57 results about "Pulse test" patented technology

The present application relates to the technical field of electric fault detection, in particular to a pressure sensitive device damage diagnosis system combined with pulse test, comprising the following modules: an original signal acquisition module, inputting pulse sequences to the pressure sensitive device, recording voltage response signals and current response signals under each pulse sequence respectively, and generating a response signal set; based on the response signal set, wavelet decomposition is performed on the voltage response signals and the current response signals. In the present application, the pulse sequences are inputted and the voltage response signals and the current response signals under each pulse sequence are recorded, so that the data acquisition covers different working states and reduces the feature loss caused by a single test point. The voltage response signals and the current response signals are divided into different frequency intervals by using the wavelet decomposition method, which is helpful to separate the high-frequency and low-frequency features, so that the local abnormal signals are not covered by the global features, and the analysis ability for short-time fault features is enhanced.

The invention relates to a method, a device and a system for measuring electrical parameters of an IGBT (Insulated Gate Bipolar Translator) module. The method comprises the steps of obtaining a historical double-pulse test result of an IGBT module, and obtaining a historical residual life curve; according to the difference between the historical remaining life of each abnormal inflection point and the historical remaining life of the adjacent test data point, determining the anomaly degree of the abnormal inflection point; in each abnormal interval, according to the proportion of fault working condition subintervals in the working condition data and the deviation degree of the multiple monitoring parameters, the fluctuation degree in the abnormal interval is determined; determining the matching degree of the abnormal inflection point based on the difference between the abnormity degree and the fluctuation degree of each abnormal inflection point; and performing a double-pulse test on the IGBT module once to obtain the current residual life, and correcting the current residual life based on the matching degree of the plurality of abnormal inflection points and the difference of the historical residual life between the adjacent test data points in the corresponding abnormal interval to obtain a target residual life value. According to the invention, the accuracy of residual life prediction of the IGBT module can be improved.

The invention relates to a double-pulse test tool and method for a full-control device series valve, and the tool comprises an upper computer main control unit which is used for transmitting a control instruction, receiving waveform data, and carrying out the automatic parameter calculation; the control unit is connected with the upper computer main control unit, comprises a high-voltage power supply, a support capacitor and a bridge arm change-over switch, and is used for providing adjustable high voltage and realizing rapid reconstruction of a test loop; the test unit is electrically connected with the control unit and the to-be-tested device and comprises a busbar box and a load inductor, and the busbar box is used for interconnecting the supporting capacitor, the load inductor, the bridge arm change-over switch and the to-be-tested device to form an energy transmission main loop; and the acquisition unit is connected with the upper computer main control unit and the test unit, comprises an oscilloscope, a voltage probe and a current probe, and is used for capturing the electrical parameter waveform of the device to be tested in real time and uploading the electrical parameter waveform to the upper computer main control unit.

This application discloses a double-pulse testing device and method for power semiconductors, belonging to the field of power semiconductor technology. The device includes: a global control module, used to generate a parameter package based on the test task and characteristic parameters of the target device when a double-pulse test is to be performed on a target device, send the parameter package to a target local execution module, and iteratively adjust the parameter package based on the double-pulse test results of the target device fed back by the target local execution module, while simultaneously sending the iteratively adjusted parameter package to the target local execution module until the double-pulse test results of the target device fed back by the target local execution module meet the test objective; and a target local execution module, used to perform double-pulse testing on the target device according to the parameter package issued by the global control module, and to feed back the double-pulse test results of the target device to the global control module. This device can improve the efficiency and accuracy of double-pulse testing of power semiconductors.

The present application relates to seismic instrument testing technology, and discloses a seismic instrument testing method based on data communication, which comprises the following steps: a host computer is connected with a seismic instrument through handshaking, and the seismic instrument obtains testing instructions from the host computer; the testing instructions are analyzed to obtain a testing type and enter a testing mode; when the testing type is index testing, the seismic instrument is tested according to the testing instructions to obtain a first testing result; when the testing type is state testing, the seismic instrument is tested according to the testing instructions to obtain a second testing result; the first testing result and the second testing result are sent to the host computer, and the testing mode is exited; the seismic instrument is updated according to the testing data, and the testing is completed after the updating is finished. The present application also discloses a seismic instrument testing device based on data communication, an electronic device and a storage medium. The present application can improve the seismic instrument testing efficiency.

