Adjustable laser wavelength locking method, device, equipment and storage medium

Abstract

The present invention discloses a method, device, equipment and storage medium for locking the wavelength of an adjustable laser, and belongs to the technical field of laser module manufacturing. The present invention sequentially obtains the actual wavelength error between the target wavelength and the actual wavelength corresponding to multiple wavelength channels to be tested of the adjustable laser to be tested; based on the preset wavelength error and the first preset adjustment step, continuously adjusts the laser cooler control parameters of the adjustable laser to be tested until the actual wavelength error is less than or equal to the preset wavelength error; obtains the wavelength drift rate corresponding to the current wavelength channel to be tested; repeatedly performs the above operations to obtain multiple wavelength drift rates, and finally obtains the wavelength drift rates corresponding to all wavelength channels by linear interpolation calculation and writes them into the flash memory as wavelength locking parameters. Under the premise of saving manpower and material resources, efficient locking of the wavelength of the adjustable laser is achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of laser module manufacturing, and in particular to a method, device, equipment and storage medium for locking the wavelength of an adjustable laser. Background Art

[0002] ITLA (Integrated Tunable Laser Assembly) is a wavelength-tunable laser assembly whose wavelength covers the C-band or L-band. It has high requirements for wavelength accuracy, and its fluctuation range needs to be locked within 0.02nm. Normally, component suppliers will directly lock the wavelength by controlling various parameters of the tunable laser. However, when tunable lasers are used in large-scale production and transplanted to specific products, many external factors such as welding errors, welding processes, stress, and temperature drift will cause the wavelength of the tunable laser to shift and fail to meet the product's requirements for wavelength accuracy. Therefore, it is necessary to readjust the wavelength of the tunable laser. In related technologies, the method of coarse adjustment plus manual fine adjustment is mainly used to ensure that the wavelength is controlled within the target range to achieve wavelength locking.

[0003] However, the method of coarse tuning plus manual fine tuning is time-consuming and labor-intensive. When faced with large-scale production, the wavelength locking efficiency of tunable lasers is low. Summary of the invention

[0004] The main purpose of the present invention is to provide a method for locking the wavelength of an adjustable laser, aiming to solve the technical problem of low wavelength locking efficiency of an adjustable laser in the face of large-scale production in the related art.

[0005] To achieve the above object, the present invention provides a method for locking the wavelength of a tunable laser, the method comprising the following steps:

[0006] Sequentially obtain the actual wavelength errors between the target wavelengths and the actual wavelengths corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested;

[0007] Based on the preset wavelength error and the first preset adjustment step, continuously adjusting the laser cooler control parameters of the tunable laser to be tested until the actual wavelength error is less than or equal to the preset wavelength error;

[0008] Obtain the wavelength drift rate corresponding to the current wavelength channel to be tested, return to execute the step of sequentially obtaining the actual wavelength errors between the target wavelength and the actual wavelength corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested, until all the multiple wavelength channels to be tested are tested, and obtain the wavelength drift rate set corresponding to the multiple wavelength channels to be tested;

[0009] Performing linear interpolation calculation based on the wavelength drift rate set to obtain wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested;

[0010] The wavelength drift rates corresponding to all wavelength channels are written into the flash memory as wavelength locking parameters of the tunable laser to be tested.

[0011] Optionally, the step of continuously adjusting the laser cooler control parameters of the tunable laser to be tested based on the preset wavelength error and the first preset adjustment step until the actual wavelength error is less than or equal to the preset wavelength error includes:

[0012] Determine whether the actual wavelength error is greater than the preset wavelength error;

[0013] If so, the control parameters of the laser cooler are adjusted based on the first preset adjustment step, and the process returns to the step of determining whether the actual wavelength error is greater than the preset wavelength error, until the actual wavelength error is less than or equal to the preset wavelength error.

[0014] Optionally, the step of writing the wavelength drift rates corresponding to all wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested includes:

[0015] Based on the preset fluctuation parameters, a fluctuation threshold is added for all wavelength drift rates;

[0016] All wavelength drift rates and fluctuation thresholds are determined as wavelength locking parameters of the tunable laser to be tested and written into the flash memory.

[0017] Optionally, after the step of writing the wavelength drift rates corresponding to all wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested, the tunable laser wavelength locking method further comprises:

[0018] Acquire a wavelength drift rate of any wavelength channel of the tunable laser to be tested at a normal operating temperature as a first wavelength drift rate;

[0019] Obtaining a wavelength drift rate of the same wavelength channel of the tunable laser to be tested in a high temperature environment with a temperature higher than a first preset temperature as a second wavelength drift rate; wherein the first preset temperature is an upper limit of a normal working temperature;

[0020] Based on the preset drift accuracy and the second preset adjustment step, the control parameters of the etalon cooler are continuously adjusted under the condition that the control parameters of the laser cooler remain unchanged until the fluctuation amount of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy;

[0021] Record and perform linear interpolation calculation based on the first current parameter value of the etalon cooler to obtain multiple first current parameter values ​​based on different ambient temperatures;

[0022] Write all first current parameter values ​​to flash memory.

[0023] Optionally, based on a preset drift accuracy and a second preset adjustment step, the step of continuously adjusting the etalon cooler control parameters under the condition that the laser cooler control parameters remain unchanged until the fluctuation amount of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy includes:

[0024] Determine whether the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is greater than a preset drift accuracy;

[0025] If so, based on the second preset adjustment step, under the condition that the laser cooler control parameters remain unchanged, adjust the standard tool cooler control parameters, and return to the step of determining whether the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is greater than the preset drift accuracy, until the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0026] Optionally, after the step of writing all first current parameter values ​​into the flash memory, the tunable laser wavelength locking method further comprises:

[0027] Obtaining a wavelength drift rate of the same wavelength channel of the tunable laser to be tested in a low temperature environment lower than a second preset temperature as a third wavelength drift rate; wherein the second preset temperature is a lower limit of a normal working temperature;

[0028] Based on the preset drift accuracy and the second preset adjustment step, the control parameters of the etalon cooler are continuously adjusted under the condition that the control parameters of the laser cooler remain unchanged until the fluctuation amount of the drift rate of the third wavelength compared with the drift rate of the first wavelength is less than or equal to the preset drift accuracy;

[0029] Record and perform linear interpolation calculation based on the second current parameter value of the etalon cooler to obtain multiple second current parameter values ​​based on different ambient temperatures;

[0030] Write all second current parameter values ​​to flash memory.

