Power supply state monitoring method suitable for microcomputer host

Abstract

The invention discloses a power supply state monitoring method suitable for a microcomputer host, and relates to the technical field of power supply monitoring. The method comprises the following steps: acquiring a first power supply temperature sequence at a to-be-analyzed moment; comparing the power supply temperature at each moment in the first power supply temperature sequence with a theoretical temperature range, and determining an abnormal frequency of an abnormal power supply temperature in the first power supply temperature sequence; under the condition that the abnormal frequency is smaller than a preset frequency threshold value, determining a first power supply normal probability according to each abnormal power supply temperature in the first power supply temperature sequence; under the condition that the abnormal frequency is not smaller than a preset frequency threshold value, determining a first power supply normal probability according to each abnormal power supply temperature in the first power supply temperature sequence and the environment temperature of the power supply; and comparing the first power supply normal probability with a preset probability threshold, and determining the power supply operation state of the power supply. According to the power supply state monitoring method suitable for the microcomputer host, the accuracy of power supply state monitoring can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of power supply monitoring, and in particular to a power supply status monitoring method suitable for a microcomputer host. Background Art

[0002] The microcomputer host is the core component of the microcomputer system. This type of computer host adopts a compact appearance design, which can greatly save space and is suitable for various office environments, so it has a wide range of application scenarios in enterprises and homes. The power supply is an important component to ensure the normal operation of the microcomputer host. By monitoring the power supply status, the energy consumption problem of the microcomputer host can be discovered and corrected in time.

[0003] In the existing method, the temperature of the microcomputer host is monitored. When the temperature of the microcomputer host exceeds a theoretical temperature range, the operation state of the power supply is abnormal.

[0004] However, this method simply compares the temperature of the microcomputer host with the normal temperature range, and does not take into account the normal fluctuation of the power supply temperature, resulting in low accuracy of power supply status monitoring. Summary of the invention

[0005] The embodiment of the present invention provides a power status monitoring method applicable to a microcomputer host, which can improve the accuracy of power status monitoring.

[0006] According to a first aspect of an embodiment of the present invention, there is provided a power status monitoring method applicable to a microcomputer host, comprising: Acquire a first power supply temperature sequence at a time to be analyzed, wherein the first power supply temperature sequence includes the power supply temperature at the time to be analyzed and at each time within a preset time period before the time to be analyzed; Compare the power supply temperature at each moment in the first power supply temperature sequence with the theoretical temperature range, and determine the abnormal frequency of the abnormal power supply temperature in the first power supply temperature sequence, wherein the abnormal power supply temperature is the power supply temperature that is not within the theoretical temperature range; When the abnormal frequency is less than a preset frequency threshold, determining the probability that the first power supply is normal according to each abnormal power supply temperature in the first power supply temperature sequence; When the abnormal frequency is not less than a preset frequency threshold, determining the probability that the first power supply is normal according to each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply; The first power supply normal probability is compared with a preset probability threshold to determine the power supply operation state of the power supply.

[0007] In the power state monitoring method for a microcomputer host provided by an embodiment of the present invention, a first power temperature sequence at a time to be analyzed is obtained, and then the power temperature at each time in the first power temperature sequence is compared with the theoretical temperature range to determine the abnormal frequency of the abnormal power temperature in the first power temperature sequence. By comparing the power temperature at each time in the preset time period before the time to be analyzed and the theoretical temperature range, respectively, the accidental normal fluctuation of temperature can be eliminated. Then, according to whether the abnormal frequency is greater than the preset frequency threshold, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power temperature sequence; when the abnormal frequency is not less than the preset frequency threshold, the influence of the ambient temperature on the power supply temperature is further considered, and the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power temperature sequence and the ambient temperature of the power supply. Finally, the normal probability of the first power supply is compared with the preset probability threshold to determine the power supply operation state of the power supply. In this way, the phenomenon of normal fluctuation of the temperature of the power supply under various circumstances is comprehensively considered, so as to improve the accuracy of power state monitoring. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0009] Figure 1 A schematic flow chart of a first power status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention; Figure 2 A schematic flow chart of a second power status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention; Figure 3 A schematic flow chart of a third power status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention; Figure 4 A flowchart of a fourth power status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0010] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the power status monitoring method for a microcomputer host proposed by the present invention, its specific implementation method, structure, features and effects in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0011] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0012] It should be noted that the acquisition, storage, use, and processing of data in the technical solution of the present invention are in compliance with the relevant provisions of laws and regulations.

[0013] It should be noted that in the embodiments of the present invention, certain software, components, models and other existing solutions in the industry may be mentioned, which should be regarded as exemplary. Their purpose is only to illustrate the feasibility of implementing the technical solution of the present invention, but it does not mean that the applicant has or will necessarily use the solution.