This application relates to a control link delay testing system, method, and apparatus. The system method includes: a valve control system and a test pulse module; the valve control system includes a main control module and a control link, the test pulse module is connected to the main control module via the control link, and the test pulse module is also directly connected to the main control module; the test pulse module outputs a preset test excitation signal to the main control module via the control link, receives a response signal returned by the main control module, and determines the uplink delay of the control link based on the transmission time of the test excitation signal and the reception time of the response signal; the test pulse module receives a pulse test signal sent by the main control module, and also receives a drive signal sent by the main control module via the control link, and determines the downlink delay of the control link based on the reception time of the pulse test signal and the reception time of the drive signal. Through the above testing process, accurate measurement of the uplink and downlink delays of the valve control system's control link can be achieved.

The utility model provides a kind of perovskite and metal oxide composite structure artificial synapse device, including high doped silicon layer, silicon oxide layer, perovskite film and metal oxide film, the top of high doped silicon layer is provided with silicon oxide layer, the top of silicon oxide layer is provided with perovskite film, the top of perovskite film is provided with metal oxide film.The utility model changes device structure to realize the function of artificial synapse, makes device to appear counterclockwise hysteresis when being bidirectional transmission characteristic curve test, and output current shows memory function when being pulse test.Through depositing perovskite film first, subsequently depositing metal oxide film on perovskite film, avoid the direct contact of perovskite film and air, so that device has better stability and life.The preparation method of the utility model only includes spin coating, magnetron sputtering and thermal evaporation, and operation process is simpler, process is compatible simultaneously, and time cost and process cost are lower.

This invention provides an automatic parameter extraction method and system for GaN HEMT device models based on differential evolution algorithms, belonging to the field of semiconductor device modeling technology. By deeply integrating the global optimization capability of differential evolution algorithms with semiconductor device physical models, and utilizing pulse test data and self-heating effect iterative models, this invention achieves physical-level decoupling of electrical and thermal parameters. It overcomes the problems of traditional methods, such as being prone to getting trapped in local optima, the tendency for small physical quantities to collapse to zero values, and the extraction distortion caused by multi-physics coupling, significantly improving parameter extraction accuracy and model generalization ability.

The invention discloses a portable rechargeable high-voltage ignition pulse tester for dual-channel isolated acquisition, and belongs to the technical field of high-voltage pulse signal testing equipment. The tester comprises a main control module, a battery management system, a dual-channel pulse signal monitoring module, a man-machine interaction module and a power management module. Each path of the dual-channel pulse signal monitoring module is independently provided with a gas discharge tube for protection and photoelectric isolation and is independently powered by the isolation DC-DC module, so that complete electrical isolation of a high-voltage side and a low-voltage side is realized, and safety and measurement precision are ensured. The main control module adopts a microcontroller to collect and process amplitudes and times of two paths of ignition pulses in real time, information such as pulse counting, voltage values and battery electric quantity is visually displayed through a display screen, and the device is particularly suitable for high-voltage ignition pulse external field rapid detection and maintenance of engines and ignition devices in the fields of aviation, military industry and the like.

The application provides a multi-parameter fusion asphalt mixture acoustic emission sensor layout optimization method, comprising: arranging a plurality of acoustic emission sensors at equal intervals along a straight line parallel to the longitudinal direction of the surface of the asphalt mixture to be measured, performing an acoustic emission pulse test, and measuring amplitude, ringing count and wave speed; determining an effective arrangement range in which acoustic emission signals can be effectively received according to the distance at which each index attenuates by 50%, and taking the minimum value as the initial interval of the acoustic emission sensor arrangement; according to the CRLB principle, an optimization function of the acoustic emission sensor network layout is constructed; and the optimization function in step S2 is solved by using an improved genetic algorithm. The application determines the physical space constraint of the effective arrangement of the sensor through standard attenuation testing and multi-parameter fusion, constructs a regional overall positioning accuracy optimization function that fuses the exponential wave speed equation and the spatial uncertainty of the sound source, and improves the physical accuracy and reliability of the layout optimization model from a theoretical source.

