Cable performance testing apparatus, method, and electronic device

Abstract

The application discloses a kind of performance testing device, method and electronic equipment of cable, performance testing method includes: obtaining the reference resistance value of test circuit;When test circuit connects the cable to be measured, according to preset test task, the cable to be measured is tested to obtain test resistance value;According to reference resistance value and test resistance value, the resistance value of cable to be measured in preset test task is calculated.The technical scheme is compared by using reference resistance value and test resistance value, which significantly reduces the influence of test circuit resistance on test results, especially in the performance test of short cable, provides more accurate and reliable electrical characteristic measurement, solves the error problem in traditional cable test method.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of cable testing, and in particular to a cable performance testing device, method and electronic equipment. BACKGROUND

[0002] In cable performance testing, accurately measuring the electrical characteristics (such as continuity resistance and insulation resistance) of the cable is crucial to ensuring the quality and safety of the cable. Traditional cable testing methods mostly use a two-wire method connection, that is, two test wires are directly connected to both ends of the cable for measurement. However, when using the two-wire method, the resistance of the test circuit will inevitably affect the measurement results. Especially in the case of a long test circuit or a short cable, the line resistance has a particularly significant impact on the measurement value.

[0003] In addition, automatic testing devices usually use a relay module to switch different test channels to achieve automated measurement. However, the contact resistance of the relay itself also introduces additional errors. Although the relay usually provides a standard value of contact resistance when it leaves the factory, the contact resistance will gradually change as the number of uses increases, making it difficult to predict and quantify the impact on the measurement results. With changes in environmental conditions, the test circuit resistance and relay contact resistance can change to varying degrees, further exacerbating measurement errors.

[0004] Therefore, the current cable performance testing device faces the inevitable impact of test circuit resistance on measurement results, especially when testing short cables, the error is more significant. How to eliminate or reduce the impact of test circuit resistance on measurement results is still a difficult problem in cable performance testing technology that needs to be solved. SUMMARY

[0005] The embodiments of the present application provide a cable performance testing device, method and electronic equipment to solve the above technical problems.

[0006] The first aspect of the embodiments of the present application provides a cable performance testing method, which is applied to a test device with a test circuit, and includes:

[0007] obtaining a reference resistance value of the test circuit;

[0008] When the test circuit is connected to a cable to be tested, the cable to be tested is tested according to a preset test task to obtain a test resistance value;

[0009] According to the reference resistance value and the test resistance value, the resistance value of the cable to be tested in the preset test task is calculated.

[0010] Optionally, the test circuit comprises a multi-channel switch module and an adapter cable, the adapter cable comprises a plurality of adapter cores, one end of each of the adapter cores is connected to each channel of the multi-channel switch module one by one;

[0011] The reference resistance value of the test circuit is obtained by:

[0012] The other end of each of the adapter cores of the adapter cable is connected in common, and a channel gating instruction corresponding to each pair of the adapter cores is sequentially sent to the multi-channel switch module to obtain the reference resistance value of the line in which each pair of the adapter cores is connected.

[0013] Or, the other end of any two of the adapter cores of the adapter cable is connected through a resistor, a channel gating instruction corresponding to each pair of the adapter cores is sequentially sent to the multi-channel switch module to obtain the resistance value of the line in which each pair of the adapter cores is connected, and the reference resistance value is obtained by subtracting the resistance value between each pair of the adapter cores from the resistance value of the line in which each pair of the adapter cores is connected.

[0014] The channel gating instruction is used to control the channel gating corresponding to each pair of the adapter cores, and the remaining channels are turned off.

[0015] Optionally, the to-be-tested cable comprises a plurality of to-be-tested cores, when the test circuit is connected to the to-be-tested cable, the to-be-tested cores are connected to the adapter cores one by one.

[0016] When the preset test task is a continuity test, the test resistance value of the to-be-tested cable is obtained by testing the to-be-tested cable according to the preset test task, comprising:

[0017] The other end of each of the to-be-tested cores of the to-be-tested cable is connected in common, and a channel gating instruction corresponding to each pair of the to-be-tested cores in the to-be-tested cable is sent to the multi-channel switch module respectively to obtain the first test resistance value of each pair of the to-be-tested cores of the to-be-tested cable.

[0018] Optionally, the resistance value of the to-be-tested cable in the preset test task is calculated according to the reference resistance value and the test resistance value, comprising:

[0019] The continuity resistance value of each pair of the to-be-tested cores in the continuity test is obtained by subtracting the reference resistance value of the line in which each pair of the adapter cores connected to each pair of the to-be-tested cores is connected from the first test resistance value of each pair of the to-be-tested cores.

[0020] Optionally, when the preset test task is an insulation test, the test resistance value of the to-be-tested cable is obtained by testing the to-be-tested cable according to the preset test task, comprising:

[0021] The other end of each of the to-be-tested core wires of the to-be-tested cable is left hanging, and a channel gating instruction corresponding to each pair of the to-be-tested core wires in the to-be-tested cable is sent to the multi-channel switch module respectively to obtain a second test resistance value of each pair of the to-be-tested core wires of the to-be-tested cable.

