accuracy.

[0053] In summary, since users can perform comprehensive automated testing on the chip by selecting automated testing or customized testing on the PC operating platform 2 according to their needs. This flexibility and customizability enables the disclosed chip testing device to meet the testing needs of different users, improve testing efficiency and accuracy, and ensure the quality and reliability of the chip. Therefore, the problem of difficulty in meeting some temporary or sudden testing needs during chip testing can be solved, achieving the effect of facilitating testing of chips according to user needs.

[0054] In one embodiment, the PC operating platform 2 is further provided with a data analysis module 23 for processing and analyzing the test data, and generating a customized report in combination with the interface configuration report content and chart format.

[0055] In one embodiment, the data analysis module 23 is further used to respond to the user's request for an adaptive optimization solution, further analyze the results of processing and analyzing the test data, and generate an indicator adjustment optimization solution.

[0056] In one embodiment, the communication control module 1 includes a communication control board 11 and a communication protocol interface library 12;

[0057] The communication control board 11 integrates a low-speed serial communication interface conversion circuit, a high-speed Ethernet interface conversion circuit and a universal connector for connecting different types of chips;

[0058] In an exemplary embodiment, the communication control board 11 is a communication interface control board dedicated to the device, which integrates low-speed serial interface and high-speed Ethernet interface conversion circuits, can adapt to multiple types of communication interfaces, and is connected to DUT4 through the universal connector of the communication control board 11 to enable the PC operating platform 2 to communicate with the chip through the communication control board 11.

[0059] The communication protocol interface library 12 is integrated in the PC operating platform 2 and is provided with a variety of communication protocol interfaces to adapt to the communication protocols of a variety of chips.

[0060] In one embodiment, the instrument control module 3 includes a matrix switch 31, a universal instrument interface library 32, and a variety of test instruments in an instrument library 33;

[0061] The universal instrument interface library 32 is integrated in the PC-side operating platform 2 to call the connection function interface to connect the PC-side operating platform 2 with various test instruments in the instrument library 33;

[0062] In one embodiment, the universal instrument interface library 32 also calls the corresponding test instrument according to the instrument control instruction to operate the test instrument;

[0063] The matrix switch 31 is used to control the ports of DUT4 to be connected or disconnected with the test instrument. DUT4 is a test circuit board integrated with the chip to be tested.

[0064] In an exemplary embodiment, the instrument library 33 loads and calls the VISA library, performs programming based on the SCPI instruction set according to the instruction protocols and business requirements of each instrument, encapsulates a custom function interface, and constructs a variety of instrument call libraries. In combination with the needs of chip, especially analog chip debugging business for multi-instrument collaboration, a unified instrument call interface is implemented through programming language design, and the interaction between the host computer and various instruments is realized through the matching of business keywords, and instrument connection control, command sending and data receiving are performed. Among them, VISA (Virtual Instrument Software Architecture, referred to as "Visa"), that is, virtual instrument software architecture, is the general term for I / O interface software standards and their specifications formulated by the VXIplug&play Alliance. VISA provides a standard I / O function library for instrument programming, called the VISA library. The VISA function library resides in the computer system and is a standard software communication interface between the computer and the instrument, through which the computer controls the instrument. SCPI (Standard Commands for Programmable Instruments) is a universal instrument control language used to control and communicate various programmable instruments and equipment. The SCPI instruction set defines a set of standardized commands and syntax rules, making instruments from different manufacturers consistent and interoperable in control and communication.

[0065] In one implementation, the communication control board 11 supports at least one of the following communication modes to communicate with the chip: SPI, I2C, TCP, and UART.

[0066] In an exemplary embodiment, the communication protocol interface library 12 is integrated into the PC operating platform 2, and an information interaction interface based on the principles of multiple protocols such as I2C, SPI, Uart, TCP, etc. is developed. On the basis of the communication protocol, the interaction interface is encapsulated in combination with the specific chip debugging business scenario, and the interaction instructions are received and parsed, and corresponding incentives are issued to the chip, thereby realizing support for multiple communication methods between the platform and the chip.

[0067] In one embodiment, the universal instrument interface library 32 supports at least one of the following communication modes to communicate with various test instruments: TCP, GPIB, and RS232.

[0068] Since chip debugging, especially batch automated testing, requires the coordination of multiple instruments to test multiple scenarios, multiple channels and multiple indicators of the chip, in order to solve the time and labor costs of frequent cable replacement, this device is designed with an instrument library 33 and a matrix switch 31 to connect with the device under test, and the control of the instrument is achieved through TCP, GPIB, RS232 and other methods, realizing communication between the PC operating platform 2 and the instrument.

[0069] In an exemplary embodiment,

[0070] Taking the example of enabling the PC operating platform 2 to communicate with the test instrument through TCP communication, the following methods can be used in the configuration stage:

[0071] In the setting interface of the universal instrument interface library 32, select the TCP communication mode.

[0072] Enter the test instrument's name, IP address, and port number to establish a TCP connection with the test instrument.

[0073] Confirm the settings and save them, and the universal instrument interface library 32 will use the TCP communication method to establish a connection with the test instrument.

