Intelligent hardware performance test system and method

Abstract

The invention discloses an intelligent hardware performance testing system and method, and relates to the technical field of hardware performance testing, and the system comprises a hardware equipment data acquisition module, a target reference object selection module, an adjustment parameter analysis module and a hardware performance testing module. Data of circuit boards used in different use environments are acquired through a hardware equipment data acquisition module, different circuit boards are subjected to use environment change degree analysis through a target reference object selection module, and target circuit boards capable of providing test mode reference are screened out according to analysis results. The compression resistance data and the maintenance time data of the target circuit board in the use process are called through the adjustment parameter analysis module, a to-be-referenced adjustment parameter set is established, and the hardware performance test module selects a test mode to carry out compression resistance test on the current circuit board. And the adaptation degree to the use environment when part of the circuit boards are put into use after being qualified through the compression resistance test is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of hardware performance testing, and in particular to an intelligent hardware performance testing system and method. Background Art

[0002] The compression performance test of the circuit board is an important means to evaluate the voltage resistance of the circuit board material and the insulation layer. The existing test method is generally to connect the circuit board to the voltage resistance tester, gradually increase the voltage applied to the circuit board to the maximum withstand voltage, and observe whether the circuit board has any abnormalities in the process. If an abnormality occurs, it is judged that the circuit board's compression performance is unqualified, and the performance of the corresponding circuit board needs to be further improved. However, the existing test method can only test the maximum withstand voltage value of the circuit board, but cannot test whether the circuit board with the corresponding compression performance can adapt to the use environment during subsequent use. In the actual use of the circuit board, the voltage it withstands may not be gradually increased, the voltage value is the same each time, and the corresponding voltage is maintained for an unchanged time. At present, there is a lack of a better compression performance test method to predict whether the circuit board can adapt to the use environment during actual use. The existing test method cannot improve the adaptability of some circuit boards to the use environment when they are put into use after passing the compression performance test. Therefore, it is impossible to make targeted improvements to the performance of unqualified circuit boards to increase the service life of the improved circuit boards in the actual use environment. Summary of the invention

[0003] The purpose of the present invention is to provide an intelligent hardware performance testing system and method to solve the problems raised in the prior art.

[0004] To achieve the above object, the present invention provides the following technical solutions: an intelligent hardware performance testing system, the system includes a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module and a hardware performance testing module;

[0005] Collecting circuit board data used in different usage environments through the hardware device data acquisition module;

[0006] Analyze the degree of change in the use environment of different circuit boards through the target reference object selection module, and select target circuit boards that can provide reference for the test method according to the analysis results;

[0007] The pressure resistance data and the maintenance time data of the target circuit board during use are retrieved by the adjustment parameter analysis module to form an adjustment parameter set to be referenced;

[0008] The hardware performance test module is used to select a test method to perform a compression performance test on the current circuit board.

[0009] Preferably, the hardware device data acquisition module includes a compression resistance data acquisition unit and a maintenance time acquisition unit;

[0010] The compression data collection unit is used to collect historical withstand voltage data of a number of circuit boards used in different use environments in the same time period;

[0011] The maintenance time acquisition unit is used to obtain the time during which the voltage borne by the circuit board remains unchanged.

[0012] Preferably, the target reference object selection module includes a working curve generation unit, a curve matching analysis unit, a change degree analysis unit and a test reference target screening unit;

[0013] The working curve generating unit is used to generate historical working curves of several circuit boards used in different use environments. The historical working curve is a curve showing the change of the voltage value borne by the circuit board over time. One circuit board corresponds to several historical working curves.

[0014] The curve matching analysis unit is used to analyze the matching scores between a plurality of historical working curves corresponding to a random circuit board;

[0015] The variation degree analysis unit is used to set the highest matching score, the second matching score range and the third matching score range, count the number of matching score items in different ranges, and analyze the variation degree of the use environment of a random circuit board based on the statistical results;

[0016] The test reference target screening unit is used to compare the degree of change in the use environment of different circuit boards and screen out target circuit boards that can provide a reference for the test method.

