Test system

Abstract

The invention relates to a test system which is provided with an upper computer, an interface expansion device and a test tool, the interface expansion device is in communication connection with the upper computer through a standard protocol and is in communication connection with the test tool through the standard protocol and / or a private protocol, and the test tool is used for being connected with equipment to be tested. Through the scheme, the interface expansion device can communicate with the test tool through a standard protocol or a private protocol, so that transmission of a test instruction or a test signal is realized. Therefore, in an actual test environment, a test tool with a standard protocol or a private protocol can be selected according to requirements, the test tool is connected to the to-be-tested equipment to realize different function tests, the extension of test functions is realized, and the problem of poor expansibility of a test system is effectively relieved.

Description

Technical Field

[0001] The present application relates to the technical field of automated testing, and in particular to a testing system. Background Art

[0002] Energy storage provides frequency regulation and peak regulation in all aspects of power generation, transmission, distribution and use, stabilizing the frequency of the power grid, alleviating grid congestion, and improving the flexibility of power generation and use, bringing great convenience to daily production and life. With the continuous development of energy storage technology, flexible DC energy storage has gradually been widely used due to its advantages such as high power transmission efficiency.

[0003] In flexible DC energy storage technology, the energy storage valve control system is the core control component, and its stable operation is of great significance to flexible DC energy storage, so it is particularly important to test the energy storage valve control system. However, in the related art, the scalability of the test system used to test the energy storage valve control system is poor. Summary of the invention

[0004] Based on this, it is necessary to provide a test system to solve the problem of poor scalability of the test system of the energy storage valve control system.

[0005] A test system comprises a host computer, a test tool and an interface expansion device, wherein the test tool is used to access a device to be tested, and the interface expansion device is connected to the host computer through a standard protocol and is connected to the test tool through at least one of a standard protocol and a private protocol.

[0006] The above-mentioned test system is provided with a host computer, an interface expansion device and a test fixture. The interface expansion device is connected to the host computer through a standard protocol, and is connected to the test fixture through a standard protocol and / or a private protocol. The test fixture is used to access the device under test. Through this solution, the interface expansion device can communicate with the test fixture through a standard protocol or a private protocol to realize the transmission of test instructions or test signals. Therefore, in an actual test environment, a test fixture of a standard protocol or a private protocol can be selected according to the needs, and it can be connected to the device under test to realize different functional tests and realize the expansion of the test function. In the case where the device under test selects an energy storage valve control system, the problem of poor scalability of the test system of the energy storage valve control system can be effectively solved.

[0007] In some embodiments, the test system further includes a communication device and a tester, wherein the communication device is respectively connected to the host computer and the tester in communication with each other according to a standard protocol, and the tester is used to access the device under test.

[0008] In the above scheme, the test system also includes a communication device and a tester. The communication device is connected to the tester to implement the test of the device under test, and the tester is used to implement the corresponding function test of the device under test, which can effectively expand the test items of the device under test.

[0009] In some embodiments, at least one of the testers is connected to the test tool.

[0010] In the above scheme, the tester can also be connected to the test tooling, and connected to the host computer through the test tooling and the interface expansion device, so as to receive control instructions from the host computer through the interface expansion device and the test tooling, or return test results to the host computer through the interface expansion device and the test tooling, and continue to execute the test function when the communication protocol between the tester and the communication device does not match.

[0011] In some embodiments, the tester includes at least one of a timing tester, a digital tester, an analog tester, and a storm tester.

[0012] In the above scheme, the tester adopts at least one of a timing tester, a digital tester, an analog tester and a storm tester, so as to implement different project tests on the equipment to be tested and meet different test requirements.

[0013] In some embodiments, the test tooling includes a processor board, a protocol interface board, an expansion board, an input board and an output board, the protocol interface board, the expansion board, the input board and the output board are respectively connected to the processor board, and the protocol interface board, the expansion board, the input board and the output board are respectively used to access the device under test.

[0014] In the above scheme, the test tooling includes a processor board, a protocol interface board, an expansion board, an input board and an output board, which can realize standard protocol communication, private protocol communication and input and output of switch quantities, thereby improving the test reliability of the device under test.

