High-voltage current-limiting fuse pulse aging device and service life evaluation method thereof

Abstract

The invention discloses a high-voltage current-limiting fuse pulse aging device and a service life evaluation method thereof, and relates to the technical field of fuse testing devices.The device comprises a rectifying circuit unit, a BUCK circuit unit, an inverter circuit unit, a transformer unit, a high-voltage current-limiting fuse, a sensor unit, an interaction unit and a control unit; the control unit generates a first control instruction based on the pulse aging parameter so as to control start and stop of the rectification circuit unit; the control unit generates a second control instruction based on the feedback signal and the pulse aging parameter by adopting a pulse amplitude modulation mode; adjusting the amplitude of the current stress according to the second control instruction; and carrying out aging test on the high-voltage current-limiting fuse according to the pulse aging test time and the stress impact frequency by the adjusted current stress. According to the invention, the closed-loop control and real-time feedback adjustment of the impact current stress of the fuse in the high-voltage current-limiting fuse pulse aging device can be realized, and the life evaluation of the high-voltage current-limiting fuse is realized.

Description

Technical Field

[0001] The present application relates to the technical field of fuse testing devices, and in particular to a high-voltage current-limiting fuse pulse aging device and a life evaluation method thereof. Background Art

[0002] As a key overcurrent protection device in the power system, high-voltage current-limiting fuses can quickly cut off fault circuits in the event of a short circuit or overload, thereby ensuring the safe operation of equipment and systems. However, with the continuous expansion of the scale of the power grid and the increase in the complexity of power equipment, higher requirements are placed on the performance, reliability and life of fuses. The operating environment of modern power grids is complex, with uncertain factors such as load fluctuations, short-circuit faults and lightning strikes, which make fuses susceptible to impact current stress under high voltage and high current conditions, thereby accelerating the aging of the fuse or material fatigue failure, threatening the reliability of power grid operation. Therefore, it is necessary to perform pulse aging tests on fuses to evaluate the service life of fuses. Through scientific life evaluation, not only can the maintenance strategy of fuses be optimized, the life of equipment can be extended, and resource waste can be avoided, but also the economic losses caused by fault power outages can be reduced, the intelligent operation and maintenance level of power systems can be improved, and ultimately the urgent needs of modern power grids for high-performance and long-life equipment can be met.

[0003] Traditional static testing methods are difficult to fully reflect the aging behavior of fuses under dynamic impact conditions, and existing devices have deficiencies in the control accuracy of current stress amplitude, frequency and time. The reliability of the test results is limited and the test results are repeatable. With the rapid development of new energy, distributed photovoltaic and wind energy are connected to the power grid, making fuses face more complex load conditions and frequent transient current shocks. Therefore, there is an urgent need for a high-voltage current limiting fuse pulse aging device to achieve precise closed-loop control and real-time feedback adjustment, providing reliable protection for fuse life prediction. Summary of the invention

[0004] The purpose of this application is to provide a high-voltage current limiting fuse pulse aging device and a life assessment method thereof, which can realize closed-loop control and real-time feedback adjustment of the impulse current stress of the fuse in the high-voltage current limiting fuse pulse aging device, and thereby realize the life assessment of the high-voltage current limiting fuse.

[0005] To achieve the above objectives, this application provides the following solutions: In a first aspect, the present application provides a high-voltage current-limiting fuse pulse aging device, comprising: a rectifier circuit unit, a BUCK circuit unit, an inverter circuit unit, a transformer unit, a sensor unit, and a control unit; The BUCK circuit unit is connected to the rectifier circuit unit and the inverter circuit unit respectively; the inverter circuit unit is connected to the transformer unit; the sensor unit is connected to the BUCK circuit unit, the inverter circuit unit and the transformer unit respectively; the control unit is connected to the rectifier circuit unit, the BUCK circuit unit, the inverter circuit unit and the sensor unit respectively; The control unit is used to obtain pulse aging parameters and generate a first control instruction based on the pulse aging parameters; the first control instruction is used to control the start and stop of the rectifier circuit unit; the pulse aging parameters include current stress amplitude, pulse aging test time and stress impact frequency; The rectifier circuit unit is used to rectify the external input power supply; the BUCK circuit unit is used to step down the rectified power supply to form a DC voltage with adjustable amplitude; the inverter circuit unit is used to invert the DC voltage with adjustable amplitude to form AC power; the transformer unit is used to convert the AC power into current stress; the sensor unit is used to obtain feedback signals; the feedback signals include feedback signals output by the BUCK circuit unit, feedback signals output by the inverter circuit unit, and feedback signals output by the transformer unit; The control unit is also used to generate a second control instruction based on the feedback signal and the pulse aging parameter by adopting a pulse amplitude modulation method; the second control instruction is used to control the duty cycle of the switches in the BUCK circuit unit and the inverter circuit unit to adjust the current stress until the amplitude of the current stress reaches the current stress amplitude; the adjusted current stress performs an aging test on the high-voltage current limiting fuse according to the pulse aging test time and the stress impact frequency.