[0031] Optionally, based on the preset drift accuracy and the second preset adjustment step, the step of continuously adjusting the control parameters of the etalon cooler under the condition that the control parameters of the laser cooler remain unchanged until the fluctuation amount of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy includes:

[0032] Determine whether the fluctuation amount of the third wavelength drift rate compared to the first wavelength drift rate is greater than a preset drift accuracy;

[0033] If so, based on the second preset adjustment step, under the condition that the laser cooler control parameters remain unchanged, adjust the standard tool cooler control parameters, and return to the step of determining whether the fluctuation of the third wavelength drift rate compared to the first wavelength drift rate is greater than the preset drift accuracy, until the fluctuation of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0034] In addition, to achieve the above-mentioned purpose, the present invention also provides a tunable laser wavelength locking device, the device comprising:

[0035] A wavelength error acquisition module is used to sequentially acquire the actual wavelength errors between the target wavelength and the actual wavelength corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested;

[0036] A wavelength error adjustment module, used to continuously adjust the laser cooler control parameters of the tunable laser to be tested based on a preset wavelength error and a first preset adjustment step size until the actual wavelength error is less than or equal to the preset wavelength error;

[0037] The wavelength drift acquisition module is used to obtain the wavelength drift rate corresponding to the wavelength channel to be tested;

[0038] A linear interpolation calculation module is used to perform linear interpolation calculation based on the wavelength drift rate set to obtain the wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested;

[0039] The parameter writing module is used to write the wavelength drift rates corresponding to all wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested.

[0040] In addition, to achieve the above-mentioned purpose, the present invention also provides an adjustable laser wavelength locking device, the device comprising: a memory, a processor, and an adjustable laser wavelength locking program stored in the memory and executable on the processor, the adjustable laser wavelength locking program being configured to implement the steps of the adjustable laser wavelength locking method as described above.

[0041] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, on which a tunable laser wavelength locking program is stored. When the tunable laser wavelength locking program is executed by a processor, the steps of the tunable laser wavelength locking method as described above are implemented.

[0042] The present invention sequentially obtains the actual wavelength errors of multiple wavelength channels to be tested, and compares them with the preset wavelength errors. Then, according to the comparison results, the laser cooler control parameters are adjusted with a fixed first preset adjustment step size to change the operating temperature of the laser diode, and the wavelength of the tunable laser is indirectly adjusted, thereby realizing closed-loop control of the tunable laser wavelength, and the wavelength of the tunable laser can be accurately controlled within the target range. On this basis, the wavelength drift rate of all wavelength channels of the tunable laser to be tested is obtained in combination with linear interpolation calculation, and the wavelength drift rate is stored in a flash memory, and combined with the laser cooler control parameters, it can be adjusted in real time to achieve wavelength locking. Therefore, the present invention can quickly lock the wavelength of the tunable laser within the target range without the need for human intervention throughout the process, greatly improving the wavelength locking efficiency of the tunable laser during large-scale production. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 It is a schematic diagram of the structure of an adjustable laser wavelength locking device in a hardware operating environment involved in an embodiment of the present invention;

[0044] Figure 2 It is a schematic diagram of the flow chart of the first embodiment of the tunable laser wavelength locking method of the present invention;

[0045] Figure 3 It is a schematic diagram of the flow chart of the second embodiment of the tunable laser wavelength locking method of the present invention;

[0046] Figure 4 It is a graph showing the transmittance of an etalon in the first embodiment of the tunable laser wavelength locking method of the present invention;

[0047] Figure 5 This is a spectrum diagram of the etalon in the first embodiment of the tunable laser wavelength locking method of the present invention;

[0048] Figure 6 This is a spectrum diagram of a light source in the first embodiment of the tunable laser wavelength locking method of the present invention;

[0049] Figure 7 A schematic diagram of an example of a method for locking the wavelength of a tunable laser according to the present invention;

[0050] Figure 8 A schematic diagram of the temperature optimization process of an example of the tunable laser wavelength locking method of the present invention.

[0051] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0052] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0053] The present invention sequentially obtains the actual wavelength errors of multiple wavelength channels to be tested, and compares them with the preset wavelength errors. Then, according to the comparison results, the laser cooler control parameters are adjusted with a fixed first preset adjustment step size to change the operating temperature of the laser diode, and the wavelength of the tunable laser is indirectly adjusted, thereby realizing closed-loop control of the tunable laser wavelength, and the wavelength of the tunable laser can be accurately controlled within the target range. On this basis, the wavelength drift rate of all wavelength channels of the tunable laser to be tested is obtained in combination with linear interpolation calculation, and the wavelength drift rate is stored in a flash memory, combined with the laser cooler control parameters, and can be adjusted in real time to achieve wavelength locking. Therefore, the wavelength of the tunable laser can be efficiently locked under the premise of saving manpower and material costs.

[0054] The inventive concept of the present application is further described below in conjunction with some specific embodiments and implementation methods.

[0055] Reference Figure 1 , Figure 1 The figure is a schematic diagram of the structure of an adjustable laser wavelength locking device in the hardware operating environment involved in the embodiment of the present invention.

