Current measurement compensation method for shunt

Abstract

The embodiment of the invention discloses a shunt current measurement compensation method. The method comprises the following steps: acquiring an update voltage and an update current of a shunt and a sampling temperature corresponding to a first temperature sampling point; determining dissipation power according to the update voltage and the update current, and calculating an actual temperature corresponding to the shunt according to the dissipation power and a sampling temperature corresponding to the first temperature sampling point; compensating the updated voltage according to a preset linear temperature formula and the actual temperature corresponding to the diverter to obtain a compensation resistor corresponding to the diverter; and obtaining a measurement voltage corresponding to the shunt, and obtaining a compensation current corresponding to the shunt according to the compensation resistor and the measurement voltage. By implementing the embodiment of the invention, the accuracy of current measurement can be remarkably improved, and the accuracy of current measurement can also be ensured under the condition of long-time operation or environment temperature change.

Description

Technical Field

[0001] The present application relates to the technical field of shunts, and in particular to a shunt current measurement compensation method. Background Art

[0002] Accurately measuring current is crucial in modern power electronics systems, especially in high-power applications such as electric vehicle charging stations. Traditional current measurement methods typically use shunts, inferring the magnitude of the larger current by measuring the small voltage drop across the shunt. However, this measurement method has inherent limitations. In particular, when the current changes rapidly or the ambient temperature fluctuates significantly, the shunt's resistance changes, leading to inaccurate measurement results. Summary of the Invention

[0003] The embodiment of the present application discloses a shunt current measurement compensation method, which can significantly improve the accuracy of current measurement and ensure the accuracy of current measurement even in the case of long-term operation or ambient temperature changes.

[0004] The present invention discloses a shunt current measurement compensation method, which is applied to a current measurement circuit. The current measurement circuit includes a shunt. The method includes: Obtaining an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of the shunt; determining a dissipated power according to the updated voltage and the updated current, and calculating an actual temperature corresponding to the shunt according to the dissipated power and a sampling temperature corresponding to the first temperature sampling point; Compensating the update voltage according to a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistance corresponding to the shunt; A measurement voltage corresponding to the shunt is obtained, and a compensation current corresponding to the shunt is obtained according to the compensation resistor and the measurement voltage.

[0005] As an optional implementation manner, before obtaining the updated voltage, updated current, and sampling temperature corresponding to the first temperature sampling point of the shunt, the method further includes: Calculating a thermal resistance value between an output circuit of the shunt and the first temperature sampling point; The calculating the actual temperature corresponding to the diverter according to the dissipated power corresponding to the diverter and the sampling temperature corresponding to the first temperature sampling point includes: Calculating a shunt temperature difference value according to the dissipated power and the thermal resistance value; The actual temperature corresponding to the diverter is obtained by adding the diverter temperature difference value to the sampling temperature corresponding to the first temperature sampling point.

[0006] As an optional implementation manner, the calculating the thermal resistance value between the output circuit of the shunt and the first temperature sampling point includes: Acquire a first temperature corresponding to the first temperature sampling point and a second temperature corresponding to the second temperature sampling point; the first temperature sampling point and the second temperature sampling point are different temperature sampling points; According to the formula , calculate the thermal resistance between the output circuit of the shunt and the first temperature sampling point, where, is the thermal resistance value, is the first temperature, is the second temperature, is the initial dissipated power.

[0007] As an optional implementation, the method further includes: Acquire the detection voltage collected by the shunt and the sampling temperature corresponding to the first temperature sampling point, and record the power-on time of the current measurement circuit; compensating the detection voltage according to the power-on time to obtain a compensated detection voltage; A compensation current is calculated according to the compensated detection voltage.

[0008] As an optional implementation manner, after obtaining the updated voltage, updated current, and sampling temperature corresponding to the first temperature sampling point of the shunt, the method further includes: Determining a comprehensive correction coefficient according to the updated current and the sampling temperature corresponding to the first temperature sampling point using a preset comprehensive correction coefficient table; Correcting the update current according to the comprehensive correction coefficient to obtain a corrected update current; The determining of the dissipated power according to the updated voltage and the updated current, and calculating the actual temperature corresponding to the shunt according to the dissipated power and the sampling temperature corresponding to the first temperature sampling point, includes: The dissipated power is determined according to the update voltage and the corrected update current, and the actual temperature corresponding to the shunt is calculated according to the dissipated power and the sampling temperature corresponding to the first temperature sampling point.

[0009] As an optional implementation manner, correcting the update current according to the comprehensive correction coefficient to obtain the corrected update current includes: According to the formula , calculate the corrected update current, where is the update current, A current diversion correction coefficient preset for the diverter, is the comprehensive correction coefficient.

