Probe type turnout steel rail profile detection device

Abstract

The invention discloses a probe type turnout steel rail profile detection device. The device comprises a probe unit; the feeding unit is connected with the probe unit, the feeding unit is used for driving the probe unit to move along a target path so that the probe unit can move among sampling points, and the sampling points are preset measuring points on the surface of the steel rail profile. The probe type turnout steel rail profile detection device is simple and reasonable in structure and convenient to install and use. Compared with a previous contact type steel rail profile contact method (a roller type and a multi-measuring-head type), the method can collect more sampling points in a steel rail profile range, including a narrow area, and has higher detection precision. And the method is not influenced by environment interference which is easy to occur in optical detection. And large-area popularization and application are worthy.

Description

Technical Field

[0001] The invention relates to the technical field of detection equipment, and in particular to a probe-type turnout rail profile detection device. Background Art

[0002] With the continuous development and application of turnout grinding technology, the demand for rail profile detection is increasing, including: ordinary rail profile, basic rail-point rail combination profile, wing rail-heart rail combination profile. In rail profile grinding technology, the contour shape of the theoretical rail profile directly affects the wheel-rail contact relationship, thereby affecting the service life of the turnout. The theoretical rail profile is often designed based on the rail profile before grinding. Therefore, improving the detection accuracy of the rail profile before grinding is of great significance to improving the wheel-rail contact relationship and extending the service life of the rail. At present, there are generally two types of detection technologies for rail profiles, one is contact type and the other is non-contact type.

[0003] The non-contact measurement method of rail profile is generally an optical detection method. Usually, a laser is used to directly illuminate the surface of the rail to be detected to obtain a diffuse reflection signal, and the image of the rail to be detected is generated after data processing. However, the accuracy of optical detection often depends on the on-site environment of the rail, and is easily affected by the shape and structure of the rail, the rough plating of the rail surface, and lighting conditions. For example, when the laser inspects the polished section of the rail (there is a light band on the surface of the rail), the light after mirror reflection from the rail surface and the gauge angle enters the camera. If the reflected light is consistent with the optical axis of the imaging device, the image of the area will be overexposed. On the contrary, if the reflected line deviates from the optical axis of the imaging device, the image of the area will be too dark. And optical equipment is generally more expensive.

[0004] For contact measurement: the commonly used one is the roller type turnout grinding profile detector (a roller type turnout grinding profile detector_Geng Jierui), which uses a small roller to slide on the rail surface to obtain the rail surface profile. Its detection accuracy often depends on the diameter of the roller. When measuring some narrow areas, such as the base and tip rail combined profile, Figure 4 As shown in the figure, the detection accuracy of the roller is greatly reduced. And when the measured profile is converted into a CAD image, it depends on the operator's accuracy and often has many burrs and flash ( Figure 5 As shown), it affects the accuracy of rail profile acquisition. There is also a portable rail profile measuring device (a portable rail profile measuring device_Jiang Jun), which allows multiple measuring heads to contact the rail surface at the same time to obtain the corresponding coordinates of the rail profile. This method is simple and direct, but because its measuring heads are arranged side by side ( Figure 6 The sampling points are spaced relatively far apart, and the sampling accuracy is limited by the volume of the measuring head, so the rail profile cannot be accurately depicted.

[0005] It can be seen that the detection accuracy of the non-contact optical measurement method in the prior art often depends on the on-site environment of the rail, and is easily affected by the shape and structure of the rail, the roughness of the rail surface, the lighting conditions, etc., and the cost is relatively high. In the contact measurement, the applicability is strong (not easily affected by the environment) and the cost is low, but its detection accuracy needs to be improved, especially for detecting the combined profile of the base and tip rails. Summary of the invention

[0006] The present invention provides a probe-type turnout rail profile detection device. It mainly solves the problem of low detection accuracy of the existing contact measurement method. The profile surface obtained by the roller measurement method often has burrs, and the detection accuracy is limited by the roller diameter. The detection accuracy of the "multiple measuring head type" is limited by the spatial arrangement of the measuring heads. At the same time, it also solves the problem that the profile detection result in the optical measurement method is easily affected by the environment.

