Calibration device and calibration method for testing ship pulsating pressure through semiconductor strain gauges

By designing a calibration device for testing the pulsation pressure of a ship by semiconductor strain gauge, and using a pulsation pressure water tank and reference pressure sensor for calibration, the problem that the existing technology cannot effectively calibrate the real ship strain gauge method, and the accurate measurement and calibration of the pulsation pressure of the ship propeller is achieved.

CN119714678APending Publication Date: 2025-03-28THREE GORNAVIGATION AUTHORITY +1
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Patent Information

Application Number
CN202411859542.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-17
Publication Date
2025-03-28

AI Technical Summary

Technical Problem

The prior art cannot effectively calibrate the real ship strain gauge method for testing the pulsation pressure of the ship propeller, resulting in the inability to accurately judge the pulsation pressure amplitude.

Method used

A calibration device for testing the pulsating pressure of a semiconductor strain gauge is designed, including a pulsating pressure water tank, a strain measurement plate, a loading water injection pipe, a water level observation window, a semiconductor strain gauge and a reference pressure sensor. By simulating the change in the pulsating pressure of the ship propeller, the calibration is performed using a semiconductor strain gauge and a reference pressure sensor.

Benefits of technology

Accurate calibration of the pulsating pressure of the ship propeller is achieved, the necessity of punching holes and embedding sensors in the hull structure is avoided, and the surface structure of the hull is protected.

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Abstract

The invention discloses a calibration device for testing ship pulsating pressure by a semiconductor strain gauge, which comprises a pulsating pressure water tank (1), a strain measuring plate (2), a loading water injection pipe (3), a water level observation window (4), a semiconductor strain gauge (5) and a reference pressure sensor (6), and is characterized in that the strain measuring plate (2) and the loading water injection pipe (3) are respectively arranged on the pulsating pressure water tank (1); the water level observation window (4) is arranged on the loading water injection pipe (3), and the semiconductor strain gauge (5) and the reference pressure sensor (6) are respectively arranged on the strain measuring plate (2). According to the calibration device and calibration method for testing the ship pulsating pressure through the semiconductor strain gauges, it can be avoided that a ship body structure above a ship propeller needs to be punched to pre-embed a sensor, and the surface structure of the ship body is damaged, and the calibration device and calibration method can serve as a new method for testing the ship propeller pulsating pressure to be popularized and used.
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Description

Technical Field

[0001] The present invention relates to the field of ship detection, and in particular to a calibration device and a calibration method for testing ship pulsating pressure using a semiconductor strain gauge. Background Art

[0002] The Three Gorges Hydrogen Boat No. 1 is a catamaran transport ship that is mainly powered by hydrogen and supplemented by lithium iron phosphate batteries. It is the first 500kW hydrogen fuel cell powered ship in China. In order to determine the vibration caused by the propeller and explore the amplitude of the pulsating pressure generated by the propeller of the ship, it is necessary to conduct a ship propeller pulsating pressure test. However, the ship has been launched and delivered for operation, and the propeller pulsating pressure test cannot be performed using the conventional punching method. The ship pulsating pressure test method is to stick a semiconductor strain gauge on the stern shipboard to test the ship pulsating pressure. However, the actual ship strain gauge method does not have a calibration device. Based on the above reasons, a new calibration method and calibration device are needed to solve this technical problem. Summary of the invention

[0003] The purpose of the invention is to provide a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge.

[0004] The technical solution adopted by the present invention to achieve the above-mentioned purpose is: a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge, comprising a pulsating pressure water tank (1), a strain measurement plate (2), a loading water injection pipe (3), a water level observation window (4), a semiconductor strain gauge (5) and a reference pressure sensor (6), wherein the strain measurement plate (2) and the loading water injection pipe (3) are respectively mounted on the pulsating pressure water tank (1), the water level observation window (4) is mounted on the loading water injection pipe (3), and the semiconductor strain gauge (5) and the reference pressure sensor (6) are respectively mounted on the strain measurement plate (2).

[0005] The pulsating pressure water tank (1) is a hollow structure formed by welding steel plates.

[0006] The loading water injection pipe (3) is a cylindrical hollow structure and is connected to the hollow structure of the pulsating pressure water tank (1).

[0007] There are eight semiconductor strain gauges (5).

[0008] Support angle irons (7) are respectively installed at the four corners of the pulsating pressure water tank (1).

[0009] The supporting angle iron (7) is provided with a lifting earring.

[0010] Another technical solution adopted by the present invention to achieve the above-mentioned purpose is: a calibration method for a calibration device for testing ship pulsating pressure using a semiconductor strain gauge, wherein a semiconductor strain gauge (5) is selected and installed on a strain measuring plate (2) on a pulsating pressure water tank (1), the semiconductor strain gauge (5) is glued to the ship board along the length of the ship, water injection changes are simulated through a water level observation window (4) on a water injection pipe (3), a wire is connected to a strain acquisition instrument, the computer is powered on, a reading is displayed, and the reading is compared with a calibrated reference pressure sensor (6), and a calibration error is analyzed to complete a test calibration work.

[0011] The present invention provides a calibration device and a calibration method for testing the pulsating pressure of a ship using a semiconductor strain gauge, which can avoid the need to drill holes in the hull structure above the ship propeller to embed sensors and damage the surface structure of the hull. The device and the calibration method can be used as a new method for testing the pulsating pressure of a ship propeller and can be promoted for implementation. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 The present invention is a schematic diagram of the three-dimensional structure of a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge.

