LED module batch traceable management method and system

Abstract

The invention belongs to the technical field of LED module management, and particularly relates to an LED module batch traceable management method and system, and the system comprises a processor, an information collection module, a code generation module, an information storage module, a traceability query module and an information safety supervision module. Various kinds of information in the LED module production process are collected through the information collection module, the code generation module generates a unique product code based on the LED module information, and the information storage module stores the code of the LED module and the product information corresponding table, so that the integrity and traceability of the LED module information are ensured, and the production efficiency of the LED module is improved. The LED module batch tracing efficiency is remarkably improved, the management difficulty is reduced, the storage potential safety hazard of the LED module can be comprehensively analyzed and accurately judged to remind a manager to take reasonable improvement measures in time, the safety of stored information is effectively improved, and the traceability of the LED module is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of LED module management, and in particular to a method and system for batch traceability management of LED modules. Background Art

[0002] During the production process of LED modules, a large amount of data and information related to the LED modules needs to be recorded, stored and retrieved, such as the source of the materials and components used in the LED modules, the processing process, quality inspection results and warehousing and logistics information. These information data usually need to be stored in the memory to facilitate the traceability of the LED module production.

[0003] In the traceability process of LED module production, since the information data of the LED module is stored in the memory, if the memory fails, the traceability data related to the LED mold stored therein will decline or be lost, resulting in the inability to effectively carry out the traceability process of the LED module production data, and unable to obtain complete and accurate traceability information, unable to provide accurate information support for production decisions, and unable to ensure product quality.

[0004] Based on this, the present application provides a method and system for LED module batch traceability management, which is used to monitor and maintain the effectiveness of LED module information data storage devices, and to promptly detect and handle potential faults. Summary of the invention

[0005] The purpose of the present invention is to provide a method and system for traceability management of LED module batches, which solves the problem that the prior art is difficult to effectively monitor and manage key data such as batch information, raw material sources, and production processes of LED modules, and cannot ensure the storage security of LED module-related data, resulting in information opacity and difficulty in traceability.

[0006] To achieve the above object, the present invention provides the following technical solutions: An LED module batch traceability management system, comprising a processor, an information collection module, a code generation module, an information storage module, a traceability query module and an information security supervision module; The information collection module is used to collect various information during the production process of LED modules; The code generation module generates a unique product code according to various information of the received LED module, and sends the generated product code to the information storage module via the processor; The information storage module is composed of several groups of memories, which are used to store the corresponding table of the LED module coding and product information; The traceability query module is used to query and display detailed information of LED modules by entering product codes or related query conditions; The information security supervision module monitors the operation damage status and vulnerability risk status of all memories of the information storage module, determines the information storage risk and generates an information security supervision qualification signal or an information security supervision warning signal, and sends the information security supervision warning signal to the smart terminal of the corresponding manager via the processor.

[0007] Furthermore, the specific operation process of the information security supervision module includes: The production date of the corresponding storage is collected, the interval between the current date and the production date is marked as the storage production interval, and a use damage assessment value is obtained by using damage assessment analysis, and the storage production interval and the use damage assessment value are numerically compared with a preset storage production interval threshold and a preset use damage assessment threshold respectively; If the storage interval time or usage damage assessment value exceeds the corresponding preset threshold, the corresponding storage will be marked as replacement emergency storage; if replacement emergency storage exists, an information security supervision warning signal is generated; if replacement emergency storage does not exist, an information security supervision qualified signal is generated.

[0008] Furthermore, the specific analysis process using damage assessment analysis is as follows: By analyzing and judging in real time whether the corresponding storage is in a state of operation causing damage, the total time length of the corresponding storage in the state of operation causing damage in the historical stage is obtained and marked as the storage damage time value, and the ratio of the storage damage time value to the storage interval time length is calculated to obtain the storage damage time value ratio; Based on the storage operation measurement value, the production interval time period is divided into a damaged time period and a non-damaged time period; The difference between the average memory operation test value in the damaged time period and the average memory operation test value in the non-damaged time period is calculated, and the obtained difference is compared with the preset memory operation test threshold value to obtain the high detection value of damaged memory; Integrate the memory operation and measurement values ​​XL of all the production interval time periods to obtain the production interval time period group, and obtain the operation and measurement variance value and operation and measurement mean ratio of the production interval time period group; The transportation loss time inspection value is obtained by multiplying the transportation measurement variance value of the production interval time period with the transportation measurement mean ratio of the production interval time period; The usage damage assessment value of the corresponding storage is obtained by numerically calculating the storage loss time value ratio, the transportation loss time inspection value and the transportation loss high inspection value.