[0015] In some embodiments, the slot interfaces of the processor board, the protocol interface board, the expansion board, the input board, and the output board are of the same type.

[0016] The above solution uniformly sets the slot interfaces of each board in the test fixture, effectively improving the interface flexibility of the test fixture.

[0017] In some embodiments, the test tool includes a host test tool and at least one slave test tool, the host test tool is connected to the interface expansion device, the slave test tool is connected to the host test tool, and the host test tool and the slave test tool are respectively used to access the device under test.

[0018] The above scheme can build a master-slave test mode through various test fixtures when there is a large-scale test demand, and implement different functional tests through different slave test fixtures, effectively improving the test efficiency of the test system.

[0019] In some embodiments, the host computer includes a first type of functional modules and a second type of functional modules, and the first type of functional modules includes at least one of a customized test case module, a human-computer interaction module, a standard communication module, a power model module, an algorithm processing module, a waveform analysis module and an event viewing function module.

[0020] In the above scheme, the host computer is provided with different first-category functional modules to implement relevant basic functional tests of the device under test and improve the reliability of basic functional tests of the test system.

[0021] In some embodiments, the second type of functional modules includes at least one of a test human resource management module, a test equipment resource management module, a defect statistics management module, a problem tracking module, and a distributed deployment module.

[0022] The above scheme sets different second-category functional modules on the host computer, which can effectively improve the rationality of the allocation of test resources and the coordination efficiency among members, thereby improving the test efficiency.

[0023] In some embodiments, the host computer also includes an expansion module.

[0024] In the above scheme, an expansion module is also provided on the host computer, and other test functions of the host computer can be expanded through the expansion module, thereby further improving the scalability of the test system.

[0025] In some embodiments, the test tool is used to access the energy storage valve control system to be tested.

[0026] In the above scheme, the energy storage valve control system to be tested is used as the device to be tested and connected to the test fixture, so that the energy storage valve control system can be tested through the test system, thereby improving the operational reliability of the energy storage valve control system.

[0027] In some embodiments, the test tool is used to connect to the high-pressure energy storage valve control device to be tested.

[0028] In the above scheme, the high-pressure energy storage valve control device to be tested is connected to the test fixture as the device to be tested, so that the test of the high-pressure energy storage valve control device is realized through the test system, which has high test safety. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0030] Figure 1 This is a schematic diagram of the test system structure in some embodiments of the present application;

[0031] Figure 2 This is a schematic diagram of the test system structure in some other embodiments of the present application;

[0032] Figure 3 This is a schematic diagram of a single test tool structure in some embodiments of the present application;

[0033] Figure 4 This is a schematic diagram of the master-slave mode structure of the test tooling in some embodiments of the present application;

[0034] Figure 5 This is a schematic diagram of the test system structure in some other embodiments of the present application.

[0035] Explanation of the reference numerals: 12 - host computer, 14 - interface expansion device, 16 - test tool; 22 - communication device, 24 - tester; 31 - processor board, 32 - protocol interface board, 33 - expansion board, 34 - input board, 35 - output board; 161 - host test tool, 162 - slave test tool. DETAILED DESCRIPTION

[0036] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0038] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0039] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0040] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0041] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0042] At present, from the perspective of market development, energy storage systems are being used more and more widely, bringing great convenience to daily production and life. Among various energy storage technologies, flexible DC energy storage technology is increasingly widely used due to its advantages of low loss, high transmission efficiency, fine control of power quality, and rapid adjustment of parameters such as voltage, frequency, and phase, thereby improving the quality and stability of electricity.

[0043] In flexible DC energy storage technology, the connections between the various levels and devices of the energy storage valve control system are very close. For a complete energy storage valve control system, it includes at least three levels: valve control chassis, valve expansion chassis, and submodule control chassis / board. In actual development and application, the number of submodule control chassis / boards and the manpower required for development are very large. In order to ensure the stable and safe operation of the energy storage valve control system, it is particularly necessary to test the energy storage valve control system. However, in the related art, when the energy storage valve control system is tested, it is necessary to detect the system functions separately through different devices or operating systems, and the scalability of the entire test system is poor.