[0022] Optionally, the calculating the resistance value of the to-be-tested cable in the preset test task according to the reference resistance value and the test resistance value comprises:

[0023] The insulation resistance value of each pair of the to-be-tested core wires in the continuity test is obtained by subtracting the reference resistance value of the line in which each pair of the adapter core wires connected to each pair of the to-be-tested core wires from the second test resistance value of each pair of the to-be-tested core wires.

[0024] The second aspect of the embodiment of the present application provides a performance testing device of a cable, the performance testing device comprises a testing device and a testing circuit, the testing device is connected to the testing circuit, and the testing device is used for:

[0025] obtaining a reference resistance value of the testing circuit, testing a to-be-tested cable according to a preset test task when the testing circuit is connected to the to-be-tested cable to obtain a test resistance value, and calculating a resistance value of the to-be-tested cable in the preset test task according to the reference resistance value and the test resistance value.

[0026] Optionally, the testing circuit comprises a multi-channel switch module and an adapter cable, the adapter cable comprises a plurality of adapter core wires, one end of each of the adapter core wires is connected to a common end of each channel of the multi-channel switch module one by one, and a first switching end, a second switching end and a control end of each channel of the multi-channel switch module are connected to the testing device respectively.

[0027] When the other end of each of the adapter core wires of the adapter cable is connected in common, the testing device sends a channel gating instruction corresponding to each pair of the adapter core wires to the multi-channel switch module in sequence to obtain a reference resistance value of the line in which each pair of the adapter core wires is located.

[0028] Or, when the other end of any two of the adapter core wires of the adapter cable is connected through a resistance, the testing device sends a channel gating instruction corresponding to each pair of the adapter core wires to the multi-channel switch module in sequence to obtain a resistance value of the line in which each pair of the adapter core wires is located, and then subtracts the resistance value of the resistance between each pair of the adapter core wires from the resistance value of the line in which each pair of the adapter core wires is located to obtain the reference resistance value.

[0029] The channel gating instruction is used for controlling the channel gating corresponding to each pair of the adapter core wires, and the remaining channels are turned off.

[0030] Optionally, the multi-channel switch module comprises a first switch module and a second switch module, the first switch module comprises a plurality of first switches, the second switch module comprises a plurality of second switches, one end of the plurality of first switches is connected in common to form a first switching end of the multi-channel switch module, one end of the plurality of second switches is connected in common to form a second switching end of the multi-channel switch module, and the other end of the plurality of first switches and the other end of the plurality of second switches are connected one by one to form a common end of the multi-channel switch module, wherein the number of the first switches is the same as the number of the second switches.

[0031] The third aspect of the embodiment of the present application provides an electronic device, which comprises the performance testing device of the second aspect.

[0032] The technical effect of the embodiment of the present application is that: by using the comparison method of the reference resistance value and the test resistance value, the influence of the test circuit resistance on the test result is significantly reduced, especially in the performance test of the short cable, more accurate and reliable electrical characteristic measurement is provided, the error problem in the traditional cable test method is solved, and the performance test of cables of various types and lengths is suitable, and the measurement result is not affected by the test circuit resistance in the low resistance value test scene such as short cable. BRIEF DESCRIPTION OF DRAWINGS

[0033] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the description of the embodiments of the present application will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0034] Figure 1 is a first structure schematic diagram of a cable performance testing device provided by the first embodiment of the present application;

[0035] Figure 2 is a flow chart of a cable performance testing method provided by the first embodiment of the present application;

[0036] Figure 3 is a second structure schematic diagram of a cable performance testing device provided by the first embodiment of the present application;

[0037] Figure 4 is a third structure schematic diagram of a cable performance testing device provided by the first embodiment of the present application;

[0038] Figure 5 is a first circuit diagram of a test module in a cable performance testing device provided by the first embodiment of the present application;

[0039] Figure 6is the second circuit diagram of the test module in the performance testing device of the cable provided by the embodiment one of the present application;

[0040] Figure 7 is the fourth structural schematic diagram of the performance testing device of the cable provided by the embodiment one of the present application;

[0041] Figure 8 is the fifth structural schematic diagram of the performance testing device of the cable provided by the embodiment one of the present application;

[0042] Figure 9 is the structural schematic diagram of the multi-channel switch module in the performance testing device of the cable provided by the embodiment two of the present application;

[0043] Figure 10 is the circuit diagram of the multi-channel switch module in the performance testing device of the cable provided by the embodiment two of the present application;

[0044] Figure 11 is the third circuit diagram of the test module in the performance testing device of the cable provided by the embodiment two of the present application;

[0045] Figure 12 is the fourth circuit diagram of the test module in the performance testing device of the cable provided by the embodiment two of the present application;

[0046] In the figure: 101, test equipment; 102, test circuit; 121, multi-channel switch module; 122, adapter cable; 123, cable to be tested; 124, test module; 131, first switch module; 132, second switch module; 133, first switch; 134, second switch. DETAILED DESCRIPTION

[0047] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present application.

[0048] It should be understood that the present application can be implemented in different forms and should not be interpreted as being limited to the embodiments presented herein. On the contrary, these embodiments are provided to make the disclosure complete and full, and to fully convey the scope of the present application to those skilled in the art. In the drawings, the sizes and relative sizes of layers and regions may be exaggerated for clarity throughout the same reference numerals represent the same elements.

