211 results about "Double pulse" patented technology

The invention belongs to the technical field of crystal processing, and relates to a method for obtaining a single crystal diamond (111) surface wafer by using double-pulse-width laser. Femtosecond laser and picosecond laser are adopted for machining and stripping the blocky single crystal diamond to obtain a first crystal face (111), then femtosecond laser and picosecond laser are continuously adopted for machining and stripping the remaining blocky single crystal diamond, and the blocky single crystal diamond is obtained; the process for obtaining the crystal face (111) comprises the following steps of: scanning femtosecond laser on the crystal face (111) to process a plurality of graphitization modification lines which are full of the crystal face (111) and are parallel to each other, wherein the graphitization modification lines are parallel to the crystal orientation of a diagonal line [110] of the crystal face (001); carrying out scanning processing along the graphitization modification line by utilizing picosecond laser, so as to form a leap crack on the basis of the graphitization modification line of the crystal face (111); and then stripping is carried out. By means of the method, the wafer with the complete (111) face can be obtained through cutting in the ultra-thick (001) CVD monocrystal diamond.

The invention discloses a double-pulse system and method for improving depth resolution of laser ionization mass spectrometry, and relates to the technical field of mass spectrometers, the system comprises a control system for controlling femtosecond laser parameters generated by a femtosecond laser and nanosecond laser parameters of a nanosecond laser; the laser energy regulation and control module is used for carrying out phase adjustment and detection on the input femtosecond laser and outputting the femtosecond laser meeting set parameters based on the femtosecond laser parameters; the light beam shaping and light beam morphology analysis module is used for shaping femtosecond laser and focusing the femtosecond laser on the surface of the sample for laser denudation; the nanosecond laser performs off-resonance multi-photon ionization on the denudated neutral particles to generate ionized ions for mass spectrometry. According to the invention, the depth resolution of the laser ionization mass spectrum can be improved to nanoscale, the ionization efficiency of ions is improved under the condition of reducing the sampling amount, and meanwhile, the sensitivity of an instrument and the accuracy of quantitative analysis are improved.

The invention discloses a broadband oscillation characterization platform of a multi-chip power module and a near-field characteristic evaluation method, and belongs to the technical field of power electronics. The continuous operation condition of the power converter is decoupled into a series of discrete switching points, transient near-field radiation data of a to-be-tested power module under the discrete switching points are obtained through a double-pulse test, and near-magnetic field radiation signals are reconstructed; performing time-frequency analysis on the reconstructed near magnetic field radiation signal to generate a two-dimensional time-frequency matrix; and calculating a radiation energy entropy value based on the two-dimensional time-frequency matrix, fusing the radiation energy entropy value with the peak amplitude in the two-dimensional time-frequency matrix to generate a comprehensive EMI index for evaluating the broadband oscillation electromagnetic interference risk, and triggering EMI risk early warning when the comprehensive EMI index exceeds a threshold value. According to the method, the spectrum complexity is quantified through the radiation energy entropy, the multi-dimensional EMI risk assessment is carried out by fusing the peak amplitude of the time-frequency matrix, and the broadband oscillation in the multi-chip parallel power module can be accurately and efficiently represented.

The utility model relates to the technical field of automobile testing, in particular to a double-pulse automatic testing device which comprises a shell provided with a containing cavity, an opening is formed in the shell, and a cover plate capable of being opened and closed is arranged at the opening; a signal generator, a tested device and an oscilloscope which are electrically connected in sequence are arranged in the accommodating chamber; the door lock module is used for locking the cover plate when the cover plate is closed; the high-voltage control module is electrically connected with the high-voltage power supply, the high-voltage power supply end of the tested device, the door lock module and the output end of the signal generator, and is used for connecting the high-voltage power supply and the tested device when the door lock module is locked and disconnecting the high-voltage power supply and the tested device after a double-pulse signal is output; the discharging module is electrically connected with the high-voltage control module and the high-voltage power supply end of the tested device and is used for releasing the high-voltage power supply after the high-voltage power supply is disconnected; and the door lock module is electrically connected with the high-voltage power supply end of the tested device and is used for unlocking the cover plate after the high-voltage power supply is released. By adopting the device, the test safety can be improved.