[0014] The microcomputer host is the core component of the microcomputer system. This type of computer host adopts a compact appearance design, which can greatly save space and is suitable for various office environments, so it has a wide range of application scenarios in enterprises and homes. The power supply is an important component to ensure the normal operation of the microcomputer host. By monitoring the power supply status, the energy consumption problem of the microcomputer host can be discovered and corrected in time.

[0015] In the existing method, the temperature of the microcomputer host is monitored. When the temperature of the microcomputer host exceeds the theoretical temperature range, the power supply operation state is abnormal. However, this method only simply compares the temperature of the microcomputer host with the normal temperature range, and does not take into account the normal fluctuation of the power supply temperature, resulting in low accuracy of power supply status monitoring.

[0016] The object of the present invention is to provide a power supply status monitoring method applicable to a microcomputer host. In the power supply status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention, a first power supply temperature sequence at a time to be analyzed is obtained, and then the power supply temperature at each time in the first power supply temperature sequence is compared with the theoretical temperature range to determine the abnormal frequency of the abnormal power supply temperature in the first power supply temperature sequence. By comparing the power supply temperature at each time in the preset time period before the time to be analyzed and the theoretical temperature range respectively, the accidental normal fluctuation of temperature can be eliminated. Then, according to whether the abnormal frequency is greater than the preset frequency threshold, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power supply temperature sequence; when the abnormal frequency is not less than the preset frequency threshold, the influence of the ambient temperature on the power supply temperature is further considered, and the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply. Finally, the normal probability of the first power supply is compared with the preset probability threshold to determine the power supply operation state of the power supply. In this way, the phenomenon of normal fluctuation of the temperature of the power supply under various circumstances is comprehensively considered, so as to improve the accuracy of the power supply status monitoring.

[0017] The following describes a specific embodiment of a power status monitoring method applicable to a microcomputer host provided by an embodiment of the present invention.

[0018] Figure 1 A flow chart of a power status monitoring method applicable to a microcomputer host is provided. The power status monitoring method applicable to the microcomputer host can be applied to a server. The power status monitoring method applicable to the microcomputer host can include the following S101 to S105.

[0019] S101, obtaining a first power supply temperature sequence at a time to be analyzed, wherein the first power supply temperature sequence includes the power supply temperature at the time to be analyzed and at each time within a preset time period before the time to be analyzed.

[0020] In this embodiment, the first power supply temperature sequence includes multiple power supply temperatures, specifically the power supply temperature at the time to be analyzed and the power supply temperature at each time within a preset time period before the time to be analyzed. For example, the preset time period can be 5 minutes, and the first power supply temperature sequence includes the power supply temperature at the time to be analyzed and the power supply temperature at each time within 5 minutes before the time to be analyzed.

[0021] As an example, the server obtains the power supply temperature at each moment from the power supply temperature sensor, wherein the temperature sensor can record the power supply temperature in real time. Then, the power supply temperature at the moment to be analyzed and the power supply temperature at each moment within 5 minutes before the moment to be analyzed are stored in the form of a time series to form a first power supply temperature sequence.

[0022] S102, comparing the power supply temperature at each moment in the first power supply temperature sequence with the theoretical temperature range, and determining the abnormal frequency of abnormal power supply temperature in the first power supply temperature sequence, wherein the abnormal power supply temperature is a power supply temperature that is not within the theoretical temperature range.

[0023] In this embodiment, the theoretical temperature range is a preset temperature range, which can be determined according to relevant parameters such as the specification, model, type, etc. of the power supply. For example, the theoretical temperature range can be 40 to 60 degrees.

[0024] The abnormal power supply temperature is a power supply temperature that is not within the theoretical temperature range. Specifically, the abnormal power supply temperature may be a power supply temperature that is higher than the theoretical temperature range, or may be a power supply temperature that is lower than the theoretical temperature range.

[0025] As an example, the server traverses the first power supply temperature sequence and compares the power supply temperature at each moment with the theoretical temperature range. If the power supply temperature at a certain moment is not within the theoretical temperature range, it is marked as an abnormal power supply temperature.

[0026] Then, the number of abnormal power supply temperatures that occur is counted, and the number of abnormalities is divided by the total number of power supply temperatures in the first power supply temperature sequence to obtain the abnormal frequency.

[0027] S103: When the abnormal frequency is less than a preset frequency threshold, determine the first power supply normal probability according to each abnormal power supply temperature in the first power supply temperature sequence.

[0028] In this embodiment, when the abnormal frequency is less than the preset frequency threshold, it indicates that the number of abnormal power supply temperatures is small. At this time, if the abnormal power supply temperature is close to the normal power supply temperature, the abnormal power supply temperature at this time is the temperature fluctuation caused by normal heat dissipation of the power supply.

[0029] As an example, when the abnormal frequency is less than a preset frequency threshold, the server uses a statistical method or a machine learning model to determine the probability that the first power supply is normal based on the degree of deviation of the abnormal power supply temperature from the theoretical temperature range.

