A test method for a synthetic test circuit based on power electronic devices, an electronic device, and a storage medium.

Abstract

This invention discloses a test method, electronic device, and storage medium for a synthetic test circuit based on power electronic devices. The synthetic test circuit includes: a circuit breaker under test and a current source circuit, a voltage source circuit, and a frequency modulation circuit connected to the circuit breaker. The test method includes: applying an equivalent power frequency short-circuit current to the circuit breaker through the current source circuit; predicting the current zero point time based on the equivalent power frequency short-circuit current, and applying an introduced current to the circuit breaker through the voltage source circuit for a preset time before the current zero point time; wherein the slope of the equivalent power frequency short-circuit current and the introduced current are the same at the current zero point; controlling the voltage source circuit to be short-circuited before the introduced current crosses zero, and controlling the connection of the frequency modulation circuit after the introduced current crosses zero to apply a recovery voltage to the circuit breaker, thereby completing the test of the synthetic test circuit.

Description

Technical Field

[0001] This invention relates to the field of power equipment technology, and in particular to a method for testing a synthetic test circuit based on power electronic devices, an electronic device, and a storage medium. Background Technology

[0002] Circuit breakers are the most numerous electrical devices in the power grid, playing a role in control and protection. Once a fault occurs, it will not only directly lead to power grid accidents, but also cause existing accidents to escalate, bringing huge negative impacts to the national economy and social stability.

[0003] The short-circuit current making and breaking tests of circuit breakers, as one of the type tests stipulated by the state, aim to verify whether the circuit breaker meets national standards. By applying the equivalent voltage and current during a short circuit to the circuit breaker under test, the breaking capacity of the circuit breaker is determined, verifying its reliable operation under harsh conditions. However, currently, conducting breaking capacity tests on circuit breakers requires transporting the circuit breaker to a large-capacity testing station, resulting in complex testing procedures, low testing efficiency, and poor economic efficiency. Summary of the Invention

[0004] This invention provides a test method, electronic device and storage medium for synthesized test circuits based on power electronic devices, to solve the technical problems of complicated test and testing processes, low testing efficiency and poor economy in the prior art.

[0005] To address the aforementioned technical problems, embodiments of the present invention provide a method for testing a synthetic test circuit based on power electronic devices. The synthetic test circuit includes: a circuit breaker under test and a current source circuit, a voltage source circuit, and a frequency modulation circuit connected to the circuit breaker; the testing method includes:

[0006] An equivalent power frequency short-circuit current is applied to the circuit breaker through the current source circuit;

[0007] The zero-point time of the current is predicted based on the equivalent power frequency short-circuit current, and an introduced current is applied to the circuit breaker through the voltage source circuit at a preset time before the zero-point time of the current; wherein, the slope of the equivalent power frequency short-circuit current and the introduced current are the same at the zero point of the current.

[0008] The voltage source circuit is controlled to be short-circuited when the introduced current has not crossed zero, and after the introduced current crosses zero, the frequency modulation circuit is controlled to be connected to apply a recovery voltage to the circuit breaker, thereby completing the test of the synthetic test circuit.

[0009] As a preferred embodiment, the current source circuit includes: a current booster and a first anti-parallel thyristor switch;

[0010] The first end of the current booster is connected to the first end of the first anti-parallel thyristor switch, the second end of the first anti-parallel thyristor switch is connected to the first end of the circuit breaker, and the second end of the current booster is connected to the second end of the circuit breaker.

[0011] As a preferred embodiment, the current source circuit includes a first capacitor, a first inductor, and a second anti-parallel thyristor switch;

[0012] The first terminal of the second anti-parallel thyristor switch is connected to the first terminal of the circuit breaker, the second terminal of the second anti-parallel thyristor switch is connected to the first terminal of the first inductor, the second terminal of the first inductor is connected to the first terminal of the first capacitor, and the second terminal of the first capacitor is connected to the second terminal of the circuit breaker.