[0049] It will be understood that when an element or layer is referred to as being "on" or "adjacent" or "connected" or "coupled" to another element or layer, it can be directly on, adjacent, connected or coupled to the other element or layer or one or more intervening elements or layers can be present. In contrast, when an element is referred to as being "directly on," "directly adjacent," "directly connected," or "directly coupled" to another element or layer, there are no intervening elements or layers present. It will be understood that, although the terms first, second, third, etc. can be used herein to describe various elements, components, regions, layers and / or sections, these elements, components, regions, layers and / or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the present application.

[0050] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and / or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0051] For a thorough understanding of the present application, reference should be made to the following detailed description taken in conjunction with the accompanying drawings, in which:

[0052] Embodiment One

[0053] The present embodiment one provides a performance test method of a cable, as shown in Figure 1 and Figure 2 The performance test method is applied to a test device 101 with a test circuit 102, comprising:

[0054] Step S101. Obtain the reference resistance value of the test circuit 102.

[0055] The test device 101 measures and records the resistance value of the test circuit 102 itself as a reference for subsequent calculation of the real resistance of the cable 123 to be tested. Through the test device 101, the resistance of the test circuit 102 (including the resistance of the test lead, the contact resistance of the relay, etc.) is measured without the connection of the cable to be tested, and the measured reference resistance value is stored in the memory or control module of the device. The method of measuring the resistance of the test circuit 102 can be to disconnect the test circuit 102 from the cable to be tested, and to measure the resistance of the test circuit 102 by short-circuiting the output end of the test circuit 102. This step measures the resistance of the test circuit 102 itself, providing a basis for subsequent accurate calculation of the resistance of the cable to be tested.

[0056] Step S20. When the test circuit is connected to the cable to be tested, the cable to be tested is tested according to the preset test task to obtain a test resistance value.

[0057] In this step, after the cable to be tested is connected, the total resistance value is measured through a predetermined test process, including the resistance of the test circuit and the resistance of the cable to be tested. The cable to be tested is connected to the test circuit 102, and according to the preset test task, the test device 101 is started to measure the resistance of the entire circuit to obtain the total resistance value. The preset test task can include tests under different conditions, such as insulation resistance tests or continuity tests, to meet different test requirements. This step supports multiple test modes and can obtain the total resistance value under different test tasks.

[0058] Step S30. Calculate the resistance value of the cable to be tested in the preset test task according to the reference resistance value and the test resistance value.

[0059] In this step, the real resistance R of the cable to be tested in the preset test task is accurately calculated by subtracting the reference resistance value from the test resistance value. 电缆 The formula is: R 电缆 =R 测试 -R 基准 , R 电缆 is the real resistance value of the cable to be tested, R 测试 is the total test resistance value, and R 基准 is the reference resistance value of the test circuit. The real resistance value obtained by calculation is stored in the device or output for analysis. This step reduces the interference of the resistance in the test circuit 102 on the measurement result, improving the test accuracy.

[0060] The technical effect of the embodiment one is that the comparison method of the reference resistance value and the test resistance value is adopted, the influence of the test circuit resistance on the test result is significantly reduced, especially in the performance test of the short cable, more accurate and reliable electrical characteristic measurement is provided, the error problem in the traditional cable test method is solved, the cable performance test of various types and lengths is suitable, and it is ensured that the measurement result is not affected by the relay contact resistance and the wire resistance in the low resistance test scene such as the short cable.

[0061] As the first embodiment of obtaining the reference resistance, as shown in Figure 3 The test circuit 102 includes a multi-channel switch module 121 and an adapter cable 122, and the adapter cable 122 includes a plurality of adapter wires, one end of each adapter wire is connected to each channel of the multi-channel switch module 121 one by one.

[0062] The reference resistance value of the test circuit in step 10 includes:

[0063] The other end of each adapter wire of the adapter cable 122 is connected, and the channel selection instruction corresponding to each pair of adapter wires is sent to the multi-channel switch module 121 in turn, so as to obtain the reference resistance value of the line connected by each pair of adapter wires; wherein the channel selection instruction is used to control the channel selection corresponding to each pair of adapter wires, and the remaining channels are turned off.

[0064] As shown in Figure 4 The other end of each adapter wire of the adapter cable 122 is connected to the test module 124, as shown in Figure 5 The connection is realized through the test module 124. The multi-channel switch module 121 provides a plurality of test channels for switching each pair of adapter wires to realize channel-by-channel measurement. Control two channels to be turned on at a time, so that the adapter wires connected to the two channels form a loop, and the remaining channels remain in the off state to ensure test independence. The multi-channel switch module 121 receives the channel selection instruction sent by the test device 101, activates the specified channel according to the instruction, completes the conduction of the signal in the selected channel, and transmits the measurement signal to the corresponding adapter wire. The multi-channel switch module 121 has the advantages of automatic channel switching, improved test efficiency, avoidance of interference between channels, and accurate measurement data. The adapter cable 122 connects the multi-channel switch module 121 and the test end as a physical path for signal transmission. The adapter cable 122 includes a plurality of adapter wires for multi-channel separation test, one end of each adapter wire is connected to the multi-channel switch module 121, and the other end is connected for reference resistance measurement. In the test process, each pair of wires transmits signals by activating the corresponding channel.