[0006] Optionally, the control unit includes: a sensor signal processing module, a DSP control module, an IGBT drive module, a relay drive module and a main circuit contactor control module; The sensor signal processing module is connected to the sensor unit; the DSP control module is respectively connected to the sensor signal processing module, the IGBT drive module and the relay drive module; the main circuit contactor control module is respectively connected to the relay drive module and the rectifier circuit unit; The sensor signal processing module is used to convert the feedback signal into an electrical signal; the DSP control module is used to obtain a pulse aging parameter and generate a first control instruction based on the pulse aging parameter; the DSP control module is also used to generate a second control instruction based on the electrical signal and the pulse aging parameter using a pulse amplitude modulation method; the relay drive module is used to generate a relay drive signal according to the first control instruction; the main circuit contactor control module is used to control the start and stop of the rectifier circuit unit according to the relay drive signal; the IGBT drive module is used to generate an IGBT drive signal according to the second control instruction; the IGBT drive signal is used to control the duty cycle of the switches in the BUCK circuit unit and the inverter circuit unit to achieve the regulation of the current stress.

[0007] Optionally, the high-voltage current-limiting fuse pulse aging device further comprises: an interaction unit; The interaction unit is used to set the pulse aging parameter.

[0008] Optionally, the interaction unit is further configured to display the feedback signal.

[0009] Optionally, the interaction unit is a touch screen.

[0010] Optionally, the switching element in the inverter circuit unit adopts Infineon FF75R12RT4 module.

[0011] Optionally, the DSP control module uses TMS320F28379D as the control microprocessor.

[0012] Optionally, the IGBT driver module uses 2SD315AI as a driver chip.

[0013] In a second aspect, the present application provides a method for evaluating the life of a high-voltage current-limiting fuse, comprising: Get pulse aging parameters; Using the above-mentioned high-voltage current limiting fuse pulse aging device, an aging test is performed on the high-voltage current limiting fuse based on the pulse aging parameters; Obtaining resistance parameters of the high-voltage current-limiting fuse after aging test; Constructing a pulse aging database based on the pulse aging parameter and the resistance parameter; The life of the high-voltage current-limiting fuse is evaluated according to the pulse aging database.

[0014] Optionally, constructing a pulse aging database based on the pulse aging parameter and the resistance parameter includes: Obtaining the number of impacts based on the pulse aging test time and the stress impact frequency; A pulse aging database is constructed based on the pulse aging parameter, the number of impacts and the resistance parameter.

[0015] According to the specific embodiments provided in this application, this application has the following technical effects: The present application provides a high-voltage current-limiting fuse pulse aging device and a life assessment method thereof, wherein a control unit generates a first control instruction based on a pulse aging parameter to control the start and stop of a rectifier circuit unit; the control unit can also generate a second control instruction based on a feedback signal and a pulse aging parameter in a pulse amplitude modulation manner to adjust the current stress until the amplitude of the current stress reaches the set current stress amplitude. Thus, closed-loop control and real-time feedback adjustment of the impact current stress of the fuse in the pulse aging device of the high-voltage current-limiting fuse are achieved. The adjusted current stress performs an aging test on the high-voltage current-limiting fuse according to the pulse aging test time and the stress impact frequency. A pulse aging database is constructed based on the resistance parameters and pulse aging parameters of the high-voltage current-limiting fuse after the aging test. Then, the life of the high-voltage current-limiting fuse is evaluated based on the pulse aging database. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 This is a schematic diagram of a pulse aging device for a high-voltage current-limiting fuse in one embodiment of the present application; Figure 2 This is a schematic diagram of a pulse aging device for a high-voltage current-limiting fuse in another embodiment of the present application; Figure 3 This is a circuit diagram of a high-voltage current-limiting fuse pulse aging device in one embodiment of the present application; Figure 4 This is a circuit schematic diagram of a sensor signal processing module in one embodiment of the present application; Figure numerals: 1-rectifier circuit unit, 2-BUCK circuit unit, 3-inverter circuit unit, 4-transformer unit, 5-sensor unit, 6-control unit, 61-sensor signal processing module, 62-DSP control module, 63-IGBT drive module, 64-relay drive module, 65-main circuit contactor control module, 7-interaction unit. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0019] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0020] Example 1 The present application provides a high voltage current limiting fuse pulse aging device, such as Figure 1 As shown, the device includes: a rectifier circuit unit 1, a BUCK circuit unit 2, an inverter circuit unit 3, a transformer unit 4, a sensor unit 5 and a control unit 6.