[0013] As a preferred embodiment, the frequency modulation circuit includes: a frequency modulation capacitor, a frequency modulation resistor, and a frequency modulation inductor;

[0014] The first end of the frequency modulation resistor is connected to the first end of the circuit breaker, the second end of the frequency modulation resistor is connected to the first end of the frequency modulation capacitor, the second end of the frequency modulation capacitor is connected to the second end of the circuit breaker, the first end of the frequency modulation inductor is connected to the second end of the first inductor, the second end of the frequency modulation inductor is connected to the second end of the circuit breaker, and the second end of the circuit breaker is grounded.

[0015] As a preferred embodiment, applying an equivalent power frequency short-circuit current to the circuit breaker through the current source circuit specifically includes:

[0016] The first anti-parallel thyristor switch in the current source circuit is closed, thereby turning on the current source circuit;

[0017] An equivalent power frequency short-circuit current is applied to the circuit breaker through the current booster in the current source circuit.

[0018] As a preferred embodiment, the step of predicting the zero-point time of the current based on the equivalent power frequency short-circuit current, and applying an introduced current to the circuit breaker through the voltage source circuit for a preset time before the zero-point time of the current, specifically includes:

[0019] The equivalent power frequency short-circuit current is collected, and the time of current zero point is predicted based on the collected equivalent power frequency short-circuit current.

[0020] Before the current zero point, a preset time is used to control the second anti-parallel thyristor switch in the voltage source circuit to close, thereby turning on the voltage source circuit;

[0021] Through the first capacitor of the voltage source circuit, before the zero point of the equivalent power frequency short-circuit current of the current source circuit, an introduced current with the same slope as the equivalent power frequency short-circuit current at the zero point is applied to the circuit breaker.

[0022] As a preferred embodiment, the step of predicting the zero-point time of the current based on the collected equivalent power frequency short-circuit current specifically includes:

[0023] Based on the collected equivalent power frequency short-circuit current, calculate the actual current frequency and period of the actual current source circuit output.

[0024] Based on the actual current frequency and period, and combined with the preset characteristic value output by the current source circuit, the target zero point of the equivalent power frequency short-circuit current is determined.

[0025] The time of current zero point is determined based on the target zero point and the actual current frequency and period.

[0026] As a preferred embodiment, the control circuit is short-circuited when the introduced current has not crossed zero, and connected to the frequency modulation circuit after the introduced current crosses zero to apply a recovery voltage to the circuit breaker, specifically including:

[0027] A preset time is elapsed before the introduced current provided by the voltage source circuit crosses zero, and the input signal of the frequency modulation circuit is generated.

[0028] According to the input signal, when the introduced current crosses zero, the first anti-parallel thyristor switch in the current source circuit is disconnected, and the voltage source circuit is controlled to be short-circuited when the introduced current does not cross zero.

[0029] After the introduced current crosses zero, the control is connected to the frequency modulation circuit, and through the frequency modulation capacitor and frequency modulation inductor of the frequency modulation circuit, a transient recovery voltage and a power frequency recovery voltage are jointly provided to the circuit breaker.

[0030] Accordingly, the present invention also provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to implement the synthetic test circuit test method based on power electronic devices as described above.

[0031] Accordingly, the present invention also provides a computer-readable storage medium comprising a stored computer program, wherein, when the computer program is executed, it controls the device on which the computer-readable storage medium is located to perform the synthetic test circuit test method based on power electronic devices as described above.

[0032] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0033] The technical solution of this invention uses the circuit breaker under test and the current source circuit, voltage source circuit, and frequency modulation circuit connected to the circuit breaker to control the connection of the current source circuit, voltage source circuit, and frequency modulation circuit respectively. By taking advantage of the characteristic that large current and large voltage do not appear simultaneously on the circuit breaker during the actual breaking process, two sets of power supplies, the current source circuit and the voltage source circuit, are used to apply current and voltage to the circuit breaker, thereby effectively reducing the power supply capacity requirement. The anti-parallel connection of thyristor switches is used as the circuit switch, which can not only carry the current and voltage flowing through the circuit, but also speeds up the triggering time and reduces the size of the equipment. It avoids the complexity of the test and testing process. At the same time, the circuit breaker can be directly restored to normal operation through the frequency modulation circuit, thereby improving the efficiency of the transition between testing and normal operation, and also improving the economy of circuit breaker testing, reducing the excessive testing costs caused by the inability to operate normally when performing breaking tests on the circuit breaker. Attached Figure Description