[0074] Through the above configuration, the universal instrument interface library 32 can perform corresponding settings and parameter configurations according to the communication method selected by the user to achieve communication with the test instrument. The user only needs to select the appropriate communication method according to the specific situation and perform corresponding settings to achieve communication between the PC operating platform and the test. Such a solution provides flexibility and scalability, allowing the universal instrument interface library 32 to adapt to the needs of different communication methods.

[0075] In one embodiment, the PC operating platform 2 is also provided with a manual testing module.

[0076] In an exemplary embodiment, the manual debugging module is divided into three interfaces according to the granularity of chip operations, which respectively support users to perform single or batch register read and write operations, chip sub-module step-by-step debugging, chip system-level configuration and other services, thereby realizing software tool support for manual debugging and optimization of chip test indicators.

[0077] In an exemplary embodiment, the PC-side operating platform 2 is split into multiple groups of plug-in modules according to functions, integrating three business modules: manual debugging, automated testing, and batch data processing and analysis. The operating platform identifies the actions of the interactive interface through slot functions, extracts the corresponding interface parameters, parses the parameters through programming languages, and calls the underlying functions of the corresponding plug-in library to coordinate the above-mentioned communication control module 1 and instrument control module 3 to perform chip pre-debugging, mid-term automated testing, and late batch data processing and analysis services. In the development of this operating platform, by using template classes for generic programming, common modules are plug-inized, and a multi-level UI interactive interface is designed. The corresponding module business operation interface can be loaded according to the business scenarios required by the debugging process, and the corresponding project dynamic library and underlying interface can be called to support multi-function and multi-business scenarios during chip debugging. Therefore, while improving the scalability of the platform, the cost of later software development is reduced.

[0078] Figure 2is a schematic diagram of the structure of a UI interaction interface according to an embodiment of the present invention, such as Figure 2 As shown,

[0079] In one embodiment, a UI interaction interface is also included, which is used to enable the PC operating platform 2 to obtain user instructions.

[0080] In an exemplary embodiment, the UI interactive interface is the common part of the entire platform application, including a menu bar, a service switching module, a log bar, and an operation service interface. Among them, the menu bar is a folding interface, including a communication configuration and an instrument configuration interface. The service interface to be operated and the log bar will switch with the selection of the service.

[0081] The business switching module includes a manual test module, an automated test mode, and a data analysis mode, so it can support three types of chip debugging and verification services. Users can operate the interface to switch services. After the selection is made, the name of the target business module and the execution interface will be displayed on the interface of the business to be operated. The operation interface of the three major business modules is also divided into multiple sub-interfaces according to the functional operation. Among them, manual debugging includes register operation, single-step configuration of chip sub-modules, and system configuration interface; the automated test business interface includes test environment configuration, use case editing, custom use case development, and test interface; data analysis includes database configuration, data import, mathematical processing, mathematical statistics, and report generation interfaces. The sub-pages of each business can be switched according to user operations and displayed on the interface of the business to be operated.

[0082] The highly interactive and multi-level UI interactive interface design of this platform can realize flexible switching of multiple business modules and multiple debugging and verification process operations. It is convenient and efficient, which not only improves the user operation experience, but also helps users improve chip verification efficiency.

[0083] It should be noted that the above-mentioned modules can be implemented by software or hardware. For the latter, it can be implemented in the following ways, but not limited to this: the above-mentioned modules are all located in the same processor; or, the above-mentioned modules are located in different processors in any combination. As used above, the term "module" can implement a combination of software and / or hardware for a predetermined function. Although the device described in the following embodiments is preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceived.

[0084] In this embodiment, a chip debugging method is also provided. Figure 3 is a flow chart of a chip debugging method according to an embodiment of the present invention. Figure 3 As shown, the process includes the following steps:

[0085] Step S301, identifying the connection status between the communication control module 1, the instrument control module 3 and the chip;

[0086] In an exemplary embodiment, corresponding hardware status indicator lights may be provided on the communication control module 1, the instrument control module 3 and the chip. By observing the on and off of the indicator lights, the connection status may be determined. For example, the indicator lights on the communication control module 1 and the instrument control module 3 may indicate the connection status with the PC-side operating platform 2, or, on the PC-side operating platform 2, the connection status between the communication control module 1, the instrument control module 3 and the chip may be displayed through the software connection status interface. The interface may display information such as the name of the connected device, the connection status and the communication parameters. The user may determine the connection status by viewing the interface. For example, the connection status between the communication control module 1 and the PC-side operating platform 2, the connection status between the instrument control module 3 and the communication control module 1, and the connection status between the instrument control module 3 and the chip may be displayed. Alternatively, the communication control module 1 and the instrument control module 3 may record log information during the communication process. By viewing the communication log, it may be determined whether the connection status is normal. For example, the log may record the time and result of the communication control module 1 establishing the connection with the PC-side operating platform 2, as well as the communication process and result between the instrument control module 3 and the chip. Therefore, by the above method, the connection status between the communication control module 1, the instrument control module 3 and the chip may be identified. Users can determine whether the connection is normal through the hardware indicator light, software connection status interface and communication log, so as to perform corresponding debugging and troubleshooting.