[0044] In order to alleviate the problem of poor scalability of the test system, it was found through research that an interface expansion device can be configured for the test system, and the conversion of various communication protocols to standard protocols can be realized through the interface expansion device. The test fixture that transmits data with different protocols (or communication protocols) is connected to the interface expansion device, and the interface expansion device converts it into a standard protocol that can be recognized by the host computer, completing the expansion of the test fixture, so that different test functions can be realized with different test fixtures.

[0045] Based on the above considerations, the technical solution of the present application provides a test system, which includes a host computer, an interface expansion device and a test tool. The interface expansion device is communicated with the host computer through a standard protocol, and is communicated with the test tool through a standard protocol and / or a private protocol. The test tool is used to access the device under test.

[0046] Through the above test system, in the actual test environment, you can choose test tools with standard protocols or private protocols according to your needs, connect them to the device under test to implement different functional tests, expand the test functions, and effectively alleviate the problem of poor scalability of the test system.

[0047] The test system provided in the embodiment of the present application is applied to the energy storage valve control system of the energy storage system to test various levels and equipment of the energy storage valve control system, and the energy storage system specifically includes a flexible DC energy storage system. The energy storage valve control system is a system used to control the operation of the energy storage valve of the energy storage system. Taking the modular flexible DC energy storage system as an example, the energy storage valve includes a plurality of cascaded energy storage valve submodules. Therefore, the energy storage valve control system can be used to control the switching operation of each energy storage valve submodule in the energy storage valve.

[0048] The test system provided in the embodiment of the present application can be used to test the energy storage valve control system before the energy storage valve control system is put into operation, or it can be used to test the energy storage valve control system in combination with actual needs during the process of the energy storage valve control system being put into operation, without specific limitation.

[0049] Please refer to Figure 1 A test system includes a host computer 12, a test tool 16 and an interface expansion device 14, the test tool 16 is used to access the device under test, the interface expansion device 14 is communicated with the host computer 12 through a standard protocol, and is communicated with the test tool 16 through at least one of a standard protocol and a private protocol.

[0050] Specifically, the host computer 12 is the main control device for realizing the test function. The test fixture 16 is the tool and equipment for testing. According to the different test items, the specific structure of the test fixture 16 will also be different. It can be set in combination with the actual test scene. The interface expansion device 14 is a device for realizing the signal transmission between the host computer 12 and the test fixture 16. The standard protocol is a communication protocol of a general type formulated by a communication standard. It can be formulated according to the GSM (Global System for Mobile Communications) standard, CDMA (Code Division Multiple Access) standard, Bluetooth standard or wireless local area network standard, and is not specifically limited. The private protocol is a user-defined communication protocol suitable for a certain class or certain specific products. The device to be tested is the device waiting to be tested in the test system of the embodiment of the present application, and its specific type is not unique. It can be a storage valve control system, etc., and it can be selected in combination with the application scenario of the test system.

[0051] In an actual test scenario, if the communication protocol of the test fixture 16 is consistent with the communication protocol of the host computer 12, the interface expansion device 14 only needs to forward the received signal between the test fixture 16 and the host computer 12. If the communication protocol of the test fixture 16 is different from the communication protocol of the host computer 12, the interface expansion device 14 needs to perform protocol conversion during data transmission to complete the data interaction between the two.

[0052] It should be noted that the number and type of the test fixtures 16 are not unique, and the number and type of the test fixtures 16 may be different depending on the number or type of the devices to be tested of the device to be tested. For example, in one embodiment, when faced with a small-scale single-function test requirement, a single test fixture 16 can be used to meet the relevant test requirement; when faced with a large-scale test such as a system function test requirement, it is necessary to rely on the current test system for expansion, and use multiple test fixtures 16 with different communication protocols to achieve different function tests.