[0034] Figure 1 : A structural diagram of the synthetic experimental circuit provided in an embodiment of the present invention;

[0035] Figure 2 : A flowchart of the test method for a synthetic test circuit based on power electronic devices provided in an embodiment of the present invention;

[0036] Figure 3 This is a schematic diagram illustrating the control method of the optically triggered thyristor switch in an embodiment of the present invention.

[0037] Figure 4 : This is a schematic diagram of a light-triggered thyristor switch in an embodiment of the present invention;

[0038] Figure 5 This is a schematic diagram of the control flow of the synthesis test circuit based on power electronic devices in an embodiment of the present invention. Detailed Implementation

[0039] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0040] Example 1

[0041] Please refer to Figure 1This invention provides a method for testing a synthetic test circuit based on power electronic devices. The synthetic test circuit includes: a circuit breaker St to be tested and a current source circuit, a voltage source circuit, and a frequency modulation circuit connected to the circuit breaker St.

[0042] As a preferred embodiment, the current source circuit includes: a current booster M1 and a first anti-parallel thyristor switch S1;

[0043] The first end of the current booster M1 is connected to the first end of the first anti-parallel thyristor switch S1, the second end of the first anti-parallel thyristor switch S1 is connected to the first end of the circuit breaker St, and the second end of the current booster M1 is connected to the second end of the circuit breaker St.

[0044] In this embodiment, the current booster M1 of the current source circuit provides an equivalent power frequency short-circuit current as the power source of the current source circuit. By controlling the first anti-parallel thyristor switch S1, it is used to apply an equivalent power frequency short-circuit current to the circuit breaker under test St after the test begins.

[0045] As a preferred embodiment, the current source circuit includes a first capacitor C2, a first inductor L2, and a second anti-parallel thyristor switch S2;

[0046] The first terminal of the second anti-parallel thyristor switch S2 is connected to the first terminal of the circuit breaker St, the second terminal of the second anti-parallel thyristor switch S2 is connected to the first terminal of the first inductor L2, the second terminal of the first inductor L2 is connected to the first terminal of the first capacitor C2, and the second terminal of the first capacitor C2 is connected to the second terminal of the circuit breaker St.

[0047] In this embodiment, the voltage source circuit uses an oscillation circuit composed of a first capacitor C2 and a first inductor L2. By controlling the second anti-parallel thyristor switch S2, it is used to introduce a high-frequency oscillation current slightly before the predicted zero point of the equivalent power frequency short-circuit current. This makes the slope of the zero point of the introduced current provided by the voltage source circuit consistent with the slope of the zero point of the short-circuit current provided by the current source, thus achieving equivalent switching between the two circuits.

[0048] As a preferred embodiment, the frequency modulation circuit includes: a frequency modulation capacitor C0, a frequency modulation resistor C0, and a frequency modulation inductor L50;

[0049] The first end of the frequency modulation resistor R0 is connected to the first end of the circuit breaker St. The second end of the frequency modulation resistor R0 is connected to the first end of the frequency modulation capacitor C0. The second end of the frequency modulation capacitor C0 is connected to the second end of the circuit breaker St. The first end of the frequency modulation inductor C0 is connected to the second end of the first inductor L50. The second end of the frequency modulation inductor L50 is connected to the second end of the circuit breaker St. The second end of the circuit breaker St is grounded.

[0050] In this embodiment, the frequency modulation circuit includes a frequency modulation capacitor C0, a frequency modulation resistor R0, and a frequency modulation inductor L50. It is short-circuited when the high-frequency input current provided by the voltage source circuit has not crossed zero, and connected after the high-frequency input current crosses zero to provide a recovery voltage to the circuit breaker under test St.

