High-frequency communication cable test fixture and use method

Abstract

The invention discloses a high-frequency communication cable test fixture and a use method thereof. The high-frequency communication cable test fixture comprises a test fixture base and a pressing block clamp, the testing jig base comprises a testing base, a circuit board is fixed to one side of the top face of the testing base, an SMA connector is connected to the top face of the circuit board in a pressing mode, a wire of the SMA connector is connected with one end of a testing lead on the top face of the circuit board in a pressing mode, and the other side of the top face of the testing base is used for clamping a high-frequency communication cable. One end of the high-frequency communication cable is lapped at the other end of the test lead; the pressing block clamp comprises a testing pressing block, a lifting assembly and a pressure adjusting assembly, the lifting assembly comprises a testing clamp push rod, and the testing clamp push rod is connected with the testing pressing block through the pressure adjusting assembly. The vertical pressure applied to one end of the high-frequency communication cable by the test pressing block can be adjusted according to the type of the high-frequency communication cable, and the test result of the high-frequency communication cable is not affected.

Description

Technical Field

[0001] The present invention belongs to the technical field of cable detection, and in particular relates to a high-frequency communication cable testing fixture and a use method thereof. Background Art

[0002] In the research and development and production of high-frequency communication cables, it is necessary to test the attenuation, impedance and other properties of the high-frequency communication cables in order to understand the performance of the high-frequency communication cables in real time.

[0003] As the communication frequency of cables becomes higher and higher, the current detection technology can no longer adapt to the detection of high-frequency communication cables. Specifically, the current detection technology generally adopts a crimping method, by welding an SMA connector, i.e., a radio frequency coaxial connector, on a circuit board to connect the test lead on the circuit board with the wire of the SMA connector, and by pressing down the plastic head to press the wire core of the high-frequency communication cable onto the test lead of the circuit board, and connecting the SMA connector to the cable detection equipment to achieve the detection of the high-frequency communication cable.

[0004] However, the current detection technology has the following two disadvantages: First, since the circuit board and the SMA connector are connected by welding, during the detection process of the high-frequency communication cable, the welding point between the circuit board and the SMA connector will affect the test results; second, due to the different structures and sizes of different types of high-frequency communication cables, the pressure required when pressing the core of the high-frequency communication cable onto the test lead of the circuit board is correspondingly different, and when pressing the core of the high-frequency communication cable onto the test lead of the circuit board by pressing down the plastic head, it is not convenient to adjust the pressure of the plastic head on the core of the high-frequency communication cable, which in turn affects the test results during the detection process of the high-frequency communication cable. In addition, the crimping position will also affect the test results of the high-frequency communication cable, and in the process of pressing the core of the high-frequency communication cable onto the test lead of the circuit board, it is not convenient to fix the crimping position, which in turn affects the test results during the detection process of the high-frequency communication cable. Summary of the invention

[0005] In view of the above-mentioned defects of the prior art, the present invention provides a high-frequency communication cable test fixture and a method of use, which can adjust the vertical pressure applied to the test block according to the type of high-frequency communication cable, and then adjust the vertical pressure applied by the test block to one end of the high-frequency communication cable, thereby not affecting the test results of the high-frequency communication cable.

[0006] The technical solution adopted by the present invention to solve its technical problem is:

[0007] A high-frequency communication cable test fixture comprises a test fixture base and a pressure block fixture; the test fixture base comprises a test base, a circuit board is fixed on one side of the top surface of the test base, an SMA connector is crimped on the top surface of the circuit board, a wire of the SMA connector is crimped with one end of a test lead on the top surface of the circuit board, the other side of the top surface of the test base is used to clamp a high-frequency communication cable, one end of the high-frequency communication cable is used to overlap the other end of the test lead, and the SMA connector is used to connect to a cable detection device; the pressure block fixture comprises a test pressure block, a lifting assembly and a pressure adjustment assembly, the lifting assembly comprises a test fixture push rod that can be vertically lifted and lowered, the test fixture push rod is connected to the test pressure block through the pressure adjustment assembly, the pressure adjustment assembly is used to adjust the vertical pressure applied to the test pressure block, and the test pressure block is used to crimp one end of the high-frequency communication cable to the other end of the test lead.

[0008] Furthermore, the lifting assembly also includes a test fixture base, a test fixture handle and a test fixture connecting rod, the test fixture base is U-shaped and fixed above the test fixture, and includes a test fixture base body and test fixture base side panels fixed on opposite sides of the top of the test fixture base body, and two upper and lower hinged ear plate assemblies are fixed at one end of the test fixture handle, the upper hinged ear plate assembly is located between the upper parts of the two test fixture base side panels and is hinged to the two test fixture base side panels, the test fixture connecting rod is arc-shaped and the upper end is hinged to the lower hinged ear plate assembly, the test fixture push rod is vertical and passes through the through channel in the test fixture base body, the upper end of the test fixture push rod extends above the test fixture base body and is hinged to the lower end of the test fixture connecting rod, and the lower end of the test fixture push rod extends below the test fixture base body and is connected to the test pressure block through the pressure regulating assembly.

[0009] Furthermore, the pressure regulating assembly includes a pressure regulating rod, a pressure regulating sleeve, a test pressure block base and a spring, all of which are arranged vertically; the upper part of the inner side wall of the pressure regulating sleeve is provided with a reverse internal thread, the middle part is smooth and the lower part is provided with a forward internal thread; the lower outer side surface of the test fixture push rod is provided with a reverse external thread matched with the reverse internal thread; the upper outer side surface of the pressure regulating rod is provided with a forward external thread matched with the forward internal thread; the pressure regulating sleeve is screwed to the outer side of the lower part of the test fixture push rod and the upper part of the pressure regulating rod; the lower end surface of the test fixture push rod is provided with a downwardly protruding clamping column; the upper end surface of the pressure regulating rod is provided with a A clamping groove, in which the clamping column is inserted, is used to prevent the pressure regulating rod from rotating along with the pressure regulating sleeve, the test pressure block base is hollow and has an opening at the lower end, and the upper end is fixedly connected to the lower end of the pressure regulating rod, and a base clamping platform extending horizontally inward and in a circular shape is fixed at the lower end opening of the test pressure block base, the test pressure block includes a test pressure block clamping body placed on the base clamping platform and a test pressure block body fixed to the lower end of the test pressure block clamping body and extending from the through hole in the middle of the base clamping platform to the bottom of the test pressure block base, the spring is in the cavity of the test pressure block base, the upper end of the spring is connected to the inner top wall of the test pressure block base, and the lower end is connected to the upper end of the test pressure block clamping body.