[0053] It can be understood that the specific types of standard protocols are not unique. In a more detailed embodiment, the standard protocol may include: Ethernet communication is realized through 100M or 1000M optical fiber at the physical level, and data transmission can be carried out through TCP / IP (Transmission Control Protocol / Internet Protocol) at the communication protocol level (application protocol level). Among them, TCP is a connection-oriented, reliable, byte stream-based transport layer communication protocol. IP is the network layer protocol in the TCP / IP system. The purpose of designing IP is to improve the scalability of the network. First, it solves Internet problems and realizes the interconnection of large-scale, heterogeneous networks; second, it separates the coupling relationship between top-level network applications and bottom-level network technologies to facilitate the independent development of the two. Private protocols may include: communication is realized through high-speed serial interface buses at the physical level, and at the communication protocol level (application protocol level), the communication protocol can be customized by the user in combination with the actual test tooling 16.

[0054] The specific type of the interface expansion device 14 is not unique. In a more detailed embodiment, the interface expansion device 14 may include an interface control chassis, that is, the interface expansion device 14 is built in the form of a chassis to facilitate the access of different test tools 16.

[0055] The specific type of the host computer 12 is not limited, and it can be a personal computer (PC), a tablet computer, a mobile phone or an industrial computer, etc. There is no specific limitation, and it can be selected according to actual needs.

[0056] The above-mentioned test system is provided with a host computer 12, an interface expansion device 14 and a test fixture 16. The interface expansion device 14 is connected to the host computer 12 through a standard protocol, and is connected to the test fixture 16 through a standard protocol and / or a private protocol. The test fixture 16 is used to access the device under test. Through this scheme, the interface expansion device 14 can communicate with the test fixture 16 through a standard protocol or a private protocol to realize the transmission of test instructions or test signals. Therefore, in an actual test environment, a test fixture 16 of a standard protocol or a private protocol can be selected according to the needs, and it can be connected to the device under test to realize different functional tests and realize the expansion of the test function. In the case where the device under test selects an energy storage valve control system, the problem of poor extensibility of the test system of the energy storage valve control system can be effectively solved.

[0057] See also Figure 2 In some embodiments, the test system further includes a communication device 22 and a tester 24. The communication device 22 is respectively connected to the host computer 12 and the tester 24 in communication with each other according to the standard protocol. The tester 24 is used to access the device under test.

[0058] Specifically, the tester 24 is an instrument for realizing the test function. The communication device 22 is an instrument or device with a communication function and realizing data transmission. In the scheme of this embodiment, the test system also includes a communication device 22 and a tester 24. The communication device 22 can be connected to the host computer 12 through a standard protocol, and can also be connected to the tester 24 through a standard protocol. The tester 24 exchanges information with the host computer 12 through the communication device 22, thereby realizing the corresponding test function under the control of the host computer 12. In this scheme, the test system can realize different test functions through the test fixture 16 and the tester 24, and the test function is relatively comprehensive. Each test fixture 16 and the tester 24 can communicate with the host computer 12 through a standard protocol and / or a private protocol, forming a whole, and working together according to the instructions of the host computer 12, and acting on the device to be tested.

[0059] It can be understood that the standard protocol between the communication device 22 and the host computer 12, the standard protocol between the communication device 22 and the tester 24, and the standard protocol between the interface expansion device 14 and the host computer 12 can be the same type of standard protocol, or they can be different, and they can be selected in combination with actual needs. For example, in a more detailed embodiment, the above standard protocols can all be standard protocols of the type of 100M / 1000M optical fiber communication at the physical level and TCP / IP protocol at the application level.

[0060] It should be noted that the specific type of the communication device 22 is not unique. In a more detailed embodiment, the communication device 22 includes a switch.

[0061] In the above scheme, the test system also includes a communication device 22 and a tester 24. The communication device 22 is connected to the tester 24 to implement the test of the device under test, and the tester 24 is used to implement the corresponding function test of the device under test, which can effectively expand the test items of the device under test.

[0062] In some embodiments, at least one tester 24 is connected to the test tool 16 .

[0063] Specifically, in the solution of this embodiment, there is at least one tester 24 connected to the test fixture 16, and finally connected to the host computer 12 through the test fixture 16 and the interface expansion device 14, so as to realize the interaction with the host computer 12. In the actual test environment, the standard protocol between the switch and the tester 24, and the standard protocol between the switch and the host computer 12 may not be the same, and the communication between the tester 24 and the host computer 12 cannot be realized through the switch. Or some or all functions of the tester 24 have special protocol communication requirements, which cannot be met by the standard protocol. At this time, the tester 24 will be connected to the test fixture 16, and the protocol conversion will be performed through the test fixture 16 and the interface expansion device 14, so as to realize the communication between the tester 24 and the host computer 12.