[0087] Step S302, when the communication control module 1, the instrument control module 3 and the chip are in a connected state, identify the test mode of the PC-side operating platform 2, call the automated test case interface through the interface and edit the automated test case parameters to test the chip according to the automated test case, or identify the control keyword and call the custom test case development sub-interface to facilitate the user to edit the custom test case, so as to generate the custom test case interface, so as to perform a custom test on the chip according to the custom test case interface;

[0088] In an exemplary embodiment, regarding the identification of the test mode of the PC-side operating platform 2: a test mode selection interface is designed on the PC-side operating platform 2, and the user can select different test modes through the interface. The selection can be provided by a drop-down menu or a button. The current test mode is determined by the user's selection.

[0089] About calling the automation case interface and editing the automation case parameters: According to the test mode selected by the user, an interface is designed on the PC operating platform 2 to provide the calling and parameter editing functions of the automation case interface. The user can select the automation case to be executed and set the relevant parameters. For example, the user can select an automation case for testing chip communication and set the communication parameters, such as baud rate, data bit, stop bit, etc.

[0090] Regarding the execution of automated test cases: According to the automated test case name and parameters set by the user, the PC-side operating platform 2 calls the corresponding test case interface, communicates with the chip through the communication control module 1 and the instrument control module 3, and tests the chip. The test results can be displayed in real time on the operating platform for the user to view.

[0091] Regarding identifying control keywords and calling the custom use case development sub-interface: an interface is designed on the PC-side operating platform 2 to identify control keywords and call the custom use case development sub-interface. When the user encounters an operation that needs to be customized during the test, the user can enter the corresponding control keyword. The operating platform calls the custom use case development sub-interface based on the keyword recognition result.

[0092] About custom use case editing: The custom use case development sub-interface provides users with an editor, where users can write custom use cases according to specific needs. Users can add, modify or delete test steps in the editor, set corresponding parameters and expected results. Users can complete the editing of custom use cases through the interface.

[0093] About generating a custom use case interface: After editing a custom use case, the PC operating platform 2 generates a corresponding custom use case interface based on the user's settings and editing results. The custom use case interface contains information such as user-defined test steps, parameters, and expected results.

[0094] Regarding the execution of custom tests: According to the custom use case name and parameters set by the user, the PC-side operating platform 2 calls the corresponding custom use case interface, communicates with the chip through the communication control module 1 and the instrument control module 3, and performs custom tests on the chip. The test results can be displayed in real time on the operating platform for users to view.

[0095] Step S303, according to the test instrument type input by the PC operating platform 2, the corresponding test instrument is called to detect the chip and generate test data.

[0096] In an exemplary embodiment, an interface is designed on the PC operating platform 2 to provide a function for selecting the type of test instrument. The user can select the type of test instrument to be used through a drop-down menu or a button. For example, the user can select different types of test instruments such as an oscilloscope, a signal generator, and a logic analyzer.

[0097] According to the test instrument type selected by the user, the PC operating platform 2 calls the corresponding test instrument driver. The test instrument driver can be a developed interface or library for communicating and controlling a specific type of test instrument.

[0098] Connect the test instrument to the chip: Connect the test instrument to the chip according to the communication interface of the test instrument (such as USB, LAN, GPIB, etc.). The connection can be achieved through adapters, connecting cables, etc.

[0099] Execute the test. According to the user's needs and test requirements, an interface is designed on the PC operating platform 2 to provide the test parameter setting function. The user can set the parameters required for the test, such as signal frequency, voltage range, sampling rate, etc. The PC operating platform 2 sends corresponding control commands to the test instrument through the test instrument driver to control the test instrument to detect the chip.

[0100] Collect test data. After the test instrument detects the chip, it will generate corresponding test data. The PC-side operating platform 2 communicates with the test instrument through the test instrument driver to obtain the test data. The test data can be displayed on the operating platform in the form of numbers, graphics, etc. for users to view and analyze.

[0101] Save test data. The PC operating platform 2 can provide a function to save test data, and save the test data to a local or remote server. Users can choose the saving format as needed, such as CSV, Excel, etc.

[0102] In the above manner, the user can select the test instrument type on the PC operating platform 2, call the corresponding test instrument to perform detection, obtain test data, and save the test data. In this way, the function of calling the corresponding test instrument according to the test instrument type input on the PC operating platform 2 to detect the chip and generate test data can be realized.

[0103] Through the above steps, since users can perform comprehensive tests on the chip according to their own needs by selecting the PC operating platform 2 for automated testing or customized testing. This flexibility and customizability enables the disclosed chip testing device to meet the testing needs of different users, improve testing efficiency and accuracy, and ensure the quality and reliability of the chip. Therefore, the problem of difficulty in meeting some temporary or sudden testing needs during chip testing can be solved, achieving the effect of facilitating chip testing according to user needs.

[0104] Figure 4 is a flowchart of testing using automated use cases or custom use cases according to an embodiment of the present invention, such as Figure 4 As shown,

[0105] In one embodiment, the method further comprises the steps of:

[0106] Step S401, in response to the communication configuration and instrument configuration operations, the communication configuration parameters and the instrument configuration parameters are acquired, and the communication protocol interface library 12 is called according to the communication configuration parameters through the interface main control module, so that the PC-side operating platform 2 communicates with the chip; the instrument interface library is called according to the instrument configuration parameters, so that the PC-side operating platform 2 is connected to the instrument corresponding to the instrument configuration parameters;

[0107] In an exemplary embodiment, regarding the acquisition of communication configuration parameters: the user sets the communication configuration parameters on the PC operating platform 2, such as selecting to use serial port communication, setting the serial port number to COM1, the baud rate to 9600, and the like.

