Quickly-assembled chip test seat

Abstract

The invention discloses a rapid assembly chip test seat which comprises a base, a containing groove is formed in the base, a probe set is arranged at the bottom of the containing groove, the containing groove is used for containing a chip, a rapid disassembly piece is detachably arranged on the side wall of one side of the base, an upper pressing cover is arranged at the top of the rapid disassembly piece, and the probe set is arranged at the bottom of the upper pressing cover. The upper gland is detachably hinged to the top of the quick release part, a floating block is suspended on the upper gland, an adjusting part is arranged on the back side of the floating block and makes contact with the back of the floating block, and rotary knobs capable of changing the axial rotation angle of the adjusting part are arranged on the two sides of the adjusting part. The components are assembled quickly and conveniently, the time and difficulty of workpiece machining and assembling are reduced, in addition, the adjusting piece is driven to rotate by rotating the rotary knob, the floating block moves downwards, the pressing stroke of the floating block can be adjusted through the one-key rotary knob, the test operation difficulty is reduced, and the test efficiency is also improved.

Description

Technical Field

[0001] The invention relates to the field of chip test sockets, and in particular to a fast-assembly chip test socket. Background Art

[0002] In the chip production process, accurate and reliable testing of chips is one of the key links to ensure product quality. In chip testing, the role of chip test sockets cannot be ignored. Chip test sockets are a type of equipment used to test chip performance and functions. They connect to the chip, provide power and signals, and thus enable comprehensive testing of the chip.

[0003] The chip test socket is usually composed of a base, a cover and an interface. When the chip is loaded into the high test socket, the bottom probe of the test socket will electrically connect the pins of the chip and send the test signal to the chip. Then the output signal of the chip is read and transmitted to the test equipment for analysis to determine whether the chip function meets the specifications. Different chip test sockets are suitable for different types of chips. The design and manufacturing process of the chip test socket requires very high technical requirements to ensure the accuracy and reliability of the test results.

[0004] The structure of the existing chip test socket is relatively complex, and the processing and assembly procedures are cumbersome, which is not conducive to large-scale production. In addition, the structure for adjusting the upper cover stroke is also relatively complex, and it is often damaged after long-term use, and it can often only test chips of a single specification. Summary of the invention

[0005] In order to solve the above-mentioned problems, the present invention provides a quick-assembly chip test seat, including a base, a receiving groove is arranged in the base, a probe group is arranged at the bottom of the receiving groove, the receiving groove is used to place the chip to be tested, a quick-release part is detachably arranged on the side wall of one side of the base, an upper pressure cover is arranged on the top of the quick-release part, the upper pressure cover and the top of the quick-release part form a detachable hinge, a floating block is suspended on the upper pressure cover, when the upper pressure cover is pressed on the top of the base, the floating block is located above the receiving groove, an adjusting part is arranged on the back side of the floating block, the adjusting part is in contact with the back of the floating block, and knobs capable of changing the axial rotation angle of the adjusting part are arranged on both sides of the adjusting part.

[0006] Furthermore, insertion rods are respectively provided at both ends of the quick-release part on the side opposite to the base, a first positioning hole corresponding to the position of the insertion rod is provided on the side wall of the base, a second positioning hole is provided on the top of the insertion rod and a latch is provided above the second positioning hole, and a third positioning hole is provided on the top of the base and passes through the second positioning hole.

[0007] Furthermore, a first groove is arranged at the top of the quick release member, first through holes are arranged on both sides of the first groove, a hinge portion is arranged at the bottom of the upper pressure cover, and second through holes are arranged on both sides of the hinge portion.

[0008] Furthermore, the adjusting member is cylindrical in shape, including end faces on both sides and an annular wall between the end faces, and a connecting rod is provided in the axial direction of the adjusting member, the connecting rod passes through the end faces and extends from both sides of the upper pressure cover, and the knob is sleeved on the connecting rod.

[0009] Furthermore, a third through hole penetrating the end surface is provided on the end surface of the adjusting member, the connecting rod is inserted into the third through hole, a limiting groove extends from the third through hole to the annular wall, and a limiting plate protrudes axially from the connecting rod.

