Communication module for radio frequency testing machine and radio frequency testing machine

Abstract

The invention provides a communication module for a radio frequency testing machine and the radio frequency testing machine, and the communication module comprises a main control chip which can be in communication connection with an upper computer in the testing machine; a plurality of first TTL communication interfaces, the first TTL communication interfaces are connected with the main control chip, the first TTL communication interfaces can be in communication connection with a sorting machine / probe station, and the first TTL communication interfaces can receive a test start signal sent by the sorting machine / probe station; and a test end signal and a classification signal can be returned to the sorting machine / probe station. According to the invention, the communication convenience of the radio frequency testing machine can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of radio frequency testing, and in particular to a communication module for a radio frequency testing machine and a radio frequency testing machine. Background Art

[0002] In the production process of semiconductor chips, functional performance testing of chips is an essential process. Traditional manual testing methods are inefficient, prone to errors, and difficult to meet the needs of large-scale production and complex testing tasks; to achieve automatic testing of semiconductor chips, close cooperation between testers and sorters / probe stations is required. Nowadays, there are various communication methods between testers and sorters, probe stations and other equipment, but the overall trend is higher data transmission speed, mutual recognition of results, automatic identification, etc.

[0003] In reality, the same chip manufacturer may purchase testers, sorters and probe stations from different manufacturers. The communication interfaces used by different manufacturers are not the same. This leads to the need to customize the communication interface according to the customer's sorter / probe station equipment during the development and production of semiconductor automatic test equipment. In addition, during the production introduction process, it is necessary to conduct actual machine joint debugging with the sorters / probe stations of different manufacturers. During the joint debugging process, it is necessary to actually operate a tester and a sorter / probe station, which consumes a lot of manpower and material resources. This is not conducive to the pre-delivery inspection of the tester, sorter / probe station or the inspection of the interconnection between the tester and the sorter / probe station.

[0004] The communication between the tester (ATE) and the handler (handler). After the tester receives the test start signal (Start Of Test, SOT signal) from the handler, it starts to test the chip. After the tester is finished, it returns different test classification results to the handler according to the actual situation, and then sends the test end signal (End OF Test, EOT signal) to the handler, completing the test of a chip. A test site (or site for short) refers to a physical location or logical unit that can independently perform RF performance testing. The test program can control the tester to test multiple test sites in parallel or serially. Under normal circumstances, the handler can support up to 8 test sites working at the same time, and the corresponding tester is also equipped with 8 test sites. The tester classifies the tested product according to the test results (i.e., BIN), and sends the classification signal (i.e., BIN signal) to the handler. The handler moves the product to the corresponding physical location according to the classification signal. Generally, each test site corresponds to up to 8 classification signals.

[0005] The start test signal of a group of chips sent by the sorting machine is a one-time signal. Once the tester fails to capture it successfully, the tester will not start the test, and will not send the end test signal to the sorter, which will cause the entire test system to crash, seriously affecting the test production efficiency. Traditional testers need to design communication protocols according to the communication interface requirements of the sorter, and need to be debugged with the sorter entity, which consumes a lot of manpower and material resources and affects the research and development progress of the tester.

[0006] The information disclosed in this background technology section is only intended to deepen the understanding of the overall background technology of the present invention, and should not be regarded as an admission or any form of suggestion that the information constitutes the prior art already known to those skilled in the art. Summary of the invention

[0007] In view of the problems existing in the prior art, the present invention provides a communication module for a radio frequency tester and a radio frequency tester.

[0008] The technical solution of the present invention provides a communication module for a radio frequency test machine, and the communication module includes: a main control chip, which can be communicated with a host computer in the test machine; a plurality of first TTL (Transistor-Transistor Logic, transistor-transistor logic) communication interfaces, the first TTL communication interface is connected to the main control chip, the first TTL communication interface can be communicated with a sorter / probe station, the first TTL communication interface can receive a test start signal sent by the sorter / probe station, and can return a test end signal and a classification signal to the sorter / probe station.

[0009] Optionally, the plurality of first TTL communication interfaces include multiple types of interfaces with different numbers of pins, and each interface is connected to a different pin of the main control chip.

