ADC irradiation detection method

Abstract

The present invention discloses an ADC radiation detection method, which belongs to the field of chip detection. The method first constructs a radiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit, and a matrix switch unit. The programmable gate array unit parses the configuration instruction into an excitation signal, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signal to the ADC to be tested and the reference ADC. Secondly, a transient pulse test is performed based on the radiation detection circuit to detect whether a transient pulse occurs in the ADC to be tested under an irradiated environment. In addition, functional tests are performed in a non-radiation environment and a radiation environment based on the radiation detection circuit to detect whether the function of the ADC to be tested is normal. Through the application of the present invention, it is possible to accurately determine whether there is a problem with the ADC.

Description

Technical Field

[0001] The present invention relates to an ADC radiation detection method, belonging to the field of chip detection. Background Art

[0002] An analog-to-digital converter (A / D converter, or ADC for short) is a chip that converts analog signals into digital signals. Primarily used for data acquisition, it can be used in diverse environments, such as those with high temperature, humidity, vibration, and radiation. Radiation environments are particularly challenging in the aerospace sector. With the rapid development of the aerospace industry, single-event radiation-resistant ADCs are increasingly being used in aerospace equipment. Therefore, assessing the radiation resistance of ADCs is crucial. However, currently, inaccurate radiation testing results in China make it difficult to accurately assess the radiation resistance of ADCs. Summary of the Invention

[0003] The technical problem solved by the present invention is to overcome the deficiencies of the prior art and propose an ADC irradiation detection method to achieve the technical effect of accurately judging whether there is a problem with the ADC.

[0004] The technical solution of the present invention is:

[0005] An ADC radiation detection method, comprising:

[0006] Build an irradiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit, and a matrix switch unit. The programmable gate array unit parses the configuration instructions into excitation signals, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signals to the ADC under test and the reference ADC;

[0007] Transient pulse test based on radiation detection circuit: The radiation detection circuit operates in an irradiated environment, using the transient pulse-free value of the reference ADC as the standard value. The programmable gate array unit receives voltage information from the ADC under test and the reference ADC. When the difference between the transient pulse value of the ADC under test and the standard value exceeds the set transient pulse threshold and the duration exceeds the set pulse width threshold, it is determined that a transient pulse has occurred in the ADC under test.

[0008] Functional testing based on the radiation detection circuit: The radiation detection circuit operates in a non-irradiated environment, and the programmable gate array unit records the operating current of the ADC under test. Then, the radiation detection circuit operates in an irradiated environment and performs the following tests:

[0009] During the same cycle of irradiation, if the difference in the digital quantity collected by the sampling points of the ADC under test and the reference ADC is lower than the set maximum error threshold of the sampling point, it is defined as a normal sampling point; otherwise, it is an abnormal sampling point; the programmable gate array unit obtains the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle. When Y1 / Y is greater than the set signal abnormality rate threshold, it is determined that the ADC under test has a functional interruption; otherwise, it is determined that the ADC under test is functioning normally;

[0010] The programmable gate array unit compares the operating current of the ADC under test in the irradiated environment with the operating current of the ADC under test in the non-irradiated environment. If the absolute value of the difference between the two is greater than the set maximum error of the operating current, it is determined that the ADC under test is functioning abnormally; otherwise, it is determined that the ADC under test is functioning normally.

[0011] Furthermore, the set transient pulse threshold, pulse width threshold, signal anomaly rate threshold, maximum error threshold of the acquisition point of the acquisition signal, operating current threshold and maximum operating current error are configured as a test stimulus set, and the programmable gate array unit parses the test stimulus set to ensure that the information received by the ADC under test and the reference ADC is completely consistent.

[0012] Furthermore, there are multiple ADCs to be tested, and the multi-channel switching unit and the matrix switching unit control the multiple ADCs to be tested to perform tests, so as to determine the test order of the multiple ADCs to be tested.

[0013] Furthermore, the radiation detection circuit further includes a precision reference source unit for supplying power to the plurality of ADCs to be tested, so as to ensure that the references of all ADCs to be tested are consistent, thereby reducing the reference source signal error between the ADCs to be tested.