[0021] The BUCK circuit unit 2 is connected to the rectifier circuit unit 1 and the inverter circuit unit 3 respectively; the inverter circuit unit 3 is connected to the transformer unit 4; the sensor unit 5 is connected to the BUCK circuit unit 2, the inverter circuit unit 3 and the transformer unit 4 respectively; the control unit 6 is connected to the rectifier circuit unit 1, the BUCK circuit unit 2, the inverter circuit unit 3 and the sensor unit 5 respectively.

[0022] The control unit 6 is used to obtain pulse aging parameters and generate a first control instruction based on the pulse aging parameters. The first control instruction is used to control the start and stop of the rectifier circuit unit 1. The pulse aging parameters include current stress amplitude, pulse aging test time and stress impact frequency.

[0023] The rectifier circuit unit 1 performs rectification processing on the external input power supply, that is, the rectifier unit 1 rectifies the external input AC voltage source into DC power. The BUCK circuit unit 2 performs voltage reduction processing on the rectified power supply to form a DC voltage with adjustable amplitude. That is, the BUCK circuit unit 2 is used to adjust the voltage amplitude input by the inverter circuit unit 3. The inverter circuit unit 3 performs inversion processing on the DC voltage with adjustable amplitude to form AC power, that is, the inverter circuit unit 3 converts the DC voltage into AC power with adjustable waveform and frequency. The transformer unit 4 converts the AC power into current stress, providing the current stress test conditions required for the high-voltage current limiting fuse to be tested. The sensor unit 5 is used to obtain feedback signals, and the feedback signals include feedback signals output by the BUCK circuit unit 2, feedback signals output by the inverter circuit unit 3, and feedback signals output by the transformer unit 4. There are two types of feedback signals: voltage feedback signals and current feedback signals.

[0024] The control unit 6 is also used to generate a second control instruction based on the feedback signal and the pulse aging parameter by using a pulse amplitude modulation method. The second control instruction is used to control the duty cycle of the switches in the BUCK circuit unit 2 and the inverter circuit unit 3 to adjust the current stress until the amplitude of the current stress reaches the current stress amplitude; the adjusted current stress performs an aging test on the high-voltage current limiting fuse according to the pulse aging test time and the stress impact frequency.

[0025] As an optional implementation, in order to better adjust the current stress. Figure 2 As shown, the control unit 6 includes: a sensor signal processing module 61 , a DSP control module 62 , an IGBT driving module 63 , a relay driving module 64 and a main circuit contactor control module 65 .

[0026] The sensor signal processing module 61 is connected to the sensor unit 5; the DSP control module 62 is respectively connected to the sensor signal processing module 61, the IGBT driving module 63 and the relay driving module 64; the main circuit contactor control module 65 is respectively connected to the relay driving module 64 and the rectifier circuit unit 1.

[0027] The sensor signal processing module 61 is used to convert the feedback signal into an electrical signal. The DSP control module 62 is used to obtain the pulse aging parameters and generate a first control instruction based on the pulse aging parameters; the DSP control module 62 is also used to generate a second control instruction based on the electrical signal and the pulse aging parameters using a pulse amplitude modulation method. The relay drive module 64 is used to generate a relay drive signal according to the first control instruction. The main circuit contactor control module 65 controls the start and stop of the rectifier circuit unit 1 according to the relay drive signal. The IGBT drive module 63 generates an IGBT drive signal according to the second control instruction. The IGBT drive signal is used to control the duty cycle of the switches in the BUCK circuit unit 2 and the inverter circuit unit 3 to achieve current stress regulation.

