Chip test process automatic updating method and system

Abstract

The invention discloses an automatic updating method and an automatic updating system for a chip test process, which are used for realizing dynamic updating, information transmission and parameter verification of the test process through an automatic means so as to solve the problems of low efficiency and high error rate of the existing test process management. The core of the invention is to establish a chip test process automatic updating system, and by reading batch attribute values, a proper test process is automatically identified and configured, and manual operation intervention is reduced. The process of the system covers the whole process from batch information acquisition, data verification to automatic configuration of a test machine, and efficient information matching and updating are realized by designing a configuration table. Compared with the prior art, the automatic updating function reduces human intervention and reconstruction of the test process, and the test efficiency is remarkably improved; through automatic acquisition and automatic configuration of batch attributes, flexible management of the test process is realized, test requirements of different batches and products are adapted, and adaptability and expansibility of the system are improved.

Description

Technical Field

[0001] The present invention belongs to the field of chip testing, and in particular relates to a chip testing process automatic updating method and system. Background Art

[0002] The test process in chip manufacturing is the core link to ensure chip quality and reliability. With the continuous growth of chip design complexity and production demand, the update frequency of chip test process and the complexity of process management are increasing, and test conditions, test parameters and batch attributes are becoming more diverse. Traditional test process management methods rely on manual configuration and manual update. Especially when test parameters or conditions change, new test processes must be re-established and configured. This method not only increases manpower and material costs, but also cannot keep up with the high requirements of modern chip manufacturing for test efficiency and accuracy. At present, the chip manufacturing industry generally uses manufacturing execution systems (MES) to record batch data and transmit information. However, MES systems have obvious limitations in the management and automated update of test processes. Generally, MES systems can record batch attributes such as Lot ID, equipment type, process code, test version, etc., but in the specific test process management, MES systems lack flexible update capabilities and automated verification functions, resulting in the entire process management still requiring a lot of manual intervention. This process that relies on manual configuration is not only prone to human errors, but also leads to reduced test efficiency. Especially when dealing with rapidly changing batch requirements in the chip production process, the existing management model appears inefficient and lagging.

[0003] In addition, with the advancement of chip testing technology, the testing process requires a higher level of automation in order to adapt to market and technological changes more quickly. At present, the test management system mainly transmits data through manual input during the information input and transmission process, which increases the risk of errors in key parameter entry. Once an error occurs during the input process, it will not only affect the accuracy of the test, but may also cause the chip to be incorrectly tested under unqualified conditions, which will have adverse effects and even cause customer complaints and damage the company's reputation. Therefore, in the process of information transmission and management, the lack of a reliable automated update mechanism and verification function has become a key obstacle affecting the efficiency and quality of the chip testing process.

[0004] In summary, the existing technology mainly has the following deficiencies: 1. Tight binding of test conditions and processes: In the current test process management, test conditions (such as test environment, parameters, etc.) are strongly bound to the test process. Whenever the test conditions or parameters change, the system must re-establish the test process. This cumbersome operation makes the test process difficult to reuse, significantly increasing the system's workload and resource consumption.

[0005] 2. High error risk of manual input: In existing systems, the configuration of test processes and the transmission of parameters mostly rely on manual input. Input errors are prone to occur during the information entry process. In particular, if key parameters are entered incorrectly, the entire chip test may be performed under incorrect conditions, affecting test accuracy and even generating a large amount of rework and customer complaints.

[0006] 3. Lack of automated update and verification mechanism: The current test process management system lacks automated update and verification mechanism, which makes it impossible for the system to automatically adjust the test process according to changes in batch production. Information transmission and data verification lack automated inspection and correction, and the system cannot detect or correct errors in parameters and processes in a timely manner, which increases the possibility of process errors and reduces the system's response speed.

[0007] 4. High cost of repeated processes: Currently, each new production work order requires re-creating the test process and configuring the test conditions. This frequent repetitive operation not only consumes a lot of time and manpower costs, but also limits the scalability and flexibility of the system, and cannot meet the current chip production needs for efficient and low-cost testing.

[0008] Therefore, the existing chip test process management system has significant room for improvement in terms of automation level, flexibility and accuracy of data transmission. An innovative solution is urgently needed to achieve dynamic update of test processes, automated parameter verification and intelligent configuration of processes, so as to reduce human intervention, reduce resource waste, and support complex and changing test process requirements, thereby improving chip production efficiency while ensuring the stability and reliability of product quality. Summary of the invention

[0009] In order to solve the above technical problems, the present invention provides a chip test process automatic update method and system.