[0007] The present invention provides the following scheme:

[0008] A probe type turnout rail profile detection device, comprising:

[0009] Probe unit;

[0010] A feeding unit, the feeding unit is connected to the probe unit, and the feeding unit is used to drive the probe unit to move along the target path so that the probe unit moves between various sampling points, and the sampling points are preset measuring points on the rail profile surface;

[0011] a laser emitting unit, the laser emitting unit being used to emit laser light to the probe unit so as to form a laser spot on the probe unit;

[0012] A laser detection unit, the laser detection unit is used to detect the deviation of the laser point, so as to determine the contact between the needle tip of the probe unit and the rail profile surface according to the deviation;

[0013] The image processing unit, the feeding unit and the laser detection unit are all connected to the image processing unit; the image processing unit is used to obtain the coordinates of each sampling point when the laser point is offset, and fit the coordinates of each sampling point to obtain the rail profile.

[0014] Preferably: the probe unit includes a cantilever beam and a probe body connected to the cantilever beam, the upper surface of the cantilever beam is provided with a laser reflection area, the laser point is located on the laser reflection area, and the cantilever beam bends and deforms when the tip of the probe body contacts the rail contour surface.

[0015] Preferably, the cantilever beam is provided with a threaded hole, the probe body comprises an external threaded section, and the probe body is connected to the threaded hole through the external threaded section.

[0016] Preferably, the tip of the probe body has a pyramid-shaped structure.

[0017] Preferably, the laser detection unit comprises a visible window.

[0018] Preferably, the feeding unit comprises an X-direction driving mechanism and a Y-direction driving mechanism, and the X-direction driving mechanism and the Y-direction driving mechanism are used to drive the probe unit to move along the X-direction and the Y-direction respectively.

[0019] According to the specific embodiments provided by the present invention, the present invention discloses the following technical effects:

[0020] Through the present invention, a device for detecting the profile of a probe-type turnout rail can be realized. In one implementation, the device may include a probe unit; a feeding unit, the feeding unit is connected to the probe unit, the feeding unit is used to drive the probe unit to move along the target path, so that the probe unit moves between various sampling points, the sampling points are preset measuring points on the rail profile surface; a laser emitting unit, the laser emitting unit is used to emit laser to the probe unit so as to form a laser point on the probe unit; a laser detection unit, the laser detection unit is used to detect the offset of the laser point, so as to determine that the tip of the probe unit is in contact with the rail profile surface according to the offset; an image processing unit, the feeding unit and the laser detection unit are both connected to the image processing unit; the image processing unit is used to obtain the coordinates of each sampling point when the laser point is offset, and fit the coordinates of each sampling point to obtain the rail profile. The device for detecting the profile of a probe-type turnout rail provided in the present application has a simple and reasonable structure and is easy to install and use. Compared with the previous contact rail profile contact method (roller type, multi-measuring head type), more sampling points can be collected within the rail profile range, including narrow areas, with higher detection accuracy. And it is not affected by environmental interference that is prone to occur in optical detection. It is worthy of large-scale promotion and use.

[0021] Of course, any product implementing the present invention does not necessarily need to achieve all of the advantages described above at the same time. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 It is a schematic diagram of a detection method of a probe-type turnout rail profile detection device provided by an embodiment of the present invention;

[0024] Figure 2 is a schematic structural diagram of a probe unit provided in an embodiment of the present invention;

[0025] Figure 3 It is a structural schematic diagram of a probe-type turnout rail profile detection device provided by an embodiment of the present invention;

[0026] Figure 4 is a schematic diagram of a base-tip rail combination profile provided by an embodiment of the present invention;

[0027] Figure 5 is a schematic diagram of burrs provided by an embodiment of the present invention;

[0028] Figure 6 It is a schematic diagram of the side-by-side arrangement of the measuring heads provided by an embodiment of the present invention.