[0064] In the above scheme, the tester 24 can also be connected to the test fixture 16, and connected to the host computer 12 through the test fixture 16 and the interface expansion device 14, so as to receive control instructions from the host computer 12 through the interface expansion device 14 and the test fixture 16, or return test results to the host computer 12 through the interface expansion device 14 and the test fixture 16, and continue to execute the test function when the communication protocol between the tester 24 and the communication device 22 does not match.

[0065] It should be noted that the type of the tester 24 is not unique, and in some embodiments, the tester 24 includes at least one of a timing tester, a digital tester, an analog tester, and a storm tester.

[0066] Specifically, a timing tester, also known as a clock tester, is a test instrument designed for the time and frequency synchronization test needs in the fields of electricity, communications, etc. A digital tester, also known as a digital test instrument, refers to a test instrument that provides digital output or display. It can be used to test the voltage, current, temperature and other parameters of the device under test during operation, without specific limitation. An analog tester, also known as an analog test instrument, refers to a test instrument whose output or display is a continuous function of the tested or input signal. A storm tester is an instrument that can quickly predict future storm phenomena in a short period of time. In actual usage scenarios, according to actual testing needs, one or more of a timing tester, a digital tester, an analog tester and a storm tester can be used to implement the testing of the device under test.

[0067] In the above scheme, the tester 24 adopts at least one of a timing tester, a digital tester, an analog tester and a storm tester, so as to implement different project tests on the device to be tested and meet different test requirements.

[0068] See also Figure 3In some embodiments, the test tool 16 includes a processor board 31, a protocol interface board 32, an expansion board 33, an input board 34 and an output board 35. The protocol interface board 32, the expansion board 33, the input board 34 and the output board 35 are respectively connected to the processor board 31, and the protocol interface board 32, the expansion board 33, the input board 34 and the output board 35 are respectively used to access the device to be tested.

[0069] Specifically, the protocol interface board 32 is a functional board that uses standard protocol communication. The expansion board 33 is a functional board that uses private protocol extension and implements private protocol communication. The input board 34 is a board used for switching input, and the output board 35 is a board used for switching output. The switching quantity is the control signal of the switch device in the device under test during the test of the device under test, which is generally a high or low level signal. The protocol interface board 32, the expansion board 33, the input board 34 and the output board 35 are respectively connected to the processor board 31 through the backplane communication bus.

[0070] In actual usage scenarios, the type of protocol interface board 32 will vary depending on the standard protocols adopted. In a more detailed embodiment, the protocol interface board 32 includes an FT3 (a link layer transmission frame format) interface board, which includes all FT3-type communication models and all optical fiber-type (wavelength matching) physical models to achieve optical fiber communication.

[0071] It should be pointed out that the number of protocol interface boards 32 is not unique. In a more detailed embodiment, multiple protocol interface boards 32 can be set on the same test tool 16, and each protocol interface board 32 is respectively connected to the processor board 31. The types of each protocol interface board 32 can be exactly the same or not exactly the same, depending on the actual needs.

[0072] Similarly, the type of expansion board 33 is not unique, and the type of expansion board 33 may be different depending on the actual selection of the private protocol. In a more detailed embodiment, the expansion board 33 includes at least one of a 100M / 1000M Ethernet communication model, a GT (i.e., Giga Transmission per second) custom communication model, and Aurora (a serial transmission protocol).

[0073] The number of expansion boards 33 is not unique. One or more expansion boards 33 can be set according to actual needs. When multiple expansion boards 33 are set, each expansion board 33 can be the same type of expansion board 33 or different types of expansion boards 33. The selection can be based on actual needs.

[0074] It is understandable that the specific type of the processor board 31 is not unique. In a more detailed embodiment, the processor board 31 can be a CPU (Central Processing Unit) board or an MCU (Microcontroller Unit) board, etc., without specific limitation.