[0065] Wherein, the other end of all the adapter wires in the adapter cable 122 is short-circuited (commonly connected) to form a unified electrical connection point, which can form a loop for the adapter wires. The test device 101 sends a channel gating instruction to the multi-channel switch module 121 in turn, each time gating a channel switch connected by a pair of adapter wires, activating the corresponding channel to form a loop, so that the signal passes through the pair of wires to complete the measurement. During the measurement process, the other channels remain closed to avoid signal interference, enabling individual measurement of each pair of adapter wires and ensuring independent measurement process. By activating the channel of the multi-channel switch module 121, the total resistance value of the current conducting channel is measured, which includes the line resistance of the adapter wire and the contact resistance inside the multi-channel switch module 121. The measured resistance value of each pair of wires is recorded and stored in the control module.

[0066] The technical effect of the embodiment is that the combination of the multi-channel switch module 121 and the adapter cable 122 realizes automatic reference resistance measurement, greatly improves the efficiency, and realizes high-precision measurement of the reference resistance through short-circuiting and sequential double-channel measurement. The test process is highly automated, suitable for large-scale cable performance test tasks, provides accurate reference resistance value, and ensures higher precision and reliability of subsequent cable resistance test.

[0067] As a second embodiment of obtaining the reference resistance, the step S10 of obtaining the reference resistance value of the test circuit includes:

[0068] The other end of any two adapter wires of the adapter cable 122 is connected by resistance, and a channel gating instruction corresponding to each pair of adapter wires is sent to the multi-channel switch module 121 in turn to obtain the resistance value of the line connected by each pair of adapter wires. Then, the resistance value of the line connected by each pair of adapter wires is subtracted by the resistance value between each pair of adapter wires to obtain the reference resistance value. Wherein, the channel gating instruction is used to control the channel gating corresponding to each pair of adapter wires, and the remaining channels are turned off.

[0069] Wherein, as Figure 6As shown, the test module 124 includes a plurality of resistors R, and in the test circuit, any two adapter wires are selected and connected to a known resistor (for example, a standard resistor or an accurate resistor with a known value) at the other end. The test device 101 sends a channel gating instruction to the multi-channel switch module 121 in turn, each time gating a pair of adapter wires, activating the corresponding channel to form a loop, so that the signal passes through the pair of wires to complete the measurement. When each pair of adapter wires is measured, the other channels remain closed to ensure the independence and accuracy of the signal. After the two channels are activated, the test device 101 measures the resistance value of the circuit in which each pair of adapter wires is connected, and subtracts the known standard resistance value to obtain a reference resistance value, which includes the resistance of the adapter wires and the resistance of other parts in the circuit (such as the relay contact resistance, etc.). The measured resistance value of the circuit in which each pair of adapter wires is connected is recorded and stored as a measurement result.

[0070] The technical effect of the embodiment is that by subtracting the known standard resistance value from the resistance value of the circuit in which each pair of adapter wires is connected, the reference resistance value is accurately obtained, and by activating and measuring each channel independently, the influence of channel interference is avoided, and by subtracting the standard resistance, the interference of other factors is eliminated, thereby improving the accuracy and efficiency of the entire cable performance test system.

[0071] As an embodiment of the test task, as Figure 7 As shown, the cable to be tested 123 includes a plurality of test wires, and when the adapter cable 122 is connected to the cable to be tested 123, the test wires are connected to the adapter wires one by one.

[0072] In step S20, when the preset test task is continuity testing, the cable to be tested 123 is tested according to the preset test task to obtain a test resistance value, including:

[0073] The other end of each test wire of the cable to be tested 123 is connected in common, and a channel gating instruction corresponding to each pair of test wires in the cable to be tested 123 is sent to the multi-channel switch module 121 respectively to obtain a first test resistance value of each pair of test wires of the cable to be tested 123.

[0074] Among them, as Figure 8As shown, the to-be-tested cable 123 is connected to the test module 124 to realize short circuit, and the adapter cable 122 is used to connect the multi-channel switch module 121 and the to-be-tested cable 123, so as to ensure that the signal can be transmitted from the multi-channel switch module 121 to the to-be-tested cable 123 through the adapter core wire, and returned to the multi-channel switch module 121 for resistance measurement. Each adapter core wire corresponds to each to-be-tested core wire in the to-be-tested cable 123 one by one, so as to ensure accurate measurement of the signal and the resistance. One end of each adapter core wire is connected to a channel of the multi-channel switch module 121, and the other end is connected to a to-be-tested core wire of the to-be-tested cable 123. Through the connection, the test circuit is connected to the to-be-tested core wire of the to-be-tested cable 123, forming an electrically closed loop. The test device 101 sends a measurement signal through the multi-channel switch module 121, which is transmitted to the corresponding core wire of the to-be-tested cable 123 through the adapter cable 122, and finally the resistance value is read.

[0075] The continuity test is a test method for detecting whether there is a complete electrical connection in a circuit or a cable, and the purpose is to verify whether the signal path is unobstructed, that is, whether there is a low-impedance connection between each core wire in the to-be-tested circuit and the to-be-tested cable 123, and whether there is an open circuit or a high-impedance problem. In the continuity test, a small current (or low voltage) is usually applied to both ends of the circuit or cable by the test device 101, and then the resistance value in the loop is measured. If the resistance value is very low (usually within a few ohms), it indicates that the test object has a good electrical connection and the loop is complete. If the resistance value is very high (usually in the order of thousands of ohms or higher), or the test device 101 cannot detect the signal, it indicates that the test object may have an open circuit or poor contact.