[0010] Furthermore, the circuit board is a multi-layer circuit board, and two symmetrical test lead slots are provided on both sides of the top surface of the circuit board. There are two test leads, and each of the test lead slots is arc-shaped and is used to hold one of the test leads; there are two SMA connectors, and the lower end of the crimped wire of each SMA connector is crimped with one end of one of the test leads; two wire cores are stripped from one end of the high-frequency communication cable, and the end of each of the wire cores is used to overlap the other end of one of the test leads.

[0011] Furthermore, a high-frequency communication cable mounting seat is fixed on the other side of the top surface of the test base, and a high-frequency communication cable slot is provided on one side of the top surface of the high-frequency communication cable mounting seat, and a wire core accommodating slot connected to the high-frequency communication cable slot is provided on the other side, the high-frequency communication cable slot is used to clamp the high-frequency communication cable, and the wire core accommodating slot is used to accommodate the two stripped wire cores.

[0012] Furthermore, it also includes a branching guide plate, which is covered on the top surface of the circuit board on one side of the SMA connector and is connected to the circuit board and the test base in sequence through bolts or screws. The bottom surface of the branching guide plate is provided with an upwardly recessed accommodating area, and the middle part of the top surface of the accommodating area is provided with a partition wall which protrudes downward and the bottom end is flush with the bottom surface of the branching guide plate. The partition wall is used to divide the accommodating area into two accommodating partitions, each of the test leads is in one of the accommodating partitions and the top surface of each test lead is spaced a certain distance from the top surface of the corresponding accommodating partition, and the branching guide plate is provided with a through hole at the other end of each test lead. The branching guide plate has branching guide openings on the top surface, the bottom surface and the corresponding side surface, and two of the branching guide openings are separated by an isolation wall, each of the branching guide openings is connected to one of the accommodating partitions, the other end of each of the test leads is in one of the branching guide openings, and the end of each of the wire cores is used to extend into one of the branching guide openings and be fixed in position through the corresponding branching guide opening; a through groove is provided on the bottom surface of the test pressure block, which is recessed upward and matched with the isolation wall between the two branching guide openings, and the test pressure blocks on both sides of the through groove are respectively used to extend into the corresponding branching guide openings, and the isolation wall between the two branching guide openings is used to be inserted in the through groove.

[0013] Furthermore, the test fixture base is fixed above the test base through a fixed support assembly, the fixed support assembly includes a first fixed support and a second fixed support, the first fixed support covers the circuit board and the branching guide plate and avoids the position of the other ends of the two test leads and is detachably connected to the test base, the SMA connector passes through the first fixed support and the top end extends above the first fixed support, the second fixed support is on the first fixed support and is detachably connected to the first fixed support, and the test fixture base is detachably connected to the second fixed support.

[0014] Furthermore, a first accommodating space which is recessed downward is provided on the top surface of the test base, and the circuit board is placed in the first accommodating space. A second accommodating space which is recessed upward is provided on the bottom surface of the first fixed support, and the shape, structure and size of the second accommodating space are compatible with those of the first accommodating space, and the branching guide plate is located in the second accommodating space.

[0015] Furthermore, the SMA connector is threadedly connected to the circuit board.

[0016] A method for using a high-frequency communication cable test fixture, specifically comprising: overlapping one end of the high-frequency communication cable at the other end of the test lead, controlling the lifting assembly to vertically lower the test fixture push rod, and the test fixture push rod drives the test pressure block to vertically lower through the pressure adjustment assembly, so that the test pressure block abuts against one end of the high-frequency communication cable, and according to the type of high-frequency communication cable, controlling the pressure adjustment assembly to adjust the vertical pressure applied to the test pressure block, and then adjusting the vertical pressure applied by the test pressure block to one end of the high-frequency communication cable, so that one end of the high-frequency communication cable is crimped to the other end of the test lead, and the high-frequency communication cable is detected by connecting the SMA connector to the cable detection equipment.

[0017] Compared with the prior art, the beneficial effects of the present invention are:

[0018] The high-frequency communication cable test fixture of the present invention, when in use, overlaps one end of the high-frequency communication cable at the other end of the test lead, controls the lifting assembly to vertically lower the test fixture push rod, and drives the test pressure block to vertically lower through the pressure regulating assembly, so that the test pressure block abuts against one end of the high-frequency communication cable, and according to the type of high-frequency communication cable, controls the pressure regulating assembly to adjust the vertical pressure applied to the test pressure block, and then adjusts the vertical pressure applied by the test pressure block to one end of the high-frequency communication cable, so that one end of the high-frequency communication cable is crimped to the other end of the test lead, and the high-frequency communication cable is detected by connecting the SMA connector to the cable detection equipment. Since the SMA connector is crimped to the circuit board, the defects caused by the welding points between the circuit board and the SMA connector in the original detection technology in the background technology can be avoided during the detection of the high-frequency communication cable, thereby avoiding affecting the test results of the high-frequency communication cable. Moreover, through the setting of the pressure adjustment component, the vertical pressure applied to the test block can be adjusted according to the type of high-frequency communication cable, and then the vertical pressure applied by the test block to one end of the high-frequency communication cable can be adjusted, thereby not affecting the test results of the high-frequency communication cable.

