A chip test process automatic update method and system

Abstract

The present invention discloses a chip test process automatic update method and system, which realizes the dynamic update, information transmission and parameter verification of the test process through automated means, so as to solve the problems of low efficiency and high error rate of existing test process management. The core of the present invention is to establish a chip test process automatic update system, which automatically identifies and configures the appropriate test process by reading batch attribute values, reducing human operation intervention. The system process covers the whole process from batch information acquisition, data verification to automatic configuration of test machines, and realizes efficient information matching and updating by designing configuration tables. Compared with the existing technology, the automatic update function in the present invention reduces human intervention and reconstruction of the test process, and significantly improves the test efficiency; through the automatic acquisition and automatic configuration of batch attributes, flexible management of the test process is realized, adapting to the testing requirements of different batches and products, and improving the adaptability and scalability of the system.

Description

Technical Field

[0001] The present invention belongs to the field of chip testing, and in particular relates to a chip testing process automatic updating method and system. Background Art

[0002] The testing process in chip manufacturing is a core component for ensuring chip quality and reliability. With the increasing complexity of chip design and production demands, the frequency of chip testing process updates and the complexity of process management are increasing, leading to a growing diversity of test conditions, test parameters, and batch attributes. Traditional test process management relies heavily on manual configuration and updates. Changes in test parameters or conditions necessitate the re-establishment and configuration of new test processes. This approach not only increases labor and material costs but also struggles to keep up with the high testing efficiency and accuracy requirements of modern chip manufacturing. Currently, the chip manufacturing industry widely uses Manufacturing Execution Systems (MES) for batch data recording and information transmission. However, MES systems have significant limitations in managing and automating test process updates. While MES systems typically record batch attributes such as lot ID, equipment type, process code, and test version, they lack flexible update capabilities and automated verification capabilities for specific test process management, resulting in significant manual intervention throughout the entire process. This reliance on manual configuration is not only prone to human error but also reduces testing efficiency. This existing management model is particularly inefficient and lags behind when dealing with the rapidly changing batch requirements of chip production.

[0003] Furthermore, with advancements in chip testing technology, the testing process requires a higher level of automation to more quickly adapt to market and technological changes. Current test management systems primarily rely on manual data entry during information input and transmission, increasing the risk of errors in key parameter entry. Mistakes in this input process not only affect test accuracy but can also result in incorrectly testing chips that do not meet specified conditions, leading to adverse consequences and even customer complaints, damaging the company's reputation. Therefore, the lack of reliable automated update mechanisms and verification capabilities in information transmission and management has become a key obstacle to the efficiency and quality of the chip testing process.

[0004] In summary, the existing technology mainly has the following deficiencies:

[0005] 1. Tight Binding of Test Conditions and Processes: In current test process management, test conditions (such as the test environment and parameters) are tightly bound to the test process. Whenever test conditions or parameters change, the system must re-establish the test process. This cumbersome operation makes test processes difficult to reuse, significantly increasing system workload and resource consumption.

[0006] 2. High risk of manual input errors: In existing systems, test process configuration and parameter transmission rely heavily on manual input. This can easily lead to input errors during information entry. In particular, incorrect input of key parameters can cause the entire chip test to be performed under incorrect conditions, impacting test accuracy and potentially resulting in extensive rework and customer complaints.

[0007] 3. Lack of automated update and verification mechanisms: The current test process management system lacks automated update and verification mechanisms, resulting in the system's inability to automatically adjust the test process to changes in batch production. Information transmission and data verification lack automated inspection and correction, making it impossible for the system to promptly detect or correct parameter and process errors, increasing the likelihood of process errors and slowing down the system's response time.

[0008] 4. High cost of repetitive processes: Currently, each new production work order requires recreating the test process and configuring the test conditions. This frequent repetitive operation not only consumes a lot of time and labor, but also limits the scalability and flexibility of the system, failing to meet the current demand for efficient and low-cost testing in chip production.

[0009] Therefore, existing chip test process management systems have significant room for improvement in terms of automation, flexibility, and data transfer accuracy. An innovative solution is urgently needed that can dynamically update test processes, automate parameter verification, and intelligently configure processes to reduce human intervention and resource waste, while also supporting complex and ever-changing test process requirements. This approach will improve chip production efficiency while ensuring product quality stability and reliability. Summary of the Invention

[0010] In order to solve the above technical problems, the present invention provides a chip test process automatic update method and system.