The invention discloses a wafer scribing process, which comprises the following steps of: amplifying the line width of a saw street dummy copper conductor and continuously filling to form a shearing buffer copper strip; performing double-pulse laser annealing on the shear buffer copper strip to generate a twin crystal softening layer; back infrared gradient preheating is carried out according to the thermoplastic transition temperature of the copper strip, the feeding rate and the rotating speed of a tool are corrected in combination with vibration data coupling, and a plastic initial saw kerf is obtained; layering progressive deep cutting is carried out according to multi-gear cutting depth data, so that the copper strip slides to absorb energy under the pulse load and is elastically reset through a low dielectric layer, and a full-depth saw kerf is formed; and performing constant-temperature crystal locking and gradient cooling in a nitrogen environment, so that the twin crystal structure of the copper strip is stable and is interlocked with the dielectric layer shrinkage hoop, and a flexible bridging unit is generated on the side wall of the saw kerf. According to the technical scheme, the interlaminar shear stress can be subjected to peak clipping and shunting at the cutting moment, selective layering of a multi-layer interconnection interface is inhibited, and the yield and long-term reliability of the ultrathin wafer are improved.

The invention belongs to the technical field of invisible coding and anti-interference, and particularly relates to an invisible coding anti-interference laser coding and decoding system based on a sub-pulse phenomenon, which comprises a laser transmitting module, a signal processing module and a pulse information comparison unit. The passive Q-switched laser generates a main pulse and a sub-pulse with a preset double-peak interval, a main pulse signal delayer is used for coordinating a double-pulse time sequence, differential gain amplification is carried out on the main pulse and the sub-pulse, double-peak interval information is reconstructed through electric signal synthesis, an actual interval is compared with preset encoding information, and the time sequence of the main pulse and the sub-pulse is calculated. An anti-interference function is realized, laser stability is guaranteed through a side pumping structure in combination with a temperature compensation mechanism, concealment and anti-deception capability of coding and decoding signals are enhanced by using a double-peak interval invisible coding characteristic, and the system has the advantages of high anti-interference performance, dynamic and adjustable coding, high environmental adaptability and the like. The problem that a traditional laser signal is easy to intercept or interfere can be effectively solved.

The invention discloses a system for eliminating fading noise in a distributed optical fiber sound wave sensing system. The system comprises a light source, an optical frequency shift modulator, an optical amplifier, an optical circulator, a photoelectric detector, a data acquisition card and a data demodulator, laser emitted by the light source is modulated into double-pulse light with frequency difference through the light frequency shift modulator, the double-pulse light is injected into the optical fiber through the optical circulator after being amplified by the optical amplifier, Rayleigh backscattered light generated in the optical fiber is emitted back to the optical circulator, light emitted by the optical circulator is detected and converted into an electric signal through the photoelectric detector, and the electric signal is transmitted to the optical fiber through the optical circulator. The electric signals are collected and converted into digital signals through the data collection card, and the data demodulator demodulates the digital signals through a fading noise elimination method to obtain signals with fading noise eliminated. Therefore, fading noise in the distributed optical fiber acoustic wave sensing system can be effectively eliminated, the signal quality is improved, and error signal interference is eliminated.

The invention discloses a loop inductance-based multi-chip parallel current rising process modeling method and system, and the method comprises the steps: writing a current rising process equation through a loop inductance method of a multi-chip parallel double-pulse test circuit, and accurately describing the current rising behavior in the multi-chip parallel double-pulse test circuit. By calculating the terminal voltage of each chip, the method can determine a key factor for achieving a complete current sharing condition, in a parallel circuit, current sharing is the key for ensuring that all components uniformly share loads and avoid overheating and damage, and the established simulation circuit model is based on an actual current rising process equation and the current sharing condition. And the behavior of an actual circuit can be accurately reflected. Based on circuit topology described by a graph theory, Kelvin sources, non-Kelvin sources and other connection modes are unified, most (all) electromagnetic induction effects are described with least inductance parameters, a simple and effective equation is obtained, and analysis and expansion are facilitated.

