Device and method for measuring deflection of substrate glass

Abstract

The present invention discloses a device and method for measuring the deflection of substrate glass, belonging to the technical field of measuring substrate glass. The device constructs a stable support structure of the device by setting a first support member, a second support member and a third support member, providing a solid physical basis for the measurement process; the connection between the substrate glass support platform and the telescopic rod can enable the substrate glass to be measured to move up and down, which is convenient for cutting and measuring; by setting a laser rangefinder, it is used to accurately measure the parameters of the substrate glass after cutting, thereby improving the measurement accuracy; by setting a positioning detection device, it is used to detect the size and damage of the substrate glass to ensure the accuracy of the measurement data; by setting a telescopic rod and a support rod, the substrate glass can be moved up and down and supported, ensuring the smooth progress of the measurement process; by connecting the controller with the board breaking device, the telescopic rod and the cutting wheel, the coordinated work and data processing of each component are realized, thereby improving the measurement efficiency.

Description

Technical Field

[0001] The invention relates to the technical field of measuring substrate glass, and in particular to measuring the deflection of substrate glass. Background Art

[0002] Substrate glass, as the cornerstone of liquid crystal display devices, is an indispensable strategic material in the electronic information display industry. With the advancement of technology and the increase in commercial demand, the size of glass substrates is increasing, and the quality inspection during the manufacturing process is becoming more and more important. Among them, the deflection of substrate glass is one of the key indicators to measure its product quality.

[0003] The impact of deflection on display products cannot be ignored. It not only causes irregular refraction of light, thus affecting the visual effect of the product, but may also cause the glass plate to break when subjected to force or temperature changes, posing a potential safety hazard. Therefore, strict control of deflection is essential during the production of glass substrates to ensure that product quality meets high standards.

[0004] However, in the existing deflection detection technology, the traditional method is relatively simple and has many limitations. Specifically, the traditional method usually supports the glass through a support block and relies on manual reading of the height gauge for measurement. This method is not only limited by the size of the glass substrate and cannot effectively measure the deflection of a large-size glass substrate, but also the accuracy of the manual reading cannot be guaranteed and is easily affected by human factors. In addition, it is necessary to mark the placement point of the support block on the glass before testing. This step is not only time-consuming and labor-intensive, but also greatly reduces work efficiency.

[0005] Therefore, how to overcome the limitations of traditional measurement methods and improve the efficiency of deflection measurement has become a technical problem that technical personnel in this field need to solve urgently. Summary of the invention

[0006] The object of the present invention is to provide a device and method for measuring the deflection of substrate glass, so as to overcome the problem of low efficiency of traditional measuring methods.

[0007] The present invention solves the above technical problems through the following technical solutions: A device for measuring the deflection of a substrate glass comprises a first support member, a second support member, a third support member, a substrate glass support platform, a cutting wheel, a plate breaking device, a laser rangefinder, a positioning detection device, a telescopic rod, a support rod and a controller; The second support member is perpendicular to the ground, and the first support member and the third support member are horizontally arranged on the second support member; the third support member is a frame structure, and the outer side of the frame of the third support member is connected to a board-breaking device that can rotate toward the inside of the third support member. In the initial state, the board-breaking device is parallel to the third support member, and a cutting wheel that can move along the frame is arranged at the bottom of the frame; the substrate glass support platform is fixedly connected to the telescopic rod, and the positioning detection device is installed at the bottom of the substrate glass support platform. The edge of the substrate glass support platform is provided with a hole, and the bottom of the support rod is fixed on the ground. When the substrate glass support platform descends, the top of the support rod passes through the hole to support the substrate glass; the laser rangefinder is arranged at the bottom of the first support member; The controller is electrically connected to the laser rangefinder, the positioning detection device, the board breaking device, the telescopic rod and the cutting wheel respectively.

[0008] A further improvement of the present invention is that it also includes a slide rail, which is arranged at the bottom of the frame and the cutting wheel is installed on the slide rail.

[0009] A further improvement of the present invention is that the probe of the laser rangefinder corresponds to the center position of the third support member.

[0010] A further improvement of the present invention is that it also includes a waste glass recovery tank, and the bottom of the telescopic rod, the support rod and the second support member are all fixed on the waste glass recovery tank.

[0011] A further improvement of the present invention is that it also includes a detachable lock, and the bottom of the telescopic rod is fixed to the waste glass recovery tank through the detachable lock.

[0012] A further improvement of the present invention is that the substrate glass supporting platform and the telescopic rod are an integrally formed structure, and the middle part of the substrate glass supporting platform is a mesh structure.