[0011] The technical solutions provided by the present invention are as follows:

[0012] A chip test process automatic update method includes the following steps:

[0013] S1. Obtain the attribute values ​​of the chip batch to be put into production testing;

[0014] S2. Based on the attribute value, perform process detection and output test program information;

[0015] S3. Download the corresponding test program package and production information to the test equipment according to the test program information.

[0016] Furthermore, in step S1, when batch materials are put into use, the test factory sequentially captures the attribute values ​​of the batches from its database according to set conditions through the manufacturing execution system, and the database stores the attribute values ​​of chip batches from upstream customers.

[0017] Furthermore, the attribute values ​​include Lot ID for identifying the chip batch, Device for identifying the chip model or series, Stage Code for identifying the production or processing stage, EXID for identifying chip extension information, Bin level CP Bin of CP test, and version number CP Version of CP test.

[0018] Furthermore, in step S2, a configuration table is used to define process detection rules and logic, and the configuration table includes a process retrieval table, a production information configuration table, and a production information verification table; the process retrieval table includes the Device, Stage code, EXID, CP Bin, CP version, and process ID information obtained by parsing the customer work order; the production information configuration table includes the process ID, registration time, program package name, program version, program MD5, Function key, and Retest bin information used to deploy production information obtained by parsing the customer work order; the production information verification table is used to verify whether the output information format is correct and whether the fixed characters in the content meet the requirements.

[0019] Furthermore, the process detection includes the following steps:

[0020] Determine whether the acquired attribute value contains a process ID, and identify whether the test batch has special test requirements and whether it is the first station based on the presence or absence of the process ID; if the process ID exists, directly link it to the production information configuration table through the process ID, and capture and output the production information of the latest registration time; if the process ID does not exist, search and match the acquired attribute value with the information in the process retrieval table to locate the process ID to which the batch belongs, and then link it to the production information configuration table through the process ID, and capture and output the production information of the latest registration time; the production information includes the package name and package MD5, Function key and Retest bin.

[0021] Preferably, if the acquired attribute value does not contain a process ID but includes an EXID, the program matching the EXID is preferentially searched.

[0022] Furthermore, it also includes a verification process: comparing the program name with the production information verification table. If all conditions are met, the next process is entered; if the conditions are not met, a relevant alarm is issued.

[0023] Furthermore, step S3 includes:

[0024] Obtain a package with the same name as the package output in step S2 from the package storage server and download it to the test device; calculate the MD5 value of the downloaded package and verify it with the MD5 value of the package output in step S2. If the two are the same, proceed to the next step; otherwise, stop the batch and alarm; pass the Function key output in step S2 to the test device to implement the Function key configuration of the test device; pass the Retest bin output in step S2 to the test device to implement the Stocker automatic partition configuration and retest bin configuration of the test device.

[0025] A chip test process automatic update system based on the above method includes the following modules:

[0026] Batch attribute value acquisition module, used to automatically obtain the attribute values ​​of the batch to be tested through the manufacturing execution system;

[0027] The process detection module is used to locate the process ID based on the acquired attribute values ​​and output the corresponding production information;

[0028] Configuration table module, used to store process retrieval table, production information configuration table and production information verification table;

[0029] The customer work order parsing module is used to parse the customer work order to obtain the form information required by the configuration table module;

[0030] a program download module, configured to download a specific program package from a program package storage server to a test machine, wherein the name of the specific program package is consistent with the program package name included in the production information output by the process inspection module;

[0031] The program package verification module is used to calculate the MD5 value of the program package downloaded by the program download module and compare it with the MD5 value of the program package contained in the production information output by the process detection module. If the two are different, a stop batch signal is output and an alarm is triggered;

[0032] The configuration update module is used to pass the Function key and Retest bin contained in the production information output by the process detection module to the test equipment to implement the Function key configuration, Stocker automatic partition configuration and Retest Bin configuration of the test equipment.

[0033] Furthermore, it also includes a verification module for comparing the program name contained in the production information output by the process detection module with the production information verification table, and triggering an alarm if the verification conditions are not met.

[0034] Compared with the prior art, the present invention has at least the following beneficial effects:

[0035] 1. Reduce duplication of test processes and reduce resource consumption

[0036] The present invention makes the test process no longer dependent on fixed test conditions and parameter binding, and the process can be automatically updated after the first configuration, which reduces the need to recreate the process and reduces manpower and material costs.