[0075] In the above scheme, the test tool 16 includes a processor board 31, a protocol interface board 32, an expansion board 33, an input board 34 and an output board 35, which can realize standard protocol communication, private protocol communication and input and output of switch quantities, thereby improving the test reliability of the device under test.

[0076] It should be pointed out that in one embodiment, the protocol interface board 32, the expansion board 33, the input board 34 and the output board 35 all use high-speed asynchronous serial communication to establish interconnection when connected to the processor board 31, thereby effectively improving the data transmission efficiency of the test tooling 16.

[0077] Further, in some embodiments, the types of slot interfaces of the processor board 31, the protocol interface board 32, the expansion board 33, the input board 34, and the output board 35 are the same. That is, the processor board 31, the protocol interface board 32, the expansion board 33, the input board 34, and the output board 35 adopt a unified slot interface setting, and the specific size of the slot interface and the interface communication protocol are consistent. The above scheme unifies the slot interface of each board in the test fixture 16, effectively improving the interface flexibility of the test fixture 16.

[0078] Please refer to Figure 4 In some embodiments, the test tool 16 includes a host test tool 161 and at least one slave test tool 162. The host test tool 161 is connected to the interface expansion device 14, and the slave test tool 162 is connected to the host test tool 161. The host test tool 161 and the slave test tool 162 are respectively used to access the device under test.

[0079] Specifically, the scheme of this embodiment is explained by taking the actual test scenario requiring multiple test fixtures 16 as an example. Under this scheme, each test fixture 16 is set to a master-slave operation mode, one of which is used as a host test fixture 161, and the others are used as slave test fixtures 162. The host test fixture 161 receives the test command of the host computer 12, and transmits the test command to the corresponding slave test fixture 162, and performs different test functions through the slave test fixture 162. In addition, the test data of each slave test fixture 162 is transmitted back to the host computer 12 by the host test fixture 161, and analyzed by the host computer 12 to obtain the final test result.

[0080] In more detail, in one embodiment, the test tool 16 includes a processor board 31, a protocol interface board 32, an expansion board 33, an input board 34 and an output board 35. Correspondingly, when the test tool 16 is configured as a master-slave operation mode, it is only necessary to connect the processor boards 31 of each test tool 16, that is, the processor boards 31 of the slave test tool 162 are respectively connected to the processor boards 31 of the host test tool 161.

[0081] The above scheme can build a master-slave test mode through various test fixtures 16 when there is a large-scale test demand, and implement different functional tests through different slave test fixtures 162, effectively improving the test efficiency of the test system.

[0082] Please refer to Figure 5 In some embodiments, the host computer 12 includes a first type of functional module and a second type of functional module, and the first type of functional module includes at least one of a customized test case module, a human-computer interaction module, a standard communication module, a power model module, an algorithm processing module, a waveform analysis module, and an event viewing functional module.

[0083] Specifically, the first type of functional module refers to a functional module that implements the basic test requirements in the device under test. The second type of functional module refers to a functional module that schedules the test system or tracks the test results, and its function is to improve the test efficiency of the test system as much as possible. The customized test case module is a functional module that formulates test cases according to actual needs. The human-computer interaction module is a functional module that realizes the interaction between the user and the host computer 12, which can be a human-computer interaction interface. The standard communication module is a functional module that realizes communication with the interface expansion device 14 or the communication device 22 through standard specifications. The power model module is a module that realizes the power analysis function, which can be voltage, current or power analysis, etc., and is not specifically limited. The algorithm processing module is a functional module that processes various types of algorithm logic during the operation of the host computer 12. The event viewing function module is a functional module that views the test items or historical test items of the device under test. In more detail, in one embodiment, the host computer 12 also includes a customized test case module, a human-computer interaction module, a standard communication module, a power model module, an algorithm processing module, a waveform analysis module and an event viewing function module.

[0084] In the above solution, the host computer 12 is provided with different types of first-category functional modules to implement relevant basic functional tests of the device under test and improve the reliability of basic functional tests of the test system.