[0051] Implementing the above embodiments has the following effects:

[0052] The technical solution of this invention uses the circuit breaker under test and the current source circuit, voltage source circuit, and frequency modulation circuit connected to the circuit breaker to control the connection of the current source circuit, voltage source circuit, and frequency modulation circuit respectively. By taking advantage of the characteristic that large current and large voltage do not appear simultaneously on the circuit breaker during the actual breaking process, two sets of power supplies, the current source circuit and the voltage source circuit, are used to apply current and voltage to the circuit breaker, thereby effectively reducing the power supply capacity requirement. The anti-parallel connection of thyristor switches is used as the circuit switch, which can not only carry the current and voltage flowing through the circuit, but also speeds up the triggering time and reduces the size of the equipment. It avoids the complexity of the test and testing process. At the same time, the circuit breaker can be directly restored to normal operation through the frequency modulation circuit, thereby improving the efficiency of the transition between testing and normal operation, and also improving the economy of circuit breaker testing, reducing the excessive testing costs caused by the inability to operate normally when performing breaking tests on the circuit breaker.

[0053] Example 2

[0054] Please see Figure 2 This invention provides a method for testing a synthetic test circuit based on power electronic devices, which is based on the circuit implementation in Embodiment 1 and includes the following steps S101-S103:

[0055] Step S101: Apply an equivalent power frequency short-circuit current to the circuit breaker through the current source circuit.

[0056] In this embodiment, during the circuit breaker's breaking process, the current and voltage applied to the circuit breaker do not appear simultaneously. When a large power frequency short-circuit current is applied to the circuit breaker, the voltage on the circuit breaker is low, which is the arc voltage. After the large power frequency short-circuit current crosses zero, a transient recovery voltage and a subsequent power frequency recovery voltage appear on the circuit breaker. Therefore, by utilizing this physical characteristic, two sets of power supply equipment are used to apply an equivalent short-circuit power frequency large current, an equivalent transient recovery voltage, and a power frequency recovery voltage to the circuit breaker under test, respectively.

[0057] It should be noted that, in order to withstand the large current and voltage during the test, the thyristor switches are anti-parallel connected, taking advantage of their fast response speed and high withstand voltage. They are used as circuit switches to turn on and off the current source circuit and the voltage source circuit, respectively, through optical triggering.

[0058] As a preferred embodiment, applying an equivalent power frequency short-circuit current to the circuit breaker through the current source circuit specifically includes:

[0059] The first anti-parallel thyristor switch in the current source circuit is closed, thereby turning on the current source circuit; an equivalent power frequency short-circuit current is applied to the circuit breaker through the current booster in the current source circuit.

[0060] In this embodiment, the capacitor is first charged. After the charging is completed, the thyristor switch S1 of the current source circuit is controlled to turn on the current source circuit and provide power frequency short-circuit current to the circuit breaker under test.

[0061] In this embodiment, the current source circuit provides an equivalent power frequency short-circuit current through a current booster as the power source circuit. By controlling the anti-parallel thyristor switch, after the test starts, the thyristor switch conduction circuit is controlled to apply an equivalent power frequency short-circuit current to the circuit breaker under test.

[0062] Step S102: Predict the zero-point time of the current based on the equivalent power frequency short-circuit current, and apply an introduced current to the circuit breaker through the voltage source circuit before the zero-point time of the current by a preset time; wherein, the slope of the equivalent power frequency short-circuit current and the introduced current are the same at the zero point of the current.

[0063] As a preferred embodiment, the step of predicting the zero-point time of the current based on the equivalent power frequency short-circuit current and applying an introduced current to the circuit breaker through the voltage source circuit for a preset time before the zero-point time of the current specifically includes:

[0064] The equivalent power frequency short-circuit current is collected, and the time of current zeroing is predicted based on the collected equivalent power frequency short-circuit current. Before the time of current zeroing, the second anti-parallel thyristor switch in the voltage source circuit is controlled to close, thereby turning on the voltage source circuit. Through the first capacitor of the voltage source circuit, before the time of zeroing of the equivalent power frequency short-circuit current in the current source circuit, an input current with the same slope as the equivalent power frequency short-circuit current at the time of zeroing is applied to the circuit breaker.