[0037] 2. Improve process automation and accuracy

[0038] The present invention avoids errors caused by manual input through functions such as automatic acquisition of batch attributes, automatic matching of configuration tables, and automatic process verification, significantly improves the accuracy of information transmission, and effectively avoids test failures or customer complaints caused by parameter errors.

[0039] 3. Accelerate process updates to meet efficient production needs

[0040] The present invention enables the system to quickly respond to changes in batches and conditions through automated rule setting and dynamic process update mechanisms, meeting high-frequency testing needs, improving the efficiency of test process management, and adapting to the demand for efficient production in modern chip manufacturing.

[0041] 4. Accurate process verification and error warning

[0042] The present invention can automatically verify the accuracy of test process information through a multi-level configuration table and an MD5 check function, and issue an early warning for process configurations that do not meet the requirements, thereby ensuring the correctness of the test program package and configuration.

[0043] 5. Improve system flexibility and adaptability

[0044] The present invention supports flexible management and configuration of different batches, equipment types and process stages, can quickly adapt to changes in production needs, and provides a more flexible test management mode for different products and processes.

[0045] Overall, the present invention is significantly superior to existing technologies in terms of process automation, error prevention, resource conservation, and flexible adaptability, bringing a more intelligent and efficient solution to test process management in chip manufacturing. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] The accompanying drawings are used to provide further understanding of the present invention and constitute a part of the specification. They are used to explain the present invention together with the embodiments of the present invention and do not constitute a limitation of the present invention.

[0047] Figure 1 This is a schematic diagram of the steps of a chip test process automatic update method provided by one embodiment of the present invention;

[0048] Figure 2This is a functional flow chart of a test process automatic update system provided by an embodiment of the present invention;

[0049] Figure 3 This is a schematic diagram of the automatic batch opening and verification process of a machine provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0050] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, other embodiments obtained by ordinary technicians in this field without making creative efforts are all within the scope of protection of the present invention.

[0051] Example 1

[0052] This embodiment provides a chip test process automatic update method, such as Figure 1 As shown, it mainly includes:

[0053] S10: Get the attribute value of the chip batch (Lot) to be put into production test

[0054] When a batch is delivered, the upstream customer transmits the batch attribute values ​​to the testing plant's database via a server, which then stores them. The testing plant then uses the Manufacturing Execution System (MES) to sequentially retrieve the batch attribute values ​​from the server database according to predefined conditions and output them in a fixed format.

[0055] Attribute values ​​include the Lot ID (a numerical serial number and name used to identify a specific chip batch), Device (device type, referring to the chip model or series), Stage Code (a code for the production or processing stage), EXID (an extended identifier used to identify extended chip information), CP Bin (a Bin level for CP testing, indicating the chip's performance or quality level during CP testing), and CP Version (a version number for the CP testing program or method used). EXID, CP Bin, and CP Version are used to distinguish WIP (work in progress). Attribute values ​​serve two purposes in the testing plant: 1) they can determine the subsequent testing process for WIP; 2) they can be used to distinguish incoming materials. For example, "(Lot ID: 1, Device: A, Stage Code: B, EXID: C, CP Bin: D, CP Version: E...") indicates that the MES has obtained the attribute values ​​of A, B, C, D, E, and so on for Lot 1.

[0056] S20: Accurately calculate the information required for machine production through setting rules on the server

[0057] In order to enable the server to accurately calculate the information conditions required for test production based on the production information and attribute values ​​of the batch through the set rules, it is necessary to establish corresponding rules and corresponding error-proofing measures in the chip test process automatic update system.

[0058] S21. Deploy three configuration tables in the chip test process automatic update system: process retrieval table, production information configuration table and production information verification table, and perform daily maintenance and updates through MES.

[0059] Process search table: uses Device / Stage code / EXID / CP Bin / CP version / Process ID as search criteria. The data source is the automatically parsed customer work order content.

[0060] Production Information Configuration Table: This table contains the process ID, package name, version, function key, and retest bin information required for deploying production information. The data source is also the automatically parsed customer work order content.

[0061] Production information verification table: Verify whether the output information format is correct and whether the fixed characters in the content meet the requirements.