[0017] Preferably, the adjustment parameter analysis module includes a working data retrieving unit and an adjustment parameter set building unit;

[0018] The working data retrieving unit is used to retrieve two historical working curves with the highest matching scores from the historical working curves of the target circuit board, retrieve the compression resistance data and the holding time data used to generate any one of the two historical working curves, and transmit the retrieved data to the adjustment parameter set building unit;

[0019] The adjustment parameter set building unit is used to build an adjustment parameter set to be referenced during the circuit board compression performance test.

[0020] Preferably, the hardware performance test module includes a test equipment preparation unit, a parameter adjustment management unit and a pressure resistance performance test unit;

[0021] The test equipment preparation unit is used to prepare a withstand voltage tester to perform a withstand voltage performance test on the current circuit board;

[0022] The parameter adjustment management unit is used to select a compressive performance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit boards, select the compressive performance test method for the current circuit board: perform a maximum compressive value test and a compressive performance test under a simulated use environment, and when performing the compressive performance test under a simulated use environment, perform parameter adjustment and setting according to the reference adjustment parameter set corresponding to the target circuit board; if the planned use environment of the current circuit board is different from the use environment of all target circuit boards, select the compressive performance test method for the current circuit: only perform a maximum compressive value test;

[0023] The compression resistance performance testing unit is used to test the current circuit board according to the selected test method and obtain the compression resistance performance test result.

[0024] An intelligent hardware performance testing method comprises the following steps:

[0025] S100: Collecting data of circuit boards used in different usage environments;

[0026] S200: Analyze the degree of change in the use environment of different circuit boards, and select target circuit boards that can provide reference for test methods according to the analysis results;

[0027] S300: Retrieving the compression resistance data and the holding time data of the target circuit board during use, and forming a reference adjustment parameter set;

[0028] S400: Select the test method to test the compressive performance of the current circuit board.

[0029] Preferably, in step S100: historical withstand voltage values ​​of m circuit boards used in different usage environments in the [a, b] time period of each day are collected, where a is the initial time for collecting the withstand voltage value data, and b is the end time for collecting the withstand voltage value data, and time data of the different voltages borne by the m circuit boards in the [a, b] time period remaining unchanged is obtained.

[0030] Preferably, in step S200: generate m historical working curves of circuit boards, the historical working curve is a curve showing the change of the voltage value of the circuit board over time, one circuit board corresponds to n historical working curves, the curvature functions of two random curves among the n historical working curves of a random circuit board are obtained as k1(t) and k2(t), respectively, and the matching score Q between the two random historical working curves is calculated according to the following formula i :

[0031]

[0032] The set of matching scores between the historical working curves corresponding to a random circuit board is obtained as Q = {Q1, Q2, ...Q i ,...Q r}, r represents the number of matching score items in the data set Q, the highest matching score is set to N, the second range of matching scores is [N1, N], and the third range of matching scores is [0, N1], where 0 <N1<N, According to statistics, there are U1 matching scores equal to N in the data set Q, U2 matching scores are in the range of [N1,N], and U3 matching scores are in the range of [0,N1]. The analysis shows that the degree of change in the use environment of a random circuit board is W. j , W j =1 / (C1*U1+C2*U2+C3*U3), where C1>C2>C3, C1, C2 and C3 are weights, and the set of the degree of change of the use environment of m circuit boards is W={W1, W2, ...W j , ...W m}, set the use environment change threshold to W ’ , W ’ =∑ m j＝1 (W j ) / m, filter out the changes less than W ’ The circuit board is a target circuit board that can provide a reference for the test method;

[0033] In order to achieve the purpose of selecting the best compressive performance test method for the current circuit board, the historical compressive data of circuit boards that have been used in different usage environments at different times in the same time period are collected through big data technology to generate historical working curves of these circuit boards. The usage environment of the circuit board is analyzed by analyzing the matching between the historical working curves, thereby analyzing the degree of change in the usage environment of the circuit board. The lower the degree of change, the stronger the regularity of the voltage change that the corresponding circuit board bears during use. The pressure bearing data of the target circuit board with a relatively high degree of change in the usage environment is used as the reference adjustment parameter data, which is conducive to selecting simulated environmental compressive testing according to the reference adjustment parameters for some circuit boards to be tested and whose planned usage environment is the same as that of the target circuit board. Considering that the usage environments of the circuit boards to be tested are different and the usage environments of some circuit boards are changeable, it is meaningless to conduct simulated environmental compressive testing. Therefore, only circuit boards with the same usage environment as the target circuit board are selected for simulated environmental compressive testing, which is conducive to improving the test effect of the compressive testing according to the reference adjustment parameters and the accuracy of the test results.