[0108] About obtaining instrument configuration parameters: The user sets the instrument configuration parameters on the PC operating platform 2, such as choosing to use USB to connect the oscilloscope and setting the communication address to 1.

[0109] About calling the communication protocol interface library 12: the interface main control module calls the serial communication protocol interface library 12 according to the communication configuration parameters set by the user. This interface library is responsible for realizing the communication function with the chip, including opening the serial port, configuring serial port parameters, sending data, receiving data, etc.

[0110] About the instrument interface library call: The interface main control module calls the LAN interface library according to the instrument configuration parameters set by the user. This interface library is responsible for realizing the communication function with the oscilloscope, including connecting to the oscilloscope, sending instructions, receiving data, etc.

[0111] Regarding the communication protocol interface library 12 and the chip communication: the interface main control module communicates with the chip by calling the serial communication protocol interface library 12 and using the communication configuration parameters. For example, open the COM1 serial port, set the baud rate to 9600, send data to the chip, and receive data returned by the chip.

[0112] About the connection between the instrument interface library and the instrument: The interface main control module connects to the oscilloscope by calling the LAN interface library and using the instrument configuration parameters. For example, it establishes a connection with the oscilloscope through the LAN interface, sends control instructions to the oscilloscope, and receives data returned by the oscilloscope.

[0113] Through the above scheme, it is possible to call the communication protocol interface library 12 to communicate with the chip according to the communication configuration parameters, and call the instrument interface library to connect with the oscilloscope according to the instrument configuration parameters. In this way, the PC operating platform 2 can communicate with the chip and connect with the oscilloscope through the interface main control module.

[0114] Step S402, identifying the status of a custom use case development button;

[0115] In an exemplary embodiment, regarding the creation of the interface: a graphical interface library, such as Qt, Tkinter, etc., is used to create an interface of the PC-side operating platform 2. A button is added to the interface for developing a custom use case function selection.

[0116] Among them, Qt is a cross-platform C++ application development framework and a toolkit for building graphical user interfaces (GUIs). It provides a wealth of functions and tools that can be used to develop high-performance, modern applications, including desktop applications, mobile applications, and embedded systems. Tkinter is Python's standard graphical user interface (GUI) toolkit. It is a cross-platform toolkit that can be used to create interface elements such as windows, buttons, text boxes, menus, and handle user input events. Tkinter is developed based on the Tcl / Tk toolkit and provides a series of components and methods that allow developers to easily create and manage user interfaces.

[0117] About setting button status: In the interface main control module, the status of the custom use case development button is determined according to specific conditions. For example, when the interface is initialized, the button can be set to disabled state, and when the user selects the communication configuration parameters and instrument configuration parameters, the button is set to enabled state.

[0118] About monitoring button click events: In the interface main control module, monitor the click events of the custom use case development button. When the user clicks the button, the corresponding event processing function is triggered.

[0119] Through the above steps, you can identify the status of the custom use case development button and perform the corresponding operation when the button is clicked.

[0120] Step S403, when the custom use case development button is on, switch to the custom use case development sub-interface, respond to the user's custom configuration operation, read the interface configuration parameters, call the underlying interface to perform lexical, syntactic, and semantic analysis, and encapsulate the custom use case interface to complete the custom use case development operation.

[0121] In an exemplary embodiment, regarding the custom use case development sub-interface: a graphical interface is created to display configuration parameters and operation buttons for users to develop custom use cases.

[0122] Regarding button status switching: When the user clicks the custom use case development button, determine whether the button is in the open state. If so, switch to the custom use case development sub-interface.

[0123] About reading interface configuration parameters: In the custom use case development sub-interface, obtain the configuration parameters entered by the user. These parameters may include communication configuration, device parameters, etc.

[0124] About calling the underlying interface for parsing: pass the obtained configuration parameters to the underlying interface for lexical, syntactic and semantic parsing. The underlying interface can be an already implemented parsing module or call a third-party parsing library.

[0125] About encapsulating custom use case interface: according to the parsing results, encapsulate the custom use case interface. According to the lexical parsing results, the corresponding data structure can be generated, and according to the semantic parsing results, the interface function or class of the custom use case can be generated.

[0126] About completing the custom use case development operation: With the help of the encapsulated custom use case interface, specific custom use case development operations are implemented. For example, by calling the functions in the custom use case interface, functions such as communication with the device and data processing are implemented.

[0127] Through the above steps, when the custom use case development button is turned on, you can switch to the custom use case development sub-interface, call the underlying interface for parsing according to the user configuration parameters, encapsulate the custom use case interface, and finally complete the development of the custom use case. The whole process involves interface interaction, parameter reading, interface calling, and business logic processing.