The invention discloses a method for simultaneously testing the thickness and refractive index of a material based on terahertz time-domain spectroscopy, which relates to the technical field of material testing and comprises the following steps: acquiring a reference signal and a sample signal by using a transmission-type terahertz time-domain spectroscopy system, and positioning a key pulse peak through an automatic peak value recognition algorithm; frequency domain phase information is obtained by combining fast Fourier transform, and then the phase difference between the main pulse and the echo is calculated; based on an optical path difference model, a relation equation set of the double-pulse phase difference and material parameters is established, the material thickness and the refractive index are obtained through inversion, and prior refractive index information is not needed; and finally, processing the data by adopting a local weighted regression smoothing algorithm to obtain comprehensive characterization parameters of the material. By adopting the method, high-precision, rapid and lossless thickness and refractive index measurement is realized, the applicability and the flexibility of measurement are remarkably improved, and the method has a wide industrial popularization prospect.

The invention discloses a method and a system for calibrating time sequence deviation of double-pulse test voltage and current waveforms. The method comprises the steps of signal interception, time domain coarse alignment, periodic oscillation section interception, spectrum decomposition and oscillation frequency phase analysis, and frequency domain fine alignment and waveform reconstruction. According to the method, the inherent phase relation of voltage and current oscillation waveforms after a switching device is turned off is extracted, and signal preprocessing and frequency domain calculation are combined, so that rapid and high-precision automatic time sequence alignment is realized. Compared with a hardware method, the method provided by the invention is simple to operate, does not need to modify the circuit in advance, does not influence the reliability of a test result, does not depend on a specific probe or a test fixture, has very high universality, and can be realized through software.

The invention relates to a power module test system, method and device, computer equipment, a storage medium and a computer program product, an adjustable load is connected to a first port of a to-be-tested power module to simulate the load of the to-be-tested power module during actual operation, and an energy supplementing device is connected to a second port of the to-be-tested power module to provide power support. And combining with a control end upper control device connected to the to-be-tested power module to build a power module test system to test the to-be-tested power module. The upper control device sends double-pulse signals to the to-be-tested power module at intervals according to heat balance time of interval time of two double-pulse signals required for representing heat accumulation-free operation of the to-be-tested power module, controls the to-be-tested power module to simulate on-load through-flow working condition operation, and finally controls the to-be-tested power module to operate according to operation state parameters fed back by the to-be-tested power module. And determining a test result. Through the scheme, the operation condition of the to-be-tested power module is simulated, and the actual operation requirement of the power module can be met.

The invention relates to the technical field of spectral analysis, and particularly discloses an underwater intelligent detection machine system and method based on laser-induced breakdown spectroscopy, and the system comprises an underwater carrying platform, an orthogonal double-pulse laser-induced breakdown spectroscopy probe, a multi-sensor cooperative sensing module, a mechanical arm, a central control unit and a water surface control station. The method comprises the following steps: a first pulse vertically builds bubbles, and a second pulse parallelly enters the bubbles and is triggered according to delay time; the central control unit maintains a working distance of 1-2cm based on a distance measurement closed loop, and adaptively adjusts delay time and energy in combination with water depth pressure and cavitation feedback; and the water surface control station carries out denoising normalization on the spectrum calibration and carries out element qualitative and quantitative operation to generate an element distribution atlas. According to the method, plasma is excited in a cavitation bubble gas environment through orthogonal double pulses, and in-situ real-time high-sensitivity element detection of an underwater target is realized in combination with distance closed loop and parameter self-adaption.

The invention relates to the technical field of temperature measurement, and discloses a mining distributed optical fiber temperature measurement method, system and device, and the method comprises the steps: synchronously injecting a temperature measurement pulse and a reference pulse, and collecting an optical fiber backscattering signal; strain-free temperature data are obtained through anti-strain demodulation and discrete temperature integration; performing strain compensation according to the real-time difference value to generate strain compensation temperature data; meanwhile, on the basis of optical fiber space distribution, weighting processing is conducted on the reference pulse temperature drift feature space to obtain compensation quantity; and the compensation amount and strain compensation data are fused, a mining global heat supply network is constructed through a temperature field reconstruction algorithm, and an anti-drift temperature field is output. A double-path anti-drift mechanism is realized through double pulse pairs, mechanical interference is eliminated in combination with anti-strain demodulation, and a temperature drift error is corrected in real time by utilizing space weighting and dynamic fusion, so that high-precision and high-stability distributed temperature monitoring is realized in a complex mine environment, and the problems of drift accumulation and precision attenuation in long-distance optical fiber temperature measurement are solved.