[0009] Furthermore, the analysis and judgment process of the operation damage status is as follows: The storage interval time is divided into several interval time periods, and the temperature of the corresponding storage and the humidity of the environment are collected at the middle moment of each interval time period to obtain the storage temperature deviation ratio and storage humidity deviation ratio corresponding to the storage; And collect the vibration data of the corresponding storage device in each production interval time period, calculate the ratio of the maximum vibration amplitude value received by the storage device and the standard amplitude value, and obtain the storage device vibration condition value, and obtain the storage device operation value by numerically calculating the storage device temperature deviation value ratio, the storage device moisture deviation value ratio and the storage device vibration condition value, and numerically compare the storage device operation value with the preset storage device operation threshold value, and if the storage device operation value exceeds the preset storage device operation threshold value, it is judged that the corresponding storage device is in an operation-damaged state.

[0010] Further, the information security supervision module is in communication connection with the storage scanning risk analysis module, and the information security supervision module sends the information security supervision qualified signal to the storage scanning risk analysis module. When receiving the information security supervision qualified signal, the storage scanning risk analysis module performs a virus vulnerability scan on all memories to identify the virus vulnerabilities in all memories. If a virus vulnerability is scanned in the corresponding memory, the corresponding memory is marked as a risky memory; If there is a risk storage device, a scanning risk warning signal is generated; if there is no risk storage device, a scanning safety signal is generated, and the scanning risk warning signal is sent to the smart terminal of the corresponding manager via the processor.

[0011] Further, the storage scanning risk analysis module is communicatively connected to the virus vulnerability threat assessment module, the virus vulnerability threat assessment module is used to set a detection period, and the storage scanning risk analysis sends the scanning analysis results of all storages within the detection period to the virus vulnerability threat assessment module; The virus vulnerability threat assessment module determines the storage threat level during the detection period through analysis and generates a storage high threat signal or a storage low threat signal, and sends the storage high threat signal to the smart terminal of the corresponding manager via the processor.

[0012] Furthermore, the specific analysis process of the virus vulnerability threat assessment module is as follows: The virus vulnerability risk detection value of the corresponding memory is obtained through analysis, and the virus vulnerability risk detection value is numerically compared with the preset virus vulnerability risk detection threshold. If the virus vulnerability risk detection value exceeds the preset virus vulnerability risk detection threshold, the corresponding memory is marked as a high-risk memory; if a high-risk memory exists, a storage high threat signal is generated.

[0013] Furthermore, the specific analysis process of obtaining the virus vulnerability risk detection value of the corresponding memory through analysis is as follows: The number of times virus vulnerabilities are scanned in the corresponding storage during the detection period is obtained and the ratio of the number to the total number of scans is marked as the scan detection value, and after the virus vulnerability is scanned, the virus vulnerability elimination time is collected, and the average of all virus vulnerability elimination times of the corresponding storage during the detection period is calculated to obtain the virus vulnerability elimination value, and the ratio of the number of virus vulnerability elimination times exceeding the preset virus vulnerability elimination time threshold during the detection period to the total number of scans is marked as the virus vulnerability low elimination value; The virus vulnerability detection value of the corresponding memory is obtained by numerically calculating the scan detection value, the virus vulnerability elimination value and the virus vulnerability low elimination value.

[0014] Furthermore, if there is no high-risk storage, the virus vulnerability risk detection values ​​of all storages are averaged to obtain the virus vulnerability performance value; By formula The virus vulnerability performance value GM and the average value Lji of the memory during the production interval are numerically calculated to obtain the virus vulnerability management value GX; wherein i is the number of memories, i=1, 2, 3, ..., n; The average value of the memory operation in the interval time period is obtained by summing and averaging the memory operation values ​​XL in the interval time period group corresponding to the memory; Compare the virus vulnerability status value with the preset virus vulnerability status threshold; If the virus vulnerability status value exceeds the preset virus vulnerability status threshold, a storage high threat signal is generated; if the virus vulnerability status value does not exceed the preset virus vulnerability status threshold, a storage low threat signal is generated.