[0019] In the present invention, the pressure regulating assembly includes a pressure regulating rod, a pressure regulating sleeve, a test pressure block base and a spring, which are all arranged vertically; the upper part of the inner side wall of the pressure regulating sleeve is provided with a reverse internal thread, the middle part is smooth and the lower part is provided with a forward internal thread; the outer side surface of the lower part of the test fixture push rod is provided with a reverse external thread matched with the reverse internal thread; the outer side surface of the upper part of the pressure regulating rod is provided with a forward external thread matched with the forward internal thread; the pressure regulating sleeve is screwed to the outer side of the lower part of the test fixture push rod and the upper part of the pressure regulating rod; the lower end surface of the test fixture push rod is provided with a downwardly protruding clamping column; the upper end surface of the pressure regulating rod is provided with a A clamping groove, in which a clamping column is inserted, is used to prevent the pressure regulating rod from rotating along with the pressure regulating sleeve. The test pressure block base is hollow and has an opening at the lower end and an upper end fixedly connected to the lower end of the pressure regulating rod. A base clamping platform extending horizontally inward and in a circular shape is fixed at the lower end opening of the test pressure block base. The test pressure block includes a test pressure block clamping body placed on the base clamping platform and a test pressure block body fixed to the lower end of the test pressure block clamping body and extending from the through hole in the middle of the base clamping platform to the bottom of the test pressure block base. The spring is in the cavity of the test pressure block base, the upper end of the spring is connected to the inner top wall of the test pressure block base and the lower end is connected to the upper end of the test pressure block clamping body. In this way, when it is necessary to adjust the vertical pressure applied to one end of the high-frequency communication cable, the test fixture push rod has been lowered into place and its position no longer changes. The test pressure block abuts against one end of the high-frequency communication cable. At this time, the pressure adjusting sleeve is rotated in a certain direction to make the pressure adjusting sleeve vertically drop relative to the test fixture push rod. Since the clamping column at the lower end of the test fixture push rod is clamped in the clamping groove at the upper end of the pressure adjusting rod, the pressure adjusting rod will not rotate with the pressure adjusting sleeve. In addition, since the upper part of the pressure adjusting sleeve and the lower part of the test fixture push rod are threadedly connected by reverse internal threads and reverse external threads, and the lower part of the pressure adjusting sleeve and the upper part of the pressure adjusting rod are threadedly connected by forward internal threads and forward external threads, During the rotation of the pressure regulating sleeve, the pressure regulating rod vertically descends relative to the pressure regulating sleeve, and the test pressure block base vertically descends along with the pressure regulating rod. In the process of vertical descent, the test pressure block base applies vertical downward pressure to the spring and compresses the spring. The compressed spring then applies vertical downward pressure to the test pressure block, and the test pressure block applies vertical downward pressure to one end of the high-frequency communication cable. According to the type of high-frequency communication cable, the vertical pressure applied by the test pressure block to one end of the high-frequency communication cable can be adjusted by adjusting the number of rotations of the pressure regulating sleeve. Therefore, it is easy to adjust the vertical pressure applied to one end of the high-frequency communication cable without affecting the test result of the high-frequency communication cable.

[0020] In the present invention, the circuit board is a multi-layer circuit board, and two symmetrical test lead slots are provided on both sides of the top surface of the circuit board. There are two test leads, and each test lead slot has an arc shape and is used to clamp one of the test leads. The increase in test frequency increases the requirements for the impedance and other performances of the circuit board that is in direct contact with the test lead, so for the circuit board that is in direct contact with the test lead, a circuit board that is thinner than the original test technology in the background technology is used, and because the direction of each test lead slot is an arc shape, the interference of the test signal can be reduced during the detection process of the high-frequency communication cable, and a reinforcing circuit board is added to the lower layer of the circuit board that is in direct contact with the test lead to form a multi-layer circuit board, so that the structural strength of the circuit board can be increased while matching the high-frequency signal.

[0021] In the present invention, the high-frequency communication cable test fixture also includes a branching guide plate, which is covered on the top surface of the circuit board on one side of the SMA connector and is connected to the circuit board and the test base in sequence by bolts or screws. An upwardly recessed accommodation area is provided on the bottom surface of the branching guide plate, and a downwardly protruding isolation wall is provided in the middle of the top surface of the accommodation area and the bottom end is flush with the bottom surface of the branching guide plate. The isolation wall is used to divide the accommodation area into two accommodation partitions, each test lead is in one of the accommodation partitions and a certain distance is spaced between the top surface of each test lead and the top surface of the corresponding accommodation partition. The branching guide plate is at the other end of each test lead. A branch line guide port is provided at the bottom surface, which passes through the top surface, the bottom surface and the corresponding side surface of the branch line guide plate. The two branch line guide ports are separated by a separation wall. Each branch line guide port is connected to one of the accommodating partitions. The other end of each test lead is in one of the branch line guide ports, and the end of each wire core is used to extend into one of the branch line guide ports and be fixed in position through the corresponding branch line guide port; a through groove which is recessed upward and matched with the separation wall between the two branch line guide ports is provided on the bottom surface of the test pressing block, and the test pressing blocks on both sides of the through groove are respectively used to extend into the corresponding branch line guide ports, and the separation wall between the two branch line guide ports is used to be inserted into the through groove. In this way, through the setting of the branch wire guide, the position of the corresponding core end of the high-frequency communication cable extending into the corresponding branch wire guide can be fixed, so as to ensure that the test pressure blocks on both sides of the through groove can be accurately pressed on the corresponding core end of the high-frequency communication cable after extending into the corresponding branch wire guide, thereby ensuring that the corresponding core end of the high-frequency communication cable is accurately crimped to the other end of the corresponding test lead; in addition, since there is a certain distance between the top surface of the test lead and the top surface of the corresponding accommodating partition of the branch wire guide plate, in the detection process of the high-frequency communication cable, capacitance will not be generated and the test results will not be affected due to the contact between the test lead and the branch wire guide plate. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a schematic diagram of the three-dimensional structure of the high-frequency communication cable test fixture of the present invention after the pressure regulating sleeve is hidden;