[0010] Furthermore, a plurality of first contact portions are spaced apart along the annular wall of the adjusting member, and the first contact portions have different linear distances from the third through hole. When the axial rotation angle of the adjusting member is changed, the first contact portions form surface contact with the back of the floating block.

[0011] Further, the probe group includes a plurality of first probes, the first probe includes a first tube body, a first limiting ring is arranged inside the first tube body, the first limiting ring is coaxially sleeved and fixed with the first tube body, a first upper needle is arranged at one end of the first tube body, the end of the first upper needle extending out of the first tube body is serrated, a first spring is arranged between the first upper needle and the first limiting ring, a first lower needle is arranged at the end of the first tube body away from the first upper needle, a first guide rod is arranged at the end of the first lower needle close to the first upper needle, the first guide rod is inserted into the first limiting ring, and a second spring is sleeved around the first guide rod.

[0012] Furthermore, a second tube body is sleeved on the outer side of the first tube body, an insulating member is provided between the first tube body and the second tube body, a second guide rod is provided at one end of the first upper needle head close to the first lower needle head, and the first spring is sleeved on the second guide rod.

[0013] Furthermore, a second probe is included between the first probes, the height of the second probe is smaller than that of the first probe, the second probe includes a third tube body, a second upper needle is provided at one end of the third tube body, the end of the second upper needle extending out of the third tube body is serrated, the second upper needle is hollow, a second lower needle is provided at the end of the third tube body away from the second upper needle, a second limiting ring is provided on the second lower needle, and the second lower needle is sleeved in the second upper needle.

[0014] Furthermore, a second contact portion is arranged between the first contact portions, and the shape of the second contact portion is an arc convex outward, and the straight-line distance with the third through hole is different. When the axial rotation angle of the adjusting member is changed, the first contact portion is tangent to the back of the floating block and the bottom of the chip contacts the first probe and the second probe at the same time.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] The various components of the present application are quickly and easily assembled, reducing the time and difficulty of workpiece processing and assembly. In addition, the adjusting member is driven to rotate by rotating the knob to move the floating block downward, so that the downward stroke of the floating block can be adjusted by one-touch knob, reducing the difficulty of test operations and improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0018] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0019] Figure 2 It is a schematic diagram of the overall structure of the present invention from another angle;

[0020] Figure 3 It is a structural schematic diagram of the base of the present invention;

[0021] Figure 4 It is a structural schematic diagram of the quick-release member of the present invention;

[0022] Figure 5 It is a structural schematic diagram of the upper gland of the present invention;

[0023] Figure 6 It is a structural schematic diagram of the adjusting member of the present invention;

[0024] Figure 7 is a schematic structural diagram of the first probe of the present invention;

[0025] Figure 8 It is a schematic diagram of the structure of the second probe of the present invention.

[0026] The reference numerals and names in the figures are as follows:

[0027] Base 100, accommodating groove 110, probe group 200, chip 10, quick release part 300, upper pressure cover 400, floating block 410, adjusting member 420, knob 430, plug rod 310, first positioning hole 120, second positioning hole 311, plug pin 320, third positioning hole 130, first groove 140, first through hole 141, hinge part 440, second through hole 441, end face 421, annular wall 422, connecting rod 423, third through hole 424, limiting groove 425, The limiting plate 426, the first contact portion 422a, the first probe 210, the first tube 211, the first limiting ring 212, the first upper needle 213, the first spring 214, the first lower needle 215, the first guide rod 216, the second spring 217, the second tube 218, the insulating member 219, the second guide rod 213a, the second probe 220, the third tube 221, the second upper needle 222, the second lower needle 223, the second limiting ring 224, and the second contact portion 422b. DETAILED DESCRIPTION

[0028] The technical solutions in the embodiments of the present invention are described clearly and completely below. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0029] The present invention is described in more detail. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention. It should be noted that when an element is described as "fixed to" another element, it can be directly on the other element, or there can be one or more centered elements therebetween. When an element is described as "connected to" another element, it can be directly connected to the other element, or there can be one or more centered elements therebetween.