[0030] S104: When the abnormal frequency is not less than a preset frequency threshold, determine the normal probability of the first power supply according to each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply.

[0031] In this embodiment, when the abnormal frequency is not less than the preset frequency threshold, it indicates that the number of abnormal power supply temperatures is large, and the actual working state of the power supply cannot be accurately reflected at this time. Since the heat dissipation system is also affected by the difference in the external ambient temperature, it is possible that the number of normal temperatures monitored during this period is small or there is no normal temperature, which leads to an erroneous judgment of the power supply operation state. Therefore, for such a situation, it is necessary to combine the stability of the abnormal power supply temperature and the ambient temperature of the power supply to determine whether the temperature abnormality at this time is caused by normal environmental factors.

[0032] As an example, when the abnormal frequency is not less than a preset frequency threshold, the server combines the abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply, and uses multivariate regression analysis, machine learning algorithms and other comprehensive evaluations to obtain the probability that the first power supply is normal.

[0033] S105: Compare the first power supply normal probability with a preset probability threshold to determine the power supply operation state of the power supply.

[0034] In this embodiment, the server compares the calculated first power supply normal probability with a preset probability threshold. If the first power supply normal probability is higher than the preset probability threshold, the power supply is considered to be in a normal operating state; if the first power supply normal probability is lower than the preset threshold, the power supply is considered to be in an abnormal operating state and further inspection or maintenance is required.

[0035] In the power state monitoring method for a microcomputer host provided in this embodiment, a first power temperature sequence at a time to be analyzed is obtained, and then the power temperature at each time in the first power temperature sequence is compared with the theoretical temperature range to determine the abnormal frequency of the abnormal power temperature in the first power temperature sequence. By comparing the power temperature at each time in the preset time period before the time to be analyzed and the theoretical temperature range, respectively, the accidental normal fluctuation of temperature can be eliminated. Then, according to whether the abnormal frequency is greater than the preset frequency threshold, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power temperature sequence; when the abnormal frequency is not less than the preset frequency threshold, the influence of the ambient temperature on the power supply temperature is further considered, and the normal probability of the first power supply is determined according to each abnormal power supply temperature in the first power temperature sequence and the ambient temperature of the power supply. Finally, the normal probability of the first power supply is compared with the preset probability threshold to determine the power supply operation state of the power supply. In this way, the phenomenon of normal fluctuation of the power supply temperature under various circumstances is comprehensively considered, so as to improve the accuracy of power state monitoring.

[0036] As an optional embodiment, S103 may specifically include: When the abnormal frequency is less than the preset frequency threshold, average values ​​of each abnormal power supply temperature in the first power supply temperature sequence and each normal power supply temperature except the abnormal power supply temperature are calculated to obtain an average value of the abnormal power supply temperature and an average value of the normal power supply temperature; Calculating the mean of the abnormal evaluation values ​​of the abnormal power supply temperatures in the first power supply temperature sequence to obtain the abnormal evaluation mean, where the abnormal evaluation value is a value where the abnormal power supply temperature is higher or lower than a theoretical temperature range; The probability that the first power supply is normal is determined by using the abnormal power supply temperature mean, the normal power supply temperature mean, and the abnormal evaluation mean.

[0037] In this embodiment, the abnormal evaluation value is used to characterize the value of the abnormal power supply temperature being higher or lower than the theoretical temperature range. For example, assuming that the theoretical temperature range is 40 to 60 degrees. If the abnormal power supply temperature is 80 degrees, its abnormal evaluation value is 20; if the abnormal power supply temperature is 20 degrees, its abnormal evaluation value is also 20.

[0038] As an example, when the abnormal frequency is less than the preset frequency threshold, the probability that the first power supply is normal can be determined by the following formula 1: Formula 1 In formula 1, a is used to represent the probability that the first power supply is normal. Used to characterize the mean of abnormal evaluation, Used to characterize the average normal power supply temperature. Used to characterize the average value of abnormal power supply temperature, Used to characterize the positive correlation normalization function.

[0039] in, The smaller it is, the closer the abnormal power supply temperature is to the normal power supply temperature, and the greater the probability that the first power supply is normal; The smaller it is, the higher the similarity between the abnormal power supply temperature and the normal power supply temperature is, and the greater the probability that the first power supply is normal. It should be noted that in order to ensure that the calculation results are meaningful, when performing fractional operations in the embodiment of the present invention, when the denominator is 0, a parameter adjustment factor greater than 0 needs to be added to the denominator to prevent the denominator from being 0. The value of the parameter adjustment factor is set by the implementer according to the actual situation, and this application does not impose any special restrictions.

[0040] Through this embodiment, when the abnormal frequency is less than the preset frequency threshold, the normal probability of the first power supply is accurately evaluated according to each abnormal power supply temperature in the first power supply temperature sequence. Thus, the power supply operation state of the power supply can be accurately determined when the abnormal frequency is less than the preset frequency threshold, thereby improving the accuracy of power supply state monitoring.