[0028] As an optional implementation, in order to improve the flexibility of the device, the DSP control module 62 can adopt model predictive control, use pulse amplitude modulation, and generate a second control instruction based on the electrical signal and the pulse aging parameter. When testing high-voltage current limiting fuses with different parameters, the high-voltage current limiting fuse pulse aging device can flexibly adjust the current stress according to the parameters of the high-voltage current limiting fuse.

[0029] As an optional implementation, in order to more accurately control the amplitude of the current stress, the high-voltage current limiting fuse pulse aging device further includes an interactive unit 7. The interactive unit 7 is used to set pulse aging parameters, which include the current stress amplitude, the pulse aging test time, and the stress impact frequency. The interactive unit 7 is also used to display the feedback signal. The interactive unit 7 can be a touch screen.

[0030] As an optional implementation, the circuit of the high-voltage current-limiting fuse pulse aging device is simplified under the premise of ensuring reliability. Figure 3 As shown, the switch element in the inverter circuit unit 3 may be an insulated gate bipolar transistor (IGBT), and specifically, an Infineon FF75R12RT4 module may be selected as the switch element.

[0031] IGBT has the advantages of high input impedance, simple driving circuit, and low switching loss. Its applications cover a range of fields, from industrial power supplies, inverters, new energy vehicles, new energy power generation to rail transportation. Selecting Infineon's FF75R12RT4 module as the switching element of inverter circuit unit 3 can simplify the circuit structure while ensuring high reliability, making it easy to miniaturize the device.

[0032] As an optional implementation, in order to achieve stable regulation of current stress, the DSP control module 62 can select TMS320F28379D as the control microprocessor. TMS320F28379D belongs to the C2000 series real-time control microprocessor. The C2000 series integrates the best features of DSP and microcontroller, and integrates multiple functional modules such as enhanced pulse width modulation (EnhancedPulseWidthModulation, ePWM) module, analog-to-digital converter module (Analog-to-Digital Converter, ADC), and general digital input / output interface (I / O port), providing comprehensive hardware resources for the design of complex control systems. The DSP control module 62 and the interactive unit 7 use serial port communication. The serial port chip can use CH343 chip, which supports automatic recognition and dynamic adaptation of communication baud rates of 115200bps and below.

[0033] As an optional implementation, in order to improve the safety of the device, the IGBT drive module 63 uses 2SD315AI as the drive chip. 2SD315AI integrates functions such as self-protection and fault feedback. The weak current control signal and the IGBT drive signal have a 4000V isolation capability, and have a large current drive capability and intelligent overcurrent protection function. The drive circuit module 63 serves as a bridge between the DSP control module 62 and the BUCK circuit unit 2 and the inverter circuit unit 3. It converts the second control instruction into an IGBT drive signal, and controls the on and off time of the IGBT in the BUCK circuit unit 2 and the inverter circuit unit 3 through the IGBT drive signal (that is, adjusts the duty cycle of the IGBT), thereby realizing the adjustment of the current stress.

[0034] The IGBT drive module 63 can also provide protection functions for the inverter circuit unit 3, including overcurrent protection, overvoltage protection and overheat protection, to ensure the safety and stability of the device when testing the high-voltage current-limiting fuse. The DSP control module 62 controls the IGBT drive module, and then controls the BUCK circuit unit 2 and the inverter circuit unit 3, so that the high-voltage current-limiting fuse pulse aging device can operate according to the expected control strategy to achieve the control effect of the current stress required for the test.

[0035] As an optional implementation, in order to improve the accuracy of the feedback signal, a voltage acquisition circuit based on the HCNR200 linear optocoupler can be used to collect the feedback signal output by the inverter circuit unit 3, and the signal isolation between the links can be achieved while collecting the analog signal. The current feedback signal in the feedback signal output by the transformer unit 4 can be obtained through a current transformer. The feedback signal is converted into an electrical signal by the sensor signal processing module 61, and the feedback signal is removed from the noise by a second-order filter circuit. In the sensor signal processing module 61, the filter inductor can be a toroidal reactor made of iron silicon aluminum, and the filter capacitor can be a high-frequency non-inductive absorption film capacitor. For example, the circuit principle of the sensor signal processing module used in this application is as follows Figure 4 As shown, since the components used are existing components, they will not be described in detail.

