14 results about "Pulse test" patented technology

This application relates to a control link delay testing system, method, and apparatus. The system method includes: a valve control system and a test pulse module; the valve control system includes a main control module and a control link, the test pulse module is connected to the main control module via the control link, and the test pulse module is also directly connected to the main control module; the test pulse module outputs a preset test excitation signal to the main control module via the control link, receives a response signal returned by the main control module, and determines the uplink delay of the control link based on the transmission time of the test excitation signal and the reception time of the response signal; the test pulse module receives a pulse test signal sent by the main control module, and also receives a drive signal sent by the main control module via the control link, and determines the downlink delay of the control link based on the reception time of the pulse test signal and the reception time of the drive signal. Through the above testing process, accurate measurement of the uplink and downlink delays of the valve control system's control link can be achieved.

The utility model provides a kind of perovskite and metal oxide composite structure artificial synapse device, including high doped silicon layer, silicon oxide layer, perovskite film and metal oxide film, the top of high doped silicon layer is provided with silicon oxide layer, the top of silicon oxide layer is provided with perovskite film, the top of perovskite film is provided with metal oxide film.The utility model changes device structure to realize the function of artificial synapse, makes device to appear counterclockwise hysteresis when being bidirectional transmission characteristic curve test, and output current shows memory function when being pulse test.Through depositing perovskite film first, subsequently depositing metal oxide film on perovskite film, avoid the direct contact of perovskite film and air, so that device has better stability and life.The preparation method of the utility model only includes spin coating, magnetron sputtering and thermal evaporation, and operation process is simpler, process is compatible simultaneously, and time cost and process cost are lower.

This invention provides an automatic parameter extraction method and system for GaN HEMT device models based on differential evolution algorithms, belonging to the field of semiconductor device modeling technology. By deeply integrating the global optimization capability of differential evolution algorithms with semiconductor device physical models, and utilizing pulse test data and self-heating effect iterative models, this invention achieves physical-level decoupling of electrical and thermal parameters. It overcomes the problems of traditional methods, such as being prone to getting trapped in local optima, the tendency for small physical quantities to collapse to zero values, and the extraction distortion caused by multi-physics coupling, significantly improving parameter extraction accuracy and model generalization ability.

The application provides a multi-parameter fusion asphalt mixture acoustic emission sensor layout optimization method, comprising: arranging a plurality of acoustic emission sensors at equal intervals along a straight line parallel to the longitudinal direction of the surface of the asphalt mixture to be measured, performing an acoustic emission pulse test, and measuring amplitude, ringing count and wave speed; determining an effective arrangement range in which acoustic emission signals can be effectively received according to the distance at which each index attenuates by 50%, and taking the minimum value as the initial interval of the acoustic emission sensor arrangement; according to the CRLB principle, an optimization function of the acoustic emission sensor network layout is constructed; and the optimization function in step S2 is solved by using an improved genetic algorithm. The application determines the physical space constraint of the effective arrangement of the sensor through standard attenuation testing and multi-parameter fusion, constructs a regional overall positioning accuracy optimization function that fuses the exponential wave speed equation and the spatial uncertainty of the sound source, and improves the physical accuracy and reliability of the layout optimization model from a theoretical source.

This application relates to a method, system, and computer device for selecting the number of pulses for blind vias. The method includes: obtaining the adaptive power of a test board; machining multiple first blind vias on the test board using the adaptive power and different pulse test counts; observing the hole quality characteristics of the multiple first blind vias; and selecting an appropriate number of pulses from the different pulse test counts. This method improves the accuracy of selecting the number of pulses for blind vias, thereby improving the machining quality of blind vias.

This application relates to a method and apparatus for regulating cooling capacity distribution in a liquid cooling system, belonging to the field of computer technology. The method includes: acquiring electrical pulse test commands, internal flow channel volume, and real-time flow data; parsing and processing the electrical pulse test commands to obtain the predicted peak time of the heat load; generating a heat load time-series curve based on the predicted peak time of the heat load and a preset electrothermal conversion coefficient; performing time-delay correlation processing on the internal flow channel volume and real-time flow data to obtain the inherent heat transfer delay duration; generating a primary-side feedforward regulation command based on the heat load time-series curve and the inherent heat transfer delay duration; controlling the primary-side regulation mechanism based on the primary-side feedforward regulation command; generating a secondary-side transient drive command in response to the current moment reaching the predicted peak time of the heat load; and controlling the secondary-side circulating pump based on the secondary-side transient drive command. This application effectively eliminates temperature overshoot under pulsed heat loads and reduces redundant cooling energy consumption in the liquid cooling system.

A kind of power module dynamic switch parameter calculation method, comprising: using dynamic double-pulse test waveform to power module, the center point position of each pulse is calculated out;Waveform data of gate voltage waveform Vge, current waveform Ic and bus voltage waveform Vce are respectively carried out zero drift processing;According to the three waveform data obtained after eliminating zero drift, the basic parameters Vge- Pos 、Vge‑ Neg 、U dc 、I CM , first pulse turn-off Turn- off And the waveform data of second pulse turn-on Turn- on Time period in double pulse are respectively obtained, and the turn-off and turn-on process parameters are calculated, and the starting value and end value of each corresponding parameter are calculated according to the percentage of each parameter in turn-off and turn-on process, and finally the corresponding parameters are obtained.The present application does not need to use filter, and is realized based on software algorithm, which can ensure that the test data fluctuation is not too large due to waveform oscillation or waveform difference, and can make the test result close to the actual value, so as to ensure the authenticity of data.