[0030] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, vertical, horizontal" and "top, bottom" are usually based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description. Unless otherwise stated, these directional words do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the scope of protection of the present invention; the directional words "inside and outside" refer to the inside and outside relative to the outline of each component itself. In the description of the present invention, it should be noted that the use of words such as "first" and "second" to define components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above words have no special meaning, and therefore cannot be understood as limiting the scope of protection of the present invention. In the description of the embodiments of the present application, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0031] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention.

[0032] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0033] The preferred embodiments of the present invention are further described in conjunction with the accompanying drawings. Figure 1 and Figure 2 As shown, a quick-assembly chip test seat includes a base 100, a receiving groove 110 is arranged in the base 100, a probe group 200 is arranged at the bottom of the receiving groove 110, the receiving groove 110 is used to place the chip 10 that needs to be tested, a quick-release part 300 is detachably arranged on the side wall of one side of the base 100, an upper pressure cover 400 is arranged on the top of the quick-release part 300, the upper pressure cover 400 and the top of the quick-release part 300 form a detachable hinge, a floating block 410 is suspended on the upper pressure cover 400, when the upper pressure cover 400 is pressed on the top of the base 100, the floating block 410 is located above the receiving groove 110, an adjusting member 420 is arranged on the back side of the floating block 410, the adjusting member 420 is in contact with the back of the floating block 410, and knobs 430 capable of changing the axial rotation angle of the adjusting member 420 are arranged on both sides of the adjusting member 420.

[0034] When the present application is implemented, the quick-release part 300 is first installed on the side wall of one side of the base 100, and then the upper pressure cover 400 is hingedly installed on the top of the quick-release part 300 to complete the installation of the test socket, and then the chip 10 to be tested is placed in the receiving groove 110, and then the upper pressure cover 400 is pressed on the base 100 so that the floating block 410 is located above the receiving groove 110, and finally the adjusting part 420 is driven to rotate by rotating the knob 430 to move the floating block 410 downward, and the chip 10 is pressed downward as a whole from above the chip 10, thereby ensuring that the chip 10 to be tested is in contact with the probe group 200 at the bottom of the receiving groove 110, and ensuring that the test of the chip 10 can be completed.

[0035] Compared with the prior art, the various components of the present application are quickly and conveniently assembled, reducing the time and difficulty of workpiece processing and assembly. In addition, by rotating the knob 430, the adjusting member 420 is driven to rotate so that the floating block 410 moves downward, and the one-touch knob 430 can adjust the downward stroke of the floating block 410, thereby reducing the operational difficulty of the test and improving the test efficiency.

[0036] On the basis of the above embodiments, Figure 3 and Figure 4 As shown, the two ends of the quick release member 300 on the side opposite to the base 100 are respectively provided with an insertion rod 310, a first positioning hole 120 corresponding to the position of the insertion rod 310 is provided on the side wall of the base 100, a second positioning hole 311 is provided on the top of the insertion rod 310 and a latch 320 is provided above the second positioning hole 311, and a third positioning hole 130 penetrating through the second positioning hole 311 is provided on the top of the base 100. When the quick release member 300 and the base 100 need to be assembled, When the base 100 is assembled with the quick-release component 300, the insertion rod 310 is inserted into the first positioning hole 120 so that the quick-release component 300 is fitted with the side wall of the base 100, and the second positioning hole 311 is aligned with the third positioning hole 130. Then, the latch 320 is inserted from the third positioning hole 130 so that it passes through the third positioning hole 130 and the second positioning hole 311. In this way, the insertion rod 310 of the quick-release component 300 is fixed in the first positioning hole 120, thereby forming a detachable connection between the quick-release component 300 and the base 100.