[0076] The process of the continuity test in this embodiment is to short-circuit the other end of each to-be-tested core wire in the to-be-tested cable 123 to form a unified electrical connection point. The resistance of the common connection point should be as small as possible to ensure that the subsequent measurement results are not affected by the common connection resistance. The test device 101 sends a channel selection instruction to the multi-channel switch module 121 in turn, selects a channel corresponding to a pair of to-be-tested core wires in the to-be-tested cable 123 each time, activates the channel and closes the other channels. After selecting a pair of to-be-tested core wires each time, the resistance value of the pair of core wires is measured, and the resistance of each pair of to-be-tested core wires is recorded. The resistance value includes the total resistance between the adapter cable 122, the multi-channel switch module 121 and the core wires of the to-be-tested cable 123.

[0077] In step S30, the resistance value of the to-be-tested cable 123 in the preset test task is calculated according to the reference resistance value and the test resistance value, including:

[0078] The continuous resistance value of each pair of to-be-tested core wires in the continuity test is obtained by subtracting the reference resistance value of the line connected to each pair of adapter core wires connected to each pair of to-be-tested core wires from the first test resistance value of each pair of to-be-tested core wires.

[0079] Wherein, the reference resistance value has been obtained by a separate test adapter wire during system initialization, and the test system subtracts the reference resistance value of the line corresponding to the adapter wire from the first test resistance value of each pair of test wires, the formula is: R 连续 =R 测试 -R 基准 , wherein: R 连续 is the continuous resistance of each pair of test wires,

[0080] R 测试 is the first test resistance value of each pair of test wires, R 基准 is the reference resistance value of the adapter wire corresponding to the test wire. This calculation excludes the influence of non-test wire parts such as adapter wire resistance, multi-channel switch module 121, etc. on the measurement result. After removing the reference resistance value, the continuous resistance value of each pair of test wires is determined. This value reflects the actual electrical performance of the test wire under test conditions, and the test equipment 101 records the continuous resistance value of each pair of test wires as the test result. The continuous resistance value can accurately reflect the electrical connection quality of each pair of test wires, and is an important basis for judging whether the test cable 123 meets the design requirements. If the continuous resistance value is high or infinite, the test equipment 101 can quickly determine whether the pair of wires has a break or poor connection, etc., thereby locating the fault.

[0081] The technical effect of the embodiment is that the continuous resistance value of each pair of test wires in the continuity test can be calculated efficiently and accurately through the above steps. After eliminating the interference of external factors such as adapter wires, the obtained continuous resistance value is more accurate, ensuring the reliability of the test result, which can quickly judge the state of the test wire and realize fault positioning and quality control.

[0082] As another embodiment of the test task, when the preset test task is insulation test, the test cable 123 is tested according to the preset test task to obtain the test resistance value, comprising:

[0083] The other end of each test wire of the test cable 123 is suspended, and a channel gating instruction corresponding to each pair of test wires in the test cable 123 is sent to the multi-channel switch module 121 respectively, so as to obtain the second test resistance value of each pair of test wires of the test cable 123.

[0084] Wherein, the other end of all the to-be-tested core wires of the to-be-tested cable 123 is disconnected from any electrical connection and kept in a suspended state, ensuring that the other end of the to-be-tested core wire is not grounded and does not form a circuit with other to-be-tested core wires, so as to avoid interference with the test results. The test device 101 sends a control signal to the multi-channel switch module 121 to activate each pair of to-be-tested core wire corresponding channel in turn, and select one channel at a time, so that the signal is measured only through this pair of to-be-tested core wire, and other channels remain closed, to ensure the independence of the signal path during the test. The test device 101 applies a voltage (usually a direct current voltage or a low-frequency alternating current voltage) to the to-be-tested core wire and measures the resistance value between the core wires, and records the resistance value between each pair of to-be-tested core wires as the second test resistance value.

[0085] The technical effect of the embodiment is that, by means of the suspended processing and the channel-by-channel selection, the interference of external connection and other core wires on the measurement results is avoided, and the efficiency is improved by means of the automatic channel switching and the test process, which is especially suitable for large-scale cable insulation testing.

[0086] In step S30, the resistance value of the to-be-tested cable 123 in the preset test task is calculated according to the reference resistance value and the test resistance value, including:

[0087] The insulation resistance value of each pair of to-be-tested core wire in the continuity test is obtained by subtracting the reference resistance value of the line connected with each pair of adapter core wire from the second test resistance value of each pair of to-be-tested core wire.

[0088] Wherein, the second test resistance value of each pair of to-be-tested core wire is affected by the test circuit resistance value, which includes the resistance of the adapter cable 122 and the switch module, which are not the test object and will affect the test results. Therefore, it is necessary to subtract the reference resistance value of the line connected with the adapter core wire from the test resistance value of each pair of to-be-tested core wire to exclude the influence of the adapter line on the measurement results. By subtracting the reference resistance value from the second test resistance value, the insulation resistance value of each pair of to-be-tested core wire is obtained, which reflects the insulation performance of the to-be-tested cable 123 under the insulation test condition. The measured insulation resistance value should be consistent with the design standard of the cable. For example, good cable insulation usually requires the insulation resistance value to be in the order of megohm (MΩ), and if it is lower than this value, it indicates that the insulation performance is poor. The calculated insulation resistance value can be stored or displayed for subsequent analysis and quality judgment.