[0015] Furthermore, the present invention also proposes a method for batch traceability management of LED modules, comprising the following steps: Step 1: Collect various information during the production process of LED modules; Step 2: Generate a unique product code based on the collected information of the LED module; Step 3: Store the corresponding table of the LED module coding and product information; Step 4: Query and display detailed information of LED modules by entering product codes or related query conditions; Step 5: Analyze and determine the storage risk of the stored information and generate an information security supervision qualification signal or an information security supervision warning signal, and send the information security supervision warning signal to the smart terminal of the corresponding manager.

[0016] Compared with the prior art, the present invention has the following beneficial effects: 1. In the present invention, various types of information in the production process of LED modules are collected through the information collection module, the code generation module generates a unique product code based on the LED module information, and the information storage module stores the LED module code and product information correspondence table to ensure the integrity and traceability of the LED module information, significantly improve the traceability efficiency of LED module batches and reduce management difficulty; 2. In the present invention, all memories of the information storage module are monitored and analyzed by the information security supervision module to determine the replacement of the emergency memory, and when the information security supervision qualified signal is generated, all memories are scanned for virus vulnerabilities by the storage scanning risk analysis module to determine the risky memory, and the virus vulnerability threat assessment module is used to accurately judge the degree of storage threat during the detection period, which is conducive to the management personnel to make reasonable improvement measures in time, significantly improve the security of the stored information, and ensure the traceability of the LED module. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to facilitate understanding by those skilled in the art, the present invention is further described below in conjunction with the accompanying drawings; Figure 1 This is a system block diagram of Embodiment 1 of the present invention; Figure 2 It is a system block diagram of Embodiment 2 and Embodiment 3 of the present invention; Figure 3 This is a flow chart of the method of Embodiment 4 of the present invention. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] Embodiment 1: Figure 1 As shown, the present invention proposes a LED module batch traceability management system, including a processor, an information acquisition module, a code generation module, an information storage module, a traceability query module and an information security supervision module; The information collection module is used to collect various information in the production process of LED modules, including raw material supplier information, production date, production line, production process parameters and production batch number, and sends the collected information to the code generation module through the processor; The coding generation module generates a unique product code (generates a unique product code according to preset coding rules) based on the various information of the received LED module to ensure the uniqueness and traceability of the code. The product code contains all necessary traceability information of the corresponding LED module, and the generated product code is sent to the information storage module via the processor.

[0020] The information storage module is composed of several groups of memories, which are used to store the corresponding table of the LED module code and product information to ensure the integrity and traceability of the LED module information; When it is necessary to trace the detailed information of a batch of LED modules, users can enter the product code or related query conditions through the traceability query module to query and display the detailed information of the LED modules. The unique product code and quick query mechanism significantly improve the traceability efficiency of LED module batches and reduce the difficulty of management. Through strict traceability management, it helps enterprises to promptly discover and deal with problems in the production process of LED modules, optimize the production management process of LED modules, ensure that the quality of LED modules meets the standards, and improve the overall quality and market competitiveness of products.