[0023] Figure 2 for Figure 1 A schematic diagram of the three-dimensional structure in another direction;

[0024] Figure 3 for Figure 1 Exploded view of the test fixture base;

[0025] Figure 4 This is a schematic diagram of the main structure of the SMA connector being crimped onto the circuit board through crimping bolts;

[0026] Figure 5 A schematic diagram of the top view of the circuit board;

[0027] Figure 6 It is a schematic diagram of the three-dimensional structure of the clamp after the pressure block clamp of the downward pressure test clamp handle;

[0028] Figure 7 for Figure 3 A schematic diagram of the three-dimensional structure of the center line guide plate in another direction;

[0029] Figure 8 It is a schematic diagram of the structure of the line dividing guide plate when viewed from above;

[0030] Fig. 9 for Figure 3 A schematic diagram of the three-dimensional structure of the first fixed support in another direction.

[0031] Fig.10 It is a cross-sectional structural schematic diagram of the connection between the test fixture push rod and the test pressure block through the pressure regulating assembly;

[0032] Description of the reference numerals in the figure: 1. Test fixture base, 101. Test base, 10101. First accommodating space, 102. Circuit board, 10201. Test lead, 10202. Test lead slot, 103. SMA connector, 10301. Wire, 104. High-frequency communication cable mounting seat, 10401. High-frequency communication cable slot, 10402. Wire core accommodating slot, 105. Branching guide plate, 10501. Isolation wall, 10502. Accommodating partition, 10503. Branching guide port, 106. Crimp bolt, 107. First fixed support, 10701. Second accommodating space, 2. Press block fixture, 201. Test Test pressure block, 20101, test pressure block card body, 20102, test pressure block body, 20103, through slot, 202, test fixture push rod, 20201, clamping column, 203, test fixture base, 20301, test fixture base body, 20302, test fixture base side plate, 204, test fixture handle, 20401, hinged ear plate assembly, 205, test fixture connecting rod, 206, pressure adjustment rod, 20601, clamping slot, 207, pressure adjustment sleeve, 208, test pressure block base, 209, test pressure block pressure plate, 20901, pressure plate clamping platform, 2010, spring, 2011, second fixed support. DETAILED DESCRIPTION

[0033] The specific embodiments of the present invention are further described in detail below in conjunction with the accompanying drawings. These embodiments are only used to illustrate the present invention, but not to limit the present invention.

[0034] In the description of the present invention, it should be noted that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance.

[0035] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0036] like Figure 1 , Figure 2 , Figure 3 and Figure 6 As shown, a high-frequency communication cable test fixture comprises a test fixture base 1 and a pressing block fixture 2; the test fixture base 1 comprises a test base 101, a circuit board 102 is fixed on one side of the top surface of the test base 101, an SMA connector 103 is crimped on the top surface of the circuit board 102, a wire 10301 of the SMA connector 103 is crimped with one end of a test lead 10201 on the top surface of the circuit board 102, the other side of the top surface of the test base 101 is used to clamp a high-frequency communication cable, and one end of the high-frequency communication cable is used to overlap the test lead 10201 on the top surface of the circuit board 102. At the other end of the test lead 10201, the SMA connector 103 is used to connect to the cable detection equipment; the pressure block fixture 2 includes a test pressure block 201, a lifting assembly and a pressure adjustment assembly, the lifting assembly includes a test fixture push rod 202 that can be vertically lifted and lowered, the test fixture push rod 202 is connected to the test pressure block 201 through the pressure adjustment assembly, the pressure adjustment assembly is used to adjust the vertical pressure applied to the test pressure block 201, and the test pressure block 201 is used to crimp one end of the high-frequency communication cable to the other end of the test lead 10201.

[0037] When in use, one end of the high-frequency communication cable is overlapped on the other end of the test lead 10201, and the test fixture push rod 202 is vertically lowered by controlling the lifting assembly. The test fixture push rod 202 drives the test pressure block 201 to vertically lower through the pressure adjustment assembly, so that the test pressure block 201 abuts against one end of the high-frequency communication cable. According to the type of high-frequency communication cable, the pressure adjustment assembly is controlled to adjust the vertical pressure applied to the test pressure block 201, and then the vertical pressure applied by the test pressure block 201 to one end of the high-frequency communication cable is adjusted to crimp one end of the high-frequency communication cable to the other end of the test lead 10201. The SMA connector 103 is connected to the cable detection equipment to achieve detection of the high-frequency communication cable.

[0038] Since the SMA connector 103 is crimped with the circuit board 102, the defects caused by the welding points between the circuit board 102 and the SMA connector 103 in the original detection technology in the background technology can be avoided during the detection of the high-frequency communication cable, thereby avoiding affecting the test results of the high-frequency communication cable. Specifically, since there are no welding points between the SMA connector 103 and the circuit board 102, the resistance and capacitance spikes of the test will not be affected when the test exceeds 10GHZ, and through the setting of the pressure adjustment component, the vertical pressure applied to the test block 201 can be adjusted according to the type of high-frequency communication cable, and then the vertical pressure applied by the test block 201 to one end of the high-frequency communication cable can be adjusted, thereby not affecting the test results of the high-frequency communication cable.

[0039] In one embodiment, Figure 1 , Figure 2 and Figure 6 As shown, the lifting assembly also includes a test fixture base 203, a test fixture handle 204 and a test fixture connecting rod 205. The test fixture base 203 is U-shaped and fixed above the test base 101, and includes a test fixture base body 20301 and a test fixture base side plate 20302 fixed to the top of the test fixture base body 20301 on both sides of the opposite sides. An upper and lower hinged ear plate assembly 20401 is fixed at one end of the test fixture handle 204. The upper hinged ear plate assembly 20401 is located at the upper part of the two test fixture base side plates 20302. The test fixture connecting rod 205 is located between the two test fixture base side panels 20302, the test fixture connecting rod 205 is arc-shaped and the upper end is hinged to the hinged ear plate assembly 20401 on the lower side, the test fixture push rod 202 is vertical and passes through the through channel in the test fixture base body 20301, the upper end of the test fixture push rod 202 extends to the top of the test fixture base body 20301 and is hinged to the lower end of the test fixture connecting rod 205, and the lower end of the test fixture push rod 202 extends to the bottom of the test fixture base body 20301 and is connected to the test pressure block 201 through the pressure adjustment assembly.