The invention discloses a double-pulse test circuit and method suitable for a high-voltage SiC MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor), and belongs to the technical field of semiconductor device testing. The circuit comprises an FPGA (Field Programmable Gate Array) controller, a driving main chip, a desaturation short circuit detection circuit, a bidirectional voltage-stabilizing protection circuit, a SiC MOSFET upper tube test loop and a SiC MOSFET lower tube; the output end of the FPGA controller is connected with the input end of the SiC MOSFET upper tube test loop and the input end of the driving board, and the input end of the FPGA controller is connected with the output end of the driving main chip. The input end of the desaturation short circuit detection circuit is electrically connected with the drain electrode and the source electrode of the SiC MOSFET lower tube, and the input end of the desaturation short circuit detection circuit is electrically connected with the driving main chip. One end of the bidirectional voltage stabilization protection circuit is connected with the output end of the driving main chip, and the other end of the bidirectional voltage stabilization protection circuit is connected with the grid electrode of the SiC MOSFET lower tube. The high-voltage SIC MOSFET test circuit can solve the problem that the high-voltage SIC MOSFET test circuit is low in safety.

This application relates to a method, system, and computer device for selecting the number of pulses for blind vias. The method includes: obtaining the adaptive power of a test board; machining multiple first blind vias on the test board using the adaptive power and different pulse test counts; observing the hole quality characteristics of the multiple first blind vias; and selecting an appropriate number of pulses from the different pulse test counts. This method improves the accuracy of selecting the number of pulses for blind vias, thereby improving the machining quality of blind vias.

The invention relates to the technical field of high-frequency pressure pulse test devices, in particular to a knocking-based adjustable high-frequency pressure pulse output device and a control method. The detonation device is characterized by comprising a fuel gas mixing device, a detonation pipe and a detonation pipe collecting device, the fuel gas mixing device is arranged at the front end of the detonation pipe, the detonation pipe collecting device is arranged at the rear end of the detonation pipe, and a pressure relief device is further arranged at an outlet of the detonation pipe collecting device. The fuel gas mixing device is connected with the gas filling control system and the time sequence control module, and an electric spark generator is arranged on the fuel gas mixing device; a fuel gas mixing device is adopted for filling gas into a plurality of detonation pipes at the same time, each detonation pipe is provided with an independent ignition source, and the ignition time sequence is controlled by a time sequence control module in a unified mode. A detonation gathering device is adopted, and the structure can achieve pressure pulse output through a single tube. A delay control module and an electromagnetic valve group are adopted to control the gas filling time, and the pulse intensity is adjustable under the assistance of a pressure relief device.

The SiC MOSFET oscillation suppression circuit comprises a double-pulse test circuit, a first clamping voltage circuit, a second clamping voltage circuit, a first starting circuit, a second starting circuit, a first energy recovery circuit, a second energy recovery circuit, a first diode D1 and a second diode D2. According to the invention, a double-pulse test circuit is creatively proposed, and a clamping voltage circuit, a starting circuit and an energy recovery circuit are designed, and a diode D1 is used for control; the problems that the oscillation suppression effect of a SiC MOSFET oscillation suppression circuit is not obvious, an active gate drive mode circuit is complex, the clamping voltage peak suppression effect of a traditional clamping RCD circuit is not obvious, and energy loss is large in the energy recovery process are effectively solved. In the turn-off process of the device, the clamping voltage part of the circuit not only can well clamp overshoot and suppress oscillation in the turn-off process of the device, but also can reduce the peak value of the clamping voltage, and has a smaller oscillation peak value.