[0021] The information security supervision module monitors all memories of the information storage module, determines the risk of information storage and generates an information security supervision qualified signal or an information security supervision early warning signal, and sends the information security supervision early warning signal to the intelligent terminal of the corresponding manager through the processor. The manager promptly backs up the information stored in the replacement emergency memory and replaces the replacement emergency memory to ensure the security of the stored information. The specific operation process of the information security supervision module is as follows: The production date of the corresponding storage is collected, and the interval between the current date and the production date is marked as the storage interval time, and the use damage assessment value is obtained through use damage assessment analysis. The specific analysis process is: the storage interval time is divided into several interval time periods, and the temperature of the corresponding storage and the humidity of the environment are collected at the middle moment of each interval time period. The deviation value of the storage temperature compared with the preset suitable temperature standard value is marked as the storage temperature deviation value, and the storage temperature deviation value is calculated by ratio with the temperature standard value to obtain the storage temperature deviation value ratio. The deviation value of the storage humidity compared with the preset suitable humidity standard value is marked as the storage moisture deviation value, and the storage moisture deviation value is calculated by ratio with the humidity standard value to obtain the storage moisture deviation value ratio. The vibration data (i.e., the data value of the vibration amplitude, recorded as the vibration amplitude value) to which the corresponding storage is subjected in each interval time period is collected, and the maximum vibration amplitude value to which the storage is subjected is calculated by ratio with the amplitude standard value to obtain the storage vibration condition value. Among them, the standard values ​​of temperature, humidity and amplitude are all set by the staff based on experience; The memory temperature deviation ratio XR, the memory humidity deviation ratio XM and the memory vibration condition value XF are numerically calculated by the formula XL=(hp1*XR+hp2*XM+hp3*XF) / 3 to obtain the memory operation value XL; wherein hp1, hp2 and hp3 are preset proportional coefficients with values ​​greater than zero, and the value of hp1 is 0.34, the value of hp2 is 0.34 and the value of hp3 is 0.32; and the larger the value of the memory operation value XL is, the greater the damage currently suffered by the corresponding memory is; Compare the memory operation test value XL with the preset memory operation test threshold. If the memory operation test value XL exceeds the preset memory operation test threshold, it indicates that the corresponding memory is currently damaged to a greater extent. Then, it is determined that the corresponding memory is in an operation damage state in the corresponding production interval time period. Specifically: the storage operation test value XL is greater than or equal to the preset storage operation test threshold corresponding to the production interval time is recorded as the operation damage time period; the storage operation test value XL is less than the preset storage operation test threshold corresponding to the production interval time is recorded as the non-damage time period; Obtain the total time duration of the corresponding storage in the operation-damage state in the historical stage and mark it as the storage damage time value (the sum of the production interval time periods corresponding to all operation-damage states); Calculate the ratio of the memory loss time value to the memory generation interval time to obtain the memory loss time value ratio; Integrate the memory operation measurement values ​​XL of all the production interval time periods to obtain a production interval time period group; Calculate the storage operation and measurement value XL of the production interval time period group according to the variance calculation formula to obtain the operation and measurement variance value of the production interval time period; Calculate the ratio of the maximum memory operation value XL in the production interval time period group to the memory operation mean value of the production interval time period group to obtain the operation mean value ratio of the production interval time period; The transportation loss time inspection value is obtained by multiplying the transportation measurement variance value of the production interval time period with the transportation measurement mean ratio of the production interval time period; Obtaining the memory operation and measurement values ​​corresponding to all non-damage time periods, summing and averaging them, and obtaining the memory operation and measurement mean value of the non-damage time period; Obtain the storage operation and measurement values ​​corresponding to all the operation and measurement time periods, sum and average them, and obtain the storage operation and measurement mean value of the operation and measurement time period; The difference between the average memory operation test value in the damaged time period and the average memory operation test value in the non-damaged time period is calculated, and the obtained difference is compared with the preset memory operation test threshold value to obtain the high detection value of damaged memory; The formula LP=LX*(LS+LW) is used to calculate the storage damage time ratio LX, the transportation damage time inspection value LS and the transportation damage high inspection value LW to obtain the use damage assessment value LP of the corresponding storage; the larger the value of the use damage assessment value LP is, the more serious the damage condition of the corresponding storage in the historical stage is; The storage interval time and the use damage assessment value LP are numerically compared with the preset storage interval threshold and the preset use damage assessment threshold; if the storage interval time or the use damage assessment value LP exceeds the corresponding preset threshold, it indicates that the storage risk of continuing to use the corresponding storage is relatively high, and the corresponding storage needs to be replaced in time, then the corresponding storage is marked as replacement emergency storage; If there is a replacement emergency storage, it indicates that the overall information storage risk is large, and an information security supervision warning signal is generated; if there is no replacement emergency storage, it indicates that the overall information storage risk is small, and an information security supervision qualified signal is generated.

[0022] Embodiment 2: Figure 2 As shown, the difference between this embodiment and the first embodiment is that the information security supervision module is communicatively connected to the storage scanning risk analysis module, the information security supervision module sends the information security supervision qualified signal to the storage scanning risk analysis module, and the storage scanning risk analysis module performs a virus vulnerability scan on all memories upon receiving the information security supervision qualified signal to identify the virus vulnerabilities in all memories, and if a virus vulnerability is scanned out in the corresponding memory, the corresponding memory is marked as a risk memory; If there is a risk storage device, a scanning risk warning signal is generated. If there is no risk storage device, a scanning safety signal is generated. The scanning risk warning signal is sent to the smart terminal of the corresponding manager via the processor, and corresponding processing measures are taken on the risk storage device in a timely manner to eliminate virus vulnerabilities and further ensure the security of information storage.