[0041] As an optional embodiment, S104 may specifically include: When the abnormal frequency is not less than the preset frequency threshold, obtain the first temperature increase mean value of the first power supply temperature sequence and the temperature mean value of the target temperature set, wherein the first temperature increase mean value is the average value of the temperature increase at each adjacent moment in the first power supply temperature sequence, and the target temperature set is a set consisting of each abnormal power supply temperature greater than the theoretical temperature range; Determine the stability of the power supply by using the first temperature increment mean, the temperature mean of the target temperature set, and the ambient temperature of the power supply; A first power supply normal probability is determined according to the stability of the power supply, the temperature standard deviation of the target temperature set, and the abnormal frequency.

[0042] In this embodiment, the first temperature increase average value is the average value of the temperature increase at each adjacent moment in the first power supply temperature sequence. For example, assuming that the first power supply temperature sequence is {A1, A2, A3, A4}, the first temperature increase average value is the average value of the temperature increase of A2 compared to A1, the temperature increase of A3 compared to A2, and the temperature increase of A4 compared to A3.

[0043] As an example, the stability of the power supply can be specifically determined by the following formula 2: Formula 2 In formula 2, b is used to characterize the stability of the power supply. A first temperature increase mean value for characterizing a first power supply temperature sequence, The temperature mean used to characterize the target temperature set, Used to characterize the ambient temperature, Used to represent the maximum value, Used to characterize the positive correlation normalization function.

[0044] in, It reflects the power supply temperature change trend characteristics of the first power supply temperature sequence. The larger the value is, the more obvious the upward trend of the power supply temperature in the first power supply temperature sequence is, and the lower the stability of the power supply is. The larger it is, the less similar it is to the ambient temperature, and the less stable the power supply is.

[0045] When the abnormal frequency is not less than the preset frequency threshold, the normal probability of the first power supply can be determined by the following formula 3: Formula 3 In formula 3, a is used to represent the probability that the first power supply is normal, and p is used to represent the abnormal frequency. The temperature standard deviation used to characterize the target temperature set, Used to characterize the stability of power supply, Used to characterize the positive correlation normalization function.

[0046] in, It reflects the proportion of normal power supply temperature. The greater the proportion of normal power supply temperature, the greater the probability that the first power supply is normal. It reflects the fluctuation of abnormal power supply temperature that is greater than the theoretical temperature range. The greater the fluctuation, the smaller the probability that the first power supply is normal; the greater the stability of the power supply, the greater the probability that the first power supply is normal.

[0047] Through this embodiment, when the abnormal frequency is not less than the preset frequency threshold, the normal probability of the first power supply is accurately evaluated according to each abnormal power supply temperature in the first power supply temperature sequence and the ambient temperature of the power supply. Thus, the power supply operation state of the power supply can be accurately determined when the abnormal frequency is not less than the preset frequency threshold, thereby improving the accuracy of power supply state monitoring.

[0048] As an optional embodiment, Figure 2 As shown, S105 may specifically include the following S201 to S203.

[0049] S201, when the probability that the first power supply is normal is less than a preset probability threshold, performing a heat dissipation enhancement operation on the heat dissipation system of the microcomputer host to obtain a second power supply temperature sequence in a response time period, where the response time period is a time period for performing the heat dissipation enhancement operation; S202, determining a feedback adjustment result of the power supply temperature based on the second power supply temperature sequence; S203: Determine the power supply operation state of the power supply based on the feedback adjustment result of the power supply temperature.

[0050] In this embodiment, the second power supply temperature sequence includes a plurality of power supply temperatures, specifically, the power supply temperatures at various moments in a response time period, and the response time period is a time period for performing the heat dissipation enhancement operation.

[0051] The feedback adjustment result is used to measure whether the power supply temperature reaches a balanced state after the heat dissipation enhancement operation is performed. The larger the feedback adjustment result, the more likely the power supply temperature reaches a balanced state after the heat dissipation enhancement operation is performed; the smaller the feedback adjustment result, the less likely the power supply temperature reaches a balanced state after the heat dissipation enhancement operation is performed.

[0052] As an example, when the probability of the first power supply being normal is less than the preset probability threshold, the server sends a power supply temperature abnormality signal to the microcomputer motherboard. After receiving the power supply temperature abnormality signal, the microcomputer motherboard will increase the duty cycle of the PWM signal, so that the cooling system obtains a higher power supply voltage, increases the working power of the cooling system, increases the cooling capacity of the cooling system, and reduces the temperature of the power supply. The timing starts from the sending of the power supply temperature abnormality signal, and the response time period is set to one minute. During this time period, the server will obtain the power supply temperature in real time to form a second power supply temperature sequence.

[0053] Then, the server compares and analyzes the first power supply temperature sequence and the second power supply temperature sequence to obtain a feedback adjustment result of the power supply temperature.