The invention discloses a transient photocurrent measurement system and measurement method for a photoelectric material. The transient photocurrent measurement system comprises a double-pulse femtosecond laser detection system and a transient photocurrent high-resolution acquisition system, the double-pulse femtosecond laser detection system is used for outputting two beams of time sequence adjustable femtosecond pulse light which are respectively used as pump light and detection light, irradiating the pump light on a photoelectric material, irradiating the detection light on an ultrafast light switch material, and regulating and controlling the optical path difference of the two beams of light reaching a sample; and the transient light current high-resolution acquisition system is used for extracting picosecond-level time resolution of the transient light current of the photoelectric material. The picosecond-level time resolution can be realized, the simplified electrode structure design not only reduces the manufacturing cost and complexity, but also improves the stability and reliability of the system, so that the technology can adapt to more types of materials and application scenes, the device structure is compatible with a traditional method for testing the bandwidth of the device, and the test efficiency is greatly improved. And a convenient research method is provided for establishing a relation between device performance and a working mechanism.

The invention discloses an orthogonal collinear integrated double-pulse laser-induced breakdown spectroscopy component analysis device, and relates to the technical field of chemical and spectral analysis, a multi-channel pulse generator controls the laser emission time of a laser time sequence emission unit and the laser collection time of a collection unit; the first laser time sequence emission unit emits first laser which passes through the PS spectroscope and the first focus lens to vertically excite the surface of a tested sample; the second laser time sequence emission unit emits second laser to the tested sample or the PS spectroscope, the second laser is parallel to the surface of the sample in the horizontal direction when emitted to the tested sample, the second laser and the first laser are propagated in the same light path when emitted to the PS spectroscope, and the second laser vertically excites the surface of the sample after passing through the first focus lens; the three-dimensional displacement table carries the sample to move to a laser focusing position; and the collection unit collects and processes the data of the tested sample. The invention provides a dipulse laser-induced breakdown spectroscopy component analysis device with a simple excitation mode.

The invention discloses an IGBT parallel current balancing method and device based on real-time feedback control, and relates to the technical field of power electronic conversion, and the method comprises the steps: activating a double-pulse test device to carry out the transient test of an IGBT, and obtaining the test information; performing simulation analysis by taking the multiple physical parameters as constraints to obtain simulation information; performing collaborative analysis on the test information and the simulation information to obtain a parallel current prediction function; introducing an equalization control coefficient to obtain an equalization control quantity; and activating a grid charge regulator to control and regulate the balance control quantity of the IGBT. According to the invention, the technical problems that the existing control and adjustment technology of conversion equipment between alternating current and direct current lacks an accurate feedback and dynamic adaptation mechanism, parallel branch parameters are difficult to control in a balanced manner, and the requirements of efficient and stable electric energy conversion under complex working conditions cannot be met are solved; the technical effects of accurately controlling the parallel branch current of the alternating current and direct current conversion equipment in a balanced manner and improving the electric energy conversion efficiency and the system stability under complex working conditions are achieved.

The invention discloses a multi-information synchronous measurement device and method for a whole space, and belongs to the technical field of spectral measurement and analysis. The device comprises a double-pulse laser excitation module, a multi-angle spectrum acquisition module, a transient imaging module, a backlight shadow imaging module and a synchronous control module. The measurement method comprises the steps of sample positioning pretreatment, double-pulse plasma excitation, multi-angle spectrum synchronous acquisition, plasma transient imaging, shock wave backlight shadow imaging, detection post-treatment and the like, and synchronous acquisition of multi-dimensional data is realized through accurate time sequence control. Omnibearing synchronous measurement of plasma spectrum, form and shock wave propagation is realized, and the device has the advantages of high data time consistency, comprehensive information acquisition, high measurement precision and high experiment efficiency, can be widely applied to the fields of material analysis, environment monitoring, plasma physical research and the like, and has wide application prospect. And the method has good adaptability in LIBS (Laser-induced Breakdown Spectroscopy) technology expansion scenes such as double pulses and magnetic confinement.