[0013] A further improvement of the present invention is that: the board-breaking device is hingedly connected to the outer side of the frame of the third support member; and the telescopic rod is a hydraulic rod.

[0014] A method for measuring the deflection of substrate glass, using the above device, comprises the following steps: Obtain the vertical distance H between the laser rangefinder and the support rod, and obtain the thickness D of the substrate glass to be measured; The substrate glass to be tested is placed on the substrate glass support platform, and the substrate glass to be tested is raised to the cutting point by a telescopic rod for cutting. After cutting, the plate breaking device is controlled to rotate for the first time to obtain the cut substrate glass; The size parameters of the substrate glass after cutting are obtained through the positioning detection device, and the controller determines whether the substrate glass is damaged according to the size parameters. When it is judged as yes, the board bending device is controlled to rotate for the second time to scrap the damaged substrate glass; when it is judged as no, the substrate glass supporting platform is lowered to the initial position through the telescopic rod, and the vertical distance X from the laser rangefinder to the substrate glass is obtained through the laser rangefinder, and the controller calculates the deflection according to the vertical distance H, thickness D and vertical distance X.

[0015] A further improvement of the present invention is that the deflection calculation formula is specifically: vertical distance X-thickness D-vertical distance H.

[0016] A further improvement of the present invention is that the angle W1 of the first rotation is in the range of 0<W1≤90°; and the angle W2 of the second rotation is in the range of 90<W2≤180°.

[0017] Compared with the prior art, the positive and progressive effects of the present invention are: The device for measuring the deflection of substrate glass provided by the present invention comprises a first support member, a second support member, a third support member, a substrate glass support platform, a cutting wheel, a plate bending device, a laser rangefinder, a positioning detection device, a telescopic rod, a support rod and a controller; it can overcome the limitations of traditional measurement methods and improve measurement efficiency. Specifically, by setting the first support member, the second support member and the third support member, a stable support structure of the device is constructed, which provides a solid physical foundation for the entire measurement process. The fixed connection between the first support member and the second support member ensures the accuracy of the measurement data; the fixed connection between the third support member and the second support member ensures the accuracy of cutting; the connection between the substrate glass support platform and the telescopic rod can enable the substrate glass to be measured to move up and down, which is convenient for cutting and measurement; by connecting the cutting wheel with the controller, the substrate glass can be accurately cut at the specified position, thereby improving the measurement accuracy; by connecting the board breaking device with the controller, it can automatically rotate to complete the cutting and possible scrapping of the substrate glass, thereby improving the degree of automation of the measurement process; by setting a laser rangefinder, it is used to accurately measure the parameters of the substrate glass after cutting, thereby improving the measurement accuracy; by setting a positioning detection device, it is used to detect the size and damage of the substrate glass to ensure the accuracy of the measurement data; by setting a telescopic rod and a support rod, the substrate glass can be moved up and down and supported, ensuring the smooth progress of the measurement process; by the electrical connection between the controller and other components, the coordinated work and data processing of each component are realized, thereby improving the measurement efficiency.

[0018] Furthermore, the connection design between the slide rail and the cutting wheel is adopted, so that the cutting wheel can move flexibly along the preset frame, thereby achieving accurate cutting of the substrate glass, and improving the cutting accuracy and flexibility.

[0019] Furthermore, by making the probe of the laser rangefinder correspond to the center position of the third support member, the source of error in the measurement process is effectively reduced, and the measurement accuracy is further improved.

[0020] Furthermore, a waste glass recovery tank is provided to collect scrapped substrate glass, so that the whole set of cutting-inspection-scrap procedures can be completed, thereby improving the work efficiency of the whole process.

[0021] Furthermore, the bottom of the telescopic rod is fixed to the waste glass recovery tank by a detachable lock, and can be easily removed from the waste glass recovery tank for replacement or maintenance, which not only simplifies the maintenance process, but also facilitates the cleaning of waste glass and improves the practicality of the device.

[0022] Furthermore, the substrate glass support platform and the telescopic rod are designed as an integrated structure, which enhances the stability and durability of the overall structure; the substrate glass support platform adopts a mesh structure in the middle design, which reduces the weight of the platform while ensuring sufficient support strength, making the device lighter and more flexible while maintaining high performance.

[0023] Furthermore, the board-bending device is connected to the outer side of the frame of the third support member through a hinge, thereby realizing flexible rotation of the board-bending device; a hydraulic rod is used as a power source to provide stable and reliable lifting power for the measurement process, which not only improves the degree of automation of the device, but also ensures the smooth progress of the measurement process and improves the stability and accuracy of the measurement.