[0014] Furthermore, when the radiation detection circuit is operating in a radiation environment, if the operating current of the ADC to be tested is greater than a set operating current threshold and the duration exceeds the operating current duration threshold, the precision reference source unit cuts off power to the ADC to stop the test.

[0015] Furthermore, before executing the power-off operation, the precision reference source unit sends a power-off signal to the programmable gate array unit, and the programmable gate array unit obtains the output waveform, operating voltage and operating current of the ADC to be tested, and records them in the database for storage.

[0016] Furthermore, when the radiation detection circuit is working in the radiation environment, the first two bits of the n-bit ADC to be tested are removed, and the 2-n bits are XORed to obtain the number of samples P in a single cycle. According to the radiation time t and the signal period T, the total data bit A is obtained, and the flip number B during the radiation period is obtained. n , in order to accurately obtain the performance status of the ADC to be tested.

[0017] Furthermore, if there are multiple ADCs to be tested, the same number of test stimulus sets are set, and each test stimulus set corresponds to one ADC to be tested, thereby improving the data detection rate of the programmable gate array unit; in addition, if the programmable gate array unit detects that one of the ADCs to be tested is functionally abnormal, the test stimulus set corresponding to the ADC is used as the test stimulus set for the ADC and any other ADC to be tested. If only the ADC that was previously functionally abnormal becomes abnormal again, the ADC is confirmed to be functionally abnormal, thereby improving the inspection accuracy.

[0018] The advantages of the present invention compared with the prior art are:

[0019] (1) The present invention constructs an irradiation detection circuit, in which a programmable gate array unit parses a configuration instruction into an excitation signal, and a multi-way switching unit and the matrix switch unit synchronously input the excitation signal to the ADC to be tested and the reference ADC to ensure synchronization of control timing and data return between the ADC to be tested and the reference ADC, thereby improving detection accuracy.

[0020] (2) The present invention can realize simultaneous detection of multiple ADCs to be tested, and at the same time, power the multiple ADCs to be tested through a precision reference source unit, thereby ensuring that the references of the ADCs to be tested are consistent and reducing the reference source signal error between the ADCs to be tested.

[0021] (3) The present invention integrates the threshold values ​​of various detection parameters into a test stimulus set, and parses the test stimulus set through a programmable gate array unit to ensure that the information received by the ADC under test and the reference ADC is completely consistent. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiment below. The accompanying drawings are for illustration purposes only and are not to be considered as limiting the present invention. The same reference symbols are used throughout the drawings to represent the same components. In the drawings:

[0023] Figure 1 Flowchart of the ADC irradiation detection method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0024] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0025] The present invention proposes an ADC irradiation detection method, such as Figure 1 As shown, specifically including:

[0026] S1: Build an irradiation detection circuit. The irradiation detection circuit includes a programmable gate array unit, a multi-channel switching unit, and a matrix switch unit. The programmable gate array unit parses the configuration instructions into excitation signals. The multi-channel switching unit and the matrix switch unit synchronously input the excitation signals to the ADC to be tested and the reference ADC to ensure that the two excitation signals of the ADC to be tested and the reference ADC are completely consistent, so as to control the synchronization of timing and data return.

[0027] S2: Preset transient pulse thresholds and pulse width thresholds. The reference ADC's transient pulse-free value is used as the standard. When the difference between the transient pulse value of the ADC under test and the standard exceeds the transient pulse threshold and the duration exceeds the pulse width threshold, a transient pulse is determined to have occurred. The reference ADC and the ADC under test are identical devices.

[0028] S3: Preset the signal abnormality rate threshold X and the maximum error threshold of the acquisition point of the acquisition signal. When the digital value difference between the ADC to be tested and the reference ADC in the same week during the irradiation period is lower than the maximum error threshold of the acquisition point, it is defined as a normal sampling point. Otherwise, it is an abnormal sampling point. Obtain the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle. When Y1 / Y>X, the ADC to be tested is functionally interrupted. When Y1 / Y≤X, the ADC to be tested is normal.