[0085] In some embodiments, the second category of functional modules includes at least one of a test human resource management module, a test equipment resource management module, a defect statistics management module, a problem tracking module, and a distributed deployment module.

[0086] Specifically, the test human resource management module is a functional module that coordinates and dispatches human resources according to the actual test situation during the test process of the device under test. The test equipment resource management module is a functional module that manages and controls each test tool 16 and tester 24 in the actual test scenario. The defect statistics management module is a functional module that classifies, records and manages the defects of the device under test in the test results based on the real-time test results. The problem tracking module is a functional module that tracks a defect (or multiple defects) in the test results and monitors whether the defects have been eliminated. The distributed deployment module is a functional module that performs distributed deployment of the test tool 16 or the tester 24 according to the actual test requirements, and deploys the test tool 16 or the tester 24 in different environments, such as a test laboratory, an on-site joint debugging environment, etc., to test the device under test.

[0087] In actual scenarios, combined with test requirements, one or more of the test human resources management module, the test equipment resource management module, the defect statistics management module, the problem tracking module and the distributed deployment module can be set in the host computer 12. In more detail, in one embodiment, the test human resources management module, the test equipment resource management module, the defect statistics management module, the problem tracking module and the distributed deployment module can be set at the same time.

[0088] In the above scheme, different second-category functional modules are provided in the host computer 12, which can effectively improve the rationality of the allocation of test resources and the coordination efficiency among members, thereby improving the test efficiency.

[0089] In some embodiments, the host computer 12 also includes an expansion module.

[0090] Specifically, the expansion module is an expansion component that expands functions according to actual needs. In the host computer 12, an expansion module is reserved, and users can develop corresponding test function modules according to the expansion module in combination with actual test needs, and add them to the host computer 12 to achieve the expansion of the test function of the host computer 12.

[0091] In the above solution, the host computer 12 is further provided with an expansion module, through which other test functions of the host computer 12 can be expanded, thereby further improving the scalability of the test system.

[0092] In actual engineering tests, the above test system can meet new requirements and realize testing of large-scale equipment under test through the configuration of the host computer 12. It is easy to use in practice, and the test platform is built through a universal communication, software and hardware architecture, which has good scalability and meets its general requirements.

[0093] In some embodiments, the test tool is used to access the energy storage valve control system to be tested.

[0094] Specifically, the energy storage valve control system to be tested is the entire system to be tested and used to implement the operation control of the energy storage valve. The solution of this embodiment applies the test system in the energy storage scenario, specifically to implement the test of the entire energy storage valve control system, so that the energy storage valve control system is connected to the energy storage system in a normal state.

[0095] In the above scheme, the energy storage valve control system to be tested is used as the device to be tested and connected to the test fixture, so that the energy storage valve control system can be tested through the test system, thereby improving the operational reliability of the energy storage valve control system.

[0096] In some embodiments, the test tool is used to access the high-pressure energy storage valve control device to be tested.

[0097] Specifically, the high-pressure energy storage valve control device to be tested is a valve control device with a higher operating voltage in the system to be tested and used to realize the operation control of the energy storage valve. It can be understood that the high-pressure energy storage valve control device to be tested may include part or all of the valve control devices used to constitute the energy storage valve control system, and there are certain differences depending on the type of energy storage system.

[0098] The solution of the embodiment of the present application can apply the test system to the high-voltage direct current energy storage system scenario. Through the test system of the embodiment of the present application, the operation test of the high-voltage energy storage valve control device in the high-voltage direct current energy storage system can be realized.

[0099] Through in-depth research, it is found that the testing work of the energy storage valve control system in the current high-voltage direct current direct-hung system is all done by testers who connect different testers to the equipment to be tested (such as a high-voltage energy storage valve control device) according to actual needs, which poses a great safety hazard. In view of the above problems, the solution of the embodiment of the present application connects the test tooling of the test system to the high-voltage energy storage valve control device, thereby combining with the host computer to realize the automated testing of the high-voltage energy storage valve control device, reducing the possibility of contact between the staff and the high-voltage energy storage valve control device.

