Active MOSFET voltage clamping circuit, clamping method and double-pulse test circuit
A voltage clamping and voltage clamping technology, applied in the field of voltage clamping measurement modules, can solve the problems of numerous components, temperature sensitivity, complex structure, etc., and achieve the effect of suppressing voltage spikes, widening the voltage measurement range, and improving passive networks
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[0042] The present invention will be further detailed below in conjunction with the accompanying drawings:
[0043] See figure 2 As shown, the double pulse test circuit includes a device under test (DUT), a shunt resistor R shunt , DC power supply V IN , Capacitance C IN , Inductance L, Schottky diode D SBD Connect the voltage clamp module and the oscilloscope in parallel with the voltage clamp circuit, the oscilloscope, the drain-source of the device under test (DUT), and connect the shunt resistor R to the drain of the device under test (DUT) shunt Connect to ground, shunt resistance R shunt Parallel capacitance C between the other end of and the source of the device under test (DUT) IN And the DC power supply, the inductance L and Schottky diode D are associated between the source of the device under test (DUT) and the parallel capacitor CIN and the common terminal of the DC power supply SBD ; The double pulse test circuit is used to evaluate the switching speed and swit...
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