The invention discloses an online monitoring system and method for an industrial motor, and relates to the technical field of motor state monitoring. The method comprises the following steps: classifying according to rotating speed, injecting a pulse test signal to acquire a current response waveform, determining a target frequency band based on historical fault data, extracting an energy ratio of the target frequency band, and establishing a mapping library; then acquiring a rotating speed matching category in real time, collecting and preprocessing an actual current waveform, and calculating a target frequency band energy ratio of the actual current waveform; then calculating a dynamic time warping distance between the actual waveform and the reference waveform of the same category to quantify the similarity; and finally, performing continuous abnormity judgment based on double criteria of the distance and the energy ratio, and giving an alarm and recording information if N times of abnormity are performed continuously. The system comprises a mapping library establishment module, a real-time data acquisition and preprocessing module, a dynamic time warping distance calculation module and an abnormity judgment and alarm module. According to the invention, accurate monitoring and abnormal early warning of the motor operation state can be realized.

This application relates to a method and apparatus for regulating cooling capacity distribution in a liquid cooling system, belonging to the field of computer technology. The method includes: acquiring electrical pulse test commands, internal flow channel volume, and real-time flow data; parsing and processing the electrical pulse test commands to obtain the predicted peak time of the heat load; generating a heat load time-series curve based on the predicted peak time of the heat load and a preset electrothermal conversion coefficient; performing time-delay correlation processing on the internal flow channel volume and real-time flow data to obtain the inherent heat transfer delay duration; generating a primary-side feedforward regulation command based on the heat load time-series curve and the inherent heat transfer delay duration; controlling the primary-side regulation mechanism based on the primary-side feedforward regulation command; generating a secondary-side transient drive command in response to the current moment reaching the predicted peak time of the heat load; and controlling the secondary-side circulating pump based on the secondary-side transient drive command. This application effectively eliminates temperature overshoot under pulsed heat loads and reduces redundant cooling energy consumption in the liquid cooling system.

The application discloses a kind of graphite heater heating performance fault detection method and system, it is related to heating system performance safety detection related field, this method includes: in graphite heater middle deployment detection array, trigger based on first-order sensing acquisition obtains first detection signal group, graphite heating geometric structure is coaxially arranged spiral channel, using modular heating unit;Determine first heating test period, execute periodic physical end test and based on analog detector heating simulation test, mutual test determines first performance coefficient;Determine second pulse test condition, execute power pulsation sequence test based on non-stable direct current output and analog test based on analog detector in physical end, mutual test determines second performance coefficient;Determine comprehensive performance coefficient and carry out test platform visualization.The technical problem that the precision of existing graphite resistance type heating process performance safety detection is limited is solved, and the technical effect of improving the accuracy of heater performance safety evaluation is achieved.

A kind of power module dynamic switch parameter calculation method, comprising: using dynamic double-pulse test waveform to power module, the center point position of each pulse is calculated out;Waveform data of gate voltage waveform Vge, current waveform Ic and bus voltage waveform Vce are respectively carried out zero drift processing;According to the three waveform data obtained after eliminating zero drift, the basic parameters Vge- Pos 、Vge‑ Neg 、U dc 、I CM , first pulse turn-off Turn- off And the waveform data of second pulse turn-on Turn- on Time period in double pulse are respectively obtained, and the turn-off and turn-on process parameters are calculated, and the starting value and end value of each corresponding parameter are calculated according to the percentage of each parameter in turn-off and turn-on process, and finally the corresponding parameters are obtained.The present application does not need to use filter, and is realized based on software algorithm, which can ensure that the test data fluctuation is not too large due to waveform oscillation or waveform difference, and can make the test result close to the actual value, so as to ensure the authenticity of data.

A prediction method for a crosstalk voltage spike in a half bridge of current-source inverter with silicon carbide devices includes calculation of the crosstalk voltage spike in the circuit of current-source type double-pulse test and analysis of the effect of each parameter on the magnitude of the crosstalk voltage spike. The prediction method analyzes the horizontal conduction crosstalk mechanism between the gate-source junction of the MOSFET caused by the high-frequency switching action of the silicon carbide (SiC) MOSFET and the SiC Schottky diode connected in series, and derives the prediction model. Based on the equivalent circuit of the current-source-type double-pulse test and the crosstalk-induced mechanism, the extreme value of crosstalk voltage spike is accurately predicted, which is helpful to analyze the effects of the drive circuit and the parameters of the power circuit on the crosstalk voltage spike through the prediction model.