[0023] Embodiment 3: Figure 2 As shown, the difference between this embodiment and the first and second embodiments is that the storage scanning risk analysis module is communicatively connected to the virus vulnerability threat assessment module, and the virus vulnerability threat assessment module is used to set a detection period, preferably, the detection period is thirty-five days; the storage scanning risk analysis module sends the scanning analysis results of all storages within the detection period to the virus vulnerability threat assessment module; The virus vulnerability threat assessment module determines the storage threat level during the detection period through analysis and generates a storage high threat signal or a storage low threat signal, and sends the storage high threat signal to the corresponding manager's smart terminal through the processor. When the manager receives the storage high threat signal, he strengthens virus scanning supervision on all memories and optimizes the antivirus function, thereby further reducing the storage risk of LED module information; the specific analysis process of the virus vulnerability threat assessment module is as follows: The number of times virus vulnerabilities are scanned in the corresponding storage during the detection period is obtained and the ratio of the number of times the virus vulnerabilities are scanned is marked as the scan detection value, and after the virus vulnerability is scanned, the virus vulnerability elimination time (i.e., the interval between the time when the virus vulnerability is scanned and the time when the virus vulnerability is eliminated) is collected, and the virus vulnerability elimination time of all virus vulnerability elimination times of the corresponding storage during the detection period is averaged to obtain the virus vulnerability elimination value, and the ratio of the number of virus vulnerability elimination times exceeding the preset virus vulnerability elimination time threshold to the total number of scans during the detection period is marked as the virus vulnerability low elimination value; By formula The virus vulnerability risk detection value WX of the corresponding memory is obtained by numerically calculating the scan detection value WN, the virus vulnerability elimination value WY and the virus vulnerability low elimination value WP; wherein aw1, aw2 and aw3 are preset proportional coefficients, aw3>aw1>aw2>0, the value of aw3 is 0.7742, the value of aw2 is 0.2215, and the value of aw1 is 0.4455; and the larger the value of the virus vulnerability risk detection value WX is, the greater the scanning processing risk for the corresponding memory during the detection period is. The virus vulnerability risk detection value WX is numerically compared with the preset virus vulnerability risk detection threshold. If the virus vulnerability risk detection value WX exceeds the preset virus vulnerability risk detection threshold, it indicates that the scanning and processing risk of the corresponding storage during the detection period is relatively high, and the corresponding storage is marked as a high-risk storage; if a high-risk storage exists, a storage high threat signal is generated.

[0024] Furthermore, if there is no high-risk storage, the virus vulnerability risk detection values ​​of all storages are averaged to obtain the virus vulnerability performance value; By formula The virus vulnerability performance value GM and the average value Lji of the memory in the production interval time period are numerically calculated to obtain the virus vulnerability control value GX; wherein, i is the number of memories, i=1, 2, 3, ..., n; the larger the value of the virus vulnerability control value GX, the greater the risk of scanning and processing for all memories in general; The average value of the memory operation in the interval time period is obtained by summing and averaging the memory operation values ​​XL in the interval time period group corresponding to the memory; The virus vulnerability status value GX is numerically compared with the preset virus vulnerability status threshold. If the virus vulnerability status value GX exceeds the preset virus vulnerability status threshold, it indicates that the overall scanning and processing risk for all memories is relatively high, and a storage high threat signal is generated; if the virus vulnerability status value GX does not exceed the preset virus vulnerability status threshold, it indicates that the overall scanning and processing risk for all memories is relatively low, and a storage low threat signal is generated.

[0025] Embodiment 4: Figure 3 As shown, the difference between this embodiment and the first, second and third embodiments is that the present invention provides a method for batch traceability management of LED modules, comprising the following steps: Step 1: Collect various information during the production process of LED modules; Step 2: Generate a unique product code based on the collected information of the LED module; Step 3: Store the corresponding table of the LED module coding and product information; Step 4: Query and display detailed information of LED modules by entering product codes or related query conditions; Step 5: Analyze and determine the storage risk of the stored information and generate an information security supervision qualification signal or an information security supervision warning signal, and send the information security supervision warning signal to the smart terminal of the corresponding manager.

