Full-automatic thin film voltage-withstanding temperature spectrum testing device and testing method

Abstract

The invention relates to the technical field of film testing, in particular to a full-automatic film voltage-withstanding temperature spectrum testing device and method, which can realize automatic voltage-withstanding testing of a film wide temperature spectrum and greatly improve the testing efficiency and the testing accuracy, and a tested electrode can follow a testing module to translate to a detection position and then descend for testing. And the angle between the electrode and the surface of the thin film is consistent during each test, so that the electrode does not cause great damage to the surface of the thin film, the wide-temperature-spectrum automatic withstand voltage test of the thin film is realized, and the test efficiency and the test accuracy are greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of thin film testing, and in particular to a fully automatic thin film pressure-resistance temperature spectrum testing device and a testing method. Background Art

[0002] High energy storage density pulse power capacitors are key and basic components in the fields of national defense, military, transportation, electricity, scientific research and medical treatment. They are common technologies that need to be solved in major national strategic projects such as domestic aircraft carrier projects, ultra-high voltage transmission projects, high-speed railway projects, and new energy vehicle development and popularization projects. Organic film capacitors usually have a high breakdown field strength and unique self-healing properties. They can work stably under high electric fields. At this stage, they are the only choice for energy storage devices in (ultra) high voltage, (ultra) high current, and (ultra) high power application scenarios. They are widely used in various fields of national defense, military, scientific research and civilian use, such as power pulse generation, high-frequency inverters, power factor correction, etc.

[0003] The current problem that film capacitors need to solve urgently is how to achieve better energy storage density. According to the linear dielectric energy storage density calculation formula: It can be seen that the energy storage density is in a square relationship with the voltage. Therefore, the withstand voltage test of the polymer dielectric film is of great significance for the development of high energy storage film capacitors. Conventional withstand voltage test usually uses the manual 50-point method to test the withstand voltage of the polymer dielectric film at room temperature, which has the disadvantages of low efficiency and narrow temperature spectrum. Summary of the invention

[0004] In order to solve the above technical problems, the present invention provides a fully automatic thin film withstand voltage and temperature spectrum testing device, which can realize automatic withstand voltage testing of thin films with a wide temperature spectrum, greatly improving test efficiency and test accuracy.

[0005] The technical solution is as follows: a fully automatic thin film withstand voltage temperature spectrum test device, characterized in that it includes a heat-insulating shell, a detection platform, a test module and a detection bracket plate are installed in the heat-insulating shell, a rubber pad wrapped with annealed aluminum foil is placed on the detection platform to form a test negative electrode, the detection bracket plate and the test module are arranged behind the detection platform, the test module is connected to a translation drive mechanism, the test module is connected to an electrode serving as a test positive electrode, the test positive electrode is connected to a lifting drive mechanism, and an unwinding mechanism and a winding machine are respectively arranged on both sides of the electrode The unwinding mechanism comprises an unwinding roller, an unwinding side tensioning roller, and an unwinding side moving roller, and the winding mechanism comprises a winding roller, a winding side tensioning roller, and a winding side moving roller; the film starts from the unwinding roller, and sequentially passes around the unwinding side tensioning roller, the unwinding side moving roller, the winding side moving roller, and the winding side tensioning roller, and is then wound up by the winding roller, the unwinding side moving roller and the winding side moving roller are connected to a swinging driving mechanism to achieve up and down swinging, which is used to drive the film between the unwinding side moving roller and the winding side moving roller to separate from and approach the test negative electrode.

[0006] It is further characterized in that a sandwich layer is provided in the heat-insulating shell, and the sandwich layer is filled with foamed polyurethane; A heating unit and a temperature control unit are provided in the thermal insulation shell. The temperature control unit is electrically connected to the heating unit. When the heating unit starts to heat, the temperature control unit monitors the temperature in the thermal insulation shell. When the temperature is about to reach the set temperature, a low-power heating mode is adopted. When the temperature exceeds the set temperature by a certain value, the heating unit stops working until the temperature is lower than the set temperature, and then the heating unit continues to work.

[0007] A testing method of a fully automatic thin film withstand voltage temperature spectrum testing device, characterized in that it comprises the following steps: S1: Wrap the rubber pad with annealed aluminum foil and place it on the test platform as the negative electrode of the test; S2: Place the sample film to be tested into the unwinding roller and lock it. The film passes through the unwinding side tensioning roller, the unwinding side moving roller, the winding side moving roller, the winding side tensioning roller in sequence and then enters the winding roller; S3: Set the test temperature, the heating unit starts working, and wait for the test temperature to stabilize; S4: Start the test, the unwinding side moving roller and the winding side moving roller move downward, the film is attached to the negative electrode, the electrode moves downward, and contacts the film for testing, the test module moves from left to right, and carries the electrode for testing, after a certain number of points are tested, the electrode is lifted, the unwinding side moving roller and the winding side moving roller move upward, the film is separated from the negative electrode, the winding roller and the unwinding roller start working, the film that has been tested is rolled up to the winding roller, and the new film to be tested is placed from the unwinding roller to the negative electrode to be tested, and a new round of testing starts until the test is completed; S5: After the test is completed, the film is rolled up and the annealed aluminum foil is replaced.