This invention relates to a method and system for identifying reverse recovery conduction paths and predicting dynamic characteristics of SiC MOSFETs, belonging to the field of power semiconductor device testing and reliability analysis. The method includes: Step 1: Constructing a dual-pulse test circuit and acquiring waveform data; Step 2: Preprocessing the data; Step 3: Extracting feature parameters and constructing feature vectors; Step 4: Outputting the conduction path type and device degradation state; Step 5: Based on the conduction path type, combined with the total current decomposition relationship and the dynamic response characteristics of the device under different test conditions, establishing a conduction path decomposition model, and calculating the current proportions of the MOS channel conduction path, body diode conduction path, and Schottky diode conduction path; Step 6: Predicting reverse recovery parameters; Step 7: Assessing device status, predicting remaining lifetime, and assessing failure risk. This invention automates the processing of dual-pulse test data and, for the first time, achieves quantitative identification of conduction paths.

The application discloses a double-pulse test method for Econo module based on a drive and power loop, and is realized by a test circuit composed of an interface adaptation part, a power loop part, a drive circuit part and a measurement part, and specifically comprises the following steps: interface adaptation docking: an Econo module is directly docked with a special pin interface seat through a spring hole insertion mode, and the pin spacing and pin definition of the interface seat are completely consistent with the side pin of the module. The double-pulse test method for Econo module based on the drive and power loop, through special interface adaptation, short-path power loop design and independent drive control of the gate, realizes no switching connection of the test loop, effectively suppresses the parasitic inductance, eliminates the test error caused by the switching contact resistance, improves the precision and efficiency of dynamic parameter test of the Econo packaged IGBT module, and simultaneously reduces the operation difficulty and equipment investment cost.

The invention discloses a new energy automobile electric drive assembly power acceleration test evaluation method, and relates to the technical field of new energy automobile testing, and the method comprises the steps: collecting the full-load holding data and light-load holding data of an electric drive assembly, carrying out the same-speed position alignment, power current increment calculation and segmented arrangement, and carrying out the calculation of the power acceleration of the electric drive assembly; obtaining a same-speed double-reference sequence, an initial speed segment endpoint and a segment time window length; dividing initial speed sections according to the endpoints of the initial speed sections, carrying out a same-speed micro-dipulse test at the initial output rotating speed position of each initial speed section according to the length of a segmented time window, and carrying out redemption coefficient calculation through a same-speed double-reference sequence to form a micro-detection redemption coefficient, a main acceleration redemption coefficient and a micro-detection redemption median value; the method comprises the following steps: performing local arrangement on a main acceleration redemption coefficient through the length of a segmented time window, identifying a power flow dislocation break point by combining a micro-detection redemption median value, and dividing a release section according to the power flow dislocation break point to form an advanced establishment time difference, a collaborative establishment area and a limited mismatch area.

This invention relates to the field of test circuit technology, specifically to a method and system for rapid H-bridge multi-pulse testing, comprising: acquiring switching transistor grouping information and corresponding test sequences in an H-bridge test circuit; selecting one switching transistor group and calling the test sequence for pulse testing; and performing a current reset operation on the load inductor after the pulse ends. Addressing the problem of low efficiency in existing H-bridge test circuits, which typically only test a group of switching transistors at a test position, this invention groups the switching transistors under test in the H-bridge test circuit to form switching transistor grouping information. This information is used to conduct switching transistors at specific positions during testing to form specific circuit modes, and a corresponding test sequence is set for each switching transistor under test in each circuit mode and executed sequentially. A current reset operation on the load inductor is performed during each test to improve consistency for subsequent tests. The above process design improves testing efficiency.

The application relates to a power device electric-thermal comprehensive test platform based on a double-pulse test, which comprises a box body, a capacitor group arranged in the box body, a heating loop diode and a heating loop switch tube arranged in the box body, a direct-current heating loop formed by the heating loop diode, a power supply test board, the heating loop switch tube and an external direct-current current source, a double-pulse test loop formed by a double-pulse loop switch tube, the power supply test board, a freewheeling diode, the capacitor group, an external load inductor and a direct-current voltage source, and the dynamic electrical characteristic parameters of a measured device are obtained; and the direct-current heating loop and the double-pulse test loop share the same power supply test board. The direct-current heating simulation loop and the double-pulse test loop are integrated on the same platform and share the same power supply test board, the heating instant is switched to the test process, the switching behavior of the device at the actual working temperature is truly reflected, and the measurement error caused by the temperature drop of the junction due to the long time interval between heating and testing is avoided.

The present application relates to a kind of vehicle steering wheel corner pulse test data automatic processing method, including based on storage path sequentially extracting test data and pre-processing test data, continuous multiple test data is automatically intercepted as single test data;Automatic processing is carried out to the test data after interception, and the steering wheel corner pulse test related index result is obtained, the test processing result obtained by processing is automatically judged, and unreasonable result value is removed;Effective test result after removing unreasonable value is scored, and the target vehicle steering wheel corner pulse test working condition score is obtained;Based on data processing result and scoring result, test report is automatically generated.The processing method of the present application can realize vehicle steering wheel corner pulse test data automatic interception, processing, scoring and report generation process, solve the problems such as long time-consuming, easy to make mistakes in manual processing, while improving processing precision also greatly improves processing efficiency, shortens the vehicle development cycle, and saves development cost.