[0056] like Figure 1 As shown, the tunable laser wavelength locking device may include: a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity (WIreless-FIdelity, WI-FI) interface). The memory 1005 may be a high-speed random access memory (Random Access Memory, RAM) memory, or a stable non-volatile memory (Non-Volatile Memory, NVM), such as a disk memory. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0057] Those skilled in the art will understand that Figure 1 The structure shown in the figure does not constitute a limitation on the tunable laser wavelength locking device, and may include more or less components than those shown in the figure, or combine certain components, or arrange the components differently.

[0058] like Figure 1As shown, the memory 1005 as a computer-readable storage medium may include an operating system, a data storage module, a network communication module, a user interface module, and a tunable laser wavelength locking program.

[0059] exist Figure 1 In the tunable laser wavelength locking device shown, the network interface 1004 is mainly used for data communication with other devices; the user interface 1003 is mainly used for data interaction with the user; the processor 1001 and the memory 1005 in the tunable laser wavelength locking device of the present invention can be set in the tunable laser wavelength locking device, and the tunable laser wavelength locking device calls the tunable laser wavelength locking program stored in the memory 1005 through the processor 1001, and executes the tunable laser wavelength locking method provided by the embodiment of the present invention.

[0060] The embodiment of the present invention provides a method for locking the wavelength of an adjustable laser. Figure 2 , Figure 2 The figure is a flow chart of a first embodiment of a method for locking wavelength of an adjustable laser according to the present invention.

[0061] In this embodiment, the tunable laser wavelength locking method includes:

[0062] Step S100: sequentially obtaining actual wavelength errors between target wavelengths and actual wavelengths corresponding to a plurality of wavelength channels to be tested of a tunable laser to be tested.

[0063] It can be understood that the wavelength channel of a tunable laser refers to the independent wavelength range that the laser can be tuned within a specific wavelength range. Its tuning range usually covers the C band, L band and S band. The wavelength tuning of a tunable laser is usually achieved through two methods: temperature coordination and current coordination. Among them, temperature coordination mainly changes the refractive index of the semiconductor material by changing the temperature of the laser, thereby adjusting the output wavelength of the tunable laser; current coordination directly controls the wavelength output of the tunable laser by adjusting the driving current of the laser diode.

[0064] Among them, the actual wavelength error of each wavelength channel of the tunable laser refers to the difference between the expected wavelength (that is, the target wavelength) and the laser when it is tuned to a specific wavelength (that is, the actual wavelength). This error manifests as a tiny frequency offset, usually expressed in "picometers (pm)" or "GHz".

[0065] In this embodiment, in order to take into account both the efficiency of wavelength locking of the tunable laser and the accuracy of wavelength control, it is first necessary to determine a representative wavelength channel to be tested from multiple tunable wavelength channels of the tunable laser for wavelength testing.

[0066] In the specific implementation process, first select and switch to a wavelength channel to be tested of the tunable laser according to actual needs, read the wavelength frequency of the wavelength channel to be tested, and then calculate the target wavelength corresponding to the wavelength channel to be tested by formula 1, and then directly read the actual wavelength of the wavelength channel to be tested, and finally calculate the actual wavelength error.

[0067] Formula 1: ;

[0068] in, is the wavelength, unit is nm; f is the wavelength frequency, unit is Hz; c is the speed of light.

[0069] For example, the wavelength frequency of the wavelength channel to be tested is , the target wavelength under the wavelength channel to be tested can be calculated by formula 1: At this time, the actual wavelength of the wavelength channel to be tested is read as , then the actual wavelength error of the wavelength channel to be tested is .

[0070] Step S200: Based on a preset wavelength error and a first preset adjustment step, continuously adjusting the laser cooler control parameters of the tunable laser to be tested until the actual wavelength error is less than or equal to the preset wavelength error.

[0071] It is understandable that there are two semiconductor coolers (TEC, Thermal Electric Cooler) in the tunable laser, namely ETN_TEC (also known as the etalon cooler) and Laser_TEC (also known as the laser cooler). Generally speaking, the working state of ETN (Etalon, etalon) is less sensitive to changes in the cooler (TEC), while the working state of Laser (laser) will respond quickly to changes in the cooler. Therefore, when adjusting the wavelength, the etalon cooler will be kept at a fixed value, and only the laser cooler will be adjusted.

[0072] Specifically, after obtaining the actual wavelength error of the wavelength channel to be tested, it is determined whether the actual wavelength error of the wavelength channel to be tested meets the accuracy requirement based on the preset wavelength error. If so, the subsequent steps are continued. If not, the control parameters of the laser cooler are continuously adjusted with a fixed first preset adjustment step size to adjust the operating temperature of the laser diode, and then the output wavelength of the tunable laser to be tested is indirectly adjusted to achieve the purpose of adjusting the actual wavelength error of the wavelength channel to be tested, until the actual wavelength error of the wavelength channel to be tested meets the accuracy requirement.

[0073] Furthermore, in the specific implementation process, step S200 specifically includes:

[0074] Step S210: determining whether the actual wavelength error is greater than the preset wavelength error.

[0075] Step S220: If yes, adjusting the control parameters of the laser cooler based on the first preset adjustment step.

[0076] Return to step S210 and execute until the actual wavelength error is less than or equal to the preset wavelength error.

[0077] Specifically, after obtaining the actual wavelength error of the wavelength channel to be tested, the actual wavelength error of the wavelength channel to be tested is compared with the preset wavelength error to determine whether the actual wavelength error is greater than the preset wavelength error. If the actual wavelength error is greater than the preset wavelength error at this time, the control parameter of the laser cooler is adjusted according to the first preset adjustment step.