[0034] Preferably, in step S300: a total of x target circuit boards are screened out by counting, two historical working curves with the highest matching scores are retrieved from the historical working curves of a random target circuit board, and the withstand voltage value data used to generate any one of the two historical working curves are retrieved and combined into {V1, V2, ... V f}, the corresponding time data set for the voltage value to remain unchanged is {T1, T2, ...T f}, f represents the number of data items used to generate the corresponding working curve, and a random reference adjustment parameter set for the circuit board compression performance test is {(V1, T1), (V2, T2), ... (V f , T f )}, a total of x reference adjustment parameter sets are established for x target circuit boards.

[0035] Preferably, in step S400: prepare a withstand voltage tester to perform a withstand voltage performance test on the current circuit board, use the withstand voltage tester to apply voltage to the circuit board, set the maximum allowable leakage current value, test whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value when the voltage is applied, and select a withstand voltage performance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit boards, select a withstand voltage performance test method for the current circuit board: perform a maximum withstand voltage value test and a withstand voltage performance test under a simulated use environment, and when performing the withstand voltage performance test under a simulated use environment, press the use environment The reference adjustment parameter set corresponding to the target circuit board in the same environment as the planned use environment of the current circuit board is used to adjust the applied voltage value and the applied voltage maintenance time; when performing the highest withstand voltage value test, the qualified withstand voltage value is set, and the voltage applied to the current circuit board is gradually increased by using the withstand voltage tester until the applied voltage reaches the qualified withstand voltage value, and when the current circuit board is tested in two test methods: whether the actual leakage current of the circuit board during the test exceeds the maximum allowable leakage current value, if it exceeds, the withstand voltage performance test result of the current circuit board is unqualified; otherwise, the test result is qualified, and when the highest withstand voltage value test result and the withstand voltage performance test result under the simulated use environment are both qualified, the withstand voltage performance of the current circuit board is judged to be qualified;

[0036] If the planned use environment of the current circuit board is different from the use environment of all target circuit boards, the compression resistance performance test method selected for the current circuit is: only the highest compression resistance value test is performed, and when the highest compression resistance value test result is qualified, the compression resistance performance of the current circuit board is judged to be qualified;

[0037] Different compressive performance test methods are selected for circuit boards whose planned use environments are the same as or different from the use environments of the target circuit boards, thereby improving the adaptability of some circuit boards to the use environment when they are put into use after passing the compressive performance test.

[0038] Compared with the prior art, the present invention has the following beneficial effects:

[0039] The present invention realizes the purpose of selecting the best compression performance test method for the current circuit board. The present invention collects historical compression data of circuit boards used in different use environments at different times in the same time period through big data technology, generates historical working curves of these circuit boards, analyzes the use environment of the circuit board by analyzing the matching between the historical working curves, and thus analyzes the degree of change of the use environment of the circuit board. The pressure bearing data of the target circuit board with a relatively high degree of change in the use environment is used as the reference adjustment parameter data, which is conducive to selecting the simulated environment compression test according to the reference adjustment parameters for some circuit boards to be tested and whose planned use environment is the same as that of the target circuit board. Considering that the use environment of the circuit board to be tested is different and the use environment of some circuit boards is changeable, it is meaningless to perform the simulated environment compression test. Therefore, only the circuit board with the same use environment as the target circuit board is selected for the simulated environment compression test, which is conducive to improving the test effect of the compression test according to the reference adjustment parameters and the accuracy of the test result; different compression performance test methods are selected for circuit boards with the same and different planned use environments as the use environment of the target circuit board, which improves the adaptability of some circuit boards to the use environment when they are put into use after passing the compression performance test. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 A schematic diagram of the structure of an intelligent hardware performance testing system of the present invention;

[0041] Figure 2 The present invention is a flowchart of an intelligent hardware performance testing method. DETAILED DESCRIPTION

[0042] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0043] Example 1: Figure 1As shown, this embodiment provides an intelligent hardware performance testing system, and the system includes: a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module and a hardware performance testing module; the hardware device data acquisition module is used to collect circuit board data used in different usage environments; the target reference object selection module is used to analyze the degree of change in the usage environment of different circuit boards, and the target circuit boards that can provide reference for the test method are screened out according to the analysis results; the pressure resistance data and maintenance time data of the target circuit board during use are retrieved through the adjustment parameter analysis module, and a reference adjustment parameter set is formed; the hardware performance testing module is used to select a test method to perform a pressure resistance performance test on the current circuit board.