[0065] In this embodiment, based on the predicted zero point of the power frequency current, the thyristor switch S2 of the voltage source circuit is controlled slightly before the zero point to turn on the voltage source circuit. The slope of the introduced current provided by the voltage source circuit at the zero point is consistent with the slope of the zero point of the power frequency short circuit current, so that the power frequency short circuit current and the introduced current flow together through the circuit breaker under test.

[0066] In this embodiment, the voltage source circuit is an oscillating circuit composed of capacitors, inductors, and anti-parallel thyristor switches. Since the high-frequency current introduced by the voltage source circuit acts alone for 200μs-500μs, a high-frequency oscillating current is connected slightly before the predicted zero point of the short-circuit current, based on the selected frequency of the voltage source circuit. The slope of the current at the zero point provided by the voltage source is made consistent with the slope of the current at the zero point provided by the current source, achieving equivalent switching between the two circuits. To ensure that the slopes of the currents at the zero points provided by the two circuits are consistent, that is:

[0067]

[0068] in, This refers to the current component of the current source circuit. Let t1 and t2 represent the current component of the voltage source circuit, respectively, and t1 and t2 correspond to the times when the current in the current source circuit and voltage source circuit are at zero, respectively. For time components.

[0069] The current expression provided by the current source is:

[0070]

[0071] in, The maximum current component of the current source circuit. For periodic coefficients, For time.

[0072] The expression for the current provided by the voltage source is:

[0073]

[0074] in, This represents the maximum current component of the voltage source circuit. For periodic coefficients, The difference is between them.

[0075] Substituting the initial conditions, the current relationship between the two loops is obtained:

[0076]

[0077] The voltage source circuit provides an input current with a frequency between 250Hz and 1000Hz. Observing the voltage source circuit, the frequency modulation circuit is in a short-circuit state before the input current crosses zero. Therefore, a zero-input second-order circuit response analysis is performed on the voltage source circuit to obtain the voltage source circuit capacitance. ,inductance for

[0078]

[0079]

[0080] in, The voltage supplied to the first capacitor. This actually corresponds to the capacitor in the voltage source circuit.

[0081] After the voltage source circuit is connected, the interrupting current source circuit is controlled at the predicted zero point of the power frequency current, so that only the introduced current provided by the voltage source circuit flows through the circuit breaker under test. After the introduced current crosses zero, the frequency modulation circuit starts to work.

[0082] As a preferred embodiment, the step of predicting the zero-point time of the current based on the collected equivalent power frequency short-circuit current specifically includes:

[0083] Based on the collected equivalent power frequency short-circuit current, calculate the actual current frequency and period of the actual current source circuit output; based on the actual current frequency and period, and combined with the preset characteristic value of the current source circuit output, determine the target zero point of the equivalent power frequency short-circuit current; based on the target zero point and the actual current frequency and period, determine the time of current zero point.

[0084] In this embodiment, after the current source circuit is turned on, the zero point of the current signal is predicted by analyzing the acquired current signal. Specifically, before the test begins, the circuit breaker under test is in the closed state, and a current booster is used to power the circuit breaker under test. Apply a power frequency current and acquire the current signal. Calculate the actual current frequency output from the actual current source circuit based on the current signal. With period After the experiment begins, the current source circuit is connected, and the characteristic value of the output current is combined with the period. Calculate the target zero point and finally determine the time of current zero point.

[0085] Step S103: Control the voltage source circuit to be short-circuited when the introduced current has not crossed zero, and control the connection to the frequency modulation circuit after the introduced current crosses zero, apply the recovery voltage to the circuit breaker, thereby completing the test of the synthetic test circuit.