[0062] Table 1 Process retrieval table

[0063]

[0064] Table 2 Production information configuration table

[0065]

[0066] Table 3 Generated information verification table

[0067]

[0068] S22, such as Figure 2 As shown, the chip test process automatically updates the system logic as follows:

[0069] (1) The Lot attribute value obtained by MES is passed to the chip test process. The automatic update system first determines whether the process ID exists. Purpose: By determining whether the process ID exists, it can be identified whether there are special test requirements for this lot test, and it can also determine whether the lot is the first station.

[0070] (2) If a process ID exists, it is directly linked to the production information configuration table through the process ID to capture all production information of the latest registration time.

[0071] (3) If the process ID does not exist, the process ID of the lot is automatically matched against the Device / Stagecode / EXID / CP Bin / CP version in the process search table. The process ID is then directly linked to the production information configuration table. All production information with the latest registration time is captured. If the lot has an EXID, the program associated with the EXID is searched first.

[0072] (4) MES retrieves the latest registration time information under the process ID in the production information configuration table.

[0073] (5) To ensure that the program information calculated by the above process is accurate, a verification process is added. The program name is compared with the production information verification table. If all conditions are met, the next process is entered. If the conditions are not met, a relevant alarm is issued. The program name usually contains information such as the test platform type, product type, product capacity, and program version. For example, product type A_machine type B_program version C_product capacity D_other E_timestamp.

[0074] (6) The output information in step (5) must at least include: program version, program name, program MD5, Bintable, Function key, and retest bin.

[0075] S30: Test program packages and other production information are automatically downloaded to the machine to achieve automatic batch opening and verification processes, such as Figure 3 As shown, the specific process includes:

[0076] (1) When the MES opens a batch, the obtained Lot attribute value is passed to the test process automatic update system. The test process update system will output information such as the package name, package MD5, Function key, and Retest Bin;

[0077] (2) The automated tool will retrieve the package with the same name as the one output by process (1) from the package storage server and download it to the test platform. After the download is complete, the MD5 of the package will be calculated and verified with the MD5 of process (1). If the two are the same, the next step will be continued. If the two are different, the batch will be stopped and an alarm will be issued.

[0078] (3) The automation tool transfers the function key of the test process automatic update system to the machine end, realizing automatic setting of the function key configuration of the machine;

[0079] (4) The automation tool transfers the Retest Bin of the test process automatic update system to the machine end, and automatically sets the machine's Stocker automatic partition configuration and retest Bin configuration.

[0080] Example 2

[0081] Based on the above method, this embodiment provides a chip test process automatic update system, which includes:

[0082] Batch attribute value acquisition module, used to automatically obtain the attribute values ​​of the batch to be tested through the manufacturing execution system;

[0083] The process detection module is used to locate the process ID based on the acquired attribute values ​​and output the corresponding production information;

[0084] Configuration table module, used to store process retrieval table, production information configuration table and production information verification table;

[0085] The customer work order parsing module is used to parse the customer work order to obtain the form information required by the configuration table module;

[0086] a program download module, configured to download a specific program package from a program package storage server to a test machine, wherein the name of the specific program package is consistent with the program package name included in the production information output by the process inspection module;

[0087] The program package verification module is used to calculate the MD5 value of the program package downloaded by the program download module and compare it with the MD5 value of the program package contained in the production information output by the process detection module. If the two are different, a stop batch signal is output and an alarm is triggered;

[0088] The configuration update module is used to pass the Function key and Retest bin contained in the production information output by the process detection module to the test equipment to implement the Function key configuration, Stocker automatic partition configuration and Retest Bin configuration of the test equipment.

[0089] In some embodiments, the system further includes a verification module for comparing the program name contained in the production information output by the process detection module with a production information verification table, and triggering an alarm if the verification conditions are not met.

[0090] Compared with the existing chip test process management system, the system of the present invention has the following specific features:

[0091] (1) Unbinding the process from the test conditions: In this system, the strong binding relationship between the test process and the specific test conditions is released. It is only necessary to establish the process at the test site, and the test process automatically updates the system to automatically pass the test conditions and parameters.

[0092] (2) Reduce repeated configuration processes: Each test process only needs to be configured for the first time. Any subsequent parameter changes can be achieved through the automatic update system, without the need to create the process again, reducing manpower and material costs.

[0093] (3) Automated verification and configuration: The system implements automated verification of processes through the design of multi-level configuration tables, avoiding errors caused by manual input and improving the accuracy of information transmission.