[0054] Finally, the current operating state of the power supply is determined based on the feedback adjustment result of the power supply temperature after the heat dissipation enhancement operation and the preset safety threshold. If the feedback adjustment result is stable within the preset safety threshold after the heat dissipation enhancement operation, the power supply is considered to be in a normal operating state; if the feedback adjustment result is not within the preset safety threshold after the heat dissipation enhancement operation, the power supply may be faulty and needs to be shut down for inspection or maintenance immediately.

[0055] Through this embodiment, when the probability of the first power supply being normal is less than the preset probability threshold, the heat dissipation enhancement operation is performed on the heat dissipation system of the microcomputer host to obtain a second power supply temperature sequence in the response time period. Thus, the power supply operation state of the power supply is determined according to the second power supply temperature sequence. In this way, by further analyzing the change in the power supply temperature after the heat dissipation enhancement operation is performed on the heat dissipation system of the microcomputer host, the power supply operation state of the power supply can be accurately determined, thereby improving the accuracy of power supply state monitoring.

[0056] As an optional embodiment, S202 may specifically include: Based on the second power supply temperature sequence, determine a second temperature increase mean value of the second power supply temperature sequence and a temperature increase standard deviation of the second power supply temperature sequence, wherein the second temperature increase mean value is an average value of temperature increases at adjacent moments in the second power supply temperature sequence; The feedback adjustment result of the power supply temperature is determined by using the second temperature increase mean value and the temperature increase standard deviation.

[0057] In this embodiment, the second temperature increase average is the average of the temperature increases at adjacent moments in the second power supply temperature sequence. For example, assuming that the second power supply temperature sequence is {B1, B2, B3, B4}, the second temperature increase average is the average of the temperature increase of B2 compared to B1, the temperature increase of B3 compared to B2, and the temperature increase of B4 compared to B3.

[0058] For example, the feedback adjustment result of the power supply temperature can be specifically determined by the following formula 4: Formula 4 In formula 4, Feedback regulation results used to characterize the power supply temperature, A second temperature increase mean value for characterizing a second power supply temperature sequence, Used to characterize the standard deviation of the temperature increase of the second power supply temperature series, Used to characterize the positive correlation normalization function.

[0059] The larger the second temperature increase mean and the temperature increase standard deviation are, the more unstable the second power supply temperature sequence is, that is, the feedback regulation of the power supply temperature at this time has not reached a balanced state, and the feedback regulation result is smaller.

[0060] The larger the feedback adjustment result of the power supply temperature is, the closer the feedback adjustment of the power supply temperature is to the equilibrium state, and the more normal the power supply operation state is; the smaller the feedback adjustment result of the power supply temperature is, the further the feedback adjustment of the power supply temperature is from the equilibrium state, and the more abnormal the power supply operation state is.

[0061] Through this embodiment, the second temperature increase mean value of the second power supply temperature sequence and the temperature increase standard deviation of the second power supply temperature sequence are used to accurately determine the feedback adjustment result of the power supply temperature. In this way, the power supply operation state of the power supply can be accurately determined through the feedback adjustment result of the power supply temperature, thereby improving the accuracy of power supply state monitoring.

[0062] As an optional embodiment, Figure 3 As shown, S203 may specifically include the following S301 to S303.

[0063] S301, when the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining a power supply abnormality index of the power supply according to a second power supply temperature sequence; S302, when the power supply abnormality index of the power supply is greater than a preset abnormality threshold, determining that the power supply operation state of the power supply is an abnormal operation state; S303: When the power supply abnormality index of the power supply is not greater than a preset abnormality threshold, determine that the power supply operation state of the power supply is a normal operation state.

[0064] In this embodiment, the power supply abnormality index is used to characterize an index for quantifying the degree of power supply abnormality. For example, the power supply abnormality index may include the amplitude, rate, duration, etc. of temperature change.

[0065] As an example, when the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, the server analyzes the second power supply temperature sequence to obtain a power supply abnormality indicator.

[0066] Then, the power supply abnormality index is compared with the preset abnormality threshold. This preset abnormality threshold is set according to the characteristics of the power supply and the operating environment to determine whether the abnormality index has reached the level that triggers an alarm or takes further measures.

[0067] If the power supply abnormality index is greater than the preset abnormality threshold, the power supply operation state is determined to be abnormal, which means that the power supply may have overheated or other temperature-related problems, requiring immediate attention or measures; if the power supply abnormality index is not greater than the preset abnormality threshold, the power supply operation state is determined to be normal. This means that although there may be some minor temperature changes or fluctuations, they have not reached the level that triggers an alarm or takes further measures, and the power supply is still operating within the normal range.

[0068] According to this embodiment, when the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, the power supply abnormality index of the power supply is determined according to the second power supply temperature sequence. In this way, the power supply operation state of the power supply can be accurately judged through the power supply abnormality index of the power supply, thereby improving the accuracy of power supply state monitoring.