[0089] The technical effect of the embodiment is that, by subtracting the reference resistance of the test circuit, it is ensured that the test value only reflects the insulation performance of the to-be-tested core wire, and the accuracy of the test is improved.

[0090] Embodiment two

[0091] The embodiment two provides a performance test device of a cable, like Figure 1As shown, the cable performance testing device includes a testing device 101 and a testing circuit 102, the testing device 101 is connected to the testing circuit 102, the testing device 101 is used for:

[0092] The reference resistance value of the testing circuit is obtained, the testing resistance value of the to-be-tested cable 123 is obtained when the testing circuit 102 is connected to the to-be-tested cable 123 according to the preset test task, and the resistance value of the to-be-tested cable 123 in the preset test task is calculated according to the reference resistance value and the testing resistance value.

[0093] The testing device 101 is used for controlling the whole testing process and collecting and processing the data of the testing circuit 102. The testing device 101 includes a processing unit for calculating and analyzing the resistance value. The testing circuit 102 is connected to the to-be-tested cable 123, and the resistance of the to-be-tested cable 123 is measured through the testing circuit 102. The testing circuit 102 usually includes a multi-channel switch module 121 and a conversion cable 122 for resistance testing. The testing device 101 controls the testing circuit 102 to obtain the reference resistance value, which is the resistance measurement value of the testing circuit 102 when not connected to the to-be-tested cable 123. The resistance value is usually composed of the internal resistance of the testing circuit 102, the wiring resistance, the switch module resistance, etc. According to the preset test task, the testing device 101 controls the testing circuit to perform different types of tests (for example: continuity test, insulation test, etc.) on the to-be-tested cable 123, so as to obtain the testing resistance value of the to-be-tested cable 123. The testing device 101 calculates the resistance value of the to-be-tested cable 123 in the preset test task by comparing the reference resistance value with the actual testing resistance value.

[0094] The cable performance testing device provided in the second embodiment can eliminate the interference of the testing circuit during the testing of the to-be-tested cable 123 through accurate reference resistance measurement and automatic control, so as to obtain accurate resistance value, adapt to different test tasks, improve the testing efficiency, accuracy and reliability, and meet the actual needs in cable production and quality detection.

[0095] Further, as shown in the figure, Figure 3 The testing circuit includes a multi-channel switch module 121 and a conversion cable 122, the conversion cable 122 includes a plurality of conversion cores, one end of each conversion core is connected to the common end of each channel of the multi-channel switch module 121 one by one, and the first switching end, the second switching end and the control end of each channel of the multi-channel switch module 121 are connected to the testing device 101 respectively;

[0096] When the other ends of the conversion cores of the conversion cable 122 are connected in common, the testing device 101 sends a channel selection instruction corresponding to each pair of conversion cores to the multi-channel switch module 121 in sequence to obtain the reference resistance value of the line connected by each pair of conversion cores;

[0097] Alternatively, when the other ends of any two adapter wires of the adapter cable 122 are connected through a resistor, the test device 101 sends a channel gating instruction corresponding to each pair of adapter wires to the multi-channel switch module 121 in turn to obtain the resistance value of the line on which each pair of adapter wires is connected, and then subtracts the resistance value of the resistor between each pair of adapter wires from the resistance value of the line on which each pair of adapter wires is connected to obtain a reference resistance value; wherein the channel gating instruction is used to control the channel gating corresponding to each pair of adapter wires, and the remaining channels are turned off.

[0098] Further, as shown in Figure 9 The multi-channel switch module 121 includes a first switch module 131 and a second switch module 132. The first switch module 131 includes a plurality of first switches 133, and the second switch module 132 includes a plurality of second switches 134. One end of the plurality of first switches 133 is commonly connected to form a first switching end of the multi-channel switch module 121, and one end of the plurality of second switches 134 is commonly connected to form a second switching end of the multi-channel switch module 121. The other ends of the plurality of first switches 133 and the other ends of the plurality of second switches 134 are connected one by one to form a common end of the multi-channel switch module 121. The number of the first switches 133 is the same as the number of the second switches 134.

[0099] The first switch module 131 includes a plurality of first switches 133, and each first switch 133 is responsible for the selection of signals of one channel. The second switch module 132 includes a plurality of second switches 134, which correspond to the first switch module 131 one by one and work cooperatively. The other ends of the first switches 133 and the other ends of the second switches 134 are connected one by one to form a common end of the multi-channel switch module 121. Each common end is connected to an adapter wire. The number of the first switches 133 is the same as the number of the second switches 134, which ensures that each signal channel has independent first switches 133 and second switches 134 and can be independently controlled and measured. The test device 101 controls the switch states of the first switch module 131 and the second switch module 132 by sending control signals. When a certain first switch 133 and a non-corresponding second switch 134 are turned on at the same time, the signal is transmitted from the first switching end to the second switching end through the common end, forming a closed loop. The remaining switches remain closed to ensure the independence of the current channel. The first switching end and the second switching end are respectively connected to the test device 101 for providing a signal source and receiving a feedback signal. The common end is connected to the adapter wire to transmit the signal to the to-be-tested wire, realizing the test of a specific channel. Only the switch of one channel is activated (the remaining channels are completely closed) during each test, avoiding signal interference between different channels.

