Ion trap mass spectrometer

A technology for mass spectrometers and ions, applied in the field of time-of-flight mass spectrometers and electrostatic traps, which can solve problems such as slow acquisition speed and duty cycle limitations

Active Publication Date: 2013-01-16
LECO CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The combination of slow acquisition speed and limited charge capacity limits the duty cycle to 0.3% in most adverse cases
[0009] Thus, prior art MP-TOFs and E-traps li...

Method used

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Examples

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Embodiment Construction

[0164] 1, the prior art coaxial E-trap 11 of US 6,744,042 (which is incorporated herein by reference) comprises two coaxial ion mirrors 12 and 13 separated by a field-free region 14, a pulsed ion source 17, with The mirror current detector 15 and ADC 16 of the preamplifier, a set of pulsed power supply 17 and a DC 18 power supply are connected to the mirror electrodes as shown. The distance between the mirror caps is 400mm, and the accelerating voltage is 4kV.

[0165] In operation, the ion source 17 produces ion packets at an energy of 4 keV which are pulsed admitted into the space between the ion mirrors by temporarily lowering the mirror 12 voltage. After restoring the mirror voltage, ion packets oscillate near the Z axis, between the ion mirrors, forming repeating I-path ion trajectories. These envelopes are spatially focused to a diameter of 2mm and extend to approximately 30mm along the Z axis, i.e. the ion envelope volume can be estimated to be 100mm 3 . The oscillat...

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PUM

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Abstract

The application relates to an ion trap mass spectrometer. An apparatus 41 and operation method are provided for an electrostatic trap mass spectrometer with measuring frequency of multiple isochronous ionic oscillations. For improving throughput and space charge capacity, the trap is substantially extended in one Z-direction forming a reproduced two-dimensional field. Multiple geometries are provided for trap Z-extension. The throughput of the analysis is improved by multiplexing electrostatic traps. The frequency analysis is accelerated by the shortening of ion packets and either by Wavelet-fit analysis of the image current signal or by using a time- of-flight detector for sampling a small portion of ions per oscillation. Multiple pulsed converters are suggested for optimal ion injection into electrostatic traps.

Description

technical field [0001] The present invention relates generally to the field of time-of-flight mass spectrometers and electrostatic traps for capturing and analyzing charged particles, and more particularly to electrostatic trap mass spectrometers with image detection and Fourier analysis and methods of use. Background technique [0002] Electrostatic trap (E-trap) mass spectrometers (MS) and multiple time-of-flight (MP-TOF) mass spectrometers both share a common feature - the analyzer electrostatic field is designed to be small initial Energy spread, angular spread and spatial spread provide isochronous ion motion. The two techniques differ in the arrangement of ion motion and the method of ion m / z measurement. In MP-TOF MS, ion packets follow a predetermined folded ion path from a pulsed source to a detector, and the ion mass-to-charge ratio (m / z) is determined from the ion time-of-flight (T), where T~(m / z) 0.5 . In E-trap MS, ions are trapped indefinitely, and ion fligh...

Claims

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Application Information

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IPC IPC(8): H01J49/48H01J49/46H01J49/42
CPCH01J49/40H01J49/282H01J49/4245H01J49/406H01J49/0036H01J49/062H01J49/401H01J49/0031
Inventor A·沃伦奇科夫
Owner LECO CORPORATION
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