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103 results about "Pulse test" patented technology

Test method and apparatus for bipolar degradation of diode, and device

A test method and apparatus for bipolar degradation of a diode, and a device. The method comprises: respectively performing static characteristic tests on a first diode and a second diode, so as to obtain a first static characteristic test result and a second static characteristic test result; setting a pulse test current, a pulse test time and a pulse cycle time, so that, on the basis of the pulse test current, the pulse test time and the pulse cycle time, a power semiconductor pulse current test device performs repeated short pulse current power cycle tests on the first diode under normal temperature conditions, and performs repeated short pulse current power cycle tests on the second diode under high temperature conditions; then, performing static tests, so as to obtain a plurality of static characteristic test results; and on the basis of the static characteristic test results, obtaining a bipolar degradation test result of a diode. By means of the method, bipolar degradation of the diode is tested, and the accuracy and reliability of the test result are improved.
Owner:GUANGDONG POWER GRID CO LTD +1

IGBT parallel current balancing method and device based on real-time feedback control

The invention discloses an IGBT parallel current balancing method and device based on real-time feedback control, and relates to the technical field of power electronic conversion, and the method comprises the steps: activating a double-pulse test device to carry out the transient test of an IGBT, and obtaining the test information; performing simulation analysis by taking the multiple physical parameters as constraints to obtain simulation information; performing collaborative analysis on the test information and the simulation information to obtain a parallel current prediction function; introducing an equalization control coefficient to obtain an equalization control quantity; and activating a grid charge regulator to control and regulate the balance control quantity of the IGBT. According to the invention, the technical problems that the existing control and adjustment technology of conversion equipment between alternating current and direct current lacks an accurate feedback and dynamic adaptation mechanism, parallel branch parameters are difficult to control in a balanced manner, and the requirements of efficient and stable electric energy conversion under complex working conditions cannot be met are solved; the technical effects of accurately controlling the parallel branch current of the alternating current and direct current conversion equipment in a balanced manner and improving the electric energy conversion efficiency and the system stability under complex working conditions are achieved.
Owner:ZHEJIANG GUANGXIN MICROELECTRONICS CO LTD

Pressure sensitive device damage diagnostic system in conjunction with pulse testing

The present application relates to the technical field of electric fault detection, in particular to a pressure sensitive device damage diagnosis system combined with pulse test, comprising the following modules: an original signal acquisition module, inputting pulse sequences to the pressure sensitive device, recording voltage response signals and current response signals under each pulse sequence respectively, and generating a response signal set; based on the response signal set, wavelet decomposition is performed on the voltage response signals and the current response signals. In the present application, the pulse sequences are inputted and the voltage response signals and the current response signals under each pulse sequence are recorded, so that the data acquisition covers different working states and reduces the feature loss caused by a single test point. The voltage response signals and the current response signals are divided into different frequency intervals by using the wavelet decomposition method, which is helpful to separate the high-frequency and low-frequency features, so that the local abnormal signals are not covered by the global features, and the analysis ability for short-time fault features is enhanced.
Owner:QINGDAO AIPU INTELLIGENT INSTR

Method, device and system for measuring electrical parameters of IGBT (Insulated Gate Bipolar Translator) module

The invention relates to a method, a device and a system for measuring electrical parameters of an IGBT (Insulated Gate Bipolar Translator) module. The method comprises the steps of obtaining a historical double-pulse test result of an IGBT module, and obtaining a historical residual life curve; according to the difference between the historical remaining life of each abnormal inflection point and the historical remaining life of the adjacent test data point, determining the anomaly degree of the abnormal inflection point; in each abnormal interval, according to the proportion of fault working condition subintervals in the working condition data and the deviation degree of the multiple monitoring parameters, the fluctuation degree in the abnormal interval is determined; determining the matching degree of the abnormal inflection point based on the difference between the abnormity degree and the fluctuation degree of each abnormal inflection point; and performing a double-pulse test on the IGBT module once to obtain the current residual life, and correcting the current residual life based on the matching degree of the plurality of abnormal inflection points and the difference of the historical residual life between the adjacent test data points in the corresponding abnormal interval to obtain a target residual life value. According to the invention, the accuracy of residual life prediction of the IGBT module can be improved.
Owner:XUCHANG RELAY INST