[0013] Figure 2 The present invention is a top view of a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge.

[0014] Figure 3 It is a left view of a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge according to the present invention.

[0015] Figure 4 It is a right view of a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge according to the present invention.

[0016] In the figure: 1. Pulsating pressure water tank; 2. Strain measurement plate; 3. Loading water injection pipe; 4. Water level observation window; 5. Semiconductor strain gauge; 6. Reference pressure sensor; 7. Support angle iron. DETAILED DESCRIPTION

[0017] like Figures 1 to 4As shown, a calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge, the calibration device for testing the pulsating pressure of a ship using a semiconductor strain gauge, comprises a pulsating pressure water tank 1, a strain measuring plate 2, a loading water injection pipe 3, a water level observation window 4, a semiconductor strain gauge 5 and a reference pressure sensor 6, the strain measuring plate 2 and the loading water injection pipe 3 are respectively mounted on the pulsating pressure water tank 1, the water level observation window 4 is mounted on the loading water injection pipe 3, the semiconductor strain gauge 5 and the reference pressure sensor 6 are respectively mounted on the strain measuring plate 2, the pulsating pressure water tank 1 is made of a steel plate The hollow structure is a square structure with a side length of 0.7 meters and a cavity in the middle with a height of 0.02 meters for filling water. The four corners of the pulsating pressure water tank 1 are respectively installed with supporting angle irons 7 for placing the device. The supporting angle irons 7 are provided with lifting earrings for convenient transportation and loading and unloading. The loading water injection pipe 3 is a cylindrical hollow structure connected to the hollow structure of the pulsating pressure water tank 1. There are eight semiconductor strain gauges 5. The calibration method of the calibration device for testing the pulsating pressure of a ship by using semiconductor strain gauges is as follows: the semiconductor strain gauge 5 is selected to be installed in the pulsating pressure tank 1. On the strain measuring plate 2 on the pressure water tank 1, the semiconductor strain gauge 5 is glued to the ship board along the length direction of the ship, and the water injection change of the water level observation window 4 on the water injection pipe 3 is used to simulate the change of the ship propeller pulsating pressure. The wire is connected to the strain acquisition instrument, powered on and connected to the computer, the reading is displayed, and compared with the calibrated reference pressure sensor (6), the calibration error is analyzed, and a test calibration work is completed; the calibration device and calibration method of the semiconductor strain gauge for testing the ship pulsating pressure of the present invention selects a semiconductor strain gauge as a test test. It is a sensitive element made by using the piezoresistive effect of semiconductor single crystal silicon. Compared with the resistance strain gauge, the most prominent advantage of the semiconductor strain gauge is its high sensitivity, which is about 50 to 100 times higher, and can provide a solid basis for accurately feedback the pulsating pressure of the propeller. Since the semiconductor strain gauge is a new method for testing the ship pulsating pressure, the data accuracy needs to be reviewed and verified to ensure whether its accuracy meets the requirements, which can avoid the need to drill holes in the hull structure above the ship propeller to embed the sensor and damage the hull surface structure.

Claims

1. A calibration device for testing ship pulsating pressure using a semiconductor strain gauge, characterized in that: The invention comprises a pulsating pressure water tank (1), a strain measurement plate (2), a loading water injection pipe (3), a water level observation window (4), a semiconductor strain gauge (5) and a reference pressure sensor (6), wherein the strain measurement plate (2) and the loading water injection pipe (3) are respectively mounted on the pulsating pressure water tank (1), the water level observation window (4) is mounted on the loading water injection pipe (3), and the semiconductor strain gauge (5) and the reference pressure sensor (6) are respectively mounted on the strain measurement plate (2).

2. A calibration device for testing ship pulsating pressure using a semiconductor strain gauge according to claim 1, characterized in that: The pulsating pressure water tank (1) is a hollow structure formed by welding steel plates.

3. The calibration device for testing ship pulsating pressure using a semiconductor strain gauge according to claim 1, characterized in that: The loading water injection pipe (3) is a cylindrical hollow structure and is connected to the hollow structure of the pulsating pressure water tank (1).

4. The calibration device for testing ship pulsating pressure using a semiconductor strain gauge according to claim 1, characterized in that: There are eight semiconductor strain gauges (5).

5. The calibration device for testing ship pulsating pressure using a semiconductor strain gauge according to claim 2, characterized in that: Support angle irons (7) are respectively installed at the four corners of the pulsating pressure water tank (1).

6. A calibration device for testing ship pulsating pressure using a semiconductor strain gauge according to claim 5, characterized in that: The supporting angle iron (7) is provided with a lifting earring.

7. A calibration method for the calibration device for testing ship pulsating pressure using a semiconductor strain gauge according to claim 1, characterized in that: A semiconductor strain gauge (5) is selected and installed on a strain measuring plate (2) on a pulsating pressure water tank (1). The semiconductor strain gauge (5) is glued to the shipboard along the length of the ship. The water level observation window (4) on the water injection pipe (3) is filled with water to simulate the change of the pulsating pressure of the ship propeller. The wire is connected to the strain acquisition instrument, powered on and connected to a computer, the reading is displayed, and compared with the calibrated reference pressure sensor (6), the calibration error is analyzed, and a test calibration work is completed.