[0069] As an optional embodiment, S301 may specifically include: When the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, determining the corresponding second power supply normal probability for each power supply temperature in the second power supply temperature sequence; The power supply abnormality index of the power supply is determined by using the normal probability of each second power supply.

[0070] In this embodiment, for each power supply temperature in the second power supply temperature sequence, the corresponding second power supply normal probability is determined according to the power supply state monitoring method in the above embodiment.

[0071] Then, using the normal probability of each second power supply, the power supply abnormality index of the power supply is determined by the following formula 5: Formula 5 In formula 5, H is used to represent the power supply abnormality index, and n is used to represent the number of power supply temperatures in the second power supply temperature sequence. A second power supply normal probability for characterizing the power supply temperature. Used to characterize the indicative function. If the probability that the second power supply is normal is greater than the preset probability threshold, the value is assigned to 0; if the probability that the second power supply is normal is not greater than the preset probability threshold, the value is assigned to 1.

[0072] According to this embodiment, when the feedback adjustment result of the power supply temperature is greater than the preset adjustment threshold, the power supply abnormality index of the power supply is determined according to the second power supply temperature sequence. In this way, the power supply operation state of the power supply can be accurately judged through the power supply abnormality index of the power supply, thereby improving the accuracy of power supply state monitoring.

[0073] As an optional embodiment, Figure 4 As shown, S203 may further specifically include the following S401 to S403.

[0074] S401, when the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, determining the power supply performance evaluation value of the power supply according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period, the target historical time period being the time period before the response time period; S402, when the power performance evaluation value of the power supply is less than a preset performance threshold, determining that the power operation state of the power supply is an abnormal operation state; S403: When the power performance evaluation value of the power supply is not less than a preset performance threshold, determine that the power supply operation state of the power supply is a normal operation state.

[0075] In this embodiment, the third power supply temperature sequence includes multiple power supply temperatures, specifically the power supply temperatures at various moments in the target historical time period, and the target historical time period is the previous time period of the response time period. Specifically, if the response time period is the time period for the first execution of the heat dissipation enhancement operation, the target historical time period is the preset time period at which the power supply temperature abnormality signal is sent; if the response time period is not the time period for the first execution of the heat dissipation enhancement operation, the target historical time period is the previous response time period.

[0076] The power performance evaluation value is used to measure the power performance of the power supply. If the power performance evaluation value does not meet the preset performance threshold, it is considered that the feedback adjustment of the power supply temperature is abnormal during the heat dissipation enhancement operation, that is, the power supply operation state is an abnormal operation state; if the power performance evaluation value meets the preset performance threshold, it is considered that the feedback adjustment of the power supply temperature is normal during the heat dissipation enhancement operation, that is, the power supply operation state is a normal operation state.

[0077] As an example, when the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, the server analyzes the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period to obtain a power supply performance evaluation value.

[0078] Then, the power supply performance evaluation value is compared with the preset performance threshold. This preset performance threshold is set according to the characteristics of the power supply and the operating environment to determine whether the abnormal index has reached the level that triggers an alarm or takes further measures.

[0079] If the power supply performance evaluation value is less than the preset performance threshold, the power supply operation state is determined to be abnormal, which means that the power supply may have overheated or other temperature-related problems, requiring immediate attention or measures; if the power supply performance evaluation value is not less than the preset performance threshold, the power supply operation state is determined to be normal. This means that although there may be some minor temperature changes or fluctuations, they have not reached the level that triggers an alarm or takes further measures, and the power supply is still operating within the normal range.

[0080] Through this embodiment, when the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, the power supply performance evaluation value of the power supply is determined according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period. In this way, the power supply operation state of the power supply can be accurately judged through the power supply performance evaluation value of the power supply, thereby improving the accuracy of power supply state monitoring.

[0081] As an optional embodiment, S401 may specifically include: Determine a second temperature increase mean value of the second power supply temperature sequence and a third temperature increase mean value of the third power supply temperature sequence according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period; The power performance evaluation value of the power supply is determined by using the second temperature increase average value, the third temperature increase average value, and the second power supply normal probability at the response end time of the response time period.

[0082] In this embodiment, the power performance evaluation value of the power supply can be specifically determined by the following formula 6: Formula 6 In formula 6, c is used to represent the power supply performance evaluation value. a third temperature increase mean value for characterizing a third power supply temperature sequence, A second temperature increase mean value used to characterize a second power supply temperature sequence. The second power supply normal probability used to characterize the response end time, Used to characterize the positive correlation normalization function.

[0083] in, Used to characterize the regulation effect of the current response time on the power supply temperature after feedback regulation; The larger it is, the better the adjustment effect of the power supply temperature after feedback adjustment is, that is, the larger the power supply performance evaluation value is.

[0084] Through this embodiment, when the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, the power supply performance evaluation value of the power supply is determined according to the second power supply temperature sequence and the third power supply temperature sequence of the target historical time period corresponding to the response time period. In this way, the power supply operation state of the power supply can be accurately judged through the power supply performance evaluation value of the power supply, thereby improving the accuracy of power supply state monitoring.