[0078] It is understandable that the main function of the laser cooler is to adjust the operating temperature of the laser diode in the tunable laser. The temperature change of the laser diode has a significant impact on the output wavelength of the tunable laser. Generally, an increase in the temperature of the laser diode will cause the output wavelength of the tunable laser to redshift (i.e., the wavelength becomes longer), while a decrease in temperature will cause the wavelength to blueshift (i.e., the wavelength becomes shorter). Therefore, by adjusting the control parameters of the laser cooler, the output wavelength of the tunable laser to be tested can be indirectly adjusted, and then the actual wavelength error of the wavelength channel to be tested can be controlled to meet the preset accuracy requirements.

[0079] Step S300: Obtaining the wavelength drift rate corresponding to the wavelength channel to be tested currently.

[0080] Return to step S100 and execute until all the multiple wavelength channels to be tested are tested, and a set of wavelength drift rates corresponding to the multiple wavelength channels to be tested is obtained.

[0081] Step S400: performing linear interpolation calculation based on the wavelength drift rate set to obtain wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested.

[0082] It can be understood that linear interpolation calculation is a mathematical method used to estimate unknown values ​​between known data points. Based on the wavelength drift rates of some wavelength channels, the wavelength drift rates of other wavelength channels can be inferred by linear interpolation. For example, when the drift rates of two wavelength points are known, the wavelength drift rates of other wavelengths between these points can be estimated by interpolation.

[0083] In this embodiment, on the basis of obtaining the wavelength drift rates of a plurality of wavelength channels to be tested, the wavelength drift rates of all wavelength channels of the tunable laser to be tested may be obtained by linear difference calculation.

[0084] Step S500: writing the wavelength drift rates corresponding to all wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested.

[0085] It can be understood that in a tunable laser, the standard has the function of an optical resonant cavity, and its main function is to control the wavelength of the tunable laser. The resonant cavity is a structure in the laser used to maintain the coherence of light waves, and the etalon, as a part of the resonant cavity, can help the laser form a stable laser output and adjust the wavelength of the laser within a specific range. In theory, the transmittance of the etalon changes periodically with the laser frequency. When the laser frequency matches the resonance condition of the etalon, the reflected light on the two surfaces of the etalon will interfere destructively. Specifically, the reflected wave of the laser will produce interference in the optical resonant cavity. When destructive interference occurs, the intensity of the reflected light will decrease, and the intensity of the light passing through the etalon will increase. When the laser frequency does not meet the resonance condition, the reflection loss of the etalon will reach a maximum, that is, the reflected light intensity will be the maximum. That is, the output wavelength of the laser will be adjusted by the etalon, and in the case of anti-resonance, the output power of the laser will decrease due to the increase in reflection loss. When the reflectivity of the surface of the etalon is not too high, the transmittance T of the etalon is proportional to the wavelength. There is the following mathematical relationship:

[0086] Formula 2: ;

[0087] Where, T is the transmittance of the etalon; is the phase difference; F is the fineness of the etalon (that is, the maximum number of fringes that can be resolved within a full-scale range).

[0088] Formula 3: ;

[0089] Where n is the refractive index within the etalon; is the light refraction angle; is the cavity thickness or length of the etalon; is the laser wavelength.

[0090] Combining Formula 2 and Formula 3, it is not difficult to see that the transmittance T and frequency f are approximately a simple sine equation. Therefore, when the properties of the etalon are fixed, that is, n (refractive index in the etalon), F (fineness of the etalon), l (thickness or length of the cavity of the etalon), and (light refraction angle) are all fixed constants, at this time T and There are similar sinusoidal curves, such as Figure 4 (Etalon transmittance curve) shown. Figure 4 The horizontal axis is wavelength (Wavelength), and the vertical axis is the transmittance of the standard device. Different curves represent the transmittance curves of multiple different wavelengths in the resonant cavity.

[0091] Since the etalon uses the principle of light interference to perform frequency screening, when a fixed light source illuminates the ENT, the spectrum formed by the etalon is as follows: Figure 5 (Etalon spectrum diagram) is shown. The horizontal axis is the wavelength of the light source, and the vertical axis is the light power of the light source after passing through the etalon. Figure 5 It can be seen that the higher the light intensity (that is, the greater the light power), the greater the curve amplitude in the spectrum graph. Figure 6 , Figure 6 It is the spectrum of the light source before it passes through the etalon (that is, the spectrum of the light source itself). The horizontal axis is the wavelength of the light source, and the vertical axis is the optical power of the light source. Figure 6 It can be seen that the shape and peak value of the spectrum of any light source before and after passing through the etalon are almost constant, which shows that the intensity of the light source is almost unaffected after any light source passes through the etalon.

[0092] Therefore, based on the above principle, two groups of monitoring ADCs can be set for the tunable laser, one group is used to detect the current change of the standard tool ( ), as long as the wavelength If the value of the etalon changes, the corresponding transmittance T of the etalon will also change, which can be determined by monitoring the current value of the etalon; the other group is used to detect the change of the light source current ( ), generally speaking, the greater the light source current, the greater the light source intensity. In normal operation, the optical power value of the adjustable laser should be a certain value. When affected by external factors, the optical power will drift. At this time, a dimensionless number Drift (also known as the wavelength drift rate) is defined, recorded as ,So Satisfies formula 4.

[0093] Formula 4: ;

[0094] because In actual operation, the change is small. Therefore, according to the above inference, formula 4 also has a relationship similar to a sine curve. Therefore, it is not difficult to understand that the wavelength drift rate It can more accurately reflect the change of the current of the etalon. However, the change of the current of the etalon can reflect the change of the transmittance of the etalon. According to the above, the transmittance and wavelength of the etalon satisfy the mathematical relationship of formula 2, so the wavelength drift rate can indirectly reflect the change of wavelength. It can be seen that when the optical power of the tunable laser drifts, the working state of the tunable laser can be determined by real-time monitoring of the optical power change. Specifically, the wavelength drift rate can be used as a feedback signal to feedback and control the wavelength.