[0010] As an optional implementation manner, before obtaining the measured voltage corresponding to the shunt and obtaining the compensation current corresponding to the shunt according to the compensation resistor and the measured voltage, the method further includes: Compensating the update resistor according to the actual temperature to obtain a temperature compensated resistor; Compensating the update resistor according to the update current to obtain a current compensation resistor; The update resistor is compensated according to the temperature compensation resistor and the current compensation resistor to obtain a compensation resistor corresponding to the shunt.

[0011] The present application discloses a shunt current measurement compensation device, which is applied to a current measurement circuit. The current measurement circuit includes a shunt. The device includes: an acquisition module, configured to acquire an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of the shunt; a calculation module, configured to determine a dissipated power according to the updated voltage and the updated current, and calculate an actual temperature corresponding to the shunt according to the dissipated power and a sampling temperature corresponding to the first temperature sampling point; a compensation module, configured to compensate the update voltage according to a preset linear temperature formula and an actual temperature corresponding to the shunt, to obtain a compensation resistance corresponding to the shunt; The determination module is configured to obtain a measurement voltage corresponding to the shunt, and obtain a compensation current corresponding to the shunt according to the compensation resistor and the measurement voltage.

[0012] An embodiment of the present application discloses an electronic device, including a memory and a processor, wherein a computer program is stored in the memory. When the computer program is executed by the processor, the processor implements any one of the shunt current measurement compensation methods disclosed in the embodiments of the present application.

[0013] An embodiment of the present application discloses a computer-readable storage medium storing a computer program, wherein when the computer program is executed by a processor, any one of the shunt current measurement compensation methods disclosed in the embodiment of the present application is implemented.

[0014] Compared with the related art, the embodiments of the present application have the following beneficial effects: The embodiment of the present application provides a shunt current measurement and compensation method, which includes obtaining an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of the shunt; determining the dissipated power based on the updated voltage and the updated current, and calculating the actual temperature corresponding to the shunt based on the dissipated power and the sampling temperature corresponding to the first temperature sampling point; compensating the updated voltage based on a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistor corresponding to the shunt; obtaining a measured voltage corresponding to the shunt, and obtaining a compensation current corresponding to the shunt based on the compensation resistor and the measured voltage. By implementing the embodiment of the present application, the sampling temperature can be calculated based on the obtained updated circuit, updated current, and sampling temperature corresponding to the first temperature sampling point of the shunt to obtain the actual temperature, and the updated voltage can be compensated based on the actual temperature, a preset temperature formula, and the actual temperature corresponding to the shunt to obtain the compensation resistor, thereby improving the accuracy of the measured resistance, thereby improving the accuracy of the compensated current corresponding to the shunt obtained based on the compensation resistor and the measured voltage. By compensating and correcting the measured updated voltage and updated current multiple times, the accuracy of the current measurement can be significantly improved, and the accuracy of the current measurement can be ensured even in the case of long-term operation or changes in ambient temperature. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0016] Figure 1 This is a flow chart of a shunt current measurement and compensation method disclosed in an embodiment of the present application; Figure 2 This is a flow chart of another shunt current measurement and compensation method disclosed in an embodiment of the present application; Figure 3 This is a flow chart of another shunt current measurement and compensation method disclosed in an embodiment of the present application; Figure 4 This is a structural diagram of a shunt current measurement and compensation device disclosed in an embodiment of the present application; Figure 5 This is a structural diagram of an electronic device disclosed in an embodiment of the present application. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0018] It should be noted that the terms "including," "having," and any variations thereof in the embodiments and drawings of this application are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to the process, method, product, or apparatus.

[0019] It will be understood that the terms "first," "second," and the like used herein may be used to describe various elements herein, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, without departing from the scope of this application, a first temperature sampling point may be referred to as a second temperature sampling point, and similarly, a second temperature sampling point may be referred to as a first temperature sampling point. Both the first temperature sampling point and the second temperature sampling point are temperature sampling points, but they are not the same temperature sampling point.

[0020] The present invention discloses a shunt current measurement compensation method, device, electronic device, and storage medium, which can significantly improve the accuracy of current measurement and ensure the accuracy of current measurement even under long-term operation or ambient temperature changes. Detailed descriptions are provided below.

[0021] Figure 1 This is a flow chart of a shunt current measurement compensation method disclosed in an embodiment of the present application. Figure 1 The described shunt current measurement compensation method is applicable to current measurement circuits that may include shunts. Figure 1 As shown, the shunt current measurement compensation method may include the following steps: Step S101 : obtaining an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of a shunt.