Testing tool and testing method for double-pulse test of full-control type device series valve

The invention relates to a double-pulse test tool and method for a full-control device series valve, and the tool comprises an upper computer main control unit which is used for transmitting a control instruction, receiving waveform data, and carrying out the automatic parameter calculation; the control unit is connected with the upper computer main control unit, comprises a high-voltage power supply, a support capacitor and a bridge arm change-over switch, and is used for providing adjustable high voltage and realizing rapid reconstruction of a test loop; the test unit is electrically connected with the control unit and the to-be-tested device and comprises a busbar box and a load inductor, and the busbar box is used for interconnecting the supporting capacitor, the load inductor, the bridge arm change-over switch and the to-be-tested device to form an energy transmission main loop; and the acquisition unit is connected with the upper computer main control unit and the test unit, comprises an oscilloscope, a voltage probe and a current probe, and is used for capturing the electrical parameter waveform of the device to be tested in real time and uploading the electrical parameter waveform to the upper computer main control unit.
Owner:CHINA ELECTRIC POWER RESEARCH INSTITUTE CO LTD +2

Dual pulse testing apparatus and method for power semiconductor

This application discloses a double-pulse testing device and method for power semiconductors, belonging to the field of power semiconductor technology. The device includes: a global control module, used to generate a parameter package based on the test task and characteristic parameters of the target device when a double-pulse test is to be performed on a target device, send the parameter package to a target local execution module, and iteratively adjust the parameter package based on the double-pulse test results of the target device fed back by the target local execution module, while simultaneously sending the iteratively adjusted parameter package to the target local execution module until the double-pulse test results of the target device fed back by the target local execution module meet the test objective; and a target local execution module, used to perform double-pulse testing on the target device according to the parameter package issued by the global control module, and to feed back the double-pulse test results of the target device to the global control module. This device can improve the efficiency and accuracy of double-pulse testing of power semiconductors.
Owner:CHONGQING CLOUDCHILD TECH CO LTD

Dynamic on-resistance test circuit based on gallium nitride transistor and test method thereof

The application discloses a dynamic on-resistance test circuit based on a gallium nitride transistor and a test method thereof, and belongs to the technical field of power electronics.The circuit comprises a DPT test circuit, a switching state switching circuit and a clamping circuit; the test method is to obtain the on-resistance of the to-be-tested tube by monitoring the voltage between test points on the clamping circuit and the current on the coaxial resistor; and the switching between hard switching and soft switching tests is realized by changing the switching interface.The gallium nitride transistor and the clamping circuit are introduced on the traditional double-pulse test circuit, and the dynamic on-resistance test functions in the soft switching and hard switching modes are integrated.Compared with the traditional test circuit, the clamping circuit of the application can capture the dynamic on-resistance within nanosecond time delay, greatly reduces the peak of the clamping voltage, improves the test precision, and realizes the fast and accurate measurement of the dynamic on-resistance.
Owner:NANTONG UNIV

Method, system, device, storage medium and program product for detecting dynamic on-resistance of power device

The application relates to a power device dynamic on-resistance detection method, system, device, storage medium and program product, which is applied to a power device dynamic on-resistance detection system, and the power device dynamic on-resistance detection system comprises an upper computer, a controller, a double-pulse test circuit and a signal collector, wherein the double-pulse test circuit is installed with a measured gallium nitride power device; the method comprises the following steps: under the condition that the test temperature of the measured gallium nitride power device meets preset test conditions, sending multiple groups of double-pulse test signals to the double-pulse test circuit through the controller; collecting multiple groups of electrical test parameters of the measured gallium nitride power device under the multiple groups of double-pulse test signals through the signal collector; and detecting the on-resistance of the measured gallium nitride power device based on the multiple groups of electrical test parameters through the upper computer. The method improves the detection accuracy of power device dynamic on-resistance detection.
Owner:CHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INSTITUTE ((THE FIFTH INSTITUTE OF ELECTRONICS MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY) (CHINA SAIBAO LABORATORY)