[0026] The working principle of the present invention is as follows: when in use, various types of information in the production process of LED modules are collected through the information collection module, the code generation module generates a unique product code according to the various types of information of the received LED modules, and the information storage module stores the code of the LED module and the corresponding table of product information to ensure the integrity and traceability of the LED module information. The user enters the product code or related query conditions through the traceability query module to query the detailed information of the corresponding batch of LED modules, which significantly improves the traceability efficiency of the LED module batch and reduces the management difficulty, helps enterprises to timely discover problems in the production process of LED modules and optimize their production management process, and monitors all memories of the information storage module through the information security supervision module, judges the risk of information storage and identifies the replacement emergency memory, backs up the information stored in the replacement emergency memory when generating the information security supervision warning signal, and replaces the replacement emergency memory, thereby ensuring the security of the stored information and the traceability of the LED module.

[0027] The above formulas are all dimensionless and numerical calculations. The formula is a formula obtained by collecting a large amount of data and performing software simulation to obtain the most recent real situation. The preset parameters in the formula are set by technicians in this field according to actual conditions. The preferred embodiments of the present invention disclosed above are only used to help explain the present invention. The preferred embodiments do not describe all the details in detail, nor do they limit the invention to only specific implementation methods. Obviously, many modifications and changes can be made according to the contents of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present invention, so that technicians in the relevant technical field can understand and use the present invention well. The present invention is only limited by the claims and their full scope and equivalents.

Claims

1. A LED module batch traceability management system, characterized in that: It includes a processor, an information collection module, a code generation module, an information storage module, a traceability query module and an information security supervision module; The information collection module is used to collect various information during the production process of LED modules; The code generation module generates a unique product code according to various information of the received LED module, and sends the generated product code to the information storage module via the processor; The information storage module is composed of several groups of memories, which are used to store the corresponding table of the LED module coding and product information; The traceability query module is used to query and display detailed information of LED modules by entering product codes or related query conditions; The information security supervision module monitors the operation damage status and vulnerability risk status of all memories of the information storage module, determines the information storage risk and generates an information security supervision qualification signal or an information security supervision warning signal, and sends the information security supervision warning signal to the smart terminal of the corresponding manager via the processor.

2. The LED module batch traceability management system according to claim 1, characterized in that: The specific operation process of the information security supervision module includes: The production date of the corresponding storage is collected, the interval between the current date and the production date is marked as the storage production interval, and a use damage assessment value is obtained by using damage assessment analysis, and the storage production interval and the use damage assessment value are numerically compared with a preset storage production interval threshold and a preset use damage assessment threshold respectively; If the storage interval time or usage damage assessment value exceeds the corresponding preset threshold, the corresponding storage will be marked as replacement emergency storage; if replacement emergency storage exists, an information security supervision warning signal is generated; if replacement emergency storage does not exist, an information security supervision qualified signal is generated.

3. The LED module batch traceability management system according to claim 2, characterized in that: The specific analysis process using damage assessment analysis is as follows: By analyzing and judging in real time whether the corresponding storage is in a state of operation causing damage, the total time length of the corresponding storage in the state of operation causing damage in the historical stage is obtained and marked as the storage damage time value, and the ratio of the storage damage time value to the storage interval time length is calculated to obtain the storage damage time value ratio; Based on the storage operation measurement value, the production interval time period is divided into a damaged time period and a non-damaged time period; The difference between the average memory operation test value in the damaged time period and the average memory operation test value in the non-damaged time period is calculated, and the obtained difference is compared with the preset memory operation test threshold value to obtain the high detection value of damaged memory; Integrate the memory operation and measurement values ​​XL of all the production interval time periods to obtain the production interval time period group, and obtain the operation and measurement variance value and operation and measurement mean ratio of the production interval time period group; The transportation loss time inspection value is obtained by multiplying the transportation measurement variance value of the production interval time period with the transportation measurement mean ratio of the production interval time period; The usage damage assessment value of the corresponding storage is obtained by numerically calculating the storage loss time value ratio, the transportation loss time inspection value and the transportation loss high inspection value.