[0022] In some embodiments, a shunt is an instrument for measuring direct current, and is made based on the principle that a voltage is generated across a resistor when a direct current passes through the resistor. The updated voltage and updated current of the shunt at the current moment can be used to update the current at the next moment. Before obtaining the updated voltage, updated current, and the sampling temperature corresponding to the first temperature sampling point of the shunt, the initial temperature and initial resistance of the shunt can be set, and its temperature coefficient can be determined based on the characteristics of the shunt material. After the current measurement circuit is powered on, the updated voltage, updated current, and sampling temperature corresponding to the first temperature sampling point of the shunt can be collected at intervals according to a preset time, wherein the first temperature sampling point can be set in advance, and the sampling temperature is used to represent the temperature of the first temperature sampling point.

[0023] Step S102 : determining the dissipated power according to the updated voltage and the updated current, and calculating the actual temperature corresponding to the shunt according to the dissipated power and the sampled temperature corresponding to the first temperature sampling point.

[0024] In some embodiments, the dissipated power can be used to describe the power of the current measurement circuit. The current measurement circuit can determine the dissipated power based on the product of the obtained updated voltage and the updated current, and calculate the shunt temperature difference based on the determined dissipated power. Based on the shunt temperature difference, the sampling temperature corresponding to the first temperature sampling point is compensated to obtain the actual temperature corresponding to the shunt. The first temperature sampling point can be any sampling point in the current measurement circuit. Furthermore, the first temperature sampling point can be set on the output circuit of the shunt, and the temperature of the first temperature sampling point of the temperature detection device can be used.

[0025] Step S103 : Compensating the update voltage according to a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistor corresponding to the shunt.

[0026] In some embodiments, the update resistance corresponding to the shunt can be obtained first, and the update resistance can be calculated by the actual temperature corresponding to the shunt, or the update resistance corresponding to the shunt can be directly measured. The actual temperature corresponding to the shunt is substituted into a preset linear temperature formula to obtain the compensation resistance corresponding to the shunt. The linear temperature formula can be the product of the square of the update current multiplied by the update resistance and the thermal resistance value, plus the actual temperature corresponding to the shunt and subtracting the initial temperature difference, multiplied by the temperature coefficient of the shunt and , and finally add obtained, among which It can be at the initial temperature The resistance value is obtained by measuring the resistance of the shunt. Further, the linear temperature formula is ,in, is the temperature coefficient of the shunt, To update the current, To update the resistor, is the actual temperature, is the initial temperature, For the shunt Resistance at temperature, is the thermal resistance value, is the compensation resistor.

[0027] In other embodiments, the current measurement circuit can compensate the update resistor based on the actual temperature to obtain a temperature compensation resistor; compensate the update resistor based on the update current to obtain a current compensation resistor; and compensate the update resistor based on the temperature compensation resistor and the current compensation resistor to obtain a compensation resistor corresponding to the shunt. Furthermore, the current measurement circuit can obtain a temperature compensation resistor based on the product of the actual temperature and a temperature compensation coefficient, and obtain a current compensation resistor based on the product of the update current and the current compensation coefficient. The temperature compensation resistor and the current compensation resistor are added to the measured update resistor to compensate the update resistor to obtain a compensation resistor corresponding to the shunt. The temperature compensation coefficient and the current compensation coefficient can be obtained through a large amount of experimental data.

[0028] The current measurement circuit compensates the update resistance according to the actual temperature and the update current. By performing a multi-dimensional compensation method of temperature compensation correction and current compensation correction on the shunt, an integrated digital compensation of the shunt is realized, which can improve the accuracy of the shunt current measurement.

[0029] The linear temperature formula can be obtained through a large amount of experimental data or can be set in advance by the staff. The current measurement current can be measured before obtaining the updated current and updated voltage. Optionally, the shunt can be measured at the initial temperature before obtaining the updated current and updated voltage. The resistance under , thus obtaining value.

[0030] Step S104 , obtaining a measured voltage corresponding to the shunt, and obtaining a compensation current corresponding to the shunt according to the compensation resistor and the measured voltage.

[0031] In some embodiments, the current measurement circuit can update the updated current corresponding to the shunt based on the compensation resistor and the measured voltage to obtain a compensated current corresponding to the shunt. If the updated current is the current value measured at the previous moment, the compensated current can be the current value measured at the next moment. Compensating the error in the current value measured by the current measurement circuit at the next moment using the updated current at the previous moment can significantly improve the accuracy of current measurement.