Seismograph testing method, device and equipment based on data communication and storage medium

The present application relates to seismic instrument testing technology, and discloses a seismic instrument testing method based on data communication, which comprises the following steps: a host computer is connected with a seismic instrument through handshaking, and the seismic instrument obtains testing instructions from the host computer; the testing instructions are analyzed to obtain a testing type and enter a testing mode; when the testing type is index testing, the seismic instrument is tested according to the testing instructions to obtain a first testing result; when the testing type is state testing, the seismic instrument is tested according to the testing instructions to obtain a second testing result; the first testing result and the second testing result are sent to the host computer, and the testing mode is exited; the seismic instrument is updated according to the testing data, and the testing is completed after the updating is finished. The present application also discloses a seismic instrument testing device based on data communication, an electronic device and a storage medium. The present application can improve the seismic instrument testing efficiency.
Owner:MIANYUAN TECH SHENZHEN CO LTD

Control link latency test system, method and apparatus

PendingCN122340003APulse testControl system
This application relates to a control link delay testing system, method, and apparatus. The system method includes: a valve control system and a test pulse module; the valve control system includes a main control module and a control link, the test pulse module is connected to the main control module via the control link, and the test pulse module is also directly connected to the main control module; the test pulse module outputs a preset test excitation signal to the main control module via the control link, receives a response signal returned by the main control module, and determines the uplink delay of the control link based on the transmission time of the test excitation signal and the reception time of the response signal; the test pulse module receives a pulse test signal sent by the main control module, and also receives a drive signal sent by the main control module via the control link, and determines the downlink delay of the control link based on the reception time of the pulse test signal and the reception time of the drive signal. Through the above testing process, accurate measurement of the uplink and downlink delays of the valve control system's control link can be achieved.
Owner:TBEA SUNOASIS +1

An artificial synapse device of perovskite and metal oxide composite structure

ActiveCN224556179UChemical physicsPulse test
The utility model provides a kind of perovskite and metal oxide composite structure artificial synapse device, including high doped silicon layer, silicon oxide layer, perovskite film and metal oxide film, the top of high doped silicon layer is provided with silicon oxide layer, the top of silicon oxide layer is provided with perovskite film, the top of perovskite film is provided with metal oxide film.The utility model changes device structure to realize the function of artificial synapse, makes device to appear counterclockwise hysteresis when being bidirectional transmission characteristic curve test, and output current shows memory function when being pulse test.Through depositing perovskite film first, subsequently depositing metal oxide film on perovskite film, avoid the direct contact of perovskite film and air, so that device has better stability and life.The preparation method of the utility model only includes spin coating, magnetron sputtering and thermal evaporation, and operation process is simpler, process is compatible simultaneously, and time cost and process cost are lower.
Owner:SHENZHEN HOTCHIP TECH

An Automatic Parameter Extraction Method and System for GaN HEMT Device Models Based on Differential Evolution Algorithm

PendingCN122287519ALocal optimumDevice material
This invention provides an automatic parameter extraction method and system for GaN HEMT device models based on differential evolution algorithms, belonging to the field of semiconductor device modeling technology. By deeply integrating the global optimization capability of differential evolution algorithms with semiconductor device physical models, and utilizing pulse test data and self-heating effect iterative models, this invention achieves physical-level decoupling of electrical and thermal parameters. It overcomes the problems of traditional methods, such as being prone to getting trapped in local optima, the tendency for small physical quantities to collapse to zero values, and the extraction distortion caused by multi-physics coupling, significantly improving parameter extraction accuracy and model generalization ability.
Owner:CHONGQING UNIV OF POSTS & TELECOMM

Portable rechargeable high-voltage ignition pulse tester for dual-channel isolated acquisition