[0128] In one embodiment, the method further comprises the steps of:

[0129] Step S404, obtaining the name and parameter configuration of the test case in the test case editing interface, and calling the automated test case interface or the customized test case interface, wherein the test case includes the automated test case and the customized test case, and the parameters include the parameters that need to be configured for the test case;

[0130] In an exemplary embodiment, regarding the use case editing interface: a graphical interface is created for editing the name and parameter configuration of the use case to be tested. The user can enter the name of the use case to be tested and the parameters to be configured in the interface.

[0131] About obtaining the name and parameter configuration of the test case to be tested: obtain the name and parameter configuration of the test case to be tested input by the user from the test case editing interface. These parameter configurations may include communication configuration, device parameters, test data, etc.

[0132] The use cases to be tested can be divided into two types: automated use cases and custom use cases.

[0133] About calling the automated test case interface: If the test case is an automated test case, call the corresponding automated test case interface according to the parameter configuration. This interface may be an already implemented automated test framework that can execute automated test cases and generate test reports.

[0134] This interface can implement specific business logic processing based on the custom use case template provided by the user.

[0135] Regarding case processing: Perform corresponding case processing operations based on the results returned by the called interface. You can generate a test report based on the execution results of the automated case interface, or perform data processing, device control, and other operations based on the execution results of the custom case interface.

[0136] Through the above steps, you can obtain the name and parameter configuration of the test case in the test case editing interface, and call the corresponding interface for processing according to the different types of test cases. This process involves interface interaction, parameter reading, interface calling, and business logic processing. At the same time, different processing methods are selected according to different types of test cases to meet the test requirements.

[0137] Step S405: Based on the automated use case interface or the custom use case interface and following the use case test logic, a chip stimulus instruction and an instrument operation instruction are generated, and the corresponding interfaces of the communication interface library and the instrument interface library are called and issued;

[0138] In an exemplary implementation, first, an automatic use case interface or a custom use case interface is established, which can provide some methods or functions for defining test logic and operation steps.

[0139] Next, write the test case logic and determine how to generate chip stimulus instructions and instrument operation instructions based on specific test requirements and goals. These instructions may include chip configuration, register writing, signal sending, and other operations.

[0140] Using the methods provided by the automatic use case interface or the custom use case interface, chip stimulus instructions and instrument operation instructions can be generated according to the test logic.

[0141] Finally, the interfaces corresponding to the chip excitation instructions and instrument operation instructions are called to send these instructions to the chip and instrument. These interfaces can be chip controller interfaces, device communication interfaces or other related interfaces.

[0142] Through this process, it is possible to generate chip stimulus instructions and instrument operation instructions based on automatic use case interface or custom use case interface, combined with use case test logic, and send them to chips and instruments. In this way, chips and instruments can be tested and controlled to verify their functions and performance.

[0143] Step S406, following the use case test logic, the chip data and the instrument test data are respectively obtained through the communication control module 1 and the instrument control module 3, and processed according to the use case test logic;

[0144] In an exemplary embodiment, first, a use case module is established to define test logic and operation steps. This module may contain a series of test cases, each of which describes a set of test steps and expected results.

[0145] Next, the communication control module 1 is used to communicate with the chip. This module may provide some interfaces or methods for communicating with the chip, sending instructions, obtaining data, and other operations.

[0146] Then, the instrument control module 3 is used to control the instrument equipment and obtain test data. This module may provide some interfaces or methods for controlling the configuration of the instrument equipment, starting the test, obtaining the test results and other operations.

[0147] According to the test logic, the use case module will call the interface of the communication control module 1 to communicate with the chip and send corresponding instructions to obtain chip data. The use case module will also call the interface of the instrument control module 3 to configure the instrument equipment, start the test and obtain the test data.

[0148] Finally, the use case module will process the acquired chip data and instrument test data according to the test logic. This may include data analysis, comparison, recording and other operations to verify whether the chip's functions and performance meet expectations.

[0149] Through this process, the use case module, the communication control module 1 and the instrument control module 3 can be used to obtain chip data and instrument test data, and process them according to the test logic, so as to realize the test and verification of the chip.

[0150] Step S407, use the use case module to call the Excel dynamic library to generate a test data file and notify the main control interface, obtain and update the test status, and display the test status and results.

[0151] In an exemplary embodiment, regarding the use case module: the use case module refers to a set of test cases used for testing, including input data, expected output, expected results, etc. The use case module is the basis of testing and is used to verify the functions and performance of the system or software.

[0152] About Excel dynamic library: Excel dynamic library refers to a library or tool that can interact with Excel files. Through Excel dynamic library, you can read, write and operate the data in Excel files.

[0153] About generating test data files: Generating test data files refers to the process of using Excel dynamic libraries to write test data into Excel files according to the requirements of test cases. Test data files contain input data for testing, which can be used for subsequent test execution.

[0154] About notifying the main control interface: During the test, you can communicate with the main control interface to update the test progress and status in real time. Notifying the main control interface can be through prompt information on the interface, pop-up windows or logs, etc., to feedback the test progress and status to the user or monitoring system.

[0155] About obtaining and updating the test status: During the test process, you can obtain the current test status, such as the test cases in progress, the number of completed test cases, etc., by communicating with the main control interface or other means. According to the obtained test status, you can perform corresponding operations, such as updating the display, recording logs, etc.