[0036] Example 2 In this example, the present application provides a method for evaluating the life of a high-voltage current-limiting fuse, the method comprising: Step 10, obtaining pulse aging parameters, the pulse aging parameters including: current stress amplitude, pulse aging test time and stress impact frequency.

[0037] Step 11: Use the high-voltage current limiting fuse pulse aging device provided in Example 1 to perform an aging test on the high-voltage current limiting fuse based on the pulse aging parameters.

[0038] Step 12, obtaining the resistance parameters of the high-voltage current limiting fuse after the aging test.

[0039] Step 13: construct a pulse aging database based on the pulse aging parameters and the resistance parameters.

[0040] Step 14: Evaluate the life of the high-voltage current limiting fuse according to the pulse aging database.

[0041] As an optional implementation, in order to accurately evaluate the service life of the high-voltage current limiting fuse, step 13 specifically includes: The impulse times are obtained based on the pulse aging test time and current frequency, and then a pulse aging database is constructed based on the pulse aging parameters, impulse times and resistance parameters.

[0042] For example, a certain WFMDJ-7.2kV type high-voltage current limiting fuse with a rated current of 125A and 160A is selected for pulse aging test. A certain pulse time (i.e., current impact time), pulse aging test time, and current frequency are set, and a pulse peak current parameter lower than the melting current of the high-voltage current limiting fuse and higher than its rated current is selected as the set current stress amplitude. In this embodiment, for a high-voltage current limiting fuse with a rated current of 125A, 5 times the pulse peak current is selected as the current stress amplitude, and the high-voltage current limiting fuse is input for testing; for a high-voltage current limiting fuse with a rated current of 160A, 3 times and 5 times the pulse peak current are selected as the current stress amplitude, respectively, and the high-voltage current limiting fuse is input for testing. The test data is shown in Table 1.

[0043] Table 1 WFMDJ type fuse pulse aging test data table

[0044] The number of impacts is obtained according to the set pulse time and current frequency, and the number of impacts in each pulse aging test process is accumulated to obtain the cumulative number of impacts. Then, the pulse aging test data is obtained according to the pulse aging parameters, the number of impacts and the resistance parameters, and a pulse aging database is constructed as shown in Table 1. Therefore, the life of the tested high-voltage current limiting fuse is evaluated according to the pulse aging database.

[0045] Analysis of the data in Table 1 shows that the resistance value of the 160A fuse after 2520 pulse shocks under the conditions of 300%In current stress and 8s shock time is 2.5146mΩ, and the resistance value increases slowly with the increase of the number of pulses, indicating that the fuse has good surge resistance under such experimental conditions. Under the conditions of 500%In current stress and 8s shock time, the resistance value of the 125A and 160A fuses increases rapidly with the increase of the number of pulses. The resistance of the 125A fuse suddenly breaks after more than 100 times, and the fuse fails. The resistance of the 160A fuse suddenly breaks after more than 200 times, and the fuse fails. In summary, the smaller impact energy (i.e., smaller current stress) generated by pulse current stress causes less cumulative damage to the fuse, while the larger impact energy (i.e., larger current stress) generated by the current pulse will cause cumulative irreversible damage to the fuse, increasing the resistance of the fuse in the cooling state, causing the characteristics of the fuse to vary and reducing the current carrying capacity of the fuse.

[0046] The high-voltage current-limiting fuse pulse aging device provided in the present application controls the current stress output by the transformer by controlling the BUCK circuit unit and the inverter circuit unit, obtains the expected current stress, and realizes the control of the discharge of the high-voltage current-limiting fuse. By using the high-voltage current-limiting fuse pulse aging device to evaluate the life of high-voltage current-limiting fuses with different rated currents, it is proved that the current stress generated by the device can meet the requirements of variable stress and variable frequency testing, and can solve the variable stress impact current problem that is urgently needed to be solved in the current fuse testing industry. The device is of great significance for exploring the remaining life and reliability prediction of high-voltage current-limiting fuses under different current stress levels.