The invention discloses a portable rechargeable high-voltage ignition pulse tester for dual-channel isolated acquisition, and belongs to the technical field of high-voltage pulse signal testing equipment. The tester comprises a main control module, a battery management system, a dual-channel pulse signal monitoring module, a man-machine interaction module and a power management module. Each path of the dual-channel pulse signal monitoring module is independently provided with a gas discharge tube for protection and photoelectric isolation and is independently powered by the isolation DC-DC module, so that complete electrical isolation of a high-voltage side and a low-voltage side is realized, and safety and measurement precision are ensured. The main control module adopts a microcontroller to collect and process amplitudes and times of two paths of ignition pulses in real time, information such as pulse counting, voltage values and battery electric quantity is visually displayed through a display screen, and the device is particularly suitable for high-voltage ignition pulse external field rapid detection and maintenance of engines and ignition devices in the fields of aviation, military industry and the like.
Owner:SHAANXI ELECTRICAL APPLIANCE RES INST

A multi-parameter fusion asphalt mixture acoustic emission sensor layout optimization method

The application provides a multi-parameter fusion asphalt mixture acoustic emission sensor layout optimization method, comprising: arranging a plurality of acoustic emission sensors at equal intervals along a straight line parallel to the longitudinal direction of the surface of the asphalt mixture to be measured, performing an acoustic emission pulse test, and measuring amplitude, ringing count and wave speed; determining an effective arrangement range in which acoustic emission signals can be effectively received according to the distance at which each index attenuates by 50%, and taking the minimum value as the initial interval of the acoustic emission sensor arrangement; according to the CRLB principle, an optimization function of the acoustic emission sensor network layout is constructed; and the optimization function in step S2 is solved by using an improved genetic algorithm. The application determines the physical space constraint of the effective arrangement of the sensor through standard attenuation testing and multi-parameter fusion, constructs a regional overall positioning accuracy optimization function that fuses the exponential wave speed equation and the spatial uncertainty of the sound source, and improves the physical accuracy and reliability of the layout optimization model from a theoretical source.
Owner:CHANGSHA UNIVERSITY OF SCIENCE AND TECHNOLOGY +1

Double-pulse test circuit and method suitable for high-voltage SiC MOSFET (Metal Oxide Semiconductor Field Effect Transistor)

The invention discloses a double-pulse test circuit and method suitable for a high-voltage SiC MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor), and belongs to the technical field of semiconductor device testing. The circuit comprises an FPGA (Field Programmable Gate Array) controller, a driving main chip, a desaturation short circuit detection circuit, a bidirectional voltage-stabilizing protection circuit, a SiC MOSFET upper tube test loop and a SiC MOSFET lower tube; the output end of the FPGA controller is connected with the input end of the SiC MOSFET upper tube test loop and the input end of the driving board, and the input end of the FPGA controller is connected with the output end of the driving main chip. The input end of the desaturation short circuit detection circuit is electrically connected with the drain electrode and the source electrode of the SiC MOSFET lower tube, and the input end of the desaturation short circuit detection circuit is electrically connected with the driving main chip. One end of the bidirectional voltage stabilization protection circuit is connected with the output end of the driving main chip, and the other end of the bidirectional voltage stabilization protection circuit is connected with the grid electrode of the SiC MOSFET lower tube. The high-voltage SIC MOSFET test circuit can solve the problem that the high-voltage SIC MOSFET test circuit is low in safety.
Owner:ELECTRIC POWER RES INST OF GUANGDONG POWER GRID CO LTD

Control method and device of double-pulse testing device, testing system and storage medium

The invention provides a control method and device of a double-pulse testing device, a testing system and a storage medium, and relates to the technical field of electronic device testing. The method comprises the following steps: sending a first pulse to a to-be-tested IGBT device; the first pulse is used for controlling the to-be-tested IGBT device to be turned off after saturation conduction; continuously sending a plurality of second pulses to the to-be-measured IGBT device until the device temperature of the to-be-measured IGBT device rises to the target temperature, and measuring the switching characteristic of the to-be-measured IGBT device at the target temperature; wherein the pulse width of the second pulse is smaller than that of the first pulse, and the to-be-tested IGBT device works in a linear region within the duration of the pulse width of the second pulse. According to the invention, the performance test of the IGBT device in the high-temperature state can be realized by using the double-pulse test device.
Owner:XIAMEN KEHUA DIGITAL ENERGY TECH CO LTD