[0086] In a preferred embodiment, the control of the voltage source circuit to be short-circuited when the introduced current has not crossed zero, and the control of connecting the frequency modulation circuit to apply a recovery voltage to the circuit breaker after the introduced current crosses zero, specifically includes:

[0087] A signal for engaging the frequency modulation circuit is generated before the introduced current from the voltage source circuit crosses zero. Based on the signal, the first anti-parallel thyristor switch in the current source circuit is disconnected when the introduced current crosses zero, and the voltage source circuit is short-circuited before the introduced current crosses zero. After the introduced current crosses zero, the frequency modulation circuit is connected, and the transient recovery voltage and the power frequency recovery voltage are provided to the circuit breaker through the frequency modulation capacitor and frequency modulation inductor of the frequency modulation circuit.

[0088] In this embodiment, the current source thyristor switch is controlled at the zero point of the predicted power frequency current to disconnect the current source circuit. After that (including the stage before the current crosses zero), only the voltage source circuit is connected to the circuit breaker under test.

[0089] In this embodiment, the frequency modulation circuit is composed of a frequency modulation capacitor, a frequency modulation resistor, and a frequency modulation inductor. Its function is to short-circuit the high-frequency current provided by the voltage source circuit before it crosses zero, and to connect it after the high-frequency current crosses zero. Subsequently, together with the voltage source capacitor and the voltage source inductor, it provides transient recovery voltage and power frequency recovery voltage to the circuit breaker under test.

[0090] The inherent oscillation frequency of the voltage source circuit after the frequency modulation circuit is connected :

[0091]

[0092] Frequency modulation resistor in frequency modulation circuit Calculation formula:

[0093]

[0094] Formula for calculating the frequency modulation capacitor in a frequency modulation circuit:

[0095]

[0096] in The time it takes for the transient recovery voltage to reach its peak value. is the amplitude coefficient of the circuit breaker under test.

[0097] After the test, the optical signal of the voltage source circuit switch is canceled, causing the thyristor switch to open the voltage source circuit.

[0098] Please see Figure 3 and 4 This diagram illustrates the control method of the optically triggered thyristor switch in this invention. The acquisition card is controlled via a LabVIEW program. After the task starts, the duration of the high-level signal emitted by the acquisition card, the subsequent low-level signal duration, and the initial delay time are set in seconds. After setting, clicking "Start" allows control of the acquisition card. The acquisition card emits a high-level signal to the transistor. Upon receiving the high-level signal, the transistor conducts. Once the transistor is turned on, a laser diode powered by a DC power supply emits an optical signal. This optical signal is transmitted to the thyristor switch, causing the thyristor switch to forward deflect, thus completing the circuit. Canceling the trigger signal allows the thyristor switch to open or close the circuit.

[0099] Please see Figure 5 This is a control flow diagram of a synthetic test circuit based on power electronic devices. After the test begins, an unlocking signal is issued to forward-bias the first anti-parallel thyristor switch, thereby conducting the current source circuit and determining the input voltage circuit's activation time τh. The current signal is then acquired to predict the current zero point, and the time τh before zero is calculated. Subsequently, an unlocking signal is issued to forward-bias the second anti-parallel thyristor switch, conducting the voltage source circuit. At the time τy before zero crossing, a high-voltage circuit activation signal is output. Finally, the current source circuit is disconnected at zero, thus completing the circuit breaker test.

[0100] Implementing the above embodiments has the following effects:

[0101] The technical solution of this invention uses the circuit breaker under test and the current source circuit, voltage source circuit, and frequency modulation circuit connected to the circuit breaker to control the connection of the current source circuit, voltage source circuit, and frequency modulation circuit respectively. By taking advantage of the characteristic that large current and large voltage do not appear simultaneously on the circuit breaker during the actual breaking process, two sets of power supplies, the current source circuit and the voltage source circuit, are used to apply current and voltage to the circuit breaker, thereby effectively reducing the power supply capacity requirement. The anti-parallel connection of thyristor switches is used as the circuit switch, which can not only carry the current and voltage flowing through the circuit, but also speeds up the triggering time and reduces the size of the equipment. It avoids the complexity of the test and testing process. At the same time, the circuit breaker can be directly restored to normal operation through the frequency modulation circuit, thereby improving the efficiency of the transition between testing and normal operation, and also improving the economy of circuit breaker testing, reducing the excessive testing costs caused by the inability to operate normally when performing breaking tests on the circuit breaker.