[0095] Specifically, when the wavelength channel to be tested is adjusted to meet the preset accuracy requirements, the wavelength drift rate currently corresponding to the wavelength channel to be tested is obtained and recorded. Then the next wavelength channel to be tested is switched, and steps S100 to S300 are continued until all the wavelength channels to be tested are tested, and the wavelength drift rate corresponding to each wavelength channel to be tested is obtained respectively, that is, a set of wavelength drift rates. Finally, based on the obtained multiple wavelength drift rates, the wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested are obtained by combining linear interpolation calculation, and all wavelength drift rates are written into the flash memory of the tunable laser to be tested as wavelength locking parameters, so that the tunable laser to be tested can adjust the relevant control parameters in real time according to the wavelength drift rate fed back to achieve wavelength locking.

[0096] Furthermore, in the specific implementation process, step S500 specifically includes:

[0097] Step S510: adding a fluctuation threshold for all wavelength drift rates based on a preset fluctuation parameter.

[0098] Step S520: Determine all wavelength drift rates and fluctuation thresholds as wavelength locking parameters of the tunable laser to be tested and write them into the flash memory.

[0099] It is understandable that the TEC (Thermoelectric Cooler chip), ADC (Analog-to-Digital Converter chip) sampling chip, DAC (Digital-to-Analog Converter chip) adjustment chip, MCU (Microcontroller Unit) and other chips inside the tunable laser have certain errors and precision differences. In order to avoid some minor errors that cause system instability, it is necessary to set a system error tolerance to improve the robustness of the system.

[0100] Specifically, firstly, according to the preset fluctuation parameters, a fluctuation threshold is added for each wavelength drift rate, and then the wavelength drift rate and its corresponding fluctuation threshold are written into the flash memory together to improve the working stability of the tunable laser to be tested.

[0101] In this embodiment, the actual wavelength errors of multiple wavelength channels to be tested are obtained in sequence and compared with the preset wavelength errors, and then the laser cooler control parameters are adjusted with a fixed first preset adjustment step size according to the comparison results to change the operating temperature of the laser diode, and the wavelength of the tunable laser is indirectly adjusted, thereby realizing closed-loop control of the tunable laser wavelength, and the wavelength of the tunable laser can be accurately controlled within the target range. On this basis, the wavelength drift rate of all wavelength channels of the tunable laser to be tested is obtained in combination with linear interpolation calculation, and the wavelength drift rate is stored in a flash memory, and combined with the laser cooler control parameters, it can be adjusted in real time to achieve wavelength locking. Therefore, the present invention can quickly lock the wavelength of the tunable laser within the target range without the need for human intervention throughout the process, greatly improving the wavelength locking efficiency of the tunable laser during large-scale production.

[0102] Further, based on the first embodiment, a second embodiment is proposed, referring to Figure 3 , Figure 3 FIG. 4 is a flow chart of a second embodiment of a method for locking wavelength of a tunable laser according to the present invention.

[0103] In this embodiment, after step S500, the method further includes:

[0104] Step b10: obtaining a wavelength drift rate of any wavelength channel of the tunable laser to be tested at a normal operating temperature as a first wavelength drift rate.

[0105] Step b20: obtaining the wavelength drift rate of the same wavelength channel of the tunable laser to be tested in a high temperature environment higher than a first preset temperature as a second wavelength drift rate, wherein the first preset temperature is the upper limit of the normal working temperature.

[0106] Step b30: Based on the preset drift accuracy and the second preset adjustment step, the standard tool cooler control parameters are continuously adjusted under the condition that the laser cooler control parameters remain unchanged until the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0107] It is understandable that the tunable laser is significantly affected by the ambient temperature during operation. To further ensure that the wavelength adjustment and locking accuracy are affected by the high temperature environment to a minimum, on the basis of the above, the tunable laser to be tested can be placed in a high temperature environment higher than the first preset temperature for further testing to improve the wavelength locking accuracy in the high temperature environment.

[0108] Specifically, first obtain the wavelength drift rate corresponding to any wavelength channel of the tunable laser to be tested at normal working temperature, and use it as the first wavelength drift rate. Then put the tunable laser to be tested in a high temperature environment with a temperature higher than the first preset temperature for testing, and obtain the wavelength drift rate corresponding to the same wavelength channel of the tunable laser to be tested in the high temperature environment, and use it as the second wavelength drift rate. Next, control the control parameters of the laser cooler unchanged through the microcontroller unit, and then judge whether the fluctuation amount of the second wavelength drift rate compared with the first wavelength drift rate meets the accuracy requirements according to the preset drift accuracy, that is, judge whether the fluctuation amount is less than or equal to the preset drift accuracy. If not, continuously adjust the control parameters of the standard cooler according to the second preset adjustment step until the second wavelength drift rate meets the accuracy requirements compared with the first wavelength drift rate.

[0109] Furthermore, in the specific implementation process, step b30 specifically includes:

[0110] Step b31: Determine whether the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is greater than a preset drift accuracy.

[0111] Step b32: If yes, then based on the second preset adjustment step, the control parameters of the etalon cooler are adjusted under the condition that the control parameters of the laser cooler remain unchanged.

[0112] Return to step b31 until the fluctuation amount of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0113] Specifically, first, according to the obtained second wavelength drift rate and first wavelength drift rate, the absolute value of the difference between the two is calculated, that is, the fluctuation amount between the two. Then, it is determined whether the fluctuation amount is greater than the preset drift accuracy. If so, the standard tool cooler control parameter is adjusted according to the second preset adjustment step, and then the step b31 is returned to be executed, and multiple iterations are performed until the absolute value of the difference between the second wavelength drift rate and the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0114] Step b40: Record and perform linear interpolation calculation based on the first current parameter value of the etalon cooler to obtain a plurality of first current parameter values ​​at different ambient temperatures.

[0115] Step b50: Write all first current parameter values ​​into the flash memory.