A high-frequency pulse test device

The present invention belongs to the technical field of test devices, and specifically relates to a high-frequency pulse test device. The device comprises a source oil power mechanism, a pulse generating mechanism, and a medium circulation exhaust mechanism connected in sequence; the source oil power mechanism's power source tank is connected to the pulse generating mechanism's oil inlet and oil return terminals, respectively; the pulse generating mechanism's output terminal is connected to the medium circulation exhaust mechanism's input terminal; the medium circulation exhaust mechanism's oil inlet and oil return terminals are respectively connected to the medium source tank; and the medium source tank is connected to the experimental equipment; the pulse generating mechanism's oil inlet pipeline is connected to the pressure regulating and protecting mechanism's oil inlet, and the pulse generating mechanism's oil return pipeline is connected to the pressure regulating and protecting mechanism's oil return terminal.
Owner:SHENYANG ZIWEIHENG TESTING EQUIP CO LTD

Pulse number selection method, system and computer device for blind hole

PendingCN122299215AImprove processing qualityAvoid technical flaws such as errorsPulse testSimulation
This application relates to a method, system, and computer device for selecting the number of pulses for blind vias. The method includes: obtaining the adaptive power of a test board; machining multiple first blind vias on the test board using the adaptive power and different pulse test counts; observing the hole quality characteristics of the multiple first blind vias; and selecting an appropriate number of pulses from the different pulse test counts. This method improves the accuracy of selecting the number of pulses for blind vias, thereby improving the machining quality of blind vias.
Owner:HANS CNC SCI & TECH

Optical pulse tester

The optical pulse tester 10 functions as an optical time domain reflectometer (OTDR) capable of measuring the condition of the optical fiber 1. An optical pulse tester (10) is provided with: a laser element (121) that generates an optical pulse incident on an optical fiber (1); a photoreceptor (123) that detects reflected light from the optical fiber (1); a light intensity adjuster (13) capable of adjusting the light intensity of the light pulse and the reflected light; and a controller (16) that controls the light intensity regulator (13).
Owner:YOKOGAWA ELECTRIC CORP +1

Knock-based adjustable high-frequency pressure pulse output device and control method

The invention relates to the technical field of high-frequency pressure pulse test devices, in particular to a knocking-based adjustable high-frequency pressure pulse output device and a control method. The detonation device is characterized by comprising a fuel gas mixing device, a detonation pipe and a detonation pipe collecting device, the fuel gas mixing device is arranged at the front end of the detonation pipe, the detonation pipe collecting device is arranged at the rear end of the detonation pipe, and a pressure relief device is further arranged at an outlet of the detonation pipe collecting device. The fuel gas mixing device is connected with the gas filling control system and the time sequence control module, and an electric spark generator is arranged on the fuel gas mixing device; a fuel gas mixing device is adopted for filling gas into a plurality of detonation pipes at the same time, each detonation pipe is provided with an independent ignition source, and the ignition time sequence is controlled by a time sequence control module in a unified mode. A detonation gathering device is adopted, and the structure can achieve pressure pulse output through a single tube. A delay control module and an electromagnetic valve group are adopted to control the gas filling time, and the pulse intensity is adjustable under the assistance of a pressure relief device.
Owner:NORTHWESTERN POLYTECHNICAL UNIV