[0032] In some embodiments, the current detection circuit may further obtain a detection voltage collected through a shunt and a sampled temperature corresponding to a first temperature collection point, and record the power-on time of the current measurement circuit; compensate the detection voltage based on the sampled temperature corresponding to the first temperature collection point and the power-on time to obtain a compensated detection voltage; and calculate a compensated current based on the compensated detection voltage. The detection voltage may be a voltage determined directly from a detection signal output by the shunt, and the power-on time may be the length of time recorded from the time the current detection circuit is connected to power.

[0033] When the current measurement circuit is initially powered on, the current passing through the shunt causes the shunt's temperature to change, affecting the shunt's resistance and, in turn, the detection voltage detected by the shunt. However, the power-on time only affects the current measurement circuit when it is initially powered on. After a period of power-on, the shunt's voltage gradually stabilizes, meaning that the effect of the power-on time on the shunt's detection current is negligible. Therefore, when the current detection circuit is initially powered on, the detection voltage can be compensated based on the sampling temperature and power-on time corresponding to the first temperature acquisition point. After the current detection circuit has been powered on for a period of time, the detection current can be compensated based solely on the sampling temperature corresponding to the first temperature acquisition point.

[0034] As an optional implementation, the current detection circuit can determine whether the power-on time is greater than a preset time threshold after obtaining the detection voltage collected through the shunt and the sampling temperature corresponding to the first temperature collection point, and recording the power-on time of the current measurement circuit. If it is determined that the power-on time is greater than or equal to the preset time threshold, the detection voltage can be compensated according to the sampling temperature and power-on time corresponding to the first temperature collection point to obtain the compensated detection voltage; if it is determined that the power-on time is less than the preset time threshold, the detection voltage can be compensated according to the sampling temperature and power-on time corresponding to the first temperature sampling point to obtain the compensated detection voltage.

[0035] The time threshold can be obtained by fitting experimental data. In the experiment, a standard current value can be input into the shunt, and the voltage across the shunt can be collected. By fitting the collected data, the relationship between the variables can be derived. Under the standard current value, the least squares method is used to fit the detection voltage collected at different time points to obtain a curve showing the relationship between the detection voltage and time. This shows that after the shunt is powered on for 600 seconds, the curve showing the relationship between the detection voltage and time tends to be flat. In other words, after 600 seconds of power-on, the effect of the power-on time on the detection voltage is negligible. Therefore, the time threshold can be set to 600 seconds.

[0036] As another optional implementation, the current detection circuit may determine whether the power-on time is greater than a preset time threshold after obtaining the detection voltage collected by the shunt and the sampling temperature corresponding to the first temperature collection point and recording the power-on time of the current measurement circuit. If it is determined that the power-on time is greater than or equal to the preset time threshold, the detection voltage may be compensated according to the input collected temperature using the first compensation model to obtain a compensated detection voltage; If it is determined that the power-on time is less than a preset time threshold, the detection voltage can be compensated by the second compensation model based on the input acquisition temperature and the power-on time to obtain a compensated detection voltage. The first compensation model and the second compensation model can be neural network models, which are trained using the first sample set and the second sample set, respectively. The first sample set can include multiple sample acquisition temperatures and target voltages corresponding to each sample acquisition temperature. The first sample set is input into the first compensation model to be trained. The first compensation model to be trained can calculate the predicted voltage corresponding to each sample acquisition temperature based on each sample acquisition temperature. The model coefficients of the first compensation model to be trained are adjusted based on the difference between the predicted voltage corresponding to each sample acquisition temperature and the target voltage, thereby obtaining a trained first compensation model.

[0037] The second sample set may include multiple sample collection temperatures, multiple sample power-on times, and target voltages corresponding to each sample collection temperature and sample power-on time. The second sample set is input into the second compensation model to be trained. The second compensation model may calculate, based on each sample collection temperature and sample power-on time, a predicted voltage corresponding to each sample collection temperature and sample power-on time. The model coefficients of the second compensation model may be adjusted based on the difference between the target voltage and the predicted voltage corresponding to each sample collection temperature and sample power-on time, thereby obtaining a fully trained second compensation model.

[0038] The current detection circuit compensates the detection voltage according to the sampling temperature corresponding to the first temperature collection point and the power-on time to obtain the compensated detection voltage, and calculates the compensation current based on the compensated detection voltage. It can quickly and efficiently compensate the detection voltage and calculate the compensation current based on the compensated detection voltage, thereby improving the accuracy of the shunt detection current.