[0156] About displaying test status and results: On the main control interface, the current test status and results can be displayed. This can be displayed in the form of text information, graphical interface or progress bar. By displaying the test status and results, users or operators can understand the test progress and results in real time so as to make corresponding treatment in time.

[0157] In summary, the test case module is used to generate the test data file and operate it through the Excel dynamic library. During the test, the test status is obtained and updated by communicating with the main control interface, and finally the test status and results are displayed on the main control interface. In this way, the test can be executed automatically and the results can be displayed in real time.

[0158] Figure 5 is a flowchart of generating a customized report or generating an indicator tuning optimization solution according to an embodiment of the present invention, such as Figure 5 As shown,

[0159] In one embodiment, the method further comprises the steps of:

[0160] Step S501, in response to confirming the operation of using the data analysis module 23, parsing the user instruction, obtaining the service name keyword, loading the data analysis module 23 dynamic library, performing service switching, and displaying the interactive interface of the data analysis module 23 on the UI interactive interface;

[0161] In an exemplary embodiment, first, a use case module is established to define test logic and operation steps. This module may contain a series of test cases, each of which describes a set of test steps and expected results.

[0162] Next, use the Excel dynamic library to generate the test data file. The Excel dynamic library can provide some interfaces or methods for creating, writing, and saving Excel files. The use case module will call the interface of the Excel dynamic library, dynamically generate test data according to the test requirements, and write it into the Excel file.

[0163] At the same time, the use case module will notify the main control interface of the generation status of the test data file. This can be achieved by calling the interface of the main control interface or sending a notification message.

[0164] After receiving the notification, the main control interface will obtain and update the test status. This may include recording the test progress, updating the test results, etc. The main control interface can obtain the test status by calling the interface of the use case module or reading the test data file.

[0165] Finally, the main control interface will display the test status and results. This can be achieved by displaying a progress bar, a table or chart showing the test results on the interface, so that users can monitor the test progress and results in real time.

[0166] Through this process, the use case module can be used to call the Excel dynamic library to generate test data files, and the test status can be obtained and updated through the main control interface, as well as the test status and results can be displayed. This makes it easy to generate test data, manage test status, and display results.

[0167] Step S502, in response to the user's operation of using the use case import interface, data processing and report generation interface, input customized parameters for data analysis; the interface recognizes the configuration completion signal, notifies the operating platform to extract the keywords of the target use case, calls the underlying database to find the target data, imports the automated test data, and further parses the parameter configuration of the data processing and report generation interface, calls the corresponding function interface of the data processing library, performs mathematical operations and statistical analysis on the test data; uses the drawing processing library to extract the parameter configuration of the report configuration interface, calls the script configuration interface, generates and saves the report configuration script;

[0168] In an exemplary embodiment, the user operates in the use case import interface and inputs customized parameters for data analysis, which may include data screening conditions, data processing methods, etc.

[0169] The user configures parameters in the data processing and report generation interface, including selecting the mathematical operations and statistical analysis methods to be performed. These parameters may include mean value, standard deviation, correlation coefficient, etc.

[0170] The interface recognizes the configuration completion signal and notifies the operating platform to extract the keywords of the target use case. These keywords can be used to find the corresponding test data in the underlying database.

[0171] The operating platform calls the underlying database and searches for target data based on the extracted keywords. These data can be test case execution results, performance data, etc.

[0172] The automated test data is imported, parsed and processed. According to the parameters configured by the user in the data processing interface, the function interface of the data processing library is called to perform mathematical operations and statistical analysis. For example, the average value, standard deviation, etc. are calculated.

[0173] Use the drawing processing library to extract the parameter configuration of the report configuration interface, including chart type, axis settings, etc. Then, call the script configuration interface to generate and save the report configuration script.

[0174] Through this process, users can perform data analysis and generate reports according to their needs. Users can configure parameters on the interface, and the system will automatically process data and generate reports based on the configured parameters. This makes it easy to analyze test data and generate visual reports.

[0175] Step S503, identifying the state of the data optimization selection button;

[0176] In an exemplary implementation, first, find the interface or page where the data optimization selection button is located.

[0177] Then, the position and attributes of the button on the interface can be determined through the interface recognition method.

[0178] Next, you need to get the state of the button. A button can have multiple states, such as selected, unselected, disabled, etc.

[0179] By analyzing the properties of the button, you can determine what the state of the button is.

[0180] The purpose of this operation is to determine the state of the data optimization selection button for use in subsequent data processing and operations. The state of the identification button can provide some feedback to the user to help the user determine the current data optimization state and make corresponding adjustments and operations as needed.

[0181] Step S504, when the data optimization selection button is in the off state, the main control interface is used to identify the report generation instruction, the script parsing interface in the drawing processing library is called, the report configuration script is parsed, the drawing engine is called to draw, and a customized data analysis report is output.

[0182] In an exemplary embodiment, first, it is necessary to confirm that the data optimization selection button is in the off state. Through the interface recognition method, the interface where the data optimization selection button is located can be found, and the state attribute of the button can be obtained. If the button state is off, that is, unselected, the next step can be performed.