[0037] On the basis of the above embodiments, Figure 4 and Figure 5As shown, a first groove 140 is provided at the top of the quick release member 300, and first through holes 141 are respectively provided on both sides of the first groove 140, a hinge portion 440 is provided at the bottom of the upper pressure cover 400, and second through holes 441 are provided on both sides of the hinge portion 440. When the upper pressure cover 400 and the quick release member 300 need to be assembled, the hinge portion 440 is arranged in the first groove 140 so that the second through hole 441 is aligned with the first through hole 141, and then a hinge rod (not shown in the figure) is inserted, so that the upper pressure cover 400 and the top of the quick release member 300 form a detachable hinge.

[0038] On the basis of the above embodiments, Figure 5 and Figure 6 As shown, the adjusting member 420 is cylindrical in shape, including end faces 421 on both sides and an annular wall 422 between the end faces 421, and a connecting rod 423 is arranged in the axial direction of the adjusting member 420, and the connecting rod 423 passes through the end faces 421 and extends from both sides of the upper pressure cover 400, and the knob 430 is sleeved on the connecting rod 423, so that when the knob 430 is rotated, the connecting rod 423 is driven to rotate, thereby changing the axial rotation angle of the adjusting member 420.

[0039] In some embodiments, in combination Figure 5 and Figure 6 As shown, a third through hole 424 penetrating the end face 421 is provided on the end face 421 of the adjusting member 420, the connecting rod 423 is inserted into the third through hole 424, a limiting groove 425 extends from the third through hole 424 to the annular wall 422, and a limiting plate 426 protrudes axially from the connecting rod 423. When the connecting rod 423 is inserted into the third through hole 424, the limiting plate 426 is aligned with the limiting groove 425 and inserted, so that when the rotating knob 430 drives the connecting rod 423 to rotate, the axial rotation angle of the adjusting member 420 can be better changed.

[0040] On the basis of the above embodiments, Figure 6As shown, a plurality of first contact portions 422a are spaced apart along the annular wall 422 of the adjusting member 420. The linear distances between the first contact portion 422a and the third through hole 424 are different. When the axial rotation angle of the adjusting member 420 is changed, the first contact portion 422a forms a surface contact with the back of the floating block 410. For example, the distances between the first contact portion 422a and the third through hole 424 are 0.3 cm, 0.5 cm, 0.7 cm and 1 cm, respectively. By rotating the adjusting member 420, the first contact portions 422a with different linear distances from the third through hole 424 are in surface contact with the back of the floating block 410, so that the floating block 410 moves downward and the chip 10 is pressed downward as a whole from above the chip 10. Specifically, for example, in the initial state, the first contact portion 422a 0.5 cm away from the third through hole 424 is in surface contact with the back of the floating block 410, and then Then, the upper pressure cover 400 is pressed onto the base 100 so that the floating block 410 is located above the accommodating groove 110. It is found that the floating block 410 does not press the chip 10 properly, so that it cannot fully contact the probe group 200 at the bottom. At this time, the adjustment member 420 is driven to rotate by rotating the knob 430 so that the first contact portion 422a, which is 0.7 cm away from the third through hole 424, contacts the back surface of the floating block 410. At this time, the floating block 410 moves downward by 0.2 cm, so that the floating block 410 continues to move downward, thereby ensuring that the floating block 410 presses the chip 10 properly.

[0041] On the basis of the above embodiments, Figure 7 As shown, the probe group 200 includes a plurality of first probes 210, the first probe 210 includes a first tube body 211, a first limiting ring 212 is arranged inside the first tube body 211, the first limiting ring 212 is coaxially sleeved and fixed with the first tube body 211, a first upper needle 213 is arranged at one end of the first tube body 211, the end of the first upper needle 213 extending out of the first tube body 211 is serrated, a first spring 214 is arranged between the first upper needle 213 and the first limiting ring 212, and a first lower needle 213 is arranged at the end of the first tube body 211 away from the first upper needle 213. 15. A first guide rod 216 is provided at one end of the first lower needle 215 close to the first upper needle 213. The first guide rod 216 is inserted into the first limiting ring 212. A second spring 217 is sleeved around the first guide rod 216. When the chip 10 is pressed into place by the floating block 410, the bottom of the chip 10 contacts with a serrated end of the first upper needle 213. When the pressing continues, the first spring 214 and the second spring 217 are compressed at the same time. When the first guide rod 216 contacts with the first upper needle 213, the first upper needle 213 contacts with the first lower needle 215, and the stroke is limited and terminated.