[0010] Optionally, the communication module further includes: a GPIB (General-Purpose Interface Bus) communication interface and an Ethernet communication interface connected to the host computer for communication.

[0011] Optionally, the communication module includes a front panel, and the front panel integrates a GPIB communication interface, an Ethernet communication interface and a plurality of first TTL communication interfaces.

[0012] Optionally, the communication module is installed in the test machine chassis in a drawer-type manner.

[0013] The technical solution of the present invention further provides a radio frequency tester, which includes a communication module.

[0014] Optionally, a host computer in the test machine is provided with test software, the test software supports three communication protocols: GPIB, TTL, and Ethernet, and the test software calls the communication interface of the communication module to realize data interaction between the host computer and the sorting machine / probe station.

[0015] Optionally, debugging software is provided in the host computer of the test machine, and the debugging software includes: a display module, which displays preset information when a test start signal is received, so that the debugger can know the test site corresponding to the test start signal; a return module, which forms a classification signal and a test end signal, and calls the communication module to pass it to the sorting machine / probe station.

[0016] Optionally, a simulation software is provided in the host computer in the test machine, and the simulation software includes: a first signal sending module, which can send a test start signal to the communication module; and a first signal receiving module, which can receive a classification signal returned by the host computer from the communication module.

[0017] Optionally, the testing machine also includes a debugging tool, which includes: a number of second TTL communication interfaces, which are used to communicate with the first TTL communication interface; a second signal sending module, which can send a test start signal to the communication module; a second signal receiving module, which can receive a classification signal and a test end signal returned by the host computer from the communication module; a number of voltage comparators, which are connected to the second signal receiving module, and a reference level is preset in the voltage comparator. The classification signal or the test end signal received by the second signal receiving module is used as a comparison level, and the voltage comparator compares the reference level and the comparison level; an LED module, which is connected to the voltage comparator, and when the voltage comparator receives the classification signal or the test end signal, the corresponding LED unit in the LED module flashes.

[0018] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention.

[0019] The beneficial effects of the present invention are as follows: the communication convenience of the radio frequency testing machine is increased. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 The present invention is a schematic diagram of a circuit board design of a communication module disclosed in an embodiment of the present invention.

[0022] Figure 2 The present invention discloses a schematic diagram of a debugging software operation flow.

[0023] Figure 3 The present invention is a schematic diagram of the operation flow of the simulation software disclosed in the embodiment of the present invention.

[0024] Figure 4 A schematic diagram of a debugging tool design disclosed in an embodiment of the present invention. DETAILED DESCRIPTION

[0025] The advantages of the present invention are further described below in conjunction with the accompanying drawings and specific embodiments.

[0026] Here, exemplary embodiments will be described in detail, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The implementations described in the following exemplary embodiments do not represent all implementations consistent with the present disclosure.

[0027] The terms used in this disclosure are only for the purpose of describing specific embodiments and are not intended to limit the disclosure. The singular forms of "a", "the" and "the" used in this disclosure are also intended to include plural forms, unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0028] It should be understood that although the terms first, second, third, etc. may be used in the present disclosure to describe various information, such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of the present disclosure, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0029] In the description of the present invention, it is necessary to understand that the terms "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0030] In the description of the present invention, unless otherwise specified and limited, it should be noted that the terms "installed", "connected" and "connected" should be understood in a broad sense. For example, it can be a mechanical connection or an electrical connection, or it can be the internal connection between two components. It can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms can be understood according to the specific circumstances.

[0031] In the following description, the suffixes such as "module", "component" or "unit" used to represent elements are only used to facilitate the description of the present invention, and have no specific meanings. Therefore, "module" and "component" can be used interchangeably.

[0032] The technical solution of the present invention provides a communication module for a radio frequency tester, the communication module comprising: a main control chip, the main control chip can be connected to a host computer in the tester for communication; a plurality of first TTL communication interfaces, the first TTL communication interface is connected to the main control chip, the first TTL communication interface can be connected to a sorter / probe station for communication, the first TTL communication interface can receive a test start signal sent by the sorter / probe station, and can return a test end signal and a classification signal to the sorter / probe station.

[0033] This embodiment increases the convenience of communication of the radio frequency tester.