[0116] Specifically, when the fluctuation amount between the second wavelength drift rate and the first wavelength drift rate meets the preset drift accuracy, the first current parameter value of the etalon cooler is read and recorded. Then, a linear interpolation calculation is performed based on the obtained first current parameter value to obtain multiple first current parameter values ​​at different temperatures above the first preset temperature, and the values ​​are written into the flash memory of the tunable laser to be tested.

[0117] Among them, the first current parameter value is a temperature data (hexadecimal data) of the standard cooler at an operating environment temperature above the first preset temperature, representing the working environment temperature of the standard at this time. Since the transmittance of the standard is only related to the current at a fixed temperature, the change of wavelength can be known by monitoring the light source intensity and the standard current at this time. When the wavelength changes, the change of the wavelength drift rate ΔD can be detected, and then the actual wavelength at this time is compared with the target wavelength to obtain the actual wavelength error. If the actual wavelength error exceeds the preset wavelength error at this time, the laser cooler control parameter is adjusted to make the actual wavelength error return to the preset wavelength error range. When the adjustable laser is at different ambient temperatures and the first current parameter value changes, the above steps are repeated to keep the actual wavelength error within the preset wavelength error. Therefore, writing the first current parameter value under different high temperature environments into the flash memory can improve the robustness of the system under different high temperature environments.

[0118] In the specific implementation process, a set of look-up tables (LUT) can be established for the first current parameter value, that is, the first current parameter value under different ambient temperatures is pre-stored in the look-up table, written into the flash memory, and the subsequent query directly returns the result.

[0119] Furthermore, in order to ensure that the wavelength adjustment and locking accuracy are affected by the low temperature environment to a minimum, in this embodiment, after step b50, the method includes:

[0120] Step b60: obtaining the wavelength drift rate of the same wavelength channel of the tunable laser to be tested in a low temperature environment lower than a second preset temperature as a third wavelength drift rate, wherein the second preset temperature is the lower limit of the normal working temperature.

[0121] Step b70: Based on the preset drift accuracy and the second preset adjustment step, the standard tool cooler control parameters are continuously adjusted under the condition that the laser cooler control parameters remain unchanged until the fluctuation of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0122] It is understandable that the tunable laser to be tested may be placed in a low temperature environment lower than the second preset temperature for further testing to improve the wavelength locking accuracy in the low temperature environment.

[0123] Specifically, the tunable laser to be tested is placed in a low-temperature environment with a temperature lower than the second preset temperature for testing, and the wavelength drift rate corresponding to the same wavelength channel of the tunable laser to be tested in the low-temperature environment is obtained, and it is used as the third wavelength drift rate. Then, the control parameters of the laser cooler are controlled unchanged by the microcontroller unit, and then the fluctuation amount of the third wavelength drift rate compared with the first wavelength drift rate is judged according to the preset drift accuracy to see whether it meets the accuracy requirements, that is, to see whether the fluctuation amount is less than or equal to the preset drift accuracy. If not, the control parameters of the standard cooler are continuously adjusted according to the second preset adjustment step until the third wavelength drift rate meets the accuracy requirements compared with the first wavelength drift rate.

[0124] Furthermore, in the specific implementation process, step b70 specifically includes:

[0125] Step b71: Determine whether the fluctuation of the third wavelength drift rate compared to the first wavelength drift rate is greater than a preset drift accuracy.

[0126] Step b72: If yes, then based on the second preset adjustment step, the etalon cooler control parameters are adjusted under the condition that the laser cooler control parameters remain unchanged.

[0127] Return to step b71 until the fluctuation amount of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0128] Specifically, first, according to the obtained third wavelength drift rate and the first wavelength drift rate, the absolute value of the difference between the two is calculated, that is, the fluctuation amount between the two. Then, it is determined whether the fluctuation amount is greater than the preset drift accuracy. If so, the standard tool cooler control parameter is adjusted according to the second preset adjustment step, and then the step b71 is returned to be executed, and multiple iterations are performed until the absolute value of the difference between the third wavelength drift rate and the first wavelength drift rate is less than or equal to the preset drift accuracy.

[0129] Step b80: Record and perform linear interpolation calculation based on the second current parameter value of the etalon cooler to obtain a plurality of second current parameter values ​​at different ambient temperatures.

[0130] Step b90: Write all second current parameter values ​​into the flash memory.

[0131] Specifically, when the fluctuation amount between the third wavelength drift rate and the first wavelength drift rate meets the preset drift accuracy, the second current parameter value of the etalon cooler is read and recorded. Then, a linear interpolation calculation is performed based on the obtained second current parameter value to obtain multiple second current parameter values ​​at different temperatures below the second preset temperature, and the values ​​are written into the flash memory of the tunable laser to be tested.

[0132] The second current parameter value is similarly a temperature data of the standard tool cooler at an operating environment temperature below the second preset temperature (that is, in a low temperature environment), which will not be described in detail here.

[0133] In this embodiment, by keeping the laser cooler control parameters unchanged at different temperatures, the control parameters of the etalon cooler corresponding to the same wavelength channel are continuously adjusted with the second preset adjustment step length, so that the fluctuation of the wavelength drift rate at different high and low temperature ambient temperatures relative to the normal working temperature can meet the preset drift accuracy. The corresponding parameter values ​​of the etalon cooler at different temperatures are recorded and written into the flash memory of the tunable laser to be tested, so that the wavelength adjustment and locking accuracy are affected by the ambient temperature to the minimum, thereby greatly improving the reliability of the wavelength locking of the tunable laser in the face of large-scale production.

[0134] In order to enable those skilled in the art to better understand the scope of protection of the claims of this application, the following is an explanation of the technical solutions recorded in the claims of this application through specific implementation examples in specific application scenarios. It can be understood that the following examples are only used to explain this application, and are not used to limit the scope of protection of the claims of this application.