The application relates to a double-pulse test protection device and method for a SiC MOSFET, wherein the device is connected with an upper tube device and a lower tube device respectively; the upper tube device and the lower tube device are detected through the introduction of a turn-on detector and a turn-off detector; specifically, the turn-on detector is arranged at the source of the upper tube device, and the turn-off detector is arranged at the source of the lower tube device; dynamic parameters generated by the two devices are obtained under different test working conditions, and it is judged whether the dynamic parameters are within a safe threshold range, and then different processing measures are automatically executed according to different judgment results. The device has the advantages of high intelligence, high identification accuracy and high working reliability.

This invention discloses a self-recovery method for LCD screen interference in data acquisition terminals. The technical solution includes two methods: an avoidance mechanism and a self-recovery mechanism, addressing two scenarios: the LCD screen displaying incorrect data due to interference and the LCD screen control chip crashing due to strong interference, respectively. This invention can fundamentally avoid the impact of interference signals on the LCD screen of the data acquisition terminal; reduce the crash rate of the data acquisition terminal during group pulse testing; effectively extend the service life of the LCD screen in the field data acquisition terminal; and has strong compatibility, applicable to various data acquisition terminals.

The application discloses a method and system for double-pulse test voltage and current waveform time sequence deviation calibration, which comprises signal interception, time domain coarse alignment, periodic oscillation section interception, spectrum decomposition and oscillation frequency phase analysis, and frequency domain fine alignment and waveform reconstruction. The method extracts the inherent phase relationship of the voltage and current oscillation waveform after the switch device is turned off, combines signal preprocessing and frequency domain calculation, and realizes fast and high-precision automatic time sequence alignment. Compared with the hardware method, the method is simple to operate, does not need to make any modification to the circuit in advance, does not affect the reliability of the test result, does not depend on specific probes or test fixtures, has strong universality, and can be realized through software.

The application discloses an IGBT parallel current equalization method and device based on real-time feedback control, and relates to the technical field of power electronic conversion, which comprises the following steps: activating a double-pulse test device to perform transient state test on IGBT to obtain test information; simulating and analyzing with multiple physical parameters as constraints to obtain simulation information; cooperatively analyzing the test information and the simulation information to obtain a parallel current prediction function; introducing an equalization control coefficient to obtain an equalization control amount; and activating a gate charge regulator to control and adjust the equalization control amount of the IGBT. The application solves the technical problem that the control and adjustment technology of the existing conversion equipment between alternating current and direct current lacks precise feedback and dynamic adaptation mechanism, it is difficult to balance the control of parallel branch parameters, and it is unable to meet the high-efficiency and stable power conversion demand under complex working conditions, and achieves the technical effect of precise equalization control of the parallel branch current of the alternating current and direct current conversion equipment, and improves the power conversion efficiency and system stability under complex working conditions.

The invention relates to the technical field of multi-pulse testing, and discloses a multi-pulse inversion control method and device, and the method comprises the steps: carrying out the short circuit of the AC side of an inverter, matching with a simple tool, completing the building of a test loop, and not needing to frequently change the wiring mode or adjust the position of a pair tube for a single to-be-tested switch tube. The test operation process is greatly simplified, and the problems of tedious wiring and long consumed time of the existing multi-pulse test are solved; the magnetizing loop and the follow current loop are accurately constructed and alternately run, the inductive current can stably rise to a preset threshold value, key waveform data such as voltage stress, current stress, driving and reverse recovery can be accurately collected in the process, the working characteristics of a switching tube in a system loop are comprehensively verified, and the running reliability of an inverter is effectively guaranteed.

The application provides a touch screen pulse generator and a portable pulse test device, and relates to the technical field of power device testing.The touch screen pulse generator comprises a touch screen, a pulse generation circuit, a first optical fiber sending module and a second optical fiber sending module; the pulse generation circuit is connected with the touch screen through a display interface; a first optical fiber interface of the pulse generation circuit is connected with the first optical fiber sending module, and a second optical fiber interface of the pulse generation circuit is connected with the second optical fiber sending module, so as to output a pulse test signal to a device under test through the first optical fiber sending module or the second optical fiber sending module. Through the device, the technical problems of complex assembly, limited application range and low test efficiency in the prior art can be relieved, and the effects of reducing assembly difficulty, expanding the use range and improving the test efficiency can be achieved.