[0085] As an optional embodiment, after S403, the power status monitoring method applicable to the microcomputer host may further include: When the probability of the second power supply being normal at the response end time of the response time period is less than a preset probability threshold, cyclically performing a heat dissipation enhancement operation on the heat dissipation system of the microcomputer host; When the heat dissipation enhancement operation reaches a preset number of times and the feedback adjustment result of the power supply temperature is not greater than a preset adjustment threshold, a power supply protection operation is performed.

[0086] In this embodiment, when the power performance evaluation value of the power supply is not less than the preset performance threshold, the server considers that the power supply temperature is normally feedback adjusted during the heat dissipation enhancement operation, that is, the power supply operation state is a normal operation state.

[0087] Then, the server compares the second power supply normal probability at the end of the response time period with the preset probability threshold. If the second power supply normal probability at the end of the response time period is less than the preset probability threshold, it indicates that although the power supply temperature is normally feedback regulated at this time, it has not yet been adjusted to a balanced state.

[0088] Therefore, it is necessary to perform the heat dissipation enhancement operation cyclically on the heat dissipation system of the microcomputer host according to the method in the above embodiment. If the feedback adjustment result of the power supply temperature is still not greater than the preset adjustment threshold after the heat dissipation enhancement operation is cyclically performed 5 times, that is, the power supply temperature has not been adjusted to a balanced state, it is determined that there is an abnormality in the power supply temperature adjustment at this time, and therefore the power supply protection measures need to be activated.

[0089] Through this embodiment, when the power supply performance evaluation value of the power supply is not less than the preset performance threshold, after determining that the power supply operation state of the power supply is the normal operation state, the heat dissipation enhancement operation is cyclically performed. And when the heat dissipation enhancement operation reaches the preset number of times and the feedback adjustment result of the power supply temperature is still not greater than the preset adjustment threshold, the power supply protection operation is performed. In this way, timely protection can be provided to the power supply, and the power supply safety can be improved.

[0090] It should be clear that the present invention is not limited to the specific configuration and processing described above and shown in the figures. For the sake of simplicity, a detailed description of the known method is omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the present invention is not limited to the specific steps described and shown, and those skilled in the art can make various changes, modifications and additions, or change the order between the steps after understanding the spirit of the present invention.

[0091] It should also be noted that the exemplary embodiments mentioned in the present invention describe some methods or systems based on a series of steps or devices. However, the present invention is not limited to the order of the above steps, that is, the steps can be performed in the order mentioned in the embodiments, or in a different order from the embodiments, or several steps can be performed simultaneously.

[0092] The above is only a specific implementation of the present invention. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working process of the system, module and unit described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here. It should be understood that the protection scope of the present invention is not limited to this. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be covered within the protection scope of the present invention.

Claims

1. A power status monitoring method suitable for a microcomputer host, characterized in that: The method comprises: Acquire a first power supply temperature sequence at a time to be analyzed, wherein the first power supply temperature sequence includes the power supply temperature at the time to be analyzed and at each time within a preset time period before the time to be analyzed; Compare the power supply temperature at each moment in the first power supply temperature sequence with the theoretical temperature range, and determine the abnormal frequency of abnormal power supply temperature in the first power supply temperature sequence, wherein the abnormal power supply temperature is a power supply temperature that is not within the theoretical temperature range; When the abnormal frequency is less than a preset frequency threshold, determining a probability that the first power supply is normal according to each of the abnormal power supply temperatures in the first power supply temperature sequence; When the abnormal frequency is not less than the preset frequency threshold, determining the probability that the first power supply is normal according to each of the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply; The first power supply normal probability is compared with a preset probability threshold to determine the power supply operation state of the power supply.

2. The power status monitoring method for a microcomputer host according to claim 1, characterized in that: When the abnormal frequency is less than a preset frequency threshold, determining the probability that the first power supply is normal according to each of the abnormal power supply temperatures in the first power supply temperature sequence includes: When the abnormal frequency is less than a preset frequency threshold, respectively calculating the mean of each abnormal power supply temperature in the first power supply temperature sequence and each normal power supply temperature except the abnormal power supply temperature to obtain a mean value of the abnormal power supply temperature and a mean value of the normal power supply temperature; Calculating the mean of the abnormal evaluation values ​​of the abnormal power supply temperatures in the first power supply temperature sequence to obtain an abnormal evaluation mean, wherein the abnormal evaluation value is a value of the abnormal power supply temperature being higher or lower than the theoretical temperature range; The probability that the first power supply is normal is determined by using the abnormal power supply temperature mean, the normal power supply temperature mean, and the abnormal evaluation mean.