[0034] It should be noted that a circuit board is usually required to carry the main control chip and the first TTL communication interface.

[0035] Optionally, the plurality of first TTL communication interfaces include multiple types of interfaces with different numbers of pins, and each interface is connected to a different pin of the main control chip. Different pins correspond to different test sites.

[0036] Optionally, the communication module further comprises: a GPIB communication interface and an Ethernet communication interface connected to the host computer for communication. The GPIB communication interface and the Ethernet communication interface are directly connected to the host computer.

[0037] Optionally, the communication module includes a front panel, and the front panel integrates a GPIB communication interface, an Ethernet communication interface and a plurality of first TTL communication interfaces.

[0038] Optionally, the communication module is installed in the test machine chassis in a drawer-type manner.

[0039] The technical solution of the present invention further provides a radio frequency tester, which includes a communication module.

[0040] Optionally, a host computer in the test machine is provided with test software, the test software supports three communication protocols: GPIB, TTL, and Ethernet, and the test software calls the communication interface of the communication module to realize data interaction between the host computer and the sorting machine / probe station.

[0041] Optionally, debugging software is provided in the host computer of the test machine, and the debugging software includes: a display module, which displays preset information when a test start signal is received, so that the debugger can know the test site corresponding to the test start signal; a return module, which forms a classification signal and a test end signal, and calls the communication module to pass it to the sorting machine / probe station.

[0042] Optionally, a simulation software is provided in the host computer in the test machine, and the simulation software includes: a first signal sending module, which can send a test start signal to the communication module; and a first signal receiving module, which can receive a classification signal returned by the host computer from the communication module.

[0043] Optionally, the testing machine also includes a debugging tool, which includes: a number of second TTL communication interfaces, which are used to communicate with the first TTL communication interface; a second signal sending module, which can send a test start signal to the communication module; a second signal receiving module, which can receive a classification signal and a test end signal returned by the host computer from the communication module; a number of voltage comparators, which are connected to the second signal receiving module, and the voltage comparator has a preset reference level. The classification signal or the test end signal received by the second signal receiving module is used as a comparison level, and the voltage comparator compares the reference level and the comparison level; an LED module, which is connected to the voltage comparator, and when the voltage comparator receives the classification signal or the test end signal, the corresponding LED unit in the LED module flashes.

[0044] Furthermore, in another embodiment, taking a sorting machine as an example (also applicable to a probe station), the present invention designs a universal, modular tester and sorter communication module based on the traditional tester and sorter communication method, as well as a debugging tool that can simulate the communication between the sorter and the tester.

[0045] The communication module mainly includes the design of mechanical structure, hardware and software. The communication module adopts a box-type design, the mechanical structure height is 1~2U, and the length and width are suitable for a 19-inch test machine rack. The communication module and the test machine box are installed in a drawer style, making the equipment assembly more convenient and facilitating the replacement and upgrade of the subsequent communication module.

[0046] The hardware design of the communication module is that the communication module supports three communication modes: TTL, GPIB, and Ethernet. TTL communication transmits test start signals, test end signals, and classification signals through high and low levels, and GPIB communication transmits commands through Visa commands, realizing direct connection between the sorting machine and the test machine controller.

[0047] Figure 1 A schematic diagram of a circuit board design of a communication module disclosed in an embodiment of the present invention is shown in FIG. Figure 1 As shown, the circuit board is provided with a network port 11 for communicating with the host computer and receiving the host computer instructions; the circuit board is also provided with a main control chip 12, and the main control chip 12 is connected to three TTL communication interfaces. The pins connected to the main control chip 12 and the TTL communication interface 15 are respectively used for the transmission of the test start, test end, and classification information of the first test site and the second test site, the pins connected to the main control chip 12 and the TTL communication interface 16 are respectively used for the transmission of the test start, test end, and classification information of the third test site and the fourth test site, and the pins connected to the main control chip 12 and the TTL communication interface 17 are respectively used for the transmission of the test start, test end, and classification information of the fifth test site to the eighth test site. The host computer realizes communication with the sorting machine according to the determined pin definition of the main control chip 12. The circuit board is also provided with a connector 13, the main function of which is to burn the executable program firmware for the main control chip 12; the circuit board is also provided with a pin-shaped power socket and a transformer 14, which can convert the external 220V AC power into a 5V DC power supply to power the TTL board. The working process is as follows: the initial state of the TTL communication interface controlled by the main control chip 12 is a high level. When a low level signal (test start signal) is received, a falling edge is generated. The main control chip 12 recognizes the low level signal (test start signal) of a specific pin and uploads it to the host computer. The test site where the chip to be tested is located can be determined and the test can be performed. After the test is completed, the host computer controls the main control chip 12 to send a classification signal and a test end signal to the TTL communication interface of the corresponding test site to complete the communication.