The application discloses an automatic double-pulse test system and a test method, which comprise an upper computer unit, a controller unit, a capacitor charging and discharging circuit unit, a load inductor unit, an IGBT power unit and an oscilloscope unit; the upper computer unit is interconnected with the controller unit; the controller unit is interconnected with the IGBT power unit; the control end of the controller unit is connected with the input end of the capacitor charging and discharging circuit unit and the load inductor unit; and the output end of the load inductor unit, the capacitor charging and discharging circuit unit and the oscilloscope unit is connected with the IGBT power unit. The whole operation process can be realized through the upper computer. The controller realizes full-automatic control and electrical isolation of the whole double-pulse test circuit, effectively guarantees test safety, the turn-on and turn-off resistance of the IGBT drive can be adjusted on line, operation is convenient, and test efficiency is greatly improved. The automatic double-pulse test system can meet most IGBT double-pulse test scenes, and can directly test the IGBT power module and the capacitor module by quickly connecting the modules with the system.

The utility model belongs to the field of inverter circuits, and comprises an NPC T-type three-level circuit test device, which comprises an NPC T-type three-level circuit composed of a first IGBT tube Q1, a second IGBT tube Q2, a third IGBT tube Q3 and a fourth IGBT tube Q4, a test power supply VCC, a ground terminal GND, a first switch SW1, a third switch SW3, a fourth switch SW4, a sixth switch SW6, a second inductor L2 and a capacitor C, a capacitor C is arranged between the test power supply VCC and the grounding end GND; the capacitor C is used for filtering clutters of the test power supply VCC; the first switch SW1, the third switch SW3 and the sixth switch SW6 are all in a closed state, and the fourth switch SW4 is in an open state; the states of the first switch SW1, the third switch SW3, the fourth switch SW4 and the sixth switch SW6 enable a first IGBT tube Q1 in the NPC T-type three-level circuit to be used for dipulse testing. The test system is simplified, the single power supply system can better perform control and debugging monitoring, power supply interference is reduced, and test accuracy is improved.

The invention relates to the technical field of inverters, and discloses a rectification multi-pulse test method and device for a TNPC inverter, and the method comprises the steps: selecting any one of the other two phases as an auxiliary phase when a rectification multi-pulse test is carried out on a target phase, and carrying out the rectification multi-pulse test on the target phase; a direct-current power supply is connected to the alternating-current ends of the target phase and the auxiliary phase, and the alternating-current ends of the other phases are disconnected, so that when a rectification multi-pulse test is carried out on a switch tube of a right transverse tube of the target phase, the positions of an inductor wire and a transistor pair do not need to be frequently changed, and the direct-current power supply is switched only through a simple tool; and the AC side relay is matched to realize rapid switching of the test platform, so that the operation process is greatly simplified and time consumption is saved. In the testing process, in order to adapt to the charging working condition of the TNPC topology energy storage inverter, a magnetizing loop and a follow current loop are formed through a target phase and an auxiliary phase, so that stress testing of the transverse pipe can be completed at the same time, and the blank that only the vertical pipe can be evaluated in an existing scheme is filled.

The invention belongs to the technical field of double-pulse testing, and provides an automatic analysis method and device for double-pulse waveform data and electronic equipment. The oscilloscope channel information comprises channels corresponding to gate-emitter voltage, gate current and collector-emitter voltage respectively; the device type and the topological form corresponding to the double-pulse waveform data are identified, the device type comprises at least one of a metal-oxide-semiconductor field effect transistor, an insulated gate bipolar transistor and a diode, and the topological form comprises a single tube or multiple tubes connected in parallel; according to the device type, the topological form and the duty ratio, performing working condition splitting on the double-pulse waveform data to obtain waveform data of multiple working conditions; and performing data analysis on the waveform data of the plurality of working conditions, and outputting waveform analysis results corresponding to the waveform data of the plurality of working conditions.