[0039] In an embodiment of the present application, an updated voltage, an updated current, and a sampled temperature corresponding to a first temperature sampling point of a shunt are obtained; dissipated power is determined based on the updated voltage and updated current, and the actual temperature corresponding to the shunt is calculated based on the dissipated power and the sampled temperature corresponding to the first temperature sampling point; the updated voltage is compensated based on a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistor corresponding to the shunt; a measured voltage corresponding to the shunt is obtained, and a compensated current corresponding to the shunt is obtained based on the compensation resistor and the measured voltage. The current measurement circuit can calculate the sampled temperature based on the obtained updated voltage, updated current, and the sampled temperature corresponding to the first temperature sampling point of the shunt to obtain the actual temperature, and compensate the updated voltage based on the actual temperature, a preset temperature formula, and the actual temperature corresponding to the shunt to obtain the compensation resistor, thereby improving the accuracy of the measured resistance, thereby improving the accuracy of the compensated current corresponding to the shunt obtained based on the compensation resistor and the measured voltage. By compensating and correcting the measured updated voltage and updated current multiple times, the accuracy of the current measurement can be significantly improved, and the accuracy of the current measurement can be ensured even under long-term operation or ambient temperature changes.

[0040] Figure 2 FIG. 1 is a flow chart of another shunt current measurement compensation method disclosed in an embodiment of the present application. In one embodiment, Figure 2 As shown, the method includes the following steps: Step S201 : calculating the thermal resistance between the output loop of the diverter and the first temperature sampling point.

[0041] In some embodiments, the experimenter can place the shunt in a temperature box set to a constant temperature, and set a constant current to flow through the shunt in the constant current source loop, and obtain the dissipated power by measuring the constant current of the shunt and the initial resistance of the shunt. The dissipated power can be obtained by multiplying the square of the constant current by the initial resistance. Further, it can be obtained by the formula ,in, is the dissipated power, is a constant current, Alternatively, the dissipated power can also be obtained by multiplying the update current and the update voltage.

[0042] After calculating the dissipated power, the current measurement circuit obtains the first temperature corresponding to the first temperature sampling point and the second temperature corresponding to the second temperature sampling point; the first temperature sampling point and the second temperature sampling point are different temperature sampling points; according to the formula , calculate the thermal resistance between the output loop of the shunt and the first temperature sampling point, where, is the thermal resistance value, is the first temperature, is the second temperature, is the initial dissipated power.

[0043] The standard test environment is a clean environment with a standard temperature of T = 20 ± 5 ° C and a relative humidity of 45-65%. This ensures that the ambient temperature and humidity during the thermal resistance measurement process are correct, making the current measurement more accurate.

[0044] Step S202 : obtaining an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of the shunt.

[0045] The description of step S202 may refer to the relevant description of step S101 in the above embodiment, and will not be repeated here.

[0046] Step S203 , calculating the shunt temperature difference value according to the dissipated power and the thermal resistance value.

[0047] In some embodiments, the shunt temperature difference value can be obtained based on the product of the dissipated power and the thermal resistance value, wherein the shunt temperature difference value can be the difference between the calculated sampling temperature corresponding to the first temperature sampling point and the actual temperature. Further, the shunt temperature difference value can be obtained by the formula Calculated, where is the split temperature difference, is the dissipated power, is the thermal resistance value.

[0048] Step S204 : Add the diverter temperature difference value to the sampling temperature corresponding to the first temperature sampling point to obtain the actual temperature corresponding to the diverter.

[0049] In some embodiments, the shunt temperature difference value is added to the sampling temperature corresponding to the first temperature sampling point to obtain the actual temperature corresponding to the shunt. The shunt temperature difference value is the temperature difference caused by self-heating. Therefore, the sampling temperature corresponding to the first temperature sampling point can be compensated according to the shunt temperature difference value to obtain the actual temperature corresponding to the shunt.

[0050] Step S205 : Compensating the update voltage according to a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistor corresponding to the shunt.

[0051] Step S206 , obtaining a measured voltage corresponding to the shunt, and obtaining a compensation current corresponding to the shunt according to the compensation resistor and the measured voltage.

[0052] The description of steps S205 to S206 may refer to the relevant description of steps S103 to S104 in the above embodiment, and will not be repeated here.

[0053] In an embodiment of the present application, the thermal resistance value between the output loop of the shunt and the first temperature sampling point is calculated, the shunt temperature difference value is calculated based on the dissipated power and the thermal resistance value, and the shunt temperature difference value is added to the sampling temperature corresponding to the first temperature sampling point to obtain the actual temperature corresponding to the shunt. This can reduce the error effect of the current itself on the current measurement, thereby improving the accuracy of the current measurement.

[0054] See also Figure 3 , Figure 3 This is a flow chart of another shunt current measurement compensation method disclosed in an embodiment of the present application. In one embodiment, the method comprises the following steps: Step S301 : obtaining an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of the shunt.