[0135] Example: In a specific example, the flow chart of tunable laser wavelength locking is as follows: Figure 7 First, select the wavelength channel according to actual needs, and then preset a wavelength error. , for example, 0.005nm. When selecting any channel data of the tunable laser for adjustment, for example, the wavelength frequency under this channel is f1, the wavelength under this channel is obtained by calculation through formula 1 , then read the actual wavelength of the current channel , and the error with the preset wavelength For comparison, if , the laser cooler is controlled by the microcontroller unit with a certain step length, and then the above steps are repeated until , record the wavelength drift rate at this time Generally speaking, the first and last channels of the adjustable laser or its accessory channels are selected for adjustment and recording. It can fully meet the accuracy of about 10 picometers. If higher precision wavelength is required, it can be achieved by appropriately increasing the number of channels scanned and reducing the adjustment step size of the laser cooler.

[0136] When completed After recording, linear interpolation is performed on the obtained values ​​to obtain the values ​​of all channels. .

[0137] Since the TEC chip, ADC sampling chip, DAC adjustment chip, microcontroller unit, etc. inside the adjustable laser have certain errors and precisions, all interpolation Add a fluctuation threshold (such as 0.025) to ensure robustness in the actual working environment. and fluctuation thresholds are written to flash memory.

[0138] Since the temperature of the three temperature environments (i.e. high temperature environment, low temperature environment and normal working temperature environment) of the tunable laser is quite different when it is working, in order to further ensure that the wavelength adjustment and locking accuracy are affected by the ambient temperature to the minimum, refer to Figure 7 , Figure 7 The following is a schematic diagram of the temperature optimization process. Figure 8 As shown, based on the above, first preset a drift accuracy When selecting any channel data of the tunable laser for adjustment, a set of lookup tables is made for the setting values ​​of the etalon cooler, that is, a wavelength channel is randomly selected for adjustment. Read, write , and then put it into the temperature box to simulate the high and low temperature environment. At this time, the microcontroller unit controls the laser cooler to maintain a certain value. At this time, the standard tool cooler is adjusted with a fixed step size (the step size can be set) and the current value is read. , recorded as ,like , then record the temperature data of the standard tool cooler at this time, repeat this step until the temperature data of the standard tool cooler in the three-temperature environment is acquired, and then perform linear interpolation calculation on this basis, and write all the calculated temperature data of the standard tool cooler into the flash memory, so as to minimize the possibility that the wavelength accuracy of the tunable laser is affected by temperature fluctuations.

[0139] Refer to Table 1, which is a comparison of the effects of the three wavelength locking methods. As can be seen from Table 1, algorithm debugging is much better than manual fine tuning and test board coarse tuning in terms of accuracy and efficiency, and is very suitable for mass production or testing. It can save manpower and material resources while greatly improving production efficiency.

[0140] Table 1 Comparison of the effects of three wavelength locking methods:

[0141]

[0142] It is worth mentioning that the specific numerical values ​​of all the preset values ​​of the present invention mentioned above are set according to actual needs and are not limited here.

[0143] Furthermore, to achieve the above-mentioned purpose, the present invention also provides a tunable laser wavelength locking device, which may include:

[0144] A wavelength error acquisition module is used to sequentially acquire the actual wavelength errors between the target wavelength and the actual wavelength corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested;

[0145] A wavelength error adjustment module, used to continuously adjust the laser cooler control parameters of the tunable laser to be tested based on a preset wavelength error and a first preset adjustment step size until the actual wavelength error is less than or equal to the preset wavelength error;

[0146] The wavelength drift acquisition module is used to obtain the wavelength drift rate corresponding to the wavelength channel to be tested;

[0147] A linear interpolation calculation module is used to perform linear interpolation calculation based on the wavelength drift rate set to obtain the wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested;

[0148] The parameter writing module is used to write the wavelength drift rates corresponding to all wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested.

[0149] It should be noted that the functions that can be realized by each module in the tunable laser wavelength locking device provided in this embodiment and the corresponding technical effects achieved can refer to the description of the specific implementation methods in each embodiment of the tunable laser wavelength locking method of the present invention. For the sake of brevity of the specification, they will not be repeated here.

[0150] In addition, an embodiment of the present invention further proposes a computer-readable storage medium, on which an adjustable laser wavelength locking program is stored, and when the adjustable laser wavelength locking program is executed by a processor, the steps of the adjustable laser wavelength locking method as described above are implemented. Therefore, no further description will be given here. In addition, the description of the beneficial effects of adopting the same method will not be repeated. For technical details not disclosed in the computer-readable storage medium embodiment involved in the present invention, please refer to the description of the method embodiment of the present invention. As an example, the program instructions can be deployed to be executed on one computing device, or on multiple computing devices located at one location, or on multiple computing devices distributed at multiple locations and interconnected by a communication network.

[0151] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of more restrictions, the elements defined by the sentence "including an adjustable laser wavelength locking" do not exclude the existence of other identical elements in the process, method, article or system including the element.

[0152] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0153] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a computer-readable storage medium (such as ROM / RAM, magnetic disk, optical disk) as above, and includes a number of instructions for a terminal device (which can be a mobile phone, a computer, a server, or a network device, etc.) to execute the methods of various embodiments of the present invention.

[0154] The above are only preferred embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A method for locking the wavelength of an adjustable laser, characterized in that: The tunable laser wavelength locking method comprises the following steps: Sequentially obtain the actual wavelength errors between the target wavelengths and the actual wavelengths corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested; Based on a preset wavelength error and a first preset adjustment step, continuously adjusting a laser cooler control parameter of the tunable laser to be tested until the actual wavelength error is less than or equal to the preset wavelength error; Obtaining the wavelength drift rate corresponding to the current wavelength channel to be tested, returning to the step of sequentially obtaining the actual wavelength errors between the target wavelength and the actual wavelength corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested, until all the multiple wavelength channels to be tested are tested, and obtaining the wavelength drift rate set corresponding to the multiple wavelength channels to be tested; Performing linear interpolation calculation based on the wavelength drift rate set to obtain wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested; The wavelength drift rates corresponding to all the wavelength channels are written into the flash memory as the wavelength locking parameters of the tunable laser to be tested.