[0029] In the figure: a probe unit 1, a cantilever beam 11, a probe body 12, a laser reflection area 13, a feeding unit 2, a laser emitting unit 3, a laser detection unit 4, an image processing unit 5, a point rail 6, and a basic rail 7. DETAILED DESCRIPTION

[0030] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field belong to the scope of protection of the present invention.

[0031] Example

[0032] See also Figure 1 , Figure 2 , Figure 3 , is a probe-type turnout rail profile detection device provided by an embodiment of the present invention, such as Figure 1 , Figure 2 , Figure 3 As shown, the device may include:

[0033] Probe unit 1;

[0034] A feeding unit 2, the feeding unit 2 is connected to the probe unit 1, and the feeding unit 2 is used to drive the probe unit 1 to move along a target path so that the probe unit 1 moves between various sampling points, and the sampling points are preset measuring points on the rail profile surface;

[0035] a laser emitting unit 3, the laser emitting unit 3 being used to emit laser light to the probe unit 1 so as to form a laser spot on the probe unit 1;

[0036] A laser detection unit 4, the laser detection unit 4 is used to detect the deviation of the laser point, so as to determine whether the needle tip of the probe unit 1 is in contact with the rail profile surface according to the deviation;

[0037] The image processing unit 5, the feeding unit 2 and the laser detection unit 4 are all connected to the image processing unit 5; the image processing unit 5 is used to obtain the coordinates of each sampling point when the laser point is offset, and fit the coordinates of each sampling point to obtain the rail profile.

[0038] The probe-type turnout rail profile detection device provided in the embodiment of the present application adopts a combination of contact and non-contact detection methods to realize the detection of the rail profile. The problem of low detection accuracy of the existing contact measurement method is solved. The profile surface obtained by the roller measurement method often has burrs, and the detection accuracy is limited by the roller diameter. The detection accuracy of the "multiple measuring head type" is limited by the spatial arrangement of the measuring heads. At the same time, it also solves the problem that the profile detection results in the optical measurement method are easily affected by environmental interference.

[0039] At the same time, the device provided in the embodiment of the present application uses a probe to scan the rail profile. The probe tip is relatively small, and the rail profile can be divided into more sampling points. The more sampling points there are, the higher the detection accuracy. A laser detection device is used to feedback whether the probe tip is in contact with the surface of the rail profile.

[0040] In practical applications, the probe unit provided in the embodiment of the present application can be used as a trigger component that contacts the surface of the rail. Specifically, the embodiment of the present application can provide that the probe unit 1 includes a cantilever beam 11 and a probe body 12 connected to the cantilever beam 11, and the upper surface of the cantilever beam 11 is provided with a laser reflection area 13, and the laser point is located on the laser reflection area 13. The cantilever beam 11 is bent and deformed when the tip of the probe body 12 contacts the contour surface of the rail.

[0041] In practical applications, in order to facilitate the connection between the probe body and the cantilever beam, the embodiment of the present application can also provide that the cantilever beam 11 is provided with a threaded hole, the probe body 12 includes an external thread section, and the probe body 12 is connected to the threaded hole through the external thread section. The tip of the probe body 12 has a pyramid cone structure.

[0042] The cantilever beam 11 has a threaded hole and a through hole. The threaded hole at the end of the cantilever beam 11 is used to insert the probe tip. The through hole at the other end of the cantilever beam is used to connect the cantilever beam to the laser detection device. There is a laser reflection area in the middle of the cantilever beam, which reflects the laser emitted from the laser source to the laser detection area. The cantilever beam 11 has a certain rigidity. When the tip of the probe tip and the rail profile are not in contact, the laser point reflected from the laser source to the laser detection area does not change; when the tip of the probe tip and the rail profile are in contact, the cantilever beam is bent due to the interaction force between the tip of the tip and the rail profile, so that the laser point in the laser detection area changes, which is used to determine whether the probe tip and the rail are in contact. The probe has a thread at the end for connecting with the cantilever beam. The tip of the tip is a pyramid cone for contacting the rail.

[0043] Furthermore, the laser detection unit includes a visible window. The laser detection device consists of two parts. It includes a laser source and a laser detection unit. The laser source is used to emit a laser signal to the cantilever beam reflection area. The laser detection unit is used to receive the laser signal reflected from the cantilever beam. The laser detection unit has a visible window, that is, the operator can see the laser point position change in the laser detection area.