[0040] In this way, when the test fixture handle 204 is pressed down, the position of the hinged ear plate assembly 20401 on the lower side of one end of the test fixture handle 204 is lowered, and the position of the lower end of the test fixture connecting rod 205 is lowered, so that the test fixture push rod 202 is vertically lowered relative to the test fixture base 203. When the test fixture handle 204 is pulled up, the position of the hinged ear plate assembly 20401 on the lower side of one end of the test fixture handle 204 is raised, and the position of the lower end of the test fixture connecting rod 205 is raised, so that the test fixture push rod 202 is vertically raised relative to the test fixture base 203.

[0041] In one embodiment, Fig.10As shown, the pressure regulating assembly includes a pressure regulating rod 206, a pressure regulating sleeve 207, a test pressure block base 208 and a spring 2010, which are all arranged vertically. The upper part of the inner wall of the pressure regulating sleeve 207 is provided with a reverse internal thread, the middle part is smooth and the lower part is provided with a forward internal thread. The lower outer side surface of the test fixture push rod 202 is provided with a reverse external thread matched with the reverse internal thread, the upper outer side surface of the pressure regulating rod 206 is provided with a forward external thread matched with the forward internal thread, the pressure regulating sleeve 207 is screwed to the outer side of the lower part of the test fixture push rod 202 and the upper part of the pressure regulating rod 206, the lower end surface of the test fixture push rod 202 is provided with a downwardly protruding clamping column 20201, the upper end surface of the pressure regulating rod 206 is provided with a clamping groove 20601 matched with the clamping column 20201, and the clamping column 202 01 is inserted into the clamping groove 20601, which is used to prevent the pressure regulating rod 206 from rotating along with the pressure regulating sleeve 207. The test block base 208 is hollow and has an opening at the lower end, and the upper end is fixedly connected to the lower end of the pressure regulating rod 206; a base clamping platform extending horizontally inward and in a circular shape is fixed at the lower end opening of the test block base 208. The test block 201 includes a test block card body 20101 placed on the base clamping platform and a test block body 20102 fixed to the lower end of the test block card body 20101 and extending from the through hole in the middle of the base clamping platform to the bottom of the test block base 208. The spring 2010 is in the cavity of the test block base 208, and the upper end of the spring 2010 is fixedly connected to the inner top wall of the test block base 208 and the lower end is fixedly connected to the upper end of the test block card body 20101.

[0042] In this way, when it is necessary to adjust the vertical pressure applied to one end of the high-frequency communication cable, the test fixture push rod 202 has been lowered into place and its position no longer changes. The test pressure block 201 abuts against one end of the high-frequency communication cable. At this time, the pressure adjusting sleeve 207 is rotated in a certain direction to make the pressure adjusting sleeve 207 vertically drop relative to the test fixture push rod 202. Since the clamping column 20201 at the lower end of the test fixture push rod 202 is clamped in the clamping groove 20601 at the upper end of the pressure adjusting rod 206, the pressure adjusting rod 206 will not rotate with the pressure adjusting sleeve 207. In addition, since the upper part of the pressure adjusting sleeve 207 and the lower part of the test fixture push rod 202 are threadedly connected by reverse internal threads and reverse external threads, the lower part of the pressure adjusting sleeve 207 and the upper part of the pressure adjusting rod 206 are threadedly connected by forward internal threads and forward external threads. In this way, during the rotation of the pressure regulating sleeve 207, the pressure regulating rod 206 vertically descends relative to the pressure regulating sleeve 207, and the test pressure block base 208 vertically descends along with the pressure regulating rod 206. In the process of vertical descent, the test pressure block base 208 applies a vertical downward pressure to the spring 2010 and compresses the spring 2010. The compressed spring 2010 then applies a vertical downward pressure to the test pressure block 201, and the test pressure block 201 applies a vertical downward pressure to one end of the high-frequency communication cable. According to the type of high-frequency communication cable, the vertical pressure applied by the test pressure block 201 to one end of the high-frequency communication cable can be adjusted by adjusting the number of rotations of the pressure regulating sleeve 207. Therefore, it is easy to adjust the vertical pressure applied to one end of the high-frequency communication cable without affecting the test result of the high-frequency communication cable.

[0043] Or, if Fig.10As shown, the pressure regulating assembly includes a pressure regulating rod 206, a pressure regulating sleeve 207, a test pressure block base 208, a test pressure block pressure plate 209 and a spring 2010, all of which are arranged vertically. The upper part of the inner side wall of the pressure regulating sleeve 207 is provided with a reverse internal thread, the middle part is smooth and the lower part is provided with a positive internal thread. The lower outer side surface of the test fixture push rod 202 is provided with a reverse external thread that matches the reverse internal thread. The upper outer side surface of the pressure regulating rod 206 is provided with a positive internal thread that matches the positive internal thread. The external thread, the pressure regulating sleeve 207 is screwed to the outer side of the lower part of the test fixture push rod 202 and the upper part of the pressure regulating rod 206, the lower end surface of the test fixture push rod 202 is provided with a downwardly protruding clamping column 20201, and the upper end surface of the pressure regulating rod 206 is provided with a clamping groove 20601 adapted to the clamping column 20201, and the clamping column 20201 is inserted into the clamping groove 20601 to prevent the pressure regulating rod 206 from rotating with the pressure regulating sleeve 207. 8 is hollow and has an opening at the lower end, and the upper end is fixedly connected to the lower end of the pressure regulating rod 206; the test block pressing plate 209 is hollow and has openings at the upper and lower ends. The test block pressing plate 209 is located in the test block base 208 and is connected to the test block base 208 by threaded fasteners. A pressing plate clamping platform 20901 extending horizontally inward and in a circular shape is fixed at the lower end opening of the test block pressing plate 209. The lower end height of the pressing plate clamping platform 20901 is lower than the lower end height of the test block base 208. The test pressure block 201 includes a test pressure block card body 20101 placed on the pressure plate card platform 20901 and a test pressure block body 20102 fixed to the lower end of the test pressure block card body 20101 and extending from the through hole in the middle of the pressure plate card platform 20901 to the bottom of the test pressure block base 208. The spring 2010 is located in the cavity of the test pressure block pressure plate 209, and the upper end of the spring 2010 is fixedly connected to the inner top wall of the test pressure block base 208 and the lower end is fixedly connected to the upper end of the test pressure block card body 20101.