A half-wave plate and a focusing lens are sequentially arranged on an output light path of a pulse width adjustable infrared laser, the focusing lens is connected with a frequency doubling crystal, the frequency doubling crystal is connected with a frequency tripling crystal, the output end face of the frequency tripling crystal is cut into a Brewster angle, and the output end face of the frequency tripling crystal is connected with a pulse width adjustable infrared laser. The output infrared laser is shielded by the infrared light blocking block after being transmitted in the space, the output green laser is shielded by the green light blocking block after being transmitted in the space, the frequency tripling crystal is connected with the imaging lens, the imaging lens is connected with the input surface of the wedge-shaped lens, and the input surface of the wedge-shaped lens is cut into a Brewster angle. Through fine adjustment of the distance between the imaging lens and the frequency tripling crystal and the distance between the wedge-shaped lens and the imaging lens, the ultraviolet laser output by the wedge-shaped lens becomes circular and is output. The Brewster angle output surface of the frequency tripling crystal reduces the ultraviolet damage probability and separates infrared light, green light and ultraviolet light. The position of the imaging lens is finely adjusted to compensate a light spot ellipse caused by a walk-off effect during frequency doubling.

The application discloses a compressor internal flow field synchronous measurement system based on PIV and pressure sensing, relates to the technical field of compressor experimental aerodynamics measurement, and is suitable for accurate measurement of flow field parameters in a diffuser modeling test of a compressor. The system comprises a dynamic pressure sensor array, a signal conditioning module, a multichannel dynamic pressure acquisition card, a double-pulse laser, a high-speed CMOS camera, an FPGA synchronous controller, a PIV post-processing server and a multi-source data fusion workstation. The FPGA synchronous controller is used as the only time sequence reference of the double-pulse laser, the high-speed CMOS camera and the multichannel dynamic pressure acquisition card, the traditional software trigger is replaced by a hardware trigger, and system delay jitter is eliminated. The timestamp marking pulse and the first pulse trigger signal are output simultaneously, the pressure data stream obtains a sampling point index corresponding to the laser emission moment directly, and the time synchronization accuracy of the velocity field and the pressure field reaches the nanosecond level.

The invention provides a high-frequency parasitic parameter extraction and electromagnetic interference source modeling method for a vehicle high-voltage high-power IGBT (Insulated Gate Bipolar Transistor) module, which comprises the following steps of: extracting parasitic capacitance to ground and lead inductance of each pole of the IGBT module by adopting a finite element method, and combining entity port impedance measurement with a simulation mode to obtain parasitic parameters among the poles of the IGBT; corresponding high-frequency equivalent circuit models are established for electromagnetic interference sources such as bridge arms, laminated busbars and cables in sequence, finally, a double-pulse simulation and entity test platform is established by integrating parasitic parameters and the models, and the accuracy of modeling of the IGBT electromagnetic interference sources can be effectively verified by comparing simulation and test results under the same working condition. And theoretical support can be provided for analysis and optimization of an electromagnetic interference mechanism of a high-voltage system of the new energy automobile.

The invention relates to a method, a device and a system for measuring electrical parameters of an IGBT (Insulated Gate Bipolar Translator) module. The method comprises the steps of obtaining a historical double-pulse test result of an IGBT module, and obtaining a historical residual life curve; according to the difference between the historical remaining life of each abnormal inflection point and the historical remaining life of the adjacent test data point, determining the anomaly degree of the abnormal inflection point; in each abnormal interval, according to the proportion of fault working condition subintervals in the working condition data and the deviation degree of the multiple monitoring parameters, the fluctuation degree in the abnormal interval is determined; determining the matching degree of the abnormal inflection point based on the difference between the abnormity degree and the fluctuation degree of each abnormal inflection point; and performing a double-pulse test on the IGBT module once to obtain the current residual life, and correcting the current residual life based on the matching degree of the plurality of abnormal inflection points and the difference of the historical residual life between the adjacent test data points in the corresponding abnormal interval to obtain a target residual life value. According to the invention, the accuracy of residual life prediction of the IGBT module can be improved.