[0100] The above scheme uses the high-pressure energy storage valve control device to be tested as the device to be tested and connects it to the test fixture, so that the test of the high-pressure energy storage valve control device can be realized through the test system, which has high test safety.

[0101] In order to facilitate understanding of the technical solution of the present application, the present application is explained below in conjunction with more detailed embodiments.

[0102] 1. In the host computer 12, in addition to the basic functions, the software system has also expanded advanced application functions, such as statistics on the use of test human resources and test equipment resources, which improves the rationality of the allocation of test resources. At the same time, it integrates defect management functions and problem tracking functions to improve the collaboration efficiency among members;

[0103] 2. The software system and the hardware system (i.e., the hardware system including the host computer 12, the test fixture 16, the interface expansion device 14, the communication device 22 and the tester 24) support 100M and 1000M Ethernet communication, and the application protocol supports standard TCP / IP and private protocols. If the target hardware system adopts non-Ethernet communication, the communication can be expanded through the test fixture 16;

[0104] 3. The various devices of the hardware system can communicate through standard / private protocols to form a whole, and work together according to the instructions of the host computer 12 to act on the device to be tested;

[0105] 4. The CPU board (processor board 31) inside the test fixture 16 and various functional sub-boards are interconnected by high-speed asynchronous serial communication, and the interfaces between various functional sub-boards and slots are designed in a unified manner, thereby ensuring that the interface flexibility of the test fixture 16 is stronger;

[0106] 5. The interfaces of the sub-boards and slots based on functional classification adopt a unified design, and two working modes of the test fixture 16 are proposed: When facing the test requirements of small-scale single-function tests, the test requirements of the device to be tested can be met by equipping different functional boards in stand-alone mode. Figure 3 When facing large-scale testing such as system function testing requirements, relying on the scalability of the tooling architecture, using the multi-machine mode, that is, the master-slave CPU multi-level control architecture, to achieve different test functions on multiple slaves, you can refer to Figure 4 .

[0107] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

1. A testing system, characterized in that: include: Host computer; Test tooling, used to access the device under test; The interface expansion device is communicatively connected to the host computer through a standard protocol, and is communicatively connected to the test fixture through at least one of a standard protocol and a private protocol.

2. The test system according to claim 1, characterized in that: It also includes a communication device and a tester. The communication device is connected to the host computer and the tester for communication according to standard protocols, and the tester is used to access the device to be tested.

3. The test system according to claim 2, characterized in that: At least one of the testers is connected to the test fixture.

4. The test system according to claim 2, characterized in that: The tester includes at least one of a timing tester, a digital tester, an analog tester and a storm tester.

5. The test system according to any one of claims 1 to 4, characterized in that: The test tooling comprises a processor board, a protocol interface board, an expansion board, an input board and an output board; the protocol interface board, the expansion board, the input board and the output board are respectively connected to the processor board; the protocol interface board, the expansion board, the input board and the output board are respectively used to access the device to be tested.

6. The test system according to claim 5, characterized in that: The slot interfaces of the processor board, the protocol interface board, the expansion board, the input board and the output board are of the same type.

7. The test system according to any one of claims 1 to 6, characterized in that: The test tool comprises a host test tool and at least one slave test tool, the host test tool is connected to the interface expansion device, the slave test tool is connected to the host test tool, and the host test tool and the slave test tool are respectively used to access the device under test.

8. The test system according to any one of claims 1 to 7, characterized in that: The host computer includes a first type of functional modules and a second type of functional modules, wherein the first type of functional modules includes at least one of a customized test case module, a human-computer interaction module, a standard communication module, a power model module, an algorithm processing module, a waveform analysis module and an event viewing functional module.

9. The test system according to claim 8, characterized in that: The second type of functional modules includes at least one of a test human resource management module, a test equipment resource management module, a defect statistics management module, a problem tracking module and a distributed deployment module.

10. The test system according to claim 8, characterized in that: The host computer also includes an expansion module.

11. The test system according to any one of claims 1 to 10, characterized in that: The test fixture is used to connect to the energy storage valve control system to be tested.

12. The test system according to any one of claims 1 to 10, characterized in that: The test fixture is used to connect to the high-pressure energy storage valve control device to be tested.

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