[0048] The GPIB communication is designed to use Visa commands for communication. Unlike the TTL design, the GPIB communication needs to cache the classified signals first, and then send the corresponding commands uniformly after all the test sites have been tested.

[0049] Ethernet communication follows standard communication protocols, identifies the sorting machine, and sends data packets through the network to achieve communication with the sorting machine.

[0050] Furthermore, this embodiment discloses a test software that supports communication protocols such as GPIB, TTL, and Ethernet. Before testing, the communication method with the sorting machine is selected, and relevant information is configured, including whether to enable communication, resources, delay time, matching of the sorting machine and the test machine test site, etc., wherein the delay time is a setting in the test software. For example, when switching from one test item to another, the resources will change, and it is necessary to wait for the resources to stabilize before testing accurately, so this delay time is set. After the configuration is completed, the test machine and the sorting machine are turned on, and the corresponding hardware is connected. Running the test software can automatically enable the communication module protocol for communication.

[0051] Furthermore, this embodiment discloses a debugging software, which can visually observe the signal emitted by the sorting machine in its software interface, and can emit a specified signal to the sorting machine. The debugging software is compatible with a variety of sorting machine communication types. After the hardware connection between the sorting machine and the test machine is completed, open the debugging software and first set the parameters, including selecting the required sorting machine communication type and resources, setting the timeout time for waiting for the test start signal, the classification information returned by each test site (ie, BIN information), and the time interval for sending the test end signal after receiving the test start signal. After completing the settings, click the start button to start communicating with the sorting machine, Figure 2 A schematic diagram of a debugging software operation flow disclosed in an embodiment of the present invention is shown in FIG. Figure 2 As shown, after determining that the test start signal has been received, the debugging software can inform the debugger through the software interface of the specific test site that received the test start signal, and further form a classification signal and a test end signal to send to the sorting machine to complete the debugging of the test process.

[0052] Furthermore, this embodiment provides a simulation software. Figure 3 Schematic diagram of the operation flow of the simulation software disclosed in the embodiment of the present invention, such as Figure 3 As shown, its main function is to send a test start signal to the test machine and receive a classification signal from the communication module of the test machine, so as to detect the communication function of the communication module. The simulation software can be compatible with multiple communication types. First, select the resource and set the test start signal time, the test site corresponding to the test start signal, and the timeout waiting time when the classification signal is not received. Then initialize the resource, simulate sending the test start signal to the test site, and receive the classification information.

[0053] The simulation software makes it possible to eliminate the need for real-time communication debugging of corresponding sorting machines during the development and production of the test machine communication module, thus avoiding the occupation of large material resources and production space.

[0054] When using simulation software to debug the test machine, you need to run the simulation software first to initialize the resources and set them to a high level.

[0055] S1 opens the simulation software, clicks the start button to run the software and initializes the resources; S2 configures the simulation software; S3 runs the test software; S4 clicks the send test start signal button of the simulation software to send a test start signal to the test site; S5 the test machine receives the test start signal and starts the test. After the test is completed, it classifies the test results and sends the classification signal to the simulation software; S6 the simulation software receives the classification signal and displays the classification information, indicating that the communication module has successfully transmitted the classification signal.