[0044] The rail profile position coordinates obtained at each sampling point can be fitted into the rail profile.

[0045] The feeding unit provided in the embodiment of the present application is used to drive the probe unit to move. Specifically, the feeding unit 2 includes an X-direction driving mechanism and a Y-direction driving mechanism, and the X-direction driving mechanism and the Y-direction driving mechanism are used to drive the probe unit to move in the X direction and the Y direction respectively. In practical applications, the laser detection related device can also be connected to the feeding unit to achieve joint movement. In specific implementation, the probe and the laser detection device can be scanned and moved along the X and Y directions.

[0046] When the device provided in the embodiment of the present application is in use, the probe unit can move in the X and Y directions, and the probe is moved along the X direction by the feeding device, for example, to the measuring point A, and the movement amount Xi at this time is recorded. Then the probe moves along the Y direction until the probe tip touches the rail profile surface (the laser point on the laser detection device is offset, that is, the tip has contacted the rail profile surface), and the movement amount Yi at this time is recorded. After the information of point A (Xi, Yi) is recorded, the probe is lifted (moved along the Y direction) to restore to its initial position, and then the probe is moved to the next measuring point Xi+1, and the (Xi+1, Yi+1) information is recorded again, and this cycle is repeated until the sampling points in the entire profile are collected.

[0047] At the same time, because the needle tip is very fine, many sampling points can be set within the rail profile (even in narrow locations in the rail profile). The more sampling points are set, the more accurate the rail profile obtained will be.

[0048] In summary, the probe-type turnout rail profile detection device provided by the present application has a simple and reasonable structure and is easy to install and use. Compared with the previous contact rail profile contact method (roller type, multi-measuring head type), it can collect more sampling points within the rail profile range, including narrow areas, with higher detection accuracy. And it is not affected by environmental interference that is prone to occur in optical detection. It is worthy of large-scale promotion and use.

[0049] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0050] The above description is only a preferred embodiment of the present invention and is not intended to limit the protection scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention are included in the protection scope of the present invention.

Claims

1. A probe type turnout rail profile detection device, characterized in that: include: Probe unit; A feeding unit, the feeding unit is connected to the probe unit, and the feeding unit is used to drive the probe unit to move along the target path so that the probe unit moves between various sampling points, and the sampling points are preset measuring points on the rail profile surface; a laser emitting unit, the laser emitting unit being used to emit laser light to the probe unit so as to form a laser spot on the probe unit; A laser detection unit, the laser detection unit is used to detect the deviation of the laser point, so as to determine the contact between the needle tip of the probe unit and the rail profile surface according to the deviation; The image processing unit, the feeding unit and the laser detection unit are all connected to the image processing unit; the image processing unit is used to obtain the coordinates of each sampling point when the laser point is offset, and fit the coordinates of each sampling point to obtain the rail profile.

2. The probe type turnout rail profile detection device according to claim 1, characterized in that: The probe unit includes a cantilever beam and a probe body connected to the cantilever beam. A laser reflection area is provided on the upper surface of the cantilever beam. The laser point is located on the laser reflection area. The cantilever beam bends and deforms when the tip of the probe body contacts the rail profile surface.

3. The probe type turnout rail profile detection device according to claim 2, characterized in that: The cantilever beam is provided with a threaded hole, the probe body comprises an external thread section, and the probe body is connected to the threaded hole through the external thread section.

4. The probe type turnout rail profile detection device according to claim 2, characterized in that: The tip of the probe body has a pyramid-shaped structure.

5. The probe type turnout rail profile detection device according to claim 1, characterized in that: The laser detection unit includes a visible window.

6. The probe type turnout rail profile detection device according to claim 1, characterized in that: The feeding unit comprises an X-direction driving mechanism and a Y-direction driving mechanism, and the X-direction driving mechanism and the Y-direction driving mechanism are used to drive the probe unit to move along the X-direction and the Y-direction respectively.

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