[0044] In one embodiment,

[0045] The circuit board 102 is a multi-layer circuit board. Two symmetrical test lead slots 10202 are provided on both sides of the top surface of the circuit board 102. There are two test leads 10201. Each test lead slot 10202 is arc-shaped and is used to hold one of the test leads 10201. Figure 3 and Figure 5 , wherein the width of the test lead 10201 is designed according to the test impedance of the high-frequency communication cable being tested; Figure 2 and Figure 3As shown, there are two SMA connectors 103 , and the lower end of the crimping wire 10301 of each SMA connector 103 is crimped to one end of one of the test leads 10201 ; two cores are stripped from one end of the high-frequency communication cable, and the end of each core is used to overlap the other end of one of the test leads 10201 .

[0046] In the present invention, the increase in test frequency increases the requirements for the impedance and other performance of the circuit board 102 that is in direct contact with the test lead 10201. Therefore, for the circuit board 102 that is in direct contact with the test lead 10201, a circuit board 102 that is thinner than the original test technology in the background technology is used. Since the direction of each test lead slot 10202 is arc-shaped, the interference of the test signal can be reduced during the detection of the high-frequency communication cable. A reinforced circuit board 102 is added to the lower layer of the circuit board 102 that is in direct contact with the test lead 10201 to form a multi-layer circuit board. In this way, the structural strength of the circuit board 102 can be increased while matching the high-frequency signal.

[0047] Among them, Figure 1-Figure 3 As shown, a high-frequency communication cable mounting seat 104 is fixed on the other side of the top surface of the test base 101, a high-frequency communication cable slot 10401 is provided on one side of the top surface of the high-frequency communication cable mounting seat 104, and a wire core accommodating slot 10402 connected to the high-frequency communication cable slot 10401 is provided on the other side, the high-frequency communication cable slot 10401 is used to clamp the high-frequency communication cable, and the wire core accommodating slot 10402 is used to accommodate the two stripped wire cores.

[0048] Among them, Figure 3 , Figure 7 and Figure 8As shown, the high-frequency communication cable test fixture also includes a branching guide plate 105, which is covered on the top surface of the circuit board 102 on one side of the SMA connector 103, and is connected to the circuit board 102 and the test base 101 in sequence by bolts or screws. A accommodating area that is recessed upward is provided on the bottom surface of the branching guide plate 105, and a partition wall 10501 that protrudes downward and has a bottom end flush with the bottom surface of the branching guide plate 105 is provided in the middle of the top surface of the accommodating area. The partition wall 10501 is used to divide the accommodating area into two accommodating partitions 10502, each test lead 10201 is in one of the accommodating partitions 10502, and a certain distance is separated between the top surface of each test lead 10201 and the top surface of the corresponding accommodating partition 10502, and the branching guide plate 105 is provided at the other end of each test lead 10201. , a branch line guide 10503 on the bottom surface and a corresponding side surface, the two branch line guides 10503 are separated by a separation wall 10501, each branch line guide 10503 is connected to one of the accommodating partitions 10502, the other end of each test lead 10201 is in one of the branch line guides 10503, and the end of each wire core is used to extend into one of the branch line guides 10503 and be fixed in position through the corresponding branch line guide 10503; a through groove 20103 which is recessed upward and matched with the separation wall 10501 between the two branch line guides 10503 is provided on the bottom surface of the test pressing block 201, the test pressing blocks 201 on both sides of the through groove 20103 are respectively used to extend into the corresponding branch line guide 10503, and the separation wall 10501 between the two branch line guides 10503 is used to be inserted into the through groove 20103.

[0049] In this way, through the setting of the branch wire guide 10503, the position of the corresponding core end of the high-frequency communication cable extending into the corresponding branch wire guide 10503 can be fixed to ensure that the test pressing blocks 201 on both sides of the through groove 20103 can be accurately pressed on the corresponding core end of the high-frequency communication cable after extending into the corresponding branch wire guide 10503, thereby ensuring that the corresponding core end of the high-frequency communication cable is accurately crimped to the other end of the corresponding test lead 10201; in addition, since there is a certain distance between the top surface of the test lead 10201 and the top surface of the corresponding accommodating partition 10502 of the branch wire guide plate 105, during the detection process of the high-frequency communication cable, capacitance will not be generated and the test results will not be affected due to the contact between the test lead 10201 and the branch wire guide plate 105.

[0050] Preferably, if Figure 1 and Figure 2As shown, the test fixture base 203 is fixed above the test base 101 through a fixed support assembly, and the fixed support assembly includes a first fixed support 107 and a second fixed support 2011. The first fixed support 107 covers the circuit board 102 and the branching guide plate 105 and avoids the position of the other ends of the two test leads 10201 and is detachably connected to the test base 101. The SMA connector 103 passes through the first fixed support 107 and the top end extends above the first fixed support 107. The second fixed support 2011 is on the first fixed support 107 and is detachably connected to the first fixed support 107. The test fixture base 203 is detachably connected to the second fixed support 2011. In this way, by providing the first fixed support 107 and the second fixed support 2011, it is convenient to fix the test fixture base 203 above the test base 101. Preferably, a first accommodating space 10101 that is recessed downward is provided on the top surface of the test base 101. Figure 3 The circuit board 102 is placed in the first accommodation space 10101, and the bottom surface of the first fixed support 107 is provided with a second accommodation space 10701 which is recessed upwards. Fig. 9 The second accommodating space 10701 is compatible with the first accommodating space 10101 in shape, structure and size, and the branching guide plate 105 is located in the second accommodating space 10701 .