[0042] In some implementations, a second tube body 218 is sleeved on the outer side of the first tube body 211, an insulating member 219 is provided between the first tube body 211 and the second tube body 218, a second guide rod 213a is provided at one end of the first upper needle 213 close to the first lower needle 215, and the first spring 214 is sleeved on the second guide rod 213a, thereby also guiding the travel of the first upper needle 213.

[0043] On the basis of the above embodiment, as shown in Figure 8, a second probe 220 is further included between the first probes 210. The height of the second probe 220 is smaller than that of the first probe 210. The second probe 220 includes a third tube body 221. A second upper needle 222 is provided at one end of the third tube body 221. The end of the second upper needle 222 extending out of the third tube body 221 is serrated. The second upper needle 222 is hollow. A second lower needle 223 is provided at one end of the third tube body 221 away from the second upper needle 222. A second limiting ring 224 is provided on the second lower needle 223. The second lower needle 223 is sleeved in the second upper needle 222. When the chip 10 is pressed into place by the floating block 410, the bottom of the chip 10 contacts the serrated end of the first upper needle 213. When the pressing continues, the first spring 214 and the second spring 217 are compressed at the same time, and the bottom of the chip 10 contacts the serrated end of the second upper needle 222.

[0044] On the basis of the above embodiments, Figure 5 and Figure 6As shown, a second contact portion 422b is provided between the first contact portions 422a. The second contact portion 422b is in the shape of an arc convex outward and has a different straight-line distance from the third through hole 424. When the axial rotation angle of the adjusting member 420 is changed, the first contact portion 422a is tangent to the back of the floating block 410 and the bottom of the chip 10 is in contact with the first probe 210 and the second probe 220 at the same time. This is because the distance between the second contact portion 422b and the third through hole 424 is longer than that of the first contact portion 422a. When the pressing is continued, the first probe 210 is compressed at the same time, and the bottom of the chip 10 can be The first contact portion 422a and the second contact portion 422b are in contact with the floating block 410 during the rotation, which is suitable for chips 10 with fewer bottom pins. When the bottom of the chip 10 is expected to contact the first probe 210 and the second probe 220 at the same time, the second contact portion 422b and the floating block 410 are in contact during the rotation, which is suitable for chips 10 with more bottom pins. Therefore, the present application only needs to rotate the knob 430 to meet the testing requirements of multiple chips 10 at the same time.

[0045] The details of the exemplary embodiments described above are not limited to the embodiments described above, and the invention may be implemented in other specific forms without departing from the spirit or essential features of the invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive in all respects, and the scope of the invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the invention.

Claims

1. A fast assembly chip test socket, characterized in that: The invention comprises a base (100), wherein a receiving groove (110) is arranged in the base (100), a probe group (200) is arranged at the bottom of the receiving groove (110), the receiving groove (110) is used to place a chip (10) to be tested, a quick release part (300) is detachably arranged on a side wall of one side of the base (100), an upper pressure cover (400) is arranged on the top of the quick release part (300), and the upper pressure cover (400) and the top of the quick release part (300) form a detachable The upper pressure cover (400) is hinged for unloading, and a floating block (410) is suspended on the upper pressure cover (400). When the upper pressure cover (400) is pressed on the top of the base (100), the floating block (410) is located above the accommodating groove (110). An adjusting member (420) is arranged on the back side of the floating block (410). The adjusting member (420) is in contact with the back of the floating block (410). Knobs (430) capable of changing the axial rotation angle of the adjusting member (420) are arranged on both sides of the adjusting member (420).

2. The rapid assembly chip test socket according to claim 1, characterized in that: The two ends of the quick-release member (300) on the side opposite to the base (100) are respectively provided with an insertion rod (310); a first positioning hole (120) corresponding to the position of the insertion rod (310) is provided on the side wall of the base (100); a second positioning hole (311) is provided on the top of the insertion rod (310) and a latch pin (320) is provided above the second positioning hole (311); and a third positioning hole (130) penetrating through the second positioning hole (311) is provided on the top of the base (100).