[0010] The technical solution provided by the present invention is specifically as follows: A chip test process automatic update method, comprising the steps of: S1. Obtain the attribute value of the chip batch to be put into production test; S2. Based on the attribute value, process detection is performed and test program information is output; S3. Download the corresponding test program package and production information to the test equipment according to the test program information.

[0011] Furthermore, in step S1, when batches are put into use, the test factory sequentially captures the attribute values ​​of the batches in its database according to set conditions through the manufacturing execution system, and the database stores the attribute values ​​of chip batches from upstream customers.

[0012] Furthermore, the attribute values ​​include Lot ID for identifying a chip batch, Device for identifying a chip model or series, a production or processing stage code Stage Code, EXID for identifying chip extension information, Bin level CP Bin of CP test, and version number CP Version of CP test.

[0013] Furthermore, in step S2, a configuration table is used to define process detection rules and logic, and the configuration table includes a process retrieval table, a production information configuration table and a production information verification table; the process retrieval table includes Device, Stage code, EXID, CP Bin, CP version and process ID information obtained by parsing the customer work order, and the production information configuration table includes the process ID, registration time, program package name, program version, program MD5, Function key and Retest bin information for deploying production information obtained by parsing the customer work order; the production information verification table is used to verify whether the output information format is correct and whether the fixed characters of the content meet the requirements.

[0014] Furthermore, the process detection includes the following steps: Determine whether there is a process ID in the acquired attribute value, and identify whether the test batch has special test requirements and whether it is the first station by whether there is a process ID; if there is a process ID, directly associate it with the production information configuration table through the process ID, and capture and output the production information of the latest registration time; if there is no process ID, search and match the acquired attribute value with the information in the process retrieval table to locate the process ID to which the batch belongs, and then associate it with the production information configuration table through the process ID, and capture and output the production information of the latest registration time; the production information includes the program package name and program package MD5, Function key and Retest bin.

[0015] Preferably, if the acquired attribute value does not contain a process ID but includes an EXID, the program matching the EXID is preferentially retrieved.

[0016] Furthermore, it also includes a verification process: comparing the program name with the production information verification table, if all conditions are met, entering the next process, if the conditions are not met, a relevant alarm is issued.

[0017] Further, step S3 includes: Obtain a program package with the same name as the one output in step S2 from the program package storage server and download it to the test device; calculate the MD5 value of the downloaded program package and verify it with the MD5 of the program package output in step S2. If the two are the same, proceed to the next step, otherwise stop the batch and alarm; pass the Function key output in step S2 to the test device to implement the Function key configuration of the test device; pass the Retest bin output in step S2 to the test device to implement the Stocker automatic partition configuration and retest Bin configuration of the test device.

[0018] A chip test process automatic update system based on the above method includes the following modules: A batch attribute value acquisition module is used to automatically acquire the attribute value of the batch to be tested through the manufacturing execution system; The process detection module is used to locate the process ID according to the acquired attribute value and output the corresponding production information; Configuration table module, used to store process retrieval table, production information configuration table and production information verification table; The customer work order parsing module is used to parse the customer work order to obtain the form information required by the configuration table module; A program download module, used to download a specific program package from a program package storage server to a test machine, wherein the name of the specific program package is consistent with the program package name included in the production information output by the process detection module; The program package verification module is used to calculate the MD5 value of the program package downloaded by the program download module and compare it with the MD5 of the program package contained in the production information output by the process detection module. If the two are not the same, a stop batch signal is output and an alarm is triggered; The configuration update module is used to transfer the Function key and Retest bin contained in the production information output by the process detection module to the test equipment to realize the Function key configuration, Stocker automatic partition configuration and retest Bin configuration of the test equipment.

[0019] Furthermore, it also includes a verification module for comparing the program name contained in the production information output by the process detection module with the production information verification table, and triggering an alarm if the verification conditions are not met.

[0020] Compared with the prior art, the present invention has at least the following beneficial effects: 1. Reduce duplication of test processes and reduce resource consumption The present invention makes the test process no longer dependent on fixed test conditions and parameter binding, and the process can be automatically updated after the first configuration, thereby reducing the need to recreate the process and reducing manpower and material costs.