3. The power status monitoring method for a microcomputer host according to claim 1, characterized in that: When the abnormal frequency is not less than the preset frequency threshold, determining the normal probability of the first power supply according to each of the abnormal power supply temperatures in the first power supply temperature sequence and the ambient temperature of the power supply includes: When the abnormal frequency is not less than the preset frequency threshold, obtaining a first temperature increase mean value of the first power supply temperature sequence and a temperature mean value of a target temperature set, wherein the first temperature increase mean value is an average value of temperature increases at adjacent moments in the first power supply temperature sequence, and the target temperature set is a set consisting of the abnormal power supply temperatures greater than the theoretical temperature range; Determine the stability of the power supply by using the first temperature increase mean, the temperature mean of the target temperature set, and the ambient temperature of the power supply; The first power supply normal probability is determined according to the stability of the power supply, the temperature standard deviation of the target temperature set, and the abnormal frequency.

4. The power status monitoring method for a microcomputer host according to claim 1, characterized in that: The comparing the first power supply normal probability with a preset probability threshold to determine the power supply operation state of the power supply includes: When the probability of the first power supply being normal is less than the preset probability threshold, a heat dissipation enhancement operation is performed on the heat dissipation system of the microcomputer host to obtain a second power supply temperature sequence in a response time period, wherein the response time period is a time period for performing the heat dissipation enhancement operation; Determining a feedback adjustment result of the power supply temperature based on the second power supply temperature sequence; Based on the feedback adjustment result of the power supply temperature, the power supply operation state of the power supply is determined.

5. The power status monitoring method for a microcomputer host according to claim 4, characterized in that: The step of determining the feedback adjustment result of the power supply temperature based on the second power supply temperature sequence includes: Based on the second power supply temperature sequence, determining a second temperature increase mean value of the second power supply temperature sequence and a temperature increase standard deviation of the second power supply temperature sequence, wherein the second temperature increase mean value is an average value of temperature increases at adjacent moments in the second power supply temperature sequence; The feedback adjustment result of the power supply temperature is determined by using the second temperature increase mean value and the temperature increase standard deviation.

6. The power status monitoring method for a microcomputer host according to claim 4, characterized in that: The step of determining the power supply operation state of the power supply based on the feedback adjustment result of the power supply temperature includes: When the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining a power supply abnormality index of the power supply according to the second power supply temperature sequence; When the power supply abnormality index of the power supply is greater than a preset abnormality threshold, determining that the power supply operation state of the power supply is an abnormal operation state; When the power supply abnormality index of the power supply is not greater than a preset abnormality threshold, it is determined that the power supply operation state of the power supply is a normal operation state.

7. The power status monitoring method for a microcomputer host according to claim 6, characterized in that: When the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining the power supply abnormality index of the power supply according to the second power supply temperature sequence includes: When the feedback adjustment result of the power supply temperature is greater than a preset adjustment threshold, determining the corresponding second power supply normal probability for each power supply temperature in the second power supply temperature sequence; The power supply abnormality index of the power supply is determined by using each of the second power supply normal probabilities.

8. The power status monitoring method for a microcomputer host according to claim 4, characterized in that: The step of determining the power supply operation state of the power supply based on the feedback adjustment result of the power supply temperature includes: In the case where the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, determining the power supply performance evaluation value of the power supply according to the second power supply temperature sequence and a third power supply temperature sequence of a target historical time period corresponding to the response time period, wherein the target historical time period is a time period previous to the response time period; When the power supply performance evaluation value of the power supply is less than a preset performance threshold, determining that the power supply operation state of the power supply is an abnormal operation state; When the power performance evaluation value of the power supply is not less than a preset performance threshold, it is determined that the power supply operation state of the power supply is a normal operation state.

9. The power status monitoring method for a microcomputer host according to claim 8, characterized in that: The method of determining the power performance evaluation value of the power supply according to the second power supply temperature sequence and a third power supply temperature sequence of a target historical time period corresponding to the response time period when the feedback adjustment result of the power supply temperature is not greater than a preset adjustment threshold value includes: Determine a second temperature increase mean value of the second power supply temperature sequence and a third temperature increase mean value of the third power supply temperature sequence according to the second power supply temperature sequence and a third power supply temperature sequence of a target historical time period corresponding to the response time period; The power performance evaluation value of the power supply is determined by using the second temperature increase average value, the third temperature increase average value, and the second power supply normal probability at the response end time of the response time period.

10. The power status monitoring method for a microcomputer host according to claim 8, characterized in that: After determining that the power supply operation state of the power supply is a normal operation state when the power supply performance evaluation value of the power supply is not less than a preset performance threshold, the method further includes: When the probability of a second power supply being normal at the end of the response time period is less than the preset probability threshold, cyclically performing the heat dissipation enhancement operation on the heat dissipation system of the microcomputer host; When the heat dissipation enhancement operation reaches a preset number of times and the feedback adjustment result of the power supply temperature is not greater than the preset adjustment threshold, a power supply protection operation is performed.

Images