[0024] The method for measuring the deflection of substrate glass provided by the present invention not only ensures the accuracy of cutting and the efficiency of scrapping by realizing automatic measurement, but also improves the efficiency and accuracy of measuring deflection. At the same time, the introduction of automatic measurement reduces manual intervention and errors, provides more accurate data support for deflection calculation, and provides more reliable technical guarantee for the quality control of substrate glass. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The drawings in the specification are used to provide further understanding of the present invention and constitute a part of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute improper limitations on the present invention.

[0026] Figure 1 It is a schematic diagram of the overall structure of the present invention; Figure 2 A schematic diagram of a certain viewing angle of the present invention; Figure 3 It is a front view of the present invention; Among them, 1 is the substrate glass support platform; 2 is the support rod; 3 is the third support member; 4 is the laser rangefinder; 5 is the waste glass recovery tank; 6 is the positioning detection device; 7 is the board breaking device; 8 is the cutting wheel; 9 is the first support member; 10 is the second support member; 11 is the telescopic rod. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings here can be arranged and designed in various different configurations.

[0028] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention claimed for protection, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0029] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0030] In the description of the embodiments of the present invention, it should be noted that if the terms "upper", "lower", "horizontal", "inner", etc. indicate an orientation or positional relationship based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship in which the product of the invention is usually placed when in use, it is only for the convenience of describing the present invention and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0031] In addition, it should be noted that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal connection of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0032] The present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments, which are intended to explain the present invention rather than to limit it.

[0033] See also Figure 1 and Figure 2 , a device for measuring the deflection of a substrate glass, comprising a first support member 9, a second support member 10, a third support member 3, a substrate glass support platform 1, a cutting wheel 8, a plate breaking device 7, a laser rangefinder 4, a positioning detection device 6, a telescopic rod 11, a support rod 2 and a controller; The second support member 10 is perpendicular to the ground, and the first support member 9 and the third support member 3 are horizontally arranged on the second support member 10; the third support member 3 is a frame structure, and the outer side of the frame of the third support member 3 is connected to a bending device 7 that can rotate toward the inside of the third support member 3. In the initial state, the bending device 7 is parallel to the third support member 3, and a cutting wheel 8 that can move along the frame is arranged at the bottom of the frame; the substrate glass support platform 1 is fixedly connected to the telescopic rod 11, and the positioning detection device 6 is installed at the bottom of the substrate glass support platform 1. The edge of the substrate glass support platform 1 is provided with a hole, and the bottom of the support rod 2 is fixed on the ground. When the substrate glass support platform 1 descends, the top of the support rod 2 passes through the hole to support the substrate glass; the laser rangefinder 4 is arranged at the bottom of the first support member 9; The controller is electrically connected to the laser rangefinder 4 , the positioning detection device 6 , the board breaking device 7 , the telescopic rod 11 and the cutting wheel 8 respectively.

[0034] By setting the first support, the second support and the third support, a stable support structure of the device is constructed, which provides a solid physical foundation for the entire measurement process. The fixed connection between the first support and the second support ensures the accuracy of the measurement data; the fixed connection between the third support and the second support ensures the accuracy of cutting; the connection between the substrate glass support platform and the telescopic rod can enable the substrate glass to be measured to move up and down, which is convenient for cutting and measurement; by connecting the cutting wheel with the controller, the substrate glass can be accurately cut at the specified position, thereby improving the measurement accuracy; by connecting the board breaking device with the controller, it can automatically rotate to complete the cutting and possible scrapping of the substrate glass, thereby improving the automation of the measurement process; by setting a laser rangefinder, it is used to accurately measure the parameters of the substrate glass after cutting, thereby improving the measurement accuracy; by setting a positioning detection device, it is used to detect the size and damage of the substrate glass to ensure the accuracy of the measurement data; by setting the telescopic rod and the support rod, the substrate glass can be moved up and down and supported, ensuring the smooth progress of the measurement process; by the electrical connection between the controller and other components, the coordinated work and data processing of each component are realized, thereby improving the measurement efficiency.

[0035] Specifically, it also includes a slide rail, which is arranged at the bottom of the frame, and the cutting wheel 8 is installed on the slide rail.

[0036] The connection design between the slide rail and the cutting wheel allows the cutting wheel to move flexibly along the preset frame, thereby achieving precise cutting of the substrate glass and improving the cutting accuracy and flexibility.

[0037] Specifically, the probe of the laser rangefinder 4 corresponds to the center position of the third support member 3 .