[0055] The description of step S301 may refer to the relevant description of step S101 in the above embodiment, and will not be repeated here.

[0056] Step S302 : determining a comprehensive correction coefficient according to the updated current and the sampling temperature corresponding to the first temperature sampling point using a preset comprehensive correction coefficient table.

[0057] In some embodiments, the preset comprehensive correction coefficient table contains comprehensive correction coefficients for each updated current under different operating environment temperature conditions. The operating environment temperature in the comprehensive correction coefficient table is divided into several temperature range intervals according to the temperature value. ~ , divide the detected updated current into several current range intervals according to the current effective value ~ For each temperature range and current range, a corresponding comprehensive correction coefficient is recorded in the comprehensive correction coefficient table, so that the corresponding comprehensive correction coefficient can be found in the preset comprehensive correction coefficient table according to the detected update current and the sampling temperature corresponding to the first temperature sampling point.

[0058] Step S303: Correcting the update current according to the comprehensive correction coefficient to obtain a corrected update current.

[0059] In some embodiments, the current measurement circuit may first obtain an initial correction coefficient corresponding to the shunt, wherein the initial correction coefficient corresponding to the shunt may be detected through experiments or set by a staff member. The current measurement circuit may multiply the obtained update current by the initial correction coefficient corresponding to the shunt, and then multiply it by the comprehensive correction coefficient to obtain the corrected update current. Specifically, according to the formula , calculate the corrected update current, where To update the current, The shunt correction factor preset for the shunt, is the comprehensive correction coefficient. According to the formula Correcting the update current can improve the accuracy of the measured update current.

[0060] Step S304 : determining the dissipated power according to the updated voltage and the corrected updated current, and calculating the actual temperature corresponding to the shunt according to the dissipated power and the sampled temperature corresponding to the first temperature sampling point.

[0061] In some embodiments, the current measurement circuit can determine the dissipated power based on the product of the updated voltage and the corrected updated current, and calculate the shunt temperature difference value based on the determined dissipated power, and compensate the sampling temperature corresponding to the first temperature sampling point based on the shunt temperature difference value to obtain the actual temperature corresponding to the shunt.

[0062] Step S305 : Compensating the update voltage according to a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistor corresponding to the shunt.

[0063] Step S306 , obtaining a measured voltage corresponding to the shunt, and obtaining a compensation current corresponding to the shunt according to the compensation resistor and the measured voltage.

[0064] The description of steps S305 to S306 may refer to the relevant description of steps S103 to S104 in the above embodiment, and will not be repeated here.

[0065] In an embodiment of the present application, a comprehensive correction coefficient is determined based on the update current and the sampling temperature corresponding to the first temperature sampling point through a preset comprehensive correction coefficient table. The update current is corrected based on the comprehensive correction coefficient to obtain the corrected update current. The dissipated power is determined based on the update voltage and the corrected update current. The actual temperature corresponding to the shunt is calculated based on the dissipated power and the sampling temperature corresponding to the first temperature sampling point. This can improve the accuracy of the measured update current, thereby improving the accuracy of the compensation current obtained based on the corrected update current and the update voltage.

[0066] See also Figure 4 , Figure 4 This is a schematic diagram of the structure of a shunt current measurement compensation device disclosed in an embodiment of the present application. The device can be applied to a current measurement circuit. Figure 4 As shown, the shunt current measurement compensation device 500 may include: an acquisition module 401 , a calculation module 402 , a compensation module 403 and a determination module 404 .

[0067] An acquisition module 401 is configured to acquire an updated voltage and an updated current of the shunt and a sampling temperature corresponding to a first temperature sampling point; A calculation module 402 is configured to determine the dissipated power according to the updated voltage and the updated current, and calculate the actual temperature corresponding to the shunt according to the dissipated power and the sampled temperature corresponding to the first temperature sampling point; The compensation module 403 is used to compensate the update voltage according to a preset linear temperature formula and the actual temperature corresponding to the shunt to obtain a compensation resistance corresponding to the shunt; The determination module 404 is configured to obtain a measured voltage corresponding to the shunt, and obtain a compensation current corresponding to the shunt according to the compensation resistor and the measured voltage.

[0068] In one embodiment, the shunt current measurement and compensation device 400 further includes a thermal resistance value calculation module: a thermal resistance calculation module, used to calculate the thermal resistance between the output circuit of the shunt and the first temperature sampling point; The calculation module 402 is further configured to calculate a shunt temperature difference value based on the dissipated power and the calculated thermal resistance value; and add the shunt temperature difference value to the sampling temperature corresponding to the first temperature sampling point to obtain the actual temperature corresponding to the shunt.