[0100] The technical scheme forms a flexible, reliable and efficient multi-channel switch module 121 system through the cooperative design of the first switch module 131 and the second switch module 132, can independently control the signal transmission of each channel, eliminates the interference between channels, and provides high-precision measurement results, and is widely applicable to multi-core cable testing, automatic measurement systems and other scenarios requiring multi-channel signal switching.

[0101] The embodiment of the application is specifically described below by means of a specific circuit structure as shown in the drawings. Figure 10 As shown in the drawings, the multi-channel switch module 121 adopts two relay module groups each containing 25 relays, can measure the performance of a 24-core cable, and the 25th test loop is used to connect the shell of the test port and test the insulation of the cable 123 joint and core wire. The input voltage is loaded across the signal detection ports A and B, and the signal detection ports are used for cable voltage signal detection. The lower computer controls the attraction selection of the 50 relay lines to select the core wire combination. In order to facilitate the testing of the cable connection, a 24-pin cable connector is installed on the device shell. During cable testing, different connection modes are adopted according to different test performances.

[0102] Since the number of cable cores to be tested is not uniform, in order to meet the testing needs of cables with different core numbers, the device adopts an adapter cable 122 to match the connection of different core cables and the test equipment 101. When testing the insulation resistance of the cable, the adapter cable 122 is used to connect the cable to be tested 123 and the test equipment 101; when testing the continuity of the cable, the test module 124 needs to be connected to the other end of the cable to be tested 123. The circuit diagram of the test module 124 is shown in the drawings. Figure 11

[0103] In order to eliminate the influence of the resistance of the test circuit 102 and the contact resistance of the relay, the test device needs to be operated according to the following process:

[0104] Step S1: Connect the test module 124 including the shorting joint to the adapter cable 122, measure the resistance of each pair of core wires of the adapter cable 122, take the 24-core cable as an example, record the resistance of the core wire combination, core wire 1-2, core wire 1-3 to core wire 23-24, and take the value as the reference resistance value of each pair of core wires and the test circuit 102 combination.

[0105] Step S2: Remove the test module 124 and connect the cable to be tested 123. If the test item is continuity, connect as shown in the drawings. Figure 8 If the test item is insulation resistance, connect as shown in the drawings. Figure 7 After the connection of the cable to be tested 123 is completed, test and record the test value at this time. ​

[0106] Step S3: subtract the test value of the corresponding core wire combination in step S1 from the test value of each pair of core wire combination obtained in step S2, and the result is the measured value of the corresponding core wire of the cable 123.

[0107] By using the above-described process, the device is self-calibrated by using the shorting joint and the adapter cable 122 before testing the cable 123 to be tested, which can effectively eliminate the influence of the resistance of the test circuit 102 on the cable performance test and improve the accuracy of the cable performance test. Meanwhile, the process can also be used to determine whether the relay function is normal.

[0108] The test module 124 used for self-calibration in the present application can also be replaced by a special calibration joint with known resistance between core wires, and a schematic diagram of the calibration joint is shown in Figure 12 The resistors R1, R2, …, R24 used in the diagram should be high-precision low-temperature drift sampling resistors. When the special calibration joint is used, the test process is as follows:

[0109] Step S4: connect the calibration joint to the adapter cable 122, and measure the resistance of each pair of core wires of the adapter cable 122. Taking a 24-core cable as an example, the resistances of the following core wire combinations should be recorded: core wire 1-2, core wire 1-3, and core wire 23-24, and the values are used as the reference resistance values of the corresponding core wire pairs and the calibration joint combination.

[0110] Step S5: subtract the resistance value between the pins of the corresponding calibration joint from the resistance value of each pair of core wires and the calibration joint combination, and the result is the reference resistance value of the corresponding core wire combination.

[0111] Step S6: remove the calibration joint and connect the cable 123 to be tested. If the test item is continuity, the connection is made in the manner shown in Figure 8 If the test item is insulation resistance, the connection is made in the manner shown in Figure 9 After the cable 123 to be tested is connected, the test is performed, and the test value at this time is recorded.

[0112] Step S7: subtract the test value of the corresponding core wire combination in step S5 from the test value of each pair of core wire combination measured in step S6, and the result is the measured value of the corresponding core wire of the cable 123 to be tested.

[0113] The above embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can be modified, or some technical features can be replaced by equivalents; and these modifications or replacements do not change the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A method of testing the performance of a cable, characterized by, The performance test method is applied to a test device with a test circuit, the test circuit comprising a multi-channel switch module and an adapter cable, the adapter cable comprising a plurality of adapter cores, one end of each of the adapter cores being connected to each channel of the multi-channel switch module one by one; the multi-channel switch module comprising a first switch module and a second switch module, the first switch module comprising a plurality of first switches, the second switch module comprising a plurality of second switches, one end of the plurality of first switches being connected in common to form a first switching end of the multi-channel switch module, one end of the plurality of second switches being connected in common to form a second switching end of the multi-channel switch module, the other end of the plurality of first switches and the other end of the plurality of second switches being connected one by one to form a common end of the multi-channel switch module, wherein the number of the first switches and the number of the second switches are the same; the first switching end and the second switching end being connected to the test device respectively, and the common end being connected to the adapter core; The performance test method comprises: obtaining a reference resistance value of the test circuit; when the test circuit is connected to a to-be-tested cable, testing the to-be-tested cable according to a preset test task to obtain a test resistance value; calculating a resistance value of the to-be-tested cable in the preset test task according to the reference resistance value and the test resistance value.