[0038] By making the probe of the laser rangefinder correspond to the center position of the third support member, the source of error in the measurement process is effectively reduced and the measurement accuracy is further improved.

[0039] Specifically, it also includes a waste glass recovery tank 5 , and the bottoms of the telescopic rod 11 , the support rod 2 and the second support member 10 are all fixed on the waste glass recovery tank 5 .

[0040] A waste glass recovery tank is provided to collect scrapped substrate glass, which can complete the whole set of cutting-inspection-scrap procedures and improve the work efficiency of the whole process.

[0041] Specifically, it also includes a detachable lock, and the bottom of the telescopic rod 11 is fixed on the waste glass recovery tank 5 through the detachable lock.

[0042] The bottom of the telescopic rod is fixed to the waste glass recycling tank by a detachable lock, and can be easily removed from the waste glass recycling tank for replacement or maintenance, which not only simplifies the maintenance process, but also facilitates the cleaning of waste glass and improves the practicality of the device.

[0043] Specifically, the substrate glass supporting platform 1 and the telescopic rod 11 are an integrally formed structure, and the middle portion of the substrate glass supporting platform 1 is a mesh structure.

[0044] The substrate glass support platform and the telescopic rod are designed as an integrated structure, which enhances the stability and durability of the overall structure; the substrate glass support platform adopts a mesh structure in the middle design, which reduces the weight of the platform while ensuring sufficient support strength, making the device lighter and more flexible while maintaining high performance.

[0045] Specifically, the board-breaking device 7 is hingedly connected to the outer side of the frame of the third support member 3; and the telescopic rod 11 is a hydraulic rod.

[0046] The board-bending device is connected to the outer side of the frame of the third support member through a hinge, which enables flexible rotation of the board-bending device; a hydraulic rod is used as a power source to provide stable and reliable lifting power for the measurement process, which not only improves the automation level of the device, but also ensures the smooth progress of the measurement process and improves the stability and accuracy of the measurement.

[0047] Based on the same inventive concept, the present invention also provides a method for measuring the deflection of a substrate glass, using the above device, comprising the following steps: Obtain the vertical distance H between the laser rangefinder 4 and the support rod 2, and obtain the thickness D of the substrate glass to be measured; The glass substrate to be tested is placed on the glass substrate support platform 1, and the glass substrate to be tested is raised to the cutting point by the telescopic rod 11 for cutting. After cutting, the plate breaking device 7 is controlled to rotate for the first time to obtain the cut glass substrate; The size parameters of the substrate glass after cutting are obtained through the positioning detection device 6, and the controller determines whether the substrate glass is damaged according to the size parameters. When it is judged as yes, the bending device 7 is controlled to rotate for the second time to scrap the damaged substrate glass; when it is judged as no, the substrate glass supporting platform 1 is lowered to the initial position through the telescopic rod 11, and the vertical distance X from the laser rangefinder 4 to the substrate glass is obtained through the laser rangefinder 4, and the controller calculates the deflection according to the vertical distance H, thickness D and vertical distance X.

[0048] This method not only ensures the accuracy of cutting and the efficiency of scrapping by realizing automated measurement, but also improves the efficiency and accuracy of measuring deflection. At the same time, the introduction of automated measurement reduces manual intervention and errors, provides more accurate data support for deflection calculation, and provides more reliable technical guarantee for the quality control of substrate glass.

[0049] Specifically, the deflection calculation formula is: vertical distance X-thickness D-vertical distance H.

[0050] Specifically, the angle W1 of the first rotation is in the range of 0<W1≤90°; the angle W2 of the second rotation is in the range of 90<W2≤180°.

[0051] Finally, it should be noted that the above-listed embodiments exist only as one or more specific forms of expression of the technical solution of the present invention. Their purpose is to clearly explain the concept, principle and application of the present invention through specific examples, and it is by no means intended to limit the protection scope of the present invention to these specific embodiments. In fact, the real value of the present invention lies in the technical ideas and innovations it proposes, rather than its form of expression or means of implementation.

[0052] For ordinary technicians in the relevant technical field, after in-depth reading and understanding of the technical solution of the present invention, they are fully capable of making various forms of changes, modifications or equivalent substitutions to the specific implementation methods of the invention based on their own professional knowledge and skills. These changes may include but are not limited to: adjusting the value range of technical parameters, optimizing algorithm processes to improve efficiency, replacing some technical components to achieve better compatibility or reduce costs, etc. As long as these changed technical solutions still substantially maintain the technical features claimed for protection by the original invention, that is, they can still achieve the core functions and effects of the present invention, then these changes should be deemed to fall within the scope of protection of the pending claims of the present invention.