[0044] The hardware device data acquisition module includes a pressure resistance data acquisition unit and a maintenance time acquisition unit; the pressure resistance data acquisition unit is used to collect the historical voltage withstand data of several circuit boards used in different usage environments in the same time period, and the voltage that the circuit board withstands during use can be measured through tools such as a multimeter or oscilloscope; the maintenance time acquisition unit is used to obtain the time for which the voltage on the circuit board remains unchanged.

[0045] The target reference object selection module includes a working curve generation unit, a curve matching analysis unit, a change degree analysis unit and a test reference target screening unit; the working curve generation unit is used to generate historical working curves of several circuit boards used in different usage environments, the historical working curve is a curve showing that the voltage value of the circuit board changes with time, and one circuit board corresponds to several historical working curves; the curve matching analysis unit is used to analyze the matching scores between several historical working curves corresponding to a random circuit board; the change degree analysis unit is used to set the highest matching score, the second range of matching scores and the third range of matching scores, count the number of matching score items within different ranges, and analyze the degree of change of the usage environment of a random circuit board based on the statistical results; the test reference target screening unit is used to compare the degree of change of the usage environment of different circuit boards, and screen out target circuit boards that can provide reference for test methods.

[0046] The adjustment parameter analysis module includes a working data retrieval unit and an adjustment parameter set assembly unit; the working data retrieval unit is used to retrieve the two historical working curves with the highest matching scores from the historical working curves of the target circuit board, retrieve the compressive strength data and maintenance time data used to generate any one of the two historical working curves, and transmit the retrieved data to the adjustment parameter set assembly unit; the adjustment parameter set assembly unit is used to assemble the adjustment parameter set to be referenced when testing the compressive strength performance of the circuit board.

[0047] The hardware performance test module includes a test equipment preparation unit, a parameter adjustment management unit and a pressure resistance test unit; the test equipment preparation unit is used to prepare a withstand voltage tester to perform a pressure resistance test on the current circuit board; the parameter adjustment management unit is used to select a pressure resistance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit board, the pressure resistance test method selected for the current circuit board is: perform the highest pressure resistance value test and the pressure resistance performance test under the simulated use environment. When performing the pressure resistance performance test under the simulated use environment, adjust and set the parameters according to the reference adjustment parameter set corresponding to the target circuit board; if the planned use environment of the current circuit board is different from the use environment of all target circuit boards, the pressure resistance performance test method selected for the current circuit is: only perform the highest pressure resistance value test; the pressure resistance test unit is used to test the current circuit board according to the selected test method and obtain the pressure resistance test result.

[0048] Example 2: Figure 2 As shown, this embodiment provides an intelligent hardware performance testing method, which is implemented based on the test system in the embodiment and specifically includes the following steps:

[0049] S100: Collecting data of circuit boards used in different use environments: Collecting historical withstand voltage values ​​of m circuit boards used in different use environments in the [a, b] time period of each day, where a is the initial time for collecting withstand voltage value data, and b is the end time for collecting withstand voltage value data, and obtaining time data of different voltages that the m circuit boards withstand in the [a, b] time period remain unchanged. For example, if the voltage value of a random circuit board is A at time point a, and the voltage value is changed to B at time point c, then the time that the voltage value A of the corresponding circuit board remains unchanged is ca;

[0050] S200: Analyze the degree of change in the use environment of different circuit boards, and select target circuit boards that can provide reference for the test method according to the analysis results: generate historical working curves of m circuit boards, where the historical working curves are curves showing the change of the voltage value borne by the circuit board over time. One circuit board corresponds to n historical working curves. For example, for a random circuit board, the first historical working curve is generated by the voltage value data borne by the circuit board at different times in the [a, b] time period of the first day, and the nth historical working curve is generated by the voltage value data borne by the circuit board at different times in the [a, b] time period of the nth day. The curvature functions of two random curves among the n historical working curves of a random circuit board are obtained as k1(t) and k2(t), respectively. The matching score Q between the two random historical working curves is calculated according to the following formula i :