[0069] In one embodiment, the thermal resistance value calculation module is further used to obtain a first temperature corresponding to a first temperature sampling point and a second temperature corresponding to a second temperature sampling point; the first temperature sampling point and the second temperature sampling point are different temperature sampling points; according to the formula , calculate the thermal resistance between the output loop of the shunt and the first temperature sampling point, where, is the thermal resistance value, is the first temperature, is the second temperature, is the initial dissipated power.

[0070] In one embodiment, the linear temperature equation is ,in, is the temperature coefficient of the shunt, To update the current, is the actual temperature, is the initial temperature, For the shunt in the Resistance at temperature, is the thermal resistance value, is the compensation resistor.

[0071] In one embodiment, the shunt current measurement compensation device 400 further includes a coefficient determination module and a correction module: A coefficient determination module, configured to determine a comprehensive correction coefficient according to the updated current and the sampling temperature corresponding to the first temperature sampling point using a preset comprehensive correction coefficient table; A correction module, configured to correct the update current according to a comprehensive correction coefficient to obtain a corrected update current; The calculation module 402 is further configured to determine the dissipated power according to the updated voltage and the corrected updated current, and calculate the actual temperature corresponding to the shunt according to the dissipated power and the sampled temperature corresponding to the first temperature sampling point.

[0072] In one embodiment, the correction module is further configured to: , calculate the corrected update current, where To update the current, The shunt correction factor preset for the shunt, is the comprehensive correction factor.

[0073] In one embodiment, the shunt current measurement compensation device 400 further includes a temperature compensation module, a current compensation module, and a shunt compensation module: A temperature compensation module is used to compensate the update voltage according to the actual temperature to obtain a temperature compensation resistor; A current compensation module is used to compensate the update voltage according to the update current to obtain a current compensation resistor; The shunt compensation module is used to compensate the update voltage according to the temperature compensation resistor and the current compensation resistor to obtain the compensation resistor corresponding to the shunt.

[0074] See also Figure 5 , Figure 5 This is a schematic diagram of the structure of an electronic device disclosed in an embodiment of the present application. Figure 5 As shown, the electronic device 500 may include: A memory 501 storing executable program code; a processor 502 coupled to the memory 501; The processor 502 calls the executable program code stored in the memory 501 to execute any one of the shunt current measurement compensation methods disclosed in the embodiments of the present application.

[0075] An embodiment of the present application discloses a computer-readable storage medium storing a computer program, wherein when the computer program is executed by the processor, the processor implements any one of the seat angle adjustment methods disclosed in the embodiment of the present application.

[0076] The embodiments of the present application disclose a computer program product, including a computer program, and the computer program can be executed by a processor to implement the methods described in the above embodiments.

[0077] It should be understood that the references to "one embodiment" or "an embodiment" throughout the specification mean that the specific features, structures, or characteristics associated with the embodiment are included in at least one embodiment of the present application. Therefore, the references to "in one embodiment" or "in an embodiment" throughout the specification do not necessarily refer to the same embodiment. In addition, these specific features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. Those skilled in the art should also be aware that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required for the present application.

[0078] In the various embodiments of the present application, it should be understood that the size of the serial numbers of the above-mentioned processes does not necessarily mean the order of execution. The order of execution of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0079] The units described above as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one place or distributed across multiple network units. Some or all of these units may be selected based on actual needs to achieve the objectives of this embodiment.

[0080] In addition, the functional units in the embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0081] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-accessible memory. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a memory and includes several requests for causing a computer device (which can be a personal computer, server, or network device, etc., specifically a processor in the computer device) to execute some or all of the steps of the above-mentioned methods in various embodiments of the present application.

[0082] Those skilled in the art will appreciate that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program. The program can be stored in a computer-readable storage medium, including a read-only memory (ROM), a random access memory (RAM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), a one-time programmable read-only memory (OTPROM), an electronically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM), or other optical disc storage, magnetic disk storage, magnetic tape storage, or any other computer-readable medium capable of carrying or storing data.

[0083] The above describes in detail a shunt current measurement and compensation method, device, electronic device, and storage medium disclosed in the embodiments of the present application. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is intended only to help understand the method and core concept of the present application. At the same time, for those skilled in the art, based on the concept of the present application, there may be changes in the specific implementation methods and scope of application. In summary, the contents of this specification should not be construed as limiting the present application.