[0053] In addition, with the continuous progress and development of technology, new technical means and methods continue to emerge, which also provides broad space for further improvement and perfection of the present invention. Therefore, the protection scope of the present invention should also include those reasonably foreseeable improvements and extensions based on the existing technology. As long as these improvements and extensions do not deviate from the basic principles and core concepts of the present invention, they should be regarded as equivalents of the present invention and are also protected by patent rights.

Claims

1. A device for measuring the deflection of a substrate glass, characterized in that: It comprises a first support member (9), a second support member (10), a third support member (3), a substrate glass support platform (1), a cutting wheel (8), a board breaking device (7), a laser rangefinder (4), a positioning detection device (6), a telescopic rod (11), a support rod (2) and a controller; The second support member (10) is perpendicular to the ground, and the first support member (9) and the third support member (3) are arranged horizontally on the second support member (10); the third support member (3) is a frame structure, and the outer side of the frame of the third support member (3) is connected to a bending device (7) that can rotate toward the inside of the third support member (3); in an initial state, the bending device (7) is parallel to the third support member (3), and a cutting wheel (8) that can move along the frame is arranged at the bottom of the frame; the substrate glass support platform (1) is fixedly connected to the telescopic rod (11), the positioning detection device (6) is installed at the bottom of the substrate glass support platform (1), the edge of the substrate glass support platform (1) is provided with a hole, the bottom of the support rod (2) is fixed on the ground, and when the substrate glass support platform (1) descends, the top of the support rod (2) passes through the hole to support the substrate glass; the laser rangefinder (4) is arranged at the bottom of the first support member (9); The controller is electrically connected to the laser rangefinder (4), the positioning detection device (6), the board bending device (7), the telescopic rod (11) and the cutting wheel (8) respectively.

2. The device for measuring the deflection of substrate glass according to claim 1, characterized in that: It also includes a slide rail, which is arranged at the bottom of the frame, and the cutting wheel (8) is installed on the slide rail.

3. The device for measuring the deflection of substrate glass according to claim 1, characterized in that: The probe of the laser rangefinder (4) corresponds to the center position of the third support member (3).

4. The device for measuring the deflection of substrate glass according to claim 1, characterized in that: It also comprises a waste glass recovery tank (5), on which the bottoms of the telescopic rod (11), the support rod (2) and the second support member (10) are all fixed.

5. The device for measuring the deflection of substrate glass according to claim 4, characterized in that: It also comprises a detachable lock, and the bottom of the telescopic rod (11) is fixed on the waste glass recovery tank (5) via the detachable lock.

6. The device for measuring the deflection of substrate glass according to claim 1, characterized in that: The substrate glass support platform (1) and the telescopic rod (11) are an integrally formed structure, and the middle portion of the substrate glass support platform (1) is a mesh structure.

7. The device for measuring the deflection of substrate glass according to claim 1, characterized in that: The board-breaking device (7) is hingedly connected to the outer side of the frame of the third support member (3); and the telescopic rod (11) is a hydraulic rod.

8. A method for measuring the deflection of a substrate glass, characterized in that: The device according to any one of claims 1 to 7 comprises the following steps: Obtaining a vertical distance H between the laser rangefinder (4) and the support rod (2), and obtaining a thickness D of the substrate glass to be measured; Placing the substrate glass to be tested on the substrate glass support platform (1), raising the substrate glass to be tested to a cutting point by means of a telescopic rod (11) for cutting, and after cutting, controlling the plate breaking device (7) to perform a first rotation to obtain the cut substrate glass; The size parameters of the substrate glass after cutting are obtained by the positioning detection device (6), and the controller determines whether the substrate glass is damaged according to the size parameters. When it is determined to be damaged, the plate bending device (7) is controlled to rotate for the second time, and the damaged substrate glass is scrapped. When it is determined to be damaged, the substrate glass support platform (1) is lowered to the initial position by the telescopic rod (11), and the vertical distance X from the laser rangefinder (4) to the substrate glass is obtained by the laser rangefinder (4). The controller calculates the deflection according to the vertical distance H, the thickness D and the vertical distance X.

9. The method for measuring the deflection of a substrate glass according to claim 8, characterized in that: The specific formula for calculating deflection is: vertical distance X-thickness D-vertical distance H.

10. The method for measuring the deflection of a substrate glass according to claim 8, characterized in that: The range of the angle W1 of the first rotation is 0<W1≤90°; the range of the angle W2 of the second rotation is 90<W2≤180°.

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