4. The LED module batch traceability management system according to claim 3, characterized in that: The analysis and judgment process of the operation damage status is as follows: The storage interval time is divided into several interval time periods, and the temperature of the corresponding storage and the humidity of the environment are collected at the middle moment of each interval time period to obtain the storage temperature deviation ratio and storage humidity deviation ratio corresponding to the storage; And collect the vibration data of the corresponding storage device in each production interval time period, calculate the ratio of the maximum vibration amplitude value received by the storage device and the standard amplitude value, and obtain the storage device vibration condition value, and obtain the storage device operation value by numerically calculating the storage device temperature deviation value ratio, the storage device moisture deviation value ratio and the storage device vibration condition value, and numerically compare the storage device operation value with the preset storage device operation threshold value, and if the storage device operation value exceeds the preset storage device operation threshold value, it is judged that the corresponding storage device is in an operation-damaged state.

5. The LED module batch traceability management system according to claim 1, characterized in that: The information security supervision module is in communication connection with the storage scanning risk analysis module. The information security supervision module sends an information security supervision qualified signal to the storage scanning risk analysis module. When receiving the information security supervision qualified signal, the storage scanning risk analysis module performs a virus vulnerability scan on all memories to identify virus vulnerabilities in all memories. If a virus vulnerability is scanned in the corresponding memory, the corresponding memory is marked as a risky memory. If there is a risk storage device, a scanning risk warning signal is generated; if there is no risk storage device, a scanning safety signal is generated, and the scanning risk warning signal is sent to the smart terminal of the corresponding manager via the processor.

6. The LED module batch traceability management system according to claim 5, characterized in that: The storage scanning risk analysis module is communicatively connected to the virus vulnerability threat assessment module. The virus vulnerability threat assessment module is used to set a detection period. The storage scanning risk analysis sends the scanning analysis results of all storages within the detection period to the virus vulnerability threat assessment module. The virus vulnerability threat assessment module determines the storage threat level during the detection period through analysis and generates a storage high threat signal or a storage low threat signal, and sends the storage high threat signal to the smart terminal of the corresponding manager via the processor.

7. The LED module batch traceability management system according to claim 6, characterized in that: The specific analysis process of the virus vulnerability threat assessment module is as follows: The virus vulnerability risk detection value of the corresponding memory is obtained through analysis, and the virus vulnerability risk detection value is numerically compared with the preset virus vulnerability risk detection threshold. If the virus vulnerability risk detection value exceeds the preset virus vulnerability risk detection threshold, the corresponding memory is marked as a high-risk memory; if a high-risk memory exists, a storage high threat signal is generated.

8. The LED module batch traceability management system according to claim 7, characterized in that: The specific analysis process of obtaining the virus vulnerability risk detection value of the corresponding memory through analysis is as follows: The number of times virus vulnerabilities are scanned in the corresponding storage during the detection period is obtained and the ratio of the number to the total number of scans is marked as the scan detection value, and after the virus vulnerability is scanned, the virus vulnerability elimination time is collected, and the average of all virus vulnerability elimination times of the corresponding storage during the detection period is calculated to obtain the virus vulnerability elimination value, and the ratio of the number of virus vulnerability elimination times exceeding the preset virus vulnerability elimination time threshold during the detection period to the total number of scans is marked as the virus vulnerability low elimination value; The virus vulnerability detection value of the corresponding memory is obtained by numerically calculating the scan detection value, the virus vulnerability elimination value and the virus vulnerability low elimination value.

9. The LED module batch traceability management system according to claim 7, characterized in that: If there is no high-risk storage, the virus vulnerability risk detection values ​​of all storages are averaged to obtain the virus vulnerability performance value; By formula The virus vulnerability performance value GM and the average value Lji of the memory during the production interval are numerically calculated to obtain the virus vulnerability management value GX; wherein i is the number of memories, i=1, 2, 3, ..., n; The average value of the memory operation in the interval time period is obtained by summing and averaging the memory operation values ​​XL in the interval time period group corresponding to the memory; Compare the virus vulnerability status value with the preset virus vulnerability status threshold; If the virus vulnerability status value exceeds the preset virus vulnerability status threshold, a storage high threat signal is generated; if the virus vulnerability status value does not exceed the preset virus vulnerability status threshold, a storage low threat signal is generated.

10. A method for traceability management of LED module batches, characterized in that: The method adopts the LED module batch traceability management system as described in any one of claims 1-9.

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