[0094] (4) MD5 verification of the program package on the machine side: Use MD5 code to verify the program package on the machine side to ensure the accuracy of the test process and avoid abnormal test situations caused by program package errors.

[0095] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Under the idea of ​​the present invention, the technical features in the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the present invention as described above. For the sake of simplicity, they are not provided in detail. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in this field should understand that they can still modify the technical solutions described in the above embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of this application.

Claims

1. A chip test process automatic update method, characterized in that: Including steps: S1. Obtain the attribute values ​​of the chip batch to be put into production testing; The attribute values ​​include Lot ID for identifying the chip batch, Device for identifying the chip model or series, Stage Code for identifying the production or processing stage, EXID for identifying chip extension information, Bin level CP Bin of CP test, and CP Version of CP test; S2. Based on the attribute value, perform process detection and output test program information; A configuration table is used to define process detection rules and logic. The configuration table includes a process retrieval table, a production information configuration table, and a production information verification table. The process retrieval table includes the Device, Stage code, EXID, CPBin, CP version, and process ID information obtained from parsing customer work orders. The production information configuration table includes the process ID, registration time, package name, program version, program MD5, Function key, and Retestbin information used to deploy production information, obtained from parsing customer work orders. The production information verification table is used to verify whether the output information format is correct and whether the fixed character content meets the requirements. The process inspection includes the following steps: Determine whether the acquired attribute value contains a process ID. The presence of the process ID is used to identify whether the test batch has special testing requirements and whether it is the first test batch. If the process ID exists, it is directly linked to the production information configuration table through the process ID, and the production information with the latest registration time is captured and output. If the process ID does not exist, the acquired attribute value is searched and matched with the information in the process search table to locate the process ID to which the batch belongs. The process ID is then linked to the production information configuration table through the process ID, and the production information with the latest registration time is captured and output. The production information includes the package name and package MD5, function key, and retest bin. S3. Download the corresponding test program package and production information to the test equipment according to the test program information; Obtain a package with the same name as the package output in step S2 from the package storage server and download it to the test device; calculate the MD5 value of the downloaded package and verify it with the MD5 value of the package output in step S2. If the two are the same, proceed to the next step; otherwise, stop the batch and alarm; pass the Function key output in step S2 to the test device to implement the Function key configuration of the test device; pass the Retest bin output in step S2 to the test device to implement the Stocker automatic partition configuration and retest bin configuration of the test device.

2. The chip test process automatic update method according to claim 1, characterized in that: In step S1, when batch materials are put into production, the test factory sequentially captures the attribute values ​​of the batches from its database according to set conditions through the manufacturing execution system. The database stores the attribute values ​​of chip batches from upstream customers.

3. The chip test process automatic update method according to claim 1, characterized in that: If the obtained attribute value does not contain a process ID but includes an EXID, the program matching the EXID will be searched first.

4. The chip test process automatic update method according to claim 1, characterized in that: It also includes a verification process: compare the program name with the production information verification table. If all conditions are met, proceed to the next process. If the conditions are not met, a relevant alarm will be issued.

5. A chip test process automatic update system based on the method according to any one of claims 1 to 4, characterized in that: Includes the following modules: Batch attribute value acquisition module, used to automatically obtain the attribute values ​​of the batch to be tested through the manufacturing execution system; The process detection module is used to locate the process ID based on the acquired attribute values ​​and output the corresponding production information; Configuration table module, used to store process retrieval table, production information configuration table and production information verification table; The customer work order parsing module is used to parse the customer work order to obtain the form information required by the configuration table module; A program download module, configured to download a program package from a program package storage server to a test machine, wherein the name of the program package is consistent with the program package name included in the production information output by the process inspection module; The program package verification module is used to calculate the MD5 value of the program package downloaded by the program download module and compare it with the MD5 value of the program package contained in the production information output by the process detection module. If the two are different, a stop batch signal is output and an alarm is triggered; The configuration update module is used to pass the Function key and Retestbin contained in the production information output by the process detection module to the test equipment to realize the Function key configuration, Stocker automatic partition configuration and retest bin configuration of the test equipment.

6. The chip test process automatic update system according to claim 5, characterized in that: It also includes a verification module for comparing the program name contained in the production information output by the process detection module with the production information verification table, and triggering an alarm if the verification conditions are not met.

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