The invention relates to an experimental platform of a full-control device series valve. The experimental platform comprises a main control unit, a unit to be tested and a sampling unit, the main control unit comprises an upper computer used for providing a test signal of the series valve; the to-be-tested unit is composed of each full-control device and a driving module connected with the full-control device, and each driving module is in communication connection with the main control unit; the sampling unit comprises a sampling host and at least two isolation units; the isolation unit is in communication connection with the sampling host; the isolation units are not electrically connected, and the isolation units and the sampling host are not electrically connected. On one hand, the reliability of the isolation unit power supply mode is ensured; and on the other hand, the reliability of normal work of the isolation unit and the sampling host is ensured. The experiment platform can carry out safety measurement on required test points in series valve single and double pulse experiments and series valve bridge type circuit no-load, on-load and other operation experiments.

The invention relates to a double-pulse test tool and method for a full-control device series valve, and the tool comprises an upper computer main control unit which is used for transmitting a control instruction, receiving waveform data, and carrying out the automatic parameter calculation; the control unit is connected with the upper computer main control unit, comprises a high-voltage power supply, a support capacitor and a bridge arm change-over switch, and is used for providing adjustable high voltage and realizing rapid reconstruction of a test loop; the test unit is electrically connected with the control unit and the to-be-tested device and comprises a busbar box and a load inductor, and the busbar box is used for interconnecting the supporting capacitor, the load inductor, the bridge arm change-over switch and the to-be-tested device to form an energy transmission main loop; and the acquisition unit is connected with the upper computer main control unit and the test unit, comprises an oscilloscope, a voltage probe and a current probe, and is used for capturing the electrical parameter waveform of the device to be tested in real time and uploading the electrical parameter waveform to the upper computer main control unit.

The invention provides a double-pulse laser engraving method and device, and relates to the technical field of laser engraving, the double-pulse laser engraving method and device are used for engraving a gravure forme.The engraving method comprises the steps that the wavelength of femtosecond pulse laser and the wavelength of picosecond pulse laser are determined; determining the pulse delay of the femtosecond pulse laser and the picosecond pulse laser; determining a to-be-engraved area of the gravure plate; adjusting the optical path length of the femtosecond pulse laser and / or the picosecond pulse laser according to the pulse delay; synthesizing the femtosecond pulse laser and the picosecond pulse laser into double-pulse laser by using a polarization beam splitting cube; and ablating the to-be-engraved area according to the double-pulse laser. The femtosecond pulse laser is short in wavelength and high in energy, so that a to-be-engraved area can be pre-ablated quickly, when ungasified plasma is formed in the pre-ablated area, the picosecond pulse laser is used for performing secondary ablation on the pre-ablated area, the machining quality of the gravure plate can be guaranteed, the area of a heat affected area can be controlled, and the etching precision of an etched pattern can be improved.

The invention discloses a laser ion source system based on double pulses and AI feedback control and a control method, and relates to the technical field of plasmas, and the system is characterized in that a first laser generates pre-ablation laser, and generates pre-plasma on a target material; the second laser generates main ionization laser which irradiates the pre-plasma to generate main plasma; and the intelligent control unit extracts spatial features from the plume image, fuses the spatial features, the spectral data, the real-time ion current intensity and the equipment parameters to obtain high-order state features, and generates laser pulse optimization parameters according to the high-order state features and the equipment parameters. According to the invention, a double-pulse mechanism is adopted to enable main ionization to occur in the expanded plasma, charge exchange and energy dispersion are reduced, the energy divergence of the ion beam is remarkably reduced, the energy conversion efficiency is improved, AI real-time feedback control can compensate factors such as target pitting corrosion and laser power fluctuation, and very high inter-pulse stability is realized.