[0102] Example 3

[0103] Accordingly, the present invention also provides a terminal device, comprising: a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to implement the synthetic test circuit test method based on power electronic devices as described in any of the above embodiments.

[0104] The terminal device in this embodiment includes a processor, a memory, and a computer program and computer instructions stored in the memory and executable on the processor. When the processor executes the computer program, it implements the various steps described in Embodiment 1 above, for example... Figure 2 Steps S101 to S103 are shown.

[0105] For example, the computer program may be divided into one or more modules / units, which are stored in the memory and executed by the processor to complete the present invention. The one or more modules / units may be a series of computer program instruction segments capable of performing a specific function, which describe the execution process of the computer program in the terminal device.

[0106] The terminal device may be a desktop computer, laptop, handheld computer, or cloud server, etc. The terminal device may include, but is not limited to, a processor and memory. Those skilled in the art will understand that the schematic diagram is merely an example of a terminal device and does not constitute a limitation on the terminal device. It may include more or fewer components than illustrated, or combine certain components, or different components. For example, the terminal device may also include input / output devices, network access devices, buses, etc.

[0107] The processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor can be a microprocessor or any conventional processor. The processor is the control center of the terminal device, connecting all parts of the terminal device via various interfaces and lines.

[0108] The memory can be used to store the computer programs and / or modules. The processor implements various functions of the terminal device by running or executing the computer programs and / or modules stored in the memory and by calling data stored in the memory. The memory may mainly include a program storage area and a data storage area. The program storage area may store the operating system, applications required for at least one function, etc.; the data storage area may store data created based on the use of the mobile terminal, etc. In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as hard disk, RAM, plug-in hard disk, smart media card (SMC), secure digital card (SD card), flash card, at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0109] Wherein, if the modules / units integrated in the terminal device are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of the present invention can also be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when the computer program is executed by a processor, it can implement the steps of the various method embodiments described above. Wherein, the computer program includes computer program code, which can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, portable hard drive, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signals, telecommunication signals, and software distribution media, etc. It should be noted that the content contained in the computer-readable medium can be appropriately added or removed according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, the computer-readable medium does not include electrical carrier signals and telecommunication signals.

[0110] Example 4

[0111] Accordingly, the present invention also provides a computer-readable storage medium comprising a stored computer program, wherein, when the computer program is executed, it controls the device on which the computer-readable storage medium is located to perform the synthetic test circuit test method based on power electronic devices as described in any of the above embodiments.

[0112] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above descriptions are merely specific embodiments of the present invention and are not intended to limit the scope of protection of the present invention. In particular, it should be noted that any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention for those skilled in the art.

Claims

1. A method for testing a synthetic test circuit based on power electronic devices, characterized in that, The synthetic test circuit includes: the circuit breaker under test and a current source circuit, a voltage source circuit, and a frequency modulation circuit connected to the circuit breaker; the test method includes: An equivalent power frequency short-circuit current is applied to the circuit breaker through the current source circuit; The zero-point time of the current is predicted based on the equivalent power frequency short-circuit current, and an introduced current is applied to the circuit breaker through the voltage source circuit at a preset time before the zero-point time of the current; wherein, the slope of the equivalent power frequency short-circuit current and the introduced current at the zero point of the current are the same, and the slope of the introduced current at the zero point is consistent with the slope of the power frequency short-circuit current at the zero point. The voltage source circuit is controlled to be short-circuited when the introduced current has not crossed zero, and the frequency modulation circuit is controlled to be connected after the introduced current crosses zero, so as to apply a recovery voltage to the circuit breaker, thereby completing the test of the synthetic test circuit; wherein, the first anti-parallel thyristor switch in the current source circuit is disconnected at the zero point of the equivalent power frequency short-circuit current, and the frequency modulation circuit is in a short-circuited state when the introduced current has not crossed zero; after the introduced current crosses zero, the frequency modulation circuit is controlled to be connected, and the transient recovery voltage and the power frequency recovery voltage are jointly provided to the circuit breaker through the frequency modulation capacitor and the frequency modulation inductor of the frequency modulation circuit.