[0051] In one embodiment, the SMA connector 103 is threadedly connected to the circuit board 102. Specifically, the SMA connector 103 is crimped onto the circuit board 102 by crimping bolts 106. Figure 4 .

[0052] A method for using a high-frequency communication cable test fixture, specifically: overlap the two wire core ends of one end of the high-frequency communication cable at the other end of the corresponding test lead 10201 respectively, press down the test fixture handle 204, adjust the position of the hinged ear plate assembly 20401 on the lower side of one end of the test fixture handle 204, and adjust the position of the lower end of the test fixture connecting rod 205, so that the test fixture push rod 202 is vertically lowered relative to the test fixture base 203, and the test fixture push rod 202 drives the test pressure block 201 to vertically descend through the pressure adjustment assembly, so that the test pressure block 201 abuts against one end of the high-frequency communication cable. At this time, the test fixture push rod 202 has been lowered into place and the position no longer changes, and then rotate the pressure adjustment sleeve 207 in a certain direction to make the pressure adjustment sleeve 207 vertically descend relative to the test fixture push rod 202, and during the rotation of the pressure adjustment sleeve 207, the pressure adjustment rod 206 The relative pressure regulating sleeve 207 descends vertically, and the test pressure block base 208 descends vertically along with the pressure regulating rod 206. In the process of vertical descent, the test pressure block base 208 applies vertical downward pressure to the spring 2010 and compresses the spring 2010. The compressed spring 2010 further applies vertical downward pressure to the test pressure block 201, and the test pressure block 201 applies vertical downward pressure to the two core ends at one end of the high-frequency communication cable. According to the type of high-frequency communication cable, the number of rotations of the pressure regulating sleeve 207 is adjusted to adjust the vertical pressure applied by the test pressure block 201 to the two core ends at one end of the high-frequency communication cable, so that the two core ends at one end of the high-frequency communication cable are respectively crimped to the other end of the corresponding test lead 10201, and the high-frequency communication cable is detected by connecting the two SMA connectors 103 to the cable detection equipment.

[0053] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and substitutions can be made without departing from the technical principles of the present invention. These improvements and substitutions should also be regarded as the scope of protection of the present invention.

Claims

1. A high-frequency communication cable test fixture, characterized in that: The invention comprises a test fixture base (1) and a pressing block fixture (2); the test fixture base (1) comprises a test base (101); a circuit board (102) is fixed on one side of the top surface of the test base (101); an SMA connector (103) is crimped on the top surface of the circuit board (102); a wire (10301) of the SMA connector (103) is crimped to one end of a test lead (10201) on the top surface of the circuit board (102); the other side of the top surface of the test base (101) is used to clamp a high-frequency communication cable; one end of the high-frequency communication cable is used to overlap the test lead (10201). 0201), the SMA connector (103) is used to connect to the cable detection equipment; the pressure block fixture (2) comprises a test pressure block (201), a lifting assembly and a pressure adjustment assembly, the lifting assembly comprises a test fixture push rod (202) that can be lifted vertically, the test fixture push rod (202) is connected to the test pressure block (201) through the pressure adjustment assembly, the pressure adjustment assembly is used to adjust the vertical pressure applied to the test pressure block (201), and the test pressure block (201) is used to crimp one end of the high-frequency communication cable to the other end of the test lead (10201).

2. A high-frequency communication cable test fixture according to claim 1, characterized in that: The lifting assembly further comprises a test fixture base (203), a test fixture handle (204) and a test fixture connecting rod (205); the test fixture base (203) is U-shaped and fixed above the test fixture (101), and comprises a test fixture base body (20301) and test fixture base side panels (20302) fixed to opposite sides of the top of the test fixture base body (20301); two upper and lower hinged ear plate assemblies (20401) are fixed at one end of the test fixture handle (204); the upper hinged ear plate assembly (20401) is located at the upper part of the two test fixture base side panels (20302) The test fixture connecting rod (205) is located between the two test fixture base side plates (20302), and is hinged to the two test fixture base side plates (20302); the test fixture connecting rod (205) is arc-shaped and the upper end is hinged to the hinged ear plate assembly (20401) on the lower side; the test fixture push rod (202) is vertical and passes through the through channel in the test fixture base body (20301); the upper end of the test fixture push rod (202) extends above the test fixture base body (20301) and is hinged to the lower end of the test fixture connecting rod (205); the lower end of the test fixture push rod (202) extends below the test fixture base body (20301) and is connected to the test pressure block (201) through the pressure adjustment assembly.

3. A high-frequency communication cable test fixture according to claim 1, characterized in that: The pressure regulating assembly comprises a pressure regulating rod (206), a pressure regulating sleeve (207), a test pressure block base (208) and a spring (2010) which are all arranged vertically. The upper part of the inner side wall of the pressure regulating sleeve (207) is provided with a reverse internal thread, the middle part is smooth and the lower part is provided with a positive internal thread. The lower outer side surface of the test fixture push rod (202) is provided with a reverse external thread that matches the reverse internal thread. The upper part of the pressure regulating rod (206) is provided with a reverse external thread that matches the reverse internal thread. The outer side surface is provided with a positive external thread matched with the positive internal thread, the pressure regulating sleeve (207) is screwed to the outer side of the lower part of the test fixture push rod (202) and the upper part of the pressure regulating rod (206), the lower end surface of the test fixture push rod (202) is provided with a downwardly protruding clamping column (20201), the upper end surface of the pressure regulating rod (206) is provided with a clamping groove (20601) matched with the clamping column (20201), and the clamping column (20201) is provided with a clamping groove (20601) matched with the clamping column (20201). The test block (201) is inserted into the clamping groove (20601) to prevent the pressure regulating rod (206) from rotating with the pressure regulating sleeve (207). The test block base (208) is hollow and has an opening at the lower end. The upper end is fixedly connected to the lower end of the pressure regulating rod (206). A base clamping table extending horizontally inward and in a circular shape is fixed at the lower end opening of the test block base (208). The test block (201) includes a test block placed on the base clamping table. A test pressure block card body (20101) and a test pressure block body (20102) fixed at the lower end of the test pressure block card body (20101) and extending from a through hole in the middle of the base card platform to below the test pressure block base (208), wherein the spring (2010) is located in the cavity of the test pressure block base (208), and the upper end of the spring (2010) is connected to the inner top wall of the test pressure block base (208) and the lower end is connected to the upper end of the test pressure block card body (20101).