[0051]

[0052] The set of matching scores between the historical working curves corresponding to a random circuit board is obtained as Q = {Q1, Q2, ...Q i ,...Q r}, r represents the number of matching score items in the data set Q, the highest matching score is set to N, the second range of matching scores is [N1, N], and the third range of matching scores is [0, N1], where 0 <N1<N, According to statistics, there are U1 matching scores equal to N in the data set Q, U2 matching scores are in the range of [N1,N], and U3 matching scores are in the range of [0,N1]. The analysis shows that the degree of change in the use environment of a random circuit board is W. j , W j =1 / (C1*U1+C2*U2+C3*U3), where * represents the multiplication sign, C1>C2>C3, C1, C2 and C3 are weights, and the set of the degree of change of the use environment of m circuit boards is W={W1, W2, ...W j , ...W m}, set the use environment change threshold to W ’ , W ’ =∑ m j＝1 (W j ) / m, filter out the changes less than W ’ The circuit board is a target circuit board that can provide a reference for the test method;

[0053] For example, the degree of change in the use environment of the five circuit boards is: W1 = 0.30, W2 = 0.34, W3 = 0.22, W4 = 0.10, W5 = 0.52, and the threshold value of the degree of change in the use environment is set to W. ’ , W ’ =∑ m j＝1 (W j ) / m=0.296,W3 <W ’ , W4 <W ’ , the third and fourth circuit boards are used as target circuit boards that can provide reference for the test method;

[0054] S300: Retrieve the compression resistance data and the sustaining time data of the target circuit board during use, and form a reference adjustment parameter set: Count and screen out x target circuit boards in total, retrieve the two historical working curves with the highest matching scores from the historical working curves of a random target circuit board, retrieve the withstand voltage value data used to generate any one of the two historical working curves and combine them into {V1, V2, ... Vf}, the corresponding time data set for the voltage value to remain unchanged is {T1, T2, ...T f}, f represents the number of data items used to generate the corresponding working curve, and a random reference adjustment parameter set for the circuit board compression performance test is {(V1, T1), (V2, T2), ... (V f , T f )}, for x target circuit boards, a total of x reference adjustment parameter sets are established;

[0055] S400: Select a test method to perform a pressure resistance test on the current circuit board: prepare a pressure tester to perform a pressure resistance test on the current circuit board, use the pressure tester to apply voltage to the circuit board, set the maximum allowable leakage current value, test whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value when the voltage is applied, and select a pressure resistance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit boards, select a pressure resistance test method for the current circuit board: perform a maximum pressure resistance value test and a pressure resistance test under a simulated use environment, and when performing a pressure resistance test under a simulated use environment, adjust the applied voltage value and the applied voltage maintenance time according to the reference adjustment parameter set corresponding to the target circuit board whose use environment is the same as the planned use environment of the current circuit board: for example: if the reference adjustment parameter set corresponding to the target circuit board whose use environment is the same as the planned use environment of the current circuit board is {(V1, T1), (V2, T2), ... (V f , T f )}, test the current circuit board according to the corresponding reference adjustment parameter set, apply the initial voltage V1, and maintain it for T1 time, adjust the applied voltage to V2 after T1 time, and maintain it for T2 time, and so on until the applied voltage is adjusted to V f , and maintain T f Duration; when conducting the highest withstand voltage test, set the qualified withstand voltage value, use the withstand voltage tester to gradually increase the voltage applied to the current circuit board until the applied voltage reaches the qualified withstand voltage value, and when testing the current circuit board in two test methods: determine whether the actual leakage current of the circuit board during the test exceeds the maximum allowable leakage current value. If it exceeds, the withstand voltage performance test result of the current circuit board is unqualified; otherwise, the test result is qualified. When the highest withstand voltage test result and the withstand voltage performance test result under the simulated use environment are both qualified, the withstand voltage performance of the current circuit board is determined to be qualified;

[0056] If the planned use environment of the current circuit board is different from the use environment of all target circuit boards, the compressive performance test method selected for the current circuit is: only perform the highest compressive value test, and when the highest compressive value test result is qualified, the compressive performance of the current circuit board is judged to be qualified.