[0021] 2. Improve process automation and accuracy The present invention avoids errors caused by manual input through functions such as automatic acquisition of batch attributes, automatic matching of configuration tables, and automatic process verification, significantly improves the accuracy of information transmission, and effectively avoids test failures or customer complaints caused by parameter errors.

[0022] 3. Accelerate process updates to meet efficient production needs The present invention enables the system to quickly respond to changes in batches and conditions through automated rule setting and dynamic process update mechanisms, meets high-frequency testing needs, improves the efficiency of test process management, and adapts to the needs of modern chip manufacturing for efficient production.

[0023] 4. Accurate process verification and error warning The present invention can automatically verify the accuracy of test process information through a multi-level configuration table and an MD5 verification function, and issue an early warning for process configurations that do not meet the requirements, thereby ensuring the correctness of the test program package and configuration.

[0024] 5. Improve system flexibility and adaptability The present invention supports flexible management and configuration of different batches, equipment types and process stages, can quickly adapt to changes in production needs, and provides a more flexible test management mode for different products and processes. In general, the present invention is significantly superior to the existing technology in terms of process automation, error prevention, resource conservation and flexible adaptability, and brings a more intelligent and efficient solution to the test process management in the chip manufacturing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The accompanying drawings are used to provide further understanding of the present invention and constitute a part of the specification. They are used to explain the present invention together with the embodiments of the present invention and do not constitute a limitation of the present invention.

[0026] Figure 1 It is a schematic diagram of the steps of a chip test process automatic update method provided by an embodiment of the present invention; Figure 2 is a functional flow chart of a test process automatic updating system provided by an embodiment of the present invention; Figure 3 It is a schematic diagram of the automatic batch opening and verification process of a machine provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, other embodiments obtained by ordinary technicians in this field without making creative work are all within the scope of protection of the present invention.

[0028] Embodiment 1 This embodiment provides a chip test process automatic update method, such as Figure 1 As shown, it mainly includes: S10: Get the attribute value of the chip batch (Lot) to be put into production test When a batch is put into production, the upstream customer transmits the attribute values ​​of the batch to the test factory's database through the server, and the test factory saves them. The test factory uses the Manufacturing Execution System (MES) to sequentially capture the attribute values ​​of the batch in the server database according to the set conditions and outputs them in a fixed format.

[0029] Attribute values ​​include the Lot ID (the digital serial number and name of the batch, used to identify a specific chip batch), Device (device type, referring to the model or series of the chip), Stage Code (code for the production or processing stage), EXID (extended identifier, used to identify the extended information of the chip), CP Bin (Bin level of CP test, indicating the performance level or quality level of the chip in CP test), CP Version (version number of CP test, indicating the version of CP test program or method used), etc., among which EXID, CP Bin, and CP Version are used to distinguish WIP (products to be tested). Attribute values ​​play two roles in the testing factory: ① The subsequent test process of WIP can be determined by attribute values; ② The incoming materials can be distinguished by attribute values. For example, (Lot ID: 1, Device: A, Stage code: B, EXID: C, CP Bin: D, CP Version: E... ") means that MES has obtained the attribute values ​​of A, B, C, D, E... of Lot 1 respectively.

[0030] S20: Accurately calculate the information required for machine production by setting rules on the server In order to enable the server to accurately calculate the information conditions required for test production based on the production information and attribute values ​​of the batch through the set rules, it is necessary to establish corresponding rules and corresponding fool-proofing measures in the chip test process automatic update system.

[0031] S21. Deploy three configuration tables in the chip test process automatic update system: process retrieval table, production information configuration table and production information verification table, and perform maintenance and update through MES on a daily basis.

[0032] Process search table: uses Device / Stage code / EXID / CP Bin / CP version / process ID as search conditions, and its data source is the customer work order content that is automatically parsed.

[0033] Production information configuration table: Deploy the process ID / package name / program version / Functionkey / Retest bin and other information required for production information. The data source is also the customer work order content that is automatically parsed.

[0034] Production information verification table: verify whether the output information format is correct and whether the fixed characters in the content meet the requirements.

[0035] Table 1 Process retrieval table

[0036] Table 2 Production information configuration table

[0037] Table 3 Generated information verification table

[0038] S22, such as Figure 2 As shown, the chip test process automatically updates the system logic as follows: (1) The Lot attribute value obtained by MES is passed to the chip test process to automatically update the system to first determine whether the process ID exists. Purpose: By determining whether the process ID exists, it can be identified whether there are special test requirements for this lot test, and whether the lot is the first station.