2. The tunable laser wavelength locking method according to claim 1, characterized in that: The step of continuously adjusting the laser cooler control parameters of the tunable laser to be tested based on the preset wavelength error and the first preset adjustment step until the actual wavelength error is less than or equal to the preset wavelength error includes: Determining whether the actual wavelength error is greater than the preset wavelength error; If so, the control parameters of the laser cooler are adjusted based on the first preset adjustment step, and the step of determining whether the actual wavelength error is greater than the preset wavelength error is returned to execute until the actual wavelength error is less than or equal to the preset wavelength error.

3. The tunable laser wavelength locking method according to claim 1, characterized in that: The step of writing the wavelength drift rates corresponding to all the wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested comprises: Based on the preset fluctuation parameter, adding a fluctuation threshold value for all the wavelength drift rates; All the wavelength drift rates and the fluctuation thresholds are determined as wavelength locking parameters of the tunable laser to be tested and written into the flash memory.

4. The tunable laser wavelength locking method according to any one of claims 1 to 3, characterized in that: After the step of writing the wavelength drift rates corresponding to all the wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested, the tunable laser wavelength locking method further comprises: Acquire a wavelength drift rate of any wavelength channel of the tunable laser to be tested at a normal operating temperature as a first wavelength drift rate; Acquire a wavelength drift rate of the same wavelength channel of the tunable laser to be tested in a high temperature environment with a temperature higher than a first preset temperature as a second wavelength drift rate; wherein the first preset temperature is an upper limit of the normal working temperature; Based on a preset drift accuracy and a second preset adjustment step, and under the condition that the laser cooler control parameter remains unchanged, the etalon cooler control parameter is continuously adjusted until the fluctuation amount of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy; Recording and performing linear interpolation calculation based on the first current parameter value of the etalon cooler to obtain a plurality of first current parameter values ​​based on different ambient temperatures; All the first current parameter values ​​are written into the flash memory.

5. The tunable laser wavelength locking method according to claim 4, characterized in that: The step of continuously adjusting the etalon cooler control parameters based on the preset drift accuracy and the second preset adjustment step size under the condition that the laser cooler control parameters remain unchanged until the fluctuation amount of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy comprises: Determining whether a fluctuation amount of the second wavelength drift rate compared to the first wavelength drift rate is greater than the preset drift accuracy; If so, based on the second preset adjustment step, under the condition that the laser cooler control parameters remain unchanged, the standard tool cooler control parameters are adjusted, and the step of determining whether the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is greater than the preset drift accuracy is returned to execute, until the fluctuation of the second wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

6. The tunable laser wavelength locking method according to claim 5, characterized in that: After the step of writing all the first current parameter values ​​into the flash memory, the tunable laser wavelength locking method further comprises: Acquire the wavelength drift rate of the same wavelength channel of the tunable laser to be tested in a low temperature environment lower than a second preset temperature as a third wavelength drift rate; wherein the second preset temperature is the lower limit of the normal working temperature; Based on the preset drift accuracy and the second preset adjustment step, the etalon cooler control parameter is continuously adjusted under the condition that the laser cooler control parameter remains unchanged until the fluctuation amount of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy; Recording and performing linear interpolation calculation based on the second current parameter value of the etalon cooler to obtain a plurality of the second current parameter values ​​at different ambient temperatures; All the second current parameter values ​​are written into the flash memory.

7. The tunable laser wavelength locking method according to claim 6, characterized in that: The step of continuously adjusting the etalon cooler control parameter based on the preset drift accuracy and the second preset adjustment step size, under the condition that the laser cooler control parameter remains unchanged, until the fluctuation amount of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy comprises: Determining whether a fluctuation amount of the third wavelength drift rate compared to the first wavelength drift rate is greater than the preset drift accuracy; If so, based on the second preset adjustment step, under the condition that the laser cooler control parameters remain unchanged, the standard tool cooler control parameters are adjusted, and the step of determining whether the fluctuation of the third wavelength drift rate compared to the first wavelength drift rate is greater than the preset drift accuracy is returned to execute, until the fluctuation of the third wavelength drift rate compared to the first wavelength drift rate is less than or equal to the preset drift accuracy.

8. A tunable laser wavelength locking device, characterized in that: The device comprises: A wavelength error acquisition module is used to sequentially acquire the actual wavelength errors between the target wavelength and the actual wavelength corresponding to the multiple wavelength channels to be tested of the tunable laser to be tested; A wavelength error adjustment module, used to continuously adjust the laser cooler control parameters of the tunable laser to be tested based on a preset wavelength error and a first preset adjustment step size until the actual wavelength error is less than or equal to the preset wavelength error; A wavelength drift acquisition module, used to acquire the wavelength drift rate corresponding to the wavelength channel to be tested; A linear interpolation calculation module, used to perform linear interpolation calculation based on the wavelength drift rate set to obtain wavelength drift rates corresponding to all wavelength channels of the tunable laser to be tested; The parameter writing module is used to write the wavelength drift rates corresponding to all the wavelength channels into the flash memory as the wavelength locking parameters of the tunable laser to be tested.

9. A tunable laser wavelength locking device, characterized in that: The device comprises: a memory, a processor, and a tunable laser wavelength locking program stored in the memory and executable on the processor, wherein the tunable laser wavelength locking program is configured to implement the steps of the tunable laser wavelength locking method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a tunable laser wavelength locking program, and when the tunable laser wavelength locking program is executed by the processor, the steps of the tunable laser wavelength locking method according to any one of claims 1 to 7 are implemented.

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