The application provides a low-temperature double-
pulse test platform and method, and relates to the technical field of power device testing.The platform comprises a
refrigeration compressor, a cooling platform, an
enclosure, an air extraction unit, a temperature acquisition unit, a parameter acquisition unit and a
control unit.The
control unit is used for acquiring surface temperature information of the power device to be tested, platform temperature information of the cooling platform and
thermistor parameters under the action of a calibration pulse during the cooling process, determining the corrected equivalent
junction temperature parameters of the power device to be tested, and controlling the double-
pulse test loop to perform double-pulse testing when the corrected equivalent
junction temperature parameters enter a target test temperature window.The method introduces a calibration pulse and
thermistor parameters on the basis of a low-temperature environment, corrects and characterizes the actual
thermal state of the power device to be tested, and controls the double-pulse testing time in combination with the target test temperature window, so as to improve the accuracy, consistency and
repeatability of low-temperature double-pulse testing.