This invention discloses a high-resolution timing-programmable burst
pulse generator based on an embedded processor, which realizes multi-channel, high-precision, and fully programmable burst pulse output for
optical module testing. It combines the advantages of low cost, high integration, low
power consumption, and high timing accuracy. It includes an embedded processor module, a host
computer configuration module, a
USB-IIC bridge communication module, and an embedded main control module. The embedded processor module adopts the GD32E5 series
chip and has a built-in SHRTIM
timer with a DMA burst transfer unit and
multiple pulse output channels. The host
computer configuration module establishes data interaction with the embedded main control module through the
USB-IIC bridge communication module to provide a visual configuration interface and support users to customize the configuration parameters of each pulse
signal. The embedded main control module receives and parses the configuration parameters, stores them in the FLASH parameter
storage area, and completes the hardware configuration. The
system waits for the rising edge of the external AUX
signal to trigger the
signal throughout the process. After triggering, it synchronously outputs 6 high-precision pulse signals.