[0008] After adopting the present invention, the tested electrode can be translated to the detection position following the test module, and then descended for testing, thus saving manual labor. The angle between the electrode and the film surface is consistent during each test, thus ensuring that the electrode will not cause significant damage to the film surface, thus realizing automatic withstand voltage testing of the film over a wide temperature spectrum, and greatly improving the test efficiency and test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 This is a schematic diagram of the main structure of the present invention (without the front cover); Figure 2 It is a schematic diagram of the internal structure of the present invention; Figure 3 This is a schematic diagram of the automatic winding and unwinding film threading shaft of the present invention; Figure 4 The invention discloses a linkage logic diagram of a temperature control unit and a heating unit. DETAILED DESCRIPTION

[0010] See Figures 1 to 3As shown, a fully automatic film withstand voltage temperature spectrum testing device comprises a heat-insulating shell 1, in which a detection platform 2, a test module 3 and a detection bracket plate 4 are installed, a rubber pad 5 wrapped with annealed aluminum foil is placed on the detection platform 2 to form a test negative electrode, the detection bracket plate 4 and the test module 3 are arranged behind the detection platform 2, the test module 3 is connected to a translation drive mechanism, the test module 3 is connected to an electrode 6 as a test positive electrode, and an unwinding mechanism 7 and a winding mechanism 8 are respectively arranged on both sides of the electrode 6, the unwinding mechanism 7 comprises an unwinding roller 7-1, an unwinding side flattening roller 7-2, an unwinding side tensioning roller 7-3, and an unwinding side moving roller 7-4, and the winding mechanism 8 comprises a winding roller 8-1, a winding side flattening roller 8-2, a winding side tensioning roller 8-3, and a winding side moving roller 8-4; the film 9 is rolled off the unwinding roller 7 -1, it sequentially bypasses the unwinding side tensioning roller 7-3, the unwinding side flattening roller 7-2, the unwinding side moving roller 7-4, the winding side moving roller 8-4, the winding side tensioning roller 8-3, and the winding side flattening roller 8-2, and then is reeled by the winding roller 8-1. The unwinding side moving roller 7-4 and the winding side moving roller 8-4 are connected to a swing driving mechanism to achieve up and down swinging. In order to play a limiting role, the unwinding side moving roller 7-4 and the winding measuring moving roller 8-4 pass through the arc groove 10 on the detection bracket plate 5. The swing driving mechanism is located on the back of the detection bracket plate 5, which can drive the unwinding side moving roller 7-4 and the winding measuring moving roller 8-4 to move up and down, thereby driving the film 9 between the unwinding side moving roller 7-4 and the winding side moving roller 8-4 to detach from and approach the test negative electrode. The film shown in the figure is located above the test negative electrode.

[0011] An interlayer is arranged inside the heat-insulating shell 1, and the interlayer is filled with foamed polyurethane to ensure good thermal insulation performance.

[0012] A heating unit 10 and a temperature control unit are arranged in the heat-insulating housing 1. The temperature control unit is electrically connected to the heating unit 10. The specific control logic is as follows: Figure 4 As shown, when the heating unit 10 starts heating, the temperature control unit monitors the temperature inside the thermal insulation shell 1. When the temperature is about to reach the set temperature, a fixed value can be taken. For example, when it is 3°C away from the set temperature, a low-power heating mode is adopted. When the temperature exceeds the set temperature by a certain value, such as exceeding 3°C, the heating unit stops working until the temperature is lower than the set temperature. The heating unit 10 continues to work, thereby ensuring the constant temperature inside the thermal insulation shell 1.

[0013] 11 is an electrode guide mounting frame.