[0047] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0048] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A high voltage current limiting fuse pulse aging device, characterized in that: The high-voltage current-limiting fuse pulse aging device comprises: a rectifier circuit unit, a BUCK circuit unit, an inverter circuit unit, a transformer unit, a sensor unit and a control unit; The BUCK circuit unit is connected to the rectifier circuit unit and the inverter circuit unit respectively; the inverter circuit unit is connected to the transformer unit; the sensor unit is connected to the BUCK circuit unit, the inverter circuit unit and the transformer unit respectively; the control unit is connected to the rectifier circuit unit, the BUCK circuit unit, the inverter circuit unit and the sensor unit respectively; The control unit is used to obtain pulse aging parameters and generate a first control instruction based on the pulse aging parameters; the first control instruction is used to control the start and stop of the rectifier circuit unit; the pulse aging parameters include current stress amplitude, pulse aging test time and stress impact frequency; The rectifier circuit unit is used to rectify the external input power supply; the BUCK circuit unit is used to step down the rectified power supply to form a DC voltage with adjustable amplitude; the inverter circuit unit is used to invert the DC voltage with adjustable amplitude to form AC power; the transformer unit is used to convert the AC power into current stress; the sensor unit is used to obtain feedback signals; the feedback signals include feedback signals output by the BUCK circuit unit, feedback signals output by the inverter circuit unit, and feedback signals output by the transformer unit; The control unit is also used to generate a second control instruction based on the feedback signal and the pulse aging parameter by adopting a pulse amplitude modulation method; the second control instruction is used to control the duty cycle of the switches in the BUCK circuit unit and the inverter circuit unit to adjust the current stress until the amplitude of the current stress reaches the current stress amplitude; the adjusted current stress performs an aging test on the high-voltage current limiting fuse according to the pulse aging test time and the stress impact frequency.

2. The high-voltage current-limiting fuse pulse aging device according to claim 1, characterized in that: The control unit includes: a sensor signal processing module, a DSP control module, an IGBT drive module, a relay drive module and a main circuit contactor control module; The sensor signal processing module is connected to the sensor unit; the DSP control module is respectively connected to the sensor signal processing module, the IGBT drive module and the relay drive module; the main circuit contactor control module is respectively connected to the relay drive module and the rectifier circuit unit; The sensor signal processing module is used to convert the feedback signal into an electrical signal; the DSP control module is used to obtain a pulse aging parameter and generate a first control instruction based on the pulse aging parameter; the DSP control module is also used to generate a second control instruction based on the electrical signal and the pulse aging parameter using a pulse amplitude modulation method; the relay drive module is used to generate a relay drive signal according to the first control instruction; the main circuit contactor control module is used to control the start and stop of the rectifier circuit unit according to the relay drive signal; the IGBT drive module is used to generate an IGBT drive signal according to the second control instruction; the IGBT drive signal is used to control the duty cycle of the switches in the BUCK circuit unit and the inverter circuit unit to achieve the regulation of the current stress.

3. The high-voltage current-limiting fuse pulse aging device according to claim 1, characterized in that: The high-voltage current-limiting fuse pulse aging device further includes: an interaction unit; The interaction unit is used to set the pulse aging parameter.

4. The high-voltage current-limiting fuse pulse aging device according to claim 3, characterized in that: The interaction unit is further configured to display the feedback signal.

5. The high-voltage current-limiting fuse pulse aging device according to claim 3, characterized in that: The interaction unit is a touch screen.

6. The high-voltage current-limiting fuse pulse aging device according to claim 1, characterized in that: The switch element in the inverter circuit unit adopts Infineon FF75R12RT4 module.

7. The high-voltage current-limiting fuse pulse aging device according to claim 2, characterized in that: The DSP control module uses TMS320F28379D as the control microprocessor.

8. The high-voltage current-limiting fuse pulse aging device according to claim 2, characterized in that: The IGBT drive module uses 2SD315AI as the drive chip.

9. A method for evaluating the life of a high-voltage current-limiting fuse, characterized in that: The high-voltage current-limiting fuse life assessment method comprises: Get pulse aging parameters; Using the high-voltage current limiting fuse pulse aging device as described in claims 1-8, an aging test is performed on the high-voltage current limiting fuse based on the pulse aging parameters; Obtaining resistance parameters of the high-voltage current-limiting fuse after aging test; Constructing a pulse aging database based on the pulse aging parameter and the resistance parameter; The life of the high-voltage current-limiting fuse is evaluated according to the pulse aging database.

10. The method for evaluating the life of a high-voltage current-limiting fuse according to claim 9, characterized in that: Constructing a pulse aging database based on the pulse aging parameter and the resistance parameter includes: Obtaining the number of impacts based on the pulse aging test time and the stress impact frequency; A pulse aging database is constructed based on the pulse aging parameter, the number of impacts and the resistance parameter.

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