[0039] (2) If a process ID exists, the process ID is directly linked to the production information configuration table to capture all production information of the latest registration time.

[0040] (3) If the process ID does not exist, the process ID to which the lot belongs is automatically matched one by one according to the attribute value of the lot and the Device / Stagecode / EXID / CP Bin / CP version of the process search table, and then directly linked to the production information configuration table through the process ID. All production information of the latest registration time is captured. If the lot has an EXID, the program related to the EXID is searched first.

[0041] (4) MES retrieves the latest registration time information under the process ID in the production information configuration table.

[0042] (5) In order to ensure that the program information calculated by the above process is accurate, a verification process is added. Compare the program name with the production information verification table. If all conditions are met, enter the next process. If the conditions are not met, a relevant alarm is issued. The program name usually contains information such as the test platform type, product type, product capacity, program version, etc., such as product type A_machine type B_program version C_product capacity D_other E_timestamp.

[0043] (6) The output information in step (5) must at least include: program version, program name, program MD5, Bintable, Function key, and retest bin.

[0044] S30: The test program package and other production information are automatically downloaded to the machine end to realize the automatic batch opening and verification process, such as Figure 3 As shown, the specific process includes: (1) When the MES opens a batch, the obtained Lot attribute value is passed to the test process automatic update system. The test process update system will output information such as the package name, package MD5, Function key, and Retest Bin; (2) The automated tool retrieves the package with the same name as the one output by process (1) from the package storage server and downloads it to the test platform. After the download is complete, the MD5 of the package is calculated and verified with the MD5 of process (1). If the two are the same, the next step is continued. If the two are different, the batch is stopped and an alarm is issued. (3) The automation tool transfers the function key of the test process automatic update system to the machine end, realizing automatic setting of the function key configuration of the machine; (4) The automation tool transfers the Retest Bin of the test process automatic update system to the machine end, and automatically sets the machine's Stocker automatic partition configuration and retest Bin configuration.

[0045] Embodiment 2 Based on the above method, this embodiment provides a chip test process automatic update system, the system comprising: A batch attribute value acquisition module is used to automatically acquire the attribute value of the batch to be tested through the manufacturing execution system; The process detection module is used to locate the process ID according to the acquired attribute value and output the corresponding production information; Configuration table module, used to store process retrieval table, production information configuration table and production information verification table; The customer work order parsing module is used to parse the customer work order to obtain the form information required by the configuration table module; A program download module, used to download a specific program package from a program package storage server to a test machine, wherein the name of the specific program package is consistent with the program package name included in the production information output by the process detection module; The program package verification module is used to calculate the MD5 value of the program package downloaded by the program download module and compare it with the MD5 of the program package contained in the production information output by the process detection module. If the two are not the same, a stop batch signal is output and an alarm is triggered; The configuration update module is used to transfer the Function key and Retest bin contained in the production information output by the process detection module to the test equipment to realize the Function key configuration, Stocker automatic partition configuration and retest Bin configuration of the test equipment.

[0046] In some embodiments, the system further includes a verification module for comparing the program name contained in the production information output by the process detection module with the production information verification table, and triggering an alarm if the verification conditions are not met.

[0047] Compared with the existing chip test process management system, the system of the present invention has the following specific features: (1) Unbinding the process from the test conditions: In this system, the strong binding relationship between the test process and the specific test conditions is untied. You only need to establish the process at the test site, and the test process will automatically update the system to automatically transfer the test conditions and parameters.

[0048] (2) Reduce repeated configuration processes: Each test process only needs to be configured for the first time. Any subsequent parameter changes can be achieved through the automatic update system, without the need to create the process again, reducing manpower and material costs.

[0049] (3) Automated verification and configuration: The system implements automated verification of processes through the design of multi-level configuration tables, avoiding errors caused by manual input and improving the accuracy of information transmission.

[0050] (4) MD5 verification of the program package on the machine side: Use the MD5 code to verify the program package on the machine side to ensure the accuracy of the test process and avoid abnormal testing situations caused by program package errors.