2. The performance test method of claim 1, wherein, The obtaining of the reference resistance value of the test circuit comprises: connecting the other end of each of the adapter cores of the adapter cable in common, and sequentially sending a channel gating instruction corresponding to each pair of the adapter cores to the multi-channel switch module to obtain a reference resistance value of a line in which each pair of the adapter cores is located; or, connecting the other end of any two of the adapter cores of the adapter cable through a resistance, sequentially sending a channel gating instruction corresponding to each pair of the adapter cores to the multi-channel switch module to obtain a resistance value of a line in which each pair of the adapter cores is located, and then subtracting a resistance value between each pair of the adapter cores from the resistance value of the line in which each pair of the adapter cores is located to obtain the reference resistance value; wherein the channel gating instruction is used to control the channel gating corresponding to each pair of the adapter cores, and the remaining channels are turned off.

3. The performance test method of claim 2, wherein, The to-be-tested cable comprises a plurality of to-be-tested cores, and when the adapter cable is connected to the to-be-tested cable, the to-be-tested cores are connected to the adapter cores one by one; when the preset test task is a continuity test, the testing of the to-be-tested cable according to the preset test task to obtain a test resistance value comprises: connecting the other end of each of the to-be-tested cores of the to-be-tested cable in common, and respectively sending a channel gating instruction corresponding to each pair of the to-be-tested cores in the to-be-tested cable to the multi-channel switch module to obtain a first test resistance value of each pair of the to-be-tested cores of the to-be-tested cable.

4. The performance test method of claim 3, wherein, The calculation of the resistance value of the to-be-tested cable in the preset test task according to the reference resistance value and the test resistance value comprises: The continuity resistance value of each pair of the to-be-tested core wires in the continuity test is obtained by subtracting the reference resistance value of the circuit in which each pair of the adapter core wires connected to each pair of the to-be-tested core wires is arranged from the first test resistance value of each pair of the to-be-tested core wires.

5. The performance test method of claim 3, wherein, when the preset test task is the insulation test, the testing of the to-be-tested cable according to the preset test task to obtain a test resistance value comprises: The other end of each to-be-tested core wire of the to-be-tested cable is left in the air, and a channel gating instruction corresponding to each pair of to-be-tested core wires in the to-be-tested cable is sent to the multi-channel switch module respectively to obtain a second test resistance value of each pair of to-be-tested core wires of the to-be-tested cable. The resistance value of the to-be-tested cable in the preset test task is calculated according to the reference resistance value and the test resistance value, which comprises:

6. The performance test method of claim 5, wherein, The insulation resistance value of each pair of the to-be-tested core wires in the continuity test is obtained by subtracting the reference resistance value of the circuit in which each pair of the adapter core wires connected to each pair of the to-be-tested core wires is arranged from the second test resistance value of each pair of the to-be-tested core wires. The performance test device comprises a test equipment and a test circuit, the test equipment is connected to the test circuit, the test circuit comprises a multi-channel switch module and an adapter cable, the adapter cable comprises a plurality of adapter core wires, one end of each adapter core wire is connected to each channel of the multi-channel switch module one by one, the multi-channel switch module comprises a first switch module and a second switch module, the first switch module comprises a plurality of first switches, the second switch module comprises a plurality of second switches, one end of the plurality of first switches is commonly connected to form a first switching end of the multi-channel switch module, one end of the plurality of second switches is commonly connected to form a second switching end of the multi-channel switch module, the other end of the plurality of first switches and the other end of the plurality of second switches are connected one by one to form a common end of the multi-channel switch module, wherein the number of the first switches and the number of the second switches are the same, the first switching end and the second switching end are connected to the test equipment respectively, and the common end is connected to the adapter core wires.

7. An apparatus for testing the performance of a cable, characterized by The test equipment is used for: obtaining a reference resistance value of the test circuit, testing a to-be-tested cable according to a preset test task to obtain a test resistance value when the test circuit is connected to the to-be-tested cable, and calculating a resistance value of the to-be-tested cable in the preset test task according to the reference resistance value and the test resistance value. When the other end of each adapter core wire of the adapter cable is commonly connected, the test equipment sends a channel gating instruction corresponding to each pair of the adapter core wires to the multi-channel switch module in sequence to obtain a reference resistance value of the circuit in which each pair of the adapter core wires is arranged.

8. The performance testing apparatus of claim 7, wherein, ​ Or, when the other end of any two of the adapter cores of the adapter cable are connected through resistance, the test device sends a channel gating instruction corresponding to each pair of the adapter cores to the multi-channel switch module in sequence to obtain the resistance value of the line in which each pair of the adapter cores is located, and then subtracts the resistance value between each pair of the adapter cores from the resistance value of the line in which each pair of the adapter cores is located to obtain a reference resistance value. The channel gating instruction is used to control the channel gating corresponding to each pair of the adapter cores, and the rest of the channels are turned off.

9. An electronic device, comprising: The electronic device comprises the performance testing device according to any one of claims 7 to 8.

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