[0183] Next, you need to use the main control interface to identify the report generation instructions. The main control interface refers to the main interface used to control data analysis and report generation. The interface can be found and the location and properties of the report generation instructions can be identified through the interface identification method.

[0184] Then, the script parsing interface in the drawing processing library is called to parse the report configuration script. The report configuration script is a script file used to configure the report, which contains configuration information such as the chart type to be displayed, data processing method, chart style, etc.

[0185] According to the report configuration information obtained by parsing, the drawing engine is called to perform drawing operations. The drawing engine can use appropriate drawing methods and styles according to the report configuration information to visualize the data in the form of charts.

[0186] Finally, a customized data analysis report is output. The data analysis results can be displayed in the form of charts generated by the drawing engine and output as a report file.

[0187] The purpose of this process is to generate customized data analysis reports using the drawing processing library and drawing engine according to the user's instructions and report configuration in the main control interface when the data optimization selection button is turned off. By visualizing the data as a chart, the data analysis results can be more intuitively displayed to help users make decisions and judgments.

[0188] In one embodiment, after generating and saving the report configuration script, the method further includes:

[0189] Step S505, when the data optimization selection button is turned on, in response to the user selecting the operation of generating an adaptive optimization solution, extracting the parameter values ​​of the solution optimization configuration interface, and generating an indicator debugging optimization solution according to the data of the report configuration script and the chip configuration data.

[0190] In an exemplary embodiment, first, it is necessary to confirm that the data optimization selection button is in the on state. Through the interface recognition method, the interface where the data optimization selection button is located can be found, and the state attribute of the button can be obtained. If the button state is on, that is, selected, the next step can be performed.

[0191] Next, in response to the user's selection of the operation of generating an adaptive optimization solution, this means that the user has performed a corresponding operation on the interface and selected to generate an adaptive optimization solution. The system needs to recognize the user's selection and perform the corresponding operation.

[0192] Extract the parameter values ​​of the solution optimization configuration interface. The solution optimization configuration interface refers to the interface used to configure solution optimization, where users can set optimization parameters, constraints, etc. The system needs to find the interface through interface recognition methods and extract parameter values.

[0193] Generate an indicator tuning optimization plan based on the data in the report configuration script and the chip configuration data. The report configuration script is a script file used to configure the report, which contains configuration information such as the chart type to be displayed, data processing method, and chart style. The chip configuration data is chip-related configuration information used to guide the generation of optimization plans. The system needs to generate an indicator tuning optimization plan based on this data, that is, calculate and generate the optimization plan based on the parameter values ​​set by the user and the system configuration data.

[0194] The purpose of this process is to extract parameter values ​​and generate an index tuning optimization plan based on the user's operation and configuration, combining the report configuration script and chip configuration data, when the data optimization selection button is turned on. This plan can help users perform index tuning and optimization to improve system performance and efficiency.

[0195] In summary, the application of this platform is further explained by taking the scenario of automatic testing and data processing and analysis of this device as an example. However, as mentioned above, this platform can provide software tool support for various business scenarios such as commissioning, verification and analysis of multiple types of chips. Therefore, the example is only a part of the application of this platform, including but not limited to this.

[0196] First, users need to follow the business Figure 1 The entire test device is set up as shown, PC side. This example first performs automated testing, and then selects the data analysis module 23 to perform data processing and analysis business. The specific operation steps are as follows:

[0197] It should be noted that the executable use cases for automated testing of this device include use cases that have been programmed and implemented by software developers and encapsulated in the corresponding project library, as well as use cases that users have customized and developed through the UI interface of this device. As mentioned above, the user operation interface selects the automated testing business module, and its control interface will be displayed on the business interface to be operated on the platform interface. The user can operate the interface to configure communication and instrument parameters, edit test cases, customize use case development and other options, and then start the test on the test interface and understand the test status in real time.

[0198] In one implementation, the communication control board 11 supports at least one of the following communication modes to communicate with the chip: SPI, I2C, TCP, and UART.

[0199] In one implementation, the universal instrument interface library 32 supports at least one of the following communication modes to communicate with the chip: TCP, GPIB, and RS232.

[0200] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by adding the necessary general hardware platform with the help of software, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present invention.

[0201] An embodiment of the present invention further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above method embodiments when running.

[0202] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0203] An embodiment of the present invention further provides an electronic device, including a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0204] In an exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0205] For specific examples in this embodiment, reference may be made to the examples described in the above embodiments and exemplary implementation modes, and this embodiment will not be described in detail herein.

[0206] Obviously, those skilled in the art should understand that the above modules or steps of the present invention can be implemented by a general computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be executed in a different order than here, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. Thus, the present invention is not limited to any specific combination of hardware and software.

[0207] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A chip debugging device, characterized in that: include: Communication control module, used to connect the chip to the PC operating platform; The PC-side operating platform is provided with an automated test module, which is used to call the automated use case interface and edit the automated use case parameters through the interface to test the chip according to the automated test case, and is also provided with a custom use case mode, which is used to identify control keywords and call the custom use case development sub-interface to facilitate the user to edit the custom use case, so as to generate a custom use case interface, so as to perform a custom test on the chip according to the custom use case interface; The instrument control module is used to call the corresponding test instrument according to the test instrument type input by the PC operating platform to detect the chip and generate test data.