[0029] S4: Preset the operating current threshold IDD1 and the maximum operating current error M, record the operating current IDD0 of the ADC under test before irradiation and the operating current IDD2 of the ADC under test after irradiation, and when |IDD2-IDD0|>M, the ADC under test is functionally abnormal; when |IDD2-IDD0|≤M, the ADC under test is functionally normal.

[0030] S5: Send the results of steps S2 to S4 to the programmable gate array unit. Through the judgment method of S2 to S4, it is possible to accurately determine whether the ADC to be tested is abnormal, and if so, accurately obtain the abnormal condition.

[0031] During the irradiation period, remove the first two bits of the n-bit ADC to be measured, perform XOR on the 2-n bits, and obtain the number of samples P in a single cycle. The irradiation time is t, the signal period is T, and the total data volume is A. A=A=(t / T)×P, and the flip number B during the irradiation period is obtained. n , flip rate = B n / A. By obtaining the flip rate of the ADC under test, the performance status of the ADC under test can be accurately obtained.

[0032] In each of the above steps, the transient pulse threshold is set at 10% of the measured signal output by the ADC under test; the pulse width threshold is set at the microsecond level, with flexibility depending on test requirements; the signal anomaly rate threshold is defined as the number of anomalies occurring in a sinusoidal signal over n cycles. The maximum error threshold for the sampling point of the acquired signal is defined as follows: The error threshold is the allowable error ratio based on the amount of anomalies in the sampled data over n cycles at a certain rate during irradiation, with the base value being the sampled data volume over n cycles. The operating current threshold is defined as the base current, with the threshold value set at 1.5 times the normal current.

[0033] In a possible implementation, the detection circuit can be connected to multiple ADCs to be tested, and the multi-way switching unit and the matrix switch unit control the multiple ADCs to be tested to determine the test order of the multiple ADCs to be tested and facilitate switching the tests of the multiple ADCs to be tested.

[0034] In one possible implementation, the detection circuit further includes a precision reference source unit that supplies power to multiple ADCs under test, ensuring a consistent reference reference across them and reducing reference source signal errors between them. Furthermore, a preset operating current duration threshold is established. When the operating current of the ADC under test exceeds IDD1 during irradiation and the duration exceeds the operating current duration threshold, the precision reference source unit powers off the ADC under test, halting testing.

[0035] Furthermore, before the precision reference source unit is powered off, the programmable gate array unit obtains the output waveform, operating voltage and operating current of the ADC to be measured at that time, and records them in the database for storage to avoid data loss due to sudden power failure.

[0036] In one possible implementation, the required test configuration is preset as a test stimulus set to facilitate synchronous data transmission. For example, the transient pulse threshold, pulse width threshold, signal anomaly rate threshold X, maximum error threshold of the acquisition point of the acquisition signal, operating current threshold IDD1 and maximum operating current error M are configured as a test stimulus set. The programmable gate array unit parses the test stimulus set to ensure that the information received by the ADC under test and the reference ADC is completely consistent.

[0037] Furthermore, the test stimulus set includes a first test stimulus set, a second test stimulus set, and a third test stimulus set. At the first time when the first ADC under test performs the first test task, the first ADC under test and the reference ADC simultaneously input the first test stimulus set to obtain a first test result. At the second time when the first ADC under test performs the first test task, the second ADC under test and the reference ADC simultaneously input the second test stimulus set to obtain a second test result. At the third time when the first ADC under test performs the first test task, the third ADC under test and the reference ADC simultaneously input the third test stimulus set to obtain a third test result. Rapid clock switching enables synchronous detection of the three types of test tasks under the same test task, as well as synchronous collection of test results, thereby achieving a more efficient testing process.

[0038] When the first test result is abnormal, the second ADC under test and the reference ADC are simultaneously fed with the first test stimulus set. If the test results are normal, it is determined that there is a problem with the first ADC under test. By comparing the results, the results are more accurate.