[0057] It will be apparent to those skilled in the art that the invention is not limited to the details of the exemplary embodiments described above and that the invention can be implemented in other specific forms without departing from the spirit or essential features of the invention. Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of the invention is defined by the appended claims rather than the foregoing description, and it is intended that all variations falling within the meaning and scope of the equivalent elements of the claims be included in the invention. Any reference numeral in a claim should not be considered as limiting the claim to which it relates.

Claims

1. An intelligent hardware performance testing system, characterized in that: The system includes a hardware device data acquisition module, a target reference object selection module, an adjustment parameter analysis module and a hardware performance testing module; Collecting circuit board data used in different usage environments through the hardware device data acquisition module; Analyze the degree of change in the use environment of different circuit boards through the target reference object selection module, and select target circuit boards that can provide reference for the test method according to the analysis results; The pressure resistance data and the maintenance time data of the target circuit board during use are retrieved by the adjustment parameter analysis module to form an adjustment parameter set to be referenced; The hardware performance test module is used to select a test method to perform a compression performance test on the current circuit board.

2. The intelligent hardware performance testing system according to claim 1, characterized in that: The hardware device data acquisition module includes a compression resistance data acquisition unit and a maintenance time acquisition unit; The compression data collection unit is used to collect historical withstand voltage data of a number of circuit boards used in different use environments in the same time period; The maintenance time acquisition unit is used to obtain the time during which the voltage borne by the circuit board remains unchanged.

3. An intelligent hardware performance testing system according to claim 2, characterized in that: The target reference object selection module includes a working curve generation unit, a curve matching analysis unit, a change degree analysis unit and a test reference target screening unit; The working curve generating unit is used to generate historical working curves of several circuit boards used in different use environments. The historical working curve is a curve showing the change of the voltage value borne by the circuit board over time. One circuit board corresponds to several historical working curves. The curve matching analysis unit is used to analyze the matching scores between a plurality of historical working curves corresponding to a random circuit board; The change degree analysis unit is used to set the highest matching score, the second matching score range and the third matching score range, count the number of matching score items in different ranges, and analyze the change degree of the use environment of a random circuit board based on the statistical results; The test reference target screening unit is used to compare the degree of change in the use environment of different circuit boards and screen out target circuit boards that can provide a reference for the test method.

4. The intelligent hardware performance testing system according to claim 3, characterized in that: The adjustment parameter analysis module includes a working data retrieving unit and an adjustment parameter set building unit; The working data retrieving unit is used to retrieve two historical working curves with the highest matching scores from the historical working curves of the target circuit board, retrieve the compression resistance data and the holding time data used to generate any one of the two historical working curves, and transmit the retrieved data to the adjustment parameter set building unit; The adjustment parameter set building unit is used to build an adjustment parameter set to be referenced during the circuit board compression performance test.

5. An intelligent hardware performance testing system according to claim 4, characterized in that: The hardware performance test module includes a test equipment preparation unit, a parameter adjustment management unit and a pressure resistance performance test unit; The test equipment preparation unit is used to prepare a withstand voltage tester to perform a withstand voltage performance test on the current circuit board; The parameter adjustment management unit is used to select a compressive performance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit boards, select the compressive performance test method for the current circuit board: perform a maximum compressive value test and a compressive performance test under a simulated use environment, and when performing the compressive performance test under a simulated use environment, perform parameter adjustment and setting according to the reference adjustment parameter set corresponding to the target circuit board; if the planned use environment of the current circuit board is different from the use environment of all target circuit boards, select the compressive performance test method for the current circuit: only perform a maximum compressive value test; The compression resistance performance testing unit is used to test the current circuit board according to the selected test method and obtain the compression resistance performance test result.

6. An intelligent hardware performance testing method, characterized in that: The following steps are involved: S100: Collecting data of circuit boards used in different usage environments; S200: Analyze the degree of change in the use environment of different circuit boards, and select target circuit boards that can provide reference for test methods according to the analysis results; S300: Retrieving the compression resistance data and the holding time data of the target circuit board during use, and forming a reference adjustment parameter set; S400: Select the test method to test the compressive performance of the current circuit board.