2. The device according to claim 1, characterized in that The PC operating platform is also provided with a data analysis module for processing and analyzing the test data, and generating a customized report in combination with the interface configuration report content and chart format.

3. The device according to claim 2, characterized in that The data analysis module is also used to respond to the user's request for an adaptive optimization solution, further analyze the results of processing and analyzing the test data, and generate an indicator adjustment optimization solution.

4. The device according to claim 1, characterized in that The communication control module includes a communication control board and a communication protocol interface library; The communication control board integrates a low-speed serial communication interface conversion circuit, a high-speed Ethernet interface conversion circuit and a universal connector for connecting different types of chips; The communication protocol interface library is integrated into the PC operating platform and is provided with a variety of communication protocol interfaces to adapt to the communication protocols of a variety of chips.

5. The device according to claim 1, characterized in that The instrument control module includes a matrix switch, a universal instrument interface library and an instrument library; The universal instrument interface library is integrated into the PC-side operating platform to call a connection function interface to connect the PC-side operating platform with a variety of test instruments in the instrument library; The matrix switch is used to control the ports of the DUT to be connected or disconnected with the test instrument. The DUT is a test circuit board integrated with the chip to be tested.

6. The device according to claim 4, characterized in that The communication control board supports at least one of the following communication modes to communicate with the chip: SPI, I2C, TCP, UART.

7. The device according to claim 5, characterized in that The universal instrument interface library supports at least one of the following communication modes to communicate with the multiple test instruments: TCP, GPIB, and RS232.

8. The device according to claim 1, characterized in that It also includes a UI interactive interface, which is used to enable the PC operating platform to obtain user instructions.

9. A chip debugging method, characterized in that: include: Identify the connection status of the communication control module, instrument control module and chip; When the communication control module, the instrument control module and the chip are in a connected state, the test mode of the PC operating platform is identified, and the automated test case interface is called through the interface and the automated test case parameters are edited to test the chip according to the automated test case, or used to identify the control keyword and call the custom test case development sub-interface so that the user can edit the custom test case to generate a custom test case interface, so as to perform a custom test on the chip according to the custom test case interface; According to the test instrument type inputted into the PC operating platform, the corresponding test instrument is called to detect the chip and generate test data.

10. The method according to claim 9, characterized in that Also includes: Acquire communication configuration parameters and instrument configuration parameters in response to the communication configuration and instrument configuration operations, and call the communication protocol interface library according to the communication configuration parameters through the interface main control module to enable the PC end operating platform to communicate with the chip; Calling the instrument interface library according to the instrument configuration parameters so that the PC end operating platform is connected to the instrument corresponding to the instrument configuration parameters; Identify the state of the custom use case development button; When the custom use case development button is on, switch to the custom use case development sub-interface, respond to the user's custom configuration operation, read the interface configuration parameters, call the underlying interface to perform lexical, syntactic, and semantic analysis, and encapsulate the custom use case interface to complete the custom use case development operation.

11. The method according to claim 10, characterized in that Also includes: Obtain the name and parameter configuration of the test case in the test case editing interface, and call the automated test case interface or the customized test case interface, wherein the test case includes automated test cases and customized test cases, and the parameters include the parameters that need to be configured for the test case; Based on the automated use case interface or the custom use case interface, following the use case test logic, generate chip stimulus instructions and instrument operation instructions, and call the corresponding interfaces of the communication interface library and the instrument interface library to issue them; Following the use case test logic, the chip data and instrument test data are obtained through the communication control module and the instrument control module respectively, and processed according to the use case test logic; Use the use case module to call the Excel dynamic library to generate a test data file and notify the main control interface, obtain and update the test status, and display the test status and results.

12. The method according to claim 9, characterized in that Also includes: In response to confirming the operation of using the data analysis module, parsing the user instruction, obtaining the service name keyword, loading the data analysis module dynamic library, performing service switching, and displaying the interactive interface of the data analysis module on the UI interactive interface; In response to user operations using the use case import interface, data processing and report generation interface, input of customized parameters for data analysis; The interface recognizes the configuration completion signal, notifies the operating platform to extract the keywords of the target use case, calls the underlying database to find the target data, imports the automated test data, and further analyzes the parameter configuration of the data processing and report generation interface, calls the corresponding function interface of the data processing library, performs mathematical operations and statistical analysis on the test data; uses the drawing processing library to extract the parameter configuration of the report configuration interface, calls the script configuration interface, generates the report configuration script and saves it; Identify the state of the data optimization selection button; When the data optimization selection button is in the off state, the main control interface is used to identify the report generation instruction, the script parsing interface in the drawing processing library is called, the report configuration script is parsed, the drawing engine is called for drawing, and a customized data analysis report is output.

13. The method according to claim 12, characterized in that After generating and saving the report configuration script, it also includes: When the data optimization selection button is turned on, in response to the user selecting the operation of generating an adaptive optimization solution, the parameter values ​​of the solution optimization configuration interface are extracted, and an indicator adjustment optimization solution is generated according to the data of the report configuration script and the chip configuration data.

14. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program implements the steps of the method described in any one of claims 9 to 13 when executed by a processor.

15. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method described in any one of claims 9 to 13 are implemented.

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