SiC MOSFET oscillation suppression circuit

The SiC MOSFET oscillation suppression circuit comprises a double-pulse test circuit, a first clamping voltage circuit, a second clamping voltage circuit, a first starting circuit, a second starting circuit, a first energy recovery circuit, a second energy recovery circuit, a first diode D1 and a second diode D2. According to the invention, a double-pulse test circuit is creatively proposed, and a clamping voltage circuit, a starting circuit and an energy recovery circuit are designed, and a diode D1 is used for control; the problems that the oscillation suppression effect of a SiC MOSFET oscillation suppression circuit is not obvious, an active gate drive mode circuit is complex, the clamping voltage peak suppression effect of a traditional clamping RCD circuit is not obvious, and energy loss is large in the energy recovery process are effectively solved. In the turn-off process of the device, the clamping voltage part of the circuit not only can well clamp overshoot and suppress oscillation in the turn-off process of the device, but also can reduce the peak value of the clamping voltage, and has a smaller oscillation peak value.
Owner:CHONGQING TSINGSHAN IND

Optical pulse tester and measurement method

To easily and accurately measure crosstalk between cores in a multicore optical fiber.SOLUTION: An optical pulse tester 10 according to the present disclosure measures crosstalk between cores of a multicore optical fiber 1. The optical pulse tester 10 includes a laser element 12 configured to generate an optical pulse, an output port 20 configured to output the optical pulse to one of a plurality of cores in the multicore optical fiber 1, an input port 30 configured to receive backscattered light generated in a core other than the one core among the plurality of cores, and a photodetector 13 configured to detect the backscattered light received by the input port 30.SELECTED DRAWING: Figure 1
Owner:YOKOGAWA ELECTRIC CORP +1

Implementation method of LabVIEW-based Sic power semiconductor dipulse test software

The invention discloses an implementation method of LabVIEW-based Sic power semiconductor double-pulse test software. The technical problems of software implementation of a signal generator, an oscilloscope and a discharge problem of a power semiconductor double-pulse test based on LabVIEW and calculation of various parameters are solved. The method mainly comprises software integrated control and calculation of configuration parameters in software, the software integrated control performs three-way switching on a signal generator, an oscilloscope, a discharge resistor and an inductor UVW based on LabVIEW, and the software integrated control is configured to configure parameters, bus voltage and pulse width of the signal generator and the oscilloscope, select a required test phase and control start and stop; calculation of configuration parameters in the software is mainly based on analysis and calculation of. Csv file data obtained through testing, and calculation of the configuration parameters in the software is divided into Vgs (grid voltage), Ids (drain-source current), Vds (drain-source voltage), IdsUper (upper tube drain-source current) and VdsUper (lower tube drain-source voltage) according to csv file data automatically exported by an oscilloscope.
Owner:GUSHI (SUZHOU) TECHNOLOGY CO LTD

Pulse test device and method for nuclear power metal hose

The application belongs to the technical field of nuclear power station safety component detection, and particularly relates to a pulse test device and method for a nuclear power metal hose, which comprises a base, a fixed track, a second track, a support frame and a clamp. The fixed track is symmetrically installed on both sides of the base, the second track is symmetrically installed on the fixed track and can move along the fixed track, the support frame is installed on the second track and can move along the second track, the top of the support frame is provided with the clamp, and the clamp is connected with the nuclear power metal hose to be detected. The device is designed with a quick adjusting mechanism, so that different specifications of the hose can be quickly clamped and positioned, the hose is installed on an adjustable dynamic support frame, the support frame can freely move along multiple axes, the minimum dynamic bending radius mm of the hose can be ensured during the test, the requirement of the minimum static bending radius mm can be met, and the device is flexible to use.
Owner:CNNC NUCLEAR POWER OPERATION MANAGEMENT CO LTD

Online monitoring system and method for industrial motor

The invention discloses an online monitoring system and method for an industrial motor, and relates to the technical field of motor state monitoring. The method comprises the following steps: classifying according to rotating speed, injecting a pulse test signal to acquire a current response waveform, determining a target frequency band based on historical fault data, extracting an energy ratio of the target frequency band, and establishing a mapping library; then acquiring a rotating speed matching category in real time, collecting and preprocessing an actual current waveform, and calculating a target frequency band energy ratio of the actual current waveform; then calculating a dynamic time warping distance between the actual waveform and the reference waveform of the same category to quantify the similarity; and finally, performing continuous abnormity judgment based on double criteria of the distance and the energy ratio, and giving an alarm and recording information if N times of abnormity are performed continuously. The system comprises a mapping library establishment module, a real-time data acquisition and preprocessing module, a dynamic time warping distance calculation module and an abnormity judgment and alarm module. According to the invention, accurate monitoring and abnormal early warning of the motor operation state can be realized.
Owner:QINGDAO AIPU INTELLIGENT INSTR