3. The rapid assembly chip test socket according to claim 2, characterized in that: A first groove (140) is arranged at the top of the quick-release component (300), and first through holes (141) are respectively arranged on both sides of the first groove (140); a hinge portion (440) is arranged at the bottom of the upper pressure cover (400), and second through holes (441) are arranged on both sides of the hinge portion (440).

4. The rapid assembly chip test socket according to claim 1, characterized in that: The adjusting member (420) is columnar in shape, and includes end faces (421) on both sides and an annular wall (422) between the end faces (421). A connecting rod (423) is provided in the axial direction of the adjusting member (420). The connecting rod (423) passes through the end faces (421) and extends from both sides of the upper pressure cover (400). The knob (430) is sleeved on the connecting rod (423).

5. The rapid assembly chip test socket according to claim 4, characterized in that: A third through hole (424) penetrating the end surface (421) is provided on the end surface (421) of the adjusting member (420); the connecting rod (423) is inserted into the third through hole (424); a limiting groove (425) extends from the third through hole (424) toward the annular wall (422); and a limiting plate (426) protrudes axially from the connecting rod (423).

6. The rapid assembly chip test socket according to claim 4, characterized in that: A plurality of first contact portions (422a) are spaced apart along the annular wall (422) of the adjusting member (420); the first contact portions (422a) are at different linear distances from the third through hole (424); when the axial rotation angle of the adjusting member (420) is changed, the first contact portions (422a) form surface contact with the back of the floating block (410).

7. The rapid assembly chip test socket according to claim 6, characterized in that: The probe group (200) comprises a plurality of first probes (210), wherein the first probe (210) comprises a first tube body (211), wherein a first limiting ring (212) is arranged inside the first tube body (211), wherein the first limiting ring (212) and the first tube body (211) are coaxially sleeved and fixed together, wherein a first upper needle (213) is arranged at one end of the first tube body (211), wherein the end of the first upper needle (213) extending out of the first tube body (211) is serrated, A first spring (214) is arranged between the first upper needle (213) and the first limiting ring (212); a first lower needle (215) is arranged at the end of the first tube (211) away from the first upper needle (213); a first guide rod (216) is arranged at the end of the first lower needle (215) close to the first upper needle (213); the first guide rod (216) is inserted into the first limiting ring (212); and a second spring (217) is sleeved around the first guide rod (216).

8. The rapid assembly chip test socket according to claim 7, characterized in that: A second tube body (218) is sleeved on the outer side of the first tube body (211), an insulating member (219) is provided between the first tube body (211) and the second tube body (218), a second guide rod (213a) is provided at one end of the first upper needle head (213) close to the first lower needle head (215), and the first spring (214) is sleeved on the second guide rod (213a).

9. The rapid assembly chip test socket according to claim 8, characterized in that: A second probe (220) is also included between the first probes (210). The height of the second probe (220) is smaller than that of the first probe (210). The second probe (220) includes a third tube body (221). A second upper needle head (222) is arranged at one end of the third tube body (221). The end of the second upper needle head (222) extending out of the third tube body (221) is serrated. The second upper needle head (222) is hollow. A second lower needle head (223) is arranged at one end of the third tube body (221) away from the second upper needle head (222). A second limiting ring (224) is arranged on the second lower needle head (223). The second lower needle head (223) is sleeved in the second upper needle head (222).

10. The rapid assembly chip test socket according to claim 9, characterized in that: A second contact portion (422b) is provided between the first contact portions (422a), the second contact portion (422b) is in the shape of an arc convex outward, and has a different straight-line distance from the third through hole (424); when the axial rotation angle of the adjusting member (420) is changed, the first contact portion (422a) is tangent to the back of the floating block (410), and the bottom of the chip (10) is in contact with the first probe (210) and the second probe (220) at the same time.

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