2. The method for testing a synthetic test circuit based on power electronic devices as described in claim 1, characterized in that, The current source circuit includes: a current booster and a first anti-parallel thyristor switch; The first end of the current booster is connected to the first end of the first anti-parallel thyristor switch, the second end of the first anti-parallel thyristor switch is connected to the first end of the circuit breaker, and the second end of the current booster is connected to the second end of the circuit breaker.

3. The method for testing a synthetic test circuit based on power electronic devices as described in claim 2, characterized in that, The voltage source circuit includes a first capacitor, a first inductor, and a second anti-parallel thyristor switch; The first terminal of the second anti-parallel thyristor switch is connected to the first terminal of the circuit breaker, the second terminal of the second anti-parallel thyristor switch is connected to the first terminal of the first inductor, the second terminal of the first inductor is connected to the first terminal of the first capacitor, and the second terminal of the first capacitor is connected to the second terminal of the circuit breaker.

4. The method for testing a synthetic test circuit based on power electronic devices as described in claim 3, characterized in that, The frequency modulation circuit includes: a frequency modulation capacitor, a frequency modulation resistor, and a frequency modulation inductor; The first end of the frequency modulation resistor is connected to the first end of the circuit breaker, the second end of the frequency modulation resistor is connected to the first end of the frequency modulation capacitor, the second end of the frequency modulation capacitor is connected to the second end of the circuit breaker, the first end of the frequency modulation inductor is connected to the second end of the first inductor, the second end of the frequency modulation inductor is connected to the second end of the circuit breaker, and the second end of the circuit breaker is grounded.

5. The method for testing a synthetic test circuit based on power electronic devices as described in claim 4, characterized in that, The application of an equivalent power frequency short-circuit current to the circuit breaker through the current source circuit specifically includes: The first anti-parallel thyristor switch in the current source circuit is closed, thereby turning on the current source circuit; An equivalent power frequency short-circuit current is applied to the circuit breaker through the current booster in the current source circuit.

6. The method for testing a synthetic test circuit based on power electronic devices as described in claim 5, characterized in that, The step of predicting the zero-point time of the current based on the equivalent power frequency short-circuit current, and applying an introduced current to the circuit breaker through the voltage source circuit for a preset time before the zero-point time of the current, specifically includes: The equivalent power frequency short-circuit current is collected, and the time of current zero point is predicted based on the collected equivalent power frequency short-circuit current. Before the current zero point, a preset time is used to control the second anti-parallel thyristor switch in the voltage source circuit to close, thereby turning on the voltage source circuit; Through the first capacitor of the voltage source circuit, before the zero point of the equivalent power frequency short-circuit current of the current source circuit, an introduced current with the same slope as the equivalent power frequency short-circuit current at the zero point is applied to the circuit breaker.

7. The method for testing a synthetic test circuit based on power electronic devices as described in claim 6, characterized in that, The prediction of the zero-point current time based on the collected equivalent power frequency short-circuit current specifically includes: Based on the collected equivalent power frequency short-circuit current, calculate the actual current frequency and period of the actual current source circuit output. Based on the actual current frequency and period, and combined with the preset characteristic value output by the current source circuit, the target zero point of the equivalent power frequency short-circuit current is determined. The time of current zero point is determined based on the target zero point and the actual current frequency and period.

8. A terminal device, characterized in that, It includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to implement the synthetic test loop test method based on any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored computer program, wherein, when the computer program is executed, it controls the device on which the computer-readable storage medium is located to perform the synthetic test circuit test method based on power electronic devices as described in any one of claims 1 to 7.

Images