[0056] Furthermore, this embodiment provides a debugging tool for testing a communication module, which replaces the sorting machine to communicate with the testing machine. Figure 4 A schematic diagram of a debugging tool design disclosed in an embodiment of the present invention is shown in FIG. Figure 4 As shown, when the communication debugging tool is used to debug the communication module of the test machine, a maximum of four test sites can be debugged at a time. When debugging the first to fourth test sites, the TTL communication interface 42 and the TTL communication interface 43 of the debugging tool are respectively connected to the TTL communication interface 15 and the TTL communication interface 16 of the communication module by hardware. When debugging the fifth to eighth test sites, the TTL communication interface 41 of the debugging tool is connected to the TTL communication interface 17 of the communication module by hardware.

[0057] Debug tool area 1 is a switch. When using TTL communication interface 42 and TTL communication interface 43 to debug the communication module, the switch controls the transmission of test start signals of the first test site to the fourth test site respectively. When using TTL communication interface 41 to debug the communication module, the switch controls the transmission of test start signals of test site 4 to the eighth test site respectively. When the switch is pressed, the debugging tool transmits a low-level signal (test start signal) to the corresponding test site.

[0058] Debugging tool area 2 is LED lamp beads. In the actual test process, the test machine needs to transmit 8 classification signals and 1 test end signal to each test site of the sorting machine. In order to reduce the size of the debugging tool and save costs, the first test site-the fourth test site and the fifth test site-the eighth test site share a set of test channels. When the debugging tool is used to debug the communication module of the test machine, up to 4 test sites can be debugged at a time, so a total of 36 LED lamp beads are designed. When the TTL communication interface 42 and the TTL communication interface 43 are used to debug the communication module, the 36 LED lamp beads correspond to the classification signals and test end signals in the first test site to the fourth test site respectively. When the TTL communication interface 41 is used to debug the communication module, the 36 LED lamp beads correspond to the classification signals and test end signals in the fifth test site to the eighth test site respectively. When the corresponding test site receives the corresponding signal from the test machine, the corresponding LED lamp bead will flash once.

[0059] Debug tool area 3 is a voltage comparator, which is provided with a reference level and a comparison level. When the comparison level is detected to be lower than the reference level, the corresponding channel is triggered to turn on and the LED lamp beads of the corresponding channel are lit. Each voltage comparator has four channels, so each voltage comparator is set to correspond to the classification signal or test end signal of 4 test sites, that is, the corresponding LED lamp beads are controlled to flash. When the TTL communication interface 42 and the TTL communication interface 43 are used in combination, or the TTL communication interface 41 is used alone to debug the communication module, there are 4 test sites respectively, and there are 36 classification signals and test end signal channels respectively, so a total of 9 voltage comparators are set.

[0060] Furthermore, the operation flow of using the debugging tool in this embodiment is as follows: First, the test machine establishes a hardware connection with the debugging tool and enables the communication module control program. Second, press the switch button of the debugging tool corresponding to the test site to send a test start signal to the test machine. Third, after the test machine receives the test start signal, the corresponding test site starts testing. Fourth, the test machine returns the corresponding classification signal or test end signal, and the LED lamp bead corresponding to the debugging tool flashes once, indicating that the classification signal or test end signal has been received. Fifth, check whether the classification signal and test end signal sent by the test machine correspond one-to-one with the LED lamp bead of the debugging tool to complete the test of the communication module.

[0061] Furthermore, in this embodiment, debugging software and debugging tools can be used for debugging, and the process is as follows: First, the test machine establishes a hardware connection with the debugging tool, and starts running the debugging software. Second, press the switch button of the debugging tool corresponding to the test site to send a test start signal to the test machine. Third, the corresponding test site can be seen on the software interface to indicate that the test start signal has been received, and check whether the information is correct. Fourth, the debugging software returns the set classification signal or test end signal, and the LED lamp bead corresponding to the debugging tool flashes once, indicating that the classification signal or test end signal has been received. Fifth, check whether the classification signal and test end signal sent by the debugging software correspond one-to-one with the LED lamp bead of the debugging tool to complete the test of the communication module.

[0062] In summary, the present invention proposes a universal test machine communication module, which is compatible with communication interfaces such as TTL, GPIB, and network ports, and can be adapted to various types of automatic test machines in enterprises. At the same time, the present invention proposes a communication module debugging test tool, which can simulate the communication mode of various types of sorting machines / probe stations, and perform joint debugging with the test machine communication module, solving the problems of long time and high cost for communication debugging of test machines and sorting machines.