Double-pulse test circuit based on power semiconductor and test circuit board

The utility model relates to the technical field of electronic circuits, in particular to a dipulse test circuit based on a power semiconductor. The inductance selection and position switching circuit for the power semiconductor dipulse test is formed by the at least two load inductance selection branches, the first position switching branch, the second position switching branch and the power semiconductor to be tested, and the inductance connected into the test circuit is changed through the load inductance selection branches when the inductance selection and position switching circuit is used. The position change of the to-be-tested power semiconductor is realized through the position switching circuit, and the device has the characteristics of high reliability, fast switching and stable test.
Owner:CHONGQING CLOUDCHILD TECH CO LTD

Power module pulse test method and equipment for converter

This invention discloses a pulse testing method and device for power modules of a converter. It includes: acquiring the target load current, the effective switching state of the power module under test, and the state switching path; determining the target switching state within the effective switching state; determining a first switching path, a second switching path, and a third switching path within the state switching paths; determining the switching frequency of the target switching state and adjacent effective switching states in the third switching path based on the target load current; generating a pulse test sequence with the first switching path as the first segment, the third switching path as the middle segment, and the second switching path as the last segment; and generating a control signal based on a preset duty cycle, switching frequency, and pulse test sequence. This method ensures that the outer transistor turns off before the inner transistor, and allows testing of another target power semiconductor immediately after testing the first target power semiconductor, thus improving the testing efficiency of the power module.
Owner:CHINA THREE GORGES CORPORATION +1

A method and apparatus for regulating the distribution of cooling capacity for a liquid cooling system

PendingCN122318178APulse testCirculator pump
This application relates to a method and apparatus for regulating cooling capacity distribution in a liquid cooling system, belonging to the field of computer technology. The method includes: acquiring electrical pulse test commands, internal flow channel volume, and real-time flow data; parsing and processing the electrical pulse test commands to obtain the predicted peak time of the heat load; generating a heat load time-series curve based on the predicted peak time of the heat load and a preset electrothermal conversion coefficient; performing time-delay correlation processing on the internal flow channel volume and real-time flow data to obtain the inherent heat transfer delay duration; generating a primary-side feedforward regulation command based on the heat load time-series curve and the inherent heat transfer delay duration; controlling the primary-side regulation mechanism based on the primary-side feedforward regulation command; generating a secondary-side transient drive command in response to the current moment reaching the predicted peak time of the heat load; and controlling the secondary-side circulating pump based on the secondary-side transient drive command. This application effectively eliminates temperature overshoot under pulsed heat loads and reduces redundant cooling energy consumption in the liquid cooling system.
Owner:SHANGHAI EXXON CO LTD

A method and system for detecting heating performance failure of a graphite heater

The application discloses a kind of graphite heater heating performance fault detection method and system, it is related to heating system performance safety detection related field, this method includes: in graphite heater middle deployment detection array, trigger based on first-order sensing acquisition obtains first detection signal group, graphite heating geometric structure is coaxially arranged spiral channel, using modular heating unit;Determine first heating test period, execute periodic physical end test and based on analog detector heating simulation test, mutual test determines first performance coefficient;Determine second pulse test condition, execute power pulsation sequence test based on non-stable direct current output and analog test based on analog detector in physical end, mutual test determines second performance coefficient;Determine comprehensive performance coefficient and carry out test platform visualization.The technical problem that the precision of existing graphite resistance type heating process performance safety detection is limited is solved, and the technical effect of improving the accuracy of heater performance safety evaluation is achieved.
Owner:NANTONG GENERAL BALL CHEM EQUIP CO LTD