[0051] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit them. Under the concept of the present invention, the technical features in the above embodiments or different embodiments may also be combined, the steps may be implemented in any order, and there are many other changes in different aspects of the present invention as described above, which are not provided in detail for the sake of simplicity. Although the present invention has been described in detail with reference to the aforementioned embodiments, a person of ordinary skill in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A chip test process automatic update method, characterized in that: Includes steps: S1. Obtain the attribute value of the chip batch to be put into production test; S2. Based on the attribute value, process detection is performed and test program information is output; S3. Download the corresponding test program package and production information to the test equipment according to the test program information.

2. The chip test process automatic update method according to claim 1, characterized in that: In step S1, when batches are put into use, the test factory sequentially captures the attribute values ​​of the batches in its database according to set conditions through the manufacturing execution system, and the database stores the attribute values ​​of chip batches from upstream customers.

3. The chip test process automatic update method according to claim 1, characterized in that: The attribute values ​​include Lot ID for identifying a chip batch, Device for identifying a chip model or series, a production or processing stage code StageCode, EXID for identifying chip extension information, Bin level CP Bin of a CP test, and version number CPVersion of a CP test.

4. The chip test process automatic update method according to claim 3, characterized in that: In step S2, a configuration table is used to define process detection rules and logic, and the configuration table includes a process retrieval table, a production information configuration table and a production information verification table; the process retrieval table includes Device, Stage code, EXID, CP Bin, CPversion and process ID information obtained by parsing the customer work order, and the production information configuration table includes the process ID, registration time, program package name, program version, program MD5, Function key and Retest bin information for deploying production information obtained by parsing the customer work order; the production information verification table is used to verify whether the output information format is correct and whether the fixed characters of the content meet the requirements.

5. The chip test process automatic update method according to claim 4, characterized in that: The process detection includes the following steps: Determine whether there is a process ID in the acquired attribute value, and identify whether the test batch has special test requirements and whether it is the first station by whether there is a process ID; if there is a process ID, directly associate it with the production information configuration table through the process ID, and capture and output the production information of the latest registration time; if there is no process ID, search and match the acquired attribute value with the information in the process retrieval table to locate the process ID to which the batch belongs, and then associate it with the production information configuration table through the process ID, and capture and output the production information of the latest registration time; the production information includes the program package name and program package MD5, Function key and Retest bin.

6. The chip test process automatic update method according to claim 5, characterized in that: If the obtained attribute value does not contain process ID but includes EXID, the program matching EXID will be searched first.

7. The chip test process automatic update method according to claim 5, characterized in that: It also includes a verification process: compare the program name with the production information verification table. If all conditions are met, enter the next process. If the conditions are not met, a relevant alarm will be issued.

8. The chip test process automatic update method according to claim 7, characterized in that: Step S3 includes: Obtain a program package with the same name as the one output in step S2 from the program package storage server and download it to the test device; calculate the MD5 value of the downloaded program package and verify it with the MD5 of the program package output in step S2. If the two are the same, proceed to the next step, otherwise stop the batch and alarm; pass the Function key output in step S2 to the test device to implement the Function key configuration of the test device; pass the Retest bin output in step S2 to the test device to implement the Stocker automatic partition configuration and retest Bin configuration of the test device.

9. A chip test process automatic update system based on the method of claim 9, characterized in that: Includes the following modules: A batch attribute value acquisition module is used to automatically acquire the attribute value of the batch to be tested through the manufacturing execution system; The process detection module is used to locate the process ID according to the acquired attribute value and output the corresponding production information; Configuration table module, used to store process retrieval table, production information configuration table and production information verification table; The customer work order parsing module is used to parse the customer work order to obtain the form information required by the configuration table module; A program download module, used to download a specific program package from a program package storage server to a test machine, wherein the name of the specific program package is consistent with the program package name included in the production information output by the process detection module; The program package verification module is used to calculate the MD5 value of the program package downloaded by the program download module and compare it with the MD5 of the program package contained in the production information output by the process detection module. If the two are not the same, a stop batch signal is output and an alarm is triggered; The configuration update module is used to pass the Function key and Retestbin contained in the production information output by the process detection module to the test equipment to realize the Function key configuration, Stocker automatic partition configuration and retest Bin configuration of the test equipment.

10. The chip test process automatic update system according to claim 9, characterized in that: It also includes a verification module for comparing the program name contained in the production information output by the process detection module with the production information verification table, and triggering an alarm if the verification conditions are not met.

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