[0063] The present invention proposes a communication module which is compatible with three communication modes, namely TTL, GPIB and network port, so as to solve the problem that the communication module of the test machine needs to be customized according to the type of the sorting machine / probe station. The communication module is structurally designed as a box structure, which is suitable for all test machines with a 19-inch rack structure and adopts a drawer-type installation mode, thereby increasing the versatility and maintainability of the communication module of the test machine.

[0064] The debugging software and simulation software of the debugging communication module corresponding to the present invention can be used in combination to complete the communication debugging between the test machine and the sorting machine / probe station physical machine, the communication function debugging between the test machine and the debugging tool, and the communication function debugging of the independent test machine, which solves the problem that the test machine communication module occupies the sorting machine / probe station resources during the debugging test, resulting in waste of manpower, material resources and other resources, and increased R&D costs.

[0065] The communication module debugging tool corresponding to the present invention adopts a simple design to realize the communication between the simulated sorter / probe station and the test machine, which solves the problem of high communication cost and time cost caused by the test machine and the sorter / probe station coming from different manufacturers, making the testing and debugging of the test machine communication module more convenient and efficient.

[0066] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A communication module for a radio frequency tester, characterized in that: The communication module comprises: A main control chip, which can be connected to the host computer in the test machine for communication; A plurality of first TTL communication interfaces, wherein the first TTL communication interface is connected to the main control chip, the first TTL communication interface can be connected to the sorting machine / probe station for communication, the first TTL communication interface can receive a test start signal sent by the sorting machine / probe station, and can return a test end signal and a classification signal to the sorting machine / probe station.

2. The communication module for a radio frequency tester according to claim 1, characterized in that: The plurality of first TTL communication interfaces include multiple types of interfaces with different numbers of pins, and each interface is connected to a different pin of the main control chip.

3. The communication module for a radio frequency tester according to claim 1, characterized in that: The communication module also includes: A GPIB communication interface and an Ethernet communication interface connected to the host computer.

4. The communication module for a radio frequency tester according to claim 3, characterized in that: The communication module includes a front panel, and the front panel integrates the GPIB communication interface, the Ethernet communication interface and the plurality of first TTL communication interfaces.

5. The communication module for a radio frequency tester according to claim 1, characterized in that: The communication module is installed in the test machine housing in a drawer-type manner.

6. A radio frequency testing machine, characterized in that: The testing machine comprises the communication module described in any one of claims 1-5.

7. The testing machine according to claim 6, characterized in that: The host computer in the test machine is provided with test software, and the test software supports three communication protocols: GPIB, TTL and Ethernet. The test software calls the communication interface of the communication module to realize data interaction between the host computer and the sorting machine / probe station.

8. The testing machine according to claim 7, characterized in that: The host computer in the test machine is provided with debugging software, and the debugging software includes: A display module, when receiving the test start signal, the display module displays preset information so that the debugger can know the test site corresponding to the test start signal; A return module forms a classification signal and a test end signal, and calls the communication module to transmit them to the sorting machine / probe station.

9. The testing machine according to claim 8, characterized in that: The host computer in the test machine is provided with simulation software, and the simulation software includes: a first signal sending module, the first signal sending module being capable of sending a test start signal to the communication module; The first signal receiving module is capable of receiving the classification signal returned by the host computer from the communication module.

10. The testing machine according to claim 9, characterized in that: The test machine also includes a debugging tool, which includes: A plurality of second TTL communication interfaces, wherein the second TTL communication interfaces are used to communicate with the first TTL communication interfaces; a second signal sending module, the second signal sending module being capable of sending a test start signal to the communication module; A second signal receiving module, the second signal receiving module can receive the classification signal and the test end signal returned by the host computer from the communication module; a plurality of voltage comparators, wherein the voltage comparators are connected to the second signal receiving module, a reference level is preset in the voltage comparators, the classification signal or the test end signal received by the second signal receiving module is used as a comparison level, and the voltage comparators compare the reference level with the comparison level; An LED module is connected to the voltage comparator. When the voltage comparator receives the classification signal or the test end signal, the corresponding LED unit in the LED module flashes.

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