[0039] The above-described embodiments are only preferred specific implementations of the present invention. Common changes and substitutions made by those skilled in the art within the scope of the technical solution of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for detecting ADC irradiation, characterized in that: include: Build an irradiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit, and a matrix switch unit. The programmable gate array unit parses the configuration instructions into excitation signals, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signals to the ADC under test and the reference ADC; Transient pulse test based on radiation detection circuit: The radiation detection circuit operates in an irradiated environment, using the transient pulse-free value of the reference ADC as the standard value. The programmable gate array unit receives voltage information from the ADC under test and the reference ADC. When the difference between the transient pulse value of the ADC under test and the standard value exceeds the set transient pulse threshold and the duration exceeds the set pulse width threshold, it is determined that a transient pulse has occurred in the ADC under test. Functional testing based on the radiation detection circuit: The radiation detection circuit operates in a non-irradiated environment, and the programmable gate array unit records the operating current of the ADC under test. Then, the radiation detection circuit operates in an irradiated environment and performs the following tests: During the same period of irradiation, if the difference between the digital values ​​collected by the sampling points of the ADC under test and the reference ADC is lower than the set maximum error threshold of the sampling point, it is defined as a normal sampling point, otherwise it is an abnormal sampling point; The programmable gate array unit obtains the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle. When Y1 / Y is greater than the set signal abnormality rate threshold, it is determined that the ADC under test has a functional interruption; otherwise, it is determined that the ADC under test is functioning normally. The programmable gate array unit compares the operating current of the ADC under test in the irradiated environment with the operating current of the ADC under test in the non-irradiated environment. If the absolute value of the difference between the two is greater than the set maximum error of the operating current, it is determined that the ADC under test is abnormal; otherwise, it is determined that the ADC under test is normal. When the radiation detection circuit is working in the radiation environment, the ADC to be tested Remove the first 2 digits of the number, and then Bitwise XOR, get the number of samples in a single cycle , according to the irradiation time , signal period , get the total data bit A, get the flip number during irradiation , in order to accurately obtain the performance status of the ADC to be tested.

2. The ADC irradiation detection method according to claim 1, wherein: The set transient pulse threshold, pulse width threshold, signal anomaly rate threshold, maximum error threshold of the acquisition point of the acquisition signal, operating current threshold and maximum error of the operating current are configured as a test stimulus set. The programmable gate array unit parses the test stimulus set to ensure that the information received by the ADC under test and the reference ADC is completely consistent.

3. The ADC radiation detection method according to claim 1, wherein: There are multiple ADCs to be tested. The multi-channel switching unit and the matrix switching unit control the multiple ADCs to be tested to perform tests, so as to determine the test order of the multiple ADCs to be tested.

4. The ADC irradiation detection method according to claim 3, wherein: The radiation detection circuit further comprises a precision reference source unit for supplying power to the plurality of ADCs to be tested, so as to ensure that the references of all ADCs to be tested are consistent and reduce the reference source signal error between the ADCs to be tested.

5. The ADC irradiation detection method according to claim 4, characterized in that: When the radiation detection circuit is working in a radiation environment, if the operating current of the ADC to be tested is greater than a set operating current threshold and the duration exceeds the operating current duration threshold, the precision reference source unit cuts off the power to the ADC to stop the test.

6. The ADC irradiation detection method according to claim 5, characterized in that: Before executing the power-off operation, the precision reference source unit sends a power-off signal to the programmable gate array unit. The programmable gate array unit obtains the output waveform, operating voltage and operating current of the ADC to be tested, and records them in the database for storage.

7. The ADC irradiation detection method according to claim 2, characterized in that: If there are multiple ADCs to be tested, set the same number of test stimulus sets, each test stimulus set corresponding to one ADC to be tested, to increase the data detection rate of the programmable gate array unit; In addition, if the programmable gate array unit detects that one of the ADCs to be tested is malfunctioning, the test stimulus set corresponding to the ADC will be used as the test stimulus set for the ADC and any other ADC to be tested. If only the ADC that was previously malfunctioning becomes abnormal again, the ADC is confirmed to be malfunctioning, thereby improving the accuracy of the inspection.

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