7. The intelligent hardware performance testing method according to claim 6, characterized in that: In step S100: collect historical withstand voltage values ​​of m circuit boards used in different usage environments in the [a, b] time period of each day, where a is the initial time for collecting the withstand voltage value data, and b is the end time for collecting the withstand voltage value data, and obtain time data of the different voltages that the m circuit boards withstand in the [a, b] time period remain unchanged.

8. An intelligent hardware performance testing method according to claim 7, characterized in that: In step S200: generate m historical working curves of circuit boards, the historical working curve is a curve showing the change of the voltage value of the circuit board over time, one circuit board corresponds to n historical working curves, the curvature functions of two random curves in the n historical working curves of a random circuit board are obtained, k1(t) and k2(t), respectively, and the matching score Q between the two random historical working curves is calculated according to the following formula i : The set of matching scores between the historical working curves corresponding to a random circuit board is obtained as Q = {Q1, Q2, ...Q i ,...Q r }, r represents the number of matching score items in the data set Q, the highest matching score is set to N, the second range of matching scores is [N1, N], and the third range of matching scores is [0, N1], where 0 <N1<N, According to statistics, there are U1 matching scores equal to N in the data set Q, U2 matching scores are in the range of [N1,N], and U3 matching scores are in the range of [0,N1]. The analysis shows that the degree of change in the use environment of a random circuit board is W. j , W j =1 / (C1*U1+C2*U2+C3*U3), where C1>C2>C3, C1, C2 and C3 are weights, and the set of the degree of change of the use environment of m circuit boards is W={W1, W2, ...W j , ...W m }, set the use environment change threshold to W ’ , W ’ =∑ m j＝1 (W j ) / m, filter out the changes less than W ’ The circuit board is a target circuit board that can provide a reference for the test method.

9. The intelligent hardware performance testing method according to claim 8, characterized in that: In step S300: a total of x target circuit boards are screened out by counting, and two historical working curves with the highest matching scores are retrieved from the historical working curves of a random target circuit board, and the withstand voltage value data used to generate any one of the two historical working curves are retrieved and combined into {V1, V2, ... V f }, the corresponding time data set for the voltage value to remain unchanged is {T1, T2, ...T f }, f represents the number of data items used to generate the corresponding working curve, and a random reference adjustment parameter set for the circuit board compression performance test is {(V1, T1), (V2, T2), ... (V f , T f )}, a total of x reference adjustment parameter sets are established for x target circuit boards.

10. The intelligent hardware performance testing method according to claim 9, characterized in that: In step S400: prepare a withstand voltage tester to perform a withstand voltage performance test on the current circuit board, use the withstand voltage tester to apply voltage to the circuit board, set the maximum allowable leakage current value, test whether the actual leakage current of the circuit board exceeds the maximum allowable leakage current value when the voltage is applied, and select a withstand voltage performance test method for the current circuit board: determine whether the planned use environment of the current circuit board is the same as the use environment of the target circuit board: if the planned use environment of the current circuit board is the same as the use environment of any circuit board in the target circuit boards, select the withstand voltage performance test method for the current circuit board: perform the highest withstand voltage value test and the withstand voltage performance test under the simulated use environment, and when performing the withstand voltage performance test under the simulated use environment, adjust the applied voltage value and the applied voltage maintenance time according to the reference adjustment parameter set corresponding to the target circuit board having the same use environment as the planned use environment of the current circuit board; When performing the highest withstand voltage test, set the qualified withstand voltage value, use the withstand voltage tester to gradually increase the voltage applied to the current circuit board until the applied voltage reaches the qualified withstand voltage value, and when testing the current circuit board in two test methods: determine whether the actual leakage current of the circuit board during the test exceeds the maximum allowable leakage current value. If so, the withstand voltage performance test result of the current circuit board is unqualified; otherwise, the test result is qualified. When the highest withstand voltage test result and the withstand voltage performance test result under the simulated use environment are both qualified, the withstand voltage performance of the current circuit board is determined to be qualified; If the planned use environment of the current circuit board is different from the use environment of all target circuit boards, the compressive performance test method selected for the current circuit is: only perform the highest compressive value test, and when the highest compressive value test result is qualified, the compressive performance of the current circuit board is judged to be qualified.

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