Claims

1. A shunt current measurement compensation method, characterized in that: Applied to a current measurement circuit, the current measurement circuit includes a shunt, and the method includes: Obtaining an updated voltage, an updated current, and a sampling temperature corresponding to a first temperature sampling point of the shunt; Determine the dissipated power according to the updated voltage and the updated current, and calculate the actual temperature corresponding to the shunt according to the dissipated power and the sampling temperature corresponding to the first temperature sampling point; According to a preset linear temperature formula and an actual temperature corresponding to the shunt, the update voltage is compensated to obtain a compensation resistance corresponding to the shunt; A measurement voltage corresponding to the shunt is obtained, and a compensation current corresponding to the shunt is obtained according to the compensation resistor and the measurement voltage.

2. A shunt current measurement and compensation method according to claim 1, characterized in that: Before obtaining the updated voltage, updated current and sampling temperature corresponding to the first temperature sampling point of the shunt, the method further includes: Calculating the thermal resistance between the output loop of the shunt and the first temperature sampling point; The calculating the actual temperature corresponding to the shunt according to the dissipated power corresponding to the shunt and the sampling temperature corresponding to the first temperature sampling point includes: Calculate the shunt temperature difference value according to the dissipated power and the thermal resistance value; The shunt temperature difference value is added to the sampling temperature corresponding to the first temperature sampling point to obtain the actual temperature corresponding to the shunt.

3. A shunt current measurement and compensation method according to claim 2, characterized in that: The calculating the thermal resistance value between the output loop of the shunt and the first temperature sampling point comprises: Acquire a first temperature corresponding to the first temperature sampling point and a second temperature corresponding to the second temperature sampling point; the first temperature sampling point and the second temperature sampling point are different temperature sampling points; According to the formula , calculate the thermal resistance between the output loop of the shunt and the first temperature sampling point, where, is the thermal resistance value, is the first temperature, is the second temperature, is the initial dissipated power.

4. A shunt current measurement and compensation method according to claim 1, characterized in that: The method further comprises: Acquire the detection voltage collected by the shunt and the sampling temperature corresponding to the first temperature sampling point, and record the power-on time of the current measurement circuit; Compensating the detection voltage according to the power-on time to obtain a compensated detection voltage; A compensation current is calculated according to the compensated detection voltage.

5. A shunt current measurement and compensation method according to claim 1, characterized in that: After obtaining the updated voltage, the updated current and the sampling temperature corresponding to the first temperature sampling point of the shunt, the method further includes: Determine a comprehensive correction coefficient according to the update current and the sampling temperature corresponding to the first temperature sampling point through a preset comprehensive correction coefficient table; Correcting the update current according to the comprehensive correction coefficient to obtain a corrected update current; The determining of the dissipated power according to the updated voltage and the updated current, and calculating the actual temperature corresponding to the shunt according to the dissipated power and the sampling temperature corresponding to the first temperature sampling point, comprises: The dissipated power is determined according to the update voltage and the corrected update current, and the actual temperature corresponding to the shunt is calculated according to the dissipated power and the sampling temperature corresponding to the first temperature sampling point.

6. A shunt current measurement and compensation method according to claim 5, characterized in that: The step of correcting the update current according to the comprehensive correction coefficient to obtain the corrected update current includes: According to the formula , calculate the corrected update current, where is the update current, A current splitting correction factor preset for the current splitter, is the comprehensive correction coefficient.

7. A shunt current measurement and compensation method according to claim 1, characterized in that: Before obtaining the measured voltage corresponding to the shunt and obtaining the compensation current corresponding to the shunt according to the compensation resistor and the measured voltage, the method further includes: Compensating the update resistor according to the actual temperature to obtain a temperature compensated resistor; Compensating the update resistor according to the update current to obtain a current compensation resistor; The update resistor is compensated according to the temperature compensation resistor and the current compensation resistor to obtain a compensation resistor corresponding to the shunt.

8. A shunt current measurement and compensation device, characterized in that: Applied to a current measurement circuit, the current measurement circuit includes a shunt, and the device includes: An acquisition module, used for acquiring an updated voltage, an updated current and a sampling temperature corresponding to a first temperature sampling point of the shunt; A calculation module, configured to determine a dissipated power according to the updated voltage and the updated current, and calculate an actual temperature corresponding to the shunt according to the dissipated power and a sampling temperature corresponding to a first temperature sampling point; A compensation module, used to compensate the update voltage according to a preset linear temperature formula and an actual temperature corresponding to the shunt, so as to obtain a compensation resistance corresponding to the shunt; The determination module is used to obtain the measurement voltage corresponding to the shunt, and obtain the compensation current corresponding to the shunt according to the compensation resistor and the measurement voltage.

9. An electronic device, characterized in that: It comprises a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the processor implements a shunt current measurement compensation method as described in any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, a shunt current measurement compensation method as claimed in any one of claims 1 to 7 is implemented.

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