A loop-symmetrical switching device double-pulse test laminated busbar and test system, belonging to the technical field of switching device testing, solves the problem of how to reduce the stray inductance of the laminated busbar. When performing a double-pulse test on a SiC-based switching device, on the upper and lower surfaces of the laminated busbar, the current of the test loop flows from one side of the two parts divided by the insulating slot through a connecting assembly to the other side of the two parts divided by the insulating slot, thereby passing through the corresponding flexible coil current sensor to complete the collection of the loop current. On the upper and lower surfaces of the laminated busbar, the path of the equivalent current forms a loop that is symmetrical in top and bottom. The currents in the loop are equal in magnitude and opposite in direction, and the magnetic fields generated by the currents in the loop cancel each other out, thereby minimizing the current residual loop and reducing the loop stray inductance. The laminated busbar occupies a small space.

The invention relates to the technical field of integrated circuits, and provides a pulse trigger type level shift circuit which comprises a double-pulse current generation circuit, a high-low level shift conversion holding circuit, a high-voltage domain output shaping filter circuit and an RS trigger which are connected in sequence. The double-pulse current generating circuit responds to the jump edge of the low-voltage domain input signal to generate a transient double-pulse current signal; the high-low level shift conversion holding circuit is combined with the current signal and an input signal to generate a complementary pulse voltage signal of a high-voltage domain; the shaping and filtering circuit performs shaping and filtering on the pulse voltage; and the RS trigger finally latches the logic state and outputs a stable burr-free high-voltage domain signal. Through a pulse current triggering mode, an extremely short pulse is generated only when a signal jumps, a quiescent current path is eliminated, and low static power consumption is achieved; meanwhile, fast level flipping under high voltage difference is achieved through pulse driving, the requirement for the input signal driving capacity is low, and the characteristics of high speed and low power consumption are considered.

The application discloses a dynamic on-resistance test circuit based on a gallium nitride transistor and a test method thereof, and belongs to the technical field of power electronics.The circuit comprises a DPT test circuit, a switching state switching circuit and a clamping circuit; the test method is to obtain the on-resistance of the to-be-tested tube by monitoring the voltage between test points on the clamping circuit and the current on the coaxial resistor; and the switching between hard switching and soft switching tests is realized by changing the switching interface.The gallium nitride transistor and the clamping circuit are introduced on the traditional double-pulse test circuit, and the dynamic on-resistance test functions in the soft switching and hard switching modes are integrated.Compared with the traditional test circuit, the clamping circuit of the application can capture the dynamic on-resistance within nanosecond time delay, greatly reduces the peak of the clamping voltage, improves the test precision, and realizes the fast and accurate measurement of the dynamic on-resistance.

This invention belongs to the field of power electronics and semiconductor device technology, and proposes a high-precision comparison method for transistor on-resistance. The method includes: generating and outputting a DC voltage capable of rapid adjustment and load-bearing capacity via a DC voltage adjustment module; generating and outputting a rapidly adjustable pulse signal based on the DC voltage and a pulse voltage via a gate drive module; applying the pulse signal to the transistor under test (TUT) via a power module and measuring the TUT's on-resistance under the gate drive voltage; switching the gate drive voltage within a delay on the order of microseconds to nanoseconds, and measuring the TUT's on-resistance under the switched gate drive voltage based on the pulse signal. This method can test the on-resistance of TUTs under different gate drive voltages in a pulse circuit, reducing the measurement delay from several minutes in traditional dual-pulse circuits to several nanoseconds, effectively improving the performance of transistor reliability evaluation circuits.

The application relates to a power device dynamic on-resistance detection method, system, device, storage medium and program product, which is applied to a power device dynamic on-resistance detection system, and the power device dynamic on-resistance detection system comprises an upper computer, a controller, a double-pulse test circuit and a signal collector, wherein the double-pulse test circuit is installed with a measured gallium nitride power device; the method comprises the following steps: under the condition that the test temperature of the measured gallium nitride power device meets preset test conditions, sending multiple groups of double-pulse test signals to the double-pulse test circuit through the controller; collecting multiple groups of electrical test parameters of the measured gallium nitride power device under the multiple groups of double-pulse test signals through the signal collector; and detecting the on-resistance of the measured gallium nitride power device based on the multiple groups of electrical test parameters through the upper computer. The method improves the detection accuracy of power device dynamic on-resistance detection.