[0014] A testing method for a fully automatic thin film withstand voltage and temperature spectrum testing device comprises the following steps: S1: Wrap the rubber pad 5 with annealed aluminum foil and place it on the detection platform 2 as the negative electrode of the test; S2: Place the sample film 9 to be tested into the unwinding roller 7-1 and lock it. The film 9 passes through the unwinding tension roller 7-3, the unwinding flattening roller 7-2, the unwinding moving roller 7-4, the winding moving roller 8-4, the winding tension roller 8-3, the winding flattening roller 8-2, and then enters the winding roller 8-1. S3: Setting the test temperature, the heating unit 10 starts working, and waits for the test temperature to stabilize; S4: Start the test, the unwinding side moving roller 7-4 and the winding side moving roller 8-4 move downward, the film 9 is attached to the negative electrode, the electrode moves downward, and contacts the film 9 for testing, the test module 3 moves from left to right, and carries the electrode 6 for testing, after a certain number of points are tested, the electrode 6 is lifted, the unwinding side moving roller 7-4 and the winding side moving roller 8-4 move upward, the film 9 is separated from the negative electrode, the winding roller 7-1 and the unwinding roller 8-1 start working, the film 9 that has been tested is wound onto the winding roller 8-1, and a new film to be tested is placed from the unwinding roller 7-1 to the negative electrode to be tested, and a new round of testing starts until the test is completed; S5: After the test is completed, the film is rolled up and the annealed aluminum foil is replaced.

[0015] The present invention includes the linkage of a heating unit and a temperature control unit, and can test the withstand voltage field strength of the film under a wide temperature spectrum. The present invention uses a driving mechanism to realize automatic testing, which greatly improves the test efficiency. At the same time, the automatic testing device ensures that the angle between the electrode and the film surface is consistent during each test, ensuring that the electrode does not cause significant damage to the film surface. The motor drives the winding and unwinding, avoiding the contamination of the film surface caused by manual sample preparation, such as hand sweat and fingerprints.

Claims

1. A fully automatic thin film withstand voltage temperature spectrum testing device, characterized in that: It includes a heat-insulating shell, in which a detection platform, a test module and a detection bracket plate are installed, a rubber pad wrapped with annealed aluminum foil is placed on the detection platform to form a test negative electrode, the detection bracket plate and the test module are arranged behind the detection platform, the test module is connected to a translation drive mechanism, the test module is connected to an electrode as a test positive electrode, the test positive electrode is connected to a lifting drive mechanism, and a reeling mechanism and a winding mechanism are respectively arranged on both sides of the electrode, the reeling mechanism includes a reeling roller, ... The winding side tensioning roller and the unwinding side moving roller, the winding mechanism includes a winding roller, a winding side tensioning roller and a winding side moving roller; the film starts from the unwinding roller, and sequentially passes around the unwinding side tensioning roller, the unwinding side moving roller, the winding side moving roller and the winding side tensioning roller, and is then wound up by the winding roller, the unwinding side moving roller and the winding side moving roller are connected to a swinging drive mechanism to achieve up and down swinging, which is used to drive the film between the unwinding side moving roller and the winding side moving roller to detach from and approach the test negative electrode.

2. The fully automatic thin film withstand voltage temperature spectrum testing device according to claim 1, characterized in that: An interlayer is arranged in the heat-insulating shell, and the interlayer is filled with foamed polyurethane.

3. The fully automatic thin film withstand voltage temperature spectrum testing device according to claim 1, characterized in that: A heating unit and a temperature control unit are provided in the thermal insulation shell. The temperature control unit is electrically connected to the heating unit. When the heating unit starts to heat, the temperature control unit monitors the temperature in the thermal insulation shell. When the temperature is about to reach the set temperature, a low-power heating mode is adopted. When the temperature exceeds the set temperature by a certain value, the heating unit stops working until the temperature is lower than the set temperature, and then the heating unit continues to work.

4. A testing method for a fully automatic thin film withstand voltage temperature spectrum testing device, characterized in that: It includes the following steps: S1: Wrap the rubber pad with annealed aluminum foil and place it on the test platform as the negative electrode of the test; S2: Place the sample film to be tested into the unwinding roller and lock it. The film passes through the unwinding side tensioning roller, the unwinding side moving roller, the winding side moving roller, the winding side tensioning roller in sequence and then enters the winding roller; S3: Set the test temperature, the heating unit starts working, and wait for the test temperature to stabilize; S4: Start the test, the unwinding side moving roller and the winding side moving roller move downward, the film is attached to the negative electrode, the electrode moves downward, and contacts the film for testing, the test module moves from left to right, and carries the electrode for testing, after a certain number of points are tested, the electrode is lifted, the unwinding side moving roller and the winding side moving roller move upward, the film is separated from the negative electrode, the winding roller and the unwinding roller start working, the film that has been tested is rolled up to the winding roller, and the new film to be tested is placed from the unwinding roller to the negative electrode to be tested, and a new round of testing starts until the test is completed; S5: After the test is completed, the film is rolled up and the annealed aluminum foil is replaced.

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