4. A high-frequency communication cable test fixture according to claim 1, characterized in that: The circuit board (102) is a multi-layer circuit board, and two symmetrical test lead slots (10202) are provided on both sides of the top surface of the circuit board (102). There are two test leads (10201), and each of the test lead slots (10202) is arc-shaped and is used to hold one of the test leads (10201); there are two SMA connectors (103), and the lower end of the crimping wire (10301) of each SMA connector (103) is crimped to one end of one of the test leads (10201); two wire cores are stripped from one end of a high-frequency communication cable, and the end of each of the wire cores is used to overlap the other end of one of the test leads (10201).

5. A high-frequency communication cable test fixture according to claim 4, characterized in that: A high-frequency communication cable mounting seat (104) is fixed on the other side of the top surface of the test base (101); a high-frequency communication cable slot (10401) is provided on one side of the top surface of the high-frequency communication cable mounting seat (104) and a wire core receiving slot (10402) connected to the high-frequency communication cable slot (10401) is provided on the other side; the high-frequency communication cable slot (10401) is used for receiving a high-frequency communication cable, and the wire core receiving slot (10402) is used for receiving two stripped wire cores.

6. A high-frequency communication cable test fixture according to claim 4, characterized in that: The invention also comprises a line splitting guide plate (105), the line splitting guide plate (105) being covered on the top surface of the circuit board (102) on one side of the SMA connector (103), and being connected to the circuit board (102) and the test base (101) in sequence by bolts or screws, the bottom surface of the line splitting guide plate (105) being provided with an upwardly recessed accommodation area, the middle part of the top surface of the accommodation area being provided with an isolation wall (10501) protruding downwards and having a bottom end flush with the bottom surface of the line splitting guide plate (105), the isolation wall (10501) being provided with a plurality of holes, and the isolation wall (10501) being provided with a plurality of holes. The wall (10501) is used to divide the accommodating area into two accommodating partitions (10502), each of the test leads (10201) is located in one of the accommodating partitions (10502), and a certain distance is between the top surface of each test lead (10201) and the top surface of the corresponding accommodating partition (10502), and the branching guide plate (105) is provided at the other end of each test lead (10201) with a top surface, a bottom surface and a corresponding side surface of the branching guide plate (105). The two branch line guide ports (10503) are separated by a partition wall (10501), each branch line guide port (10503) is connected to one of the accommodating partitions (10502), the other end of each test lead (10201) is located in one of the branch line guide ports (10503), and the end of each wire core is used to extend into one of the branch line guide ports (10503) and pass through the corresponding branch line guide port (10501). 503) is fixed in position; a through groove (20103) is provided on the bottom surface of the test pressing block (201) which is concave upwards and matches with the isolation wall (10501) between the two branch line guide openings (10503); the test pressing blocks (201) on both sides of the through groove (20103) are respectively used to extend into the corresponding branch line guide openings (10503), and the isolation wall (10501) between the two branch line guide openings (10503) is used to be inserted into the through groove (20103).

7. A high-frequency communication cable test fixture according to claim 6, characterized in that: The test fixture base (203) is fixed above the test base (101) through a fixed support assembly, the fixed support assembly comprising a first fixed support (107) and a second fixed support (2011), the first fixed support (107) covers the circuit board (102) and the branching guide plate (105) and avoids the position of the other ends of the two test leads (10201) and is detachably connected to the test base (101), the SMA connector (103) passes through the first fixed support (107) and the top end extends above the first fixed support (107), the second fixed support (2011) is on the first fixed support (107) and is detachably connected to the first fixed support (107), and the test fixture base (203) is detachably connected to the second fixed support (2011).

8. A high-frequency communication cable test fixture according to claim 7, characterized in that: The top surface of the test base (101) is provided with a first accommodating space (10101) which is recessed downwards, and the circuit board (102) is placed in the first accommodating space (10101). The bottom surface of the first fixed support (107) is provided with a second accommodating space (10701) which is recessed upwards, and the shape, structure and size of the second accommodating space (10701) are compatible with those of the first accommodating space (10101), and the branching guide plate (105) is located in the second accommodating space (10701).

9. A high-frequency communication cable test fixture according to claim 1, characterized in that: The SMA connector (103) is threadably connected to the circuit board (102).

10. A method for using a high-frequency communication cable test fixture according to any one of claims 1 to 9, characterized in that: Specifically, one end of the high-frequency communication cable is overlapped with the other end of the test lead (10201), and the test fixture push rod (202) is vertically lowered by controlling the lifting component. The test fixture push rod (202) drives the test pressure block (201) to vertically lower through the pressure adjustment component, so that the test pressure block (201) abuts against one end of the high-frequency communication cable, and according to the type of high-frequency communication cable, the vertical pressure applied to the test pressure block (201) is adjusted by controlling the pressure adjustment component, and then the vertical pressure applied by the test pressure block (201) to one end of the high-frequency communication cable is adjusted, so that one end of the high-frequency communication cable is crimped to the other end of the test lead (10201), and the high-frequency communication cable is detected by connecting the SMA connector (103) to the cable detection equipment.

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